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This document provides instructions for experiments in a sensors and transducers laboratory course. It includes:
1) Details on 8 listed experiments covering topics like strain measurement, temperature sensors, LVDT operation, and proximity sensors.
2) An example experiment on measuring strain using strain gauges, including the objectives, equipment, procedures, theoretical calculations, and sample data tables and results.
3) Objectives, equipment, setup diagrams, procedures, expected results and conclusions for other experiments on temperature sensors, LVDT characterization, and effects of interfering inputs on measurement systems.
This document provides instructions for experiments in a sensors and transducers laboratory course. It includes:
1) Details on 8 listed experiments covering topics like strain measurement, temperature sensors, LVDT operation, and proximity sensors.
2) An example experiment on measuring strain using strain gauges, including the objectives, equipment, procedures, theoretical calculations, and sample data tables and results.
3) Objectives, equipment, setup diagrams, procedures, expected results and conclusions for other experiments on temperature sensors, LVDT characterization, and effects of interfering inputs on measurement systems.
This document provides instructions for experiments in a sensors and transducers laboratory course. It includes:
1) Details on 8 listed experiments covering topics like strain measurement, temperature sensors, LVDT operation, and proximity sensors.
2) An example experiment on measuring strain using strain gauges, including the objectives, equipment, procedures, theoretical calculations, and sample data tables and results.
3) Objectives, equipment, setup diagrams, procedures, expected results and conclusions for other experiments on temperature sensors, LVDT characterization, and effects of interfering inputs on measurement systems.
DEPARTMENT OF INSTRUMENTATION AND CONTROL ENGINEERING
IC 212 SENSORS AND TRANSDUCERS LABORATORY
EXPERIMENT - DOCUMENTATION
SECOND YEAR- B.TECH
DEPARTMENT OF INSTRUMENTATION AND CONTROL ENGINEERING SENSORS AND TRANSDUCER LAB
SI.NO LIST OF EXPERIMENTS 1
Measurement of strain using strain gauges
2
Characteristics of temperature sensors
3
Study Of Ac And Dc Characteristics Of LVDT
4 Measurement of Natural frequency and damping ratio of the given system
5
Loading effects of Potentiometer and Characteristics of Optocoupler
6
Level Measurement using proximity sensors
7 Effect of Modifying and Interfering input for the given measurement system
8
Characteristics of Hall effect sensor
1.MEASUREMENT OF STRAIN USING STRAIN GAUGES
AIM: To measure the strain in a cantilever beam setup using half and full bridge configurations of strain gauge using cantilever beam setup. APPARATUS REQUIRED: S.No Components/Apparatus Specification or Range Quantity 1.
2. 3. 4. 5. Cantilever beam setup with strain gauge in Resistors Weights RPS Breadboard
Full Bridge Configuration CIRCUIT DIAGRAM 1 &2 : Half Bridge Configuration and Full Bridge Configuration
Circuit diagram1: Half bridge configuration
Circuit diagram2: Full bridge configuration FORMULA (used for the experiment) DIMENSIONS OF CANTILEVER BEAM: (Write the values of the quantities with units) Youngs Modulus (E) = Width of the beam (b) = Length of the beam (l) = Thickness of the beam (h) = Bridge Excitation voltage (E v ) = Gauge factor strain gauge (G F ) =
THEORITICAL CALCULATIONS:
I xx = b h 3 / 12 ; I xx - Moment of Inertia in mm 4
d = P l 3 / 3E I xx ; d- Deflection of the beam, P- Rated load of the beam in gm = M Y/ I xx ; M Bending moment = g l
Y = h/2. - Stress in kg/mm 2
= / E; - Strain
V O = E v G F For Half Bridge configuration V O = E v G F / 4 For Quarter bridge configuration TABULATION 1: Half Bridge Configuration
Load (gms) Bridge Volt(v) Deflection d(mm) Stress x 10 -6 Strain x 10 -5 Eth(mV) H(I) N x10 -6
S/N x 10 - 6 N(I) Increasing Decreasing
TABULATION 2: Full Bridge Configuration
Load (gms) Bridge Volt(v) Deflection d(mm) Stress x 10 -6 Strain x 10 -5 Eth(mV) H(I) N x10 -6
S/N x 10 - 6 N(I) Increasing Decreasing
Procedure: 1. The circuit connections are made as per the circuit diagram 1 and 2. . 2. Note corresponding outputs while bridge (half/Full) is loaded in multiples of 100gms till 1000gms. 3. Do the same while unloading the bridge(half/Full). 4. Plot the graph for load Vs bridge output, hysteresis and non-linearity
Result: Inference about the experiment :
2.CHARACTERISTICS OF TEMPERATURE SENSORS
AIM: To study the characteristics of the given Resistance temperature detector (RTD), Thermocouple and Thermistor. APPARATUS REQUIRED: S.No Components/Apparatus Specification or Range Quantity 1. 2. 3. 4. 5. RTD Thermocouple Thermistor Thermal calibrator Digital Multimeter
EXPERIMENTAL SETUP:
TABULATION: 1 VARIATION OF RESISTANCE OF RTD WITH TEMPERATURE
S.NO TEMPERATURE(DEGREE CELSIUS)
RESISTANCE(KILO OHM)
TABULATION: 2 VARIATION OF OUTPUT VOLTAGE OF THE THERMOCOUPL WITH TEMPERATURE
S.NO TEMPERATURE(DEGREE CELSIUS)
THERMO EMF(MILLIVOLT)
TABULATION: 3 VARIATION OF RESISTANCE OF THERMISTOR WITH TEMPERATURE
S.NO TEMPERATURE(DEGREE CELSIUS)
RESISTANCE(KILO OHM)
PROCEDURE: 1. Experimental setup is as shown in figure. Connect the thermal calibrator to the power supply. 2. Insert the RTD, Thermocouple and thermistor into the thermal calibrator and set the range of temperature from room temperature to _________ degree 3. Connect a multimeter to the two leads of RTD, Thermocouple and the thermistor and measure the output resistances and voltage for each 10 degree rise in temperature to maximum temperature. 4. Repeat the same procedure in the reverse order 5. Tabulate readings and plot graph to study characteristics i)Voltage Temperature for thermocouple ii)Resistance-Temperature for RTD and thermistor 7.Set the temperature of calibrator to room temperature and allow it to cool down. RESULT:
Inference about the experiment :
3.STUDY OF AC AND DC CHARACTERISTICS OF LVDT AIM To study the AC and DC characteristics of the given LVDT APPARATUS REQUIRED: S.No Components/Apparatus Specification or Range Quantity 1. 2. 3. 4. 5. 6. 7. LVDT DSO Function generator Resistor Capacitor Diodes Multimeter
CIRCUIT DIAGRAM 1 : AC CHARACTERISTICS
CIRCUIT DIAGRAM 2 : DC CHARACTERISTICS
Input Excitation voltage: Input Excitation Frequency: TABULATION 1 : S.No Displacement (mm) Ac voltage (mV) Dc voltage(mV)
PROCEDURE: a) To study AC Characteristics: 1. The connections are made as shown in circuit diagram 1. The core is kept at one extreme end and the output voltage is noted at this point. 2. Next the core is moved slowly to the other end and displacement is measured using screw gauge and the corresponding voltages are noted. 3. The point where the output voltage is zero is the null point. 4. Draw the graph between displacement Vs AC output voltage. Find the null point of the given LVDT and the range of displacement. b) To study DC Characteristics: 1. The connections are made as shown in the circuit diagram 2. 2.Next the core is moved slowly to the other end and the displacement is measured using screw gauge. The value of the output voltage was taken after a particular displacement was moved. 3. The point where the output voltage is zero is the null point. The readings were plotted on a graph sheet.
RESULT: Inference from the experiment:
4.EFFECTS OF INTEREFERING AND MODIFYING INPUTS FOR THE GIVEN MEASUREMENT SYSTEM AIM: To study the effect of interfering and modifying inputs on a system of strain gauge mounted on a cantilever beam using quarter bridge configuration. APPARATUS REQUIRED: Sl.No Name of the component/equipment Specifications(Range/Value) Quantity 1 Strain gauge mounted on cantilever beam(quarter bridge configuration)
2 DC regulated power supply
3 Weights 4 IC temperature measuring sensor
5 Heating strip-bimetallic strip
6 Breadboard 7 Resistors 8 Digital multimeter
TABULATION: a) The effect of modifying input Sl.No Load(g) Vs = Output voltage Vo(mv) Vs = Output voltage Vo(mv) Vs = Output voltage Vo(mv)
b) The effect of interfering input S.No Load(g) Temperature = Output voltage Vo(mv) Temperature = Output voltage Vo(mv) Temperature = Output voltage Vo(mv)
EXPERIMENTAL SETUP:
CIRCUIT DIAGRAM:
PROCEDURE: a) Modifying input 1. Connect the circuit as shown in figure. Do not give any supply to the heating element or to the IC temperature sensor LM 35. 2. Keep the supply voltage constant at 4V and note the output voltage when there is no load. 3. Keep the weights on the cantilever beam and note the output voltage for different values of weights using a multimeter. 4. Repeat steps 2 and 3 for different values of supply voltages. 5. Plot a graph between the output voltage and the load on the cantilever beam and note down the sensitivity of the three different readings. b) Interfering input 1. Make the circuit as shown in figure. For the cantilever beam setup use the other figure. Give the heating element a 220V.single phase power supply and IC temperature sensor (LM 35) a supply voltage of 5V. 2. Keep the supply voltage constant at 5V. 3. Allow the strain gauge setup to be heated and note down the temperature with LM 35 of sensitivity 10 mV/degree Celsius. 4. At a temperature different from room temperature note down the output voltage at no load conditions and also for different weights. 5. Repeat step 4 for another temperature. 6.Plot the graph for the variation of output voltage with load and note the effect of interfering input. RESULT: Inference from the experiment
5.CHARACTERISTICS OF PROXIMITY SENSORS
AIM
To obtain the characteristics of proximity sensor.
PROCEDURE: a) Current output proximity sensor (UP-1000 PVPS 24(M)) 1. The sensor is excited with a 24 V DC power supply as shown in figure. 2. A resistance of 470 is connected across the green and white wires from the sensor. An ammeter is connected in series with the loop to get the output sensor. 3. A resistance of 180 is connected across yellow and white wires from the sensor. 4. The target is placed at ______ cm distance from the sensor and moved away in steps of 5cm at a time and the corresponding output current is noted. 5. Plot the characteristics of current Vs distance, b) Voltage output proximity sensor (UP 2000 PVPS 24 1S(K) 1. The sensor is excited with a 24 V DC supply. 2. The output voltage is taken across the green and white wires, assuming white to be grounded. 3. The effective resistance of 180k is connected between the yellow and white wires as shown in figure3.the target is placed at----------- cm from sensor and moved away in steps of------cm each at a time. The output voltage corresponding to each step is noted. 4. Plot the characteristics of output voltage Vs distance. RESULT: Inference from the experiment:
6.MEASUREMENT OF NATURAL FREQUENCY AND DAMPING RATIO OF THE GIVEN SECOND ORDER SYSTEM 6.1.MEASUREMENT OF DAMPING RATIO AIM: To determine the damping ratio of second order system experimentally using logarithmic decrement method. APPARATUS REQUIRED: Sl.No Equipment Required Specifications Quantity 1 Piezo-laminated Cantilever beam 2 Digital storage oscilloscope 3 Connecting probes
TABULATION: Sl.No No:of cycles(r) i A (V) r i A (V) r i i A A r ln 2 1
EXPERIMENTAL SETUP:
PROCEDURE: 1. The experiment setup is shown above. 2. An impulse input is applied to the free end of the cantilever beam by tapping it 3. This causes the cantilever beam to vibrate and hence the PZT gives an electrical output observable to the DSO. 4. The output is a continuous exponentially decaying sinusoidal wave. The amplitudes of the i th and the i+r th waveforms are noted down where r is the number of cycles between them. 5. Substitute the values of Ai, A(i+r) in the formula to get the damping ratio .
6. By varying the number of cycles considered during different times of application of impulse input, several readings are taken and their mean is noted down as the damping ratio.
6.2. MEASUREMENT OF NATURAL FREQUENCY AIM: To measure the natural frequency of a Piezo-laminated cantilever beam APPARATUS REQUIRED: Sl.No Equipments Specification Quantity 1 Piezo-laminated cantilever beam
FUNCTION GENERATO R CHARGE AMPLIFIER DSO CHARGE AMPLIFIER CIRCUIT C=0.01F
FROM PZT OSCILL0SCOPE +
TABULATION: Sl.No Frequency(Hz) Output voltage without charge amplifier,Vo(volts) Output voltage with chargeamplifier,Vo(volts)
IC741
PROCEDURE: i) Without charge amplifier a. Connect the actuator to the output from function generator. b. The output from the piezo-electric sensor is fed directly to oscilloscope. c. Vary the frequency of the input sinusoid in the range (0-60)Hz and observe the output with aid of oscilloscope and note down the readings. d. Observe for the resonance peak at which very high output are observed. ii) With charge amplifier a. Connect the circuit as shown in figure. b. Cary the frequency of the input signal in the range (0-60)Hz. c. Repeat steps c and d of without charge amplifier. RESULT: Inference from the experiment
7.LOADING EFFECTS OF POTENTIOMETER AND CHARACTERISTICS OF OPTOCOUPLER
7.1.LOADING EFFECTS OF POTENTIOMETER
AIM: 1. To study the loading effect of a rotary potentiometer. 2. To study the characteristics of optocoupler
APPARATUS REQUIRED: Loading effect of potentiometer Sl.No Equipments Required Specifications Quantity 1 Rotary potentiometer 2 Analog Voltmeter of different ranges
3 Regulated DC power supply 4 Multimeter 5 Connecting wires
TABULATION: Sl.No: max
Voltmeter Rm= Range= Voltmeter Rm= Range= Vo Vi Vo
Nonlinerity Vo Vi Vo
Nonlinerity
CIRCUIT DIAGRAM:
PROCEDURE: 1. The experimental setup is made as per in figure 2. The input ports given on the potentiometer is connected to 5V DC 3. After all connections are made switch on the DC power supply. 4. Using the voltmeter (0-5V), measure the output voltage for different angles of rotation. 5. Measure the output voltage for different angles using 0-10V voltmeter. 6. Draw a graph between Vo/Vi and max and also the graph representing the nonlinearity
7.2.CHARACTERISTICS OF OPTOCOUPLER AIM: To study the characteristics of a i)photodiode ii)phototransistor APPARATUS REQUIRED: Sl.No Equipments Required Specifications Quantity 1 Photodiode 2 LED 3 Ammeter 4 Rheostat 5 Resistance 6 dc supply 7 npn transistor 8 IC-chip (MCT-2E).
Circuit diagram i) Photo diode RHEOSTAT + _ (0-20)mA +5v V IN ID55
1. The circuit is shown as in the figure. 2. The resistance is varied using a pot so that input current is varied.The output current and output voltage is noted. 3. The reading is tabulated and graphs are drawn. 4. The same procedure is repeated for circuit 1 and 2.
RESULT:
Inference from the experiment Sl.No I/p current(mA) O/p current(mA) Voltage(V)
8.CHARACTERISTICS OF HALL EFFECT SENSORS
AIM:
To study the characteristics of Hall effect sensor.
APPARATUS REQUIRED:
Sl.No Equipments Required Specifications Quantity 1 Hall Probe 2 Digital Hall effect set, Model DHE-22
3 Electromagnet,Model-EMU- 50/EMU-75
4 Constant current power supply 5 Digital Gauss Meter
PROCEDURE 1. Connect the widthwise contact f the Hall probe to the terminals marked Voltage and Lengthwise contact to the terminals marked Current. 2. Switch On the hall effect set-up and adjust the Current (say few mA). 3. Switch over the display to Voltage side. 4. Place the probe in the magnetic field as shown in the figure and switch ON the electromagnet power supply and adjust the current to any desired value. Rotate the hall probe till it become perpendicular to the magnetic field. 5. Measure hall Voltage for both direction of the current and the magnetic field. 6. Measure the hall voltage as a function of the current. Keeping the magnetic field constant plot a graph. 7. Measure the hall voltage as a function of the Magnetic field. Keeping a suitable value of current as constant plot the graph. 8. Measure the magnetic field by the Gauss meter. RESULT: Inference from the experiment