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Figure1.20. Measuredionizationenergies(ineV)forvarious impuritiesinSiandGaAs.Thelevelsbelowthegapcenterare measured dfrom f the th top t of fthe th valence l band b dand dareacceptor t levelsunlessindicatedbyD fordonorlevel.Thelevelsabove thegapcenteraremeasuredfromthebottomofthe conductionbandandaredonorlevelsunlessindicatedbyA foracceptorlevel. level 8
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Figure1.16.
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3.1 1 ctor Figure . Schematic Schematicpath pathof ofan anelectron electronin ina asemicond semiconductor. (a)Randomthermalmotion.(b)Combinedmotiondueto randomthermalmotionandanappliedelectricfield.
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Figure .2 .
DriftvelocityversuselectricfieldinSi.8