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Document Title
32Kx8 bit Low Power CMOS Static RAM
CMOS SRAM
Revision History
Revision No
0.0 0.1 1.0 2.0
History
Advance information Initial draft Finalize Revise - Add 45ns part with 30pF test load Revise - Change specification format and merge : Commercial, Extended, Industrial product in same datasheets. Revise - Change Speed bin Erase 45ns part from commercial product and 100ns from extended and industrial product. - Production change Erase Low power product from TSOP package
Draft Data
February 12, 1993 November 2, 1993 September 24, 1994 August 12, 1995
Remark
Design target Preliminary Final Final
3.0
Final
4.0
Final
The attached datasheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and product. SAMSUNG Electronics will answer to your questions about device. If you have any questions, please contact the SAMSUNG branch offices.
KM62256C Family
32Kx8 bit Low Power CMOS Static RAM
FEATURES
Process Technology : Poly Load Organization : 32Kx8 Power Supply Voltage : 4.5~5.5V Low Data Retention Voltage : 2V(Min) Three state output and TTL Compatible Package Type : 28-DIP-600B, 28-SOP-450, 28-TSOP1 -0813.4F/R
CMOS SRAM
GENERAL DESCRIPTION
The KM62256C families are fabricated by SAMSUNGs advanced CMOS process technology. The families support various operating temperature ranges and have various package types for user flexibility of system design. The families also support low data retention voltage for battery backup operation with low data retention current.
PRODUCT FAMILY
Power Dissipation Product Family KM62256CL KM62256CL-L KM62256CLE KM62256CLE-L KM62256CLI KM62256CLI-L Operating Temperature VCC Range Speed Standby (ISB1, Max) 100A 20 A 100A 50 A 100A 50 A 70mA Operating (Icc2) PKG Type
55/70ns
28-DIP, 28-SOP 28-TSOP1 R/F 28-SOP 28-TSOP1 R/F 28-SOP 28-TSOP1 R/F
4.5 to 5.5V
70ns
70ns
PIN DESCRIPTION
OE A11 A9 A8 A13 WE VCC A14 A12 A7 A6 A5 A4 A3 A3 A4 A5 A6 A7 A12 A14 VCC WE A13 A8 A9 A11 OE 1 2 3 4 5 6 7 8 9 10 11 12 13 14 14 13 12 11 10 9 8 7 6 5 4 3 2 1 28 27 26 25 24 23 22 21 20 19 18 17 16 15 15 16 17 18 19 20 21 22 23 24 25 26 27 28 A10 CS I/O8 I/O7 I/O6 I/O5 I/O4 VSS I/O3 I/O2 I/O1 A0 A1 A2 A2 A1 A0 I/O1 I/O2 I/O3 VSS I/O4 I/O5 I/O6 I/O7 I/O8 CS A10
1 2 3 4 5 6 7 8 9 10 11 12 13 14
28 27 26 25 24
28-DIP 28-SOP
23 22 21 20 19 18 17 16 15
Row select
I/O 1 I/O 8
Data cont
Data cont
NameName
WE CS OE A0~A14 I/O1~I/O8 Vcc Vss
Function
Write Enable Input Chip Select Input Output Enable Input Address Inputs Data Inputs/Outputs Power Ground
CS WE OE A0 A1 A2 A9 A10 A11
Control Logic
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.
KM62256C Family
PRODUCT LIST
Commercial Temperature Product (0~70C) Part Name
KM62256CLP-5 KM62256CLP-5L KM62256CLP-7 KM62256CLP-7L KM62256CLG-5 KM62256CLG-5L KM62256CLG-7 KM62256CLG-7L KM62256CLTG-5L KM62256CLTG-7L KM62256CLRG-5L KM62256CLRG-7L
CMOS SRAM
Function
28-DIP, 55ns, L-pwr 28-DIP, 55ns, LL-pwr 28-DIP, 70ns, L-pwr 28-DIP, 70ns, LL-pwr 28-SOP, 55ns, L-pwr 28-SOP, 55ns, LL-pwr 28-SOP, 70ns, L-pwr 28-SOP, 70ns, LL-pwr 28-TSOP F, 55ns, LL-pwr 28-TSOP F, 70ns, LL-pwr 28-TSOP R, 55ns, LL-pwr 28-TSOP R, 70ns, LL-pwr
Function
28-SOP, 70ns, L-pwr 28-SOP, 70ns, LL-pwr 28-TSOP F, 70ns, LL-pwr 28-TSOP R, 70ns, LL-pwr
Function
28-SOP, 70ns, L-pwr 28-SOP, 70ns, LL-pwr 28-TSOP F, 70ns, LL-pwr 28-TSOP R, 70ns, LL-pwr
FUNCTIONAL DESCRIPTION
CS H L L L
1. X means dont care
OE X
1)
WE X
1)
H L X
1)
H H L
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
KM62256C Family
RECOMMENDED DC OPERATING CONDITIONS1)
Item Supply voltage Ground Input high voltage Input low voltage Symbol Vcc Vss VIH VIL Min 4.5 0 2.2 -0.53) Typ 5.0 0 -
CMOS SRAM
Max 5.5 0 Vcc+0.5V2) 0.8 Unit V V V V
Note 1. Commercial Product : TA=0 to 70C, unless otherwise specified Extended Product : TA=-25 to 85C, unless otherwise specified Industrial Product : TA=-40 to 85C, unless otherwise specified 2. Overshoot : VCC+3.0V in case of pulse width30ns 3. Undershoot : -3.0V in case of pulse width30ns 4. Overshoot and undershoot are sampled, not 100% tested
Min -
Max 6 8
Unit pF pF
Test Conditions VIN=Vss to Vcc CS=VIH or WE=VIL, VIO=Vss to Vcc IIO=0mA, CS=VIL, VIN=VIH or V IL Cycle time=1s, 100% duty, IIO=0mA CS 0.2V, VIN0.2V, V INVcc -0.2V
Cycle time=Min,100% duty, IIO=0mA, CS=VIL, VIN=VIH or VIL
Typ 7 2 1 -
Max 1 1 15
1)
Unit A A mA mA mA V V mA A A A
72) 70 0.4 1
3)
ISB1
Low Power Low Low Power Low Power Low Low Power
KM62256C Family
AC OPERATING CONDITIONS
TEST CONDITIONS (Test Load and Test Input/Output Reference)
Input pulse level : 0.8 to 2.4V Input rising and falling time : 5ns Input and output reference voltage : 1.5V Output load (See right) :CL=100pF+1TTL
CMOS SRAM
CL1)
KM62256C Family
TIMMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS=OE=VIL, WE=VIH)
tRC Address tOH Data Out Previous Data Valid tAA
CMOS SRAM
Data Valid
Data out
NOTES (READ CYCLE)
High-Z
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage levels. 2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ (Min.) both for a given device and from device to device interconnection.
KM62256C Family
TIMING WAVEFORM OF WRITE CYCLE(1) (WE Controlled)
tWC Address tCW(2) CS tAW tWP(1) WE tAS(3) Data in tWHZ Data out Data Undefined tDW Data Valid tOW tDH tWR(4)
CMOS SRAM
Controlled)
tWC Address tAS(3) CS tAW tWP(1) WE tDW Data in Data Valid tDH tCW(2) tWR(4)
Data out
NOTES (WRITE CYCLE)
High-Z
High-Z
1. A write occurs during the overlap of a low CS and a low WE. A write begins at the latest transition among CS going Low and WE going low : A write end at the earliest transition among CS going high and WE going high, t WP is measured from the begining of write to the end of write. 2. tCW is measured from the CS going low to end of write. 3. tAS is measured from the address valid to the beginning of write. 4. tWR is measured from the end of write to the address change. t WR applied in case a write ends as CS or WE going high.
KM62256C Family
PACKAGE DIMENSIONS
28 PIN DUAL INLINE PACKAGE(600mil)
CMOS SRAM
Units: millimeter(inch)
0.25 +0.10 -0.05 +0.004 0.010-0.002 #15
#28
15.24 0.600
13.600.20 0.5350.008
0~15
( 1.65 ) 0.065
2.54 0.100
8.380.20 0.3300.008
11.43 0.450
+0.10 -0.05
0.006+0.004 -0.002
1.020.20 0.0400.008
0.89 ) 0.035
0.410.10 0.0160.004
1.27 0.050
KM62256C Family
PACKAGE DIMENSIONS
28 PIN THIN SMALL OUTLINE PACKAGE TYPE I (0813.4F)
CMOS SRAM
Units: millimeter(inch)
0.20
13.400.20 0.5280.008 #28 ( 8.40 0.331 MAX 8.00 0.315 0.425 ) 0.017
#1
0.55 0.0217
#14
0.20
13.400.20 0.528 0.008 #15 ( 8.40 0.331 MAX 8.00 0.315 0.425 ) 0.017
#14
0.55 0.0217
#28
+0.10 -0.05
0.15
0.50 ) 0.020