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and +90
i=1
x
i
The variability of the data set is given by the standard deviation. Since we
always take a limited number of samples, the experimental standard deviation
is a better estimate of the variability of the data.
s
x
=
_
1
N 1
N
i=1
(x
i
x)
2
While the experimental standard deviation gives an indication of the spread
of the data around the mean, the experimental standard deviation of the mean
(ESDM) give an indication of the spread of the means should this experiment
be repeated, assuming that all conditions stays the same.
s
x
=
s
x
N
The degrees of freedom of a standard deviation is one less than the number of
data points in the set.
= N 1
3.3.2 Type B uncertainty evaluations
A Type B evaluation is performed if an uncertainty is evaluated by using any
means other than statistical analysis of a data set. This may include (but
c NMISA, 2010 8
An overview of the GUM
is not limited to) data found in certicates, in handbooks, from manufactur-
ers specications, the history of the equipment or from the experience of the
metrologist/technician.
When dealing with uncertainty contributors, with no data for statistical analy-
sis, we try to draw a frequency distribution graph (probability density function)
by asking ourselves how we think the values will be distributed.
For example:
Each digital instrument rounds the internal value before displaying it.
This is eectively an error in the measurement.
For example, if an instrument displays a value of 5,1, the internal
representation of this value is above some trigger point at 5,05 and
below some trigger point at 5,15.
The range of possible true values are the same as the smallest
displayable increment of the display (in this case 0,1).
There is an equal likelihood that the true value can be anywhere
between the trigger points; making this a rectangular (or uniform)
probability distribution.
From standard statistics, we know that:
The best estimate of the distribution is given by the expected operator:
x = E[X] =
_
+
xp(x)dx
The standard deviation is given by the second moment around the mean:
2
= E[(Xx)
2
] =
_
+
(x x)
2
p(x)dx
In typical physical metrology and testing, only a small number of distributions
are typical.
All of the following distributions are symmetrical around the midpoint, making
the best estimate equal to the midpoint of the distribution.
The standard deviation is equal to the semi-range (distance between the mid-
point and any limit) divided by the following factor.
Distribution Divisor
Rectangular
3
Triangular
6
U-shaped
2
The degrees of freedom of a Type B evaluation must be estimated. One way
of doing this is to think about how reliable the data is and assign it a number
between 0 and 100. The degrees of freedom is then:
1
2
_
100
100 R
_
2
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An overview of the GUM
3.3.3 Sensitivity coecients
A sensitivity coecient scales and converts the unit of the uncertainty into the
unit of the measurand.
It is calculated by nding the partial derivative of the mathematical model in
terms of the uncertainty.
c
i
=
f
x
i
3.3.4 Uncertainty contribution
The uncertainty contribution, u(y
i
), is then (per denition) equal to the stan-
dard uncertainty, u(x
i
), multiplied by the sensitivity coecient, c
i
.
u(y
i
) = u(x
i
) c
i
It is equivalent to a standard deviation scaled and converted into the unit of
the measurand.
3.4 Combine all the uncertainty contributions
The combined uncertainty is calculated using the central limit theorem.
u
2
c
(y) =
N
i=1
N
j=1
f
x
i
f
x
j
u(x
i
, x
j
) =
N
i=1
N
j=1
c
i
c
j
u(x
i
, x
j
) (1)
If there is no correlation between components, it simplies to
u
2
c
(y) =
N
i=1
_
f
x
i
_
2
u
2
(x
i
) =
N
i=1
c
2
i
u
2
(x
i
) (2)
The formula for calculating combined standard uncertainty is based on a Taylor
Series Expansion truncated at the rst term. For very non-linear models, the
second term of the expansion must also be taken into account.
u
2
c
(y) =
N
i=1
_
f
x
i
_
2
u
2
(x
i
) +
N
i=1
N
j=1
_
1
2
_
2
f
x
i
x
j
_
2
+
f
x
i
3
f
x
i
2
x
j
_
u
2
(x
i
)u
2
(x
j
) (3)
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An overview of the GUM
3.5 Calculating the eective degrees of freedom
The degrees of freedom of the combined standard uncertainty is required to be
able to expand the uncertainty to a higher level of condence. The eective
degrees of freedom can be calculated using the Welch-Satterthwaite formula.
eff
=
u
4
c
(y)
N
i=1
u
4
(y
i
)
i
(4)
3.6 Expanded uncertainty
The expanded uncertainty is found by multiplying the combined standard un-
certainty, u
c
(y), with a coverage factor, k, chosen from a Student-t table based
on the required level of condence of the result and the eective degrees of
freedom of the combined standard uncertainty.
U = k u
c
(y) (5)
3.7 Reporting the result
The measurement value and uncertainty calculations do not mean much unless
they are reported in a way that is useful. The report must not be ambiguous
or confusing in any way. All relevant data must be reported.
Report the value and uncertainty to the same resolution (number of digits)
and include the units (with both preferably in the same units).
It does not make sense to report an uncertainty with an excessive number
of digits. It is usually sucient to report two or three signicant digits in
the uncertainty.
When reporting an expanded uncertainty, it is important to report the
level of condence or the coverage factor or both.
c NMISA, 2010 11
An overview of the GUM
4 An example
An engineer is measuring the current from a current source by passing the
current through a resistor and measuring the volt-drop across it.
The current source was designed for a 1A output.
Three voltage measurements were performed. The average was 10, 000 274V
with an experimental standard deviation of 0, 000 153V .
Three resistance measurements were performed. The average was 10, 000 3
with an experimental standard deviation of 0, 005 4 .
The digital multimeter was certied to comply to the manufacturers spec-
ication. The specication stated that the accuracy, when measuring 10V,
is 0, 000 4V while the accuracy, when measuring 10, is 0, 005 .
Modeling the measurement
The relationship between current, voltage and resistance is given by Ohms law.
I =
V
R
Identifying sources of error
I
V
R
Specication
Resolution
Repeated measurements
Specication
Repeated measurements
Resolution
L
e
a
k
a
g
e
c
u
r
r
e
n
t
Revisit the model
The original model does not contain any components to handle the leakage
current.
c NMISA, 2010 12
An overview of the GUM
Either the model must be changed to include the correction with the
uncertainty of the correction, or the uncertainty must be increased to
cover the correction and uncertainty of the correction.
This will be treated as a larger uncertainty and not as a correction.
The original model remains unchanged.
Quantifying the sources of error
The voltage specication was found to be 0, 000 4V . This is the semi-
range. The specication comes from the manual of the voltmeter with no
other information. The probability distribution is rectangular.
The resolution of the voltage measurement was 1V or 0, 000 01V . This
is the range. The probability distribution is rectangular.
The experimental standard deviation of three measurements was 0, 000 153V .
The measurements were performed under repeatability conditions, which
means that the standard uncertainty is (per denition) the ESDM, or
0, 000 088 334 591.
The resistance specication was found to be 0, 005 . This is the semi-
range. The specication comes from the manual of the voltmeter with no
other information. The probability distribution is rectangular.
The resolution of the resistance measurement was 0, 000 1 . This is the
range. The probability distribution is rectangular.
The experimental standard deviation of three measurements was 0, 005 4 .
The measurements were performed under repeatability conditions, which
means that the standard uncertainty is (per denition) the ESDM, or
0, 003 117 691 454.
The input impedance of the voltmeter was specied as more than 10 M.
This means the uncertainty is one-sided by 1, 000 002 A, since the cal-
culated current will always be less than the true current. To keep things
simple, it will be treated as the semi-range of a symmetrical rectangular
distribution.
Sensitivity coecients
Sensitivity coecients converts the units and scales the standard uncertainties
into the unit and scale of the measurand.
c
V
=
I
V
=
V
_
V
R
_
=
1
R
=
1
10, 000 3
= 0, 099 997 000 09
1
c
R
=
I
R
=
R
_
V
R
_
=
V
R
2
=
10, 000 274V
10, 000 3
2
eff
=
u
4
c
(y)
N
i=1
u
4
(y
i
)
i
=
(424, 986 671 1 10
6
)
4
(8,833 194 10410
6
)
4
2
+
(311,758 981 810
6
)
4
2
= 6, 906
c NMISA, 2010 14
An overview of the GUM
Coverage factor
The customer requested a 95% level of condence.
One can use on a lookup table to obtain the coverage factor. Using that
method, the coverage factor for 6 degrees of freedom is 2,447.
Result
Combined standard uncertainty, u
c
(u) 424, 986 671 1A
Eective degrees of freedom,
eff
6, 906
Required level of condence 95%
Coverage factor, k 2, 447
Expanded uncertainty, U 1, 039 942 384mA
Measurement value: I =
V
R
=
10,000 274
10,000 3
= 0, 999 997 400 1A
The current from the source was found to be
(1, 000 0 0, 001 1)A
at a level of condence of 95%.
5 References
1. BIPM, IEC, IFCC, ILAC, ISO, IUPAC, IUPAP, and OIML, Evaluation
of measurement data - Guide to the expression of uncertainty in measure-
ment, Joint Committee for Guides in Metrology, JCGM 100, September
2008, Available online at
http://www.bipm.org/utils/common/documents/jcgm/JCGM_100_2008_E.pdf
2. S.K. Kimothi, The Uncertainty of Measurements, Wisconsin: Quality
Press, 2002.
c NMISA, 2010 15