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Rev. 110214-1

ALUMINIUM + NFE

Layers, surfaces + walls measurement

TSL measurement solutions for ALUMINIUM, NOT STEEL + STAINLESS STEEL


Type of Materials/ Processes Diffusion and surface layers, thin / thick layers / walls / Duplex-u. Multi Layer - Anodizing, anodizing

Background measurements, solution requirements within the meaning of - Influence of coating on the material properties: Optical / electrical / mechanical / chemical / thermal / porosity
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-2 APPLICATION TSL-favored SYSTEMS LAYER THICKNESS, MT/QS/US/QW/EL/DF/AU/FI/US/FH1 DUPLEX THICKNESS MT / FI / EL / AU + DF THIN PCI / delta / GA / RA MATERIAL THICKNESS MT/QS/US/QW/EL/DF/AU/FI/US/FH1 SURFACE .- roughness / TOPOGRAPHY / PORE PCI / SU / PCT / TH / TY / FI / PO Color, luster, cleanliness / PURITY delta / PG / CC / PCI

SPECIAL APPLICATIONS RADII, INTERNAL PIPE, SMALL AREAS MT / EL / DF / AU / FI / PCI / FH STAINLESS STEEL + AUSTENIT MT / EL / DF / AU / QS / FH LayerMaterials PAINT / PAINT + CERAMIC other organic THICK QA / MT / DF / EL / AU / FI / RA / delta / PCI / CCS Order process MT / QA / QW / EL / DF / AU / FI / PCI / delta

OrdereProcess,specifically Plating STAINLESS STEEL,PHOSPHATE. MT / DF / QS / FH/ MT / DF / EL / AU / POWDER SOLGEL, THERM.SPRITZEN, PVD, CVD QA / RA /EL /alpha / delta / PCI / CCS BASE-COAT + elIMMERSION METHOD alpha ONLINE MEASUREMENT It should be noted that most solutions as online versions, and more extensively for the 8-hour operation to date as budget systems are available.

Please choose in the google video mode, the corresponding measurement applications

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-3 NAVIGATION NOTE Dear reader of our Representations, in order to effectively and accurately find your desired Task Stellungn by TSL Solving strategies and systems please use the following 5 Choice of topic buttons, if you are :

>starting from Your material to be measured at Material >or Your Application starting >or the already knownn Procedure >or if you apply for a Commercial unit Interest >content / editorial Backgrounds- And on our problem-solving opportunities, Engineering and want to inform R & D.

-> -> -> ->

-> MATERIAL -> APPLICATION -> SYSTEMS -> SHOP -> SUPPORT

We give up the search word input, the experience shows very often user Expectations not responded. They are therefore our opportunities for your measuring task by image-navigation after the 3-th level. By Press Your right Choice of topics-Key to move from the 1st -,in the 2nd level where you to your Target . Approach From the 2. Level navigate by Image keyingUntil you are in der 4. Level

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From the very start - operation of the widely used measurement method
Non-destructive coating thickness measurement, SDM, on metals Non-destructive measurement of wall thicknesses, WDM, metals
For the most widely used measurement application procedures are established that define the two effects from the use of a sensor over a metallic base material (GW) as a carrier of the layer to be measured. Each resulting signal response between a sending and a receiving sensor to a metal as a carrier of the layer is influenced by the distance to be measured (= layer thickness). The thicker the layer, the smaller the sensor effect can be evaluated. Distance measurement between sensors and the respective base material as a reference. This base material (or substrate, or backing material) therefore first determined that, in some cases to use measurement processes. The layer to be measured is defined the distance to the substrate, where it in alloys Interactions with the substrate may.

As a sensor of a measuring unit, these technologies are encapsulated in the different measuring probes almost all manufacturers and measurement principles of portable devices. Many Questions a measuring system resulting from the correct Ratio of primary to secondary-fed measurable / measured energy. The focus will thus binding the elkritischen Transmission properties of the base metal. Here, almost all potential for conflict and solution strategies are later

Eddy current measuring method


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Device Type: Optical almost identical to the inductive method is the only high-frequency coil of the probe usually horizontally, which the measurement area determines effect.

SDM of electrically non-conductive layers on highly conductive substrates. WDM non-conductive materials to reference ladder - there significant advantages over ultrasound systems at very high accuracy. Suitable for non-conductive thick films and materials (fiberglass, etc.).

Requirements: Electrical adjustment on the uncoated object using standards. also suitable building sites, System Cost: EUR starting 400 Training Needs: 4 Measuring time: 10 sec

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-6 Preparation / set-up time: 1 min. Requirements: Electrical adjustment on the uncoated object using standards. Substrate thickness: approx 40m minimal. For non-magnetic metal substrates with non-conductive coatings. The coating must be tough enough to resist the pressure of each patch Measurement probe tip is not to yield.

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NAVIGATION NOTE Dear reader of our Representations, in order to effectively and accurately find your desired Task Stellungn by TSL Solving strategies and systems please use the following 5 Choice of topic buttons, if you are :

>starting from Your material to be measured at Material >or Your Application starting >or the already knownn Procedure >or if you apply for a Commercial unit Interest >content / editorial Backgrounds- And on our problem-solving opportunities, Engineering and want to inform R & D.

-> -> -> ->

-> MATERIAL -> APPLICATION -> SYSTEMS -> SHOP -> SUPPORT

We give up the search word input, the experience shows very often user Expectations not responded. They are therefore our opportunities for your measuring task by image-navigation after the 3-th level. By Press Your right Choice of topics-Key to move from the 1st -,in the 2nd level where you to your Target . Approach From the 2. Level navigate by Image keyingUntil you are in der 4. Level

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Even for non-iron-wall thicknesses measurement:

Magnetic-inductive measuring method

SDM of non-magnetic layers on FE substrates. WDM non-magnetic materials to reference-FE. - Also suitable building sites, measuring time: usually faster than 5 seconds. Each suitability for conductive walls / thick films (galvanizing) to consider! System cost-EUR: starting 400 Training needs: 5 Measuring time: 5 sec better Preparation / set-up time: 5 min Prerequisites: Electric-magnetic alignment at the (same) uncoated object using standards. Perform eddy current fields in the conductor to be measured at constant methodically measuring deviations characteristics, a correction program (see TSLconvert) be einsettzbar. For magnetizable metal substrates with non-magnetizable coating / wall. Substrate thickness: 0.5-1mm minimal, depending on the sensor. The material must be tough enough to be the pressure of each patch test probe tip to yield.

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Also for special Wall measurements

Hall probes Method

SDM / WDM non-magnetic layers on FE substrates. WDM non-magnetic materials to reference-FE (Also as a ball), - a ball serves as Referenzpol - significant safety advantages over eg. Ultrasound systems at very high accuracy and significant radius capability. Requirements: Electric-magnetic alignment on the uncoated object using standards.

Suitable building sites, especially near stream areas .- often for thin substrates - rolling Measuring time: 5 seconds System Cost: 700 Training Needs: 4 Measuring time: 1-10 sec Preparation / set-up time: 1 min. For magnetizable metal substrates with non-magnetizable coatings. The coating must be tough enough to be the pressure of each patch test probe tip to yield.

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Technology Hall does not require acoustic impedance-dependent adjustments of the wall-material Properties compared with ultrasonic techniques (US-WDM) with changing metrics and Geometries. It also eliminates the coupling fluid.
The wall thickness may be only a few micrometers (microns) are up a millimeter.

Magnetic Static-Method
Application SDM / WDM by non-magnetic layers (regions) FE-substrates. WDM non-magnetic materials to FE. Even for soft Schhicht / wall materials.

- Also suitable building site System Cost: from EUR 100 Training required: 2 Measuring time: 10 sec Preparation / set-up time: 30 sec Requirements: No adjustment, therefore, close application limits. Substrate thickness note (about 1 mm minimum)!

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-11 For magnetizable metal substrates with non-magnetizable walls / coatings. The coating must not hard enough so as not to pressure the relevant patch test probe tip to give, since Measurement of release of the pressure goes to zero. Wiche materials such as rubber, are so often measured.

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NFE-surface, color, layer, and wall- Thicknesses - EXAMPLES

VW Product Reflector, Non-metal Application 10-20m below base-coating aluminum TSL-delta system 2.3

Product: 3 M, - Glue on very thin metal


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-13 Application: 2-50 micron coating thicknesses TSL System: PCI / HSL

Product:

Anodizing, Anodised, Aluminium

Application: 5-20m TSL System: delta 3.3

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Product: Boehringer, - thin film on 10 microns AL Application: 4-10 g / m2- Coating thicknesses TSL System: contact delta 2.3 non contact / HSL

Product: Pharma + cosmetics, -

Tube

Application: 5-20m coating thickness inside


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-15 TSL System: delta 3.2, - 90 degrees sensor

Product: Emitec, - Cathalysator, Austenite Application: 20-50 microns bonding-layer coating thicknesses TSL System: MT 2100 + Converter 3.1

Product: Vaillant, - Water heaters + white ware Application: coil coating <10 microns

TSL-system PCI / delta

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Product: security-sensitive: Brake-Hoder Application: 1-5 microns deltacol / seal TSL System: delta 9.2

SOLAR

Product: Thermic cell: Copper Application: 1 micron coating thickness TSL System: HSL
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Product:

Offset-printing

Application: 0.5-5 micron multi-layer coating thicknesses TSL System: HSL

Product: Application:

Transformer Coil anodised coil coating <10 microns

TSL System: PCI / delta

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Product: security-sensitive: Brake-Hoder Application: 1-5 microns deltacol / seal TSL System: delta 9.2

Product: Thermic cell: Copper Application: 1 micron coating thickness TSL System: HSL
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Product: Tooth-brush, coil 5mm diametre Application: minimum 100 micron coating thickness above coil TSL System: PCI

Product: Relay/Magnetic-Coil , - Covering thickness Application: 100 micron min covering above coil TSL System: PCI

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Examples of industrially used systems + technology

NAVIGATION within the TSL kathegorisierten materials / methods described in the direction of measurement system distribution in each case above TSL-operated working area. Other operations are u.U. very different. Some commercial areas require individual user information, so we ask you for your request-> aA

Ratings are the first orientation, of course, subject to individual review and if profitability analysis. Points 7, 9, 10 and 11, we respond to the knowledge of concrete Questions individually -> a.A.

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GLOSSARY SDM-> coating being measured WDM-> Walls/material being measured 0P USE 01 TYPE TSL-system-name in thickness Measuremnet technologies 02 Physics inductive Wiedycurrent ULTRAsonics Hall-sensor Optic Interferometer electricstat Coulommetric Tactile R xray Thermic 03 Area Measurementarea in m -> useful / border 04 prakt. Tolerance Tol in the above industries, operating range: under 100 micron in microns, / / About 100 micron-> in% of reading 05 USP- Efficiency and solution height such as: power Measure possible / Physics fits better than conventionally used procedures / simple / safer to use / less need for training .... other benefits 0 -> there is no 10 -> relevance in competition 06 measurement electronic data pratised 1 -> low 10 -> high 07 known Risk per Operator error 1 -> low 10 -> high 08 Knowledge needed: Responsible / Operator 1 -> Instruction 5 -> Training 10 -> education 09 known payback in months with device cuts, frequency / solvent storage 10 TestPart-Costs, under section 10 in the particular environment including staff / training / Test Preparation in EUR 1 -> low 10 -> high 11 possible Potential of Prevention, Returns /ComplianceCosts Abbreviations used as following

finding details visit-> Systems

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APPLICATION/ Measurement of LAYER THICKNESS, MATERIAL THICKNESS MT/FH1QS/EL/DF/AU/FI/US/FH7/delta


u-tube> Video mode: Applications

TSL-SYSTEMS

Largely current EU standard. Built in or external probes. External probes often in the system 2 to about 20 000m Data transfer and / or internal statistics, Internal memory for data series (batches) and / or memory for spec. Adjustment settings (applications). Equipment portable / stationary, by radio, infrared, or via interface multiplexing / Mux. Accessory sets, tripod / handling, roll-additives, Mux, data, radio ... BUTTON > Systems> Hand Measuring-> Options Measurement and transferPrograms for every need, BUTTON > Systems> hand-held> Options + programs

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK

KNOWLEDGE InPlace. COSTS

PREV

OP 01 02 03

MT Series

04 05 06 07 08 09

10

11

SDM / WDM MT IND / WI 2-10 000 2 / / 1-3 - 8 AA 10 / 5 aA aA aA

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK

KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

MT 700 Series

04 05 06 07

08

09

10

11

SDM / WDM MT IND / WI 4-10 000 3 / / 1-3 - 2 aA 10 / 5 a.a a.a a.A.

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK

KNOWLEDGE Amort.

COSTS

PREV

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-23 OP 01 02 03 Sensors 04 05 06 07 08 09 10 11

SDM / WDM MT IND / WI 2-800 000 1 / / 1-5 4 - aA 10 / 6 a.a a.a a.A.

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

FH 1 Series

04 05 06 07

08

09

10

11

SDM / WDM FH1 BONDING force 5-20 000 3 / / 3-10 5 / 10 - aA 6 / 1 a.a a.a a.A.

A representative type-section of our extensive product range, - According to fitness, we offer you the system or even more suitable for your needs.

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAIL-RISIKO KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

FH 7 Series

04 05 06 07

08

09

10

11

WDM / SDM FH7 HALL 20-18 000 3 / / 2-3 10 10 aA 5 / 2 a.a a.a a.A.

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

GA Series

04 05

06

07

08

09

10

11

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-24 WDM / SDM GA coulommetr. 0.2 0.3 8 2 20 / 150 aA 10 / 7 a.a a.a a.A.

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

QW Series

04 05

06

07

08

09

10

11

WDM QW RF ultrasound 10-5000 2 / 5 10 7 10 10/10 aA aA 5

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

U.S. Series

04 05

06

07

08

09

10

11

WDM U.S. ultrasonic 1000-30 000 5 3 4 10 10/10 aA aA 5

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP

01

02 03

RA Series

04 05 06 07

08

09

10

11

WDM RA XRF 0.2-20 0.1 5 10 aA 10 / 2 a.a a.a a.A. a.a

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

SU Series

04 05

06

07

08

09

10

11

Roughness SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

PG Series

04 05

06

07

08

09

10

11

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-25 GLOSS SU button 0.02-160 5-10 1 3 5 10 / 3 aA aA 4

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

PCT Series

04 05

06

07

08

09

10

11

TOPOGRAPHY PCT white light 1-90/14000 0.01/0.1 10 10 2 10 / 6 aA aA aA

TSL-TYPE USE TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort. FAILURE RISK KNOWLEDGE Amort.

COSTS COSTS

PREV PREV

OP 01 02 03

PO Series

04 05

06

07

08

09

10

11

PORE TEST PO el-static 50-11000 ---- 10 - 1 7 / 3 AA AA AA

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

MI Series

04 05

06

07

08

09

10

11

SDM / WDM PO pulse radar 10 000 10 10 10 3 10 10/10 aA aA

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

PT Series

04 05

06

07

08

09

10

11

SDMpulver / wet PT Photo-Thermic 6-25 10.5 10 10 2 10 / 2 aA aA 10

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TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

MF Series

04 05

06

07

08

09

10

11

DEEP DEFECTS -waves visually AB10 000 10 10 2 10/10 10 aA aA

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

STR Series

04 05

06

07

08

09

10

11

WDM / SDM STR WI 5000-800 000 5 10 6 3 5 / 2 AA AA 5

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

CC Series

04 05

06

07

08

09

10

11

COLORIMETRY WI CC 5000-800 000 5 10 6 3 5 / 2 AA AA 5

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

OLxz Series

04

05

06

07

08

09

10

11

ONLINE OLyz IND / WI / WLI 20-8000 0.1 / 1 10 10 1 10 / 1 AA AA 10

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02 03

STR Series

04 05

06

07

08

09

10

11

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-27 COLORIMETRY CN WI 2400-6000 K 5 10 6 3 5 / 2 AA AA 5 contact

TSL-TYPE USE

PRINCIPLE OF MEASUREMENT TOLERANCE RANGE ALPHA DATA

FAILURE RISK KNOWLEDGE Amort.

COSTS

PREV

OP 01 02

OLxyz Series

04

05

06

07

08

09

10

11

ONLINE OLxyz IND / WI / WLI 1-12 000 0.1 / 1 10 10 1 10 / 1 aA aA 10 contact

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-28 -

Special application forms of the SDM of NFE / FE-on materials

Hard chrome Paint / powder AL Organic layers on FE Non-ferrous metals on FE Hot dip galvanizing and duplex Zinc-nickel

Attention: If layer-conductive portions in structures (zinc), the suitability possibly via micrograph check and correct. On methodological differences and stable processes suitable to use an automatic curve-correction program, such as TSLconvert. To it, for example, is for highway pavement thickness settlement of this process, a regulatory basis of calculation and shall be trained accordingly.

Nmaybe-conducting materials to a simple aluminum foil as a loadable Reference


Pavement thicknesses Wood thickness FRP thickness Glass thickness

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-29 or micrometer At this point to emphasize that according to DIN EN ISO in the following issue is not the Greek term (micron), but binding of the metrological term microns,Micrometer, Is utilized. 1 m 1 x 10-6 M 1: 1000 000 meters 0, 000 001Meter 0,001 mm 1mm 1 x 10-3 M 1 Meter: 1000 1000 microns

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Serial measurement of very thin layers with the possibility of very thin substrates - The capacitive SDM process
Application Capacitive SDM method for thin films on thin metal sheets and reference conductive film, the carrier material thickness is from about 1 micron hardly relevant.

Training needs: 3 Measuring time: 10 sec Preparation / set-up time: 1 min. Suitable for reference measurements with films - such as: offset printing. AB 2007 is the Procedure for Automotive Basecoat tested, here by the usual measurement error Magnetization fluctuations in thin FE-substrate are no longer significant, A unique feature!

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-31 to discuss current measuring method

Polychromatic interferometry for rough surfaces + topography

Application topography measurement

Photothermal method for heavily pigmented layers, powder wet paint and non contact.

System cost: EUR 25 000 from sensors Training Needs: 4 Measuring time: from 2 sec Preparation / set-up time: a few min.

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-32 Impuls-Radar/Mikrowellen measurement method Application - For roads / Thick layers / layer composite,

System Cost: sensors from about EUR 100 000 Training needs: 5 Measuring time: 0.1 seconds Preparation / setup time: minimum 10 min.

Ultrasonic WDM process, - high frequency up to 100Mhz Application

- Even for films on organic substrates and multilayers. System Cost System from EUR 3500 Training needs: 5 Measuring time: 10 sec Preparation / set-up time: 5 min.

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-33 The matching process

The conditions in industrial production environments demand meters, which operate quickly and reliably, and when used on site are mains-independent, weather-resistant and temperature-independent. In addition, the required margin of measurement uncertainty is taken into account as it is to read from the device manufacturer. Noteworthy are the representations and conditions under which a supplier / manufacturer's instructions for instrument characteristics are achievable - even ours. A transparency of the different modes of representation, particularly in relation to the requested application solution towards us is essential, as we design solutions with the matching, so different systems. Here was a procurement (unfortunately due to the increasing pressure of a different order) does not take place in haste.

The appropriate adjustment and fixation-related applications are also used.


Measuring equipment plus TSL-precision stand

With a plurality of measuring devices affect conductivity / Magnetic properties of the measured wall / coating such as zinc or nickel, the selected measuring method for the user or subtly evident. This should already give independent advice to common problems and find out beforehand.

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Tag

or micrometer At this point to emphasize that in accordance with DIN EN ISO the total Issue is not the Greek term (micron), but binding of the metrological term microns,Micrometer, Is utilized. 1 m 1 x 10-6 M 1: 1000 000 meters 0, 000 001Meter 0,001 mm -3 1mm 1 x 10 M 1 Meter: 1000 1000 microns

Oops! In the SDM / WDM- Measurement equipment used terms that to consider are: Calibration a measuring instrument: Repatriation on a national / international deposited Standard mass and timed De Documentations Target-state durch a Calibration with certificate and seal. Adjustment/ Setting the meter: Electrical preparation and adjustment of the instrument for the current Messaufgabe.durch the user by means of zero and any film standard.

The Adjustment is often Manuals in more than >Calibration, 'Or' calibration < and on keyboards with> KAL <button called!

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-35 -

- Helpful Links to standards and regulations

DIN 50976

Hot dip galvanizing of components (hot dip galvanizing); requirements and testing,

DIN EN ISO 1461 (draft) hot-dip galvanizing of individual pieces

DIN EN ISO 2064 / DIN 50 928 for replacement-1 Metallic and other organic layers, definitions and Provisions relating to the measurement of film thickness: 1987-08) DIN EN ISO 2178 / Replacement for DIN 50 981: 1979-05) Non-magnetic coatings on magnetic substrates; Measurement of coating thickness, Magnetverfah, Ren DIN EN ISO 2360 / Replacement for DIN 50 984: 1978-08 Non-conductive coatings on non-magnetic substrates; Measurement of coating thickness, eddy currentprocess

DIN 1319-1 Fundamentals of Metrology, Basic concepts, Quality System-Directive FORD Q-101 or the manuals of the German Society for Quality (DGQ) as a further indication for the calculation of control limits.

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-36 DIN 1319-2 Foundations of measurement; definitions for the application of Gauges

DIN 1319-3

Foundations of measurement; evaluation of measurements A single measure, measurement uncertainty

DIN EN ISO 2808 Paints and varnishes-Determination of film thickness

includes: DIN 50 981, DIN 50 984, ISO 2178, 2360, 2808, BS 5411 (3,11) 3900 (c, 5) and ASTM B499, DI 400th

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