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Submitted by:
G PRAVEEN KUMAR
(10E51D5705)
FEATURES OF GOOD MEMORY
ABILITY TO RETAIN STORED CHARGE FOR
LONG PERIODS WITH ZEROAPPLIED OR
REFRESHED POWER.
HIGH SPEED OF DATA WRITES.
LOW POWER CONSUMPTION.
LARGE NO: OF WRITE CYCLES.
Actually none of the present memory
technologies combine these features.
RECENT ADVANCED MEMORY
TECHNOLOGIES
TOP ELECTRODE
CHALCOGENIDE LAYERS
RESISTIVE HEATER
THERMAL INSULATOR
PROGRAMMING
The OUM cell is programmed by application of a current
pulse at a voltage above the switching threshold.
The programming pulse drives the memory cell into a
high or low resistance state, depending on magnitude
of the pulse voltage.
Information stored in the cell is read out by measurement
of the cell’s resistance.
OUM devices are programmed by electrically altering
the structure (amorphous or crystalline) of the small
volume of chalcogenide alloy.
OPERATION
Ovonic Unified Memory is a new semiconductor memory
technology, originally invented by Energy Conversion
Devices, Inc. (ECD), and now licensed exclusively to
Ovonyx , Inc.
OUM uses a reversible structural phase-change
from the amorphous phase to a crystalline phase in a thin-
film chalcogenide alloy material as the data storage
mechanism.
The small volume of active media in each memory cell acts
as a fast programmable resistor, switching between high
and low resistance with >40X dynamic range.
BASIC DEVICE OPERATION
DURING AMORPHIZING RESET
PULSE, THE TEMP
OF MATERIAL EXCEEDS
MELTING POINT
ELIMINATES THE POLY
CRYSTALLINE ORDER OF
MATERIAL
CRYSTALIZING SET
PULSE IS OF LOWER
AMPLITUDE
SUFFICIENT DURATION TO
MAINTAIN THE DEVICE
TEMP IN RAPID
CRYSTALLIZATION RANGE
READING & WRITING DATA
TO READ DATA
TO WRITE DATA
CHALCOGENIDE IS HEATED READING IS DONE BY
ABOVE ITZ MELTING POINT SIMPLY MEASURING THE
TO RESET STATE RESISTANCE CHANGE.
[HIGH RESISTANCE] HIGH RESISTANCE = SET
HEATED BELOW ITZ STATE
MELTING POINT FOR 50nS
TO SET STATE LOW RESISTANCE = RESET
[LOW RESISTANCE] STATE
V-I CHARACTERISTICS
AT LOW VOLTAGES THE DEVICE
EITHER LOW RESISTANC ~ 1K OR HIGH
RESISTANCE >100K
THIS IS THE READ OPERATION REGION
TO PROGRAM THE DEVICE , A PULSE
OF SUFFICICIENT VOLTAGE IS APPLIED
SWITCHES TO DYNAMIC ON STATE
FOR RESET IT REQUIRES A VOLTAGE
GREATER THAN V th
V th IS DEVICE PARAMETER ie, .5 v to .
9v
THE RECIPROCAL OF V-I CURVE IN
DYNAMIC ON STATE IS THE SERIES
DEVICE RESISITANCE
R-I CHARACTERISTICS
AS AMPLITUDE INCREASES,MOVING FROM
LEFT TO RIGHT THE DEVICE CONTINUES TO
REMAIN IN SET STATE
INCREASE IN AMPLITUDE BEGINS TO RESET
THE DEVICE
WITH FURTHER INCREASE RESETTING THE
DEVICE TO STANDARD AMORPHOUS STATE
PROGRAMMED RESISTANCE REDUCED AS
CRYSTALLIZATION OF THE MATERIAL IS
ACHIEVED
FURTHER INCREASE IN PROGRAMMING
CURRENT FURTHER CRYSTALLIZES THE
MATERIAL ,WHICH DROPS THE RESISTANCE
TO MINIMUM VALUE
DEVICES CAN BE SAFELY RESET ABOVE
SATURATION POINT
O U M ADVANTAGES
OUM uses a reversible structural phase change.
(amorphous phase crystalline phase)
Small active storage medium.
Simple manufacturing process.
Simple planar device structure.
Low voltage single supply.
Reduced assembly and test costs.
Multistates are demonstrated.
High temperature resistance.
Easy integration with CMOS.
OUM APPLICATIONS
OUM has direct applications in
o computers,
o cell phones,
o graphics-3D rendering,
o GPS,
o video conferencing,
o multi-media,
o Internet networking and interfacing,
o digital TV,
o telecom,
o digital voice recorders,
o DVD,
o networking (ATM).