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I. INTRODUCTION
Trim effect is a term given to describe the changes in an
oscillators frequency versus temperature characteristic
resulting from an adjustment to its nominal frequency. The
effect is well-known and generally tolerated by oscillator users
primarily because of the inability of oscillator manufacturers
to provide a mitigation for it. In some cases, trim effect has
been observed to degrade oscillator temperature stability in
excess of 10X at adjustment extremes. It is the result of nonlinear characteristics of the resonator and variable capacitance
diode used to adjust the frequency and exists to varying
degrees on all crystal oscillators.
The compensation of oscillator trim effect has received
very little coverage in literature. [2] describes previous work
performed by Greenray Industries where a precision TCXO
was compensated for both temperature stability and trim effect
using an Artificial Neural Network. [3] describes work
performed by C-MAC, where a temperature sensor input was
(1)
Start
Temp
Func
Code
87.453
80.492
36.828
17.914
-27.281
-33.297
-45.648
4
4
3
3
2
3
2
Function Coefficients
f
e
d
c
1.1776889E02 -5.9895987E02 -1.2097652E02
6.4067345E01 -6.1476533E02 2.2137929E03
-4.3997589E01 2.9648705E02
9.1261340E00 -5.9761029E01
-9.9011705E00
1.8459383E01 -1.0935881E02
8.1593802E01
b
4.4996006E03
-3.5456236E03
-6.6601255E02
1.2911571E02
3.8274398E01
2.1656377E02
-2.6471459E02
a
-5.7335216E03
2.1328487E03
5.0063616E02
-9.0097423E01
-3.4903344E01
-1.4125628E02
2.1591785E02
b*T+ a
c * T2 + b * T + a
d * T3 + c * T2 + b * T + a
e * T4 + d * T3 + c * T2 + b * T + a
f * T5 + e * T4 + d * T3 + c * T2 + b * T + a
1/(e(-a * T + b))
a + b * Ln(c * T + 1)
a * e(T * b)
Total Elements
0
2
3
2
0
0
Used
0
0
in
Total Storage
Elements Rq'd
4
5
6
7
8
4
Current Solution
5
4
0
10
18
14
0
0
42
0
0
(2)
(3)
V. CONCLUSION
The data presented in this paper demonstrates that the MSAC technology provides a novel approach for compensating
electronic oscillators for temperature stability as well as
stability degradation resulting from trim effect.
The
segmenting feature of this technology permits the curve fit of
any data set to a user-defined level of error, up to the noise
level of the data itself. If the performance of the device is
repeatable, this technology permits the compensation of
temperature stability to magnitudes normally only achievable
with OCXO designs, but with only a nominal increase in
current over that of a TCXO. This methodology is also
useable for compensation of other environmental effects
commonly seen in crystal oscillators, such as hysteresis,
warm-up, aging, pressure, and acceleration sensitivity to name
a few. If the proper sensing circuitry is contained in the
oscillator and the environmental impact on frequency is
repeatable, the M-SAC methodology should provide a means
with which to fit and compensate for the behavior. Integrating
oscillators into larger systems can sometimes cause
unexpected problems due to differences between testing
environment at manufacture and the environment in the
application.
The M-SAC technology allows for easy
integration at the system level, providing a means of
compensating the oscillator in its final form and environment.
This can provide superior performance over traditional
methods. Additionally, the building blocks of this technology
are easily adaptable for integration into an ASIC. Whether
integrated into an ASIC or simply assembled from the
individual building blocks, the M-SAC technology is wellsuited and easily adaptable for incorporation into oscillators,
systems, or any product or device requiring compensation for
environmental effects or other measurable stimuli.
REFERENCES
[1] Raymond L. Filler et al., Specification and Measurement of the
Frequency Versus Temperature Characteristics of Crystal Oscillators, 43rd
Annual Symposium on Frequency Control, 1989
[2] Esterline, J.C.; , "Trim Effect Compensation using an Artificial Neural
Network, European Frequency and Time Forum & International Frequency
Control Symposium (EFTF/IFC), 2013 Joint, Prague, 2013, pp. 963-966.
[3] Ward, K.R.; , "A novel approach to improving the stability of TCVCXO
temperature performance," Frequency Control Symposium and PDA
Exhibition Jointly with the 17th European Frequency and Time Forum, 2003.
Proceedings of the 2003 IEEE International , vol., no., pp. 473- 477, 4-8 May
2003