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CD4009M CD4009C Hex Buffers (Inverting) CD4010M CD4010C Hex Buffers (Non-Inverting)

February 1988

CD4009M CD4009C Hex Buffers (Inverting) CD4010M CD4010C Hex Buffers (Non-Inverting)
General Description
These hex buffers are monolithic complementary MOS (CMOS) integrated circuits The N- and P-channel enhancement mode transistors provide a symmetrical circuit with output swings essentially equal to the supply voltage This results in high noise immunity over a wide supply voltage range No DC power other than that caused by leakage current is consumed during static conditions All inputs are protected against static discharge These gates may be used as hex buffers CMOS to DTL or TTL interface or as CMOS current drivers Conversion ranges are from 3V to 15V providing VCC s VDD

Features
Y Y Y Y

Wide supply voltage range Low power High noise immunity High current sinking capability

3 0V to 15V 100 nW (typ ) 0 45 VDD (typ ) 8 mA (min ) at VO e 0 5V and VDD e 10V

Applications
Y Y Y Y

Automotive Data terminals Instrumentation Medical electronics

Y Y Y Y

Alarm system Industrial controls Remote metering Computers

Schematic and Connection Diagrams


Dual-In-Line Package Dual-In-Line Package

TL F 5945 2

TL F 5945 4

Top View Order Number CD4009 or CD4010 CD4009M CD4009C

Top View CD4010M CD4010C

Hex COS MOS to DTL or TTL converter (non-inverting) Connect VCC to DTL or TTL supply Connect VDD to COS MOS supply

TL F 5945 1

Hex COS MOS to DTL or TTL converter (inverting) Connect VCC to DTL or TTL supply Connect VDD to COS MOS supply

TL F 5945 3

C1995 National Semiconductor Corporation

TL F 5945

RRD-B30M105 Printed in U S A

Absolute Maximum Ratings


If Military Aerospace specified devices are required please contact the National Semiconductor Sales Office Distributors for availability and specifications Voltage at Any Pin (Note 1) Operating Temperature Range CD40XXM CD40XXC VSS b 0 3V to VSS a 15 5V
b 55 C to a 125 C b 45 C to a 85 C

Storage Temperature Range (TS) Power Dissipation (PD) Dual-In-Line Small Outline Lead Temperature (TL) (Soldering 10 seconds) Operating Range (VDD)

b 65 C to a 150 C

700 mW 500 mW 260 C VSS a 3V to VSS a 15V

DC Electrical Characteristics
Symbol Characteristics Test Conditions (Volts) VO ICC PD Quiescent Device Current Quiescent Device Dissipation Package Output Voltage Low Level High Level Noise Immunity (All Inputs) VNL VNL VNH Output Drive Current N-Channel (Note 2) P-Channel (Note 2) Input Current
Note 2 IDN and IDP are tested one output at a time

Limits CD40XXM
b 55 C a 25 C a 125 C b 40 C

CD40XXC
a 25 C a 85 C

Units

VDD Min Max Min 5 10 5 10 5 10 5 10 03 05 15 5 0 01 0 01 4 99 9 99 4 99 9 99

Typ Max Min Max Min Max Min Typ Max Min Max 0 01 0 3 0 01 0 5 0 05 1 5 01 5 0 0 5 10 0 01 0 01 4 95 9 95 20 30 100 300 0 05 0 05 4 99 9 99 3 5 15 50 0 01 0 01 4 99 9 99 0 03 3 0 05 5 0 15 15 0 5 50 42 70 mA mA

210 mW 700 mW V V V V

VOL VOH

0 0 01 0 05 0 0 01 0 05 5 4 95 10 9 95

CD4009M CD4010M

VO t 4 0 VO t 8 0 VO t 1 5 VO t 3 0 VO t 3 5 VO t 7 0 04 05 25 95

5 10 5 10 5 10

1 2 16 32 14 29

1 2 15 3 15 3

2 25 45 2 25 45 2 25 45

09 19 14 29 15 3 21 56 b0 9 b0 4

1 2 16 32 14 29 36 96 b1 5 b 0 72

1 2 25 2 45 1 5 2 25 3 45 1 5 2 25 3 45 3 8 b 1 25 b0 6 10

09 19 14 29 15 3 24 64 b1 b 0 48

V V V V V V mA mA mA mA pA

IDN IDP IIN

5 3 75 10 10 5 b1 85 10 b0 9

3 4 8 10 b 1 25 b 1 75 b0 6 b0 8 10

Note 1 This device should not be connected to circuits with the power on because high transient voltage may cause permanent damage

AC Electrical Characteristics
TA e 25 c CL e 15 pF unless otherwise noted Typical Temperature coefficient for all values of VDD e 0 3% C Test Conditions Characteristics VDD (Volts) Propagation Delay Time High-to-Low Level (tPHL) VCC e VDD VDD e 10V VCC e 5V Low-to-High Level (tPLH) VCC e VDD VDD e 10V VCC e 5V Transition Time High-to-Low Level (tTHL) Low-to-High Level (tTLH) Input Capacitance (CI) VCC e VDD VCC e VDD Any Input 5 10 5 10 5 10 5 10 Min Limits CD40XXM Typ 15 10 10 50 25 15 20 16 80 50 5 Max 55 30 25 80 55 30 45 40 125 100 Min CD40XXC Typ 15 10 10 50 25 15 20 16 80 50 5 Max 70 40 35 100 70 40 60 50 160 120 ns ns ns pF Units

ns

AC Parameters are guaranteed by DC correlated testing

Typical Application

TL F 5945 5

Physical Dimensions inches (millimeters)

Ceramic Dual-In-Line Package (J) Order Number CD4009MJ CD4009CJ CD4010MJ or CD4010CJ NS Package Number J16A

CD4009M CD4009C Hex Buffers (Inverting) CD4010M CD4010C Hex Buffers (Non-Inverting)

Physical Dimensions inches (millimeters) (Continued)

Molded Dual-In-Line Package (N) Order Number CD4009MN CD4009CN CD4010MN or CD4010CN NS Package Number N16E

LIFE SUPPORT POLICY NATIONALS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION As used herein 1 Life support devices or systems are devices or systems which (a) are intended for surgical implant into the body or (b) support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected to result in a significant injury to the user
National Semiconductor Corporation 1111 West Bardin Road Arlington TX 76017 Tel 1(800) 272-9959 Fax 1(800) 737-7018

2 A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness

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National Semiconductor Japan Ltd Tel 81-043-299-2309 Fax 81-043-299-2408

National does not assume any responsibility for use of any circuitry described no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications

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