Академический Документы
Профессиональный Документы
Культура Документы
CMOS SDRAM
* Samsung Electronics reserves the right to change products or specification without notice.
CMOS SDRAM
CMOS SDRAM
Pb-free Package
RoHS compliant
GENERAL DESCRIPTION
The K4S640432H / K4S640832H / K4S641632H is 67,108,864 bits synchronous high data rate Dynamic RAM organized as 4 x 4,194,304 words by 4 bits, / 4 x 2,097,152 words by 8 bits, / 4 x 1,048,576 words by 16 bits, fabricated with SAMSUNGs high performance CMOS technology. Synchronous design allows precise cycle control with the use of system clock I/O transactions are possible on every clock cycle. Range of operating frequencies, programmable burst length and programmable latencies allow the same device to be useful for a variety of high bandwidth, high performance memory system applications.
Ordering Information
Part No. K4S640432H-UC(L)75 K4S640832H-UC(L)75 K4S641632H-UC(L)60 K4S641632H-UC(L)70 K4S641632H-UC(L)75 4Mb x 16 Orgainization 16Mb x 4 8Mb x 8 Max Freq. 133MHz(CL=3) 133MHz(CL=3) 166MHz(CL=3) 143MHz(CL=3) 133MHz(CL=3) LVTTL 54pin TSOP(II) Interface Package
CMOS SDRAM
0~8C 0.25 TYP 0.010 #54 #28 0.45~0.75 0.018~0.030 0.05 MIN 0.002 ( 0.50 ) 0.020
11.760.20 0.4630.008
#1 22.62 MAX 0.891 22.22 0.875 0.10 MAX 0.004 ( 0.71 ) 0.028
0.10 0.004
#27
0.21 0.008
0.05 0.002
1.00 0.039
0.10 0.004
+0.10
0.80 0.0315
CMOS SDRAM
I/O Control
LWE LDQM
Output Buffer
Row Decoder
Row Buffer
DQi
Address Register
CLK ADD
LRAS
LCBR
CLK
CKE
CS
RAS
CAS
WE
L(U)DQM
* Samsung Electronics reserves the right to change products or specification without notice.
CMOS SDRAM
x4
VSS N.C VSSQ N.C DQ3 VDDQ N.C N.C VSSQ N.C DQ2 VDDQ N.C VSS N.C/RFU DQM CLK CKE N.C A11 A9 A8 A7 A6 A5 A4 VSS
x8
VSS DQ7 VSSQ N.C DQ6 VDDQ N.C DQ5 VSSQ N.C DQ4 VDDQ N.C VSS N.C/RFU DQM CLK CKE N.C A11 A9 A8 A7 A6 A5 A4 VSS
x16
VSS DQ15 VSSQ DQ14 DQ13 VDDQ DQ12 DQ11 VSSQ DQ10 DQ9 VDDQ DQ8 VSS N.C/RFU UDQM CLK CKE N.C A11 A9 A8 A7 A6 A5 A4 VSS
CKE
Clock enable
A0 ~ A11
Address
BA0 ~ BA1 RAS CAS WE DQM DQ0 ~ X15 VDD/VSS VDDQ/VSSQ N.C/RFU
Bank select address Row address strobe Column address strobe Write enable Data input/output mask Data input/output Power supply/ground Data output power/ground No connection /reserved for future use
CMOS SDRAM
Unit V V C W mA
Note : Permanent device damage may occur if "ASOLUTE MAXIMUM RATINGS" are exceeded. Functional operation should be restricted to recommended operating condition. Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
DC OPERATING CONDITIONS
Parameter Supply voltage Input logic high voltage Input logic low voltage Output logic high voltage Output logic low voltage Input leakage current
Recommended operating conditions (Voltage referenced to VSS = 0V, TA = 0 to 70C) Symbol VDD, VDDQ VIH VIL VOH VOL ILI Min 3.0 2.0 -0.3 2.4 -10 Typ 3.3 3.0 0 Max 3.6 VDD+0.3 0.8 0.4 10 Unit V V V V V uA 1 2 IOH = -2mA IOL = 2mA 3 Note
Notes : 1. VIH (max) = 5.6V AC.The overshoot voltage duration is 3ns. 2. VIL (min) = -2.0V AC. The undershoot voltage duration is 3ns. 3. Any input 0V VIN VDDQ. Input leakage currents include Hi-Z output leakage for all bi-directional buffers with Tri-State outputs.
CAPACITANCE
Clock
(VDD = 3.3V, TA = 23C, f = 1MHz, VREF =1.4V 200 mV) Pin Symbol CCLK CIN CADD COUT Min 2.5 2.5 2.5 4.0 Max 4.0 5.0 5.0 6.5 Unit pF pF pF pF Note 1 2 2 3
Notes : 1. -75 only specify a maximum value of 3.5pF 2. -75 only specify a maximum value of 3.8pF 3. -75 only specify a maximum value of 6.0pF
CMOS SDRAM
DC CHARACTERISTICS
Unit
Note
mA mA
mA 6 3 3 30 mA 25 mA
ICC4
115
mA
ICC5 ICC6
135 1 400
mA mA uA
2 3 4
Notes : 1. Measured with outputs open. 2. Refresh period is 64ms. 3. K4S6404(08)32H-TC** 4. K4S6404(08)32H-TL** 5. Unless otherwise noted, input swing IeveI is CMOS(VIH /VIL=VDDQ/VSSQ)
CMOS SDRAM
Version
60 70 75
Unit
Note
140
115
1 1 15
110
mA mA
mA
6 3 3 30
mA
mA
25
ICC4
160
140
135
mA
ICC5 ICC6
160
140
1 400
135
mA mA uA
2 3 4
Notes : 1. Measured with outputs open. 2. Refresh period is 64ms. 3. K4S641632H-TC** 4. K4S641632H-TL** 5. Unless otherwise noted, input swing IeveI is CMOS(VIH /VIL=VDDQ/VSSQ)
CMOS SDRAM
Value 2.4/0.4 1.4 tr/tf = 1/1 1.4 See Fig. 2
Vtt = 1.4V
Unit V V ns V
1200 Output 870 30pF VOH (DC) = 2.4V, IOH = -2mA VOL (DC) = 0.4V, IOL = 2mA Output Z0 = 50
50
30pF
OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted) Version Parameter Row active to row active delay RAS to CAS delay Row precharge time Row active time Row cycle time Last data in to row precharge Last data in to Active delay Last data in to new col. address delay Last data in to burst stop Col. address to col. address delay Number of valid output data Symbol 60 tRRD(min) tRCD(min) tRP(min) tRAS(min) tRAS(max) tRC(min) tRDL(min) tDAL(min) tCDL(min) tBDL(min) tCCD(min) CAS latency = 3 CAS latency = 2 60 12 18 18 42 70 14 20 20 49 100 68 2 2 CLK + tRP 1 1 1 2 1 65 75 15 20 20 45 ns ns ns ns us ns CLK CLK CLK CLK ea 1 2,5 5 2 2 3 4 1 1 1 1 Unit Note
Notes : 1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time and then rounding off to the next higher integer. 2. Minimum delay is required to complete write. 3. All parts allow every cycle column address change. 4. In case of row precharge interrupt, auto precharge and read burst stop. 5. In 100MHz and below 100MHz operating conditions, tRDL=1CLK and tDAL=1CLK + 20ns is also supported. SAMSUNG recommends tRDL=2CLK and tDAL=2CLK + tRP.
CMOS SDRAM
75 Max 1000 5.4 6 ns ns ns ns ns ns 5.4 6 ns 2 3 3 3 3 2 ns 1
Unit
Note
ns
1,2
Notes : 1. Parameters depend on programmed CAS latency. 2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter. 3. Assumed input rise and fall time (tr & tf) = 1ns. If tr & tf is longer than 1ns, transient time compensation should be considered, i.e., [(tr + tf)/2-1]ns should be added to the parameter.
Notes : 1. Rise time specification based on 0pF + 50 to VSS, use these values to design to. 2. Fall time specification based on 0pF + 50 to VDD, use these values to design to. 3. Measured into 50pF only, use these values to characterize to. 4. All measurements done with respect to VSS.
CMOS SDRAM
133MHz Pull-up 0.5 1 1.5 2 2.5 3 3.5
133MHz Pull-down
250
200
Voltage
IOL Min (133MHz)
CMOS SDRAM
Minimum VDD clamp current (Referenced to VDD) 20
15
mA
10
0 0 1 Voltage
I (mA)
-3
-2
-1
Voltage
I (mA)
CMOS SDRAM
(V=Valid, X=Dont care, H=Logic high, L=Logic low)
A10/AP A11, A9 ~ A0 Note
H H L H H H H
X H L H X X X X X L H L H
L L L H L L L L L H L X H L H L H L
L L H X L H H H L X V X X H X V X X H
L L H X H L L H H X V X X H X V X H
L H H X H H L L L X V X X H X V X H
X X X X X X X X X X X V X V V V
Bank active & row addr. Read & column address Write & column address Burst stop Precharge Bank selection All banks Entry Exit Entry Precharge power down mode Exit DQM No operation command Auto precharge disable Auto precharge enable Auto precharge disable Auto precharge enable
H H L H L H H
X X V X X X 7
Notes : 1. OP Code : Operand code A0 ~ A11 & BA0 ~ BA1 : Program keys. (@ MRS) 2. MRS can be issued only at all banks precharge state. A new command can be issued after 2 CLK cycles of MRS. 3. Auto refresh functions are as same as CBR refresh of DRAM. The automatical precharge without row precharge command is meant by "Auto". Auto/self refresh can be issued only at all banks precharge state. 4. BA0 ~ BA1 : Bank select addresses. If both BA0 and BA1 are "Low" at read, write, row active and precharge, bank A is selected. If both BA0 is "Low" and BA1 is "High" at read, write, row active and precharge, bank B is selected. If both BA0 is "High" and BA1 is "Low" at read, write, row active and precharge, bank C is selected. If both BA0 and BA1 are "High" at read, write, row active and precharge, bank D is selected. If A10/AP is "High" at row precharge, BA0 and BA1 is ignored and all banks are selected. 5. During burst read or write with auto precharge, new read/write command can not be issued. Another bank read/write command can be issued after the end of burst. New row active of the associated bank can be issued at tRP after the end of burst. 6. Burst stop command is valid at every burst length. 7. DQM sampled at positive going edge of a CLK and masks the data-in at the very CLK (Write DQM latency is 0), but makes Hi-Z state the data-out of 2 CLK cycles after. (Read DQM latency is 2)