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1017/S1431927607076398
Microsc Microanal 13(Suppl 2), 2007 Copyright 2007 Microscopy Society of America
641 CD
[6] This work was supported by the Office of Naval Research through MURI N00014-06-1-0530, and N00014-06-1-0204. The authors are thankful to Hu Cao for sample preparation.
Fig. 1 Dark-field image of Fe-19% Ga taken in [001] zone axis orientation; upper right corner: corresponding diffraction pattern. Dark-field image (formed by selecting a weak {010} DO3 superlattice reflection) shows the embedded DO3 nanostructures a)
Fig. 2 High-resolution lattice image taken in [001] zone axis orientation; inset: power spectrum where solid circles show {110} reflections, dotted circles show {010} DO3 superlattice reflections and dotted lines show spot splitting in {220} reflections. b)
Fig. 3. Inverse FFT of the image in Fig.2 (a) by only including contribution from weak {010} spots (DO3). (Dotted box shows the Burgers circuit and the arrow indicates the Burgers vector.) and (b) by only including strong {110} spots (A2). a) b)
Fig. 4. (a) Simulated image (with calibration 1 pixel= .02 nm) at thickness of 1.50.5 unit cell and defocus of -120 nm with atom overlay. Blue and red circles represent Fe and Ga atoms, respectively (b) Projection of this crystal structure in [001] projection where light and dark colored spheres represent Fe and Ga atoms, respectively.