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2. PROCEDURE.
• Single crystalline silicon wafers were cut in to 1.25 cm2 square using a
sharp diamond cutter, and the unpolished side was coated with thin
aluminum layer to obtain an ohmic contact.
• The sample then kept on to custom made Teflon flaks in a way which
the aluminum layer is in contact with the electrode and the polished
side is open towards the electrolyte.
• 48% aqueous HF were prepared and mixed with ethanol in a ratio 1:3
(v/v) to prepare the electrolyte.
• Constant current was supplied for about 2 min and then terminated.
• Samples were taken out and washed with ethanol several times to
remove any traces of HF, and dried under nitrogen flow.
3. CHARACTERIZATION
SEM and AFM can be used to observe porous morphology of the etched
samples, since porous silicon have luminescent properties emission in blue or
green region also can be used for characterization. Current, etching time and
electrolyte concentration have to be fine tuned to get desired pore
morphologies.
4. REFERENCES.