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CD4007M CD4007C Dual Complementary Pair Plus Inverter

February 1988

CD4007M CD4007C Dual Complementary Pair Plus Inverter


General Description
The CD4007M CD4007C consists of three complementary pairs of N- and P-channel enhancement mode MOS transistors suitable for series shunt applications All inputs are protected from static discharge by diode clamps to VDD and VSS For proper operation the voltages at all pins must be constrained to be between VSS b 0 3V and VDD a 0 3V at all times

Features
Y Y

Wide supply voltage range High noise immunity

3 0V to 15V 0 45 VCC (typ )

Connection Diagram
Dual-In-Line Package

TL F 5943 1

Top View
Note All P-channel substrates are connected to VDD and all N-channel substrates are connected to VSS

Order Number CD4007

C1995 National Semiconductor Corporation

TL F 5943

RRD-B30M105 Printed in U S A

Absolute Maximum Ratings (Note 1) If Military Aerospace specified devices are required please contact the National Semiconductor Sales Office Distributors for availability and specifications
Voltage at Any Pin Operating Temperature Range CD4007M CD4007C VSS b0 3V to VDD a 0 3V
b 55 C to a 125 C b 40 C to a 85 C

Storage Temperature Range Power Dissipation (PD) Dual-In-Line Small Outline Operating VDD Range Lead Temperature (Soldering 10 seconds)

b 65 C to a 150 C

700 mW 500 mW VSS a 3 0V to VSS a 15V 260 C

DC Electrical Characteristics CD4007M


Limits Symbol Parameter Conditions Min IL PD VOL VOH VNL VNH IDN IDP II Quiescent Device Current VDD e 5 0V VDD e 10V
b 55 C a 25 C a 125 C

Units

Typ Max Min 0 05 01 0 25 10 0 05 0 05

Typ Max 0 001 0 05 0 001 0 1 0 005 0 25 0 001 1 0 0 0 0 05 0 05

Min

Typ Max 30 60 15 60 0 05 0 05 mA mA mW mW V V V V 14 29 V V V V mA mA mA mA pA

Quiescent Device VDD e 5 0V Dissipation Package VDD e 10V Output Voltage Low Level Output Voltage High Level Noise Immunity (All Inputs) Noise Immunity (All Inputs) VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VO e 3 6V VDD e 10V VO e 7 2V VDD e 50V VO e 0 95V VDD e 10V VO e 2 9V 36 71 0 75 16 4 95 9 95

4 95 9 95 15 30 35 70 06 13

50 10 2 25 45 2 25 45 10 25 15 30

4 95 9 95

35 70 04 0 95
b1 0 b 0 75

Output Drive Current VDD e 5 0V VO e 0 4V VI e VDD N-Channel VDD e 10V VO e 0 5V VI e VDD

Output Drive Current VDD e 5 0V VO e 2 5V VI e VSS b1 75 P-Channel VDD e 10V VO e 9 5V VI e VSS b1 35 Input Current

b1 4 b4 0 b1 1 b2 5

10

DC Electrical Characteristics CD4007C


Limits Symbol Parameter Conditions Min IL PD VOL VOH VNL VNH IDN IDP II Quiescent Device Current VDD e 5 0V VDD e 10V
b 40 C a 25 C a 85 C

Units

Typ Max 05 10 25 10 0 05 0 05

Min

Typ Max 0 005 0 05 0 005 1 0 0 025 2 5 0 05 10 0 0 0 01 0 01

Min

Typ Max 15 30 75 300 0 05 0 05 mA mA mW mW V V V V 14 29 V V V V mA mA mA mA pA

Quiescent Device VDD e 5 0V Dissipation Package VDD e 10V Output Voltage Low Level Output Voltage High Level Noise Immunity (All inputs) Noise Immunity (All Inputs) VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V VDD e 5 0V VO e 3 6V VDD e 10V VO e 7 2V VDD e 5 0V VO e 0 95V VDD e 10V VO e 2 9V 36 71 0 35 12 4 95 9 95

4 95 9 95 15 30 35 70 03 10

50 10 2 25 45 2 25 45 10 25 15 30

4 95 9 95

35 70 0 24 08
b0 9 b 0 45

Output Drive Current VDD e 5 0V VO e 0 4V VI e VDD N-Channel VDD e 10V VO e 0 5V VI e VDD

Output Drive Current VDD e 5 0V VO e 2 5V VI e VSS b1 3 P-Channel VDD e 10V VO e 9 5V VI e VSS b0 65 Input Current

b1 1 b4 0 b 0 55 b 2 5

10

Note 1 This device should not be connected to circuits with the power on because high transient voltages may cause permanent damage

AC Electrical Characteristics CD4007M TA e 25 C and CL e 15 pF and rise and fall times e 20 ns Typical temperature coefficient for all values of VDD e 0 3% C
Symbol tPLH e tPHL tTLH e tTHL CI Parameter Propagation Delay Time Transition Time Input Capacitance Conditions VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V Any Input Min Typ 35 20 50 30 50 Max 60 40 75 40 Units ns ns ns ns pF

AC Parameters may be generated by DC correlated testing

AC Electrical Characteristics CD4007C TA e 25 C and CL e 15 pF and rise and fall times e 20 ns Typical temperature coefficient for all values of VDD e 0 3% C
Symbol tPLH e tPHL tTLH e tTHL CI Parameter Propagation Delay Time Transition Time Input Capacitance Conditions VDD e 5 0V VDD e 10V VDD e 5 0V VDD e 10V Any Input Min Typ 35 20 50 30 5 Max 75 50 100 50 Units ns ns ns ns pF

AC Parameters are guaranteed by DC correlated testing

AC Test Circuits

TL F 59432

TL F 5943 3

TL F 5943 4

Switching Time Waveforms

TL F 5943 5

CD4007M CD4007C Dual Complementary Pair Plus Inverter

Physical Dimensions inches (millimeters)

Ceramic Dual-In-Line Package (J) Order Number CD4007MJ or CD4007CJ NS Package Number J14A

Molded Dual-In-Line Package (N) Order Number CD4007MN or CD4007CN NS Package Number N14A

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National Semiconductor Corporation 1111 West Bardin Road Arlington TX 76017 Tel 1(800) 272-9959 Fax 1(800) 737-7018

2 A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness

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National does not assume any responsibility for use of any circuitry described no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications

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