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IEEE Transactions on Industrial Electronics


Data driven control and process monitoring for industrial applications
The Theme: Due to the increasing demands on system performance, production quality as well as economic operation, modern
technical processes are becoming more and more complicated and the automation degrees of such systems are therefore significantly increasing. As a result, the control and monitoring of such complex processes is posing a great challenge due to the possible unavailability of sufficient quantitative knowledge about the process. In contrast to model-based approaches, data-driven control and process monitoring methods make use of the information obtained from the available process measurements to describe various complex behaviors, thus have formed an efficient alternative for control and monitoring issues with complex industrial applications. The primary objective of this Special Section is to provide a forum for researchers and practitioners to exchange their latest achievements and to identify critical issues and challenges for future investigation on modeling, control, monitoring and optimization of complex industrial applications in a data-driven environment. The papers to be published in the section are expected to provide recent advances of data driven approaches in particular new ideas and algorithms with industrial applications. Topics include, but are not limited to, the following research areas: Data pre-processing (for modeling, control, monitoring) Data-driven modeling and system identification in industrial process Data-driven controller performance monitoring and assessment Data-driven controller design Stability and robustness issues for data-driven methods New architectures and structures for data-driven control schemes with industrial applications Data-driven plant-wide optimization in complex industrial process Data-driven reliability, fault diagnosis, fault predictability analysis and prognosis Data-driven fault accommodation scheme Data driven applications for complex processes especially in industrial electronics

The papers should contain both theoretical and practical/experimental results and will be subject to specific review procedures of TIE.

Manuscript Preparation and Submission

Follow the guidelines in Information for Authors in the IEEE Transaction on Industrial Electronics Please submit your manuscript in electronic form through Manuscript Central web site: On the submission page #1 in popup menu of manuscript type, select: Data driven control and process monitoring for industrial applications.

Timetable Deadline for manuscript submissions

Information about manuscript acceptance Estimated publication date

August 30, 2013

November 2013 July 2014

Guest Editors
Huijun Gao, Harbin Institute of Technology, P.O. Box 3015, Yikuang Str. 2, Nangang District, 150080, Harbin, China,
Tel: +86 451 85402350 ext. 4121, e-mail:

Shen Yin, Harbin Institute of Technology, China, Okyay Kaynak, Bogazici University, Turkey,

Editor-in-Chief: Mo-Yuen Chow, Tel: +1-919-515-7360

North Carolina State University ECE Department, Raleigh, NC 27695-7911, USA

Journal Administrator:

Sandra McLain