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Elemental Limits of Detection in 5iO, and SRM Matrices Using Mining Analysis -rvffie The Niton6) XL3r GOt.l.ill+ Scrics x-ray fluor:escencc {XRF)anall.zcr is the utrtirnate choice in features ar-rd perfornrance. l['he chart below details the sensitivity, or LODsr, of the Niton XI-3r GOLDD+ Serics using mining analysis for an Sit), rnatrix, a typical soil rnatrix iSiO,

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,1-

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l .'*.

with Ca/Fe). and SRh,l nlxtrix"

\
60s per

Tipe Matrix
Ba

filter wlout He
SRM
I

si0,
35
12

sb
$n

i sio,nr**cu l+sl tl

45
1ri
I

tc

cd
Pd

I
5 PVS 3

Ag

Mc
Nb Zr

J
3 3 3

$r
fib

8i
As 5e Au
Pb
q

I'i lul
t5l tt ll
It lJl

lul tt

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iul

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Limits ol detecfian {L0Ds} are dependenl on th* fcllawing facfars:

" Testing time

2A

t0

. inrerierenceslmalrrx
. Levei nf st:tistical rantid*nr;c
LCDs are c:leulated as lhree standard

lA/sl

ais
J
3 5

deviaticns {99.7!;" confid ence intervalJ for each element. using 60-sacond
analysis times per irlter.

Please Nate:
5 3 5 5 3

0ngcing researclr arrti aCvancene*ls

rn our Niton XLSI

fi0LDD+ Series

anelyzers will lead to rontinuai

!mpr*vement in many oithe values

detaried in this chan. Contact a

Therna Fishr:r Scienti{ir r:ffice or your

local representative {or the latest periormance spectliratir:ns, Acir:ai analysis tjme is based on your requirements, antj, in mast
cases, shorter times wili give you

t6
E

10

Zn
Cu

I
12

Iili
Co Fe

25

?fl

Mn
Gr
1'

60
2A 10 10

I rsn tl lNiAl lasl tt

l:ol
it

l10 ioni t--l I rs tt 15 |

tl

Irsl lt

20
l

10 60

I
|

15

the detection iimits you require.

3il
I

Fnr example, if analysis time lvas red

Lr

ed iron,. 60 sccorrrls/iilter to

100

l5 secondslfrlel tl

el lhe detecticn

N/A
85
?q
I

lim;ts oi:tained wculd be twice the values shown in the chart. Similarly,

zisiq Thertt Fishet

Scientt{tt irc.

Ti
Ca K

50 40

I'oi
I tl
50*
nr+ JJ 220"

i'ol

130

increasing the anslysis tir* wiil

redlce the detection limits

by the

35

sqilare fcot of the increased time. fuS

s0
I

A;i tights ftseivaf.

Ai! Iadaaarts arc lhe
-f!,e;ftio

yapeftr

if

Fisfier
affd

cl s
P

Sr,tr;lfc l+r

il:

60 |
I I

st;hsidiarlx.

afr IV

I I
I I
I

Spd4siiE\s, |erns atid pritiig tre subi5t io eh1flJe.

Not ai! praiiucts ere avaliahle

ii all L.aililtiffi. Please con$u{t yo$ !6al ffles rearresffitatire

fsr details.

si
AI Mg

r3u l^^^* I tua' NIA I N1A*

500
3500

I rrrra I ro luu-l tttgCI 175*l { I ooo i ,ro. ttl

jvn|ru'a"I
|

rllA

Appficaticri-steri{ir

N/A
NIA

N/A = Not applicabie

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I I I

75 ! 175 I 300 | N/A I

I I I I I

S5"

1.

freititi:n

ar,l ?rr,cs.jlre isr t,ls I'jetrillinatiril

90t
230*

iletertjon ljrx,t 4S CFR, Parr 136, Appendi;< B. Revisirn 1.'i1. U.S. Environrnental Protectirn Agency. U.S. Governmenl Prinlirg 0llice: W{rh;ngtOn, itc,1ss5.

cl tlie llethad *!

NiA*
1000. 2000"

*t{44ez;.orlzgro

750"

1000

6000

| 1500" |

500"

2500
I
I

$500

| |
I

Element fist slraurn is no1 exhaustive. Fnr limits

o1 Jstection for elements nnt shown, please contact a Therms Fisher Scientific office or ylur local representattve.

"L0Ds drsplayed with the use of helium.

Thermo Scientific Portahte XRF Analyzers for Rare Earth Elements

Elemental Limits of Detection in

sio,

and sRM Matriies using MiningAnalysis

Thcrmo screnrific prrtalrle XRF analyzer:s are availalllc lvith 1,1;'1 choic:e rf cxciratior optio's, providi*g the oprimai e ,lnfig'rflti,,n f'r vour ana11'1ical needs. l'hc correlation cocfiir icnrs anti rr.pe arahiliry data for the key elernenrs in rare earth eremenr (REE) cre analysi.s demonstrate .the excellent accuracy a'd precision ,f borh rhe irandhcld rhcrmo seicntific ;r-iro' XLp ,iz2lt and thc Nirono XI-.]r (l{)l.Di)+ r-ra}- fluorescence {xRF) anah.zrrs. Th.- ch:rrr belou, derails the sensitivity. or LOI)si, rf rhe Niron XL3t coLDIJ+ and the Niton XLp -522K using nrining analvsis for an SiO, matrix, These are oprimal values and rvrll deg'ade srighdv rvirh real world materials, depending on the rlrher elernents present iir the sample.

te

i,

"q;

t{*igh; "
Limits of detection {l0Ds} are depefident on the follcwing factors:
. Testrng tim
e

. lnterf erenc esr'natlix . Levei oistatistital coniirience

60s per {ilter

dcut

He

Flements

Niton

XLI

Yttrium (Yl*
Lanthanum {La}* Cerium {Ge}* Praseodymium {Pr}* Neodymium {ltldl* Samarium {$m} Europium (Eul

5
50 60

G0LDD+ |

L0Ds are calculaled as ihree siandarri devrattcns 199.7% cnn{idencc intcrvell

Uiton Xtp 52ZK

1r
25 40 30

for each element, using 60,second

analysis times per fiite
r.

Please Note:

0ngoing research and advancemenrs

in our instrument technology will lead

qn

,5U

to contiflual improvement in many NA NA NA

4U

ofthe values deiailed

40 60

in this chart Contait youf local Thermo Scientrfic p0rta bie xRF analyzer representative

Gadolinium {Gd}
.Mslhe'-d$
emiic.Ni@nlton'

Te*ium {Tbl
Dysprosium {Dy}

for the latest performance

NA NA

40
80

specilicaiians.

Element lrst shown is not exhaustive- For limits of deteciron tor elements not shouln, please rontact your local Titermo Suientjfj! pcrtable XRF analyzer rslrreseiltaltvc. High Y concentration may suggest the presence of high concentrations of healy RFE, such as Gd. Tb, and Dy.

Your detecticn limit requirements

will

drctate the actual analysts time. For

exarrple, rf analysis time was reduced from

60

secondslfiiter to

seconds/

filter, then the detection limits obtained

n0ptional elenents avatlable on a Niton XL3r G0LDD+ analyzer.

fl/ould be twrce the values shown the chart. Simiiarly, incrsasing the

rn

analysis iime wjil reduce the detection limits bv the sq uare ioot of the

increased time.
NA -- Not applicable

@2012

ftHno fisher
Saaottfulnt

,4!l ftShrs

EffivAl,
are

A{I.xlsna*s
propary tf
SciBntifrt

the fhvno fisher

ht.

and

its

iratliitte lo !h! teletniind!!ot: ile,-"rtipt) Litnit,40 CFfi. Fart 1 3E, ^t1etitj{i AppenrJix B. Revisi0r 1.11. tJ.S. Eitvirollental Protectron Ageitcy. US. Govenrferil Pftnlirg
Deiitiiitn
ihe
a;:,1

il

sirbs?lsres

0fticer \ry:shington.

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.9ttn:fiuticns, ierns ani

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f\hi s!! sretiutis *e available il1 a!! mEb 6. Pkase cffiult yLnrlgrat sles r4l.wtat;re

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