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SILICON TRANSISTOR
2SC2954
NPN SILICON EPITAXIAL TRANSISTOR POWER MINI MOLD
DESCRIPTION
The 2SC2954 is an NPN epitaxial silicon transistor disigned for low noise wide band amplifier and buffer amplifier of OSC, for VHF and CATV bnad.
PACKAGE DIMENSIONS
(Unit: mm)
FEATURES
Low Noise and High Gain. NF: 2.3 dB, 2.4 dB
0.8 MIN.
E
0.42 0.06
Document No. P10405EJ3V0DS00 (3rd edition) (Previous No. TC-1458A) Date Published March 1997 N Printed in Japan
4.00.25
2.50.1
1994
2SC2954
ELECTRICAL CHARACTERISTICS (TA = 25 C)
CHARACTERISTIC Collector Cutoff Current DC Current Gain Gain Bandwidth Product Feedback Capacitance SYMBOL ICBO hFE fT Cre TEST CONDITIONS VCB = 10 V, IE = 0 VCE = 10 V, IC = 50 mA *1 VCE = 10 V, IC = 50 mA VCB = 10 V, Emitter Grounded, f = 1.0 MHz VCE = 10 V, IC = 50 mA, f = 500 MHz RG = 50 VCE = 10 V, IC = 30 mA, f = 500 MHz RG = 50 10 30 3.0 100 4.0 1.1 1.8 MIN. TYP. MAX. 100 200 UNIT nA
GHz pF
S21e2
NF
12.5
dB
Noise Figure
2.4
4.0
dB
2 %/Pulsed
200
IC-Collector Current-mA
2.0
100
Free Air Rth(j-a) 312.5 C/W 0 0 50 100 Ta-Ambient Temperature-C 150 0.5 VBE-Base to Emitter Voltage-V 1.0
200
IC-Collector Current-mA
200 100 70 50 30
20 10
2SC2954
FEED-BACK AND OUTPUT CAPACITANCE vs. COLLECTOR TO BASE VOLTAGE f = 1.0 MHz fT-Gain Bandwidth Product-MHz
30 25 |S21e|2-Insertion Gain-dB 20
30
25 f = 200 MHz
20
15
10
10 20 30 50 IC-Collector Current-mA
0 0.1
0.7
1.0
2SC2954
18 15
Ga-Associated Gain-dB NF-Noise Figure-dB
6 5 4 3 2 1 0
NOISE FIGURE, ASSOCIATED GAIN vs. COLLECTOR CURRENT VCE = 10 V f = 500 MHz RG = 50 Ga
12 9 6 3 0
NF
5 7 10 20 IC-Collector Current-mA
30
50
70 100
NF-Noise Figure-dB
70
60
IM3
50 IM2 40
0 0.1
2SC2954
S11e, S22e-FREQUENCY
0.10 0.40 110
0.7
0.6
0.
GTHS 0 0.01 0.49 0.02 TOWARD 0.48 0 0.49 0.0 GENE 0.01 7 0.48 2 RD L 3 RA OAD 0.4 0.0 A N O I C T O EFFCIEN 0.4 0.0TOR 3 HS TOWLE OF REFLEC T IN D 6 7 .0 4 0 G T 4 EGR N G 0. EES EN 160 A 0.4 L 0 4 E .0 6 0.0 AV 0 5 W 15 0.4 5 0.4 5 50 0 1 .0 5 0 0. 0 44 P . OS 0.1 14 0.4 6 0 06 40 ENT ITIV ON 0 ER 4 MP 0. 1 EA CO
0.
07 43 0. 0 13
1.6
8 0.0 2 0.4 20 1
0.9
1.0
0.8
1.2
9 0.0 1 0.4
0.12 0.38
0.13 0.37
90
0.14 0.36 80
0.15 0.35
70
1.4
0.1 6 0.3 4
00 6
1.8
0.1 0.3 7 3
0.2
0.
2.0
50
0. 18 32
19 0. 31 0.
T EN
0.4
0.2
40
0.3
( Z+JXTANCE CO ) MPO
WAVELE N
0 1.
0.2
0.3
0.4
0.5
0.6
0.7 0.8
0.9 1.0
1.2
1.4
1.6
1.8 2.0
3.0
4.0
5.0
10
20
0.1
0.6
1. 0
0.2
0.
S22e
5.0
4.0
E NC TA X AC J RE ZO
0.3
0.
E IV AT
0.
2.0
0.6
1.8
1.6
0.7
0.8
1.4
0.9
1.2
1.0
S21e-FREQUENCY 90 120 0.1 GHz 0.2 0.3 0.5 0.7 1.0 5.0 10 15 20 60 120
S12e-FREQUENCY 90 60 0.1 GHz 0.7 0.5 0.3 0.2 0.1 0 180 0.05 0.1 0.15 0.20 0 30
150
30
150
180
150
30
150
120
60 90
120
90
CONDITION VCE = 10 V IC = 50 mA
CONDITION VCE = 10 V IC = 50 mA
10
0.1 GHz
0.4
20
50
S11e
3.
0.
32 18 0.
3 0.3 7
0.1
4 0.3 6 0.1
0.35 0.15 70
0.36 0.14 80
1.0
0.8
0.6
0.37 0.13
0.4
0.4
1 GHz
0.8
0.6
0.2
0.2
90
0.40 0.10
11
0.4 1 0.0 9
1 2
0.4 0.0 2 8 0
NE G
0. 4 0. 3 07 30
0.
0.6
3.
1 0.2 9 0.2 30
0.8
0.3
4.0
1. 0
6.0
0.2
10
0.1
20
50
0.25 0.25
0.26 0.24
10
0.27 0.23
0.2 8 0.2 2 20
4 0
0. 0. 31 19
30
60
2SC2954
[MEMO]
2SC2954
[MEMO]
2SC2954
No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. Anti-radioactive design is not implemented in this product.
M4 96. 5
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