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Introduction
Infrared spectroscopy is a well established technique for detection and identification of contaminants on surfaces, in particular metallic surfaces. Detection levels can be as low as fractions of micrograms, depending on factors such as viewing/measurement angles and use of a polarized infrared beam. Detection of silicone films is an important application. For example, silicone release coatings are applied to surfaces to facilitate the manufacture of carbon-fiber/epoxy laminating materials. The silicone is supposed to remain on the fabricating equipment but in some cases it will migrate in small quantities to the fabricated material, which becomes problematic. For example, if the fabricated material is subsequently painted or otherwise coated, this silicone residue will result in poor adhesion affecting the quality, appearance and longevity of the coating. Figure 1: LaserScan Analyzer Also the silicon coatings
on the fabricating equipment must be monitored and maintained for the equipment to perform properly. This application note focuses on the use of Block Engineerings LaserScan Analyzer (Fig. 1) as a handheld spectrometer, based on quantum cascade laser (QCL) technology, for detecting and quantifying silicone film thicknesses.
Experimental Results
In this application note three samples of methyl silicone were dissolved in n-Hexane 97%. Sample A was 26 mg/mL; B was 50 mg/mL; C was 70 mg/mL. A micro-syringe was used to apply 0.01mL of each sample on a diffused gold substrate. The Hexane
completely evaporated in 30 minutes leaving concentrations of 173 g/cm2 for sample A; 313 g/cm2 for sample B; 438 g/cm2 for sample C. The three samples were then examined with the LaserScan at a standoff distance of 6 inches.
Figure 2: Spectrum of silicone film on surface at 6 inches standoff distance (surface concentration of approximately 438 g/cm) Figure 2 shows the silicone spectrum for Sample C. As can be seen there are distinctive features including a strong feature at 1256 cm-1.
Figure 3: Projections for Limit of Detection (LOD) estimated at 4.5 g/cm today (future projections to <1 g/cm)
Figure 3 shows a plot of absorption at wavelength 1256 cm-1 for each sample. Extrapolating the data points implies a limit of detection of 4.5 g/cm2, which is sufficient for most applications. Future versions of LaserScan currently under development should reduce the LOD to <1 g/cm2, if needed.
Conclusions
This application note demonstrates that Blocks LaserScan is the optimal tool for the standoff measurement of silicone films on surfaces. LOD of 4.5 g/cm2 on a metal surface has been demonstrated. LaserScan provides a new tool for production engineers and quality control departments tasked with ensuring the proper and effective use of silicone in important industrial applications. Future LaserScan devices will be much lighter (flashlight size) and more sensitive (projected LOD <1 g/cm).