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Mainframe Operating Manual

HP 37717B Communications Performance Analyzer

 Copyright HewlettPackard Ltd. 1997 All rights reserved. Reproduction, adaption, or translation without prior written permission is prohibited, except as allowed under the copyright laws. HP Part No 37717-90271 First edition 07/97 Printed in U.K.

Warranty
The information contained in this document is subject to change without notice. Hewlett-Packard makes no warranty of any kind with regard to this material, including, but not limited to, the implied warranties or merchantability and tness for a particular purpose. Hewlett-Packard shall not be liable for errors contained herein or for incidental or consequential damages in connection with the furnishing, performance, or use of this material.

WARNING
For details of safety, see Safety information at the front of this manual. Warning Symbols Used on the Product

!
The product is marked with this symbol when the user should refer to the instruction manual in order to protect the apparatus against damage.

The product is marked with this symbol to indicate that hazardous voltages are present

Hewlett-Packard Limited Communications Measurements Division South Queensferry West Lothian, Scotland EH30 9TG

Mainframe Operating Manual

Serial Numbers
This manual applies directly to instruments with serial numbers GB00000101 and above.

HP Part Number 37717-90271 Printed in U.K. July1997

HP 37717B Communications Performance Analyzer

About This Manual

This Mainframe Operating manual explains the following: How to obtain the required display using the display select keys, TRANSMIT; RECEIVE; RESULTS; GRAPH; OTHER How to modify the display information, using How to use the other front panel keys How to interpret the front panel status indicators How to connect to external equipment How to perform instrument tasks associated with the HP 37717B irrespective of the Option conguration The PDH Operating Manual (37717-90212) describes in detail how to perform PDH tests with the HP 37717B PDH/SDH test set. The SDH Operating Manual (37717-90273) describes in detail how to perform SDH tests with the HP 37717B PDH/SDH test set. The Jitter Operating Manual (37717-90214) describes in detail how to perform Jitter tests with the HP 37717B PDH/SDH test set. The ATM Operating manual (37717-90215) describes in detail how to perform ATM tests with the HP 37717B PDH/SDH test set. and the display softkeys

Contents

Mainframe Operating Manual 1 Warranty 2 WARNING 2 About This Manual 2

1 Getting Started
About the HP 37717B 1-1
Option Summary 1-3 Power Requirements 1-5

Obtaining and Modifying the HP 37717B Displays 1-6

Other Front Panel Keys Status Indicators 1-9 Connectors 1-11 1-8

Basic Error Measurement Demonstration 1-14

Structured PDH Setup (Option UKJ [USA]) 1-14

2 Mainframe Operating Features

Ordering Upgrade Modules 2-1

Graphics 2-2
Obtaining Graphics Results 2-3 Recalling Previously Stored Results 2-4 Viewing the Bar Graph Display 2-4 Viewing the Error and Alarm Summaries 2-5 Viewing the Stored Results Status 2-6 Printing Graphics Displays 2-7

Logging Results 2-8

Test Period Logging 2-8 Error Event Logging 2-9

Contents

Centronics Parallel Printer Port 2-10 HP-IB External Printer 2-11 RS- 232-C External Printer 2-11 Disk Drive 2-12 Printing from Disk 2-13 To Print from DOS Prompt 2-13

External HP 550C DeskJet Printer 2-14

Connecting an HP 550C DeskJet Printer to RS-232-C Port 2-14 Connecting an HP 550C DeskJet Printer to Parallel Port 2-15

Internal Printer Changing Paper 2-16 Autosetup 2-17

SDH Input PDH Input 2-17 2-18

Stored Settings 2-19

Select Settings to be Stored 2-23 Title the Settings 2-24 Save the Settings 2-24 Recall Default Settings 2-24 Recall Previously Stored Settings (FAS Monitoring)

2-25

Disk Drive 2-26

Directory Structure 2-26 Portability of Disks 2-26 To Format a Disk 2-27 To Label a Disk 2-27 File and Directory Management 2-28 Adding Descriptors to .CNF and .SMG Files 2-30 To Save Current Instrument Conguration to Disk 2-31 To Save Data Logging to Disk 2-32 To Recall Congurations from Disk to Instrument 2-33 To Recall Graphics Results from Disk to Instrument 2-33 To Copy Conguration from Instrument Store to Disk 2-34 To Copy Conguration from Disk to Instrument Store 2-34 To Copy Graphics from Instrument Store to Disk 2-35 To Delete a File 2-35

Contents

To Delete a Directory 2-36 To Rename a File 2-36 To Create a Directory 2-37 Printing from Disk 2-37 To Print from DOS Prompt 2-37

Coupling Transmit and Receive Settings 2-38 Time & Date 2-39
Setting Time and Date 2-39 2-40 2-41

Keyboard Lock 2-40

Lock/Unlock the Keyboard

Beep On Received Error 2-41

Enable/Disable Beep On Error

Analysis Control (Option UKJ[USA] only) 2-42 Analysis Control (Option UKK[USB] only) 2-42 Self Test 2-43
Additional Tests 2-44

Logging Messages A-1 Logging Devices A-1

Results Logging A-1 During the Measurement Period A-2 At the End of the Measurement Period A-6 Bar Graph Logging (Not Internal Printer) A-7 Graphics Text Results Logging (Not Internal Printer) Results Snapshot Logging A-10 Overhead Capture Logging A-12 Jitter Auto Tolerance Results Logging A-12 Jitter Transfer Results Logging A-12 Overhead Snapshot Logging A-13 SDH Tributary Scan Logging A-14 Pointer Graph Logging A-15

A-9

Results Definitions B-1 Trouble Scan B-1 PDH Alarm Scan (Options UKJ[USA], UKL[USC]) B-2

Contents

SDH Alarm Scan (Options A3R [A3S] B-2 Short Term Results B-3
PDH Results (Options UKJ[USA], UKK[USB] and UKL[USC]) B-3 SDH Results (Options US1[US5], A1T[A1U], A3R [A3S]) B-3 ATM Results (Option UKN) B-4

Cumulative Results B-5

PDH Results (Options UKJ[USA], UKK [USB]and UKL[USC]) SDH Results (Option US1[US5], A1T[A1U], A3R [A3S]) B-5 ATM Results (Option UKN) B-6 G.821 Bit Errors B-7 G.821 Frame (FAS) Errors B-8 G.821 CRC Errors B-9 G.821 REBE Errors B-10 G.826 PDH Analysis B-11 PDH M.2100 Frame Analysis B-19 PDH M.2110 BIS (Bring Into Service) B-20 PDH M.2120 Circuit Maintenance B-20 B-5

PDH Error Analysis G.821, G.826, M2100, M2110, M2120 B-7

SDH Error Analysis (Option A3R [A3S]) B-21

G.826 Analysis B1 BIP B-21 G.826 Analysis B2 BIP B-22 G.826 Analysis MS REI B-23 G.826 Path B3 BIP Analysis B-24 G.826 HP REI Analysis B-25 G.826 HP IEC Analysis B-26 G.826 TU Path BIP Analysis - 34 Mb/s Payload B-27 G.826 TU Path BIP Analysis - 2 Mb/s Payload B-28 G.826 LP REI Analysis - 34 Mb/s Payload B-29 G.826 LP REI Analysis - 2 Mb/s Payload B-30

ATM Error Analysis (Option UKN) B-31

G.826 ATM EM BIP Analysis B-31 G.826 ATM REI Analysis B-32 G.826 ATM REBE Analysis B-33

Contents

G.826 ATM CRC4 Analysis

B-34

SDH Pointer Value Results (Option A3R [A3S]) B-35 Jitter Results (Options UHN[US9], A3L [A3M], A3V [A3W], A3N [A3P]) B-36 Alarm Seconds B-37
PDH Alarm Seconds B-37 SDH Alarm Seconds (Options A3R [A3S]) B-38 ATM Alarm Seconds (Option UKN) B-38

Frequency Measurement B-39

Appendix C- Self Test Fail Numbers

Hewlett-Packard Sales and Service Offices 5 About This Edition 1 In This Book 2

Contents

Getting Started

Getting Started

1.1About the HP 37717B

The HP 37717B is a multi-rate bit error measuring test set. It can generate and receive a range of data patterns, and provide analysis to ITU-T Rec. G.821, G.826, M2100, M2110, M2120 depending on the options tted. 75 unbalanced data interfaces are provided at all PDH data rates and STM-1 only. In addition 120 balanced data interfaces are provided at 2.048 Mbit/s (and 704 kb/s in Option UKK][USB]). AMI, HDB3 or CMI coding is used depending on the selected rate. Accurate error measurements can still be made in the presence of half-rate cable loss of up to 12 dB, and at protected monitor points. Option UKK[USB] provides unstructured PDH measurements at standard bit rates of 704 kbit/s, 2.048 Mbit/s, 8.448 Mbit/s, 34.368 Mbit/s and 139.264 Mbit/s. Frequency offset capability of 100 ppm about the standard rates, is provided. At 704 kbit/s and 2.048 Mbit/s the generator timing can be recovered from the received data. In-Service FAS measurements are available at 2 Mb/s 8 Mb/s, 34 Mb/s and 140 Mb/s. Option UKJ [USA] provides structured PDH generation and measurement at standard bit rates of 2.048 Mbit/s, 8.448 Mbit/s, 34.368 Mbit/s and 139.264 Mbit/s. Full Mux/Demux testing from 64 kb/s to 140 Mb/s including N X 64 kb/s, 2 Mb/s, 8 Mb/s and 34 Mb/s. Frequency offset capability of 100 ppm about the standard rates, is provided. At 2.048 Mbit/s the generator timing can be recovered from the received data. Option UHC [US6] Provides 3 additional data outputs, for Structured PDH, Option UKJ and Unstructured PDH, Option UKK, which are a replica of PDH Signal Out, each delayed by a dened amount. Option UH3 [US7] provides binary NRZ interfaces for structured PDH, Option UKJ and Unstructured PDH, Option UKK. Option UKN [USE] provides ATM generation and measurement at the Physical and Cell layers at bit rates of 2.048 Mb/s, 34.368 Mb/s, 139.264 Mb/s and if an SDH option is tted 155.52 Mb/s.

1-1

Getting Started

Option A3R [A3S] provides generation and analysis of mapped 140 Mb/s, 34 Mb/s, 2 Mb/s, SDH signals at STM-0/STM-1. Allows; addition of errors and alarms, frequency offset of SDH line rate and tributary rate, generation of ITU-T G.783 pointer sequences, acces to STM-1 overhead, overhead sequence generation, overhead sequence capture and overhead BER testing. . Option UH1 provides STM-1 Optical interface at 1310 nm. Option 130 provides a STM-0/STM-1/STM-4 optical interface at 1310 nm with access to STM-4 and STM-4c overhead, STM-4 thru mode, STM-4 Optical stress test and Optical power measurement. Option 131 provides a STM-0/STM-1/STM-4 optical interface at 1310 nm and 1550 nm with access to STM-4 and STM-4c overhead, STM-4 thru mode, STM-4 Optical stress test and Optical power measurement. Option OYH provides binary interfaces for Options UKT, USN, 130 and 131 only. Option A3K [A3Q] Adds Jitter generation at all PDH rates except 704 kb/s if a PDH option is tted, and if Option US1[US5] or A1T [A1U] or A3R [A3S] is tted adds Jitter generation at STM-1/STM-4. Adds Wander generation at 2.048 Mb/s if a PDH option is tted, and if Option US1[US5] or A1T [A1U] or A3R [A3S] is tted adds Wander generation at STM-1/STM-4. Option 140 [141] Adds Jitter generation at all PDH rates except 704 kb/s if a PDH option is tted, and if Option US1[US5] or A1T [A1U] or A3R [A3S] is tted adds Jitter generation at STM-1/STM-4. Option UHN [US9] Adds PDH Jitter measurement at all PDH rates except 704 kb/ s, and adds Wander and Estimated Slips measurement at 2.048 Mb/s. Option A3L [A3M] adds Jitter measurement at STM-1 Electrical rate and all PDH rates except 704 kb/s and automatic Jitter Transfer measurement. Option A3V [A3W)] adds SDH Jitter measurement at STM-1 Electrical and Optical rate and all PDH rates except 704 kb/s and automatic Jitter Transfer measurement. Option A3N [A3P] adds SDH Jitter measurement at STM-1 and STM-4 Optical rates, STM-1 Electrical rate and all PDH rates except 704 kb/s and automatic Jitter Transfer measurement. Option A3B provides an external parallel printer port and remote control via RS232-C, HP-IB and LAN. Option A3D provides an external parallel printer port and remote control via RS232-C and HP-IB. Option USS provides Distributed Network Analyzer capability.

1-2

Getting Started

Option Summary
Table 1-1 provides a summary of the available HP 37717B options. Standard options are tted with BNC connectors. Options identied in [ ] have Siemens connectors.

Table 1-1

Option Summary

Option No.
UKK [USB] UKJ [USA] UKL [USC] UKN [USE] UHC [US6] UH3 [US7] US1 [US5] A1T[(A1U] A3R[(A3S] UH1 UH2 URU UKT USN 130 131 0YH UH4 UH5

Description
Unstructured PDH generation and measurement. Structured PDH generation and measurement. Structured PDH measurement only. (No Longer available). ATM generation and measurement. Multiple PDH outputs. Binary Interfaces. Generation and analysis of STM-1 electrical SDH signals, SDH frequency offset and Alarm/Error generation. (No Longer available) As US1[US5] plus Pointer generation and Overhead access. (No Longer available) As A1T[A1U] plus STM-0 generation and measurement. STM-1 Optical interface at 1310 nm. STM-1/STM-4 Optical interfaces at 1310 nm.(No Longer available). STM-1/STM-4 Optical interfaces at 1550 nm. (No Longer available) STM-1/STM-4 Optical Interface at 1310 nm, STM-4 overhead access and Optical power measurement. (No Longer available) STM-1/STM-4 Optical Interface at 1310/1550 nm STM-4 overhead access and Optical power measurement. (No Longer available) STM-1/STM-4 Optical Interface at 1310 nm, STM-4c overhead access, STM-4 thru mode and STM-4 Optical stress test. STM-1/STM-4 Optical Interface at 1310/1550 nm, STM-4c overhead access, STM-4 thru mode and STM-4 Optical stress test. SDH binary interface for Option UKT, USN, 130 and 131 only. FC/PC optical adaptor for options UH1, UH2, USN, UKT and URU. DIN47256 optical adaptor for options UH1, UH2, USN, UKT and URU.

1-3

Getting Started

Table 1-1

Option Summary

Option No.
UH6 UH7 UH8 UHK A3K {A3Q] 140 {141] UHN [US9] A1M [A1Q] A1N [A1R] A1P [A1S] A3L [A3M] A3V [A3W] A3N [A3P] A3B A3D USS 1A8 1CW 1F7 USE OB2

Description
ST optical adaptor for options UH1, UH2, USN, UKT and URU. Biconic optical adaptor for options UH1, UH2, USN, UKT and URU. NEC D4 optical adaptor for options UH1, UH2, USN, UKT and URU.

Jitter generation. (No Longer available) Jitter and Wander generation and Jitter Transfer. Extended Jitter generation.
PDH Jitter measurement, Wander and estimated Slips. STM-1 Electrical and PDH Jitter measurement. (No Longer available) STM-1 Optical and electrical and PDH Jitter measurement. (No Longer available) STM-1 Optical and Electrical, STM-4 Optical and PDH Jitter measurement. (No Longer available) STM-1 Electrical and PDH Jitter measurement and automatic jitter transfer. STM-1 Optical and electrical and PDH Jitter measurement and automatic jitter transfer. STM-1 Optical and Electrical, STM-4 Optical and PDH Jitter measurement and automatic jitter transfer. Remote Control via RS-232-C, HP-IB and LAN and a parallel printer port. Remote Control via RS-232-C and HP-IB and a parallel printer port. Distributed Network Analyzer capability. Remote Control via HP-IB. (No Longer available). Remote Control via RS-232-C. (No Longer available). Remote Control via LAN. (No Longer available). Virtual Remoter capability. (No Longer available) Provides one additional operating manual.

1-4

Getting Started

Table 1-1

Option Summary

Option No.
OBF OB3 W30

Description
Provides one additional remote control manual. Provides a service manual. Provides two additional years of hardware support beyond the standard one year warranty.

Power Requirements
The HP 37717B Communications Performance Analyzer requires a power source of 100 V to 120 V or 200 to 240 V at a frequency between 47 Hz and 63 Hz. Power consumption is 450 VA maximum. The fuse rating for the power source is, 5A Timed 250V, HP part number 21101120. To maintain protection only the specied fuse should be tted.

1-5

Getting Started

1.1Obtaining and Modifying the HP 37717B Displays

The operator interface is provided by the display and the front panel keys. Five different display areas are obtainable using the ve display keys, TRANSMIT RECEIVE RESULTS GRAPH and OTHER immediately to the right of the display:
TRANSMIT RECEIVE RESULTS GRAPH OTHER

Allows control of the settings associated with the generated signal. Allows control of the settings associated with the received signal. Allows control of the Test timing and displays the selected measurement results. Allows management of the stored graphical results. Allows control of Stored Settings, Settings Control, Time & Date, Keyboard Lock, Printer/Logging, COMMS/Remote Control, Floppy Disk, Beep On Received Error, Analysis Control, Analysis Display Mode and Self Test. A list of Options tted is also displayed.

1-6

Getting Started

1. In each of the display areas the eld currently able to be changed is marked by a "highlighted cursor". 2. The menu of selections available, for the highlighted eld, appears at the bottom of the display: 140 Mb/s; 34 Mb/s; 8 Mb/s; 2 Mb/s. The choice from the menu is made using the display softkeys situated immediately below the display.

3. The "highlighted cursor" is moved AND . around the display using The "highlighted cursor" can be quickly returned to the top of the display by pressing the appropriate display key, in this example TRANSMIT .

4. When a eld has more than ve choices, as in Pattern above a softkey labelled MORE is provided. When MORE is chosen the remainder of the menu is revealed 5. When the setting within a eld is not enclosed in [ ] the eld cannot be highlighted as no choice is available in the set up selected, as in LINE CODE and TERMINATION above . .

1-7

Getting Started

Other Front Panel Keys

AUTO SETUP The test set attempts to match the settings to the received signal. RUN/STOP Terminates the current test period if one is in progress. Starts a new test period. The indicator above the key is lit when a test period is in progress. SIGNAL IN Determines whether the PDH IN and STM-1 IN ports function as a Monitor input or as a Terminated input. Monitor allows accurate error measurement at the line equipment protected monitor point. The indicators above the key signify the type of input selected. SINGLE

Adds a single bit error to the output data pattern each time the key is

pressed.
1E - 3 Adds bit errors to the output data pattern at a rate of 1 error every 1000 data bits. The error addition continues until the key is pressed again. The indicator above the key is lit while errors are being added. LOCAL Returns the instrument from remote operation to Local (keyboard) operation. The indicator above the key is lit when the instrument is under Remote Control. PRINT NOW The selected measurement results are logged, immediately, to the selected printer. PAPER FEED The paper in the internal printer rolls up.

CAUTION

Do not press PAPER FEED while attempting to load a new roll of paper in the printer. It could result in a paper jam and disable the printer. Wait until the paper is fed through the printer rollers before pressing PAPER FEED .

1-8

Getting Started

Status Indicators

History Keys
The Status indicators on the front panel convey information regarding the current status of the instrument. If an alarm has occurred during the current Test Period the indicator above SHOW HISTORY is lit. To view which alarms have occurred press and hold SHOW HISTORY . When SHOW HISTORY is released the status indicators return to displaying the current status
SHOW HISTORY When pressed and held the Status indicators display any alarms which have been set during the current Test Period. This continues until SHOW HISTORY is released at which time the current status is displayed. The indicator above the key is lit to signify that an alarm has occurred during the current Test Period. RESET HISTORY Resets the history store such that the historical and present status are the same. This can also be achieved by starting a new Test Period.

PDH Alarm Indicators - These are active when a PDH rate is received. Signal Loss - No data transitions at the PDH IN port. Pattern Loss - The received data pattern is not in synchronization with the internally generated reference data. AIS - The All Ones AIS signal is detectable in the presence of a 1 in 10-3 error rate. Errors - A bit or frame error has occurred. Frame Loss - Frame alignment lost. M/Frame Loss - Multiframe alignment lost.

1-9

Getting Started

Remote Alarm - Remote alarm bit is set. Remote M/Frame - Remote Multiframe Alarm bit is set. Jitter Alarm Indicator - This is active when jitter is selected. Jitter Unlock - Jitter receiver is out of lock. Jitter measurement is suspended until lock is regained. SDH Alarm Indicators - These are active when a SDH rate is received. Signal Loss - No data transitions at STM-1 IN port. Frame Loss -Out Of Frame or Loss Of Frame has been detected. Status message on bottom of display states which has occurred. Loss Of Pointer - Loss of AU4 pointer has been detected. MS AIS - Multiplexer Section AIS has been detected. AU AIS - Path AIS has been detected. Pattern Loss - The received data pattern is not in synchronization with the internally generated reference data. Clock Loss - The transmitter clock is not synchronized to the selected reference. Errors - An error has been detected. The indicator will remain lit for 100 ms. MS RDI - Multiplexer SectionRDI has been detected. HP RDI - HP RDI has been detected. TU Loss Of Pointer - TU Loss Of Pointer has been detected. Only valid when TU2 or TU-12 receiver payload is selected. TU AIS - TU Path AIS has been detected. Only valid when TU-2 or TU-12 receiver payload is selected. LP RDI - LP RDI has been detected in the TU Path. Only valid when TU-2 or TU-12 receiver payload is selected. ATM Alarm Indicators - These are active when an ATM signal is received. VP Alarm - Virtual Path AIS or RDI has been detected. Status message on bottom of display states which has occurred. VC Alarm - Virtual Channel AIS or RDI has been detected. Status message on bottom of display states which has occurred. Loss of Cell Sync - Cell Sync Loss has been detected. Selected Cell Not RX - The selected cell has not been received.

1-10

Getting Started

Connectors
PDH IN (Opt UKJ/UKK/UKN) PDH receiver input interface. Allows the connection of 75 unbalanced data signals (all rates) and 120 balanced data signals at 2 Mbit/s (and 704 kb/s Option UKK[USB],). PDH OUT (Opt UKJ/UKK/UKN) PDH transmitter output interface. Provides 75 unbalanced data output (all rates) and 120 balanced data output at 2 Mbit/s (and 704 kb/s Option UKK[USB]). 75 OUT 1 (Opt UHC) Replica of PDH OUT delayed by 4 bits at all rates except 140 Mb/s. 75 OUT 2 (Opt UHC) Replica of PDH OUT delayed by 8 bits at all rates except 140 Mb/s. 75 OUT 3 (Opt UHC) Replica of PDH OUT delayed by 12 bits at all rates except 140 Mb/s. ERROR OUT (Opt UKK) Provides an ECL pulse each time an error occurs. If 2 or more errors occur within 16 clock periods only 1 pulse is output.

STM-1 OUT (Opt A3R) SDH transmitter output interface. Provides a 75 unbalanced STM-1 electrical output. STM-1 IN (Opt A3R) EXT MTS CLOCK (Opt A3R) SDH receiver input interface. Allows the connection of 75 unbalanced STM-1 electrical signals.

Allows connection of a, 75 or 120 , timing reference as per CCITT G.811. The reference format may be either clock or data.

1-11

Getting Started

OPTICAL IN (Opt UH1, 130, 131)

Allows connection of an STM-1 or STM-4 optical signal. Option UH1 only accepts STM-1, Wavelength 1200 to 1600 nm, at a maximum power level of -8 dBm. Options UH2, URU, UKT and USN accept STM-1 or STM-4, Wavelength 1200 to 1600 nm, at a maximum power level of -8 dBm.

OPTICAL OUT (Opt UH1, 130, 131)

Provides a STM-1 or STM-4 optical signal. Option UH1 provides a STM-1 optical signal, wavelength 1280 to 1330 nm, at a nominal power level of -10 dBm. Options UH2 and UKT provide a STM-1 and STM-4 optical signal, wavelength 1280 to 1330 nm, at a nominal power level of -10 dBm. Option URU provides a STM-1 and STM-4 optical signal, wavelength 1550 to 1565 nm, at a nominal power level of -1 dBm. Option USN provides a STM-1 and STM-4 optical signal, wavelength 1280 to 1330 nm and 1550 to 1565 nm, at a nominal power level of 1 dBm.

CLOCK IN (Opt OYH) Allows connection of STM-1/STM-4 binary clock to Options USN or UKT. DATA IN (Opt OYH) CLOCK OUT (Opt OYH) Allows connection of STM-1/STM-4 binary data to Options USN or UKT. Provides a STM-1/STM-4 binary clock from Options USN or UKT.

DATA OUT (Opt OYH) Provides STMN-1/STM-4 binary data from Options USN or UKT. HANDSET (Opt UKJ) Allows connection of a telephone handset for communication across the network.

MUX (Opt UKJ) Allows the insertion of an external 2 Mb/s tributary into the transmitted payload.

1-12

Getting Started

DEMUX (Opt UKJ)

Provides a 2 Mb/s tributary dropped from the received payload.

2M REF IN (Opt UHN, A3L, A3V, A3N) Allows the connection of a 2 Mb/s reference, either Clock or Data for Wander measurement. DEMOD OUT (Opt UHN, A3L, A3V, A3N) Provides a demodulated Jitter output. RS 449 (Opt A3R) Allows the Drop and Insert of Regenerator Section (192 kb/s) and Multiplexer Section (576 kb/s) Data Communication CLOCK OUT (Opt UH3) DATA OUT (Opt UH3) CLOCK IN (Opt UH3) DATA IN (Opt UH3) Provides TTL or ECL binary clock output. Provides TTL or ECL binary data output. Accepts TTL or ECL binary clock. Accepts TTL or ECL binary data.

EXT CLOCK IN (Opt UH3) Allows coded data to be clocked from the PDH transmitter. MOD IN (Opt A3K) 2M REF (Opt A3K) Allows external jitter or wander modulation. Provides a reference input for Wander generation and an external clock for 2.048 Mb/s PDH transmission.

1-13

Getting Started

1.2Basic Error Measurement Demonstration

This simple procedure explains how to perform the following:
Recall the factory default settings using the STORED SETTINGS function. Set up a simple back-to-back bit error measurement. Start the measurement and monitor the results. Recall Factory Default Settings

1. Set up the STORED SETTINGS function on the OTHER display as shown opposite and select STORED SETTING NUMBER [0]. Press RECALL to recall the factory default settings.

The recalling of factory default settings will congure the instrument in a dened state. One important feature of the factory default settings is that the Graphics Store capability is turned off. This prevents the possibility of any previously stored graphics data being discarded.

Structured PDH Setup (Option UKJ [USA])

1. Set up the TRANSMIT MAIN SETTINGS display as shown below.

1-14

Getting Started

2. Set up the TRANSMIT STRUCTURED SETTINGS display as shown below.

3. Set up the RECEIVE MAIN SETTINGS display as shown below.

4. Set up the RECEIVE STRUCTURED SETTINGS display as shown below.

1-15

Getting Started

5. Set up the RESULTS display as shown opposite.Any of the other results can be viewed on the display by making a choice from the softkey menu.

Start the Measurement and Monitor the Results 1. Connect PDH IN to PDH OUT. 2. Press RUN/STOP to start the measurement and monitor the RESULTS display. 3. Press SINGLE a few times and check that the Error Results change.

1-16

Operating Features

Mainframe Operating Features

The HP 37717B Communications Performance Analyzer can be upgraded to include extra modules as your test needs change. If you have suitably qualied bench service technicians, aware of ESD (Electrostatic Discharge) hazards, then the module upgrade may be performed at your premises. If you do not have suitably qualied bench service technicians then we strongly recommend that the upgrade is performed at your nearest HP service ofce.

Ordering Upgrade Modules

1. 2. 3. 4. Note the Model number and Serial number. Afxed to the rear panel of the HP 37717B is a BUILD STATUS label. Note the information given on this label. Determine the extra modules needed using the option numbers given in the glossy data sheet. Pass the information gathered in 1, 2 and 3 to your local HP Sales and Service ofce.

NOTE

An upgrade module cannot be delivered unless the Serial number and Build Status information is provided.

2-1

Operating Features

0.1Graphics
The Graphics function provides the following displays: bar graph display of the results obtained during the test period. display of the measurement error summary and alarm summary during the test period. display of the graphics Store, content and capacity. Each of these displays can be viewed in the GRAPH display. The bar graph display and the error and alarm summaries can be logged on an external HP 550C DeskJet printer. If Option UKK, Unstructured PDH, is tted Bar Graphs of PDH Frame Count; PDH CRC Count; PDH REBE Count; PDH Code Count; Bit Error Count and PDH Alarms 1 and 2 are available. If Option UKJ[USA] or UKL[USC], Structured PDH, is tted additional Bar graphs of Frame 140 Count, Frame 34 Count, Frame 8 Count, Frame 2 Count and M2120 REPORTS are provided. If Option UKN, ATM measurement, is tted additional Bar Graphs of EM BIP Count, FEBE Count, CRC4 Count, REBE Count, Corrected HEC Count, Non Corrected HEC Count, Non Conforming Cell Count, Bit Error Count, Cell Loss Count, Errored Cell Count, Misinserted Cell Count, BEDC Count and ATM Alarms 1, 2 and 3 are provided, If Option A3R [A3S], SDH module, is tted additional Bar Graphs of B1 BIP Count; B2 BIP Count; B3 BIP Count; MS REI count; HP REI Count; HP IEC count; A1A2 Frame count; PDH Frame DS3 Count; PDH Frame DS1 Count; DS1 CRC6 Count; DS3 PBIT Count; DS3 CBIT Count; DS3 FEBE Count; TU BIP Count; LP REI Count; Bit Error Count and SDH Alarms 1, 2 and 3 are available. If Option UHN[US9] or A3L [A3M] or A3V [A3W] or A3N [A3P], Jitter measurement + Wander and Slips, is tted additional Bar Graphs of Jitter Hit Count; Wander Bit -ve Slips; Wander Bit +ve Slips; Wander Frame -ve Slips; Wander Frame +ve Slips and Jitter Alarms are available. If Option 130 or 131, STM-1/STM-4 Optical Interface is tted additional Bar Graphs of STM-4 - B1 BIP count; B2 BIP count and Alarms are available.

2-2

Operating Features

Up to 10 sets of bar graphs, error summaries and alarm summaries, and the status of the stored results can be stored in non volatile memory. The total graphics store capacity is normally 20,000 events. An event is the occurrence of an error or alarm. If GRAPH STORAGE RESOLUTION [FULL] is selected on the OTHER MISCELLANEOUS display the capacity reduces to 10,000 events. The resolution, determined by the selection made under STORAGE on the RESULTS display, affects the ZOOM capability when viewing the bar graphs. If 1SEC is selected all resolutions are available. If 1 MIN is selected only 1 MIN/BAR, 15 MINS/BAR and 60 MINS/BAR are available. If 15 MINS is selected only 15 MINS/BAR and 60 MINS/BAR are available. If 1 HOUR is selected only 60 MINS/ BAR is available. Up to 10 sets of graphical results can be stored. If an attempt is made to store more than 10 sets of results, then a rst in rst out policy is operated and the oldest set of results will be lost. If graphics are enabled and a test is run which exceeds the remaining storage capacity, then some previously stored graphical results will be lost. To prevent accidental overwriting of graphics data the graphics capability should be disabled when graphical results are not required. To disable the graphics capability select STORAGE [OFF] on the RESULTS display.

Obtaining Graphics Results

To obtain graphical results enable the graphics by selecting STORAGE [1 SEC RESOLUTION] or [1 MIN RESOLUTION] or [15 MINS RESOLUTION] or [1 HOUR RESOLUTION] on the RESULTS display. The resolution selected affects the ZOOM capability when viewing the bar graphs. I STORAGE [1 MIN RESOLUTION] enables the graphics and allows storage of the measurement results. The graphics results can be stored in the instrument - INTERNAL or stored on DISK. When a measurement is started by pressing RUN/STOP graphical results will be stored in the selected location and displayed on the GRAPH display.

2-3

Operating Features

Recalling Previously Stored Results

Results stored from a previous test period can be recalled to the graphics displays for viewing and printing. If currently viewing the bar graph display, select TEXT RESULTS then STORE STATUS . If currently viewing the error or alarm summary, select STORE STATUS . 1. Using and move the highlighted cursor to the store location which contains the required results. 2. If you wish to view the bar graphs, select GRAPH RESULTS . 3. If you wish to view the error or alarm Summaries, select TEXT RESULTS .

Viewing the Bar Graph Display

The bar graph display can be viewed at any time. 1. To view the current bar graphs, press GRAPH and use CHANGE UPPER and CHANGE LOWER to obtain the bar graphs required. 2. To view a set of previously stored bar graphs, press GRAPH TEXT RESULTS and STORE STATUS . Using and move the highlighted cursor to the store location which contains the required results, and select GRAPH RESULTS . 3. For more detailed inspection of the bar graph, position the cursor centrally within the area of interest using and select ZOOM IN to reduce the time axis to 15 MINS/BAR. This is only possible if the graphics results were stored with a STORAGE resolution of 1 SEC,1 MINS or 15 MINS. For further reduction of the time axis, to 01 MINS/BAR or 01 SECS/BAR, position the cursor centrally within the area of interest and select ZOOM IN until the required time axis is obtained.

2-4

Operating Features

The top row of the display comprises three elds: Store Memory location in which the displayed bar graph data is stored. Store can only be changed when the status of stored results is displayed. Select TEXT RESULTS and then STORE STATUS and move the highlighted cursor, to the STORE location desired, using and . The width, in minutes, of each "bar" in the bar graph, controlled by ZOOM IN / ZOOM OUT The cursor position in terms of time and date, controlled by and . The cursor position changes in steps of 1 minute, 15 minutes or 60 minutes dependent upon the ZOOM setting. The cursor is physically located between the two graphs.

Zoom Cursor

Viewing the Error and Alarm Summaries

The error summary or alarm summary can be viewed at any time. 1. To view the error or alarm summary associated with the current bar graphs, press GRAPH then TEXT RESULTS 2. To view the error or alarm summary associated with previously stored bargraphs, press GRAPH ; TEXT
RESULTS and STORE STATUS . Using and move the highlighted cursor to the store location which contains the required results, and select TEXT RESULTS .

3. To view the Alarms which have occurred during the measurement select ALARM SUMMARY . Use NEXT SUMMARY to view the PDH; JITTER; ATM PHYSICAL; ATM CELL; SDH AU and SDH TU Alarm Summaries in turn if applicable. 4. To view the Errors which have occurred during the measurement select ERROR SUMMARY . Use NEXT SUMMARY to view the PDH; JITTER; ATM PHYSICAL; ATM CELL; SDH AU and SDH TU Error Summaries in turn if applicable.

2-5

Operating Features

The top row of the display comprises three elds: Store Memory location in which the bar graphs, error summary and alarm summary are stored. Store can only be changed when the status of stored results is displayed. Select STORE STATUS and move the highlighted cursor, to the STORE location desired, using and . The start time and date of the test, which produced the displayed results. The stop time and date of the test, which produced the displayed results.

Start Stop

Viewing the Stored Results Status

Select TEXT RESULTS ; STORE STATUS if viewing the bar graph display. Select STORE STATUS if viewing the error or alarm summary.
GRAPH RESULTS displays the bar graphs from the highlighted store location. TEXT RESULTS displays the error or alarm summary from the highlighted store location. DELETE STORE deletes the results in the highlighted store location.

If DELETE ALL is selected, a CONFIRM DELETE ; ABORT DELETE choice is provided to prevent accidental deletion of all the stored results. The top row of the display comprises ve elds: Store Memory location in which the displayed bar graph data is stored. Move the highlighted cursor, to the STORE location desired, using and . The start date of the test, which produced the stored results. The start time of the test, which produced the stored results.

Start Date Start Time

2-6

Operating Features

Test Duration

The duration of the test, which produced the stored results. The storage capacity of the graphics capability is expressed in days, hours and minutes. The percentage (%) of storage capacity used and the percentage still available for use is given at the bottom of the TEST DURATION column under TOTAL USED and FREE respectively.

Store Use 0-1 The percentage (%) of the overall storage capacity occupied by each set of stored results. The percentage used and the percentage still available is provided at the bottom of the STORE USE column.

Printing Graphics Displays

If Option A3B or A3D, Remote Control, is tted the bar graphs and error and alarm summary can be logged to an external HP 550C DeskJet printer at the end of the test period. If a printer is not immediately available the graphics results remain in memory and can be logged at a later time when a printer becomes available. To print a graphics display on an external HP 550C DeskJet printer: 1. Connect an external RS-232-C HP 550C DeskJet printer to the HP 37717B RS232 port or an external HP-IB HP 550C DeskJet printer to the HP 37717B HP-IB port or a Centronix HP 550C DeskJet printer to the HP 37717B Parallel port. See External HP 550C DeskJet Printer. Make the required selections on the OTHER LOGGING display: LOGGING PORT[HPIB] or [RS232] or [PARALLEL] and LOGGING [ON].

2.

3. Obtain the graphics display required and select PRINT on the bar graph display to log The Error and Alarm summaries, the displayed Bar graphs and the Alarm graph to the printer or Select PRINT on the Text Results display to log the selected Error and Alarm summaries to the printer.

2-7

Operating Features

0.1Logging Results
The results obtained during the test are retained in memory until they are overwritten by the next set of results. The results can be logged at any time during the test period and at the end of the test period. Any Alarm occurrence results in a timed and dated message being logged. BER and Analysis results can be selected by the user. Cumulative and Period versions of the results are calculated and can be selected by the user. Period Cumulative The results obtained over a set period of time during the test. The Period is dened by the LOGGING PERIOD selection. The results obtained over the time elapsed since the start of the test.

The Results can be Logged to the following devices: Internal Printer External HP-IB printer (Options A3B & A3D) External RS-232-C printer (Options A3B & A3D) External Centronix printer (Options A3B & A3D) Disc Drive NOTE 1. A full list of results and events available for logging is contained in Appendix A, Logging Messages, and denitions of all the results are contained in Appendix B, Results.

Test Period Logging

If degradations in system performance can be observed at an early stage, then the appropriate remedial action can be taken to maximize circuit availability and avoid system crashes. Period logging allows you to monitor the error performance of your circuit. At the end of the test period the selected results are logged. Results can be logged at regular intervals during the test period by selecting a LOGGING PERIOD of shorter duration than the test period. Without affecting the test in progress an instant summary of the results can be demanded by pressing PRINT NOW .

2-8

Operating Features

LOGGING [ON] enables the Logging of ALARM conditions. LOGGING PERIOD determines how regularly the results are logged RESULTS LOGGED [ALL] provides a complete set of, Cumulative, BER and Analysis results at the end of each print period and at the end of the test period.

Error Event Logging

Manual tracing of intermittent faults is time consuming. Error event logging allows you to carry out unattended long term monitoring of the circuit. Each occurrence of the selected error event is logged. LOGGING [ON] enables the Logging of ALARM conditions. LOG ERROR SECONDS [ON] determines that each time an error second is detected, a timed and dated message will be logged. LOG ON DEMAND allows the selected item in the menu to be logged to the selected printer when PRINT NOW is pressed.

2-9

Operating Features

When making long term out-of-service bit error measurements it is often desirable only to log results when an error has occurred.

WHEN [PERIOD BEC>0] determines the action taken at the end of the selected Logging Period. If the bit error count during a Logging Period is greater than 0 then the selected results for that period only, are logged. If the bit error count is 0 then the message NO BIT ERRORS is logged at the end of the Logging Period. A complete set of the selected results are logged at the end of the test period.

CONTENT [ER & ANAL] provides both BER and Analysis results at the end of each Logging Period and at the end of the test period. CONTENT [PER & CUMUL] provides both Period and Cumulative results at the end of each Logging Period. LOG ERROR SECONDS [ON] determines that each time an error second is detected, a timed and dated message will be logged.

Centronics Parallel Printer Port

If Remote Control Option, A3B or A3D, is tted the results can be logged to an External printer connected to the parallel port. An HP centronics printer e.g. 550C DeskJet or an alternate suppliers centronix printer can be used for logging results. If [ALT PRINTER] is selected the MODE menu allows NORMAL (80 column) or COMPRESS (40 column) to be selected. CAUTION Do not connect a serial printer e.g. RS-232-C or HP-IB to the HP 37717B Parallel port as this will damage the HP 37717B interface.

2-10

Operating Features

HP-IB External Printer

If Remote Control Option, A3B or A3D, is tted the results can be logged to an External printer connected to the HP-IB port. Selection of HP-IB External printer prevents the use of HP-IB Remote Control.

RS- 232-C External Printer

If Remote Control Option, A3B or A3D, is tted the results can be logged to an External printer connected to the RS-232C port. An HP RS-232-C External printer e.g. 550C DeskJet or an alternate suppliers RS-232-C printer, which is Epson compatible, can be used for logging results.

Selection of an RS-232-C External printer prevents the use of RS-232-C Remote Control. The SPEED selection determines the Printer Baud Rate. The HP PRINTER ow control is always Xon/Xoff.

2-11

Operating Features

The ALT PRINTER MODE menu allows NORMAL (80 column) or COMPRESS (40 column) to be selected. The SPEED selection determines the Printer Baud Rate. The ALT Printer PROTOCOL can be Xon/ Xoff or DTR.

Disk Drive
The Results can be logged to a le on the Disc Drive.

Select OTHER FLOPPY DISK and set up the display as shown opposite. Enter the File Name. The le name can contain up to 8 alphanumeric characters. Select APPEND TO FILE - data logging is appended to the named le on disk in the available free space. OVERWRITE - data logging overwrites the contents of the named le. Once the named le has been opened the data logging is appended to the le as each logging output occurs during the measurement.

2-12

Operating Features

Printing from Disk

When you wish to print the Logging Results from the Disk, remove the Disk from the HP 37717B and insert in a Personal Computer (PC).

To Print from DOS Prompt

copy a:\<filename> <printer name>

2-13

Operating Features

0.2External HP 550C DeskJet Printer

If Remote Control Option, A3B or A3D, is tted the HP 37717B has the capability of interfacing with an RS-232-C HP 550C DeskJet printer or, an alternative suppliers RS-232-C printer, via the RS-232-C port or a Centronix printer via the Parallel printer port. NOTE Selection of an External RS-232-C printer prevents the use of RS-232-C Remote Control.

Connecting an HP 550C DeskJet Printer to RS-232-C Port

1. Connect the HP 37717B RS-232-C port to the HP 550C DeskJet RS-232-C port. NOTE The DeskJet Mode Conguration switches are located on the printers front base, under the IN tray. To change the switch settings, use a pen or pencil to set the switches in the desired (up or down) position. After each change in settings press RESET on the printer to establish the new settings. 2. Set the DeskJet Conguration switches as follows:

A1
Down

A2
Down

A3
Down

A4
Down

A5
Down

A6
Down

A7
Down

A8
Up

B1
Up

B2
Down

B3
Down

B4
Down

B5
Down

B6
Down

B7
Down

B8
Down

3. Press RESET on the printer to establish the new settings. 4. Select [FONT] - PORTRAIT on the printer.

2-14

Operating Features

5. Switches B5 and B6 match the instrument Baud rate to the printer Baud rate. The settings listed above are for 9600 Baud. To change the Baud rate setting of the printer set B5 and B6 as follows:

B5
Down Up Up

B6
Down Down Up

Baud Rate
9600 Baud 2400 Baud 1200 Baud

NOTE

Parity is not selectable on the HP 37717B Printer interface and as a result B7 and B8 are set to Parity NONE - both switches down.

Connecting an HP 550C DeskJet Printer to Parallel Port

1. Connect the HP 37717B Parallel port to the HP 550C DeskJet Centronix port using printer cable HP part number 24542D. CAUTION Do not connect a serial printer e.g. RS-232-C or HP-IB to the HP 37717B Parallel port as this will damage the interface.

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Operating Features

0.3Internal Printer Changing Paper

The internal printer is housed in a compartment, beneath PAPER FEED and PRINT NOW which is accessible from the front panel. A plastic cover is tted to prohibit dust from the printer mechanism and retain the printer paper. CAUTION Do not press PAPER FEED while attempting to feed the paper into the Printer. To change the internal printer paper proceed as follows: 1. 2. 3. 4. 5. Remove the printer compartment cover by pushing the cover catch upwards and lifting the cover off. Remove any paper remaining from the old roll by gently pulling. Undo the new roll of paper and place in the printer compartment such that the paper feeds up the open end of the compartment. Using scissors cut the rst 2 inches of the paper. Feed the paper into the slot behind the cylindrical printer head located at the top of the compartment and keep feeding until the point of the paper appears between the tear-off "teeth". Pull the paper through until a full width of paper appears and then tear-off as required.

6.

Figure 2-0

Paper Feed Direction

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Operating Features

0.1Autosetup
The Autosetup function of the HP 37717B can speed up the setting up of the instrument when making PDH or SDH measurements. This featured is activated by pressing AUTO SETUP and the HP 37717B will start its search on the interface selected on the RECEIVE display. If STM-4 is selected the search will start on the STM-1 selected for test. Autosetup will detect ATM or any of the PRBS patterns the transmitter can generate. ATM is considered to be a payload of SDH or PDH. Both MONITOR and TERMINATE modes are tried in the search for an input signal.

When Autosetup is selected the OTHER display will show an Autosetup HELP page. The Autosetup search can be aborted at any time by pressing AUTO SETUP .

SDH Input
The HP 37717B will search at all line rates (STM-1, STM-4) for an electrical, optical or binary signal. If a signal is found a search of payloads will be started. The payload search order is TU-3, TU-12, TU-2, 140 Mb/s. For each payload a search is made to nd a framing pattern. If a framing pattern is found a search for PRBS patterns is made. If it is known that the signal of interest is in a particular STM-1 e.g. number 3 then the Autosetup search can be speeded up by setting the RECEIVE display to STM-1 UNDER Test [3]. The search for a signal will start in STM-1 number 3.

2-17

Operating Features

PDH Input
In PDH there are three framing possibilities for 140 Mb/s, 34 Mb/s and 8 Mb/s, namely Unframed Framed and Structured. Structured is not covered by Autosetup as to search through a PDH framing structure would take an unacceptable amount of time. At 2Mb/s all possible framing structures are searched except for Structured. All line rates are searched for a signal. If a signal is found a search for framing pattern is made. If a framing pattern is found a search for PRBS pattern is made.

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Operating Features

0.2Stored Settings
It is often desirable to store measurement settings which are used regularly and be able to recall those settings at a moments notice. This capability is provided in the HP 37717B on the OTHER SETTINGS CONTROL display. One preset store is provided which cannot be overwritten, STORED SETTING NUMBER [0], and is used to set the HP 37717B to a known state. The known state is the FACTORY DEFAULT SETTINGS as listed below.

Table 2-1

TRANSMIT Display PDH (Option UKK)

Signal Code Termination 140 Mb/s CMI 75 Clock Sync Pattern Internal 223-1

Unbal

Table 2-2

TRANSMIT Display SPDH (Option UKJ)

Settings Clock Sync Line Code Payload Type PRBS Polarity 34M Payload 2M Payload 8 Mb 64 kb User Word Error Add Rate Main Internal CMI Unframed INV Unframed Unframed 1 1 1111111111111111 None Signal Termination Frequency Offset Pattern Test Signal 2M Payload 34 Mb 2 Mb BG Pattern Error Add 140 Mb/s 75 Off 223-1 34 Mb/s Unframed 1 1 AIS Bit

Unbal

2-19

Operating Features

Table 2-3

TRANSMIT Display SDH (Option A3R)

Signal Payload TUG3 TU STM-1 140 Mb/s 1 1 Clock Sync Payload Pattern TUG2 2 Mb/s Pattern Internal 223-1 1 215-1

Display

Table 2-4

TRANSMIT Display ATM (Option UKN)

Signal Code Frequency Offset Cell Stream B/G 1 Bandwidth B/G 3 Bandwidth Burst Size F/G GFC F/G VCI F/G CLP B/G Stream B/G VPI B/G PTI B/G 1 Payload B/G 3 Payload 140 Mb/s, Internal CMI Off Distribution 0 0 1 Cell 0 32 0 1 1, 2. 3 All 000 00000001 00000011 Clock Sync Termination Trail Trace F/G Bandwidth B/G 2 Bandwidth F/G Distribution Interface F/G VPI F/G PTI F/G Payload B/G GFC B/G VCI B/G CLP B/G 2 Payload Fill Cells Internal 75

Unbal

Test 326,037 c/s 0 Burst UNI 0 000 Test Cell All 0 All 32 All 0 00000010 Idle

Table 2-5

RECEIVE Display PDH (Option UKK)

Signal Code Termination 140 Mb/s CMI 75 Test Mode Pattern Out of Service 2^23-1

Unbal

2-20

Operating Features

Table 2-6

RECEIVE Display SPDH (Option UKJ)

Settings Termination Gain Payload Type PRBS Polarity 34M Payload 2M Payload 8 Mb 64 kb Main 75 Signal Line Code Equalizer Pattern Test Signal 8M Payload 34 Mb 2 Mb 140 Mb/s CMI Off 223-1 34 Mb/s Unframed 1 1

Unbal

20 dB Unframed INV Unframed Unframed 1 1

Table 2-7

RECEIVE Display SDH (Option A3R)

Signal Payload Pattern TUG2 STM-1 2^23-1 1 Payload TUG3 TU 140 Mb/s 1 1

Table 2-8

RECEIVE Display ATM (Option UKN)

Signal Code Test Cell VPI PTI Cell Payload CDV Tolerance 140 Mb/s CMI VC 0 0XX Test Cell Disabled Termination Interface GFC VCI CLP Peak Cell Rate 75

Unbal

UNI X 32 X 100

2-21

Operating Features

Table 2-9

RESULTS Display
Results Test Timing Storage PDH Results Trouble Scan Manual OFF Short Term Short Term Period Single Test Duration SDH Results 1 Second 1 Hour Short Term, RS B1 BIP

Table 2-10

OTHER Display
Stored Setting Lock Printer Print Period Print Mode Clock Mode Beep On Error Suspend Test on LOS Settings Control On Internal OFF Normal Run OFF OFF Independent Stored Setting Number Printing Print Error Seconds Print Speed Keyboard lock Analysis Display Mode Self Test 0 Off OFF 9600 Baud OFF G.821 All Tests

The use of the STORED SETTINGS function is illustrated by carrying out the following tasks: Select the settings used in the PDH FAS Monitoring measurement. TITLE the settings as FAS Monitoring SAVE the settings as Stored Setting Number [1] RECALL the factory default settings from Stored Setting Number [0] RECALL the payload mapping settings from Stored Setting Number [1]

2-22

Operating Features

Select Settings to be Stored

1. Set up the RECEIVE display MAIN SETTINGS as shown opposite.

2. Set up the RECEIVE display STRUCTURED SETTINGS as shown opposite.

3. Set up the OTHER LOGGING display as shown opposite.

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Operating Features

Title the Settings

1. Select the STORED SETTINGS function on the OTHER display. To Title settings LOCK [OFF] must be selected. 2. Using ; JUMP ; NEXT CHAR ; and title the PREVIOUS CHAR ;

settings as shown opposite.

Save the Settings

1. Set up the display as shown opposite. Press SAVE to save the settings. The payload mapping settings are now stored in STORED SETTING NUMBER [1].

Recall Default Settings

1. Set up the display as shown opposite. Press RECALL to recall the settings in STORED SETTING NUMBER [0]. To verify that the instrument has adopted the factory default settings, view the TRANSMIT ; RECEIVE ; RESULTS and OTHER displays.

2-24

Operating Features

Recall Previously Stored Settings (FAS Monitoring)

1. Set up the display as shown opposite and press RECALL to recall the settings in STORED SETTING NUMBER [1] To verify that the instrument has adopted the FAS Monitoring settings, view the
RECEIVE MAIN SETTINGS RECEIVE STRUCTURED SETTINGS and OTHER LOGGING displays

Settings can be recalled when LOCK [ON] is selected but to save settings or title settings LOCK [OFF] must be selected.

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Operating Features

0.1Disk Drive
The disk drive is accessed on the OTHER display and allows the following: Save/recall of instrument congurations to/from oppy disk drive Save/recall of stored measurement graphics to/from oppy disk drive. This extends internal event based storage from 20,000 events to 320,000 events. Direction of logging output to oppy disk drive le path name. Save SMG stored results in a CSV (comma separated variable) PC compatible format for importing to PC spreadsheets etc. Copying of stored measurement graphics les from internal instrument storage to oppy disk drive. Copying of instrument conguration les from/to internal instrument storage to/ from oppy disk drive. Disk management - Deleting les or directories, Renaming of les, Formatting of oppy disks, Labeling of oppy disks. The upgrading of instrument rmware from the oppy disk drive.

Directory Structure
It is recommended that different directories are created for the different applications as this will speed up the transfer of data between the instrument and disk e.g. A;\GRAPHICS A:\LOGGING A:\CONFIG In addition as the number of les in a directory increases the le name pop-up access becomes gradually slower.

Portability of Disks
When transporting disks between different HP 37717Bs some problems may occur if the instruments have a different rmware revision and/or a different option mix.

2-26

Operating Features

To Format a Disk
Only 1.44M, MS-DOS compatible disks can be used in the HP 37717B. Any other format or capacity will result in a Disk access error being displayed. Select OTHER FLOPPY DISK and set up the display as shown opposite. Insert the disk to be formatted into the Disk drive. Select OK to Format the disk. A warning that this operation will erase all data is displayed and asks do you wish to continue. If YES is selected the disk will be formatted. If NO is selected the operation is aborted. NOTE Disks can be formatted in an IBM compatible PC (1.44M, MS-DOS only) but it is recommended that the disk is formatted in the HP 37717B as this will ensure full compatibility with the Floppy Disk power fail recovery included in the HP 37717B.

To Label a Disk
Select OTHER FLOPPY DISK and set up the display as shown opposite. Insert the disk to be labeled into the Disk drive. Enter the label name.The Label can contain up to 11 alphanumeric characters (including spaces). Select OK to Label the disk. The label will be displayed at the bottom of the display.

2-27

Operating Features

File and Directory Management

File and directory names can be entered in one of 2 ways: 1. Pop-Up "File List" and "File Name" menus Press SET to obtain the following display:

Move the highlighted cursor up and down the display using

and

Title Bar - File types displayed and current directory. (cannot be highlighted). . \ - Current Directory.

.. \ - Parent directory. Move highlighted cursor to this line and press SET to move to parent directory. PDH1.SMG - File (with named extension) in current directory. Move highlighted cursor to this line and press SET to select the le. The display will return to the FLOPPY DISK display and the selected le name will appear in the FILE NAME eld. NEXT - Move highlighted cursor to this line and press SET to access the next page of le names.

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Operating Features

PREV - Move highlighted cursor to this line and press SET to access the previous page of le names. NEW.. - Allows entry of new le name using pop-up keypad. Press SET to obtain the pop-up keypad display.

Use and columns.

to move across the rows to move up and down the

Select the character required and press SET . Repeat until the lename is entered. Select END and press SET to return to the le manager display, and then press CANCEL to return to the SAVE display.

The lename entered via the keypad appears on the SAVE display. The le extension .SMG has been added automatically. The Directory name and the disk Label appear at the bottom of the display.

2-29

Operating Features

2. By SOFTKEY entry Use the PREVIOUS CHAR softkeys. NEXT CHAR This provides a quick method if the new lename is similar to the lename currently displayed e.g. Filename displayed PDH1 and new lename required is PDH2 - use to move the cursor to the 1 and press
NEXT CHAR
.

This method is limited to entering le names, or a directory name when Creating a directory. However it cannot be used to navigate through the directory structure.

Adding Descriptors to .CNF and .SMG Files

Descriptors can be added to .CNF and .SMG les. Set up the display as shown opposite. Move the highlighted cursor to the FILE NAME DESCRIPTOR eld. Enter the le descriptor using one of the methods described in File and Directory Management. The "File List" pop-up will show the descriptor instead of the TIME and DATE information as long as FILE DESCRIPTOR is selected. This slows down the updating of the display.

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Operating Features

To Save Current Instrument Conguration to Disk

Select OTHER FLOPPY DISK and set up the display as shown opposite. The lename extension is xed as .CNF. The le name can contain up to 8 alphanumeric characters and can be entered as described in File and Directory Management Select OK to save the current conguration to disk. If you have entered a lename which already exists, a warning "File exists are you sure" you wish to continue is displayed. If YES is selected the conguration will be saved. To cancel, change OK to OFF.

To Save Graphics Results to Disk

Select RESULTS and set up the display as shown opposite. Select the Graph Storage resolution required. Two methods of naming the le which will be created when RUN/STOP is pressed are available: 1. A lename, in the form meas001.smg, is created automatically without any operator input. 2. The user can input a lename of his choice, which will override the automatic lename, but this must be input before RUN/STOP is pressed, If the user entered le name already exists, SMG results will be saved to an Autogenerated le name. This prevents existing les from being overwritten each time the RUN/STOP is pressed.

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Operating Features

Select OTHER FLOPPY DISK and set up the display as shown opposite. The lename extension is xed as .SMG. The le name can contain up to 8 alphanumeric characters and can be entered as described in File and Directory Management

To Save Data Logging to Disk

Select OTHER LOGGING and set up the display as shown opposite. The OTHER LOGGING CONTROL display should be set as required.

Select OTHER FLOPPY DISK and set up the display as shown opposite. The lename extension is xed as .PRN. The le name can contain up to 8 alphanumeric characters and can be entered as described in File and Directory Management Select APPEND TO FILE - data logging is appended to the named le on disk in the available free space or OVERWRITE - data logging overwrites the contents of the named le. Once the named le has been opened the data logging is appended to the le: as each logging output occurs during the measurement or

LOG ON DEMAND [RESULTS] or [O/H SNAPSHOT] or [O/H CAPTURE] or [PTR GRAPH] or [TRIB SCAN] is selected and PRINT NOW is pressed.

2-32

Operating Features

To Recall Congurations from Disk to Instrument

Select OTHER FLOPPY DISK and set up the display as shown opposite. The lename extension is xed as .CNF. The le name can contain up to 8 alphanumeric characters and can be entered as described in File and Directory Management Select OK to recall the conguration from disk to instrument.

To Recall Graphics Results from Disk to Instrument

Select OTHER FLOPPY DISK and set up the display as shown opposite. The lename extension is xed as .SMG. The le name can contain up to 8 alphanumeric characters and can be entered as described in File and Directory Management Select OK to recall the graphics results from disk to instrument.

To display the recalled graphics results select DISK on the Store Status page of the GRAPH display and press GRAPH RESULTS .

2-33

Operating Features

To Copy Conguration from Instrument Store to Disk

Select OTHER FLOPPY DISK and set up the display as shown opposite. Enter the Store Number (1 to 4). The description which was displayed on the OTHER STORED SETTINGS display appears. If required the description can be modied using JUMP NEXT CHAR softkeys. PREVIOUS CHAR The lename extension is xed as .CNF. The le name can contain up to 8 alphanumeric characters and can be entered as described in File and Directory Management Select OK to copy the conguration from instrument to disk. If you have entered a lename which already exists, a warning "File exists - are you sure" you wish to continue is displayed. If YES is selected the conguration will be copied. To cancel, change OK to OFF.

To Copy Conguration from Disk to Instrument Store

Select OTHER DISK and set up the display as shown opposite. Enter the Store Number (1 to 4) and if required enter a description using
JUMP PREVIOUS CHAR softkeys. NEXT CHAR

The lename extension is xed as .CNF. The le name can contain up to 8 alphanumeric characters and can be entered as described in File and Directory Management Select OK to copy the conguration from the disk to instrument store. An "Are you sure?" you wish to go ahead with this operation choice is provided to decrease the possibility of accidentally overwriting existing instrument stores.

2-34

Operating Features

To Copy Graphics from Instrument Store to Disk

Select OTHER FLOPPY DISK and set up the display as shown opposite. Enter the Store Number (0 to -9). The lename extension is xed as .SMG. The le name can contain up to 8 alphanumeric characters and can be entered as described in File and Directory Management Select the required format. CSV is Comma Separated Variable and is compatible with spreadsheets. Select OK to copy the graphics results from instrument store to disk. If you have entered a lename which already exists, a warning "File exists - are you sure" you wish to continue is displayed. If YES is selected the graphics data will be copied.To cancel, change OK to OFF.

To Delete a File
Select OTHER FLOPPY DISK and set up the display as shown opposite. The le name with extension can contain up to 12 alphanumeric characters and can be entered in 2 ways: 1. Use the PREVIOUS CHAR softkeys. NEXT CHAR 2. Use SET and the method described in File and Directory Management Select OK to delete the le from disk. An "Are you sure?" you wish to go ahead with this operation choice is provided to reduce the possibility of deleting the wrong le.

2-35

Operating Features

To Delete a Directory
Select OTHER FLOPPY DISK and set up the display as shown opposite. A Directory cannot be deleted unless all les within the directory have been deleted. Select OK to delete the current directory (listed on the display) from disk. An "Are you sure?" you wish to go ahead with this operation choice is provided to reduce the possibility of accidentally deleting the wrong directory.

To Rename a File
Select OTHER FLOPPY DISK and set up the display as shown opposite. The FROM le name with extension can contain up to 12 alphanumeric characters and can be entered as described in File and Directory Management. The To Directory can be selected as described in File and Directory Management. The TO le contains up to 8 alphanumeric characters. (the extension is xed - determined by the FROM le name extension) Select OK to rename the le. If you have entered a TO lename which already exists, a warning "File exists - are you sure" you wish to continue is displayed. If YES is selected the le will be renamed. To cancel, change OK to OFF. .

2-36

Operating Features

To Create a Directory
Select OTHER FLOPPY DISK and set up the display as shown opposite. The directory name can contain up to 8 alphanumeric characters and can be entered in 2 ways: 1. Use the PREVIOUS CHAR softkeys. NEXT CHAR 2. Use SET and the method described in File and Directory Management Select OK to create the directory. This will create a sub directory of the directory displayed at the bottom of the display. In this example will create A:\CONFIG\PDH.

Printing from Disk

When you wish to print logging results from the Disk remove the Disk from the HP 37717B and insert in a Personal Computer (PC).

To Print from DOS Prompt

copy /b a:\<filename> <printer name>

2-37

Operating Features

0.2Coupling Transmit and Receive Settings

When generating and measuring at the same interface level it is useful to have the transmit and receive settings coupled together. Any settings change made on the transmit display will automatically occur on the receive display. Any settings change made on the receive display will automatically occur on the transmit display. This function is available on the OTHER SETTINGS CONTROL display.

2-38

Operating Features

0.3Time & Date

When making Bit error measurements and recording results it is desirable to have certain events timed chronologically for example, Alarms; Error Seconds. The capability to set the Time and Date is provided on the OTHER display under the TIME & DATE function.

Setting Time and Date

1. Set up the OTHER display as shown opposite. Set the Time and Date as required using ; ; ; ; INCREASE DIGIT and DECREASE DIGIT . .

2. Using and move the highlighted bar to [SETUP] as shown opposite. Select RUN to complete the setting of Time and Date.

2-39

Operating Features

0.4Keyboard Lock
It is often desirable to protect the measurement settings from interference, during a test. This facility is provided in the HP 37717B on the OTHER MISCELLANEOUS display. The following keys are not affected by Keyboard Lock: Display keys TRANSMIT ; RECEIVE ; RESULTS ; GRAPH ; OTHER cursor keys and

SHOW HISTORY PAPER FEED

The following display functions are not affected by Keyboard Lock: RESULTS type on the RESULTS display KEYBOARD LOCK on the OTHER display

Lock/Unlock the Keyboard

1. Set up the OTHER display as shown opposite. To Lock the keyboard select [ON]. To Unlock the keyboard select [OFF].

2-40

Operating Features

0.5Beep On Received Error

It is sometimes desirable to have an audible indication of an error particularly when the display on the test set is hidden from view. This function is provided in the HP 37717B on the OTHER MISCELLANEOUS display.

Enable/Disable Beep On Error

1. Set up the OTHER display as shown opposite.

2-41

Operating Features

0.6Analysis Control (Option UKJ[USA] only)

It is sometimes desirable to suspend all measurements during periods of Signal Loss. This function is provided in the HP 37717B on the OTHER MISCELLANEOUS display. 1. Set up the OTHER display as shown opposite. When [ON] is selected all measurements including Elapsed Time are suspended during periods of Signal Loss and a Status Message "Data Loss - test suspended" is displayed. When [OFF] is selected measurements continue during periods of Signal Loss.

0.7Analysis Control (Option UKK[USB] only)

The HP 37717B allows a choice of Analysis results when testing and this choice is selected under ANALYSIS DISPLAY MODE. This function is provided on the OTHER MISCELLANEOUS display. 1. Set up the OTHER display as shown opposite. Select the analysis results required either G.821 or M.2100. If Option UKJ[USA] is tted the choice is made on the RESULTS display.

2-42

Operating Features

0.8Self Test
Before using the HP 37717B to make measurements it may be desirable to run the ALL TESTS Self Test to ascertain the integrity of the HP 37717B. These tests take between 15 minutes and 1 hour to complete depending on which options are tted. 1. Set up the OTHER display as shown opposite using OTHER , MORE and
SELF TEST

2. Insert a formatted disk into the HP 37717B disk drive. 3. PDH Loopbacks: Connect 75 Signal In to 75 Signal Out. Connect 120 Signal In to 120 Signal Out. If Option UKJ is tted, also connect MUX port to DEMUX port. If Option UH3 is tted connect CLOCK OUT to CLOCK IN and DATA OUT to DATA IN. 4. SDH Loopbacks: Connect the STM-1 IN port to the STM-1 OUT port. 5. Optical Interface Loopbacks: Connect the IN port to the OUT Port. NOTE If Option USN or 131, Dual Wavelength Optical Interface, is tted connect the 1310 nm OUT port to the IN port. Do not connect the 1550 nm OUT port to the IN port. If any or all of these connections are not made the HP 37717B will FAIL Self Test.

NOTE

2-43

Operating Features

5. Press RUN/STOP to activate the Self Test. TEST STATUS [RUNNING] will be displayed. The information pertaining to TEST TYPE, TEST NUMBER and SUBTEST NUMBER will change as the Self Test progresses If the HP 37717B is functioning correctly, after 15 minutes to 1 hour (depending on which options are tted), TEST STATUS [PASSED] is displayed. If TEST STATUS [FAIL nnn] is displayed the HP 37717B should be returned to a service ofce for repair. FAIL Error Numbers are listed and dened in Appendix C.

Additional Tests
Some options require additional test to be carried out to completely verify the option integrity. These require different connections and the tests run individually. RS-232-C Tests: If Option A3B or A3D is tted, the RS-232-C interface is not fully tested. To fully test RS-232-C: 1. Select CPU TESTS 2. Fit a special RS-232-C connector with Loopback links as shown:

5 o o 9

o o

o o

o o 6

o1

Table 2-1

Self Test RS-232-C Port Loopback Connections 3. Run the CPU tests.

2-44

Operating Features

Line Jitter Tests: If OptionA3L, A3V, A3N, SDH Line Jitter, is tted the full set of jitter tests are not included under ALL TESTS. To fully test SDH Line Jitter: 1. Select JITTER TESTS 2. Connect STM-1 OUT from the SDH module to STM-1E IN on the RX Jitter module. 3. For Options A3V and A3N only connect STM-1/STM-4 OUT on the Optical Module to STM-1/STM-4 IN on the RX Jitter module. 4. RUN the JITTER TESTS. 1550 nm Dual Wavelength Tests: If Option 131, Dual Wavelength Optical Interface, is tted the 1550 nm tests are not included under ALL TESTS. To complete the 1550 nm tests: 1. Select STM-1/STM-4 OPTICS TESTS 2. Connect STM-1/STM-4 1550 nm OUT to STM-1/STM-4 1550 nm IN via an Optical Attenuator set to 10 dB. 3. RUN the STM-1/STM-4 OPTICS TESTS. Datacomm Tests: If Option A3R [A3S], SDH Module, is tted the Datacomm RS449 port is not tested under ALL TESTS To test the Datacomm port: 1. Select SDH TESTS 2. Make the following connections on the Datacomm port.

Figure 2-2

Self Test Datacomm port loopback connections 3. RUN the SDH TESTS.

2-45

Operating Features

2-46

Logging Messages

Appendix A -Logging Messages

0.1Logging Devices
The internal printer and the Disc Drive are standard features and are included in all instruments. Graphics results cannot be logged to the internal printer. If Remote Control Option A3B or A3D, is tted the following types of External printer can be used for results logging: HP 660C DeskJet printer with Centronics interface HP-IB HP 550C DeskJet printer RS-232-C HP 550C DeskJet printer An alternative suppliers RS-232-C printer The alternative suppliers RS-232-C printer should be an "Epsom compatible printer". The printercan be 40 column width or 80 column width. If a 40 column width printer is used Graphics results cannot be logged.

Results Logging
Header and results are logged to the selected device when:
PRINT NOW is pressed.

If LOGGING [ON] is selected on the OTHER LOGGING measurement is started by pressing RUN/STOP

display and a

|==============================================================================| | Hewlett Packard HP37717B | | Instrument Configuration | |------------------------------------------------------------------------------| | RECEIVER | | Receive Signal : STM-1 ELECTRICAL | | Level : TERMINATE | | Mapping : AU-4 VC-4 140 Mb/s | | Payload Type : UNFRAMED | | Pattern : 2^23-1 Polarity : INVERTED | | | | MEASUREMENT STARTED 23 Jul 97 10:27:13 Print Period 10 Minutes | |------------------------------------------------------------------------------|

Figure A-1

Logging Header Example

A-1

Logging Messages

If PRINT NOW is pressed the cumulative results are logged. If a measurement is in progress the current results are logged. If a measurement is not in progress the cumulative results for the last measurement are logged.

During the Measurement Period

If LOG ERROR SECOND [ON] is selected on the OTHER LOGGING display all occurrences of an Error Second will be logged: Bit Code (PDH) Frame (PDH) CRC (PDH) REBE (PDH) DS3 Frame (SDH) DS3 P-Bit (SDH) DS3 C-Bit (SDH) DS3 FEBE (SDH) DS1 Frame (SDH) DS1 CRC6 (SDH) A1A2 FRAME (SDH) RS B1 BIP/B1 BIP (SDH) MS B2 BIP/B2 BIP (SDH) MS REI (SDH) B3 BIP (SDH) HP REI (SDH) HP IEC (SDH) TU Path BIP (SDH) LP REI (SDH) Jitter Hit (PDH Jitter) EM BIP (ATM) REI (ATM)

A-2

Logging Messages Corrected HEC (ATM) Non Corrected HEC (ATM) Cell Loss (ATM) Errored Cells (ATM) Misinserted Cells (ATM)

All Alarm occurrences will be logged both when set and cleared: Signal Loss AIS (PDH & ATM) Pattern Sync Loss (PDH & ATM) Loss Of Frame (SDH, PDH & ATM) Out Of Frame (SDH) Multiframe (PDH) Remote Loss (PDH) Remote Multiframe Loss (PDH) Loss of Pointer (SDH) MS AIS (SDH) AU AIS (SDH) Pattern Loss (SDH) Clock Loss (SDH) MS RDI (SDH) HP RDI (SDH) K1K2 Change (SDH) H4 Multiframe Loss (SDH) TU Loss of Pointer (SDH) TU AIS (SDH) LP RDI (SDH) DS3 Frame Loss (SDH)

A-3

Logging Messages

DS3 AIS (SDH) DS3 FERF (SDH) DS1 Frame Loss (SDH) DS1 AIS (SDH) DS1 FERF (SDH) Jitter Lock Loss (Jitter) Excess Jitter (Jitter) Excess Wander (Jitter) Wander Ref Loss (Jitter) Wander Signal Loss (Jitter) RDI (ATM) Loss of Cell Sync (ATM) Selected Cell Not Received (ATM) Congestion Experienced (ATM) Test Cell Loss (ATM) VP AIS (ATM) VP RDI (ATM) VC AIS (ATM) VC RDI (ATM)

In addition the following events are logged: All Alarms Clear Power Failure Power Restored New Day Squelched - Printing stopped to conserve paper during period of Unavailability Unsquelched - Printing restarted after period of Unavailability Print Demanded - if PRINT NOW is pressed.

A-4

Logging Messages Print Period - if selected on OTHER LOGGING display.

Printing Enabled - if Printer enabled during a measurement. Measurement Complete

|| 10:27:32 | 10:27:32 | 10:27:32 | 10:27:32 | 10:27:32 | 10:27:35 | 10:27:35 | 10:27:35 | 10:27:35 | 10:27:35 | 10:27:35 | 10:27:35 | 10:27:35 | 10:27:36 | 10:27:36 | 10:27:37 | 10:27:41 | 10:27:41 | 10:27:42 | 10:27:42 | 10:27:42 | 10:27:44 | 10:27:44 | 10:27:45 | 10:27:45 | 10:27:46 | 10:28:42 | 10:28:42 | 10:28:42 | 10:28:42 | 10:28:42 | 10:28:44 | 10:28:44 | 10:28:44 | 10:28:44 | 10:28:44 | 10:28:44 | 10:28:44 | 10:28:44 | 10:28:45 | 10:28:45 | 10:28:46 LOS LOF OOF AU-LOP Pattern Loss LOS LOF OOF AU-LOP Pattern Loss OOF OOF Pattern Loss Pattern Loss OOF OOF Pattern Loss Pattern Loss OOF OOF Pattern Loss Pattern Loss LOS LOF OOF AU-LOP Pattern Loss LOS LOF OOF AU-LOP Pattern Loss OOF OOF Pattern Loss Pattern Loss SET SET SET SET SET CLEAR CLEAR CLEAR CLEAR CLEAR SET CLEAR ALL ALARMS SET CLEAR ALL ALARMS SET CLEAR SET CLEAR ALL ALARMS SET CLEAR SET CLEAR ALL ALARMS SET SET SET SET SET CLEAR CLEAR CLEAR CLEAR CLEAR SET CLEAR ALL ALARMS SET CLEAR ALL ALARMS | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | |

CLEAR

CLEAR

CLEAR

CLEAR

CLEAR

CLEAR

Figure A-2

Logging During Measurement Example

A-5

Logging Messages

At the End of the Measurement Period

|==============================================================================| | MEASUREMENT COMPLETE 23 Jul 97 10:28:57 Elapsed Time 00d 00h 01m 43s| |==============================================================================| | Cumulative Results | | | | Error Results : | | A1A2 RS B1 MS B2 MSPATH B3 | | FRAME BIP BIP REI BIP | | Error Count 393 93 307 1.065E+06 244201 | | Error Ratio 9.860E-06 5.761E-09 1.923E-08 6.965E-05 1.565E-05 | | | | HPHPTU LP| | REI IEC BIP REI | | Error Count 69 239895 N/A N/A | | Error Ratio 4.617E-09 1.605E-05 N/A N/A | | | | BIT (test) CODE CRC REBE | | Error Count 2.463E+08 N/A N/A N/A | | Error Ratio 1.704E-02 N/A N/A N/A | | | | Analysis Results : | | G.826 ANALYSIS | | RS B1 MS B2 MSPATH B3 | | BIP BIP REI BIP | | Errored Blocks 20 23 64000 79708 | | Errored Seconds 10 10 10 39 | | Severely Errored Seconds 6 6 9 18 | | Unavailable Seconds 0 0 0 0 | | Path Unavailable Seconds N/A 0 0 0 | | Background Block Errors 14 16 1 10477 | | Errored Second Ratio 9.709E-02 9.709E-02 1.031E-01 3.786E-01 | | Severely Errored Sec Ratio 5.825E-02 5.825E-02 9.278E-02 1.748E-01 | | Background Block Err Ratio 1.804E-05 2.062E-05 1.420E-06 1.541E-02 | | | | HPHPTU LP| | REI IEC BIP REI | | Errored Blocks 10 122155 N/A N/A | | Errored Seconds 4 3 N/A N/A | | Severely Errored Seconds 0 0 N/A N/A | | Unavailable Seconds 0 19 N/A N/A | | Path Unavailable Seconds 0 N/A N/A N/A | | Background Block Errors 10 9 N/A N/A | | Errored Second Ratio 4.124E-02 3.846E-02 N/A N/A | | Severely Errored Sec Ratio 0 0 N/A N/A | | Background Block Err Ratio 1.289E-05 1.442E-05 N/A N/A | | | | G.821 ANALYSIS | | BIT (test) FAS 140M FAS 34M FAS 8M FAS 2M | | Errored Sec 14 N/A N/A N/A N/A | | %Errored Sec 13.59223 N/A N/A N/A N/A | | %ES (Annex D) 6.79612 N/A N/A N/A N/A | | Error Free Sec 89 N/A N/A N/A N/A | | %Error Free Sec 86.40777 N/A N/A N/A N/A | | Severely Err Sec 14 N/A N/A N/A N/A | | %Severely Err Sec 13.59223 N/A N/A N/A N/A | | Degraded Minutes 0 N/A N/A N/A N/A | | %Degraded Minutes 0.00000 N/A N/A N/A N/A | | Unavailable Sec 0 N/A N/A N/A N/A | | %Unavailable Sec 0.00000 N/A N/A N/A N/A | | | | G.826 ANALYSIS |

A-6

Logging Messages
| Near 140Mb/s Far Near 34Mb/s Far | | Errored Seconds 6 N/A N/A N/A | | Severely Errored Seconds 6 N/A N/A N/A | | Unavailable Seconds 0 N/A N/A N/A | | Errored Second Ratio 5.825E-02 N/A N/A N/A | | Severely Errored Sec Ratio 5.825E-02 N/A N/A N/A | | | | M.2100 ANALYSIS | | Rx 140Mb/s Tx Rx 34Mb/s Tx | | Errored Seconds 14 N/A N/A N/A | | Severely Errored Seconds 14 N/A N/A N/A | | Unavailable Seconds 0 N/A N/A N/A | | | | M.2110 ANALYSIS | | 2-hr 24-hr 7-day | | BIS Results WAIT WAIT WAIT | | | | | | Frequency : N/A Hz Offset : N/AHz Offset : N/Appm | | | | Pointer Results : AU POINTER TU POINTER | | Count Seconds Count Seconds | | NDF 3 N/A | | Missing NDF 4 N/A | | +ve Pointer Adjustments 3 3 N/A N/A | | -ve Pointer Adjustments 5 4 N/A N/A | | Implied VC Offset 0.0 N/A | | Pointer Value 256 N/A | |==============================================================================|

Figure A-3

Logging At End of Measurement Example

Bar Graph Logging (Not Internal Printer)

To log the Bar Graphs select the required logging device (RS232 or HPIB or DISK or PARALLEL) under LOGGING PORT on the OTHER LOGGING display. Select LOGGING [ON] on the OTHER LOGGING display. Display the Bar Graphs required on the Bar Graph display and press PRINT . The Error Summary, the Alarm Summary and the selected Bar Graphs are logged.

A-7

Logging Messages

Figure A-4

Bar Graph Logging Example

A-8

Logging Messages

Graphics Text Results Logging (Not Internal Printer)

To log the Alarm Summaries select the required logging device (RS232 or HPIB or DISK or PARALLEL) under LOGGING PORT on the OTHER LOGGING display. Select LOGGING [ON] on the OTHER LOGGING display. Display the results required on the Text Results display and press PRINT . The Error Summary and Alarm Summary are logged.

Figure A-5

Text Results Logging Example

A-9

Logging Messages

Results Snapshot Logging

To log the Results Snapshot select the required External logging device (RS232 or HPIB or DISK or PARALLEL) under LOGGING PORT on the OTHER LOGGING display. Select LOGGING [ON] on the OTHER LOGGING display. Select LOG ON DEMAND [RESULTS] on the OTHER LOGGING display and press PRINT NOW .
|==============================================================================| | Hewlett Packard HP37717B | | Instrument Configuration | |------------------------------------------------------------------------------| | RECEIVER | | Receive Signal : STM-1 ELECTRICAL | | Level : TERMINATE | | Mapping : AU-4 VC-4 140 Mb/s | | Payload Type : UNFRAMED | | Pattern : 2^23-1 Polarity : INVERTED | | | | MEASUREMENT STARTED 23 Jul 97 10:35:59 Print Period 10 Minutes | |------------------------------------------------------------------------------| |==============================================================================| | 10:37:19 PRINT DEMANDED- RESULTS SNAPSHOT Elapsed Time 00d 00h 01m 20s| |==============================================================================| | Cumulative Results | | | | Error Results : | | A1A2 RS B1 MS B2 MSPATH B3 | | FRAME BIP BIP REI BIP | | Error Count 293 81633 261 876107 95 | | Error Ratio 9.538E-06 6.561E-06 2.121E-08 7.793E-05 7.899E-09 | | | | HPHPTU LP| | REI IEC BIP REI | | Error Count 23 607484 N/A N/A | | Error Ratio 1.961E-09 5.181E-05 N/A N/A | | | | BIT (test) CODE CRC REBE | | Error Count 1.840E+08 N/A N/A N/A | | Error Ratio 1.651E-02 N/A N/A N/A | | | | Analysis Results : | | G.826 ANALYSIS | | RS B1 MS B2 MSPATH B3 | | BIP BIP REI BIP | | Errored Blocks 42284 18 45573 20 | | Errored Seconds 19 5 12 5 | | Severely Errored Seconds 9 3 11 3 | | Unavailable Seconds 0 0 0 0 | | Path Unavailable Seconds N/A 0 0 0 | | Background Block Errors 643 12 2189 18 | | Errored Second Ratio 2.375E-01 6.250E-02 1.558E-01 6.250E-02 | | Severely Errored Sec Ratio 1.125E-01 3.750E-02 1.429E-01 3.750E-02 | | Background Block Err Ratio 1.132E-03 1.948E-05 4.146E-03 2.922E-05 | | | | HPHPTU LP| | REI IEC BIP REI | | Errored Blocks 5 316822 N/A N/A | | Errored Seconds 2 1 N/A N/A | | Severely Errored Seconds 0 0 N/A N/A |

A-10

Logging Messages
| Unavailable Seconds 0 40 N/A N/A | | Path Unavailable Seconds 0 N/A N/A N/A | | Background Block Errors 5 1426 N/A N/A | | Errored Second Ratio 2.597E-02 2.703E-02 N/A N/A | | Severely Errored Sec Ratio 0 0 N/A N/A | | Background Block Err Ratio 8.117E-06 4.818E-03 N/A N/A | | | | G.821 ANALYSIS | | BIT (test) FAS 140M FAS 34M FAS 8M FAS 2M | | Errored Sec 9 N/A N/A N/A N/A | | %Errored Sec 11.25000 N/A N/A N/A N/A | | %ES (Annex D) 5.00000 N/A N/A N/A N/A | | Error Free Sec 71 N/A N/A N/A N/A | | %Error Free Sec 88.75000 N/A N/A N/A N/A | | Severely Err Sec 9 N/A N/A N/A N/A | | %Severely Err Sec 11.25000 N/A N/A N/A N/A | | Degraded Minutes 0 N/A N/A N/A N/A | | %Degraded Minutes 0.00000 N/A N/A N/A N/A | | Unavailable Sec 0 N/A N/A N/A N/A | | %Unavailable Sec 0.00000 N/A N/A N/A N/A | | | | G.826 ANALYSIS | | Near 140Mb/s Far Near 34Mb/s Far | | Errored Seconds 3 N/A N/A N/A | | Severely Errored Seconds 3 N/A N/A N/A | | Unavailable Seconds 0 N/A N/A N/A | | Errored Second Ratio 3.750E-02 N/A N/A N/A | | Severely Errored Sec Ratio 3.750E-02 N/A N/A N/A | | | | M.2100 ANALYSIS | | Rx 140Mb/s Tx Rx 34Mb/s Tx | | Errored Seconds 9 N/A N/A N/A | | Severely Errored Seconds 9 N/A N/A N/A | | Unavailable Seconds 0 N/A N/A N/A | | | | M.2110 ANALYSIS | | 2-hr 24-hr 7-day | | BIS Results WAIT WAIT WAIT | | | | | | Frequency : 155520000 Hz Offset : +0Hz Offset : +0.0ppm | | | | Pointer Results : AU POINTER TU POINTER | | Count Seconds Count Seconds | | NDF 3 N/A | | Missing NDF 2 N/A | | +ve Pointer Adjustments 3 3 N/A N/A | | -ve Pointer Adjustments 1 1 N/A N/A | | Implied VC Offset -0.0 N/A | | Pointer Value 512 N/A | |==============================================================================|

Figure A-6

Results Snapshot Logging Example

A-11

Logging Messages

Overhead Capture Logging

To log the Overhead Capture select the required External logging device (RS232 or HPIB or DISK or PARALLEL) under LOGGING PORT on the OTHER LOGGING display. Select LOGGING [ON] on the OTHER LOGGING display. Select LOG ON DEMAND [O/H CAPTURE] on the OTHER LOGGING display and press PRINT NOW .

Figure A-7

Overhead Capture Logging Example

Jitter Auto Tolerance Results Logging

To log the Jitter tolerance plot select the required External logging device (RS232 or HPIB or DISK or PARALLEL) under LOGGING PORT on the OTHER LOGGING display. Select LOGGING [ON] on the OTHER LOGGING display. Select RESULTS JITTER ; AUTO TOLER on the RESULTS display and press PRINT NOW . The results from which the Auto Tolerance plot is constructed are also logged.

Jitter Transfer Results Logging

To log the Jitter transfer plot select the required External logging device (RS232 or HPIB or DISK or PARALLEL) under LOGGING PORT on the OTHER LOGGING display. Select LOGGING [ON] on the OTHER LOGGING display. Select RESULTS JITTER ; TRANSFER FUNCTION on the RESULTS display and press PRINT NOW . The results from which the transfer plot is constructed are also logged.

A-12

Logging Messages

Overhead Snapshot Logging

To log the Overhead Snapshot select the required External logging device (RS232 or HPIB or DISK or PARALLEL) under LOGGING PORT on the OTHER LOGGING display. Select LOGGING [ON] on the OTHER LOGGING display. Select LOG ON DEMAND [O/H SNAPSHOT] on the OTHER LOGGING display and press PRINT NOW .

Figure A-8

Overhead Snapshot Logging Example

A-13

Logging Messages

SDH Tributary Scan Logging

To log the SDH Tributary Scan select the required External logging device (RS232 or HPIB or DISK or PARALLEL) under LOGGING PORT on the OTHER
LOGGING

display. Select LOGGING [ON] on the OTHER LOGGING

display. Select LOG ON DEMAND [TRIB SCAN] on the OTHER LOGGING display and press PRINT NOW

Figure A-9

SDH Tributary Scan Logging Example

A-14

Logging Messages

Pointer Graph Logging

To log thePointer Graph select the required External logging device (RS232 or HPIB or DISK or PARALLEL) under LOGGING PORT on the OTHER LOGGING display. Select LOGGING [ON] on the OTHER LOGGING display. Select LOG ON DEMAND [PTR GRAPH] on the OTHER LOGGING display and press PRINT NOW .

Figure A-10

Pointer Graph Logging Example

A-15

Logging Messages

A-16

Results Denitions

Appendix B - Results Definitions

0.1Trouble Scan
All possible error sources and alarms are scanned simultaneously. If any error counts are not zero then these are displayed. Up to 4 non-zero error counts are displayed in priority order. Table B-1
UPDH (Options UKK[USB]

Error Count Priority

SDH (Options A3R [A3S] SPDH (Options UKJ[USA], UKL[USC]) CRC BIT CODE FAS 140M FAS 34M FAS 8M FAS 2M REBE ATM (Option UKN) + SDH ATM (Option UKN) + SPDH

CRC BIT CODE FRAME REBE

B1 BIP B2 BIP B3 BIP VC3 PATH BIP TU2 BIP TU12 BIP A1A2 FRAME MS REI HP REI HP IEC HP REI LP REI BIT

B1 BIP (SDH only) B2 BIP (SDH only) B3 BIP (SDH only) Non Corrected HEC Corrected HEC Lost Cells Misinserted Cells REI Bit Errored Cells

EM BIP Non Corrected HEC Corrected HEC Lost Cells Misinserted Cells EM FEBE Bit Errored Cells

If any alarms are active "ALARMS ACTIVE" is displayed.

SHOW HISTORY and the alarm leds can be used to determine which alarms are

active. If no alarms are active and no non-zero error counts are detected then "NO TROUBLE" is displayed.

B-1

Results Denitions

0.1PDH Alarm Scan (Options UKJ[USA], UKL[USC])

Frame Loss, AIS and Remote Alarm at the interface rate and all lower levels of the hierarchy are displayed in graphical form as shown opposite. If any of the alarms has occurred the appropriate channel is highlighted. The graphical display does not show which of the three possible alarms has occurred for each channel.

0.2SDH Alarm Scan (Options A3R [A3S]

Any alarms at the AU rate and all lower levels of the hierarchy are displayed in graphical form as shown opposite. The order of alarm checking is: LOP AU AIS TU LOP TU AIS Unequipped HP RDI LP RDI H4 Loss of Multiframe If any of the alarms has occurred the appropriate channel is highlighted. The graphical display does not show which of the possible alarms has occurred for each channel.

B-2

Results Denitions

0.3Short Term Results

Displays period results obtained during the measurement. The period is user-dened under SHORT TERM PERIOD on the RESULTS display.

PDH Results (Options UKJ[USA], UKK[USB] and UKL[USC])

BIT EC BIT ER CODE EC CODE ER FRAME (FAS) CRC REBE

Counts Bit errors occurring during the Short Term Period. Calculates the ratio of Bit errors to the number of clocks in the Short Term Period. Counts Code errors occurring during the Short Term Period. Calculates the ratio of Code errors to the number of clocks in the Short Term Period. Compares the received FAS word with the correct value. Compares the received CRC4 with the calculated CRC4 (2 Mb/ s only). Detects Bit 1 of the NFAS word in frames 13 and 15 being set to 0 (2 Mb/s only).

If Option A1T or A3R is tted DS1 and DS3 are allowed as payloads, the following additional results are available:
DS1 CRC DS3 P-Bit DS3 C-Bit DS3 FEBE

Compares the received CRC6 with the calculated CRC6. Compares the received P-Bit parity with the calculated parity. Compares the received C-Bit parity with the calculated parity Calculated from the received FEBE bits.

SDH Results (Options US1[US5], A1T[A1U], A3R [A3S])

Error Count and Error Ratio results for the following error sources are available:
A1A2 FRAME B1 BIP B2 BIP MS REI B3 BIP HP REI HP IEC

Compares the received Framing bytes with the known value. Compares the received B1 with the recalculated value. Compares the received B2 with the recalculated value. Calculated from the REI bits in the received M1 overhead byte. Compares the received B3 with the recalculated value. Calculated from the REI bits in the received G1 overhead byte. Calculated from the IEC bits in the received Z5/N1 Path overhead byte.

B-3

Results Denitions

If a Payload of 34 Mb/s is selected, Error Count and Error Ratio results for the following additional error sources are also available:
TU PATH BIP LP REI

Compares the received VC3, B3 with the recalculated value. Calculated from the REI bits in the received VC3, G1 overhead byte.

If a Payload of 2 Mb/s is selected, Error Count and Error Ratio results for the following additional error sources are also available:
TU PATH BIP LP REI

Compares the received V5, BIP-2 in the TU12 selected for test with the recalculated value. Calculated from the REI bits in the V5 overhead byte of the TU12 selected for test.

ATM Results (Option UKN)

Error Count and Error Ratio results for the following error sources are available:
EM BIP REI Corrected HEC Non Corrected HEC Received Cells Errored Cells Bit Cell Loss Misinserted Cells

Compares the received BIP with the recalculated value. Calculated from the received REI bits. Errors in Cell Headers which have been corrected by the HEC algorithm. Errors in Cell Headers which have not been corrected by the HEC algorithm. Counts received cells which match the receiver cell lter. PRBS Cell containing one or more bit errors, or a Test Cell containing incorrect EDCs. Bit by Bit comparison of the received data with the internal reference pattern. A discontinuity in the Test Cell sequence number indicating cells have been lost. Errors in the Test Cell sequence number implying a misinserted cell.

B-4

Results Denitions

0.4Cumulative Results
Provides a cumulative display of the results during the measurement period.

PDH Results (Options UKJ[USA], UKK [USB]and UKL[USC])

BIT EC BIT ER CODE EC CODE ER FRAME (FAS) CRC REBE

Counts Bit errors occurring during the measurement Period. Calculates the ratio of Bit errors to the number of clocks in the measurement Period. Counts Code errors occurring during the measurement Period. Calculates the ratio of Code errors to the number of clocks in the measurement Period. Compares the received FAS word with the correct value. Compares the received CRC4 with the calculated CRC4 (2 Mb/ s only). Detects Bit 1 of the NFAS word in frames 13 and 15 being set to 0 (2 Mb/s only).

If Option A1T or A3R is tted DS1 and DS3 are allowed as payloads and the following additional results are available:
DS1CRC DS3 P-Bit DS3 C-Bit DS3 FEBE

Compares the received CRC6 with the calculated CRC6. Compares the received P-Bit parity with the calculated parity. Compares the received C-Bit parity with the calculated parity Calculated from the received FEBE bits.

SDH Results (Option US1[US5], A1T[A1U], A3R [A3S])

Error Count and Error Ratio results for the following error sources are available:
A1A2 FRAME B1 BIP B2 BIP MS REI B3 BIP HP REI HP IEC

Compares the received Framing bytes with the known value. Compares the received B1 with the recalculated value. Compares the received B2 with the recalculated value. Calculated from the REI bits in the received M1 overhead byte. Compares the received B3 with the recalculated value. Calculated from theREI bits in the received G1 overhead byte. Calculated from the IEC bits in the received Z5/N1 Path overhead byte.

B-5

Results Denitions

If a Payload of 34 Mb/s is selected, Error Count and Error Ratio results for the following additional error sources are also available:
TU PATH BIP LP REI

Compares the received VC3, B3 with the recalculated value. Calculated from the REI bits in the received VC3, G1 overhead byte.

If a Payload of 2 Mb/s is selected, Error Count and Error Ratio results for the following additional error sources are also available:
TU PATH BIP LP REI

Compares the received V5, BIP-2 in the TU12 selected for test with the recalculated value. Calculated from the REI bits in the V5 overhead byte of the TU12 selected for test.

ATM Results (Option UKN)

Error Count and Error Ratio results for the following error sources are available:
EM BIP REI Corrected HEC Non Corrected HEC Received Cells Errored Cells Bit Cell Loss Misinserted Cells

Compares the received BIP with the recalculated value. Calculated from the received REI bits. Errors in Cell Headers which have been corrected by the HEC algorithm. Errors in Cell Headers which have not been corrected by the HEC algorithm. Counts received cells which match the receiver cell lter. PRBS Cell containing one or more bit errors, or a Test Cell containing incorrect EDCs. Bit by Bit comparison of the received data with the internal reference pattern. A discontinuity in the Test Cell sequence number indicating cells have been lost. Errors in the Test Cell sequence number implying a misinserted cell.

B-6

Results Denitions

0.5PDH Error Analysis G.821, G.826, M2100, M2110, M2120

Analysis results are calculated for the following error sources:

Option UKK[USB]
Out of Service

G.821 BIT (All Rates) M2100 FRAME (All Rates) G.821 FRAME (Not 704 kb/s), G.821 CRC and REBE (2 Mb/s, CRC Framing only).

In-Service

Option UKJ[USA] & UKL[USC]

G.821 BIT and FAS (All Rates), CRC and REBE (2 Mb/s, CRC Framing only). G.826 (All Rates) M2100 FRAME (All Rates) M2110 BIS (Bring Into Service) All rates M2120 Circuit Maintenance (All Rates)

G.821 Bit Errors

These result from a bit by bit comparison of the received pattern and the internal reference pattern.

Table B-2

PDH G.821 - Bit Analysis Display

EC ES

Denition
Error Count - Cumulative Bit error count during the measurement period. Error Second - Cumulative count of seconds within available time that contain at least 1 Bit error. Percentage Error Seconds is also displayed - error seconds expressed as a percentage of the available time. Percentage Annex D Error Seconds - As% ES, only error second is normalised to 64 kb/s rate as per ITU-T G.821 Annex D. Error Free Seconds - Cumulative count of seconds within available time that contain zero errors. Percentage Error Free Seconds is also displayed - error free seconds expressed as a percentage of the available time.

% Ann. D ES EFS

B-7

Results Denitions

Table B-2

PDH G.821 - Bit Analysis Display

SES

Denition
Severely Errored Seconds - Cumulative count of seconds within available time in which the Bit Error Ratio is > 1 in 10-3. Percentage Severely Errored Seconds is also displayed severely errored seconds expressed as a percentage of the available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive seconds in which the Bit Error Ratio is > 1 in 10-3, and ends at the start of 10 or more consecutive seconds in which the Bit Error Ratio is < 1 in 10-3. Percentage Unavailable Seconds is also displayed - unavailable seconds expressed as a percentage of the total elapsed time. Degrade Minutes - Cumulative count of degraded minutes. Available seconds, excluding Severely Errored Seconds, are packaged into 1 minute blocks. The Bit Error Ratio for the packaged block is measured and if it exceeds 1 in 10-6 a Degraded Minute is registered. Percentage Degraded Minutes is also displayed -Degraded Minutes expressed as a percentage of the total number of packaged 1 minute blocks. Code Errored Second - Cumulative count of seconds with available time that contain at least 1 Code error.

UNAV

DEG MIN

CODE ES

G.821 Frame (FAS) Errors

These result from a bit by bit comparison of the received FAS word with the correct value, once frame alignment has been achieved.

Table B-3

PDH G.821 - Frame (FAS) Analysis (Not 704 kb/s) Display

EC ES

Denition
Error Count - Cumulative Frame error count during the measurement period. Error Second - Cumulative count of seconds within available time that contain at least 1 Frame error. Percentage Error Seconds is also displayed - error seconds expressed as a percentage of the available time. Percentage Annex D Error Seconds - As % ES, only error second is normalised to 64 kb/ s rate as per ITU-T G.821 Annex D. Error Free Seconds - Cumulative count of seconds within available time that contain zero errors. Percentage Error Free Seconds is also displayed - error free seconds expressed as a percentage of the available time. Severely Errored Seconds - Cumulative count of seconds within available time in which the Bit Error Ratio is > 1 in 10-3. Percentage Severely Errored Seconds is also displayed severely errored seconds expressed as a percentage of the available time.

% Ann. D ES EFS

SES

B-8

Results Denitions

Table B-3

PDH G.821 - Frame (FAS) Analysis (Not 704 kb/s) Display

UNAV

Denition
Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive seconds in which the Bit Error Ratio is > 1 in 10-3, and ends at the start of 10 or more consecutive seconds in which the Bit Error Ratio is < 1 in 10-3. Percentage Unavailable Seconds is also displayed - unavailable seconds expressed as a percentage of the total elapsed time. Degraded Minutes - Cumulative count of degraded minutes. Available seconds, excluding Severely Errored Seconds, are packaged into 1 minute blocks. The Bit Error Ratio for the packaged block is measured and if it exceeds 1 in 10-6 a Degraded Minute is registered. Percentage Degraded Minutes is also displayed - degraded minutes expressed as a percentage of the total number of packaged 1 minute blocks. Code Errored Second - Cumulative count of seconds with available time that contain at least 1 Code error.

DEG MIN

CODE ES

G.821 CRC Errors

These result from a comparison of the received CRC4 with the calculated CRC4.

Table B-4

PDH G.821 - CRC Analysis (2 Mb/s, CRC Framing) Display

EC ES

Denition
Error Count - Cumulative CRC error count during the measurement period. Error Second - Cumulative count of seconds within available time that contain at least 1 CRC error. Percentage Error Seconds is also displayed - error seconds expressed as a percentage of the available time. Percentage Annex D Error Seconds - As % ES, only error second is normalised to 64 kbs rate as per ITU-T G.821 Annex D. Error Free Seconds - Cumulative count of seconds within available time that contain zero errors. Percentage Error Free Seconds is also displayed - error free seconds expressed as a percentage of the available time. Severely Errored Seconds - Cumulative count of seconds within available time in which the Bit Error Ratio is > 1 in 10-3. Percentage Severely Errored Seconds is also displayed severely errored seconds expressed as a percentage of the available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive seconds in which the Bit Error Ratio is > 1 in 10-3, and ends at the start of 10 or more consecutive seconds in which the Bit Error Ratio is < 1 in 10-3. Percentage Unavailable Seconds is also displayed - unavailable seconds expressed as a percentage of the total elapsed time.

% Ann. D ES EFS

SES

UNAV

B-9

Results Denitions

Table B-4

PDH G.821 - CRC Analysis (2 Mb/s, CRC Framing) Display

DEG MIN

Denition
Degrade Minutes - Cumulative count of degraded minutes. Available seconds, excluding Severely Errored Seconds, are packaged into 1 minute blocks. The Bit Error Ratio for the packaged block is measured and if it exceeds 1 in 10-6 a Degraded Minute is registered. Percentage Degraded Minutes is also displayed - degraded minutes expressed as a percentage of the total number of packaged 1 minute blocks. Code Errored Second - Cumulative count of seconds with available time that contain at least 1 Code error.

CODE ES

G.821 REBE Errors

These are calculated from bit 1 of the NFAS word in frames 13 and 15 of the received 2 Mb/s.

Table B-5

PDH G.821 - REBE Analysis (2 Mb/s, CRC Framing) Display

EC ES

Denition
Error Count - Cumulative REBE error count during the measurement period. Error Second - Cumulative count of seconds within available time that contain at least 1 REBE error. Percentage Error Seconds is also displayed - error seconds expressed as a percentage of the available time. Percentage Annex D Error Seconds - As % ES, only error second is normalised to 64 kb/ s rate as per ITU-T G.821 Annex D. Error Free Seconds - Cumulative count of seconds within available time that contain zero errors. Percentage Error Free Seconds is also displayed - error free seconds expressed as a percentage of the available time. Severely Errored Seconds - Cumulative count of seconds within available time in which the Bit Error Ratio is > 1 in 10-3. Percentage Severely Errored Seconds is also displayed severely errored seconds expressed as a percentage of the available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive seconds in which the Bit Error Ratio is > 1 in 10-3, and ends at the start of 10 or more consecutive seconds in which the Bit Error Ratio is < 1 in 10-3. Percentage Unavailable Seconds is also displayed - unavailable seconds expressed as a percentage of the total elapsed time. Degraded Minutes - Cumulative count of degraded minutes. Available seconds excluding Severely Errored Seconds, are packaged into 1 minute blocks. The Bit Error Ratio for the packaged block is measured and if it exceeds 1 in 10-6 a Degraded Minute is registered. Percentage Degraded Minutes is also displayed - degraded minutes expressed as a percentage of the total number of packaged 1 minute blocks.

% Ann. D ES EFS

SES

UNAV

DEG MIN

B-10

Results Denitions

Table B-5

PDH G.821 - REBE Analysis (2 Mb/s, CRC Framing) Display

CODE ES

Denition
Code Errored Second - Cumulative count of seconds with available time that contain at least 1 Code error.

G.826 PDH Analysis

PDH G.826 Analysis results are only available on Option UKJ[USA] and UKL[USC]. DS1 and DS3 are only available if Option A3R is tted. Table B-6 PDH G.826 Analysis - 2 Mb/s CRC4 Framed (PCM30CRC, PCM31CRC) Display
RX ES

Denition
Receive Error Second - Cumulative count of seconds within available time that contain at least 1 G.703 Code error or 1 CRC error. Transmit Error Second - Cumulative count of seconds within available time that contain at least 1 REBE error. Receive Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 805 CRC errors or a DEFECT. Defects are LOS, LOF and AIS. Transmit Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 805 REBE errors or RAI has occurred for 2 consecutive 100 ms periods. Near-end occurrences of LOS, LOF and AIS are not included in the cumulative result. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds. Errored Block count - An errored block is a CRC4 with one or more bits in error. Background Block Error count - Cumulative count of errored blocks excluding those in severely errored seconds. Background Block Error Ratio - The ratio of errored blocks to total blocks. Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

TX ES

RX SES

TX SES

ESR

SESR

UAS

EB BBE

BBER

PUAS

B-11

Results Denitions

Table B-7

PDH G.826 Analysis - 2 Mb/s Framed - Not CRC4 Display

RX ES

Denition
Receive Error Second - Cumulative count of seconds within available time that contain at least 1 G.703 Code error or 1 Frame error or 1 bit error. Transmit Error Second - Cumulative count of seconds within available time where RAI occurs for 2 consecutive 100 ms periods. Receive Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 28 Frame errors or BER 1X10-3, or a DEFECT. Defects are LOS, LOF, PSL and AIS. Transmit Severely errored Seconds - Cumulative count of 1 second periods within available time where RAI occurs for 2 consecutive 100 ms periods. Near-end occurrences of LOS, LOF and AIS are not included in the cumulative result. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds.

TX ES

RX SES

TX SES

ESR

SESR

UAS

Table B-8

PDH G.826 Analysis - 2 Mb/s Unframed Display

ES

Denition
Error Second - Cumulative count of seconds within available time that contain at least 1 G.703 Code error. Severely errored Seconds - Cumulative count of 1 second periods within available time that contain a DEFECT. Defects are LOS and AIS. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds.

SES

ESR

SESR

UAS

B-12

Results Denitions

Table B-9

PDH G.826 Analysis - 8 Mb/s Framed Display

RX ES

Denition
Receive Error Second - Cumulative count of seconds within available time that contain at least 1 Frame error or 1 Bit error. Receive Error Second - Cumulative count of seconds within available time where RAI occurs for 2 consecutive 100 ms periods. Receive Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 41 Frame errors or BER 1X10-3 or a DEFECT. Defects are LOS, LOF, AIS and PSL. Transmit Severely errored Seconds - Cumulative count of 1 second periods within available time where RAI occurs for 2 consecutive 100 ms periods. Near-end occurrences of LOS, LOF and AIS are not included in the cumulative result. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds.

TX ES

RX SES

TX SES

ESR

SESR

UAS

Table B-10

PDH G.826 Analysis - 34 Mb/s Framed Display

RX ES

Denition
Receive Error Second - Cumulative count of seconds within available time that contain at least 1 Frame error or 1 Bit error. Receive Error Second - Cumulative count of seconds within available time where RAI occurs for 2 consecutive 100 ms periods. Receive Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 52 Frame errors or a DEFECT. Defects are LOS, LOF, AIS and PSL. Transmit Severely errored Seconds - Cumulative count of 1 second periods within available time where RAI occurs for 2 consecutive 100 ms periods. Near-end occurrences of LOS, LOF and AIS are not included in the cumulative result. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time.

TX ES

RX SES

TX SES

ESR

SESR

B-13

Results Denitions

Table B-10

PDH G.826 Analysis - 34 Mb/s Framed Display

UAS

Denition
Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds.

Table B-11

PDH G.826 Analysis - 140 Mb/s Framed Display

RX ES

Denition
Receive Error Second - Cumulative count of seconds within available time that contain at least 1 Frame error. Receive Error Second - Cumulative count of seconds within available time where RAI occurs for 2 consecutive 100 ms periods. Receive Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 69 Frame errors or a DEFECT. Defects are LOS, LOF, AIS. Transmit Severely errored Seconds - Cumulative count of 1 second periods within available time where RAI occurs for 2 consecutive 100 ms periods. Near-end occurrences of LOS, LOF and AIS are not included in the cumulative result. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds.

TX ES

RX SES

TX SES

ESR

SESR

UAS

Table B-12

PDH G.826 Analysis - 8, 34 and 140 Mb/s Unframed Display

ES

Denition
Error Second - Cumulative count of seconds within available time that contain at least 1 DEFECT. Defects are LOS and AIS. Severely errored Seconds - Cumulative count of 1 second periods within available time that contain a DEFECT. Defects are LOS and AIS. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds.

SES

ESR

B-14

Results Denitions

Table B-12

PDH G.826 Analysis - 8, 34 and 140 Mb/s Unframed Display

SESR

Denition
Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds.

UAS

Table B-13

G.826 Analysis DS1 Unframed Display

ES

Denition
Error Second - Cumulative count of seconds within available time that contain at least 1 DEFECT. Defects are LOS, LOF, MS AIS, LOP, Path AIS, H4 LOM, TU LOP, TU Path AIS and DS1 AIS. Severely errored Seconds - Cumulative count of 1 second periods within available time that contain a DEFECT. Defects are LOS, LOF, MS AIS, LOP, Path AIS, H4 LOM, TU LOP, TU Path AIS and DS1 AIS. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds.

SES

ESR

SESR

UAS

Table B-14

G.826 Analysis DS3 Unframed Display

ES

Denition
Error Second - Cumulative count of seconds within available time that contain at least 1 DEFECT. Defects are LOS, LOF, MS AIS, LOP and Path AIS. Severely errored Seconds - Cumulative count of 1 second periods within available time that contain a DEFECT. Defects are LOS, LOF, MS AIS, LOP, Path AIS. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds.

SES

ESR

B-15

Results Denitions

Table B-14

G.826 Analysis DS3 Unframed Display

SESR

Denition
Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds.

UAS

Table B-15

PDH G.826 Analysis - DS1, D4 & SLC-96 Framing Display

NEAR ES

Denition
Receive Error Second - Cumulative count of seconds within available time that contain at least 1 Frame error. Receive Error Second - Cumulative count of seconds within available time that contain at least 1 DS1 FERF. Receive Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 8 Frame errors or a DEFECT. Defects are LOS, LOF, MS AIS, LOP, Path AIS, H4 LOM, TU LOP, TU Path AIS, DS1 Frame Loss and DS1 AIS. Transmit Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 1 DS1 FERF. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds.

FAR ES

NEAR SES

FAR SES

ESR

SESR

UAS

Table B-16

PDH G.826 Analysis - DS1, ESF Framing Display

NEAR ES

Denition
Receive Error Second - Cumulative count of seconds within available time that contain at least 1CRC6 error.

B-16

Results Denitions

Table B-16

PDH G.826 Analysis - DS1, ESF Framing Display

FAR ES

Denition
Receive Error Second - Cumulative count of seconds within available time that contain at least 1 DS1 FERF. Receive Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 320 CRC6 errors or a DEFECT. Defects are LOS, LOF, MS AIS, LOP, Path AIS, H4 LOM, TU LOP, TU Path AIS, DS1 Frame Loss and DS1 AIS. Transmit Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 1 DS1 FERF. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds. Errored Block count - An errored block is a CRC6 with one or more bits in error. Background Block Error count - Cumulative count of errored blocks excluding those in severely errored seconds. Background Block Error Ratio - The ratio of errored blocks to total blocks. Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

NEAR SES

FAR SES

ESR

SESR

UAS

EB BBE

BBER

PUAS

Table B-17

PDH G.826 Analysis - DS3, M23 Framing Display

NEAR ES

Denition
Receive Error Second - Cumulative count of seconds within available time that contain at least 1 P-Bit parity error. Receive Error Second - Cumulative count of seconds within available time that contain at least 1 DS3 FERF. Receive Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 2444 P-Bit parity or a DEFECT. Defects are LOS, LOF, MS AIS, LOP, Path AIS, DS3 Frame Loss and DS3 AIS. Transmit Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 1 DS3 FERF.

FAR ES

NEAR SES

FAR SES

B-17

Results Denitions

Table B-17

PDH G.826 Analysis - DS3, M23 Framing Display

ESR

Denition
Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds. Errored Block count - An errored block is a P-Bit parity with one or more bits in error. Background Block Error count - Cumulative count of errored blocks excluding those in severely errored seconds. Background Block Error Ratio - The ratio of errored blocks to total blocks. Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

SESR

UAS

EB BBE

BBER

PUAS

Table B-18

PDH G.826 Analysis - DS3, C-Bit Framing Display

NEAR ES FAR ES NEAR SES

Denition
Receive Error Second - Cumulative count of seconds within available time that contain at least 1 Frame error. Receive Error Second - Cumulative count of seconds within available time that contain at least 1 DS1 FERF. Receive Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 8 Frame errors or a DEFECT. Defects are LOS, LOF, MS AIS, LOP, Path AIS, H4 LOM, TU LOP, TU Path AIS, DS1 Frame Loss and DS1 AIS. Transmit Severely errored Seconds - Cumulative count of 1 second periods within available time that contain at least 1 DS1 FERF. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Unavailable Seconds - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds and ends at the start of 10 or more consecutive non severely errored seconds.

FAR SES ESR

SESR UAS

B-18

Results Denitions

Table B-18

PDH G.826 Analysis - DS3, C-Bit Framing Display

EB BBE BBER PUAS

Denition
Errored Block count - An errored block is a frame byte with one or more bits in error. Background Block Error count - Cumulative count of errored blocks excluding those in severely errored seconds. Background Block Error Ratio - The ratio of errored blocks to total blocks. Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

PDH M.2100 Frame Analysis

For Option UKK[USB], Analysis results based on ITU-T G.821 or M.2100 can be selected on the OTHER MISCELLANEOUS display under RESULTS DISPLAY MODE. For Option UKJ[USA], UKL[USC] Analysis results based on ITU-T G.821 or M.2100 can be selected on the RESULTS [PDH] [ERROR ANALYSIS] display. M.2100 Analysis is based on Frame errors. Table B-19 PDH M.2100 - Frame (FAS) Analysis (Not 704 kb/s) Display
RX ES

Denition
Receive Error Seconds - Cumulative count of seconds within available time that contain at least 1 FAS error. 2 Mb/s, CRC Framing - Cumulative count of seconds within available time that contain at least 1 CRC4 error. Transmit Error Seconds - 2 Mb/s, CRC Framing only. Cumulative count of seconds within available time that contain at least 1 REBE error. Receive Severely Errored Seconds - Cumulative count of seconds within available time in which the error ratio exceeds a threshold. The threshold changes according to the selected rate as follows: 140 Mb/s - 568 Frame Bit errors 34 Mb/s - 223 Frame Bit errors 8 Mb/s - 99 Frame Bit errors 2 Mb/s (Non CRC4) - 28 Frame Bit errors 2 Mb/s (CRC4) - 830 CRC4 errors Transmit Severely Errored Seconds - 2 Mb/s, CRC Framing only. Cumulative count of seconds within available time that contain 830 REBE errors. Unavailable Seconds - Cumulative count of unavailable second. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds.

TX ES

RX SES

TX SES

UNAV

B-19

Results Denitions

PDH M.2110 BIS (Bring Into Service)

Provides a 2 Hour, 24 Hour and 7 Day PASS, FAIL, m-d-;- indication for BIS testing as described in M.2110. The ES and SES results are compared to the S1 and S2 thresholds and indicate PASS, FAIL or m-d-;- (uncertain). If m-d-;- is displayed the next longest test will be carried out. The S1 and S2 thresholds can be set in two different ways: 1. USER PROGRAM - S1 and S2 values are input by the user. 2. PATH ALLOCATION - The HP 37717B calculates the S1 and S2 values, from the user entered Path Allocation value, according to M.2110.

PDH M.2120 Circuit Maintenance

Provides a threshold report when any of the relevant thresholds are exceeded within a 15 Minute (TR1 ES & SES) or 24 Hour period (TR2 ES & SES). The TR1 and TR2 thresholds can be set in two different ways: 1. USER PROGRAM - TR1 ES & SES and TR2 ES & SES values are input by the user. 2. PATH ALLOCATION - The HP 37717B calculates the TR1 and TR2 values, from the user entered Path Allocation and Maintenance Factor values, according to M.2120.

B-20

Results Denitions

0.1SDH Error Analysis (Option A3R [A3S])

Analysis results are calculated for the following error sources: B1 BIP; B2 BIP; MS REI; B3 BIP; HP REI and HP IEC. If a Payload of 34 Mb/s or 2 Mb/s is selected additional error sources of TU Path BIP and LP REI are also available.

G.826 Analysis B1 BIP

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block. If an STM-4 interface is selected an errored block is a BIP with one or more bits in error.

Table B-20

G.826 Analysis B1 BIP Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with >= 2400 Errored Blocks, or containing a "defect". Defects are LOS and LOF. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability.

EB SES

UNAV

ESR

SESR

BBEC

BBER

B-21

Results Denitions

G.826 Analysis B2 BIP

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block. If an STM-4 interface is selected an errored block is a BIP with one or more bits in error.

Table B-21

G.826 Analysis B2 BIP Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with >= 2400 Errored Blocks, or containing a "defect". Defects are LOS, LOF and MS AIS. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability.

EB SES

UNAV

ESR

SESR

BBEC

BBER

B-22

Results Denitions

G.826 Analysis MS REI

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block. If an STM-4 interface is selected an errored block is a FEBE/REI with one or more bits in error.

Table B-22

G.826 Analysis MS REI Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with >= 2400 Errored Blocks, or MS RDI. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability.

EB SES

UNAV

ESR

SESR

BBEC

BBER

NOTE

Near End Failures of LOS, LOF and MS AIS produce "dead time" in the MS REI measurement such that result accumulation is suspended.

B-23

Results Denitions

G.826 Path B3 BIP Analysis

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block.

Table B-23

G.826 Analysis Path B3 BIP Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with >= 2400 Errored Blocks, or containing a "defect". Defects are LOS, LOF, MS AIS, LOP and AU AIS. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

EB SES

UNAV

ESR

SESR

BBEC

BBER

PUAS

B-24

Results Denitions

G.826 HP REI Analysis

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block.

Table B-24

G.826 Analysis HP REI Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with >= 2400 Errored Blocks, or HP RDI. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds tot he total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

EB SES

UNAV

ESR

SESR

BBEC

BBER

PUAS

NOTE

Near End Failures of LOS, LOF, MS AIS, LOP and AU AIS produce "dead time" in theHP REI measurement such that result accumulation is suspended.

B-25

Results Denitions

G.826 HP IEC Analysis

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block.

Table B-25

G.826 Analysis HP IEC Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with >= 2400 Errored Blocks, or containing a "defect". Defects are LOS, LOF, MS AIS, LOP, AU AIS and HP RDI. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

EB SES

UNAV

ESR

SESR

BBEC

BBER

PUAS

NOTE

Near End Failures of LOS, LOF, MS AIS, LOP and AU AIS produce "dead time" in the HP IEC measurement such that result accumulation is suspended.

B-26

Results Denitions

G.826 TU Path BIP Analysis - 34 Mb/s Payload

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block.

Table B-26

G.826 Analysis TU Path BIP - 34 Mb/s Payload Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with >= 2400 Errored Blocks, or containing a "defect". Defects are LOS, LOF, MS AIS, LOP, AU AIS, H4 LOM, TU3 AIS and TU3 LOP. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

EB SES

UNAV

ESR

SESR

BBEC

BBER

PUAS

B-27

Results Denitions

G.826 TU Path BIP Analysis - 2 Mb/s Payload

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block.

Table B-27

G.826 Analysis TU Path BIP - 2 Mb/s Payload Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with >= 600 Errored Blocks, or containing a "defect". Defects are LOS, LOF, MS AIS, LOP, AU AIS, H4 LOM, TU AIS and TU LOP. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

EB SES

UNAV

ESR

SESR

BBEC

BBER

PUAS

B-28

Results Denitions

G.826 LP REI Analysis - 34 Mb/s Payload

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block.

Table B-28

G.826 Analysis LP REI, 34 Mb/s Payload Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with >= 2400 Errored Blocks, or LP RDI. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

EB SES

UNAV

ESR

SESR

BBEC

BBER

PUAS

NOTE

Near End Failures of LOS, LOF, MS AIS, LOP, AU AIS, H4 LOM, TU LOP and TU Path AIS produce "dead time" in the LP REI measurement such that result accumulation is suspended.

B-29

Results Denitions

G.826 LP REI Analysis - 2 Mb/s Payload

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block.

Table B-29

G.826 Analysis TU Path FEBE/LP REI - 2 Mb/s Payload Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with >= 600 Errored Blocks, or LP RDI. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

EB SES

UNAV

ESR

SESR

BBEC

BBER

PUAS

NOTE

Near End Failures of LOS, LOF, MS AIS, LOP, AU AIS, H4 LOM, TU LOP and TU AIS produce "dead time" in the LP REI measurement such that result accumulation is suspended.

B-30

Results Denitions

0.1ATM Error Analysis (Option UKN)

Analysis results are calculated for the following error sources: EM BIP, ATM REI, ATM REBE, ATM CRC4.

G.826 ATM EM BIP Analysis

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block.

Table B-30

G.826 Analysis ATM EM BIP Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with > 30% Errored Blocks, or containing a "defect". Defects are LOS, LOF, AIS. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

EB SES

UNAV

ESR

SESR

BBEC

BBER

PUAS

B-31

Results Denitions

G.826 ATM REI Analysis

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block.

Table B-31

SDH G.826 Analysis ATM REI Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with > 30% Errored Blocks, or containing a "defect". Defects are LOS, LOF, AIS,RDI. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

EB SES

UNAV

ESR

SESR

BBEC

BBER

PUAS

B-32

Results Denitions

G.826 ATM REBE Analysis

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block.

Table B-32

G.826 Analysis ATM REBE Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with > 30% Errored Blocks, or containing a "defect". Defects are LOS, LOF, AIS. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

EB SES

UNAV

ESR

SESR

BBEC

BBER

PUAS

B-33

Results Denitions

G.826 ATM CRC4 Analysis

These calculations are based on "Errored Blocks". A Block is a set of consecutive bits associated with the Path. Each bit belongs to one and only one block.

Table B-33

G.826 Analysis ATM CRC4 Display

ES

Denition
Errored Seconds - Cumulative count of 1 second periods that contain at least 1 Errored Block. Errored Block count - cumulative count of errored blocks. Severely errored Seconds - Cumulative count of 1 second periods with > 30% Errored Blocks, or containing a "defect". Defects are LOS, LOF, AIS. Unavailability - Cumulative count of unavailable seconds. A period of unavailability begins at the start of 10 or more consecutive severely errored seconds, and ends at the start of 10 or more consecutive non severely errored seconds. Error Second Ratio - The ratio of errored seconds to the total seconds of available time. A period of unavailability begins at the start of 10 or more consecutive Severely Errored Seconds, and ends at the start of 10 or more non Severely Errored Seconds. Severely Errored Second Ratio - The ratio of severely errored seconds to the total seconds of available time. Background Block error count - Cumulative count of errored blocks which occur outwith a severely errored second. Background Block error Ratio - The ratio of errored blocks to total blocks.Total blocks excludes severely errored seconds and periods of unavailability. Path Unavailable Second count - Logical OR of the Near and Far end unavailable seconds.

EB SES

UNAV

ESR

SESR

BBEC

BBER

PUAS

B-34

Results Denitions

0.1SDH Pointer Value Results (Option A3R [A3S])

Table B-34 Pointer Value

Display
Pointer Value NDF Missing NDF

Denition
The received Pointer value. The number of seconds containing one or more active New Data Flag The number of seconds containing one or more VC moves with no accompanying active New Data Flag. The number of positive pointer adjustments in the measurement period and the number of seconds in the measurement period which contain one or more positive adjustments. The number of negative pointer adjustments in the measurement period and the number of seconds in the measurement period which contain one or more negative adjustments.

POS ADJUSTMENTS

NEG ADJUSTMENTS

IMPLIED VC4 OFFSET

The total number of positive and negative pointer movements during the measurement are counted and the implied mean VC offset, is calculated in ppm.

B-35

Results Denitions

0.1Jitter Results (Options UHN[US9], A3L [A3M], A3V [A3W], A3N [A3P])
Jitter Hits and Jitter Amplitude results are provided. In addition Wander results are provided at 2 Mb/s.

Table B-35

Jitter Results Result

+ve PEAK -ve PEAK PEAK-PEAK HIT COUNT HIT SECONDS

Description
Highest value of positive Jitter during measurement period. Highest value of negative Jitter during measurement period. Highest value of pk_pk Jitter during measurement period. Number of times received jitter exceeds a user dened threshold. Number of seconds which contain at least 1 jitter hit.

Table B-36

Wander Results Result

+ve PEAK -ve PEAK

Description
Cumulative amount of positive Wander during measurement period. Cumulative amount of negative Wander during measurement period. Cumulative amount of pk_pk Wander during measurement period. Cumulative amount of pk_pk Wander during 15 Minute period. Cumulative amount of pk_pk Wander during 24 Hour period. Cumulative Cumulative count of Bit Slips during measurement Period. Cumulative count of Frame Slips during measurement Period.

PEAK-PEAK PEAK-PEAK (15 MIN) PEAK-PEAK (24 HOURS) TIME INTERVAL ERROR ESTIMATED BIT SLIPS ESTIMATED FRAME SLIPS

B-36

Results Denitions

0.1Alarm Seconds
PDH Alarm Seconds
Table B-37 PDH Alarm Seconds Alarm
Power Loss

Options
UKJ[USA], UKK[USB], UKL[USC] UKJ[USA], UKK[USB], UKL[USC] UKJ[USA], UKK[USB], UKL[USC] UKJ[USA], UKK[USB], UKL[USC] UKJ[USA], UKL[USC] UKJ[USA], UKL[USC] UKJ[USA], UKL[USC] UKJ[USA], UKL[USC] UKK[USB] UKJ[USA], UKK[USB], UKL[USC] UKJ[USA], UKK[USB], UKL[USC] UKJ[USA], UKK[USB], UKL[USC]

Description
All rates

Loss of Signal

All rates

AIS

All rates

Pattern Loss

All rates

LOF 140M LOF 34M LOF 8M LOF 2M Frame Loss Remote Alarm

140 Mb/s Frame Loss 34 Mb/s Frame Loss 8 Mb/s Frame Loss 2 Mb/s Frame Loss 2 Mb/s In Service Only Not 704 kb/s

Multiframe Loss

2 Mb/s, CAS or CRC Framing

Remote MFrame Alarm

2 Mb/s, CAS Framing Only

B-37

Results Denitions

SDH Alarm Seconds (Options A3R [A3S])

Table B-38 SDH Alarm Seconds) Alarm
Power Loss Loss of Signal (LOS) Loss of Frame (LOF) Out of Frame (OOF) Loss of Pointer (LOP) MS AIS K1K2 Change Path AIS MS RDI HP RDI H4 Multiframe Loss (Not 140 Mb/s Payload) TU LOP (Not 140 Mb/s Payload) TU AIS (Not 140 Mb/s Payload) LP RDI (Not 140 Mb/s Payload)

STM-1
Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes No No No No

STM-4
Yes Yes Yes Yes No Yes Yes No Yes No No No No No

ATM Alarm Seconds (Option UKN)

Table B-39 ATM Alarm Seconds (Option UKN) Alarm
Power Loss LOS LOF AIS RDI Pattern Loss

SDH
Yes Yes Yes No No Yes

PDH
Yes Yes Yes Yes Yes Yes

Description
Loss of Power Loss of Signal Loss of Frame PDH, Physical Layer AIS PDH, Physical Layer FERF Pattern Sync Loss

B-38

Results Denitions

Table B-39

ATM Alarm Seconds (Option UKN) Alarm

Loss of Cell Sync Sel Cell Not RX Test Cell Loss Congestion EXP VP AIS VP RDI VC AIS VC RDI OOF LOP MS AIS Path AIS MS FERF/RS RDI Path FERF/HP RDI TU LOP TU Path AIS TU Path FERF/LP RDI

SDH
Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes Yes

PDH
Yes Yes Yes Yes No No No No No No No No No No No No No

Description
Cell Sync Loss Selected Cell Not Received Test Cell Loss Congestion experienced Virtual Path AIS Virtual Path FERF Virtual Channel AIS Virtual Channel FERF Out of Frame Loss of Pointer Multiplexer Section AIS Path AIS Multiplexer Section FERF Path FERF Tributary Loss of Pointer Tributary Path AIS Tributary Path FERF

0.1Frequency Measurement
Frequency measurement is available at standard PDH and SDH rates. The measured frequency is displayed in Hz with 1 Hz resolution. Offset from the standard rate is displayed in Hz and ppm (parts per million).

B-39

Results Denitions

B-40

Self Test Fail Numbers

Appendix C- Self Test Fail Numbers

When self test is run fail numbers may be displayed. The fail numbers and a description are listed below. Table C-1 No.
1020 1022 1024 1041 1043 1045 1047 1060 1070 1081 1083 1085 1087 1090 1101 1103 1110 1112 1120 1122 1124 1131 1133 1141 1143

Processor Self Test Description

SRAM Error SRAM Error SRAM Address Error RS232 R1 RS232 CTS RS232 Tx time out RS232 Tx/Rx Data t Real Time Clock Set Incorrectly Parallel Port No Send Data Keyboard Processor Internal RAM Keyboard Processor ROM Front Panel Bad Command Front Panel CPU or UART VRAM Data Error Disk Full Disk Read Fail LAN Failed Power-On Test LAN Hardware Not Found Front Panel No Response Front Panel Returned Invalid Error Number Dual Port SRAM Address Error Front Panel Bad Command Front Panel FEPROM Sum-check Error Front Panel Bad Command Front Panel SRAM Data Error

No.
1021 1023 1040 1042 1044 1046 1052 1061 1080 1082 1084 1086 1088 1100 1102 1104 1111 1113 1121 1123 1130 1132 1140 1142 1144

Description
SRAM Error SRAM Error RS232 DCD RS232 DSR RS232 Rx too many bytes RS232 Rx too few bytes HP-IB Driver Chip Real Time Clock Not Ticking correctly Internal Printer Keyboard Processor External RAM Front Panel No Response Front Panel Invalid Error Returned Cannot Detect Front Panel Printer No Disk in Drive Disk Write Fail Disk Verify Read/Write Fail LAN Returned Invalid Error Number Lan Fitted No Test Result Front Panel Bad Command Dual Port SRAM Data Error Front Panel No Response Front Panel Returned Invalid Error Number Front Panel No Response Front Panel Returned Invalid Error Number Front Panel SRAM Address Error

C-1

Self Test Fail Numbers

Table C-1 No.

1145 1151 1153 1155 1160 1162 1164

Processor Self Test Description

Front Panel Address Range Invalid Front Panel Bad Command Front Panel VRAM Data Error Front Panel Address Range Invalid Front Panel No Response Front Panel Returned Invalid Error Number Front Panel Internal Loopback not Reset

No.
1150 1152 1154 1156 1161 1163 1166

Description
Front Panel No Response Front Panel Returned Invalid Error Number Front Panel Stored Fonts Corrupted Front Panel VGA Controller Error Front Panel Bad Command Front Panel UART Tx/Rx Error Internal Front Panel UART Tx/Rx Error External

Table C-2 No.

2010 2014 2021 2030 2034 2041 2050 2054 2061 2070 2074 2081 2090 2094 2101

PDH Tests, Option UKK (75 Unbal Back to Back) Description

140 Mb/s, PRBS - Signal Loss 140 Mb/s, PRBS - Errors 34 Mb/s, PRBS - Pattern loss 8 Mb/s, PRBS - Signal Loss 8 Mb/s, PRBS - Errors 2 Mb/s, HDB3, PRBS - Pattern loss 2 Mb/s, AMI, PRBS - Signal Loss 2 Mb/s, AMI, PRBS - Errors 704 kb/s, HDB3, PRBS - Pattern loss 704 kb/s, AMI, PRBS - Signal Loss 704 kb/s, AMI, PRBS - Errors 140 Mb/s, WORD - Pattern loss 140 Mb/s, AIS WORD - Signal Loss 140 Mb/s, AIS WORD - Errors 704 kb/s, AMI, WORD - Pattern Loss

No.
2011 2020 2024 2031 2040 2044 2051 2060 2064 2071 2080 2084 2091 2100 2104

Description
140 Mb/s, PRBS - Pattern loss 34 Mb/s, PRBS - Signal Loss 34 Mb/s, PRBS - Errors 8 Mb/s, PRBS - Pattern loss 2 Mb/s, HDB3, PRBS - Signal Loss 2 Mb/s, HDB3, PRBS - Errors 2 Mb/s, AMI, PRBS - Pattern loss 704 kb/s, HDB3, PRBS - Signal Loss 704 kb/s, HDB3, PRBS - Errors 704 kb/s, AMI, PRBS - Pattern loss 140 Mb/s, WORD - Signal Loss 140 Mb/s, WORD - Errors 140 Mb/s, AIS WORD - Pattern Loss 704 kb/s, AMI, WORD - Signal Loss 704 kb/s, AMI, WORD - Errors

C-2

Self Test Fail Numbers

Table C-3
No. 2110 2114 2121

PDH Tests, Option UKK (120 Bal Back to Back)

Description 2 Mb/s, HDB3, PRBS - Signal Loss 2 Mb/s, HDB3, PRBS - Errors 704 kb/s, AMI, WORD - Pattern Loss No. 2111 2120 2124 Description 2 Mb/s, HDB3, PRBS - Pattern Loss 704 kb/s, AMI, WORD - Signal Loss 704 kb/s, AMI, WORD - Errors

Table C-4 No.

2130 2134 2143 2150 2154 2163 2170 2174 2183 2190 2194 2203 2210 2214 2223 2230 2234

PDH Tests, Option UKK (Offset, Frequency Measurement) Description

704 kHz, 0 ppm - Signal Loss 704 kHz, 0 ppm - Frequency High 2 MHz, 0 ppm - Frequency Low 8 MHz, 0 ppm - Signal Loss 8 MHz, 0 ppm - Frequency High 8 MHz, -100 ppm - Frequency Low 8 Mb/s, +100 ppm - Signal Loss 8 Mb/s, +100 ppm - Frequency High 34 MHz, 0 ppm - Frequency Low 34 MHz, -100 ppm - Signal Loss 34 MHz, -100 ppm - Frequency High 34 MHz, +100 ppm - Frequency Low 140 MHz, 0 ppm - Signal Loss 140 MHz, 0 ppm - Frequency High 140 MHz, -100 ppm - Frequency Low 140 MHz, +100 ppm - Signal Loss 140 MHz, +100 ppm - Frequency High

No.
2133 2140 2144 2153 2160 2164 2173 2180 2184 2193 2200 2204 2213 2220 2224 2233

Description
704 kHz, 0 ppm - Frequency Low 2 MHz, 0 ppm - Signal Loss 2 MHz, 0 ppm - Frequency High 8 MHz, 0 ppm - Frequency Low 8 MHz, -100 ppm - Signal Loss 8 MHz, -100 ppm - Frequency High 8 MHz, +100 ppm - Frequency Low 34 MHz, 0 ppm - Signal Loss 34 MHz, 0 ppm - Frequency High 34 MHz, -100 ppm - Frequency Low 34 MHz, +100 ppm - Signal Loss 34 MHz, +100 ppm - Frequency High 140 MHz, 0 ppm - Frequency Low 140 MHz, -100 ppm - Signal Loss 140 MHz, -100 ppm - Frequency High 140 MHz, +100 ppm - Frequency Low

C-3

Self Test Fail Numbers

Table C-5 No.

2243 2253 2263

PDH Tests, Option UKK (Error Add/Error Count) Description

140 Mb/s, No Error - Count Low 140 Mb/s, 5 Errors - Count Low 140 Mb/s, Error All - Count Low

No.
2244 2254 2264

Description
140 Mb/s, No Error - Count High 140 Mb/s, 5 Errors - Count High 140 Mb/s, Error All - Count High

Table C-6 No.

2273 2283 2293 2303 2313

PDH Tests, Option UKK (Clock Recovery) Description

704 kb/s - Result Low 2 Mb/s - Result Low 8 Mb/s - Result Low 34 Mb/s - Result Low 140 Mb/s - Result Low

No.
2274 2284 2294 2304 2314

Description
704 kb/s - Result High 2 Mb/s - Result High 8 Mb/s - Result High 34 Mb/s - Result High 140 Mb/s - Result High

Table C-7 No.

2320 2335 2341 2345 2351 2355 2361 2365

PDH Tests, Option UKK (FAS Word) Description

FAS register write error FAS 2 Mb/s - Not Locked FAS Word 8 Mb/s - Not Locked Non FAS Word 8 Mb/s - Locked FAS Word 34 Mb/s - Not Locked Non FAS Word 34 Mb/s - Locked FAS Word 140 Mb/s - Not Locked Non FAS Word 140 Mb/s - Locked

No.
2330 2340 2344 2350 2354 2360 2364

Description
FAS 2 Mb/s - Signal Loss FAS 8 Mb/s - Signal Loss FAS Word 8 Mb/s - Errors FAS Word 34 Mb/s - Signal Loss FAS Word 34 Mb/s - Errors FAS Word 140 Mb/s - Signal Loss FAS Word 140 Mb/s - Errors

Table C-8 No.

2370

PDH Tests, Option UKK & UH3 (Binary Interface) Description

140 Mb/s, PRBS23, Error Add On - Loss of Signal

No.
2372

Description
VCXO not settled

C-4

Self Test Fail Numbers

Table C-8 No.

2373 2380 2383 2390 2393 2400 2403 2410 2413 2420 2423 2430 2433 2440 2443 2450 2453 2460 2463 2470 2473 2480 2483 2490 2493

PDH Tests, Option UKK & UH3 (Binary Interface) Description

140 Mb/s, PRBS23, Error Add On - Result Low 140 Mb/s, PRBS23, Error Add Off - Loss of Signal 140 Mb/s, PRBS23, Error Add Off - Result Low 34 Mb/s, PRBS23, Error Add On - Loss of Signal 34 Mb/s, PRBS23, Error Add On - Result Low 34 Mb/s, PRBS23, Error Add Off - Loss of Signal 34 Mb/s, PRBS23, Error Add Off - Result Low 8 Mb/s, PRBS15, Error Add On - Loss of Signal 8 Mb/s, PRBS15, Error Add On - Result Low 8 Mb/s, PRBS15, Error Add Off - Loss of Signal 8 Mb/s, PRBS15, Error Add Off - Result Low 2 Mb/s, PRBS15, Error Add On - Loss of Signal 2 Mb/s, PRBS15, Error Add On - Result Low 2 Mb/s, PRBS15, Error Add Off - Loss of Signal 2 Mb/s, PRBS15, Error Add Off - Result Low 704 kb/s, PRBS15, Error Add On - Loss of Signal 704 kb/s, PRBS15, Error Add On - Result Low 704 kb/s, PRBS15, Error Add Off - Loss of Signal 704 kb/s, PRBS15, Error Add Onff- Result Low 140 Mb/s, Word, Error Add Off - Loss of Signal 140 Mb/s, Word, Error Add Off - Result Low 704 kb/s, Word, Error Add Off - Loss of Signal 704 kb/s, Word, Error Add Off - Result Low 34 Mb/s, Word, Error Add Off - Loss of Signa 34 Mb/s, Word, Error Add Off - Result Low

No.
2374 2382 2384 2392 2394 2402 2404 2412 2414 2422 2424 2432 2434 2442 2444 2452 2454 2462 2464 2472 2474 2482 2484 2492 2494

Description
140 Mb/s, PRBS23, Error Add On - Result High VCXO not settled 140 Mb/s, PRBS23, Error Add Off - Result High VCXO not settled 34 Mb/s, PRBS23, Error Add On - Result High VCXO not settled 34 Mb/s, PRBS23, Error Add Off - Result High VCXO not settled 8 Mb/s, PRBS15, Error Add On - Result High VCXO not settled 8 Mb/s, PRBS15, Error Add Off - Result High VCXO not settled 2 Mb/s, PRBS15, Error Add On - Result High VCXO not settled 2 Mb/s, PRBS15, Error Add Off - Result High VCXO not settled 704 kb/s, PRBS15, Error Add On - Result High VCXO not settled 704 kb/s, PRBS15, Error Add Off - Result High VCXO not settled 140 Mb/s, Word, Error Add Off - Result High VCXO not settled 704 kb/s, Word, Error Add Off - Result High VCXO not settled 34 Mb/s, Word, Error Add Off - Result High

Table C-9 No.

3010

SPDH Tests, Option UKJ (Line Code 75 Unbal Back to Back) Description
140 Mb/s, PRBS - Signal Loss

No.
3011

Description
140 Mb/s, PRBS - Pattern loss

C-5

Self Test Fail Numbers

Table C-9 No.

3014 3021 3030 3034 3041 3050 3054 3061 3070 3074

SPDH Tests, Option UKJ (Line Code 75 Unbal Back to Back) Description
140 Mb/s, PRBS - Errors 140 Mb/s, AIS WORD - Pattern loss 140 Mb/s, WORD - Signal Loss 140 Mb/s, WORD - Errors 34 Mb/s, PRBS - Pattern loss 8 Mb/s, PRBS - Signal Loss 8 Mb/s, PRBS - Errors 2 Mb/s, HDB3, PRBS - Pattern loss 2 Mb/s, AMI, PRBS - Signal Loss 2 Mb/s, AMI, PRBS - Errors

No.
3020 3024 3031 3040 3044 3051 3060 3064 3071

Description
140 Mb/s, AIS WORD - Signal Loss 140 Mb/s, AIS WORD - Errors 140 Mb/s, WORD - Pattern loss 34 Mb/s, PRBS - Signal Loss 34 Mb/s, PRBS - Errors 8 Mb/s, PRBS - Pattern loss 2 Mb/s, HDB3, PRBS - Signal Loss 2 Mb/s, HDB3, PRBS - Errors 2 Mb/s, AMI, PRBS - Pattern loss

Table C-10 No.

3080 3084 3091

SPDH Tests, Option UKJ (Line Code 120 Bal Back to Back) Description
2 Mb/s, HDB3, PRBS - Signal Loss 2 Mb/s, HDB3, PRBS - Errors 2 Mb/s, AMI, PRBS - Pattern Loss

No.
3081 3090 3094

Description
2 Mb/s, HDB3, PRBS - Pattern Loss 2 Mb/s, AMI, PRBS - Signal Loss 2 Mb/s, AMI, PRBS - Errors

Table C-11 No.

3100 3103 3110 3113 3120 3123 3130 3133

SPDH Tests, Option UKJ (Offset, Frequency Measurement) Description

140 MHz, 0 ppm - Signal Loss 140 MHz, 0 ppm - Frequency Low 140 MHz, +100 ppm - Signal Loss 140 MHz, +100 ppm - Frequency Low 140 MHz, -100 ppm - Signal Loss 140 MHz, -100 ppm - Frequency Low 34 MHz, 0 ppm - Signal Loss 34 MHz, 0 ppm - Frequency Low

No.
3102 3104 3112 3114 3122 3124 3132 3134

Description
140 MHz, 0 ppm - VXCO not settled 140 MHz, 0 ppm - Frequency High 140 MHz, +100 ppm - VXCO not settled 140 MHz, +100 ppm - Frequency High 140 MHz, -100 ppm - VXCO not settled 140 MHz, -100 ppm - Frequency High 34 MHz, 0 ppm - VXCO not settled 34 MHz, 0 ppm - Frequency High

C-6

Self Test Fail Numbers

Table C-11 No.

3140 3143 3150 3153 3160 3163 3170 3173 3180 3183 3190 3193 3200 3203 3210 3213

SPDH Tests, Option UKJ (Offset, Frequency Measurement) Description

34 MHz, +100 ppm - Signal Loss 34 MHz, +100 ppm - Frequency Low 34 MHz, -100 ppm - Signal Loss 34 MHz, -100 ppm - Frequency Low 8 MHz, 0 ppm - Signal Loss 8 MHz, 0 ppm - Frequency Low 8 MHz, +100 ppm - Signal Loss 8 MHz, +100 ppm - Frequency Low 8 MHz, -100 ppm - Signal Loss 8 MHz, -100 ppm - Frequency Low 2 MHz, 0 ppm - Signal Loss 2 MHz, 0 ppm - Frequency Low 2 MHz, +100 ppm - Signal Loss 2 MHz, +100 ppm - Frequency Low 2 MHz, -100 ppm - Signal Loss 2 MHz, -100 ppm - Frequency Low

No.
3142 3144 3152 3154 3162 3164 3172 3174 3182 3184 3192 3194 3202 3204 3212 3214

Description
34 MHz, +100 ppm - VXCO not settled 34 MHz, +100 ppm - Frequency High 34 MHz, -100 ppm - VXCO not settled 34 MHz, -100 ppm - Frequency High 8 MHz, 0 ppm - VXCO not settled 8 MHz, 0 ppm - Frequency High 8 MHz, +100 ppm - VXCO not settled 8 MHz, +100 ppm - Frequency High 8 MHz, -100 ppm - VXCO not settled 8 MHz, -100 ppm - Frequency High 2 MHz, 0 ppm - VXCO not settled 2 MHz, 0 ppm - Frequency High 2 MHz, +100 ppm - VXCO not settled 2 MHz, +100 ppm - Frequency High 2 MHz, -100 ppm - VXCO not settled 2 MHz, -100 ppm - Frequency High

Table C-12 No.

3223 3226 3234 3243 3246 3254 3263 3266 3274

SPDH Tests, Option UKJ (34 Mb/s, Error Add/Error Count) Description
Framed, Code, No Error - Count Low Framed, Code, No Error - Invalid result Framed, Code, 1 Error - Count High Framed, Code, 1 in 10 - Count Low Framed, Code, 1 in 103 - Invalid result Framed, Frame, No Error - Count High Framed, Code, 1 Error - Count Low Framed, Code, 1 Error - Invalid result Framed, Code, 1 in 103 - Count High
3

No.
3224 3233 3236 3244 3253 3256 3264 3273 3276

Description
Framed, Code, No Error - Count High Framed, Code, 1 Error - Count Low Framed, Code, No Error - Invalid result Framed, Code, 1 in 103 - Count High Framed, Frame, No Error - Count Low Framed, Frame, No Error - Invalid result Framed, Code, 1 Error - Count High Framed, Code, 1 in 103 - Count Low Framed, Code, 1 in 103 - Invalid result

C-7

Self Test Fail Numbers

Table C-12 No.

3283 3286 3294 3303 3306 3314 3323 3326 3334 3343 3346 3354 3363 3366

SPDH Tests, Option UKJ (34 Mb/s, Error Add/Error Count) Description
Framed, Bit, No Error - Count Low Framed, Bit, No Error - Invalid result Framed, Bit, 1 Error - Count High Framed, Bit, 1 in 10 Error - Count Low Framed, Bit, 1 in 103 - Error - Invalid result Structured, Frame, No Error - Count High Structured, Frame, 1 Error - Count Low Structured, Frame, 1 Error - Invalid result Structured, Frame, 1 in 103 Error - Count High Structured, Bit, No Error - Count Low Structured, Bit, No Error - Invalid result Structured, Bit, 1 Error - Count High Structured, Bit, 1 in 103Error - Count Low Structured, Bit, 1 in 103 - Error - Invalid result
3

No.
3284 3293 3296 3304 3313 3316 3324 3333 3336 3344 3353 3356 3364

Description
Framed, Bit, No Error - Count High Framed, Frame, 1 Error - Count Low Framed, Bit, 1 Error - Invalid result Framed, Bit, 1 in 103Error - Count High Structured, Frame, No Error - Count Low Structured, Frame, No Error - Invalid result Structured, Frame, 1 Error - Count High Structured, Frame, 1 in 103 Error - Count Low Structured, Frame, 1 in 103 Error- Invalid result Structured, Bit, No Error - Count High Structured, Frame, 1 Error - Count Low Structured, Bit, 1 Error - Invalid result Structured, Bit, 1 in 103Error - Count High

Table C-13 No. 3377

3397 3408 3427 3437

SPDH Tests, Option UKJ (Framing/Unframed) Description 140 Mb/s Unframed - Frame Loss
2 Mb/s Unframed - Frame Loss 2Mb/s, PCM30 - MultiFrame Loss 2Mb/s, PCM30CRC - Frame Loss 2Mb/s, PCM31CRC - Frame Loss

No. 3387
3407 3417 3428 3447

Description 140 Mb/s Framed - Frame Loss

2Mb/s, PCM30 - Frame Loss 2Mb/s, PCM31 - Frame Loss 2Mb/s, PCM30CRC - MultiFrame Loss 2 Mb/s, Drop - Frame Loss

Table C-14 No.

3451 3461

SPDH Tests, Option UKJ (Structured Payloads) Description

140 Mb/s ; 34 Mb/s - Pattern Loss 140 Mb/s ; 8 Mb/s - Pattern Loss

No.
3454 3464

Description
140 Mb/s ; 34 Mb/s - Errors 140 Mb/s ; 8 Mb/s - Errors

C-8

Self Test Fail Numbers

Table C-14 No.

3471 3481 3491

SPDH Tests, Option UKJ (Structured Payloads) Description

140 Mb/s ; 2 Mb/s - Pattern Loss 140 Mb/s ; 64 kb/s - Pattern Loss 140 Mb/s ; N X 64 kb/s (odd channels) - Pattern Loss

No.
3474 3484 3494

Description
140 Mb/s ; 2 Mb/s - Errors 140 Mb/s ; 64 kb/s - Errors 140 Mb/s ; N X 64 kb/s (odd channels)- Errors

3501

140 Mb/s ; N X 64 kb/s (even channels) - Pattern Loss

3504

140 Mb/s ; N X 64 kb/s (even channels)- Errors

3511 3521 3531

34 Mb/s ; 8 Mb/s - Pattern Loss 34 Mb/s ; 2 Mb/s - Pattern Loss 8 Mb/s ; 2 Mb/s - Pattern Loss

3514 3524 3534

34 Mb/s ; 8 Mb/s - Errors 34 Mb/s ; 2 Mb/s - Errors 8 Mb/s ; 2 Mb/s - Errors

Table C-15 No.

3541 3551 3561 3571 3581 3591 3601 3611 3621 3631

SPDH Tests, Option UKJ (Patterns) Description

140 Mb/s, Inverted PRBS9 - Pattern Loss 140 Mb/s, PRBS11 - Pattern Loss 140 Mb/s, Inverted PRBS15 - Pattern Loss 140 Mb/s, PRBS23 - Pattern Loss 140 Mb/s, WORD - Pattern Loss 2 Mb/s, PRBS9 - Pattern Loss 2 Mb/s, Inverted PRBS11 - Pattern Loss 2 Mb/s, PRBS15 - Pattern Loss 2 Mb/s, Inverted PRBS23 - Pattern Loss 2 Mb/s, WORD - Pattern Loss

No.
3544 3554 3564 3574 3584 3594 3604 3614 3624 3634

Description
140 Mb/s, Inverted PRBS9 - Errors 140 Mb/s, PRBS11 - Errors 140 Mb/s, Inverted PRBS15 - Errors 140 Mb/s, PRBS23 - Errors 140 Mb/s, WORD - Errors 2 Mb/s, PRBS9 - Errors 2 Mb/s, Inverted PRBS11 - Errors 2 Mb/s, PRBS15 - Errors 2 Mb/s, Inverted PRBS23 - Errors 2 Mb/s, WORD - Errors

Table C-16 No.

3640 3642

SPDH Tests, Option UKJ (Drop/Insert) Description

Insert Port Loss of Signal Drop Port Excess Frequency Offset

No.
3641

Description
Insert Port Excess Frequency Offset

C-9

Self Test Fail Numbers

Table C-17 No.

3651 3654 3663 3671 3674 3683 3691 3694 3703 3711 3714 3723

SPDH Tests, Option UKJ (Round Trip Delay) Description

140 Mb/s, 1s - Pattern Loss 140 Mb/s, 1s - Result High 140 Mb/s, 2s - Result Low 34 Mb/s, 1s - Pattern Loss 34 Mb/s, 1s - Result High 34 Mb/s, 2s - Result Low 8 Mb/s, 1s - Pattern Loss 8 Mb/s, 1s - Result High 8 Mb/s, 2s - Result Low 2 Mb/s, 1s - Pattern Loss 2 Mb/s, 1s - Result High 2 Mb/s, 2s - Result Low

No.
3653 3661 3664 3673 3681 3684 3693 3701 3704 3713 3721 3724

Description
140 Mb/s, 1s - Result Low 140 Mb/s, 2s - Pattern Loss 140 Mb/s, 2s - Result High 34 Mb/s, 1s - Result Low 34 Mb/s, 2s - Pattern Loss 34 Mb/s, 2s - Result High 8 Mb/s, 1s - Result Low 8 Mb/s, 2s - Pattern Loss 8 Mb/s, 2s - Result High 2 Mb/s, 1s - Result Low 2 Mb/s, 2s - Pattern Loss 2 Mb/s, 2s - Result High

Table C-18 No.

3730 3733 3740 3743 3750 3753 3760 3763 3770 3773 3780 3783 3790

PDH Tests, Options UKJ & UH3 (Binary Interface) Description

140 Mb/s, PRBS23, Error Add On - Loss of Signal 140 Mb/s, PRBS23, Error Add On - Result Low 140 Mb/s, PRBS23, Error Add Off - Loss of Signal 140 Mb/s, PRBS23, Error Add Off - Result Low 34 Mb/s, PRBS23, Error Add On - Loss of Signal 34 Mb/s, PRBS23, Error Add On - Result Low 34 Mb/s, PRBS23, Error Add Off - Loss of Signal 34 Mb/s, PRBS23, Error Add Off - Result Low 8 Mb/s, PRBS15, Error Add On - Loss of Signal 8 Mb/s, PRBS15, Error Add On - Result Low 8 Mb/s, PRBS15, Error Add Off - Loss of Signal 8 Mb/s, PRBS15, Error Add Off - Result Low 2 Mb/s, PRBS15, Error Add On - Loss of Signal

No.
3732 3734 3742 3744 3752 3754 3762 3764 3772 3774 3782 3784 3792

Description
VCXO not settled 140 Mb/s, PRBS23, Error Add On - Result High VCXO not settled 140 Mb/s, PRBS23, Error Add Off - Result High VCXO not settled 34 Mb/s, PRBS23, Error Add On - Result High VCXO not settled 34 Mb/s, PRBS23, Error Add Off - Result High VCXO not settled 8 Mb/s, PRBS15, Error Add On - Result High VCXO not settled 8 Mb/s, PRBS15, Error Add Off - Result High VCXO not settled

C-10

Self Test Fail Numbers

Table C-18 No.

3793 3800 3803 3810 3813 3820 3823

PDH Tests, Options UKJ & UH3 (Binary Interface) Description

2 Mb/s, PRBS15, Error Add On - Result Low 2 Mb/s, PRBS15, Error Add Off - Loss of Signal 2 Mb/s, PRBS15, Error Add Off - Result Low 140 Mb/s, Word, Error Add Off - Loss of Signal 140 Mb/s, Word, Error Add Off - Result Low 34 Mb/s, Word, Error Add Off - Loss of Signa 34 Mb/s, Word, Error Add Off - Result Low

No.
3794 3802 3804 3812 3814 3822 3824

Description
2 Mb/s, PRBS15, Error Add On - Result High VCXO not settled 2 Mb/s, PRBS15, Error Add Off - Result High VCXO not settled 140 Mb/s, Word, Error Add Off - Result High VCXO not settled 34 Mb/s, Word, Error Add Off - Result High

Table C-19 No.

721 731

SDH Tests Option A3R (STM-1) Description

Sync Loss Monitor, False Sync

No.
724 741

Description
Bit Errors Rx, loss of Signal

Table C-20 No.

751 754 763 771 774 791

SDH Tests Option A3R (STM-1 Frequency Offset) Description

STM-1 - Signal Loss STM-1, 0 ppm - Frequency High STM-1, +100 ppm - Offset Low STM-1, -100 ppm - Signal Loss STM-1 -100 ppm - Offset High Clock Ref, false lock

No.
753 761 764 773 781

Description
STM-1, 0 ppm - Frequency Low STM-1, +100 ppm - Signal Loss STM-1, +100 ppm - Offset High STM-1, -100 ppm - Offset Low Clock Ref, Clock Loss

Table C-21 No.

7101

SDH Tests Option A3R (STM-1, Overhead) Description

Overhead processor failed

No.
7102

Description
Path Overhead fail

C-11

Self Test Fail Numbers

Table C-21 No.

7104 7121 7124 7133 7141 7144 7153 7161 7164 7171 7173 7175 7177 7179

SDH Tests Option A3R (STM-1, Overhead) Description

section Overhead fail B1 Error Add, Sync Loss B1 Errors, Result High B2 Errors, Result Low B3 Error Add, Sync Loss B3 Errors, Result High MS FEBE Errors, Result Low PIEC Error Add, Sync Loss PIEC Errors, Result High Error Add Off - Loss of Frame Error Add 2 in 4 - Loss of Frame Error Add 4 in 4 - Frame Sync Error Add 2 in 4 - Loss of Frame Error Add Off - Loss of Frame 7172 7174 7176 7178 Error Add 1 in 4 - Loss of Frame Error Add 3 in 4 - Loss of Frame Error Add 3 in 4 - Frame Sync Error Add 1 in 4 - Loss of Frame

No.
7111 7123 7131 7134 7143 7151 7154 7163

Description
VC4 J1 fail B1 Errors, Result Low B2 Error Add, Sync Loss B2 Errors, Result High B3 Errors, Result Low MS FEBE Error Add, Sync Loss MS FEBE Errors, Result High PIEC Errors, Result Low

Table C-22 No.

7181 7184 7193 7201 7204

SDH Tests Option A3R (140 Mb/s Payload) Description

Bit Errors - Sync Loss Bit Errors - Result High Error Add 1E3, Offset +100 ppm - Result Low Error Add 1E3, Offset -100 ppm - Sync Loss Error Add 1E3, Offset -100 ppm - Result High

No.
7183 7191 7194 7203

Description
Bit Errors - Result Low Error Add 1E3, Offset +100 ppm - Sync Loss Error Add 1E3, Offset +100 ppm - Result High Error Add 1E3, Offset -100 ppm - Result Low

Table C-23 No.

7211 7223

SDH Tests Option A3R (TU3 Payload) Description

VC3 J1 Fail VC3 B3 Single Error - Result Low

No.
7221 7224

Description
VC3 B3 Single Error - Sync Loss VC3 B3 Single Error - Result High

C-12

Self Test Fail Numbers

Table C-23
7231 7234 7243 7251 7262

SDH Tests Option A3R (TU3 Payload)

VC3 FEBE Single Error - Sync Loss VC3 FEBE Single Error - Result High Payload Bit Single Error - Result Low Background Pattern - RX False Sync Background Pattern - TUG 3 Pattern Loss 7233 7241 7244 7261 VC3 FEBE Single Error - Result Low Payload Bit Single Error - Sync Loss Payload Bit Single Error - Result High Background Pattern - TUG 1 Pattern Loss

Table C-24 No.

7271 7294 7314 7334 7354 7374 7394 7411 7414 7423 7431 7434 7433

SDH Tests Option A3R (TU12 Payload Overhead) Description

Async - A1,A2 Sync Loss Async - B2 errors Async - FEBE Errors Async - V5 FEBE Errors Floating Byte - B1 Errors Floating Byte - B3 Errors Floating Byte - V5 BIP2 Errors Async V5 BIP2 Add - Sync Loss Async V5 BIP2 Add - Result High Async V5 FEBE Add - Result Low Async Payload Bit Add - Sync Loss Async Payload Bit Add - Result High Floating Byte Payload Bit Add - Result Low

No.
7284 7304 7324 7341 7364 7384 7404 7413 7421 7424 7433 7441 7434

Description
Async - B1 Errors Async - B3 Errors Async - V5 BIP2 Errors Floating Byte - A1,A2 Sync Loss Floating Byte - B2 Errors Floating Byte - FEBE Errors Floating Byte - V5 BIP2 Errors Async V5 BIP2 Add - Result Low Async V5 FEBE Add - Sync Loss Async V5 FEBE Add - Result High Async Payload Bit Add - Result Low Floating Byte Payload Bit Add - Sync Loss Floating Byte Payload Bit Add - Result High

Table C-25 No.

7451 7454 7463 7471 7474

SDH Tests Option A3R (Payload Pattern) Description

140 Mb/s, PRBS23 - Sync Loss 140 Mb/s, PRBS23 - Result High TU3, PRBS15 - Result Low TU12, WORD - Sync Loss TU12, WORD - Result High

No.
7453 7461 7464 7473 7481

Description
140 Mb/s, PRBS23 - Result Low TU3, PRBS15 - Sync Loss TU3, PRBS15 - Result High TU12, WORD - Result Low TU2, PRBS9 - Sync Loss

C-13

Self Test Fail Numbers

Table C-25
7483 7491

SDH Tests Option A3R (Payload Pattern)

TU2, PRBS9 - Result Low Background PRBS9 - False Pattern Sync TUG1 7484 7501 TU2, PRBS9 - Result High Background PRBS9 - False Pattern Sync TUG2

Table C-26 No.

7511 7514

SDH Tests Option A3R (TU12 Payload Bit Error Add) Description
Sync Loss Result High

No.
7513

Description
Result Low

Table C-27 No.

7521 7544 7564 7574 7584 7601 7624 7644 7654 7664 7681 7704 7724 7734 7744

SDH Tests Option A3R (Freq Offset/Pointer Movements) Description

140 Mb/s, A1,A2 - Sync Loss 140 Mb/s, B1 - Errors 140 Mb/s, B3 - Errors 140 Mb/s, +100 ppm - Implied VC Offset High 140 Mb/s, -100 ppm - Implied VC Offset High TU3, H1,H2 - Loss of Pointer TU3, B2 - Errors TU3, TU BIP - Errors TU3, +100 ppm - Implied VC Offset High TU3, -100 ppm - Implied VC Offset High TU12, H1,H2 - Loss of Pointer TU12, B2 - Errors TU12, TU BIP - Errors TU12, +100 ppm - Implied VC Offset High TU12, -100 ppm - Implied VC Offset High

No.
7531 7554 7573 7583 7591 7614 7634 7653 7663 7671 7694 7714 7733 7743

Description
140 Mb/s, H1,H2 - Loss of Pointer 140 Mb/s, B2 - Errors 140 Mb/s, +100 ppm - Implied VC Offset Low 140 Mb/s, -100 ppm - Implied VC Offset Low TU3, A1,A2 - Sync Loss TU3, B1 - Errors TU3, B3 - Errors TU3, +100 ppm - Implied VC Offset Low TU3, -100 ppm - Implied VC Offset Low TU12, A1,A2 - Sync Loss TU12, B1 - Errors TU12, B3 - Errors TU12, +100 ppm - Implied VC Offset Low TU12, -100 ppm - Implied VC Offset Low

C-14

Self Test Fail Numbers

Table C-28 No.

7751 7771

SDH Tests Option A3R (Thru Mode and DCC) Description

Thru Mode - H4 Frame Sync Loss MS DCC Loopback Fail

No.
7761

Description
RS DCC Loopback Fail

Table C-29 No.

7781 7791 7801

SDH Tests Option A3R (Bulk Filled Payload Pattern) Description

AU-4 Bulk - False Sync TU-3 Bulk - False Sync TU-12 Bulk - False Sync

No.
7782 7792 7802

Description
AU-4 Bulk - Sync Loss TU-3 Bulk - Sync Loss TU-12 Bulk - Sync Loss

Table C-30 No.

7811 7821 7831 7841 7851 7861 7871

SDH Tests Option A3R (DS3/DS1 Framing) Description

DS3 Unframed - False Sync DS3 M23 - False Sync DS3 C-Bit - False Sync DS1 Unframed - False Sync DS1 D4 - False Sync DS1 ESF - False Sync DS1 SLC-96 - False Sync

No.
7812 7822 7832 7842 7852 7862 7872

Description
DS3 Unframed - Sync Loss DS3 M23 - Sync Loss DS3 C-Bit - Sync Loss DS1 Unframed - Sync Loss DS1 D4 - Sync Loss DS1 ESF - Sync Loss DS1 SLC-96 - Sync Loss

Table C-31 No.

7881

SDH Tests Option A3R (STM-1 J0 Message) Description

No Errors

No.

Description

C-15

Self Test Fail Numbers

Table C-32 No.

7891 7894 7903 7911 7914 7923 7931 7934

SDH Tests Option A3R (Payload Patterns) Description

C-4 Bulk, PRBS11 - Sync Loss C-4 Bulk, PRBS11 - Result High C-3 Bulk, PRBS9 - Result Low C-12 Bulk, Word - Sync Loss C-12 Bulk, Word - Result High DS3 Unframed PRBS20 - Result Low DS1 Unframed QRSS - Sync Loss DS1 Unframed QRSS - Result High

No.
7893 7901 7904 7913 7921 7924 7933

Description
C-4 Bulk, PRBS11 - Result Low C-3 Bulk, PRBS9 - Sync Loss C-3 Bulk, PRBS9 - Result High C-12 Bulk, Word - Result Low DS3 Unframed PRBS20 - Sync Loss DS3 Unframed PRBS20 - Result High DS1 Unframed QRSS - Result Low

Table C-33 No.

7945 7947 7961 7976 7981

SDH Tests Option A3R (Mixed Payloads) Description

TUG3 No 2,TU-3 Mapping - TU AIS Alarm TUG3 No 2,TU-3 Mapping - TU LOP Alarm TUG3 No 3,TU-3 Mapping - Sync Loss TUG3 No 1,TU-12Mapping - TU FERF Alarm TUG3 No 2, TU-12 Mapping - Sync Loss

No.
7946 7951 7975 7977 7991

Description
TUG3 No 2,TU-3 Mapping - TU FERF Alarm TUG3 No 1,TU-3 Mapping - Sync Loss TUG3 No 1,TU-12Mapping - TU AIS Alarm TUG3 No 1,TU-12Mapping - TU LOP Alarm TUG3 No 3,TU-12Mapping - Sync Loss

Table C-34 No.

22001 22011

SDH Tests Option A3R (TU-12 Background Pattern) Description

Unframed, PRBS9 - F/G Pattern Loss ESF, PRBS15 - F/G Pattern Loss

No.
22002 22012

Description
D4, PRBS9 - B/G Pattern Loss D4, PRBS15- B/G Pattern Loss

Table C-35 No.

22021

SDH Tests Option A3R (Service Disruption Test) Description

Sync Loss

No.
22025

Description
Shortest Burst Error

C-16

Self Test Fail Numbers

Table C-35 No.

22026 22035 22037 22046

SDH Tests Option A3R (Service Disruption Test) Description

Longest Burst Error Shortest Burst Error Last Burst Error Longest Burst Error

No.
22027 22036 22045 22047

Description
Last Burst Error Longest Burst Error Shortest Burst Error Last Burst Error

Table C-36 No.

22051 22064 22081 22091 22101 22111 22114 22122 22132 22142 22153 22161 22164 22173 22181 22184 22193 22201 22204 22213 22221 22224

SDH Tests Option A3R (STM-0) Description

STM-0 Loopback - Signal Present STM-0 Loopback - Result High Pulse Shape HI - Sync Loss Pulse Shape LO - Sync Loss Pulse Shape XCONNECT - Sync Loss Frequency Measurement - Signal Loss Frequency Measurement - Result High C-3 Bulk Framing - Sync Loss TU-12 Bulk Framing - Sync Loss DS1 Unframed - Sync Loss B1 Error Add - Result Low B2 Error Add - Sync Loss B2 Error Add - Result High B3 Error Add - Result Low MS FEBE Error Add - Sync Loss MS FEBE Error Add - Result High IEC Error Add - Result Low 34 Mb/s Mapping, Offset +100ppm - Sync Loss 34 Mb/s Mapping, Offset +100ppm - Result High 34 Mb/s Mapping, Offset -100ppm - Result Low DS3 Mapping, Offset +100ppm - Sync Loss DS3 Mapping, Offset +100ppm - Result High

No.
22061 22071 22084 22094 22104 22113 22121 22131 22141 22151 22154 22163 22171 22174 22183 22191 22194 22203 22211 22214 22223 22231

Description
STM-0 Loopback - Sync Loss STM-0 Loopback - False Signal Present Pulse Shape HI - Result High Pulse Shape LO - Result High Pulse Shape XCONNECT - Result High Frequency Measurement - Sync Loss C-3 Bulk Framing - False Sync TU-2 Bulk Framing - False Sync DS1 Unframed - False Sync B1 Error Add - Sync Loss B1 Error Add - Result High B2 Error Add - Result Low B3 Error Add - Sync Loss B3 Error Add - Result High MS FEBE Error Add - Result Low IEC Error Add - Sync Loss IEC Error Add - Result High 34 Mb/s Mapping, Offset +100ppm - Result Low 34 Mb/s Mapping, Offset -100ppm - Sync Loss 34 Mb/s Mapping, Offset -100ppm - Result High DS3 Mapping, Offset +100ppm - Result Low DS3 Mapping, Offset -100ppm - Sync Loss

C-17

Self Test Fail Numbers

Table C-36 No.

22233 22241

SDH Tests Option A3R (STM-0) Description

DS3 Mapping, Offset -100ppm- Result Low THRU Mode Fail

No.
22234

Description
DS3 Mapping, Offset +100ppm - Result High

Table C-37
8911 8914 8923 8931 8934 8943 8951 8954 8963

SDH Tests Option A3R (Round Trip Delay)

STM-1, 140 Mb/s, 1s- Pattern Loss STM-1, 140 Mb/s, 1s - Result High STM-1, 140 Mb/s, 2s - Result Low STM-1, 34 Mb/s, 1s - Pattern Loss STM-1, 34 Mb/s, 1s - Result High STM-1, 34 Mb/s, 2s - Result Low STM-1, 2 Mb/s, 1s - Pattern Loss STM-1, 2 Mb/s, 1s - Result High STM-1, 2 Mb/s, 2s - Result Low 8913 8921 8924 8933 8941 8944 8953 8961 8964 STM-1, 140 Mb/s, 1s - Result Low STM-1, 140 Mb/s, 2s - Pattern Loss STM-1, 140 Mb/s, 2s - Result High STM-1, 34 Mb/s, 1s - Result Low STM-1, 34 Mb/s, 2s - Pattern Loss STM-1, 34 Mb/s, 2s - Result High STM-1, 2 Mb/s, 1s - Result Low STM-1, 2 Mb/s, 2s - Pattern Loss STM-1, 2 Mb/s, 2s - Result High

Table C-38 No.

911 931 941 944

Optical Tests Option UH1 (STM-1) Description

Signal Loss Pattern Sync Loss Error Add - Pattern Sync Loss Error Add - Bit Error Rate High

No.
921 934 943 951

Description
Alarms Present Bit Errors Error Add - Bit Error Rate Low TX OFF - No Signal Loss

Table C-39 No.

10011 10015

Error Add Tests Options 130, 131 Description

1310 nm STM-1 Pattern Sync Loss 1550 nm STM-1 Pattern Sync Loss

No.
10012 10016

Description
1310 nm STM-1 Signal Loss 1550 nm STM-1 Signal Loss

C-18

Self Test Fail Numbers

Table C-39 No.

10022 10031 10034 10037 10041 10045 10051 10061 10071 10075 10081

Error Add Tests Options 130, 131 Description

1310 nm STM-1 - Alarms Present 1310 nm STM-1, Error Add - Pattern Sync Loss 1310 nm STM-1, Error Add - Bit Error Rate High 1550 nm STM-1, Error Add - Bit Error Rate Low 1310 nm TX OFF - No Alarms 1550 nm TX OFF - No Alarms 1310 nm STM-1 - Failed Frame Sync 1310 nm STM-1 - Frame Alarm (OOF) 1310 nm STM-1 #1 - Alarms Present 1550 nm STM-1 #1 - Alarms Present 1310 nm STM-1 #1, Error Add - Pattern Sync Loss

No.
10026 10033 10035 10038 10042 10046 10055 10065 10072 10076 10083

Description
1550 nm STM-1 - Alarms Present 1310 nm STM-1, Error Add - Bit Error Rate Low 1550 nm STM-1, Error Add - Pattern Sync Loss 1550 nm STM-1, Error Add - Bit Error Rate High 1310 nm TX OFF - No Signal Loss 1550 nm TX OFF - No Signal Loss 1550 nm STM-1 - Failed Frame Sync 1550 nm STM-1 - Frame Alarm (OOF) 1310 nm STM-1 #1 - Signal Loss 1550 nm STM-1 #1 - Signal Loss 1310 nm STM-1 #1, Error Add - Bit Error Rate Low

10084

1310 nm STM-1 #1, Error Add - Bit Error Rate High

10085

1550 nm STM-1 #1, Error Add - Pattern Sync Loss

10087

1550 nm STM-1 #1, Error Add - Bit Error Rate Low

10088

1550 nm STM-1 #1, Error Add - Bit Error Rate High

10091 10095 10101 10111

1310 nm STM-1 #1 - TX OFF - No Alarms 1550 nm STM-1 #1 - TX OFF - No Alarms 1310 nm STM-1 #2 - Alarms Present 1310 nm STM-1 #2, Error Add - Pattern Sync Loss

10092 10096 10102 10113

1310 nm STM-1 # - TX OFF - No Signal Loss 1550 nm STM-1 #1 - TX OFF - No Signal Loss 1310 nm STM-1 #2 - Signal Loss 1310 nm STM-1 #2, Error Add - Bit Error Rate Low

10114

1310 nm STM-1 #2, Error Add - Bit Error Rate High

10121

1310 nm STM-1 #2 - TX OFF - No Alarms

10122 10132

1310 nm STM-1 #2 - TX OFF - No Signal Loss 1310 nm STM-1 #3 - Signal Loss

10131 10141

1310 nm STM-1 #3 - Alarms Present 1310 nm STM-1 #3, Error Add - Pattern Sync Loss

10143

1310 nm STM-1 #3, Error Add - Bit Error Rate Low

10144

1310 nm STM-1 #3, Error Add - Bit ErrorRate High

10151 10161 10171

1310 nm STM-1 #3 - TX OFF - No Alarms 1310 nm STM-1 #4 - Alarms Present 1310 nm STM-1 #4, Error Add - Pattern Sync Loss

10152 10162 10173

1310 nm STM-1 #3 - TX OFF - No Signal Loss 1310 nm STM-1 #4 - Signal Loss 1310 nm STM-1 #4, Error Add - Bit Error Rate Low

C-19

Self Test Fail Numbers

Table C-39 No.

10174

Error Add Tests Options 130, 131 Description

1310 nm STM-1 #4, Error Add - Bit Error Rate High

No.
10181

Description
1310 nm STM-1 #4 - TX OFF - No Alarms

10182 10192 10196 10206

1310 nm STM-1 #4 - TX OFF - No Signal Loss 1310 nm STM-4 - B1 Errors 1550 nm STM-4 - B1 Errors 1550 nm STM-4 - B2 Errors

10191 10195 10202 10211

1310 nm STM-4 - Alarms Present 1550 nm STM-4 - Alarms Present 1310 nm STM-4 - B2 Errors 1310 nm STM-4, B2 Error Add - Frame Alarm (OOF or LOF)

10213

1310 nm STM-4, B2 Error Add - Error Rate Low

10214

1310 nm STM-4, B2 Error Add - Error Rate High

Table C-40 No.

10221 10225 10231 10241 10251

Clock Recovery Tests Options 130, 131 Description

STM-4, STM-1 #1 LOF, OOF or LOP STM-4, STM-1 #1 LOF, OOF or LOP STM-4 Clock Recovery LOF, OOF or LOP STM-4 Clock Recovery LOF, OOF or LOP STM-4 Clock Recovery LOF, OOF or LOP

No.
10222 10226 10235 10245 10255

Description
STM-4, STM-1 #1 Signal Loss STM-4, STM-1 #1 Signal Loss STM-4 Clock Recovery LOF, OOF or LOP STM-4 Clock Recovery LOF, OOF or LOP STM-4 Clock Recovery LOF, OOF or LOP

Table C-41 No.

10261 10271 10281

Overhead Tests Options 130, 131 Description

STM-4 Overhead Pattern 1 - Fail to Sync STM-4 Overhead Pattern 1 - Fail to Sync STM-1 Overhead Pattern 1, Columns 1,4,7 Fail to Sync

No.
10262 10272 10282

Description
STM-4 Overhead Pattern 1 - Pattern Error STM-4 Overhead Pattern 1 - Pattern Error STM-1 Overhead Pattern 1, Columns1,4,7 Pattern Error

10291

STM-1 Overhead Pattern 1, Columns 2,5,8 Fail to Sync

10292

STM-1 Overhead Pattern 1, Columns2,5,8 Pattern Error

10301

STM-1 Overhead Pattern 1, Columns 3,6,9 Fail to Sync

10302

STM-1 Overhead Pattern 1, Columns3,6,9 Pattern Error

C-20

Self Test Fail Numbers

Table C-41 No.

10311

Overhead Tests Options 130, 131 Description

STM-1 Overhead Pattern 2, Columns 1,4,7 Fail to Sync

No.
10312

Description
STM-1 Overhead Pattern 2, Columns1,4,7 Pattern Error

10321

STM-1 Overhead Pattern 2, Columns 2,5,8 Fail to Sync

10322

STM-1 Overhead Pattern 2, Columns2,5,8 Pattern Error

10331

STM-1 Overhead Pattern 2, Columns 3,6,9 Fail to Sync

10332

STM-1 Overhead Pattern 2, Columns3,6,9 Pattern Error

10341

STM-1 #1 Overhead Pattern 1, Columns 1,4,7 Fail to Sync

10342

STM-1 #1 Overhead Pattern 1,Columns 1,4,7 Pattern Error

10351

STM-1 #1 Overhead Pattern 1, Columns 2,5,8 Fail to Sync

10352

STM-1 #1 Overhead Pattern 1,Columns 2,5,8 Pattern Error

10361

STM-1 #1 Overhead Pattern 1, Columns 3,6,9 Fail to Sync

10362

STM-1 #1 Overhead Pattern 1,Columns 3,6,9 Pattern Error

10371

STM-1 #2 Overhead Pattern 1, Columns 1,4,7 Fail to Sync

10372

STM-1 #2 Overhead Pattern 1,Columns 1,4,7 Pattern Error

10381

STM-1 #2 Overhead Pattern 1, Columns 2,5,8 Fail to Sync

10382

STM-1 #2 Overhead Pattern 1,Columns 2,5,8 Pattern Error

10391

STM-1 #2 Overhead Pattern 1, Columns 3,6,9 Fail to Sync

10392

STM-1 #2 Overhead Pattern 1,Columns 3,6,9 Pattern Error

10401

STM-1 #3 Overhead Pattern 1, Columns 1,4,7 Fail to Sync

10402

STM-1 #3 Overhead Pattern 1,Columns 1,4,7 Pattern Error

10411

STM-1 #3 Overhead Pattern 1, Columns 2,5,8 Fail to Sync

10412

STM-1 #3 Overhead Pattern 1,Columns 2,5,8 Pattern Error

10421

STM-1 #3 Overhead Pattern 1, Columns 3,6,9 Fail to Sync

10422

STM-1 #3 Overhead Pattern 1,Columns 3,6,9 Pattern Error

10431

STM-1 #4 Overhead Pattern 1, Columns 1,4,7 Fail to Sync

10432

STM-1 #4 Overhead Pattern 1,Columns 1,4,7 Pattern Error

10441

STM-1 #4 Overhead Pattern 1, Columns 2,5,8 Fail to Sync

10442

STM-1 #4 Overhead Pattern 1,Columns 2,5,8 Pattern Error

10451

STM-1 #4 Overhead Pattern 1, Columns 3,6,9 Fail to Sync

10452

STM-1 #4 Overhead Pattern 1,Columns 3,6,9 Pattern Error

10461

STM-1 #1 Overhead Pattern 2, Columns 1,4,7 Fail to Sync

10462

STM-1 #1 Overhead Pattern 2,Columns 1,4,7 Pattern Error

10471

STM-1 #1 Overhead Pattern 2, Columns 2,5,8 Fail to Sync

10472

STM-1 #1 Overhead Pattern 2,Columns 2,5,8 Pattern Error

C-21

Self Test Fail Numbers

Table C-41 No.

10481

Overhead Tests Options 130, 131 Description

STM-1 #1 Overhead Pattern 2, Columns 3,6,9 Fail to Sync

No.
10482

Description
STM-1 #1 Overhead Pattern 2,Columns 3,6,9 Pattern Error

10491

STM-1 #2 Overhead Pattern 2, Columns 1,4,7 Fail to Sync

10492

STM-1 #2 Overhead Pattern 2,Columns 1,4,7 Pattern Error

10501

STM-1 #2 Overhead Pattern 2, Columns 2,5,8 Fail to Sync

10502

STM-1 #2 Overhead Pattern 2,Columns 2,5,8 Pattern Error

10511

STM-1 #2 Overhead Pattern 2, Columns 3,6,9 Fail to Sync

10512

STM-1 #2 Overhead Pattern 2,Columns 3,6,9 Pattern Error

10521

STM-1 #3 Overhead Pattern 2, Columns 1,4,7 Fail to Sync

10522

STM-1 #3 Overhead Pattern 2,Columns 1,4,7 Pattern Error

10531

STM-1 #3 Overhead Pattern 2, Columns 2,5,8 Fail to Sync

10532

STM-1 #3 Overhead Pattern 2,Columns 2,5,8 Pattern Error

10541

STM-1 #3 Overhead Pattern 2, Columns 3,6,9 Fail to Sync

10542

STM-1 #3 Overhead Pattern 2,Columns 3,6,9 Pattern Error

10551

STM-1 #4 Overhead Pattern 2, Columns 1,4,7 Fail to Sync

10552

STM-1 #4 Overhead Pattern 2,Columns 1,4,7 Pattern Error

10561

STM-1 #4 Overhead Pattern 2, Columns 2,5,8 Fail to Sync

10562

STM-1 #4 Overhead Pattern 2,Columns 2,5,8 Pattern Error

10571

STM-1 #4 Overhead Pattern 2, Columns 3,6,9 Fail to Sync

10572

STM-1 #4 Overhead Pattern 2,Columns 3,6,9 Pattern Error

Table C-42 No.

10591

STM-4 Alarms Options 130, 131 Description

1310 nm, No Frame Errors - OOF Alarm Test Fail

No.
10592

Description
1310 nm, No Frame Errors - LOF Alarm Test Fail

10601

1310 nm, 3 in 4 Frame Errors - OOF Alarm Test Fail

10602

1310 nm, 3 in 4 Frame Errors - LOF Alarm Test Fail

10611 10632 10652

1310 nm, No Alarms - Pattern Sync Loss 1310 nm, No Alarms - MS AIS Alarm 1310 nm, MS FERF Alarm - Alarm Not Detected

10622 10641 10662

1310 nm, MS AIS Alarm - Alarm Not Detected 1310 nm, No Alarms - Pattern Sync Loss 1310 nm, No Alarms - MS FERF Alarm

C-22

Self Test Fail Numbers

Table C-43 No.

10701 10711 10723 10731 10751 10761 10764 10772 10782

Binary Interface Options 0YH with 130 or 131 Description

STM-1 Binary - Signal Loss STM-1 Binary, Error Add - Alarms Detected STM-1 Binary, Error Add - Bit Error Rate Low STM-1 Binary, TX OFF - No Alarms STM-4 Binary, Error Add - No Alarms STM-4 Binary, Error Add - Pattern Sync Loss STM-4 Binary, Error Add - Bit Error Rate High STM-4 Binary, TX OFF - No Signal Loss STM-4 Binary - B1 Errors

No.
10702 10721 10724 10732 10752 10763 10771 10781 10792

Description
STM-1 Binary - Pattern Sync Loss STM-1 Binary, Error Add - Pattern Sync Loss STM-1 Binary, Error Add - Bit Error Rate High STM-1 Binary, TX OFF - No Signal Loss STM-4 Binary, Error Add - No Signal Loss STM-4 Binary, Error Add - Bit Error Rate Low STM-4 Binary, TX OFF - No Alarms STM-4 Binary - Frame Sync Loss STM-4 Binary - B2 Errors

Table C-44 No.

10801 10804 10807 10811 10814 10817

Optical Power Measurement Options 130, 131 Description

1310 nm STM-1 - Alarm Sync 1310 nm STM-1 - Result High 1550 nm STM-1 - Result Low 1310 nm STM-4 - Alarm Sync 1310 nm STM-4 - Result High 1550 nm STM-4 - Result Low

No.
10803 10805 10808 10813 10815 10818

Description
1310 nm STM-1 - Result Low 1550 nm STM-1 - Alarm Sync 1550 nm STM-1 - Result High 1310 nm STM-4 - Result Low 1550 nm STM-4 - Alarm Sync 1550 nm STM-4 - Result High

Table C-45 No.

10821 10824 10827 10831 10834 10837

Frequency Measurement Options 130, 131 Description

1310 nm STM-1 - Loss Of Signal 1310 nm STM-1 - Result High 1550 nm STM-1 - Result Low 1310 nm STM-4 - Loss Of Signal 1310 nm STM-4 - Result High 1550 nm STM-4 - Result Low

No.
10823 10825 10828 10833 10835 10838

Description
1310 nm STM-1 - Result Low 1550 nm STM-1 - Loss Of Signal 1550 nm STM-1 - Result High 1310 nm STM-4 - Result Low 1550 nm STM-4 - Loss Of Signal 1550 nm STM-4 - Result High

C-23

Self Test Fail Numbers

Table C-46 No.

10841 10844 10854 10856

Error Add Tests Options 130, 131 Description

1310 nm STM-4 B2 - Frame Sync Loss 1310 nm STM-4 - B2 Error Rate High 1310 nm STM-4 - Frame Error Rate High 1310 nm STM-4 - B1 Error Rate High

No.
10843 10853 10855 10857

Description
1310 nm STM-4 - B2 Error Rate Low 1310 nm STM-4 - Frame Error Rate Low 1310 nm STM-4 - B1 Error Rate Low 1310 nm STM-4- MS FEBE//MS REI Error Rate Low

10858

1310 nm STM-4 - MS FEBE//MS REI Error Rate High

Table C-47 No.

10861 10865

STM-4 Stress Test Options 130, 131 Description

1310 nm - Frame Sync Loss 1550 nm - Frame Sync Loss

No.
10862 10866

Description
1310 nm - OOF Alarm 1550 nm - OOF Alarm

Table C-48 No.

10872 10876 10882 10886

Loss of Signal Tests Options 130, 131 Description

1310 nm - No Loss of Optical Signal 1550 nm - No Loss of Optical Signal 1310 nm - No Loss of Binary Signal 1550 nm - No Loss of Binary Signal

No.
10873 10877 10883 10887

Description
1310 nm - Loss of Optical Signal 1550 nm - Loss of Optical Signal 1310 nm - Loss of Binary Signal 1550 nm - Loss of Binary Signal

Table C-49 No.

10891 10903

STM-4c Tests Options 130, 131 Description

1310 nm - POH J1 Byte error 1310 nm, PRBS 223 - Error Rate Low

No.
10901 10904

Description
1310 nm, PRBS 223 - Frame Sync Loss 1310 nm, PRBS 223 - Error Rate High

C-24

Self Test Fail Numbers

Table C-49 No.

10911 10914 10923 10931 10934 10942 10944 10953 10955

STM-4c Tests Options 130, 131 Description

1310 nm, PRBS 215 - Frame Sync Loss 1310 nm, PRBS 215 - Error Rate High 1310 nm, Word - Error Rate Low 1310 nm, PRBS 2 - Frame Sync Loss 1310 nm, PRBS 29 - Error Rate High 1310 nm, Frequency Offset - Pointer Alarm 1310 nm, Frequency Offset - B2 Bip Errors 1310 nm, +100 ppm Offset - Result Low 1310 nm, -100 ppm Offset - Result Low
9

No.
10913 10921 10924 10933 10941 10943 10945 10954 10956

Description
1310 nm, PRBS 215 - Error Rate Low 1310 nm, Word - Frame Sync Loss 1310 nm,Word - Error Rate High 1310 nm, PRBS 29 - Error Rate Low 1310 nm, Frequency Offset - Frame Sync Loss 1310 nm, Frequency Offset - B1 Bip Errors 1310 nm, Frequency Offset - B3 Bip Errors 1310 nm, +100ppm Offset -Result High 1310 nm, -100ppm Offset -Result High

Table C-50 No.

10961 10971 10973 10975 10981 10992 10995

STM-4 Payloads Tests Options 130, 131 Description

Background Payload - Frame Sync Loss F/G Payload STM-1 #1 - Frame Sync Loss F/G Payload STM-1 #2 - Frame Sync Loss F/G Payload STM-1 #4 - Frame Sync Loss Thru Mode - H4 Frame Fail STM-1- POH Fail Regenerator SOH DCC Fail

No.
10962 10972 10974 10976 10991 10994 10996

Description
Background Payload - Errors Detected F/G Payload STM-1 #1 - Error Count Wrong F/G Payload STM-1 #2 - Error Count Wrong F/G Payload STM-1 #4 - Error Count Wrong Overhead Processor Fail STM-1- SOH Fail Multiplexer SOH DCC Fail

Table C-51 No.

12153 12156 12164 12173 12176

ATM Bandwidth, Back to Back Tests (Option UKN) Description

F/G, 80,000 c/s - Result Low F/G, 80,000 c/s - Result Invalid F/G, 40,000 c/s - Result High F/G, 100 c/s - Result Low F/G, 100 c/s - Result Invalid

No.
12154 12163 12166 12174 12183

Description
F/G, 80,000 c/s - Result High F/G, 40,000 c/s - Result Low F/G, 40,000 c/s - Result Invalid F/G, 100 c/s - Result High F/G 24,000 c/s - Result Low

C-25

Self Test Fail Numbers

Table C-51 No.

12184 12193 12196 12204 12213 12216 12224 12233 12236 12244 12253 12256

ATM Bandwidth, Back to Back Tests (Option UKN) Description

F/G 24,000 c/s - Result High B/G 1 70% - Result Low B/G 1 70% - Result Invalid B/G 1, 25 % - Result High B/G 2, 45 % - Result Low B/G 2, 45 % - Result Invalid B/G 2, 20 % - Result High B/G 3, 25 % - Result Low B/G 3, 25 % - Result Invalid B/G 3, 15 % - Result High Fill 10 % - Result Low Fill 10 % - Result Invalid

No.
12186 12194 12203 12206 12214 12223 12226 12234 12243 12246 12254

Description
F/G 24,000 c/s - Result Invalid B/G 1 70% - Result High B/G 1, 25 % - Result Low B/G 1, 25 % - Result Invalid B/G 2, 45 % - Result High B/G 2, 20 % - Result Low B/G 2, 20 % - Result Invalid B/G 3, 25 % - Result High B/G 3, 15 % - Result Low B/G 3, 15 % - Result Invalid Fill 10 % - Result High

Table C-52 No.

12263 12265 12273 12275 12283 12285

ATM Distribution, Back to Back Tests (Opt UKN) Description

Periodic, SCNR Off - Result Low Periodic, SCNR Off - SCNR alarm Burst, SCNR On - Result Low Burst, SCNR On - No SCNR alarm Periodic + Burst, SCNR Off - Result Low Periodic + Burst, SCNR Off - SCNR alarm

No.
12264 12266 12274 12276 12284 12286

Description
Periodic, SCNR Off - Result High Periodic, SCNR Off - Result Invalid Burst, SCNR On - Result High Burst, SCNR On - Result Invalid Periodic + Burst, SCNR Off - Result High Periodic + Burst, SCNR Off - Result Invalid

Table C-53 No.

12293 12296

ATM Error Add, Back to Back Tests (Opt UKN) Description

2 Mb/s CRC4, Error Add Off - Result Low 2 Mb/s CRC4, Error Add Off - Result Invalid

No.
12294 12297

Description
2 Mb/s CRC4, Error Add Off - Result High 2 Mb/s CRC4, Error Add Single - Result Low

C-26

Self Test Fail Numbers

Table C-53 No.

12298 12303 12306 12308 12313 12316 12318

ATM Error Add, Back to Back Tests (Opt UKN) Description

2 Mb/s CRC4, Error Add Single - Result High 2 Mb/s REBE, Error Add Off - Result Low 2 Mb/s REBE, Error Add Off - Result Invalid 2 Mb/s REBE, Error Add Single - Result High 34 Mb/s EM BIP, Error Add Off - Result Low 34 Mb/s EM BIP, Error Add Off - Result Invalid 34 Mb/s EM BIP, Error Add Single - Result High

No.
12299 12304 12307 12309 12314 12317 12319

Description
2 Mb/s CRC4, Error Add Single - Result Invalid 2 Mb/s REBE, Error Add Off - Result High 2 Mb/s REBE, Error Add Single - Result Low REBE, Error Add Single - Result Invalid 34 Mb/s EM BIP, Error Add Off - Result High 34 Mb/s EM BIP, Error Add Single - Result Low 34 Mb/s EM BIP, Error Add Single - Result Invalid

12323 12326 12328

140 Mb/s EM BIP, Error Add Off - Result Low 140 Mb/s EM BIP, Error Add Off - Result Invalid 140 Mb/s EM BIP, Error Add Single - Result High

12324 12327 12329

140 Mb/s EM BIP, Error Add Off - Result High 140 Mb/s EM BIP, Error Add Single - Result Low 140 Mb/s EMBIP, Error Add Single - Result Invalid

12333 12336 12338 12343 12346 12348 12353 12356 12358 12363 12366

34 Mb/s FEBE, Error Add Off - Result Low 34 Mb/s FEBE, Error Add Off - Result Invalid 34 Mb/s FEBE, Error Add On - Result High 140 Mb/s FEBE, Error Add Off - Result Low 140 Mb/s FEBE, Error Add Off - Result Invalid 140 Mb/s FEBE, Error Add On - Result High SHEC, Error Add Off - Result Low SHEC, Error Add Off - Result Invalid SHEC, Error Add Single - Result High SHEC, Error Add Single - DHEC Result Low Single HEC, Error Add Single - DHEC Result Invalid

12334 12337 12339 12344 12347 12349 12354 12357 12359 12364 12367

34 Mb/s FEBE, Error Add Off - Result High 34 Mb/s FEBE, Error Add On - Result Low 34 Mb/s FEBE, Error Add On - Result Invalid 140 Mb/s FEBE, Error Add Off - Result High 140 Mb/s FEBE, Error Add On - Result Low 140 Mb/s FEBE, Error Add On - Result Invalid SHEC, Error Add Off - Result High SHEC, Error Add Single - Result Low SHEC, Error Add Single - Result Invalid SHEC, Error Add Single - DHEC Result High Single HEC, Error Add 1 in 103- Result Low

12368 12373 12376 12378 12383 12386 12388

Single HEC, Error Add 1 in 103 - Result High SHEC, Error Add Burst - Result Low SHEC, Error Add Burst - Result Invalid SHEC, Error Add Burst - DHEC Result High Double HEC, Error Add Off - Result Low Double HEC, Error Add Off - Result Invalid Double HEC, Error Add Single - Result High

12369 12374 12377 12379 12384 12387 12389

Single HEC, Error Add 1 in 103- Result Invalid SHEC, Error Add Burst - Result High SHEC, Error Add Burst - DHEC Result Low SHEC, Error Add Burst - DHEC Result Invalid Double HEC, Error Add Off - Result High Double HEC, Error Add Single - Result Low Double HEC, Error Add Single - Result Invalid

C-27

Self Test Fail Numbers

Table C-53 No.

12393

ATM Error Add, Back to Back Tests (Opt UKN) Description

Double HEC, Error Add Single - SHEC Result Low

No.
12394

Description
Double HEC, Error Add Single - SHEC Result High

12396

Double HEC, Error Add Single - SHEC Result Invalid

12397

Double HEC, Error Add 1 in 103- Result Low

12398 12403 12406 12408 12413 12416 12418 12423 12426 12428

Double HEC, Error Add 1 in 103 - Result High Double HEC, Error Burst - SHEC Result Low Double HEC, Burst - SHEC Result Invalid Double HEC, Burst - DHEC Result High Bit, Error Add Off - Result Low Bit, Error Add Off - Result Invalid Bit, Error Add Single - Result High Bit, Error Add Single - Err. Cell Result Low Bit, Error Add Single - Err. Cell Result Invalid Bit, Error Add 1 in 103 - Result High

12399 12404 12407 12409 12414 12417 12419 12424 12427 12429

Double HEC, Error Add 1 in 103- Result Invalid Double HEC, Burst - SHEC Result High Double HEC, Burst - DHEC Result Low Double HEC, Burst - DHEC Result Invalid Bit, Error Add Off - Result High Bit, Error Add Single - Result Low Bit, Error Add Single - Result Invalid Bit, Error Add Single - Err. Cell Result High Bit, Error Add 1 in 103- Result Low Bit, Error Add 1 in 103 - Result Invalid

Table C-54 No.

12433 12436 12444 15453 12456 12464 12473 12476 12484 12493 12496

ATM Headers, Back to Back Tests (Opt UKN) Description

F/G GFC=10 - Result Low F/G GFC=10 - Result Invalid F/G VPI=85 - Result High F/G VPI=2730 - Result Low F/G VPI=2730 - Result Invalid F/G VCI=21845 - Result High F/G PTI=000 - Result Low F/G PTI=000 - Result Invalid F/G PTI=010 - Result High F/G CLP=0 - Result Low F/G CLP=0 - Result Invalid

No.
12434 12443 12446 12454 12463 12466 12474 12483 12486 12494 12503

Description
F/G GFC=10 - Result High F/G VPI=85 - Result Low F/G VPI=85 - Result Invalid F/G VPI=2730 - Result High F/G VCI=21845 - Result Low F/G VCI=21845 - Result Invalid F/G PTI=000 - Result High F/G PTI=010 - Result Low F/G PTI=010 - Result Invalid F/G CLP=0 - Result High F/G CLP=1 - Result Low

C-28

Self Test Fail Numbers

Table C-54 No.

12504 12513 12516 12524 12533 12536 12544 12553 12556 12564 12573 12576 12584 12593 12596 12604 12613 12616 12624 12633 12636 12644

ATM Headers, Back to Back Tests (Opt UKN) Description

F/G CLP=1 - Result High RX GFC=X - Result Low RX GFC=X - Result Invalid RX GFC=2 - Result High RX VPI=X - Result Low RX VPI=X - Result Invalid RX VPI=0 - Result High RX VPI=85 - Result Low RX VPI=85 - Result Invalid RX VCI=X - Result High RX VCI=33 - Result Low RX VCI=33 - Result Invalid RX PTI=XXX - Result High RX PTI=0XX - Result Low RX PTI=0XX - Result Invalid RX PTI=X1X - Result High RX PTI=XX0 - Result Low RX PTI=XX0 - Result Invalid RX CLP=X - Result High RX CLP=0 - Result Low RX CLP=0 - Result Invalid RX CLP=1 - Result High

No.
12506 12514 12523 12526 12534 12543 12546 12554 12563 12566 12574 12583 12586 12594 12603 12606 12614 15623 12626 12634 12643 12646

Description
F/G CLP=1 - Result Invalid RX GFC=X - Result High RX GFC=2 - Result Low RX GFC=2 - Result Invalid RX VPI=X - Result High RX VPI=0 - Result Low RX VPI=0 - Result Invalid RX VPI=85 - Result High RX VCI=X - Result Low RX VCI=X - Result Invalid RX VCI=33 - Result High RX PTI=XXX - Result Low RX PTI=XXX - Result Invalid RX PTI=0XX - Result High RX PTI=X1X - Result Low RX PTI=X1X - Result Invalid RX PTI=XX0 - Result High RX CLP=X - Result Low RX CLP=X - Result Invalid RX CLP=0 - Result High RX CLP=1 - Result Low RX CLP=1 - Result Invalid

Table C-55 No.

12654 12674 12694 12714

ATM Payloads, Back to Back Tests (Opt UKN) Description

34 Mb/s Cross Cell PRBS15 - Pattern Errors 34 Mb/s Single Cell PRBS9 - Pattern Errors 140 Mb/s User Word 11111111 - Pattern Errors 2 Mb/s Test Cell - Pattern Errors

No.
12664 12684 12704

Description
34 Mb/s Cross Cell PRBS23 - Pattern Errors 140 Mb/s User Word 00000000 - Pattern Errors 2 Mb/s User Word 01010101 - Pattern Errors

C-29

Self Test Fail Numbers

Table C-56 No.

12723 12726 12734 12743 12746 12754 12757 12759

ATM Test Cell, Back to Back Tests (Opt UKN) Description

Single HEC Inject - Result Low Single HEC Inject - Result Invalid Double HEC Inject - Result High 3 X 100 ms Double HEC Inject - Result Low 3 X 100 ms Double HEC Inject - Result Invalid Misinserted Cell (a) - Result High Misinserted Cell (a) - Errored Cell Count Low Misinserted Cell (a) - Errored Cell Count Invalid

No.
12724 12733 12736 12744 12753 12756 12758 12763

Description
Single HEC Inject - Result High Double HEC Inject - Result Low Double HEC Inject - Result Invalid 3 X 100 ms Double HEC Inject - Result High Misinserted Cell (a) - Result Low Misinserted Cell (a) - Result Invalid Misinserted Cell (a) - Errored Cell Count High Misinserted Cell (b) - Result Low

12764 12767 121276 9 12774 12777 12779 12784 12787 12789

Misinserted Cell (b) - Result High Misinserted Cell (b) - Errored Cell Count Low Misinserted Cell (b) - Errored Cell Count Invalid

12766 12768 12773

Misinserted Cell (b) - Result Invalid Misinserted Cell (b) - Errored Cell Count High Misinserted Cell (c) - Result Low

Misinserted Cell (c) - Result High Misinserted Cell (c) - Errored Cell Count Low Misinserted Cell (c) - Errored Cell Count Invalid Mean Cell Transfer Delay - Normal Result High Mean Cell Transfer Delay - Test Result Low Mean Cell Transfer Delay - Test Result Invalid

12776 12778 12783 12786 12788 12793

Misinserted Cell (c) - Result Invalid Misinserted Cell (c) - Errored Cell Count High Mean Cell Transfer Delay -Normal Result Low Mean Cell Transfer Delay -Normal Result Invalid Mean Cell Transfer Delay - Test Result High Gated Mean Cell Transfer Delay -Normal Result Low

12794

Gated Mean Cell Transfer Delay - Normal Result High

12796

Gated Mean Cell Transfer Delay -Normal Result Invalid

12797

Gated Mean Cell Transfer Delay - Test Result Low

12798

Gated Mean Cell Transfer Delay- Test Result High

12799

Gated Mean Cell Transfer Delay - Test Result Invalid

12803

Maximum Cell Transfer Delay -Normal Result Low

12804

Maximum Cell Transfer Delay - Normal Result High

12806

Maximum Cell Transfer Delay -Normal Result Invalid

12807 12809

Maximum Cell Transfer Delay - Test Result Low Maximum Cell Transfer Delay - Test Result Invalid

12808 12813

Maximum Cell Transfer Delay - Test Result High Pk_Pk Cell Delay Variation -Normal Result Low

C-30

Self Test Fail Numbers

Table C-56 No.

12814

ATM Test Cell, Back to Back Tests (Opt UKN) Description

Pk_Pk Cell Delay Variation- Normal Result High

No.
12816

Description
Pk_Pk Cell Delay Variation -Normal Result Invalid

12817 12819 12824 12833 12836 12844 12853

Pk_Pk Cell Delay Variation - Test Result Low Pk_Pk Cell Delay Variation - Test Result Invalid Bit Error Add Off - Errored Cell Count High Bit Error Add Single - Errored Cell Count Low Bit Error Add Single - Errored Cell Count Invalid Bit Error Add 1 in 103 - Errored Cell Count High Cell Delay Variation tolerance (a) - Non Conforming Cell Count Low

12818 12823 12826 12834 12843 12846 12854

Pk_Pk Cell Delay Variation - Test Result High Bit Error Add Off - Errored Cell Count Low Bit Error Add Off - Errored Cell Count Invalid Bit Error Add Single - Errored Cell Count High Bit Error Add 1 in 103 - Errored Cell Count Low Bit Error Add Off - Errored Cell Count Invalid Cell Delay Variation tolerance (a) - Non Conforming Cell Count High

12856

Cell Delay Variation tolerance (a) - Non Conforming Cell Count Invalid

12863

Cell Delay Variation tolerance (b) - Non Conforming Cell Count Low

12864

Cell Delay Variation tolerance (b) - Non Conforming Cell Count High

12866

Cell Delay Variation tolerance (b) - Non Conforming Cell Count Invalid

12867

Cell Delay Variation tolerance (c) - Non Conforming Cell Count Low

12868

Cell Delay Variation tolerance (c) - Non Conforming Cell Count High

12869

Cell Delay Variation tolerance (c) - Non Conforming Cell Count Invalid

12873

TX CellRate=20,000 - Maximum 1 Pt CDV Result Low

12874

TX Cell Rate=20,000 - Maximum 1 Pt CDV Result High

12876

TX Cell Rate=20,000 - Maximum 1 Pt CDV Result Invalid

12883

TX Cell Rate=20,000 - Maximum 1 Pt CDV Result Low

12884

TX Cell Rate=20,000 - Maximum 1 Pt CDV Result High

12886

TX Cell Rate=20,000 - Maximum 1 Pt CDV Result Invalid

Table C-57 No.

12896 12898

ATM Trail Trace, Back to Back Tests (Opt UKN) Description

34 Mb/s TEST String Incorrect 34 Mb/s USER String Incorrect

No.
12897 12899

Description
140 Mb/s TEST String Incorrect 140 Mb/s USER String Incorrect

C-31

Self Test Fail Numbers

Table C-58 No.

12906 12916

Performance Management OAM, Back to Back Tests (Opt UKN) Description

F4 Segment Loss of POAM - Error Not Detected F4 End to End Loss of POAM - Error Not Detected

No.
12907 12917

Description
F4 Segment NO Loss of POAM - Error Detected F4 End to End NO Loss of POAM - Error Detected

12926 12936

F5 Segment Loss of POAM - Error Not Detected F5 End to End Loss of POAM - Error Not Detected

12927 12937

F5 Segment NO Loss of POAM - Error Detected F5 End to End NO Loss of POAM - Error Detected

12943 12946

F4 Segment Error Add Off - BEDC Result Low F4 Segment Error Add Off - BEDC Result Invalid

12944 12947

F4 Segment Error Add Off - BEDC Result High F4 Segment Bit Error Add Single- BEDC Result Low

12948

F4 Segment Bit Error Add Single - BEDC Result High

12949

F4 Segment Bit Error Add Single- BEDC Result Invalid

12953

F4 End to End Error Add Off - BEDC Result Low

12954

F4 End to End Error Add Off - BEDC Result High

12956

F4 End to End Error Add Off - BEDC Result Invalid

12957

F4 End to End Bit Error Add Single- BEDC Result Low

12958

F4 End to End Bit Error Add Single - BEDC Result High

12959

F4 End to End Bit Error Add Single- BEDC Result Invalid

12963 12966

F5 Segment Error Add Off - BEDC Result Low F5 Segment Error Add Off - BEDC Result Invalid

12964 12967

F5 Segment Error Add Off - BEDC Result High F5 Segment Bit Error Add Single- BEDC Result Low

12968

F5 Segment Bit Error Add Single - BEDC Result High

12969

F5 Segment Bit Error Add Single- BEDC Result Invalid

12973

F5 End to End Error Add Off - BEDC Result Low

12974

F5 End to End Error Add Off - BEDC Result High

12976

F5 End to End Error Add Off - BEDC Result Invalid

12977

F5 End to End Bit Error Add Single- BEDC Result Low

12978

F5 End to End Bit Error Add Single - BEDC Result High

12979

F5 End to End Bit Error Add Single- BEDC Result Invalid

12983

Double Header Error Add - Cell Loss Result Low

12984

Double Header Error Add - Cell Loss Result High

12986

Double Header Error Add - Cell Loss Result Invalid

12987

Double Header Error Add - BEDC Result Low

12988

Double Header Error Add - BEDC Result High

12989

Double Header Error Add - BEDC Result Invalid

C-32

Self Test Fail Numbers

Table C-58 No.

12993

Performance Management OAM, Back to Back Tests (Opt UKN) Description

B/G Header = FG Header - Cell Misinsertion Result Low

No.
12994

Description
B/G Header = FG Header- Cell Misinsertion Result High

12996

B/G Header = FG Header - Cell Misinsertion Result Invalid

12997

B/G Header = FG Header -BEDC Result Low

12998

B/G Header = FG Header - BEDC Result High

12999

B/G Header = FG Header - BEDC Result Invalid

Table C-59 No.

1411 1421 1439 1452 1469 1482 1499 14111

JITTER Generator Tests Description

140 Mb/s PDH, 2 kHz - Errors 140 Mb/s PDH, 5 kHz - Errors 34 Mb/s PDH, 2 kHz - VCO not Settling 34 Mb/s PDH, 100 kHz - No Errors 8 Mb/s PDH, 2 kHz - VCO not Settling 8 Mb/s PDH, 50 kHz - No Errors 2 Mb/s PDH, 2 kHz - VCO not Settling 140 Mb/s SDH, 2 kHz - Errors

No.
1419 1431 1441 1461 1471 1491 14102 14121

Description
140 Mb/s PDH, 2 kHz - VCO not Settling 34 Mb/s PDH, 2 kHz - Errors 34 Mb/s PDH, 5 kHz - Errors 8 Mb/s PDH, 2 kHz - Errors 8 Mb/s PDH, 5 kHz - Errors 2 Mb/s PDH, 2 kHz - Errors 2 Mb/s PDH, 5 kHz - No Errors 140 Mb/s SDH, 5 kHz - Errors

Table C-60 No.

14133 14138 14143 14148 14154 14163 14168 14174

JITTER Receiver Tests Description

Intrinsic Jitter 140 Mb/s, PRBS - Result Low Intrinsic Jitter 140 Mb/s, PRBS - Jitter Unlock Intrinsic Jitter 140 Mb/s, All 0s - Result Low Intrinsic Jitter 140 Mb/s, All 0s - Jitter Unlock Intrinsic Jitter 140 Mb/s, 1000 - Result High Intrinsic Jitter 140 Mb/s, All 1s - Result Low Intrinsic Jitter 140 Mb/s, All 1s - Jitter Unlock Intrinsic Jitter 34 Mb/s, PRBS - Result High

No.
14134 14139 14144 14153 14158 14164 14173 14178

Description
Intrinsic Jitter140 Mb/s, PRBS - Result High Intrinsic Jitter140 Mb/s - VCO not Settling Intrinsic Jitter140 Mb/s, All 0s - Result High Intrinsic Jitter140 Mb/s, 1000 - Result Low Intrinsic Jitter140 Mb/s, 1000 - Jitter Unlock Intrinsic Jitter140 Mb/s, All 1s - Result High Intrinsic Jitter34 Mb/s, PRBS - Result Low Intrinsic Jitter 140 Mb/s,PRBS - Jitter Unlock

C-33

Self Test Fail Numbers

Table C-60 No.

14179 14184 14193 14198 14204 14213 14218 14223 14228 14234 14243 14248 14254 14259 14264 14273 14278 14284

JITTER Receiver Tests Description

Intrinsic Jitter 34 Mb/s - VCO not Settling Intrinsic Jitter 34 Mb/s, All 0s - Result High Intrinsic Jitter 34 Mb/s, 1000 - Result Low Intrinsic Jitter 34 Mb/s, 1000 - Jitter Unlock Intrinsic Jitter 34 Mb/s, All 1s - Result High Intrinsic Jitter 8 Mb/s, PRBS - Result Low Intrinsic Jitter 8 Mb/s, PRBS - Jitter Unlock Intrinsic Jitter 8 Mb/s, All 0s - Result Low Intrinsic Jitter 8 Mb/s, All 0s - Jitter Unlock Intrinsic Jitter 8 Mb/s, 1000 - Result High Intrinsic Jitter 8 Mb/s, All 1s - Result Low Intrinsic Jitter 8 Mb/s, All 1s - Jitter Unlock Intrinsic Jitter 2 Mb/s, PRBS - Result High Intrinsic Jitter 8 Mb/s, - VCO not Settling Intrinsic Jitter 2 Mb/s, All 0s - Result High Intrinsic Jitter 2 Mb/s, 1000 - Result Low Intrinsic Jitter 2 Mb/s, 1000 - Jitter Unlock Intrinsic Jitter 2 Mb/s, All 1s - Result High

No.
14183 14188 14194 14203 14208 14214 14219 14224 14233 14238 14244 14253 14258 14263 14268 14274 14283 14288

Description
Intrinsic Jitter 34 Mb/s, All 0s - Result Low Intrinsic Jitter 34 Mb/s,All 0s - Jitter Unlock Intrinsic Jitter34 Mb/s, 1000 - Result High Intrinsic Jitter 34 Mb/s,All 1s - Result Low Intrinsic Jitter 34 Mb/s,All 1s - Jitter Unlock Intrinsic Jitter8 Mb/s, PRBS - Result High Intrinsic Jitter8 Mb/s - VCO not Settling Intrinsic Jitter8 Mb/s, All 0s - Result High Intrinsic Jitter 8 Mb/s,0001 - Result Low Intrinsic Jitter 8 Mb/s,1000 - Jitter Unlock Intrinsic Jitter8 Mb/s, All 1s - Result High Intrinsic Jitter 2 Mb/s,PRBS - Result Low Intrinsic Jitter 2 Mb/s,PRBS - Jitter Unlock Intrinsic Jitter 2 Mb/s,All 0s - Result Low Intrinsic Jitter 2 Mb/s,All 0s - Jitter Unlock Intrinsic Jitter2 Mb/s, 1000 - Result High Intrinsic Jitter 2 Mb/s,All 1s - Result Low Intrinsic Jitter 2 Mb/s,All 1s - Jitter Unlock

Table C-61 No.

14293 14298 14303 14308 14314 14323 14328 14334

JITTER Back to Back Tests Description

140 Mb/s, 0 UI, 10 Hz - Result Low 140 Mb/s, 0 UI, 10 Hz - Jitter Unlock 140 Mb/s, 10 UI, 100 Hz - Result Low 140 Mb/s, 10 UI, 100 Hz - Jitter Unlock 140 Mb/s, 1 UI, 10 kHz - Result High 140 Mb/s, 0.6 UI, 3 MHz - Result Low 140 Mb/s, 0.6 UI, 3 MHz - Jitter Unlock 34 Mb/s, 0 UI, 10 Hz - Result High

No.
14294 14299 14304 14313 14318 14324 14333 14338

Description
140 Mb/s, 0 UI, 10 Hz - Result High 140 Mb/s - VCO not Settling 140 Mb/s, 10 UI, 100 Hz - Result High 140 Mb/s, 1 UI, 10 kHz - Result Low 140 Mb/s, 1 UI, 10 kHz - Jitter Unlock 140 Mb/s, 0.6 UI, 3 MHz - Result High 34 Mb/s, 0 UI, 10 Hz - Result Low 34 Mb/s, 0 UI, 10 Hz - Jitter Unlock

C-34

Self Test Fail Numbers

Table C-61 No.

14339 14344 14353 14358 14364 14373 14378 14383 14388 14394 14403 14408 14414 14419 14424 14433 14438 14444

JITTER Back to Back Tests Description

34 Mb/s - VCO not Settling 34 Mb/s, 10 UI, 100 Hz - Result High 34 Mb/s, 1 UI, 200 kHz - Result Low 34 Mb/s, 1 UI, 200 kHz - Jitter Unlock 34 Mb/s, 0.6 UI, 500 kHz - Result High 8 Mb/s, 0 UI, 10 Hz - Result Low 8 Mb/s, 0 UI, 10 Hz - Jitter Unlock 8 Mb/s, 10 UI, 100 Hz - Result Low 8 Mb/s, 10 UI, 100 Hz - Jitter Unlock 8 Mb/s, 1 UI, 100 kHz - Result High 8 Mb/s, 0.6 UI, 300 kHz - Result Low 8 Mb/s, 0.6 UI, 300 kHz - Jitter Unlock 2 Mb/s, 0 UI, 10 Hz - Result High 2 Mb/s - VCO not Settling 2 Mb/s, 10 UI, 100 Hz - Result High 2 Mb/s, 1 UI, 25 kHz - Result Low 2 Mb/s, 1 UI, 25 kHz - Jitter Unlock 2 Mb/s, 0.6 UI, 80 kHz - Result High

No.
14343 14348 14354 14363 14368 14374 14379 14384 14393 14398 14404 14413 14418 14423 14428 14434 14443 14448

Description
34 Mb/s, 10 UI, 100 Hz - Result Low 34 Mb/s, 10 UI, 100 Hz - Jitter Unlock 34 Mb/s, 1 UI, 200 kHz - Result High 34 Mb/s, 0.6 UI, 500 kHz - Result Low 34 Mb/s, 0.6 UI, 500 kHz - Jitter Unlock 8 Mb/s, 0 UI, 10 Hz - Result High 8 Mb/s - VCO not Settling 8 Mb/s, 10 UI, 100 Hz - Result High 8 Mb/s, 1 UI, 100 kHz - Result Low 8 Mb/s, 1 UI, 100 kHz - Jitter Unlock 8 Mb/s, 0.6 UI, 300 kHz - Result High 2 Mb/s, 0 UI, 10 Hz - Result Low 2 Mb/s, 0 UI, 10 Hz - Jitter Unlock 2 Mb/s, 10 UI, 100 Hz - Result Low 2 Mb/s, 10 UI, 100 Hz - Jitter Unlock 2 Mb/s, 1 UI, 25 kHz - Result High 2 Mb/s, 0.6 UI, 80 kHz - Result Low 2 Mb/s, 0.6 UI, 80 kHz - Jitter Unlock

Table C-62 No.

14493 14497

STM-1 Electrical JITTER Receiver Tests Description

Intrinsic Jitter, Range 1_6, PRBS - Result Low Intrinsic Jitter Range 1_6, PRBS - Loss of Signal

No.
14494 14498

Description
Intrinsic Jitter,Range 1_6, PRBS - Result High Intrinsic Jitter Range 1_6, PRBS - Jitter Unlock

14499

Intrinsic Jitter Range 1_6, PRBS - VCO not Settling

14503

Intrinsic Jitter Range 1_6, All 0s - Result Low

14504

Intrinsic Jitter, Range 1_6, All 0s - Result High

14507

Intrinsic Jitter, Range 1_6, All 0s - Loss of Signal

14508

Intrinsic Jitter, Range 1_6, All 0s - Jitter Unlock

14513

Intrinsic Jitter Range 1_6, All 1s - Result Low

C-35

Self Test Fail Numbers

Table C-62 No.

14514

STM-1 Electrical JITTER Receiver Tests Description

Intrinsic Jitter, Range 1_6, All 1s - Result High

No.
14517

Description
Intrinsic Jitter, Range 1_6, All 1s - Loss of Signal

14518 14524 14528 14534 14538 14544 14548 14554 14558 14564 14568 14574 14578 14584 14588 14594 14598 14604 14608 14614 14618

Intrinsic Jitter, Range 1_6, All 1s - Jitter Unlock Intrinsic Jitter, Range 16, PRBS - Result High Intrinsic Jitter, Range 16, PRBS - Jitter Unlock Intrinsic Jitter, Range 16, All 0s - Result High Intrinsic Jitter, Range 16, All 0s - Jitter Unlock Intrinsic Jitter, Range 16, All 1s - Result High Intrinsic Jitter, Range 16, All 1s - Jitter Unlock Jitter Off - Result High Jitter Off - Jitter Unlock Jitter 5 UI, 100 Hz - Result High Jitter 5 UI, 100 Hz - Jitter Unlock Jitter 5 UI, 1 kHz - Result High Jitter 5 UI, 1 kHz - Jitter Unlock Jitter 1 UI, 10 kHz - Result High Jitter 1 UI, 10 kHz - Jitter Unlock Jitter 1 UI, 10 kHz - Result High Jitter 1 UI, 100 kHz - Jitter Unlock Jitter 0.5 UI, 1 MHz - Result High Jitter 0.5 UI, 1 MHz - Jitter Unlock Jitter Hits 1 UI - Result High Jitter Hits 1 UI - Jitter Unlock

14523 14527 14533 14537 14543 14547 14553 14557 14563 14567 14573 14577 14583 14587 14593 14597 14603 14607 14613 14617

Intrinsic Jitter Range 16, PRBS - Result Low Intrinsic Jitter,Range 16, PRBS - Loss of Signal Intrinsic Jitter Range 16, All 0s - Result Low Intrinsic Jitter,Range 16, All 0s - Loss of Signal Intrinsic Jitter Range 16, All 1s - Result Low Intrinsic Jitter, Range 16, All 1s - Loss of Signal Jitter Off - Result Low Jitter Off - Loss of Signal Jitter 5 UI, 100 Hz - Result Low Jitter 5 UI, 100 Hz - Loss of Signal Jitter 5 UI, 1 kHz - Result Low Jitter 5 UI, 1 kHz - Loss of Signal Jitter 1 UI, 10 kHz - Result Low Jitter 1 UI, 10 kHz - Loss of Signal Jitter 1 UI, 100 kHz - Result Low Jitter 1 UI, 10 kHz - Loss of Signal Jitter 0.5 UI, 1 MHz - Result Low Jitter 0.5 UI, 1 MHz - Loss of Signal Jitter Hits 1 UI - Result Low Jitter Hits 1 UI - Loss of Signal

Table C-63 No.

14623 14627 14633

STM-1 Optical JITTER Receiver Tests Description

Intrinsic Jitter, Range 1_6, PRBS - Result Low Intrinsic Jitter Range 1_6, PRBS - Loss of Light Intrinsic Jitter Range 1_6, All 0s - Result Low

No.
14624 14628 14634

Description
Intrinsic Jitter,Range 1_6, PRBS - Result High Intrinsic Jitter Range 1_6, PRBS - Jitter Unlock Intrinsic Jitter Range 1_6, All 0s - Result High

C-36

Self Test Fail Numbers

Table C-63 No.

14637 14643 14647 14653 14657 14663 14667 14673 14677 14683 16817 14693 14697 14703 14707 14713 14717 14723 14727 14733 14737 14743 14747

STM-1 Optical JITTER Receiver Tests Description

Intrinsic Jitter, Range 1_6, All 0s - Loss of Light Intrinsic Jitter Range 1_6, All 1s - Result Low Intrinsic Jitter, Range 1_6, All 1s - Loss of Light Intrinsic Jitter Range 16, PRBS - Result Low Intrinsic Jitter,Range 16, PRBS - Loss of Light Intrinsic Jitter Range 16, All 0s - Result Low Intrinsic Jitter,Range 16, All 0s - Loss of Light Intrinsic Jitter Range 16, All 1s - Result Low Intrinsic Jitter, Range 16, All 1s - Loss of Light Jitter Off - Result Low Jitter Off - Loss of Light Jitter 5 UI, 100 Hz - Result Low Jitter 5 UI, 100 Hz - Loss of Light Jitter 5 UI, 1 kHz - Result Low Jitter 5 UI, 1 kHz - Loss of Light Jitter 1 UI, 10 kHz - Result Low Jitter 1 UI, 10 kHz - Loss of Light Jitter 1 UI, 100 kHz - Result Low Jitter 1 UI, 100 kHz - Loss of Light Jitter 0.3 UI, 1 MHz - Result Low Jitter 0.3 UI, 1 MHz - Loss of Light Jitter Hits 1 UI, 1 kHz - Result Low Jitter Hits 1 UI, 1 kHz - Loss of Light

No.
14638 14644 14648 14654 14658 14664 14668 14674 14678 14684 14688 14694 14698 14704 14708 14714 14718 14724 14728 14734 14738 14744 14748

Description
Intrinsic Jitter, Range 1_6, All 0s - Jitter Unlock Intrinsic Jitter, Range 1_6, All 1s - Result High Intrinsic Jitter, Range 1_6, All 1s - Jitter Unlock Intrinsic Jitter, Range 16, PRBS - Result High Intrinsic Jitter, Range 16, PRBS - Jitter Unlock Intrinsic Jitter, Range 16, All 0s - Result High Intrinsic Jitter, Range 16, All 0s - Jitter Unlock Intrinsic Jitter, Range 16, All 1s - Result High Intrinsic Jitter, Range 16, All 1s - Jitter Unlock Jitter Off - Result High Jitter Off - Jitter Unlock Jitter 5 UI, 100 Hz - Result High Jitter 5 UI, 100 Hz - Jitter Unlock Jitter 5 UI, 1 kHz - Result High Jitter 5 UI, 1 kHz - Jitter Unlock Jitter 1 UI, 10 kHz - Result High Jitter 1 UI, 10 kHz - Jitter Unlock Jitter 1 UI, 100 kHz - Result High Jitter 1 UI, 100 kHz - Jitter Unlock Jitter 0.3 UI, 1 MHz - Result High Jitter 0.3 UI, 1 MHz - Jitter Unlock Jitter Hits 1 UI, 1 kHz - Result High Jitter Hits 1 UI, 1 kHz - Jitter Unlock

Table C-64 No.

14753 14757 14763

STM-4 Optical JITTER Receiver Tests Description

Intrinsic Jitter, Range 1_6, PRBS - Result Low Intrinsic Jitter Range 1_6, PRBS - Loss of Light Intrinsic Jitter Range 1_6, All 0s - Result Low

No.
14754 14758 14764

Description
Intrinsic Jitter,Range 1_6, PRBS - Result High Intrinsic Jitter Range 1_6, PRBS - Jitter Unlock Intrinsic Jitter Range 1_6, All 0s - Result High

C-37

Self Test Fail Numbers

Table C-64 No.

14767 14773 14777 14783 14787 14793 14797 14803 14807 14813 14817 14823 14827 14833 14837 14843 14847 14853 14857 14863 14867 14873 14877

STM-4 Optical JITTER Receiver Tests Description

Intrinsic Jitter, Range 1_6, All 0s - Loss of Light Intrinsic Jitter Range 1_6, All 1s - Result Low Intrinsic Jitter, Range 1_6, All 1s - Loss of Light Intrinsic Jitter Range 16, PRBS - Result Low Intrinsic Jitter,Range 16, PRBS - Loss of Light Intrinsic Jitter Range 16, All 0s - Result Low Intrinsic Jitter,Range 16, All 0s - Loss of Light Intrinsic Jitter Range 16, All 1s - Result Low Intrinsic Jitter, Range 16, All 1s - Loss of Light Jitter Off - Result Low Jitter Off - Loss of Light Jitter 5 UI, 100 Hz - Result Low Jitter 5 UI, 100 Hz - Loss of Light Jitter 5 UI, 1 kHz - Result Low Jitter 5 UI, 1 kHz - Loss of Light Jitter 1 UI, 10 kHz - Result Low Jitter 1 UI, 10 kHz - Loss of Light Jitter 1 UI, 100 kHz - Result Low Jitter 1 UI, 100 kHz - Loss of Light Jitter 0.5 UI, 1 MHz - Result Low Jitter 0.5 UI, 1 MHz - Loss of Light Jitter Hits 1 UI - Result Low Jitter Hits 1 UI - Loss of Light

No.
14768 14774 14778 14784 14788 14794 14798 14804 14808 14814 14818 14824 14828 14834 14838 14844 14848 14854 14858 14864 14868 14874 14878

Description
Intrinsic Jitter, Range 1_6, All 0s - Jitter Unlock Intrinsic Jitter, Range 1_6, All 1s - Result High Intrinsic Jitter, Range 1_6, All 1s - Jitter Unlock Intrinsic Jitter, Range 16, PRBS - Result High Intrinsic Jitter, Range 16, PRBS - Jitter Unlock Intrinsic Jitter, Range 16, All 0s - Result High Intrinsic Jitter, Range 16, All 0s - Jitter Unlock Intrinsic Jitter, Range 16, All 1s - Result High Intrinsic Jitter, Range 16, All 1s - Jitter Unlock Jitter Off - Result High Jitter Off - Jitter Unlock Jitter 5 UI, 100 Hz - Result High Jitter 5 UI, 100 Hz - Jitter Unlock Jitter 5 UI, 1 kHz - Result High Jitter 5 UI, 1 kHz - Jitter Unlock Jitter 1 UI, 10 kHz - Result High Jitter 1 UI, 10 kHz - Jitter Unlock Jitter 1 UI, 100 kHz - Result High Jitter 1 UI, 100 kHz - Jitter Unlock Jitter 0.5 UI, 1 MHz - Result High Jitter 0.5 UI, 1 MHz - Jitter Unlock Jitter Hits 1 UI - Result High Jitter Hits 1 UI - Jitter Unlock

Table C-65 No.

14145 14185

RMS JitterTests (Options A3L, A3V, A3N) Description

140 Mb/s, All 0s - Result Low 34 Mb/s, All 1s - Result Low

No.
14146 14186

Description
140 Mb/s, All 0s - Result High 34 Mb/s, All 1s - Result High

C-38

Self Test Fail Numbers

Table C-65 No.

14225 14265 14315 14355 14395 14435 14495 14595 14625 14725 14755 14855

RMS JitterTests (Options A3L, A3V, A3N) Description

8 Mb/s, All 1s - Result Low 2 Mb/s, All 1s - Result Low 140 Mb/s, 1 UI, 10 kHz - Result Low 34 Mb/s, 1 UI, 200 kHz - Result Low 8 Mb/s, 1 UI, 100 kHz - Result Low 2 Mb/s, 1 UI, 25 kHz - Result Low STM-1 E, PRBS23 - Result Low STM-1 E, 1 UI, 10 kHz - Result Low STM-1 Opt, All 1s - Result Low STM-1 Opt, 1 UI, 10 kHz - Result Low STM-4, All 0s - Result Low STM-4,1 UI, 10 kHz - Result Low

No.
14226 14266 14316 14356 14396 14436 14496 14596 14626 14726 14756 14856

Description
8 Mb/s, All 1s - Result High 2 Mb/s, All 1s - Result High 140 Mb/s, 1 UI, 10 kHz - Result High 34 Mb/s, 1 UI, 200 kHz - Result High 8 Mb/s, 1 UI, 100 kHz - Result High 2 Mb/s, 1 UI, 25 kHz - Result High STM-1 E, PRBS23 - Result High STM-1 E, 1 UI, 10 kHz - Result High STM-1 Opt, All 1s - Result High STM-1 Opt, 1 UI, 10 kHz - Result High STM-4, All 0s - Result High STM-4,1 UI, 10 kHz - Result High

Table C-66 No.

14881 14893 14898 14902 14909 14923 14928 14933 14938 14943 14948

Jitter Back to Back Tests (OPT A3K Only) Description

2 Mb/s, 80 UI, 100 Hz - Errors 2 Mb/s, 13 UI, 100 Hz - Result Low 2 Mb/s, 13 UI, 100 Hz - Jitter Unlock 2 Mb/s, 20 UI, 100 Hz - Overrange not Detected 2 Mb/s, 20 UI, 100 Hz - VCXO not Settling STM-1E, 13 UI, 100 Hz - Result Low STM-1E, 13 UI, 100 Hz - Jitter Unlock STM-1O, 13 UI, 100 Hz - Result Low STM-1O, 13 UI, 100 Hz - Jitter Unlock STM-4, 12 UI, 100 Hz - Result Low STM-4, 12 UI, 100 Hz - Jitter Unlock

No.
14889 14894 14899 14908 14911 14924 14929 14934 14939 14944 14949

Description
2 Mb/s, 80 UI, 100 Hz - VCXO not Settling 2 Mb/s, 13 UI, 100 Hz - Result High 2 Mb/s, 13 UI, 100 Hz - VCXO not Settling 2 Mb/s, 20 UI, 100 Hz - Jitter Unlock 140 Mb/s, 50 UI, 100 Hz - Errors STM-1E, 13 UI, 100 Hz - Result High STM-1E, 13 UI, 100 Hz - VCXO not Settling STM-1O, 13 UI, 100 Hz - Result High STM-1O, 13 UI, 100 Hz - VCXO not Settling STM-4, 12 UI, 100 Hz - Result High STM-4, 12 UI, 100 Hz - VCXO not Settling

C-39

Self Test Fail Numbers

C-40

Index

A Alarm Indicators ATM, 1-10 PDH, 1-9 SDH, 1-10 Alarm Scan PDH, B-2 SDH, B-2 Alarm Seconds ATM, B-38 PDH, B-37 SDH, B-38 Analysis Display Mode, 2-42 ATM Alarm Seconds, B-38 ATM Error Analysis, B-31 ATM Results Cumulative, B-6 G.826 CRC4, B-34 G.826 EM BIP, B-31 G.826 FEBE, B-32 G.826 REBE, B-33 Short Term, B-4 Autosetup, 2-17 B Basic Error Measurement, 1-14 Beep On Received Error, 2-41 C Connecting a Centronix Printer, 2-15 Connectors, 1-11 Copy Configuration from Disk to Instrument Store, 2-34 Copy Configuration from Instrument Store to Disk, 2-34 Copy Graphics from Instrument Store to Disk, 2-35 Coupling, 2-38 Create a Directory, 2-37 Cumulative Results ATM, B-6 PDH, B-5 SDH, B-5 D Date & Time, 2-39 Default Settings, 2-19 Delete a Directory, 2-36

Delete a File, 2-35 Directory Structure, 2-26 Disc Drive Printing Logging Results, 2-37 Disk Drive, 2-26?? Copy Configuration from Disk, 2-34 Copy Configuration to Disk, 2-34 Copy Graphics to Disk, 2-35 Create a Directory, 2-37 Delete a Directory, 2-36 Delete a File, 2-35 Directory Management, 2-28 Directory Structure, 2-26 Disk Portability, 2-26 File Management, 2-28 Format, 2-27 Label, 2-27 Logging Results, 2-12 Printing From, 2-13 Recall Configurations from Disk, 2-33 Recall Graphics Results from Disk, 2-33 Rename a File, 2-36 Save Configuration to Disk, 2-31 Save Data Logging to Disk, 2-32 Save Graphics Results to Disk, 2-31 E Error Event Logging, 2-9 External Printer Connecting, 2-14, 2-15 F Fail Numbers, C-1 File and Directory Management, 2-28 Floppy Disk, 2-26 Format a Disk, 2-27 Frequency Measurement, B-39 Front Panel Keys Display, 1-6 History, 1-9 Other, 1-8 G G.821 Analysis Bit, B-7 CRC, B-9 Frame (FAS), B-8 REBE, B-10

G.826 Analysis 140 Mb/s Framed, B-14 2 Mb/s CRC4 Framed, B-11 2 Mb/s Framed Not CRC4, B-12 2 Mb/s Unframed, B-12 34 Mb/s Framed, B-13 8 Mb/s Framed, B-13 8, 34 and 140 Mb/s Unframed, B-14 ATM CRC4, B-34 ATM EM BIP, B-31 ATM FEBE, B-32 ATM REBE, B-33 DS1 Unframed, B-15 DS1, D4 & SLC-96 Framing, B-16 DS1, ESF Framing, B-16 DS3 Unframed, B-15 DS3, C-Bit Framing, B-18 DS3, M23 Framing, B-17 MS B2 BIP, B-22 Path B3 BIP, B-24 Path FEBE, B-25 Path IEC, B-26 RS B1 BIP, B-21 TU Path BIP 2 Mb/s, B-28 TU Path BIP 34 Mb/s, B-27 TU Path FEBE 2 Mb/s, B-30 TU Path FEBE 34 Mb/s, B-29 Getting Started, 1-1 Graphics, 2-22-7 Logging Bar Graphs, A-7 Obtaining Results, 2-3 Printing Displays, 2-7 Recall Results, 2-4 Text Results Logging, A-9 Viewing Alarm Summary, 2-5 Viewing Bar Graphs, 2-4 Viewing Error Summary, 2-5 Viewing Stored Results Status, 2-6 H HP-IB Printer Results Logging, 2-11 I Internal Printer Paper change, 2-16

Index-1

Index

K Keyboard Lock, 2-40 L Label a Disk, 2-27 Logging Devices, A-1 Logging Messages, A-1A-12, ??A-12 Logging Results, 2-8?? At end of Measurement, A-6 Bar Graphs, A-6 Disk Drive, 2-12 During Measurement, A-2 Error & Alarm Summaries, A-9 Error Event, 2-9 Graphics Text, A-9 HP-IB Printer, 2-11 Jitter Auto Tolerance, A-12 Jitter Transfer, A-12 Logging Header, A-1 Overhead Capture, A-12 Overhead Snapshot, A-13 Pointer Graph, A-15 Result Snapshot, A-10 RS-232-C Printer, 2-11 Test Period, 2-8 Tributary Scan, A-14 M M.2100 Frame Analysis, B-19 M.2110 BIS Analysis, B-20 M.2120 Circuit Maintenance, B-20 Mainframe Operating Features, 2-1 Measurement Demo Recall Default Settings, 1-14 Miscellaneous, 2-40, 2-42 O Option Summary, 1-3 Ordering Upgrade Modules, 2-1 Overhead Capture Logging Example, A12 Overhead Snapshot Logging Example, A13 P Paper Change Internal Printer, 2-16 Parallel Port External Printer, 2-10

PDH Alarm Scan, B-2 PDH Alarm Seconds, B-37 PDH Results Cumulative, B-5 Error Analysis, B-7B-20 Short Term, B-3 Pointer Graph Logging Example, A-15 Portability of Disks, 2-26 Power Requirements, 1-5 Printer Change Paper, 2-16 Printing from Disk, 2-13 Printing Logging Results from Disc, 2-37 R Recall Configurations from Disk to Instrument, 2-33 Recall Graphics Results from Disk to Instrument, 2-33 Recall Settings, 2-24 Rename a File, 2-36 Results Definitions, B-1 Alarm Scan, B-2 ATM Alarm Seconds, B-38 Cumulative ATM, B-6 Cumulative PDH, B-5 Cumulative SDH, B-5 Frequency Measurement, B-39 G.821 Bit Analysis, B-7 G.821 CRC Analysis, B-9 G.821 Frame Analysis, B-8 G.821 REBE Analysis, B-10 G.826 ATM EM BIP, B-31, B-33, B-34 G.826 ATM FEBE, B-32 G.826 MS B2 BIP Analysis, B-22 G.826 MS FEBE Analysis, B-23 G.826 Path B3 BIP Analysis, B-24 G.826 Path FEBE, B-25 G.826 Path IEC, B-26 G.826 PDH Analysis, B-11 G.826 RS B1 BIP Analysis, B-21 G.826 TU Path BIP 2 Mb/s, B-28 G.826 TU Path BIP 34 Mb/s, B-27 G.826 TU Path FEBE 2 Mb/s, B-30 G.826 TU Path FEBE 34 Mb/s, B-29 Jitter, B-36 M.2100 Analysis, B-19 M.2110 Analysis, B-20

M.2120 Analysis, B-20 PDH Alarm Seconds, B-37 SDH Alarm Seconds, B-38 Short Term ATM, B-4 Short Term PDH, B-3 Short Term SDH, B-3 Trouble Scan, B-1 Wander, B-36 Results Logging, 2-8?? Disk Drive, 2-12 HP-IB Printer, 2-11 Parallel Printer Port, 2-10 RS-232-C Printer, 2-11 Results Snapshot Logging Example, A-11 RS-232-C Printer Logging Results, 2-11 RS-449 Loopback, 2-45 S Save Current Instrument Configuration to Disk, 2-31 Save Data Logging to Disk, 2-32 Save Graphics Results to Disk, 2-31 Save Settings, 2-24 SDH Alarm Scan, B-2 SDH Alarm Seconds, B-38 SDH Error Analysis, B-21B-30 SDH Results Cumulative, B-5 G.826 MS B2 BIP, B-22 G.826 MS FEBE, B-23 G.826 Path B3 BIP, B-24 G.826 Path FEBE, B-25 G.826 Path IEC, B-26 G.826 RS B1 BIP, B-21 G.826 TU Path BIP 2 Mb/s, B-28 G.826 TU Path BIP 34 Mb/s, B-27 G.826 TU Path FEBE 2 Mb/s, B-30 G.826 TU Path FEBE 34 Mb/s, B-29 Short Term, B-3 Self Test, 2-43 Self Test Fail Numbers, C-1 Settings Control, 2-38 Short Term Results ATM, B-4 PDH, B-3 SDH, B-3 Status Indicators, 1-9

Index-2

Index

Stored Settings, 2-19 Recall, 2-24 Save, 2-24 Title, 2-24 T Test Period Logging, 2-8 Time & Date, 2-39 Title Settings, 2-24 Tributary Scan Logging Example, A-14 Trouble Scan, B-1 U Upgrade Modules Ordering, 2-1 Analysis Control Option UKJ, 2-42 Option UKK, 2-42 W Wander Results, B-36

Index-3

Index

Index-4

Hewlett-Packard Sales and Service Offices

United States:
Hewlett-Packard Company 2101 Gaither Road Rockville MD 20850 (301) 258-2000 Hewlett-Packard Company 5201 Tollview Drive Rolling Meadows IL 60008 (708) 255-9800 Hewlett-Packard Company 1421 S. Manhattan Avenue Fullerton CA 92631 (714) 999-6700 Hewlett-Packard Company 2000 South Park Place Atlanta GA 30339 (404) 955-1500

Japan:
Yokogawa-Hewlett-Packard Ltd. Measurement Assistance Center 9-1, Takakura-Cho Hachioji-Shi Tokyo 192 Japan (81) 426 48 0722

Latin America:
Hewlett-Packard Latin America Region Headquarters 5200 Blue Lagoon Drive 9th Floor Miami Florida 33126 USA (305) 267 4245/4220

Australia/New Zealand:
Hewlett-Packard Australia Ltd. 31-41 Joseph Street Blackburn Victoria 3130 Australia Melbourne Caller 272 2555 (008) 13 1347

Canada:
Hewlett-Packard Canada Ltd. 5150 Spectrum Way Mississauga Ontario L4W 5G1 (416) 206-4725

Far East:
Hewlett-Packard Pacic Ltd. 22-30/F Peregrine Tower Lippo Centre 89 Queensway Central Hong Kong (852) 848 7070

Europe:
Hewlett-Packard European Marketing Centre PO Box 999 1180 AZ Amstelveen The Netherlands

Learning Products Map

Other learning products which apply to this instrument are listed below: PDH Operating Manual 37717-90212 SDH Operating Manual 37717-90273 Jitter Operating Manual 37717-90275 ATM Operating Manual 37717-90215 Calibration Manual 37717-90268 Remote Control Manual 37717-90269

About This Edition

This is the rst edition of the 37717- 90271 manual. It documents the product as of 07/97. Edition dates are as follows: 1st Edition 07/97 Copyright HewlettPackard Company 1997. All rights reserved. Reproduction, adaption, or translation without prior written permission is prohibited, except as allowed under the copyright laws.

In This Book
This book contains operating information relating to mainframe (not option dependent) operation of the HP 37717B.

Printed in U.K. 07/97 37717-90271