Advanced Distance Shot Test:

.
Test Object - Device Settings
.

.
.

Substation/Bay:
Substation:
Bay:

MESAAD
C80.RP

Substation address:
Bay address:

Manufacturer:
Device address:

ABB

Number of phases:
V primary:
I primary:

3
132.0 kV
1.000 kA

IN / I nom:

1.000

I max:

2.500 A

Device:
Name/description:
Device type:
Serial/model number:
Additional info 1:
Additional info 2:

REL561
REL561 Version 2

.
Nominal Values:
f nom:
V nom (secondary):
I nom (secondary):

50.00 Hz
110.0 V
1.000 A

.
Residual Voltage/Current Factors:
VLN / VN:

1.732

.
Limits:
V max:

165.0 V

.
Debounce/Deglitch Filters:
Debounce time:

3.000 ms

Deglitch time:

0.000 s

Overload Detection:
Suppression time:

50.00 ms

Test Object - Other RIO Functions

.
CB Configuration
Description
CB trip time
CB close time
52a/b %

Name
CB trip time
CB close time
52a/b %

Value
50.00 ms
100.00 ms
20.00 %

Test Object - Distance Settings

.
.

Line angle:
CT starpoint:

82.11
Dir. line

System
parameters:
Line length:
PT connection:
Impedance
correction 1A/I nom:
Impedances in
primary values:

0.000
at line
no
no

Tolerances:
Tol. T rel.:
Tol. T abs. +:
Tol. Z rel.:

5.000 %
20.00 ms
5.000 %

Tol. T abs. -:
Tol. Z abs.:

20.00 ms
50.00 m

1.000000
no

Z0/Z1 angle:

0.000000

Grounding factor:
Z0/Z1 mag.:
Separate arc
resistance:

Zone Settings:
Label

Type

Trip time

Tol.T rel

Tripping

Fault
loop
L-L

Tol.T
abs20.00 ms

Tol.Z rel.

Tol.Z abs

5.000 %

Tol.T
abs+
20.00 ms

Z1 L-L

35.00 ms

5.000 %

35.00 ms

5.000 %

20.00 ms

20.00 ms

5.000 %

L-L

435.0 ms

5.000 %

20.00 ms

20.00 ms

5.000 %

Tripping

L-E

435.0 ms

5.000 %

20.00 ms

20.00 ms

5.000 %

Z3 L-L

Tripping

L-L

5.035 s

5.000 %

20.00 ms

20.00 ms

5.000 %

Z3 L-N

Tripping

L-E

5.035 s

5.000 %

20.00 ms

20.00 ms

5.000 %

50.00
m
50.00
m
50.00
m
50.00
m
50.00
m
50.00
m

Z1 L-N

Tripping

L-E

Z2 L-L

Tripping

Z2 L-N

X/

20

15

10

-5

-10

-15
-5

10

15

20

25

30

Linked XRIO References

Reference Name
RIO.DEVICE.NOMINALVALUES.IN
OM

Un
it
In

Valu
e
1.00
A

XRIO Path
RIO/Device/Nominal
Values/In

35

R/

Comment

Test Module
Name:
Test Start:
User Name:
Company:

OMICRON Advanced Distance

25-May-2013 11:09:57

Version:
Test End:
Manager:

2.40 SR 1
25-May-2013 11:12:53

constant test current

yes

ITest
kS = kL:

2.250 kA
no

0.000
1.000

ZS angle:
kS angle:

0.00
0.00

200.0 ms
300.0 ms

Max. fault:
Time reference:

5.500 s
fault inception

Extended zones:

active

no

Load current
enabled:

no

Switch off at zero

crossing:
Load current::

Search res. abs.:

40.00 m

Test Settings
.
Test model:
Test model:
Allow reduction of
ITest/VTest:
ZS mag.:
kS mag.:

.
Fault Inception:
Mode:
DC-offset:

random
no

.
Times:
Prefault:
Postfault:

.
Other:
n/a

.
Search Settings:
Search res. rel.:
Ignore nominal
characteristics:
Search interval:

1.000 %
no
160.0 m

.
Auxiliary Binary Outputs:
Name
Bin. Out 1

Test Results

Fault inception
Delay time
n/a

Slope

Trip Delay time

Slope

closed

n/a

closed

Shot Test: Fault Type L1-E

|Z|
720.6 m
1.781
4.800
613.9 m
1.798
4.800
1.200
5.551
9.983

Phi
90.00
90.00
90.00
82.11
82.11
82.11
0.00
0.00
0.00

%
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a

% of

t nom
35.00 ms
435.0 ms
5.035 s
35.00 ms
435.0 ms
5.035 s
35.00 ms
435.0 ms
5.035 s

t act.
40.10 ms
442.0 ms
5.024 s
37.00 ms
439.2 ms
5.025 s
33.40 ms
432.7 ms
5.021 s

Dev.
14.57 %
1.609 %
-0.2224 %
5.714 %
0.9655 %
-0.2046 %
-4.571 %
-0.5287 %
-0.2741 %

ITest
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA

Result
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

ITest
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA

Result
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

2.250 kA

Passed

X/

30

25

20

15

10

-5

-10
-5

10

15

20

25

30

35

R/

Shot Test: Fault Type L2-E

|Z|
720.6 m
1.781
4.800
613.9 m
1.798
4.800
1.200
5.551

Phi
90.00
90.00
90.00
82.11
82.11
82.11
0.00
0.00

%
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a

9.983

0.00

n/a

% of

t nom
35.00 ms
435.0 ms
5.035 s
35.00 ms
435.0 ms
5.035 s
35.00 ms
435.0 ms

t act.
37.10 ms
437.0 ms
5.023 s
39.00 ms
439.2 ms
5.024 s
35.30 ms
434.9 ms

5.035 s

5.020 s

Dev.
6%
0.4598 %
-0.2483 %
11.43 %
0.9655 %
-0.2185 %
0.8571 %
-0.02299
%
-0.2959 %

X/

30

25

20

15

10

-5

-10
-5

10

15

20

25

30

35

R/

Shot Test: Fault Type L3-E

|Z|
720.6 m
1.781

Phi
90.00
90.00

%
n/a
n/a

4.800
613.9 m
1.798
4.800
1.200
5.551
9.983

90.00
82.11
82.11
82.11
0.00
0.00
0.00

n/a
n/a
n/a
n/a
n/a
n/a
n/a

% of

t nom
35.00 ms
435.0 ms

t act.
42.10 ms
434.6 ms

5.035 s
35.00 ms
435.0 ms
5.035 s
35.00 ms
435.0 ms
5.035 s

5.026 s
37.80 ms
439.3 ms
5.025 s
32.50 ms
433.3 ms
5.021 s

Dev.
20.29 %
-0.09195
%
-0.1887 %
8%
0.9885 %
-0.1966 %
-7.143 %
-0.3908 %
-0.2741 %

ITest
2.250 kA
2.250 kA

Result
Passed
Passed

2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA

Passed
Passed
Passed
Passed
Passed
Passed
Passed

X/

30

25

20

15

10

-5

-10
-5

10

15

20

25

30

35

R/

Shot Test: Fault Type L1-L2

|Z|
720.6 m
2.009
7.200

Phi
90.00
90.00
90.00

%
n/a
n/a
n/a

769.6 m
2.104
7.200

82.11
82.11
82.11

1.079
2.254
9.984

% of

t nom
35.00 ms
435.0 ms
5.035 s

t act.
35.50 ms
438.4 ms
5.031 s

n/a
n/a
n/a

35.00 ms
435.0 ms
5.035 s

37.60 ms
441.6 ms
5.032 s

0.00
0.00

n/a
n/a

35.00 ms
435.0 ms

35.80 ms
435.2 ms

0.00

n/a

5.035 s

5.032 s

Dev.
1.429 %
0.7816 %
-0.06951
%
7.429 %
1.517 %
-0.06356
%
2.286 %
0.04598
%
-0.06753
%

ITest
2.250 kA
2.250 kA
2.250 kA

Result
Passed
Passed
Passed

2.250 kA
2.250 kA
2.250 kA

Passed
Passed
Passed

2.250 kA
2.250 kA

Passed
Passed

2.250 kA

Passed

X/

30

25

20

15

10

-5

-10
-5

10

15

20

25

30

35

R/

Shot Test: Fault Type L2-L3

|Z|
720.6 m
2.009
7.200
769.6 m
2.104
7.200
1.079
2.254
9.984

Phi
90.00
90.00
90.00
82.11
82.11
82.11
0.00
0.00
0.00

%
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a

% of

t nom
35.00 ms
435.0 ms
5.035 s
35.00 ms
435.0 ms
5.035 s
35.00 ms
435.0 ms
5.035 s

t act.
40.10 ms
439.9 ms
5.027 s
39.10 ms
438.6 ms
5.029 s
41.00 ms
438.8 ms
5.031 s

Dev.
14.57 %
1.126 %
-0.1529 %
11.71 %
0.8276 %
-0.1231 %
17.14 %
0.8736 %
-0.06951
%

ITest
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA

Result
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

X/

30

25

20

15

10

-5

-10
-5

10

15

20

25

30

35

R/

Shot Test: Fault Type L3-L1

|Z|
720.6 m
2.009
7.200
769.6 m
2.104
7.200

Phi
90.00
90.00
90.00
82.11
82.11
82.11

%
n/a
n/a
n/a
n/a
n/a
n/a

1.079
2.254
9.984

0.00
0.00
0.00

n/a
n/a
n/a

% of

t nom
35.00 ms
435.0 ms
5.035 s
35.00 ms
435.0 ms
5.035 s

t act.
39.00 ms
437.9 ms
5.029 s
40.40 ms
439.8 ms
5.031 s

35.00 ms
435.0 ms
5.035 s

38.40 ms
435.7 ms
5.030 s

Dev.
11.43 %
0.6667 %
-0.1092 %
15.43 %
1.103 %
-0.08937
%
9.714 %
0.1609 %
-0.09533
%

ITest
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA

Result
Passed
Passed
Passed
Passed
Passed
Passed

2.250 kA
2.250 kA
2.250 kA

Passed
Passed
Passed

X/

30

25

20

15

10

-5

-10
-5

10

15

20

25

30

35

R/

Shot Test: Fault Type L1-L2-L3

|Z|
720.6 m
2.009
7.200
769.6 m
2.104
7.200
1.079
2.254
9.984

Phi
90.00
90.00
90.00
82.11
82.11
82.11
0.00
0.00
0.00

%
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a
n/a

% of

t nom
35.00 ms
435.0 ms
5.035 s
35.00 ms
435.0 ms
5.035 s
35.00 ms
435.0 ms
5.035 s

t act.
35.70 ms
437.8 ms
5.025 s
37.60 ms
438.7 ms
5.026 s
37.90 ms
434.4 ms
5.028 s

Dev.
2%
0.6437 %
-0.2046 %
7.429 %
0.8506 %
-0.1867 %
8.286 %
-0.1379 %
-0.145 %

ITest
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA
2.250 kA

Result
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed
Passed

X/

30

25

20

15

10

-5

-10
-5

10

15

20

25

30

35

R/

Shot Details:

.
Parameters:
Fault Type:
| Z |:
R:
%:
ITest

L1-L2-L3
9.984
9.984
n/a
2.250 kA

Phi:
X:
% of:

0.00
0.000

5.028 s
5.035 s
4.783 s

Assessment:
Dev.:
t max:

Passed
-0.145 %
5.287 s

.
Results:
t act.:
t nom:
t min:

Fault Quantities (natural):

VL1:
VL2:
VL3:
IL1:
IL2:
IL3:
VFault:
IFault:

22.46 kV
22.46 kV
22.46 kV
2.250 kA
2.250 kA
2.250 kA
22.46 kV
2.250 kA

Fault Quantities (symmetrical):

0.00
-120.00
120.00
0.00
-120.00
120.00
0.00
0.00

V0:
V1:
V2:
I0:
I1:
I2:

0.000 V
22.46 kV
0.000 V
0.000 A
2.250 kA
0.000 A

n/a
0.00
n/a
n/a
0.00
n/a

Prefault
Fault

Postfault
Trip

V/kV

20
10
0
-10

0.0

0.5

1.0

1.5

2.0

2.5

3.0

3.5

4.0

4.5

5.0

3.0

3.5

4.0

4.5

5.0

t/s

-20
-30
VL1

VL2

VL3

I/kA

2.0
1.0
0.0
-1.0

0.0

0.5

1.0

1.5

2.0

2.5

t/s

-2.0
-3.0
IL1

IL2

IL3

Bin. In. 1
Bin. In. 2
0.0

0.5

1.0

1.5

2.0

2.5

3.0

3.5

4.0

4.5

5.0

0.0

0.5

1.0

1.5

2.0

2.5

3.0

3.5

4.0

4.5

5.0

t/s

Bin. Out 1

.
Cursor Data
Cursor 1
Cursor 2
C2 - C1

Time

Signal

Value

0.000 s
5.028 s
5.028 s

<none>
<none>

n/a
n/a
n/a

.
All values are
primary

t/s

Test State:
Test passed