.

.-.

El
MILITARY

k!!_l
MI L- STD-43W )ml ICE 3 22 Septssbcr 1W4 STANDARD fC4 ELECISDNIC EMJIPF.EH1

STANDSSD GENERALREWIREPINTS

10 ALL HOLDERSOF MI L- STO-454N: 1, THE f~LWINC KU REM21 RESENTS OF lSIL-STD-434fl REOUIREIEWTS 25 64 71 7s-1/72-2 2. ktAKE IHE fOLLWING a. b. Pose vi, 22 22 22 22 OATE Ssptcllilsr Scfm!lfmr Ssptcdmr Ssptsntwr 1994 1W4 1996 1994 HAVE 2EEH REVISED ASD sWERSEDE IKE REOUIREKEMTS LISTEO: SWERSEDEO REQUIREIEWIS 23 64 71 NEWREMJIRENEHT OATE 15 Osccnbcr 19S9 SO Octet-w lW1 so Jw 1992 .. .

PEN AND INK WAMCES: tablss: 2-1. In tnble farafr@ 71-II, 4.2; delete Delete al fxicaesWI L-U9fPW22fran 4 title. Wtltu:*

contmts. IWO

Rewlr==m 2. ffIL-C-3SW6/22=. ;-_~e .5.

c.

Pm7e 5-1,

pnragra@

2:

Oelete

Ymcummt.

urd tititura

d.

RsWir-t ~tit-e Re@rsmcnt Md .frce.

5. 5. 7,

PWe 5-1: ~. page 7.1.

Delete

the headiw

. ~ormat

ion for

nuidawe

C.nty..

Srd

e.

pwagrafh

L.1:

In Iim

SIX,

insert

dspnrturen

between

.withwt-

f.

RSWir_t 11. fran the CCC-

PWe Iim.

11.3,

pOrngra#I

4.S:

Oelete

WIL-P-

79. iflL-P-W7,

If IL-P-15037,

)flL-P-\934F

Rsqwirarmw 20, fqa 20-2, tnble 20-1, ama rms wits of -1OOOW m-d St67atitute
h.

spec type or class .lOOO=.

M1607S/2:

Oalete

the valw

for

ReWlremnt parOgra#m

39, fmoe 39-2, paragrafAm 5, 6, and 7: Rerurber as 4.1, 4.2. m-d 6.3.: 8, 9, 10. and 1!: Rernmtmsr as 5, 5.1, 5.2, ad 5.3=, respsctivelyt

1.

n=wfr== 41, puss 41-1 d 41-3, POrawr~ 2: Oelete -SW from ASTM A29/A2Sn-SS: delete -63. from ASTM A22S/A22W-S3; delete -8fran ASllf #313-87; &lete -W from ASTM 66S2.79; delete -06= frcn ASTM SAEWW-06: dslete -&$frASTM B122-S6; delete -90. fran ASTM B139/8139fl-90; delete -SSfrOO ASTM B194.S4: delete .SSS fran ASTM B19WS1WU-S2: delete -SW iron ASTM 8197/B197M-S9: dslete -S64frna ASTM B206-SM; Oeleie -8P frccn ASTM 020644-87; d dslete -SW fmn ASTM S522-00. Rqiramtt 46, pase 46-1, am.i m fMC.e 46-2, pragr~ R+ir*t 50, fmse 50-2, P,oorn#i 2: 4.3: Oelete table SO-I: Delete ~lL-F+ 397.. ond s~titute WI L- ff-9397 WI L- F-92VP ad sduttitute %lL-M-939P. Oelete the I ictirsz for Flmrsscmt I---

ik.

Msc WA PISTRIBU71W

lofs SIATEKE w t. woved

for fmhli. .aleose;

distrihtion

is tmlimited.

..

MI L- STD-454N NOTICE 3 1.

Requiranent 52, notice 2, page 52-1, paragra@ 2: ASTM F872,, and on psge 52-2, paragra~ 4.1, sixth ASTM F873L) .
Requirement 55, page 55-1, paregra@! UEIA 277., and on page 55-1, par,qgrs~ Shtitute l:EIA 277,,,

Delete Lim:

C, F- F-300U ard substitute DeLete ,, F- F-300US and substitute

u.

2: De(ete EIA RS-31 O-C-7?, ad substitute 4.4, second [ine: Oe(ete ,,E IA RS-310 -CC, ard

n.

R@wir=t Electrical,

66. me ~-l, 9.sraers@ Fluorqwlyner-insulated,

2: Delete title co~r or co~r

for MI L+22739 Alloy .,,

ad

substitute

Wire

(1) Title

for Resistant, Title for Electrical,

III L-u-25038 should read Wire, Aircraft and Flight Critical, 111 L-c-27072 should Wlticonductor,,. read ,Cab[e,

Electrical, High Temperature General Specification for,,. Pouer, Electrical and Special

and Fire

(2)

Purpose,

(3)

Chanse title for ASTM A580 to ,,Staniard Resisting Steel Mire,>.

Specification

for

Stainless

and Heat

(4)

change title for ASTM B33 to read ,,Standard Specification Arneaied Cowr Uire for Electric Purposes,,. mm ;.i:

for

Timed

soft

or

0.

76-3,

Retirement 76. paragrati

76-4. mrawad! .4.2: Oelete ,IIEC-693 -80,0 and substitute Oe(ete II I~EE; STD-81211 and substitute IIHIL-STD -21961). MAKE THE FOLLOUING PEN ANO lllK CHANGES: and substitute wIL-U .9397,,. ,OASIH 03295. II IEC-693}1. S IEEE 200,S.

,,1 Ec-69311 and on oane

3.

llcOEX Of APPLICAT ION DOCWEUTS I I -1. Page 11-2, Page 11-8, Pege 11-8, Domment: Docune. t: Ocament: Delete Delete Oelete Delete lrdex

WIL-F-Q3978S

O,ASTHD3295 -8111 and substitute ,01 EC-693 -80,S and substitute lIEEE 200-1973: 1: Insert and substitute

Page 11-S., Docunent: Pase 11-1 thrcugh 11-8,

the fol lowing

documents in nmber

sequence:

Hi I itary

stnbdards

Reau i rmmt FhO 11, 26

MIL-STO-llW1 )fIL-1-2676S Handbooks HIL-HDBK-179(ER) M[L-HDBK-611 HIL-HDBK-727 NO Government documents EIA 277 IEEE 1029 ASTM Fl12d JEDEC-SID -17

64 25 7a Reauirem?nt 55 64 77 64

u IL-S1O.454M

NOTICE 3 ~ther Govermrenl dactmmt~ m 70 78 A4 11-8. lmAcx 1: Delete the followlra I r-w F-I 11, 11, 11, 11 11, 5t. 26 26 26 26 doctmsntc:

HAVSO P- 3A79 UAvso P-m71 O& 4245.7fi 01-EGOS-SSS1l Page 11-1 Mllftow
u IL-P.79

through

stmd.3r@

MI L-P-W7 141 L-P-15037 MI L- P-1S047 MI L-P-19161 141 L- E- S1512 MI L. STD-480

ASTM AW090 EIA-31 O-C IEEE 812-84 4.

71 55
76

RETAIN THIS NOTICE AND INSERT SEFORE lASLE Of COVIENTS.

Holdsrs of MI L- SID-454N will verify thot pose chnmsss urd rditlons itiicoted abve have bsen sntersd. 5. This notice pane mill km resoined os a check sheet. lhia iswmm, together with ~ w@es, 1S a s-rate ptblicatim. Ec.cfI mtice is to km retolnsd by stccklm points LMtil the HilitOW StsrdOrd is Cmmletely revised or carceled.

COMCLWI NC flAIER [Al

Custodians: Anw - En Nsvy - L3 Air force - 11 Bevim activities: TE

Preparing activity: Air Force - 10 ALlmt : OLA - ES (Projsct mfto-olsz)

AIW - ~. Av, CR, ME, Ml, PI, Navy - EC, 03, SH Air Force - 17, W, 85, W Other: OLA - ES fAA

HIL-SID-L5LN MOT1CE 3
REOUIRE)!EM7 .75 ELECTRICAL PI?sIR

1.
2.

&f?92S.
Oocunsnts

lhis owl

rqiremcnt i coble

establishes 8: for voltages. Eisctric

criteria

for

electrical

power.

to Rc.aulrsmw Freqmrcies Electric Aircraft

MI L- S1O-2DS MI L- STO-255 MI L- SID-7D4 MI L-SID- 1275

Electric

Power. and Oirsct Currsnt.

Alternating

Power characteristics. DC Electrienl Systcss in

Characteristics of 2.9 Volt military Vehicles. Interface Stardard for Direct

MI L- SID-13W HIL-SID1539

Shl$&ard Currsnt,

SVSteau. space vehicle

Elsctricol Power, Oesign R~ircments.

111 L-llOBK-4ff 3. 4. Pe finitims. Reauiremcnts. Not awl

Power and the Enviransftt icoble.

for

Sensitive

O@ Electronic

Equipsent.

6.1 ~. Except as spulficd below, the electrical pauer source requirsd for electrmic equipm?nt d associated equipu?nt ad for portions of systcun c@oying electronic equipncm shall bs in accordance with 141 L- STO-2DS ard f!l L-s ID-255. 6.2 ~. accordance 4.3 The electrical MI L- STD-7D4. The electrical power requirements for airborne ad ossocioted qipnmt shall bs in

with

Shis&ea rd.

accordance 4.4 ~.

with

type

I or type

II

fm.er requircuents for shipkaard of scctim 300 of MI L- SIO-l SW.

nnd ossocioted

equipnmt

shall

in

The elsctricol

pmisr

rsquircaents

for spnce squipm?nt

shall

Lm in acco~e

with

MI L- STD-1S39. 6.5 Crowd vehicles. The electrical accordance with u IL- S1O-127S. S. Jnform!ticm fo r guidance Cnly. The electrical should be for fmuer a power rcquircmnts for rnilitarr wmmd vehictss shall Lm in

OM m Ioted Outm!atic ditto P roccwim foci litie~. S.1 Critical ficd cwrnm Iclltlm requirements for critical cnnmmicotiom and reloted autnu. tic data processing ~ipnmt Iunitwl -68 V & uninterrtqxible pm!cr SIWIY (n accordance with ftl L-lfOBK-&ll.

Sqxr5cdes
REOUIREltENT 2S 15 D.xmt.er 19S39 25-1125.2 REMJIREMEM1 2S 22 Sept&r 1994

!IIL-SID-454M NOTICE 3 UEOtilRE~Nl RICROELECIRWIC 64 DEVICES

1. -. IiOvlce$. reliability, 2.

This r~irement establishes criterio These criteria we based on the objectives and .mintainnbility In ullltory 8wtcc8. amt i cnble to Rewlr Hybrid .?mmt bb:

for the selection am! c$plicat ion of nicroelectrmic of ochlwlng technologlcol superiority, qlallty,

pacurents ffl L-H-3S534 MI L- I-2S5S5

Hicrocircults,

General

Spccifimtion

For.

[ntegroted Circuits Cemrol Specfficotlm , Reli~ility Dwel.7fmem Test ffethcds

(H{crc.circuits) For.

ft.arwfocturiw,

MI L- SID-7S5

Prw!rm for Systems cd d Prc.d.Jcti On. ord Proccdmes for

EwiPt

MI L- WD-S32 HIL-SID-975

Microelectrmics. ad

NA3A Stondnrd Elcctrlml, Etectrcmechmical Parts

Electronic List.

ftl L.srD-

1547

Electronic Ports, flmeriola, and Processes ad Loimch vehicles, Technicol s~irem?ntn List of Stamlwd Micra ircuits.

for Space For.

MIL-SID-

1562

HIL-SID-1686

Electrostatic Dischz.rse Cmttrol Prwrum for Protectim of Electrical orrl Elect rcmic Parts. nssablles d EWipzent (ExcluJiw Electrically Initiated Explosive Ooviccs) . List of Stordardiztd Predictim lfilitary Drauings (S!tDs). Eqdipncnt.

MI L- ELJL-1D2 lfl L- KoBK-217 AflSIllEEE 1076

Reliability

of Electronic

VHSIC Harduare Description LnmJuage (VHDLI VHSIC Interoperability Sunim-ds. Inc.1Sfmcificotimt for the In-b, Elm L8n. Pi b.n, ard VHSIC Electrical Specification. (Copies C.vailable frcm Novol Resenrch Laboratory, code 5305, Wash DC 20375-5000). $faveform ord Vector )iicrocircuit Lmch-up EIch~e S&mcificc.tlon.

5flSlf IEEE 1029 HIL-HDBK-179(ER) JEDEC-STD-17 ol-Ems-so311

A@lcatim in CffOS In:ewated Dcscriptim

IW@mok. Circ.lts. Lortwwe (VHOL)

wSIC Ilar&are Docuccntatim.

Supsrsc.des

SEWISEMEN1 U 30 D5tnbcr lW1

6L-1

REWIREMEM1 t4 22 Septcnixr 1994

tll L-sTD-f.5LN NOT1CE 3

3.

Definitions. Ronol ithic, md.les. hybrid, rf and micro.ave (h@rid/integrated circuits, uulti chip

3.1 Microelectronic devices. microcircuits, and microcircuit

3.2 Advanced microcircuit module technology Microcircuit rrcdule fabrication and design technology nhich is nedly a.ai IabLe for prototyps designs and w; II be avai Iable for prcducti.a i the mar future (2 to 5 years). For digital microcircuits, the performance capabi 1ity can be approximately characterized by the minimm feature size, the ct.acking frequency, and the functional thr.aughWt rate. 3.3 VHSIC hardware descrimicm language (VHDL~. A high level ccmpter Iag.age developed tinder he VHSIC program for describing the signal structure of e(ectr.aic hardwre (chips, mcdules., and wbsyscems). The lmgu.ge describes the sigml flow and the structure of the device in terms of the basic circuit Qwdels, fundamental Logic blocks, and higher level functional ass~lies of logic blocks. 3.6 Oua(if ied device (microcircuit]. Any device or microcircuit nhich has ma 141 L- N-3.S534, or MI L-1-38535 and is listed on the associated 014 LfOPL (isti.gs.
the requirements of

3.5 Uaveform and vector excha.qe SDe. ificat ion (WAVES). A high level cmputer language test vector and Waveform Stinuti for electronic hardware (chips, macbdes, ad subsystems). ccwatible .
3.6

for describing The WAVES is

mith

the VHOL simulation ion specific integrates

language circuit

and simiatio (AS IC).

enviromnents. that is c.stein designed w .sy cet L

Awlicat

Any microcircuit

pr.w~ble ( ibrary, 3.7 6. 6.1 ~.

micr.. irc.it (e.9. EpRcu. EEpRW. WEPRW, PLA, PLD, sate array, sea of gates, standard etc. ) that is programnea or personalized to perform a sp+cif ic equipment or cust.an function. Very high speed integrated circuit.

Retirements. Se Lecti.a. each stage in neu ard re-engineered system designs, i.e., concept studies, o, and engineering and mnrmfactwing deve(opmmt, the advanced microcircuit meet rel iabi I ity, P.wf.armace, ad cost requirements of the appt icat ion shal I be production phase.

4.1.1 Techno(oqy. At demonstration and val idati modu(e technologies which evaluated for use in the

6.1.2 Retiabi[iw. Microetectr.aic devices in military system which are i engineering and manufacturing development and production shal 1, as a mininun, conform to the applicable product r.ssrance (ee( Of MI L-H-38536 0, MI L-I-38535. 6.1.3 Order of Precedence. Un[ess otherwise specified, the order of precedence sha[ L be as fol low: This requiremmt shal 1 be superseded upon @l i cation and DcO/lnd.stry f.1 Iy coordinated acceptance of the proposed DCCIMicrocircuit Appi i cation Handbook c.. Stanjard. This docunent wi I I provide guidance on how the D.XI and its contractors ca select devices based m cost effective per fornwce, designed in high quality, r.rd reliability for a give applic.sti cm. a. Microcircuits specifications, listed fully i table cqliant I of MI L-sTD -1562. Microcircuits with dated to the QML (M IL-N-38535 and HIL. H-38534). mi 1itary

b.

Microcircuits Listed in table II of MI L-sTD -1562. Microcircuits ccmpl icmt to the standard Mi I itary Drauing Program, and other MI L-H-38536 C?xrpli ant microcircuits ot I isted i tnbles 1 e.rd 11 of HIL-sTD -1562.
Other

c.

microcircuits

(see

4.1.5),

subject

to acquiring

activity

approval.

REQUIREMENT 64 22 Septenber IW4

64-2

Supersedes REQUIREMENT 64 30 October lW1

MIL. SID-4SLN NOT1CE 3 4.1.4 OWalifisddo vices. Mttcn the cmtroct or prchase order for mu dssigns, or rcde5im, or psrt level, or qualifisd port mrcda of u4ilitory IWduore Spscifi the use of a fll L-STD-.SS3 class B or S uicrocircuit, and there Is o q.mlificd dwico of the rewircd E.?nsric chip ard pock.we type or case outlim, the WIiflsd dsviee shall Lm the preferrul dwice authorized In thot denim. 4.1.4.1 $mce Owlic atims. mrufc-cturer, the r~irac+mt WIm qualified devices ore mt ovoiloble of ffl L- STD-W5 or II IL- STO-1547 shall OF+. or cannot IY. be cp.mlified by the

4.1.4.2 Qthur nmlicoti cum. kl!m o qualiflsd device .$MS not exist nrsf o 31CJ dsvice of tho rswlrsd iwnsric chip ond fmckogo typ or case cutlins doss exist, the SKI dwlce shell ke the preferred dsvice authorized for thnt desisn. 4.1.5 Other nlcrotircult6. for other thm q.ml if Isd do.less, the follwinn inforcmim in the nmsm.mford FOrt nf.pmval retpmst (excspt here idmtificatlm of a uilitary &toll 3ft0 rarber satisfies this requircamt or other dircctim is givm): a. Oevice Iiaits RSWirSd Ioture, suf f icism unrklfu, cmfiwration. fmttiortnl to Insure the rsqvirsd form fwsctims enchtrmce (life) and other r~irm?ms, porcemters orsl interchameabil iw. ccqmbility tests. shall ka Imlukd spscificatim or

snd

b. c.

SWirMYMtaI.

design

GuOlity ossurnme rtqirmsnts, incluJitu scroenins ad lot qdality cmfonmnce (occeptc+tte) tests. As o uinima, devices $holl be pmcursd to all the rq.dremnts HIL-S1O-SS3 pOragrt@I 1.2.1. The q@{cable dstoil spscificotlon, WD or verdOr/contractor daunsm shol I km spccif isd for electrical perfor-umce, mschsnical, finnl elsstricol test rWirmem9. m evaluation of the Projectd availability and prtit the tiua of productim cd through the wolec ted life Device dcsi.an @ tsst docuusntatlon ossurmce status of the system (sss of the device

of ard

d.

at

q.

in the VHDL amf WAVES forcnt

4.5.3

srd 4.5.4).

4.1.6 W1-tsiti e mwta lficrocircuits ore susceptible to electrostatic discharge (E3D) trmtotic lsi~oci;cuit wsccpti; ility i; classified in RIL-SID- 12.% ard t-t wthcd 3015 of HIL-S1O-SS3. -90. li?ten dwim susceptibility is not ovailoble, it cm be doteminsd using test cmthcd 3015 or appemlix 8 of uIL-STD-lbSb. fficroctrcuits frm tho ESOS Ctoss nucm.sary to met ES3 requiremms shall ba selected. EE3 susceptibility of uicrc.circuits oro listed in the asmciotsd QffL/OPL listin17s of ffl L- H-3S534 or ffl L-1-30335 for the itiivifhml devices. 4.1.7 Latcht@ )archtm tes(. JEOEC-S1O-17 as a ninim.m 4.2 Prowumable procuring activity. dwlces. test ins shol I bs Perfom sF@icable techmtosiss (i. e., SPAYS)per

El

Use of p$ogrurmble

devices,

r.?pardlem

of

type,

rqires

wroval

of

the

L.3

Fusible

link

devices.

bhsn fusible

user, parumstric and fmctimc!l SUWWU 7 A ~ 0S 0 uini-, confisuratim at-d effectiveness

link dsvicss (PRC+fs, PAL8, PLOS, etc. ) are prOQrescEd by the elsctricnl tssts in accordance nith MI L- STO-SS3, nnthcd 5003, grcup A, *011 h PCrfOI_MCd Oft Or FWOSr_l IW to v@rifY the specific fxo.aran of link ftuins.

4.4 ~. Micrc.zircuit devices used in CWipn?m shall ~ herwticnlly scaled in 910ss, MS1OI or NO orgmic or FOlW8WiC tumeriots such as Incq.!srs, varnishes, ceremic (or c~imtims of these) packages. cmtinss, or smoses shall b used imids the uicrocircuit pnckose, unless otheruise specified. NO desiccants sholi be cmtained in the uicrocircuit pnckose, mless otherwise specified. Orgmic or palwsric materials (e.g. cdnesivas) cowlimt to MI L- STD-S2.3, test mmhod 5011, ore Prmitts.d insids the microcircuit pckage uhen specified in the o$prc+wioto .Ilitory spccifi cotion or ~.

Sqersedes REMJIREPEN1 64 30 Octeber lW1

b4.3

REWIREKENT 6L 22 Ssptar 1W4

MI L- STD-454N NOT1CE 3 4.4.1 Use of plastic encapsulated microcircuits. upon specific request and awr.aval by the pr.acur ing act ivity to waive the requirenmnts of 4.1, plastic .mcapsu[ate.d microcircuits may be considered for .s. in ground fixed (GF) or ground benign (GB) q nvimnnents as defined in MI L- HD8K-217. They should meet a( ( the r~i~~nts Of the Wuiwnt %wcif i cation. Tewerat.re mtd humidity shal I ix ccwlete(y controlled in trenslt, storage, and awlicati.a. This requirement sha( I be wpersedea ~ @Licat ion end DcOjlndustry fu( (y eo.ardiated mceptance of the proposed D& Microcircuit Appl icatio Handbook or standard. For Amy aw( i cat ions, use of )11L- HDBK-179(ER) is rerxmnendd.
6.5

Device

desiq

end test

d.awnmtati

on.

6.5.1 ASIC docunentatio i VHDL. Digita( Awlicat ion-specific integrated circuits (ASICS) sha(l be docmted by rmam of struct.ra( end behavioral VHSIC hwdwre description language (VHDL) descriptions i accordance With ANSI IIEEE 1076, (see 5.6). Behaviorn[ VHDL descriptions shall .incl tie functi.m and timing at the pmt. accurate enough to enable the psrformace of test Seneraticm and determination of fau(t dete. tionl fault is.alatim levels at the integrated circuits pins when performing board w subsystem simulations.
4.5.2

with

Fauit coveraqe. for al 1 digital HIL-STD-8E3 test m?thcd 5012 for a[[

nicr.acircu its, fau(t coverage shr. ( ( be documented manufactwing-[evel logic tests.

i accordame

4.5.3 Qualified device d.acunetatio in VHDL. Digita[ qualified devices used in board 10wL awlic.atiom shal 1 be documented by means of behavioral VHDL descriptions i accordance uith ANSI -IEEE 1076, (see 5.6). Behavioral VHDL descriptions sha(l include funcrim and timing at the port accurate enough to perform test 9enerat ion and determine fau(t detect i.nrfault iso(at ian levels at the integrated circuit pins. 4.5.4 ASIC test stinuti docunenrat ion i UAVES. Digital ASICS shall have .s11 test waveforms dc-ame.ted and delivered to the Govewm,e.t i the UAVES format. 4.6 cost
5.

vectors

and test

Cost considerations.

!licro

electronic

devices

shall

be selectd

on the basis

of overal(

life

cycle

Information

for

guidance

o[y.

5.1 Techno( c.qv Dro9ress ion. The use of advanced rnicrocirc.ir technology shoutd be considered ami evaluated i the design of all systems jequipmmt. For critica[ weapon systems awticat ions, and for system developnet schedules projected to be longer than fow years, the per forrrace dw.ntages provided by advanced techno(.agies should be evaluated early in the system development @ases for use in the procurement stage. 5.2 Reliability. microcirmit reliability predicri.m activity awrova( by using specific shm[d be prepared in test andlor field rate

5.2.1 Reliability Dredict ion. men required, accordance with I! IL- HDBK-217, or uith pr.acurig dsts.

5.2.2 Rekiabi[ity assurance. A plan shw[d be i p[ace to assure that microelectronic devices meet the rel iabi Iity requirement of paragraph 4.1.2 m the time of engimering and man. factwing development. This plan shcm(d provide for resubmission of parts 1ist, if so invoked by contract, through DESC/HPCAG prior to procurerrent of parts to be used in actual producticm ro assure the.t all evaluations are based o the most recent standard izmion status. 5.3 Microcircuit obsolescence. Due to rapid techm[ogy admnces, rray rni [ itary and cmmerc ink microcircuits I isted i specifications ONI catalogs are either obwtete w are nearing obsolescence. The use of these devices wi I I affect the mission objectives of the using equipnr. For Navy equipmmt, current in fomtim on micrmircuits that my be nearing .absotesceme may be obtained frm the Naval Air Uarfare Center, Code L35, Indiannpdis, IN C.621Q-2189, te[e#mne (317) 353-3767.

REQUIREMENT 64 22 Sept.zmt.er 1W4

64-4

Supersedes REQu1REMENT 64 30 October 1991

HIL-STD-654U NOTICE 3 5.4 Jesrobili~. NSU cd ~rsdcd system shmld exploit chip level LmIiIt-in-test features to erdmnce the testability cd operatimol availability of the mx%ule w system. Uhen ndvnnced digital mG&lss or boards are de.elcped, rnicrccircuits incorproting the E1lf-mls or TN-BUS should be used.

5.5
custs

Life

cvcle

cost
uith

evpluntim.
selsctim in-test of m

The follouiw

fmtors

asmciatcd e.

uicrocircuit
rcpnir,

devices

should be rmnsidersd or tschnologiss: Operat iawl

In sstitcating

life

cvcle

Effect of Luilr. recmfigurability.

mintoinability,

nvoilnbility.

nnd

b.

value of VHOL descriptions of chips. 128velc+=erlr, m-d design Upgrode.

ASIC &

-lea,

ond tonrds

in resLwly,

mltiple

source

5.6

UTlm; ntim aliverY

refercl-lc~. inStrIK1i _

Wwmratirn

Oota item description, for ASIC docwentotim.

01. ECOS-WS1l

provides

the dacuncntatim

Supersedes
REWIRCfIH1 6A 22 Ssptsu2xr 1W4

$4-5

REWIRE)EENT 64 30 Octc&r lW1

111 L- STD-45bN MOT [ CE 3 REOUIREHENT 71 CA2LE MM wIRE, INTERCONNECTION

1. ~. and nire 2.

This r~imment used for Intercc+-mectlon ad icoble Wm.

establishes criteria bctwsn ~its. 71: C-r

for

the selectlrn

and aF@lcatim

of electric

cable

poctmems m-w-so NIL-C-17

to Rewlrm!em Electrical,

Wninsulatsd). flexible mid SerJ. Rioid, General

Cobles, Rodio Frequsncr. s~ificotim For. Wire ad Cable, Hmkt+, Specificailon For. Cable, Uire, Tw sd

fft L-ii-76

Electrical,

Insulated,

Gsnaral

lfl L-C-442 f!l L- C-S432

Ccductor, Spcclal

Parallel. purpose) and Wire, Electrical (3W

coblss, (Poner al-d 600 volts). wire, Alloy. wire, Cnble, wire, Elsctric,

HIL-u-50&

Polwinyl

chloride

Imulated,

c-r

or CqIer

MI L-u-5246 HIL-C-707S fll L-U-EW77 o lfl L-C-13777

Electrical, Electrlc, Electrical,

Chrcmsl d Aerospace Silicam-

Aluacl,

lher.mco@e. General C-r, Spuiflcetim 600 Volt. Gmcral for. 200C.

Vehicte,

lnsulc. ted,

Cable, Specie.1 Purpose. Spssificatim For. uire, Wire, Ctile, Wire, Alloy. Cable, Electrical, Ins.lat cd,

Eleccricol,

Ccrdstors,

M[L-U-1~72 MI L-U-19150 MI L-C-19S47 MI L-U.227SV

[nsuloted,

General

Speclficatim

For.

Hard Orcdm C-r. Special Purpme, Shore Use. Ce$fmr or c-r

Electrical, Electrical,

fluorapolymw-

lns.loted.

fllL-C-2.S437 )IIL-c-24U0

S@cinl

Purpose,

Electrical. for Shirbamd Use. Gsneral

Cable, Elsctricol, Spuificatim for.

L19htwiL!ht

t41L-u-25022

Uim. Electrical, Hi@! Tsmpsrature specification for. Ctile, Pm-w, KtAticqtor Electrical and Cable, ad Sir@e Shit.lded,

&

Fire

Resiatmt,

Gmsral

lfl L-C-27072

Special Generat

Purpem, Elcctrlcol. Spccificatim for. Electrical,

PIIL-C-27SO0

Cable, Potter, Eloclr ical Shielded ord Vnshlelded,

I@ Coble Spscial FurpQm, Gsmr.1 Speciflcatlm for. Simles. Triples, Shieltkd Internal

MIL-C.5S021

Csble, Etsctricol. 2hialded sinsles, Iuistsd Pairs md Spuiflcotim for.

srd Jacketsd HOOkI+, General

Eqxrsedes
REwIRENEILT 71 30 Jwm 1W2 71-1 RES121RENEN171 22 Septer 1W4

RI L- STD-L54N NOTICE 3 HIL-!J-81OL6 Uire, E(ectric, Cross lik.?d P.a(yalkene, Cross.l inked A(kane-irnide Polymer, or Poly.wylene Imu(ated, Cqpr or Cqper ALIw Uire, EL.?ctric, Polyitmi de-lnsuL ated, Silicone I.su( ated, Copper or c.awer copper, 600 volt, Alloy. ZOO-C,

HIL-u-81381 HS25471

Uire, Electrical, Polyester Jacket. Uire, Electrical, FEP Jacket. Stardard Uire.

w27110

Si(icme

[mukated,

Copper,

600 Volt,

200 SC,

A8TI! A580

specification

for

Stainless

end Heat Resistant

Steel

ASTM-B33

Standard Specification for for Eiectrica( Purposes.

Tinned Soft

or Annea Led copper

Wire

3. 3.1

Definitions. lnterc.nnectin9 wire. [m. tated, single-c.arductor wire used to carry eLectric current covering electrical between units.

3.2 Interconnecting cable. more insu[ ated conductors with betueen tmi ts.

TWO or more imdated conductors contained in a c-n a gross metallic shield outer conductor used to carry

or cme m cmrent

4. 4.1 table 4.2 shalt

L.3

Rmuiremnts. wire 71-I. setect ion. Selection of wire for imereonnect ion between units shal 1 be in nccordmce ith

Hultic.mdwt.ar cable be in accordance .ith Armlicati.m a. b. c. HIL-U-76 restrict shaLl

setectim. selection table 71-11. ims. for Amy applimtim Air

of nulti

conductor

cable

for

interconnection

betwen

units

be med

onty

(see

4.3.3). a~licat ions.

hlIL-U- 16878 shal I mat be used for

Force or N.w

nerospace

Cable or wire with polyvinyl chloride insulation shaL( not b used in aerospace applications. Use of these Mires m cables in my other aw( icotim requires prior approvai of the procuring activity. 141 L-U-22739 Wire with only sing[e ~[ytetraf space ad missi Ie appi imtims shal I mqui.e Use of alminm Silver plated system. wire Cowr requires Mire shal( specific luoroethy[ene insulation used i Air Force the awrova L of the procuring e.cti,vity. by the procuring activity. Amy inissile

d.

e. f.

approval

mat be used in aWiicatims

involving

5.

Information

for

auidance

onty.
cables carrying rf sisnals should be coaxial cables i the characteristic irpedmm of the trmmitting or uaveguides media.

5.1 Rf sima[s. All and should be tennimted,

interconnecting tien pmsible,

REQu1REMENT 71 22 September 1W4

71-2

Supersedes REQLJ1 REUEIIT 71 30 Jtms 1W2

141 L. SID-454N NO1l EE 3

1:

>

(5

>

Swrsedei

EEOUIREHENT 71 30 Jtme 1W2

71.1

REGIJIREMENT71 22 Sem-r 19?4

TABLE 71-I.

Uire.

etectrica(,

imercomect

ion

- continued.

Const rwt i m COrductOr Insulation ~1 ~1

Spec no. Spec type or cLass Material Primary 600 CUIA, Ag, Sn 1 1,8,10,11 105 .s,10 ,11 HSA, 1000 3000 600 3A 3A,3B,4A 13B ~/ 6 10,11 s. 8,10,11 CUIA mu M 4A 4A 200 1000 250 Ag, Sn CUIA S. 2C 125 600 1000 600
CUIA, RSA,

Title Coaring Type M16878/1 uw7a/2 )!16678/3

Prifmry cover Jacket/ topcoat

Max Cmd teqa c Max l-m volts

Remrks See note 4

HIL-U-16S78

wire, electrical, insut ated, high temperature

H16W014
)416 S78/5 H1607816 Ag Cu/A i.A,8, 1.A,8 ,10 11 75 H16s7817 u16E7818 H16s7a/lo HMt!78111 !!16.S7s/12 H16S78113 H16S78114 HW97E/15 H168.7W16 nm7a/77 S,Str 2A

Ccu

1000 200 250 600 1000 600

3000
Sn Age 1 8 105

Ccu uMS78/18
1000

See footnotes

at end of table.

TABLE 71-I. Intercwmectl ~ . Cmtlmmd. COmtrutlm

Uire.

clectrieol.

cOdIctOr
y Insulntim
Max

~ cd 1c Jooo VOltn ma m

5P

no. or c I 0ss coat irlg Prlmmry 1 Au. Sn Type Mlta72/19 Mnterfal Pri~ry cover Jc.cket/ Wfxorlt

Spcc type

Title

Umrks See mte 4

MIL. U.1M7B [cmtd) Ml M72/zo 250

Uire, electrical, insulated, high

t-rature 1416870/21 AU CUIA. USA, 3A so N{ 3A 38 3A 38 mo CUIA Sn Str 6 150 1000 AU CUJA, CW CulA AU Hi CWH 2A 8 M S,str Str 2A 38 200 n 200 260 640 1000 loca sA.50 .6A 130. $/ 260 ~ Csu SO M1M72122 M16870123 H16872/24 H1M72/23 Mlta72126 M16S72127 M16078128 M16270129 M16878/30 M16W2/31 It16s72132 H16270/33 mlta72/34 M1607W3S 200 @ 1000 230

II L-U-19150

wire, insulated, hard-drmm

c-r

,.

Supersedes

REQUIREHENT 71 22 Septmt.er 1994

71-6

REOUlREHENT 71 30 June 1992

o
lntercmtf~ - Cmtirusd. Constructim
lmulatlm ~

IASLE 71. [.

tie.

etectrfcal.

CO@.4ct0r

Max

Spec Spsc type

m.
or class ffoter ial coat irm Pr iuary T* CuJA
nz2n91\b

cd
Primary cover Jack.xl t~nat [q c I-W volts

Max
Rnnwks

Title

411-U-22739

Uire,

[cmtd)
n22n9\\7 IISA CUIA Sn kg 200 2I H3A 100a Ag m22n9m m22n9/19 fi22n9f20 u22n9f

Sn 150 600

18

Lisht
kdim

wisht eight
LiEfIt Lisht uelght wsifit

electrical, fluorofml~r - Inst ated, cwr or

alloy

c-r

ui 3A

260

u 22nvf
22 Ag r422n9n3

2U0 260 Str 3A 7s 200 2M 200

Ni
CUIA hg

m22nv128 H22739129 )(22739/30 Ag III CUIA Sn n22n9f m2n9n2 f422n9f33 3I HSA

!ii

150
200

600

HSA A9
Sn M Ni CUIA HSA \ CUIA

m22n9w n22n9f35 u22n914 u22n9i42 u22n9143 CUIA

150 20 20

HSA
A9

200

See fmtnotes

at sfd of table.

TABLE 71- [.

Uire.

electrical.

intercomect

ion - Continued.

Construct ion Conductor Insulation ~1 ~

Spec no. Spec type or class material Coat i ng Tw St, 15 288 3B 13B 600 CUIA Primary Primry cover Jacket/ topcoat H2503.S/l ard Hi c[ad

Title

Max cm-d tellp c Max m volts Remrks

HIL-u-25038

Uire, e[ectrica~, high terp?rature fire resistant

Critical circuits where q Lectric.3t integrity nwt be maintained during fire (1093-C flmc/5 rein) and See

HIL-W-.S1LW I!E1044/6 Cu/A Sn A9 Sn A9 Str 98 2B HSA CUIA HSA ffllo44/7 !!81044/9 mlo44 /lo

Uire, q lectr ical, cross- ( inked plyalkene, crossIinked a[kaneimide polymer, etc insulated, copper or Cowr alloy

150

600

and see tw on sPtificati sheet On

Sheets 112 /13 It .t. note 4 Sheets /9 /10 red ut. app( icatio. limitation stiplated detai I

nalo44 /12 cu/A Sn

)!81044 /13 HSA Aa

See footraces

at end of tab(e.

e
.
IABLE 71. I. electr I~ . Cmtlmmcf. icai. I cm uctim [mulatlm Max Cond Jocket = 1? -vJ c Max t-w ~ 1 Wlro.

rd.xmr
y

I
Sxc type or class hterlal

1E!!KY
VOltl
Primary cover Rmmrks CUIA

Spec m.

Title
M12S117 !4.91ss1/8 KS1S2119 s21s21/lo l!Sls21/11 Is or 1: H21SS1112 MSlszl/ls 7A IIS1S21116 HLllssll17 CUJA 17 HSA )(21ss1/18 HS1S21119 K.91S01120 Mls21/21 CUIA Sn .1 NOlss\122 WA ?00 m CUJ4 HSA

MI L-U-81S21

Uire,

Electric, Polylmfde Inwtated, C-r or Alloy

i3-

C%s=r

shOOtS J7 thru I1O It wt. sheetsIll thru 114 md wt. Sheets /17 thru /20 It .t, single rap pril!wy (II1 ercmmect wiring here .t, WJOCe, and high tcql Ccwbil ity are critical theeta 17 thru I1O 6 \71 thru /20 see Imte L S8 jackets in cheets /11, /12 ad /22 are in s{ zes 8 and lc.rger

105 15 or li

See fmtmtes

at end of male.

MI L- SID-454N NOTICE 3 TABLE 71-1. NOTES: Conductor mterial Cede CUIA CU;H Ccu HSA Al S. AU fli Tyw Descrim i m Comer. annealed Copper, hard-dram CoFr covered steel High strength copper Atminm Tin Silver Nicket Sok id St rmded Description PoLyvinyl chloridelextruded Polyethylenelext ruded Polya I kenelcmss - 1inked ext mded Polyethyl enelcross- linkedlfncdi fiedle.xtruded Polytet rafluoroethyleelext rtiti (TFE Teflon) Polytetraf loroethylene/ta~ Polytetraf (uoroethylee/mineral f i 1led/ex. trtied Po[ytetraf luoroethylee iWregmted g(ass type Fluorinated-ethylene propylenelextrcded (FEP Teflon) Ftuorir!ated-ethy lene propyleneldi spers ion Uonoch Lorotri fLuoroethy[ ene/extrtid (Ke(-F) Si Licone rutberlextrtied FEPlpolyirnide f i Lm (Kapton) Polymide lacquer (Pure lfL ) Pcdymide/extmder (fiyton) Polwinylidene fl.oridelextruded (Kynar) Potywinylidene f t.oridelextrddlcross1inked Sraid/synthetic yamilacquer impregnated Sraid/ny[onli Wregat4 Braid/ply esterliWregnatd Sraidlglass fiber~itrpregmted 8raid/TFE coated glms fiber/TFE finish Brr, idlasbestoslTFE impregnated Braid, bcave or .arpli..argmic fiber ALkane-imide wlmr/extrd4/crosslinkd Modified emmtic po[yimide Ethylene- tetraf Luoroethyl ene/extrudsd (TefzeL) Pol yary~enelext ruded Crms-linked, extrded, modified ethylene- totraflucmwthylee Uire. electrical. interconnection - Continued.

alloy

Coat ing

s
St,

ZI

lnsuLnt iOn Code 1 2A 2s 2C 3A 38 3C 3D 4A 4B 5 6 7A 7s 8 9A 9s 10 11 12 13A 13B 14 15 16 17 18 19 20

~1 $/

Uhen specified

o purchase

order,

Wire intended for an interconnecting

use in electrmic equipnmt hook-up e#imtiom. It my OISO be used s.s wire when m additional jacket or other mechanical protection is provided. insulations and unshielded, ion requirenmts. See detai I wire

Various ccabinations of primary, primry cover, cd jacket shie(ded, etc, constructions are u vai Iable to m?et eW(icat specification.

REWI REMENT 71 22 Septenber IW4

71-10

Supersedes REWIREMENT 71 30 J1W2

MI L-STD-654M

M071LE 3

stmersedes

REiiWS2i(ENT 71 30 Jwm 1W2

71-11

RE@JlsEl(ENl 71 22 Sept5ter 1?94

MI L-sm-f.51.N NOT1CE 3

REOUIREHENT 71 22 September 1W4

71-12

supersedes REQUIREMENT 71 30 Jme 1W2

UIL-STD-454N NOTICE 3

a
Supers*
REWIREI!2W 71 30 Juno 1W2 71-13 REM21REMEN1 71 22 !$epterber 1W4

TABLE 71-11.

Cab Le. W(ticorduct

or.

interconnection

- continued

Jacket Conductor shield braid II

~1

*c. HIL-U8777 HIL-U22759

no. 1-7 600 200C various Various 85 Various Braided

Title

Basic uire Specs Volts rm TeIW 21 Strmd material nater iaL 31 Type St rard coating % COver age

No. of cod.

Remrks

41L-C-

27300

1-7

various

Variom Various 85

Various

various

Extruded
or

For generat aerospace flight vehicle p.pplicatiom braided

HIL-u1-7 600 260c various

Various

85

Cab[e, power, electrical and cable speciat pqmse, electrical, shie(ded end mshieldea 25038 MIL-U810b& MIL-U81381 2-3 or MIL-UI 687a 600 rO 1000 None or Cowr 90 1-7 600 Var i 0.s Various V.9 r i 0.s 85 1-7 600 150.C various various 85 TFE coated glass fit-m Various

Braidd

Extruded

Various

Tape

Ill L-C.

Extruded

55021

Cab[e, tuisted pairs C trip~es, internal hookq

-40SC to +105C 0, -65 C to +200C

Tin, silver Nicke(

None Pvc , Nylon TFE-Tef (on

eat ruded or tape

See footnotes

at era of tabke.

l.-

MI L-sTo.b54M NOTICE 3 lASLE 71-11. $ab\e. nult!cc+vktor. intermfmect Ion - Ccmtirued.

fLUTES:

sea Wiic*ledetOil canf igurat ions. See ~licble Polyester: TFE-teflm: m: 2EL-F: FEP-teflOn: WF :
Althou@!

cpecificatim

sheet

!or.rateric.ls

cmtrol

of specific

cable

datoil

speciflcotim

sheet

for

tcaperature

Ilmltatlons.

PolvetfIyltne tere$hthalate Polytetrof luoroethylem Polyvinyl chloride (mt to km used in alrkarm Pol~hlorotriblmrwthylFltmrlmted ethylene prOF@em P01vvir@!d4n0 fluoride
the specificmim flexibility in three light !kdiun d!x$ mt limit the nmbcr are determining foctors.

*licatims)

of cmd.ictors

in e cnbl.?,

the Size,

witit,
wai(cble class Class Class L: M: H:

clc.ss{ficatims: TO .ithstmd To withstc.rd severe severe flexlrm flexlra and fr.?rwem mniwlatim. akwse.

duty: *w:

ard nechattical

Heavy duty:

10 withstand severe f leaiw ad ncchmical oLmm ad obil itY to uithstord severe cm-vice IUSIC.C!S such os to km m over by treks or trucks. for mchnnicol test requirements for cold bend,

Sea a@ Icc.ble detail SFQCif icot im sheet cold bed torque, iuwIct bend. ad twist. for use trder tie are requirements. nechmicol cditims

end where resistmce

to umber,

oil

ad

mom

Sqersedes
REO121REI(ENT 71 30 Juna 1W2 71-15 REM21REIIENT 71 22 Sept-r 1994

fll L-sTD-45bM U071CE 3

REWIREftENl PRtOUCIBILIIY 72

1.

*M

preparing

m.m!sfl.

emtrattual dccu?entc.
~trntico specification, 2.

es to prcdxibllity requirements *ich shodd be ccits.idcred establish requirements, and -t mt be referenmtd in Prtiibility program talks, qantitatlve re@ronents, ad verification or requirements mat km directly speclficd In the cmtroct or the $Ystem and/Or cquikment 0s mapri ata.

This

requlranent

offers

ouideme

contractual

*um2nts.

lt dces m{

Pocu-nents EL911 cobl e to ReQUIrcmettt Da 4245.7u lrnnsition Prdxibil nest OesiW Not I@icrlble. Not q@ir.ab(e. mlidancfl only.

~: to Pr*tiOn.

frcm Development Ity Ifeasurtumt

NAvso P-3679 fiAvso P-6071 MIL-lm8K-n7 3. 4. s. pefinitionq. Rec-.Jirements.. Jnfommt ion for

Guldellnea.

Practices. Guidance for Prcd.cibility.

Droarwq. 5.1 Pr d!cibilitv Pro@cibility ertgiM8rinE ond plom?ing tosks aimed ot presetting, detecti!w, ad correcting cmufacturabllity dmiw deflclenciea ord providi~ Prcducibillty related inf.mmt ian essmt ial to ecwis itim, operatim, aml s~rt umnascamt shculd t8 i~ltdect in cmtroct rqirmmts with the objective of establishlnE ad nnintoinlng m efficient prtiibility progrmn occordiw to proerma @aSe. flAvSO P-3679 is the overal I prosrmn dom.tmnt for the s~ject. The ticessful creation and memasc!m?nt of a praducibltity progrmn is d.atoi Ied in Section 2. 5.2 Prc&c ibility mmmurtmwtl. Pra&sibility ueosurtucnt and osacssment too18 are a critical insuritts a p+--t is reedy for Pr-ticn. Secticns 3 cd 4 of NAVSO P.367P give tuo irw$.mtry Ks?c.sur-t and as%essuent tools. part of exanples of

5.3 Owntitative retiwiremente. Quantitative producibility rwirarents ard verification or dcnuntrattm I i ty ncasurement is em reWir~ts sfmuld be este.bl i shed as ~cpriate tO WWr~ @IOSe. Prcdcibi essential part of the design process uf!ish can demmmirn the probability of successfu( Pr-tim. !4inimal tailoring shmld ke recwi red #ten flAVSO P-3d7P is aRIl ied to a pro.arsda. Other protkcibility dacwn?nts b+lich uay km cited directly as n &sic for contract rqirtnnws Inclda O@ 4245.7M, NAVSO P-6071, ad MIL-H08K.727.

ml

76-1/72.2

REEUI REflEu1 72 22 Sept*r 1P94