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Use-Case Based Testing: A use case is a description of how a user uses a particular system design for a particular task.

It helps covering scenarios in different flows such as positive and negative alt ernative. It also covers Input and Output based scenarios. It provides coverage on the overall functionality of the system. Risk-based Testing Risk-based Testing detects potential risks in a project and reduces the cost of fixing defects at a later stage. The risk assessment process helps to identify risks at various project levels. The Risk Assessment Plan provides an analysis of critical information pertaining to project risks. Performance Testing It is part of technical testing. Involves designing the tests that evaluate the current performance of a system. It involves a systematic step-by-step process with specified activities and well -defined deliverables. Security Testing Security Testing determines whether the security features of a system are adequa te to prevent possible threats and if they are working appropriately. It provides an insight on risk analysis and contingency planning. There are a variety of tools available for various security functionalities. For example: white box, black box, and grey box testing. Localization Testing Localization Testing checks a product s compatibility with it s locale. Localization Testing is done throughout the Software Development Life Cycle (SDL C.) Test Data Management It is a process that enables an effective management of test data during differe nt phases of test such as, planning, preparation and execution. It also addresse s various functions pertaining to data management. It not only helps implementing the Test Data Management process but also in iden tifying the ways to improve the data quality and productivity and reduce cost. ================================================================================ ==================================== ORTHOGONAL ARRAY Purpose Detect and resolve errors as early as possible. Verify the application meets requirements. Train and pass ownership to portfolios and users. Ensure operations are functioning. Goal Reduce business risk associated with the use of a product by providing managemen t and users with appropriate quality-related information. Generally, defects involve a single condition, which is independent of any other condition in the system.

A Single Mode fault is a consistent problem with any level of any single paramet er. A Double Mode fault occurs when specific levels of two parameters occur together . This is an indication of pair-wise incompability between two test parameters. A Multi Mode fault is even more complex; it happens when multiple parameter leve ls create faults when they occur together. Faults that occur for only one specific combination of test parameter levels are called isolated faults. For example, data-entry errors. If the fault lies in the logic, there is a tendency for a region to exhibit faul ts. Single-mode and double-mode faults are special cases of region faults. A Design of Experiment (DoE) is a structured and organized method for determinin g the relationship between factors affecting a process and the output of that pr ocess. Combinatorial Testing The process of combinatorial testing is begun by selecting test data values for each system input. Combinatorial explosion is the number of combinations of the selected test data va lues. This number is very large. Combinatorial Test Reduction It is usually impossible to test all the combinations of selected test data valu es. Not testing any combinations of input may increase the risk of a software fault escaping into a fielded system. Testers need to look for ways to select an effective and economical subset of te st cases. Combinatorial Test Reduction It is usually impossible to test all the combinations of selected test data valu es. Not testing any combinations of input may increase the risk of a software fault escaping into a fielded system. Testers need to look for ways to select an effective and economical subset of te st cases. Pair-wise Testing generates small test sets, relative to the combinatorial test data set Size of the pair-wise test set is usually 1-20% of the combinatorial test data s et. This method finds all double-mode faults that are two parameters conflicting wit h each other. History of OA[Orthogonal Array] Promoted by Dr. Genichi Taguchi in the 1950s for use in statistical test design. Is a two-dimensional array of numbers in which any two columns receive an even d istribution of all pair-wise combinations of values in the array. OA Tools Some of the commonly used tools to generate Orthogonal Arrays are : Allpairs It is a freeware. (www.pairwise.org) It is tailored for Windows but can be ported to a wide variety of platforms with some minor tweaks to the script file.

It requires a prior installation of the Perl script interpreter, unless you use the canned allpairs.exe binary on Windows. It does not require extra Perl libraries. RdExpert It automatically generates efficient orthogonal test plans. All RdExpert test plans provide balanced, pair wise coverage efficiently. Jenny It is a freeware at http://burtleburtle.net/bob/math/jenny.html It is coded in C language. It ensures pair-wise testing for all features paired together. PICT It is a Microsoft tool. It ensures an efficient way to design test cases and test configurations for sof tware systems. Orthogonal Array Testing: Is a systematic and statistical approach for testing pair-wise interactions. Provides representative coverage of variable combinations. Is good for integration testing of OO components. Provides testing combinations of objects. How OA helps Taguchi methods use OA testing for experimental design. OA provides two-dimensional arrays of numbers. Choosing any two columns provides an even distribution of all pair- wise combina tions of values. OA is used in many applications for planning experiments. Rows represent the experiments to be run. Essential OA Terminology Runs This is the number of rows which translate to test cases. Since the rows represent an experiment (test) to be run, the goal is to minimiz e the number of row as much as possible. Factors Number of columns (which is the number of variables). Levels Maximum number of values for a factor ( 0 levels 1) Together, the values in Levels and Factors are called LRUNS (Levels**Factors) PAIR WISE We use a technique that guarantees each level of each parameter being paired wit h each level of every other parameter at least once. -----------------Benefits & Limitations Applied Statistics-based Testing Differentiator To avoid doubt, Accenture s applied statistics-based approach to creating optimize d test plans is not limited to test plans with the specific characteristics of a ny subset of case studies. This approach and tool will generate dramatic improve ments in virtually any testing situation outside of (a) Unit Testing and (b) tes t plans with or less than 20 scripts BEN:

Orthogonal Array: Is a structured test design technique. Ensures significant reduction in test scripting effort. Enables proportionate reduction in the test execution effort. Provides optimum test coverage. Provides higher probability of an earlier defect detection. Is independent of platform/domain. Guarantees pair wise combinations of all selected variables. Ensures a consistently less time required for pattern generation. Reduces cost of experimentation. LIM: The defects that occur when specific values are tied together may be missed if t he values are not tested. However, the probability is very less. OA does not allow exhaustive testing. Key Recommendations: OA is not recommended for systems with higher security requirements. It is not recommended for mission-critical or life-critical projects (space, med ical treatment, and defense) where even one combination left untested proves fat al. OA is recommended in projects that have good number of variables to test with va rious values. It is important to do a thorough analysis before deciding on the usage of OA for test suite development in order to identify parameters and levels. OA can be very useful in experimentation design, configuration testing, system, and regression testing.

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