1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28

SNELL & WILMER

L.L.P. LOS ANGELES

SNELL & WILMER L.L.P. Brian G. Arnold, Bar No. 186007 barnold@swlaw.com Marjorie A. Witter, Bar No. 250061 mwitter@swlaw.com 350 South Grand Avenue Suite 2600 Two California Plaza Los Angeles, California 90071 Telephone: 213.929.2500 Facsimile: 213.929.2525 Attorneys for Plaintiff INTERCONNECT DEVICES, INC. UNITED STATES DISTRICT COURT NORTHERN DISTRICT OF CALIFORNIA SAN JOSE DIVISION

INTERCONNECT DEVICES, INC., Plaintiff, v.

Case No. COMPLAINT FOR DECLARATORY JUDGMENT DEMAND FOR JURY TRIAL

JOHNSTECH INTERNATIONAL CORP., Defendant.

18900107

COMPLAINT FOR DECLARATORY JUDGMENT

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28
SNELL & WILMER
ATTORNEYS AT LAW LOS ANGELES

Plaintiff Interconnect Devices, Inc. (IDI) brings this Complaint against Defendant Johnstech International Corp. (Johnstech) for a Declaratory Judgment that (1) IDI has not infringed U.S. Patent Nos. 7,059,866, 7,722,361, and 7,445,465; (2) that U.S. Patent Nos. 7,059,866, 7,722,361, and 7,445,465 are invalid pursuant to 35 U.S.C. 101, 102, 103 and 112; and (3) that this is an exceptional case under 35 U.S.C. 285 and for an award of all of IDIs attorneys fees and costs. THE PARTIES 1. Plaintiff Interconnect Devices, Inc. is a Delaware corporation with a principal

place of business at 5101 Richland Avenue, Kansas City, KS 66106. 2. Defendant Johnstech International Corporation is a Minnesota corporation with a

principal place of business at 1210 New Brighton Blvd., Minneapolis, MN 55413. JURISDICTION 3. 2201. 4. This Court has subject matter jurisdiction over this matter pursuant to 28 U.S.C. Plaintiff brings this action under the Federal Declaratory Judgment Act, 28 U.S.C.

1331 (Federal Question) and 1338(a) (Patent). 5. Upon information and belief, this Court has personal jurisdiction over Johnstech

because it has established minimum contacts with the forum. Johnstech maintains its Sales, Service, & Innovation Center in Santa Clara, California, and, on information and belief, has maintained this office in this district since 1995. On information and belief, the lead inventor of two of the patents-in-suit resides in this district and developed the purported inventions described in the patents-in-suit in this district. Johnstech has placed and continues to place products into the stream of commerce, which stream is directed at this district, and knows or should know that such products are used throughout the United States, including in this district. Further, Johnstech is registered to do business in California and maintains an agent for service of process in this district. VENUE

18900107

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COMPLAINT FOR DECLARATORY JUDGMENT

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SNELL & WILMER
ATTORNEYS AT LAW LOS ANGELES

6.

Venue is proper in this Court pursuant to 28 U.S.C. 1391(b) and (c), and

1400(b) because a substantial part of the events giving rise to this action occurred within this Judicial District, and because a corporation defendant shall be deemed to reside in any judicial district in which it is subject to personal jurisdiction. In addition, Johnstech maintains its Sales, Service, & Innovation Center in Santa Clara, California, and, on information and belief, the lead inventor of two of the patents-in-suit resides in this district and developed the purported inventions described in the patents-in-suit in this district. Further, IDI maintains a sales and applications engineering office in this district in Milpitas, California. THE PATENTS-IN-SUIT 7. On June 13, 2006, the United States Patent and Trademark Office (USPTO)

issued U.S. Patent No. 7,059,866 (the 866 Patent), entitled Integrated Circuit Contact to Test Apparatus. Mathew L. Gilk is the named inventor on the face of the 866 Patent. On information and belief, the 866 Patent is assigned to Johnstech. A true and correct copy of the 866 Patent is attached hereto as Exhibit A. 8. On May 25, 2010, the USPTO issued U.S. Patent No. 7,722,361 (the 361

Patent), entitled Test Socket. Jose E. Lopez, Dennis B. Shell, and Mathew L. Gilk are the named inventors on the face of the 361 Patent. On information and belief, the 361 Patent is assigned to Johnstech. A true and correct copy of the 361 Patent is attached hereto as Exhibit B. 9. On November 4, 2008, the USPTO issued U.S. Patent No. 7,445,465 (the 465

Patent), entitled Test Socket. Jose E. Lopez, Dennis B. Shell, and Mathew L. Gilk are the named inventors on the face of the 465 Patent. On information and belief, the 465 Patent is assigned to Johnstech. A true and correct copy of the 465 Patent is attached hereto as Exhibit C. FACTUAL BACKGROUND 10. IDI provides spring contact probe based technology, including connectors,

advanced semiconductor test sockets, ATE interfaces and spring contact probes. For over three decades, test engineers and product designers have turned to IDI for the most reliable interconnect designs available. IDI is the originator of the spring contact probe text socket and continues to be the leader of innovations in the semiconductor test industry.
18900107

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COMPLAINT FOR DECLARATORY JUDGMENT

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SNELL & WILMER
ATTORNEYS AT LAW LOS ANGELES

11.

On February 25, 2014, Johnstechs counsel set a cease and desist letter (the

Letter) to IDI, alleging that IDIs Archimedes test pin and socket directly infringes Johnstechs 866 Patent, 361 Patent, and 465 Patent (collectively, the patents-in-suit). A true and correct copy of the Letter is attached hereto as Exhibit D. 12. The Letter stated that its purpose was to advise IDI of the consequences of

infringement of one or more of these patents. It stated that Johnstech is aware that [IDI] will be exhibiting products at the upcoming BITS conference in Phoenix, AZ in March 2014 and warned that if IDI exhibits the Archimedes product, Johnstech will consider that an intentional infringement. 13. The Letter demanded a response in less than five business days, and stated that if

Johnstech do[es] not hear from [IDI] by March 1, 2014, we shall assume that settlement is of no interest, and continued infringement will certainly be willful. 14. By virtue of the foregoing, there is a continuing justiciable controversy between

the parties as to IDIs right to make, use, offer to sell and sell its Archimedes product, and as to the validity, enforceability and scope of the patents in suit. FEDERAL DECLARATORY JUDGMENT ACT 15. Pursuant to the Federal Declaratory Judgment Act, 28 U.S.C. 2201, this Court

may declare the rights and other legal relations of any interested party. 16. As set forth in the Letter, Johnstech has asserted that IDI infringes Johnstechs

866 Patent, 361 Patent, and 465 Patent. 17. 18. A real and actual substantial controversy exists between IDI and Johnstech. IDI and Johnstech have adverse legal interests with respect to the threats of patent

infringement made by Johnstech against IDI. 19. Johnstech has made antagonistic claims that are immediate and that indicate

imminent and inevitable litigation. 20. The interests of the parties will be best served if this Court enters a Declaratory

Judgment setting forth the rights of the parties with respect to this dispute.

18900107

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COMPLAINT FOR DECLARATORY JUDGMENT

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SNELL & WILMER
ATTORNEYS AT LAW LOS ANGELES

21.

The relief sought by IDI will resolve the controversy relative to the respective

interests of IDI and Johnstech. COUNT I DECLARATORY JUDGMENT OF NON-INFRINGEMENT OF THE 866 PATENT 22. 23. 24. 25. Each of paragraphs 1 through 21 is incorporated herein by reference. On information and belief, 866 Patent is assigned to Johnstech. IDI has not infringed and does not infringe any valid claim of the 866 Patent. There is an actual, substantial and immediate controversy between the adverse

interests of IDI and Johnstech as to whether IDIs use, making, sale or offering for sale of its Archimedes test pin and socket infringes the claims of the 866 Patent. 26. IDI is entitled to a Judicial Declaration and Order that IDI has not infringed and

does not infringe, either directly or indirectly, literally or under the doctrine of equivalents, any valid claim of the 866 Patent. COUNT II DECLARATORY JUDGMENT OF INVALIDITY OF THE 866 PATENT 27. 28. 29. Each of paragraphs 1 through 26 is incorporated herein by reference. On information and belief, 866 Patent is assigned to Johnstech. The 866 Patent is invalid for failure to satisfy one or more of the conditions of

patentability set forth in Title 35 of the United States Code, including, but not limited to, 35 U.S.C. 101, 102, 103, and 112. 30. An actual, substantial and immediate controversy exists between IDI and

Johnstech as to whether the claims of the 866 Patent are valid. 31. IDI is entitled to a Judicial Declaration and Order that the 866 Patent is invalid. COUNT III DECLARATORY JUDGMENT OF NON-INFRINGEMENT OF THE 361 PATENT 32. 33. 34.
18900107

Each of paragraphs 1 through 31 is incorporated herein by reference. On information and belief, the 361 Patent is assigned to Johnstech. IDI has not infringed and does not infringe any valid claim of the 361 Patent. -5COMPLAINT FOR DECLARATORY JUDGMENT

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28
SNELL & WILMER
ATTORNEYS AT LAW LOS ANGELES

35.

There is an actual, substantial and immediate controversy between the adverse

interests of IDI and Johnstech as to whether IDIs use, making, sale or offering for sale of its Archimedes test pin and socket infringes the claims of the 361 Patent. 36. IDI is entitled to a Judicial Declaration and Order that IDI has not infringed and

does not infringe, either directly or indirectly, literally or under the doctrine of equivalents, any valid claim of the 361 Patent. COUNT IV DECLARATORY JUDGMENT OF INVALIDITY OF THE 361 PATENT 37. 38. 39. Each of paragraphs 1 through 36 is incorporated herein by reference. On information and belief, the 361 Patent is assigned to Johnstech. The 361 Patent is invalid for failure to satisfy one or more of the conditions of

patentability set forth in Title 35 of the United States Code, including, but not limited to, 35 U.S.C. 101, 102, 103, and 112. 40. An actual, substantial and immediate controversy exists between IDI and

Johnstech as to whether the claims of the 361 Patent are valid. 41. IDI is entitled to a Judicial Declaration and Order that the 361 Patent is invalid. COUNT V DECLARATORY JUDGMENT OF NON-INFRINGEMENT OF THE 465 PATENT 42. 43. 44. 45. Each of paragraphs 1 through 41 is incorporated herein by reference. On information and belief, the 465 Patent is assigned to Johnstech. IDI has not infringed and does not infringe any valid claim of the 465 Patent. There is an actual, substantial and immediate controversy between the adverse

interests of IDI and Johnstech as to whether IDIs use, making, sale or offering for sale of its Archimedes test pin and socket infringes the claims of the 465 Patent. 46. IDI is entitled to a Judicial Declaration and Order that IDI has not infringed and

does not infringe, either directly or indirectly, literally or under the doctrine of equivalents, any valid claim of the 465 Patent. ///
18900107

-6-

COMPLAINT FOR DECLARATORY JUDGMENT

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28
SNELL & WILMER
ATTORNEYS AT LAW LOS ANGELES

COUNT VI DECLARATORY JUDGMENT OF INVALIDITY OF THE 465 PATENT 47. 48. 49. Each of paragraphs 1 through 46 is incorporated herein by reference. On information and belief, the 465 Patent is assigned to Johnstech. The 465 Patent is invalid for failure to satisfy one or more of the conditions of

patentability set forth in Title 35 of the United States Code, including, but not limited to, 35 U.S.C. 101, 102, 103, and 112. 50. An actual, substantial and immediate controversy exists between IDI and

Johnstech as to whether the claims of the 465 Patent are valid. 51. IDI is entitled to a Judicial Declaration and Order that the 465 Patent is invalid. PRAYER FOR RELIEF WHEREFORE, IDI respectfully requests that the Court enter judgment in its favor and against Johnstech as follows: A. B. C. D. E. F. G. The Court enter judgment that the 866 Patent is not infringed by IDI. The Court enter judgment that the 866 Patent is invalid. The Court enter judgment that the 361 Patent is not infringed by IDI. The Court enter judgment that the 361 Patent is invalid. The Court enter judgment that the 465 Patent is not infringed by IDI. The Court enter judgment that the 465 Patent is invalid. The Court find this case to be an exceptional case pursuant to 35 U.S.C. 285

and award IDI its attorneys fees in this action; and H. and proper. \\\ \\\ \\\ \\\ \\\
18900107

The Court enter an order for such other and further relief as this Court deems just

-7-

COMPLAINT FOR DECLARATORY JUDGMENT

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28
SNELL & WILMER
ATTORNEYS AT LAW LOS ANGELES

Dated: March 10, 2014

SNELL & WILMER L.L.P.

By: /s/ Brian G. Arnold Brian G. Arnold Marjorie A. Witter Attorneys for Plaintiff INTERCONNECT DEVICES, INC.

18900107

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COMPLAINT FOR DECLARATORY JUDGMENT

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28
SNELL & WILMER
ATTORNEYS AT LAW LOS ANGELES

DEMAND FOR JURY TRIAL IDI hereby demands a jury trial on any issue triable of right by a jury pursuant to Rule 38 of the Federal Rules of Civil Procedure. Dated: March 10, 2014 SNELL & WILMER L.L.P.

By: /s/ Brian G. Arnold Brian G. Arnold Marjorie A. Witter Attorneys for Plaintiff INTERCONNECT DEVICES, INC.

18900107

-9-

COMPLAINT FOR DECLARATORY JUDGMENT

EXHIBIT A

US007059866B2

(12)

United States Patent

Gilk
INTEGRATED CIRCUIT CONTACT TO TEST

(10) Patent N0.:

(45) Date of Patent:
5,634,801 A *

US 7,059,866 B2
Jun. 13, 2006

(54)

6/1997 Johnson ..................... .. 439/71

APPARATUS

5,749,738 A 6,019,612 A

5/1998 Johnson et a1. 2/2000 Hasegawa et a1.

439/66 439/73

(75)
(73)

Inventor:

Mathew L_ Gilk, Lakeville, MN (Us)

6,231,353 B1
6,244,874 B1

5/2001 Rathburn
6/2001 Tan ...... ..

439/66
439/66

AssigneeZ JohnsTech International Corporation

6,572,388 B1

6/2003 Lee ........................... .. 439/71

Minneapolis, MN (US)
(*) Notice: Subject to any disclaimer, the term of this
. . . y ays.

FOREIGN PATENT DOCUMENTS

JP 2002'043004 A 2/2002

Brochure entitled SMT type Low-inductance Socket, [C299

(21) Appl, N0.: 10/829,577

(22) Filed: Apr. 22, 2004
_ _ _

Series published by Yamaichi Electronics Co. Ltd.

* Cited by examiner
Primary Examiner4Chandrika Prasad

(65)

Pnor Pubhcatlon Data

US 2004/0248448 A1 Dec. 9, 2004

(74) Attorney, Agent, or FirmiNawrocki, Rooney &

SiVeITSOn, P-A

Related US. Application Data

(60)
51

(57)

ABSTRACT

Provisional application NO 60/465022 ?led on Apr 23 2003'

I t Cl

A contact test set for use in testing integrated circuits. The set includes a housing having oppositely-facing surfaces and one or more slots extending through the housing between the

( ) 130'? '12/00 H05K1/00

(52)

2006 01 (2006'01)
( ' )

surfaces. A ?rst surface, during use of the test set, is approached by an integrated circuit to be tested, and a
second surface is proximate the load board at a test site. A
Contact is received in a Slot, each Contact having a ?rst end

US. Cl. ....... ...... ..: .................................... .. 439/66

(58)

Field of Classi?cation Search ................ .. 439/65, _ _ 439/66 68 69 70 71 72 73 591

engagable by a lead of the integrated Circuit device_ A second end of each contact is in engagement with a corre

(56)

See aPPhCaUOn ?le for Complete Search hlstoryR f Ct d

e erences 1 e

U.S. PATENT DOCUMENTS

5,069,629 A 12/1991 Johnson ..................... .. 439/71

sponding terminal. Each contact is movable between a ?rst orientation, unengaged by a corresponding lead of an IC and a second orientation in which the 1C is engaged by the corresponding lead of an IC and urged into its slot. An
elastomer biases the contact to its ?rst orientation. The contact, when moved between its ?rst and second orienta tions, does not slide across a terminal of the load board.

5,207,584 A * 5,388,996 A * 5,437,556 A

5,594,355 A

5/1993 Johnson 2/1995 Johnson 8/1995 Bargain et a1. .

439/66 439/65 439/66

1/1997 Ludwig .................... .. 324/755

4 Claims, 1 Drawing Sheet

\\ 38
22 17
I

_ .J

$8 . s. V

f
9

44

m 13

US 7,059,866 B2
1
INTEGRATED CIRCUIT CONTACT TO TEST APPARATUS

2
In use, a lead of an integrated circuit Will be made to engage the nose of a contact at the curved surface. Such

action will effect compression of the front elastomer. The

This is a regular application ?led under 35 U.S.C. lll(a)

contact Will rotate about a curved surface de?ned by an axis

claiming priority, under 35 U.S.C. ll9(e)(l), of provi sional application Ser. No. 60/465,022, previously ?led Apr.
23, 2003 under 35 U.S.C. 111(b).
BACKGROUND OF THE INVENTION

through the tail. A linear contact surface of the tail, adjacent the curved surface, is parallel to and in engagement With the terminal pad of the load board. This contact con?guration tends to substantially eliminate sliding motion of the contact against the terminal pad of the load board. The engagement portion of the contact With the terminal pad moves forWard
as a result of the rolling of the contact, simultaneously

1. Technical Field The present invention relates to a connector apparatus

preventing sliding betWeen the tail and terminal pad.

The terminus of the contact tail also has a surface that engages a Wall of the housing. This surface serves to

Which accomplishes interfacing of an integrated circuit With

an IC test apparatus. More particularly, the present invention provides an electrical connection system Which facilitates a positive connection betWeen an IC device under test (DUT) and a load board of the test apparatus, and positive restraint of very small connectors utiliZed in current test apparatus. 2. Description of the Related Art Many different test site con?gurations have been devised

positively prevent the contact from sliding along the termi nal of the load board by maintaining the position of the
contact relative to the housing. The front elastomer also

20

plays a role in achieving this by urging the tail of the contact toWard the housing Wall and maintaining the contact seated against that Wall.
The present invention is thus a contact set assembly Which

for quickly and temporarily connecting integrated circuit

leads of a device to be tested to a load board of a tester.

Automated test apparatus in particular use a number of such

solves many of the problems of the prior art. It enables positive contact to be established along electrical paths, yet
it minimiZes erosion of a lead of a load board 12.

con?gurations. One arrangement uses force brought to bear

upon a contact positioned betWeen a lead of the IC and the load board to deform a probe tip of the contact and engage a pad on the load board. Another arrangement is to use engagement force applied by the IC to rotate a contact mounted Within a slot to overcome positional bias imposed by an elastomeric element to the contact. An end of the

BRIEF DESCRIPTION OF THE DRAWING

The objects and features of the present invention Will

become more apparent to those skilled in the art upon
30

contact opposite an end engaged by the IC contacts a pad of the load board When the IC and test site are brought together.

reference to the folloWing description, taken in conjunction With the accompanying draWing Wherein like reference
numerals refer to the same part or feature, and Wherein: The FIGURE is a cross-section vieW of the present invention.

Such con?gurations provide for positive connection

betWeen leads of a DUT and corresponding leads of a test

apparatus and rely upon the initial engagement betWeen the

DUT and test site to ensure a positive connection.

35

It Would be desirable to provide a system affording

DETAILED DESCRIPTION OF THE INVENTION

40

additional predetermined force, in addition to that provided

by initial engagement of the DUT and the test apparatus, to better ensure a positive electrical connection. Further, it Would be desirable that excessive force not be required
betWeen the DUT and test site. It is to these dictates of the prior art that the current invention is directed. The present invention is an apparatus Which accommodates these dictates.
SUMMARY OF THE INVENTION

A contactor assembly 5, as shoWn in the FIGURE, is

mounted in a housing 10. Housing 10 has generally planar,

parallel opposed sides 22 essentially at right angles to pairs of opposed edges. Housing 10 is con?gured to effect elec
45

trical connection of an integrated circuit device (DUT) 14 to a load board 12. Device 14 has leads 17 and load board 12 has terminals or pads 16 Which are electrically connected by contacts 18 mounted Within housing 10.

Parallel sides of housing 10 bound generally equally spaced parallel slots 20, each for receiving a corresponding
50

The present invention is a small pin contactor arrange

contact 18 therein.

ment, positioned Within a housing, for facilitating connect ing the leads of an integrated circuit to corresponding
terminals of a load board. The housing typically has a

plurality of generally parallel slots for receiving a corre sponding plurality of contacts, one in each slot. Each contact
has a nose end that extends from its slot on one side of the housing, and a tail end that extends from its slot on an

Each slot 20, it is intended, contains a contact 18. Con tacts 18 are thin With generally planar surfaces. Each has a nose end 26 and a tail end 28 Which together de?ne an essentially S shaped structure. Nose end 26 is, as illus
55

trated, larger than tail end 28 to provide a greater outWard extension to protrude from housing 10 beyond one side to
contact leads 17 of device 14. Tail end 28 has a linear portion 29 to provide a positive electrical connection to terminals 16 of lead board 12.

opposing side of the housing. The contacts are generally S

shaped. A front elastomer extends through the housing along

an axis generally perpendicular to the slots such that the nose
of a contact curves over the front elastomer. Arear elastomer
60

Generally tubular shaped channels 31 and 33 extend

also extends along an axis generally perpendicular to the

slots such that the tail of the contact curves around the rear

through housing 10 along axes generally perpendicular to planes de?ned by slots 20 With front channel 31 being larger
than rear channel 33 to better conform to the corresponding
65

elastomer.
The nose of the contact has a curved surface to be engaged by a lead of an integrated circuit. The tail of the contact has

concave portion of edges of engaged nose ends 26 and tail ends 28. A cylindrical shaped front elastomer 30 is received Within front channel 31, and a cylindrical shaped rear
elastomer 32 is received Within rear channel 33.

a ?at portion for engaging a terminal pad of the load board.

US 7,059,866 B2
3
Nose end 26 has a concave inner edge 25 Which engages

4
tomers, the point of contact betWeen the lead 17 and the contact tail 28 Walks forWard on the load board 12 (translates horizontally) and travels along the loWer contact arc 13. The ?at portion 29 of the contact tail design 28 controls
location of contact nose 26 While alloWing the contact nose

and bears against front elastomer 30. Similarly, tail end 28

has a concave inner edge 42 Which engages and bears against rear elastomer 32. Front channel 31 and rear channel

33 have corresponding communicating apertures 33, 35

extending through to load board 12. Proximate sides of
channels 33, 35 are spaced closer than distances the same as

the diameters of their respective channels 31, 33. This permits inserting elastomers 30 and 32 into channels 31, 33

26 to be pre-loaded in the uncompressed state, as illustrated in the FIGURE. The ?at portion 29 of the contact tail 28 constrains the contact 18 from achieving an ultimate rolling

equilibrium position, and alloWs the partial compression of

the front elastomer 30 Without sliding of the tail 28 With
respect to the load board 12. This creates immediate contact

by urging them through their respective apertures 33, 35.

Elastomers 30, 32 are thereby retained in place.
An alignor 36 extends across an outer portion of housing 10 proximate the nose end 26 of the contact 18. The portion of the alignor 26 opposite contacts 18 de?nes a stop 38. The alignor 36 locates an edge of DUT 14 such that its leads 17 are opposite the outWard extensions of corresponding nose ends 26 of contacts 18, and also orients the leads 17 parallel to the contacts 18. Stop 38 also limits the outWard extension
of contacts 18.

force at the load board 12, Which improves the effective

compliance range (operating range) of the contactor system.

In lieu of a ?at portion 29 on the contact tail 28, the alignor 38 can be used to control the contact nose 26 position

and provide the necessary constraint to facilitate pre-loading

the nose 26 of the contact 18.

DUT 14 is positioned proximate housing 10 in the posi

tion and orientation shoWn in the FIGURE. Apparatus, not shoWn, determines the precise location of device 14 relative to surface 19 of housing 10 such that each lead 17 is directly
opposite a contact 18. DUT 14 is then moved closer to housing 10 as shoWn in the FIGURE. This effects engage ment of the device 14 and the nose end 26 of a corresponding contact 18. Contacts 18 are thus rotated, their nose ends 26
20

This design can be alternatively con?gured as a single elastomer system. In this con?guration the rear elastomer 32 Would de?ne the applicable force necessary at both the contact nose 26 and contact tail 28. The design of housing 10 and contact 18 Would be modi?ed from the FIGURE to

facilitate this con?guration option. The rear elastomer 32,

again, can be placed in either tensile extension or compres
sion.

25

It Will be understood that this disclosure, in many

engaged by opposing leads 17 and their tail ends 28 engag

ing terminals 16. This rotation of contacts 18 Will also result in ?at portion 29 of each rising up slightly at one end as its contact rolls counterclockwise, as shoWn by arroW 44 in the FIGURE. Such action results in front elastomer 30 and rear elas tomer 32 both being compressed. Since the diameters and characteristics of the elastomers are selectable, the amount of force required to compress the elastomers can be pre
selected. This force is chosen so as to be suf?cient to provide

respects, is only illustrative. Changes may be made in details, particularly in matters of shape, siZe, material, and arrangement of parts Without exceeding the scope of the
invention. Accordingly, the scope of the invention is as
30

de?ned in the language of the appended claims.

What is claimed is:

1. Apparatus for electrically connecting a lead of the

integrated circuit to be tested to a corresponding terminal of
a load board at a test site, comprising:
35

a housing having oppositely facing surfaces, a ?rst

approachable by an integrated circuit to be tested and a second proximate the load board, a slot extend through

a good electrical connection betWeen the leads and termi nals. In the dual elastomer con?guration as pictured in the

FIGURE, the front elastomer 30 provides ?exibility in

controlling contact force by the device 14 in addition to aiding in keeping the contact tail 28 engaged against a Wall surface 6. In this con?guration the front elastomer 30 is fully in compression. As the front elastomer 30 is compressed, the
displaced material can expand into an elastomer relief area 8. The rear elastomer 32 can be con?gured and used in either tension or compression. The front elastomer 30 can play a signi?cant role in
40

said housing from a ?rst of said oppositely facing surfaces to a second of said oppositely facing surfaces;
a contact receivable in said slot having a ?rst end eng

45

agable by the lead and a second end in engagement With the terminal, said contact being rollable across the terminal betWeen a ?rst orientation unengaged by the lead of the integrated circuit and a second orientation in Which said ?rst end of said contact is engaged by the

lead of the integrated circuit and urged into said slot;

and means for biasing said contact to said ?rst orientation, Wherein, as said contact is rolled betWeen said ?rst and

preventing contacts 18 from being easily released from the

housing 10 While the contacts 18 are not engaged by DUT 14, as after implacement. A contact 18 is rotated clockWise, and the contact 18 is then pinched betWeen the front elas
tomer 30 and alignor 36. As a contact 18 is removed from the bottom, both the front and rear elastomers 30, 32 need to

said second orientations thereof, sliding motion of said

second end of said contact across the terminal is

substantially eliminated.
2. Apparatus in accordance With claim 1 Wherein said
55

be compressed to permit the contact 18 to pass betWeen the

tWo.

This contactor system has been designed to prevent contact translational relative motion (sliding) against the
load board 28. Sliding motion causes Wear on the load board

contact is generally S-shaped.

3. Apparatus in accordance With claim 2 Wherein said means for biasing comprises a ?rst elastomer interfacing
With said ?rst end of said contact and a second elastomer

pads, an undesirable characteristic. The sloped terminus of contact tail 6 in engagement With housing Wall 15 is instru mental in preventing the contact 18 from sliding along the load board 12. The front elastomer 30 also plays a role in helping achieve this end by forcing the contact 18 in a direction to remain seated against Wall 15 of the housing 10. Rather than sliding along leads 17 as contacts of previous contactors do, the contact motion in the present invention is
a rolling action. As the contact 18 compresses the elas

60

interfacing With said second end of said contact. 4. Apparatus in accordance With claim 3 Wherein second end of said contact includes a protrusion, Wherein said housing de?nes a Wall engaged by said trusion to substantially eliminate sliding motion of
second end of said contact across the terminal.

said and pro said

EXHIBIT B

US007722361B2

(12) Unlted States Patent

Lopez et a].
(54)
(76)

(10) Patent N0.2

(45) Date of Patent:
5,069,629 A
5,189,363 A 5,594,355 A *

US 7,722,361 B2
*May 25, 2010

TEST SOCKET
Inventors: Jose E. Lopez, 665 Santa Paula Ave.,

12/1991 Johnson
2/1993 Bregman et a1. 1/1997 Ludwig .................... .. 324/755

Sunnyvale, CA (US) 94044; Dennis B, Shell, 7243 40th St. West, Webster, MN (US) 55088; Mathew L. Gilk, 70537 Toledo Dr. North, Minneapolis, MN (US)
554435424

5,609,489 5,634,801 6,231,353 6,244,874

A A B1 B1

3/1997 6/1997 5/2001 6/2001

6/2003

Bickford et a1. Johnson Rathburn Tan

Lee ........................... .. 439/71

6,572,388 B2 *

6,794,890 B1

9/2004 Tokumo

(*)

Notice:

Subject to any disclaimer, the term of this patent is extended or adjusted under 35
U'S'C' 154(1)) by 0 days
_

6,854,981 B2

*
2004/0067665 A1 *
2004/0217771 A1

2/2005 Nelson_ gagagtniel

ran e a . . . . . . . . . . . . . . . . ..

439/71

4/2004 Nakano ..................... .. 439/70

11/2004 Leong

glglillgitem 1S Sublect to a tenmnal dls

2004/0248448 A1 * 12/2004 Gilk ......................... .. 439/264

(21) APPl- N01 12/264008

(22) Filed: NOV. 3, 2008 EP
* 't d b

FOREIGN PATENT DOCUMENTS

1 482 595 A
'

12/2004

(65)

Prior Publication Data

Us 2009/0053912 A1 Feb. 26, 2009 C1 e y exammer

Related US- Application Data

Primary ExamineriT C Patel Assistant ExamineriVladimir lmas

(63) Continuation of application No. 11/482,644, ?led on

Jul. 7, 2006, noW Pat. NO. 7,445,465.

Alloy;
Ive/Son, ~

Agent or FlrmiNawrockl Rooney &

ABSTRACT

(60) Provisional application No. 60/697,693, ?led on Jul. 8, 2005, provisional application No. 60/776,654, ?led on

(57)

223201
'

68 13588251011211apphCanOnNO' 60/69772 1
'

An improved test socket for use in testing integrated circuits.

The test socket includes a housing having one or more slots

(51)
(52) 58

Int Cl H0'1R 2/00

U 5 Cl F: I'd

(2006 01)
"" "_ ""
' """ 439/72 """""""""" " 439/72

formed therein. Contacts can be received Within respective slots and maintained therein With rear ends of the contacts in
engagement With traces on a load board. Mounting is accom plished by means ofa pair of elastomers, and the elastomers

)
S

1e

assl canon earc

73 754

maintain each contact such that, When the front end of a

contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace

(56)

1, _ ?l f 1 h ee app lcanon e or Comp ete Seam lstory' References Cited

With virtually no translational or rotational sliding.

U.S. PATENT DOCUMENTS

4,980,245 A

12/1990 Marino

6 Claims, 2 Drawing Sheets

sq&\/WWWWW
, I s

,,

4,

US. Patent

May 25, 2010

Sheet 2 of2

US 7,722,361 B2

11))

US 7,722,361 B2
1
TEST SOCKET CROSS-REFERENCE TO RELATED APPLICATIONS

2
SUMMARY OF THE INVENTION

The present invention is an improved test socket. It includes a housing Which has a ?rst surface that is placed into engagement With a surface of a tester load board. The housing

This is a continuation of application Ser. No. 11/482,644

?led on Jul. 7, 2006 now US. Pat. No. 7,445,465, Which

claims priority of the following provisional applications ?led

under 35 U.S.C. 111(a) claiming priority, under 35 U.S.C.

119(e) (1): provisional application Ser. No. 60/697,693, pre viously ?led Jul. 8, 2005, under 35 U.S.C. 111(b); provi
sional application Ser. No. 60/776,654, previously ?led on Feb. 24, 2006, under 35 U.S.C. 111(b); and provisional application Ser. No. 60/697,721, previously ?led on Jul. 8, 2005, under 35 U.S.C. 111(b).
TECHNICAL FIELD

has a second surface Which is generally parallel to, and spaced from, the housing ?rst surface. The second surface of the housing faces in a direction opposite that in Which the ?rst surface faces. At least one slot, extending through the housing betWeen the ?rst and second surfaces thereof, is formed in the
housing. A contact is received in a corresponding slot. Such a contact has a front end Which normally extends beyond the

second surface of the housing to be engaged by a correspond

ing lead or pad of a device to be tested. The contact further has
a rear end Which de?nes an arcuate surface, the arcuate sur

The present invention deals With electronic component

testing technologies. More speci?cally, hoWever, the inven

tion deals With test sockets Which employ contacts for testing
an electronic component. A test socket includes contacts

20

face engaging a corresponding trace formed on the surface of the tester load board. The contact is elastomerically mounted in its slot such that, When the front end of the contact is engaged by the lead or the pad of the device to be tested and urged into its slot, the arcuate surface of the contact rolls
across its corresponding trace on the surface of the tester load

Which interconnect and provide an electronic path betWeen a lead or pad of the electronic component to be tested and a
corresponding trace on a load board. The invention focuses
25

board With virtually no translational or rotational sliding. Abrasion betWeen the contact and the load board is, thereby,

substantially eliminated.
It is envisioned that the rear end of the contact, in addition to de?ning the arcuate surface in engagement With the load board, also de?nes a gradually arcing surface Which is angu

upon control and regulation of forces applied to a device lead or pad and a load board trace by a corresponding contact of
the test socket.
30

larly spaced from the arcuate surface thereof. The housing, in

this embodiment, de?nes a Wall Within the slot. The Wall is

BACKGROUND OF THE INVENTION

engaged by the gradually arcing surface of the rear end of the contact, and the spatial relationship betWeen the gradually
arcing surface and the Wall is such that, as the front end of the contact is engaged by the lead or pad of the device to be tested

Integrated circuit device testing is a procedure Which has

been observed for many years in order to obtain as high a

degree of quality control as possible for electronic devices. A

tester typically includes a plurality of conductive traces
formed on a load board associated With the tester apparatus. It is necessary to interconnect a lead, of a leaded device, or a

and urged into the corresponding slot, the gradually arcing

35

surface moves along the Wall and causes the arcuate surface of the contact to roll across its corresponding trace. It is envi

pad, of a non-leaded device, to a corresponding trace on the

load board in order to effectuate testing. A test socket having a plurality of contacts is interposed betWeen the device under
test and the load board in order to effectuate interconnection. One contact engages, at a front end, the lead orpad of a device under test With its corresponding trace on the load board. Over the years, shape and construction of such contacts have evolved in response to the construction of test sockets, load boards, and architecture of devices to be tested. For merly, it Was considered necessary to have a Wiping action at the various locations of engagement at the contact ends in

sioned that the Wall de?ned by the housing Would be angu larly spaced at an acute angle relative to the ?rst surface of the housing. This Would enable the arcuate surface of the contact
40

to roll across the trace of the tester load board With virtually no translational or rotational sliding.

A preferred embodiment of the invention employs a pair of elastomers, crossing perpendicularly across the slots, to
45

effect the elastomeric mounting of the contacts. A front elas tomer is positioned in a channel betWeen the surface of the tester load board and the contacts. The front elastomer is pre-compressed in vieW of the fact that a shoulder de?ned by the housing can be employed to engage the contacts and limit

the distance they extend beyond the second surface of the

50

order to provide a good transmission path. As technology has progressed, hoWever, it has become apparent that less Wiping
action is necessary to maintain a good transmission path than What Was formerly believed. Furthermore, it has become

housing. Pre-compression is, thereby, accomplished by the

contacts and the load board sandWiching the front elastomer
therebetWeen. The front elastomer becomes further com

apparent that excessive Wiping action damages component parts at the various points of engagement and signi?cantly
decreases the life of the test socket and tester load board.

pressed by the contacts as they are engaged by the leads or pads of the device to be tested and urged into their respective
55

slots.
The rear elastomer pre-loads the rear end of the contact. It thereby maintains contact betWeen the rear end of each con tact against its corresponding trace on the surface of the tester

Consequently, various attempts have been made to minimiZe

abrading of one surface relative to another. The current state of the art, hoWever, has been unable to de?ne a construction adequate to both maximize ef?ciency of the test socket and minimize abrasion and consequent deterioration of compo nent parts. It is to these problems and dictates of the prior art that the

60

load board. The present invention can employ contacts made of pre cious metals. Such contacts extend load board life. A Neyoro G contact is a solid gold alloy contact Without any plating. While it has been found that such a material extends the life of

present invention is directed. Its advantages Will become

more apparent With reference to the Summary of the Inven
65

the contact, it also extends loadboard life. By using Neyoro G

material for the contacts, load board life can, it has been found, be at least doubled over load board life in mechanisms knoWn in the prior art.

tion, Detailed Description of the Invention, appended claims

and accompanying draWing ?gures.

US 7,722,361 B2
3
The present invention is thus an improved test socket Which

4
tester load board 12 on Which the traces 14 are formed. The

addresses the dictates of the prior art and solves problems thereof. More speci?c features and advantages obtained in
vieW of those features Will become apparent With reference to

the Detailed Description of the Invention, appended claims

and accompanying drawing ?gures.

BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a sectional vieW of a test socket in accordance

housing 32 has a second surface 36 Which is generally parallel to, and spaced from, the ?rst surface thereof. The second surface 36 of the housing 32 faces oppositely from the ?rst surface 34. As previously discussed, the housing 32 carries a plurality of contacts 24. A plurality of slots 38 are provided,
each slot to receive a single one of the contacts 24.

FIG. 2 illustrates, in perspective, an individual contact in accordance With the present invention. The contact 24

includes ?rst, second and third protrusions 40, 42, 44. The
?rst protrusion 40 is de?ned by the rear end 30 of the contact 24 Which engages the trace 14 of the load board 12. The third protrusion 44 is de?ned by the front end 26 of the contact 24 Which is engaged by a lead 20 or pad of the device under test 18. The second protrusion 42 serves to engage, When mounted by a plurality of elastomers 46, 48, as Will be dis cussed hereinafter, a shoulder 49 de?ned by the housing 32.

With the present invention shoWing contact and elastomer

response to engagement of a contact by a lead of a device

under test; and

FIG. 2 is a perspective vieW of a contact for use in the

present invention.
DETAILED DESCRIPTION OF THE INVENTION

Engagement of the shoulder 49 by the second protrusion 42

Referring noW to the draWing ?gures, Wherein like refer ence numerals denote like elements throughout the several
vieWs, FIG. 1 illustrates a test socket 10 in accordance With the present invention. The test socket 10 is intended for use
20

serves to limit the degree of upWard movement of the contact 24 and the distance the front end 26 of the contact 24 Will

extend beyond the second surface 36 of the housing 32 When

the contact 24 is not engaged by a device to be tested. Referring again to FIG. 1, the test socket 10 has a pair of
25

With a tester typically employed for ascertaining quality of integrated circuit devices used in electronic appliances. The
tester interfaces With a tester load board 12 Which has elec trically conductive traces 14 formed on a surface 16 thereof to enable electronic communication betWeen the tester and an

channels 50, 52 Which extend along axes generally transverse to planes de?ned by the slots 38 formed in the housing 32.
These channels 50, 52 are intended to receive elastomers 46,
48 Which serve to mount the contacts 24 in their slots 38. FIG.

integrated circuit device 18 to be tested. That is, electrical

signals are transmitted betWeen the device under test 18 and the test apparatus through the test socket 10. FIG. 1 illustrates a DUT package Which is provided With a
30

1 shoWs a generally circular channel 50 receiving a larger, front elastomer 46, and a rectangular channel 52 receiving a
smaller, rear elastomer 48. The rear elastomer 48 is pre loaded and, because of the arcuate surface 28 of the rear end

plurality of leads 20, only one of Which is shoWn. FIG. 1 illustrates only a portion of the device under test 18, but it Will be understood that substantially identical leads extend along both of opposite sides of the device package 18.
FIG. 1 further illustrates a lead backer Which, When the device under test 18 is brought into engagement With its leads 20 in contact With corresponding contacts 24 of the test socket

30 of the contact 24 being in engagement With the load board

12, Will engage an upper edge of the rear end 30 of the contact 24 at a location to urge the front end 26 of the contact 24
35

upWardly. Similarly, the front elastomer 46 is under compres

sion and also serves to urge the contact 24 upWard and bias it to a point of initial contact by a lead 24 or pad of an integrated circuit device 18 to be tested. As previously alluded to, the arcuate surface 28 in engage ment With the trace 14 on the load board 12 has no, if any,

10, deters bending of the leads 20. DoWnWard pressure is brought to bear upon the device 18 under test by a plunger

40

mechanism (not shoWn). The plunger depresses, When testing

is to be conducted, the contacts 24 to overcome an upWard

appreciable translational or rotational sliding along the trace

14 ofthe load board 12. This is so because of an angled Wall

bias imparted by the elastomerically-mounted contacts 24.

FIG. 1 illustrates the normal position of the contacts 24 prior to a device under test 18 being brought into engagement With the contacts 24. That ?gure also illustrates, in phantom, a
45

54 de?ned Within the housing 32 proximate its ?rst surface 34

near the end of a slot 38. The rear end 30 of the contact 24, in

position of the contact When the plunger has depressed the

device under test to its test position. Typically, the distance of travel of the front end 26 of a contact 24 along an axis along Which the plunger moves is on the order of 0.3 mm. It Will be understood that, in vieW of the construction of the contacts 24
as Will be discussed hereinafter, an arcuate surface 28 at a rear

addition to de?ning the arcuate surface 28, also has a gradu ally arcing surface 56 at an edge of the rear end 30 of the contact 24 Which engages this angled Wall 54 de?ned by the housing 32. Disposition of a contact 24 is such that the gradu

ally arcing surface 56 Will interact With the angled Wall 54

50

de?ned by the end of the slot 38 so that the point of contact of

the arcuate surface 28, While it Will move across the load board trace 14, Will not slide across that trace 14. The motion

end 30 of the contact 24 on a loWer edge thereof Will roll across a corresponding trace 14 on the load board 12 With virtually no translational or rotational sliding of that surface

Will be virtually totally a rolling action (that is, one in Which

the relative movement across the trace Will be as a Wheel
55

rolling on a surface Without any slippage). This Will result

along the trace 14. Optimally, arcuate surface 28 Would have

as great a radius of curvature as possible to limit the impact

from the gradually arcing surface 56, because of its contour,

permitting the arcuate surface 28 of the rear end 30 of the contact 24 to roll Without translational sliding as engagement
60

brought to bear upon trace 14. Further, it has been found that, in vieW of the construction of the contact 24, translational sliding of the front end 26 of the contact 24 along the lead 20 of the device under test 18 to Which the contact corresponds Will be adequate to effect signi?cant scrub on the front end of
the contact but minimal scrub on a lead 20 of the device 18.

of the gradually arcing surface 56 is maintained in contact With the angled Wall 54. When the device under test 18 is
Withdrawn, rolling in a reverse direction Will occur.

For example, in one embodiment of the invention, the trans

As previously discussed, as WithdraWal of the device occurs, the second projection 42 Will engage the shoulder 49 de?ned by the housing 32 in order to limit upWard movement

lational sliding is on an order of 0.041 mm on the device 18. 65 of the contacts 24. The test socket 10 includes a housing 32 Which has a ?rst It Will also be noted that the point of application of force by

surface 34 generally in engagement With the surface 16 of the

a device under test 18 is spaced laterally a relatively signi?

US 7,722,361 B2
5
cant distance from the point of engagement of the rear end 30 of the contact 24 With the trace 14 on the load board 12. This

6
arcuate surface, and said housing de?ning, Within the slot, a Wall, engaged by said gradually arcing surface of
said rear end of said contact, such that, as said front end

Will augment the bene?cial advantage achieved by the rolling action (that is, minimization of likelihood of damage to the load board).
Further, contacts made of precious metals can be employed
in the present invention. Such contacts tend to extend load board life also. A Neyoro G contact, Which is a solid gold

of said contact is engaged by the lead orpad of the device to be tested and urged into the corresponding slot, said gradually arcing surface of said contact moves along
said Wall and causes said arcuate surface to roll across

the corresponding trace; and

means for elastomerically mounting said contact in said

alloy contact not having any plating, is envisioned as being used. Such a material, it has been found, not only extends the life of the contact. It also, hoWever, extends load board life by minimizing damage to the traces thereon. It has been found
that load board life can be at least doubled over mechanisms

corresponding slot, Wherein, When said front end of said

contact is engaged by the lead or pad of the device to be

tested and urged into the corresponding slot, said arcuate

surface rolls across said corresponding trace With virtu ally no translational or rotational sliding. 2. A test socket in accordance With claim 1, Wherein said Wall is angularly spaced at an arcuate angle relative to said

constructed as knoWn in the prior art.

It Will be understood that this disclosure, in many respects,

15

is only illustrative. Changes may be made in details, particu larly in matters of shape, siZe, material, and arrangement of
parts Without exceeding the scope of the invention. Accord ingly, the scope of the invention is as de?ned in the language of the appended claims. What is claimed is: 1. A test socket, comprising: a housing having a ?rst surface generally in engagement
With a surface of a tester load board, said housing further
20

?rst surface of said housing.

3. A test socket in accordance With claim 1 Wherein said means for elastomerically mounting said contact comprises a front elastomer precompressed by the contact and com pressed further by the contact as said front end of said contact is engaged by the lead or pad of the device to be tested and

urged into the slot.

4. A test socket in accordance With claim 3 Wherein said means for elastomerically mounting said contact further com prises a rear elastomer that preloads the rear end of the contact against a corresponding trace on the surface of the tester load board. 5. A test socket in accordance With claim 4 further com

having a second surface, generally parallel to, spaced from, and facing oppositely from said ?rst surface, and
at least one slot formed in said housing extending

through said housing betWeen said ?rst surface and said second surface;
a contact received in a corresponding slot and having a

front end extending beyond said second surface for engagement by a corresponding lead or pad of a device
to be tested, and having a rear end de?ning an arcuate surface in engagement With a corresponding trace on

prising a shoulder de?ned by said housing for engaging the contact and limiting the distance the contact extends beyond said second surface of said housing.
6. A test socket in accordance With claim 1 Wherein said contacts are made of Neyoro G.
* * * * *

said surface of the tester load board, and de?ning a

gradually arcing surface, angularly spaced from said

EXHIBIT C

US007445465B2

(12) United States Patent

Lopez et a].
(54) TEST SOCKET

(10) Patent No.:

(45) Date of Patent:
5,189,363 A *
5,609,489 A *

US 7,445,465 B2
Nov. 4, 2008

2/1993 Bregman et a1. .......... .. 324/754

3/1997 Bickford et a1. ............. .. 439/72

(75) Inventors: g)
ennls

]I;IslelZllS1\1Vnng";a1ehgNA$SS));
. e, e ser, ;

5,634,801 A *
*

6/1997 Johnson ..................... .. 439/71

5/2001 Rathburn ................... .. 439/66
6/2001 Tan ........................... .. 439/66

Mathew L GilkMinneaPOhsMN (Us)

6,231,353 B1
6,244,874 B1*

(73)
*

Assignee; Johnstech International Corporation, Minneapolis, MN (US)

_ _ _ _ _

6,572,388 B2* 6,854,981 B2*

2003/0068908 A1*

6/2003 Lee ........................... .. 439/71 2/2005 Nelson ...................... .. 439/66

4/2003 Brandtetal. ............... ..439/71

Nome

Sublect_t any dlsclalmeritheterm Ofthls

patent 1s extended or adjusted under 35

2004/0067665 Al*
2004/0248448 A1*

4/2004 Nakano ..................... .. 439/70

_
12/2004 G111< ......................... .. 439/264

U.S.C. 154(b) by 0 days.

(21) Appl.No.: 11/482,644

(22) Filed:
(65)

Jul. 7, 2006
Prior Publication Data

* cited by examiner

Primary ExamineriTulsidas C. Patel

Assistant ExamineriVladimir Imas

US 2007/0032128 A1

Feb. 8, 2007

Related US. Application Data

(74) Attorney, Agent, or FirmiNaWrocki, Rooney & Sivertson, P.A.

(60)

Provisional application No. 60/776,654, ?led on Feb.

(57)

ABSTRACT

24, 2006, provisional application No. 60/697,721,

?led on Jul. 8, 2005, provisional application No.
60/697,693, ?led on Jul. 8, 2005.

An improved test socket for use in testing integrated circuits.

The test socket includes a housing having one or more slots

(51)
(52)

Int. Cl. H01R 12/00

(2006.01)
439/72

formed therein. Contacts can be received Within respective slots and maintained therein With rear ends of the contacts in
engagement With traces on a load board. Mounting is accom

US. Cl. ...................................................... ..

(58)

Field of Classi?cation Search ................. .. 439/72,

plished by means of a pair of elastomers, and the elastomers

maintain each contact such that, When the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace With virtually no translational or rotational sliding.

439/70, 71, 73; 324/754 See application ?le for complete search history.
(56)
4,980,245 A * 5,069,629 A *

References Cited
U.S. PATENT DOCUMENTS
12/1990 12/1991 Marino ..................... .. 428/671 Johnson ..................... .. 439/71

4 Claims, 2 Drawing Sheets

US. Patent

Nov. 4 2008

Sheet 1 of2

////// // ////
a

US. Patent

Nov. 4, 2008

Sheet 2 of2

US 7,445,465 B2

:23:
J

l/l/

US 7,445,465 B2
1
TEST SOCKET CROSS-REFERENCE TO RELATED APPLICATIONS

2
tion, Detailed Description of the Invention, appended claims

and accompanying draWing ?gures.

SUMMARY OF THE INVENTION

This is a regular application ?led under 35 U.S.C. 1 l 1(a)

claiming priority, under 35 U.S.C. 119(e) (l ), of provisional

application Ser. No. 60/ 697,693, previously ?led Jul. 8, 2005, under 35 U.S.C. lll(b). This is further a regular application ?led under 35 U.S.C.

The present invention is an improved test socket. It includes a housing Which has a ?rst surface that is placed into engagement With a surface of a tester load board. The housing

111 (a) claiming priority, under 35 U.S.C. 119(e) (l) of provisional application Ser. No. 60/776,654, previously ?led
on Feb. 24, 2006.

has a second surface Which is generally parallel to, and spaced from, the housing ?rst surface. The second surface of the housing faces in a direction opposite that in Which the ?rst surface faces. At least one slot, extending through the housing betWeen the ?rst and second surfaces thereof, is formed in the
housing. A contact is received in a corresponding slot. Such a contact has a front end Which normally extends beyond the

This is further a regular application ?led under 35 U.S.C.

111 (a) claiming priority, under 35 U.S.C. 119(e) (l) of provisional application Ser. No. 60/ 697,721, previously ?led
on Jul. 8, 2005.

second surface of the housing to be engaged by a correspond

ing lead or pad of a device to be tested. The contact further has
a rear end Which de?nes an arcuate surface, the arcuate sur

TECHNICAL FIELD
20

The present invention deals With electronic component

testing technologies. More speci?cally, hoWever, the inven

tion deals With test sockets Which employ contacts for testing
an electronic component. A test socket includes contacts

face engaging a corresponding trace formed on the surface of the tester load board. The contact is elastomerically mounted in its slot such that, When the front end of the contact is engaged by the lead or the pad of the device to be tested and urged into its slot, the arcuate surface of the contact rolls
across its corresponding trace on the surface of the tester load

Which interconnect and provide an electronic path betWeen a lead or pad of the electronic component to be tested and a
corresponding trace on a load board. The invention focuses

board With virtually no translational or rotational sliding. Abrasion betWeen the contact and the load board is, thereby,

substantially eliminated.
30

upon control and regulation of forces applied to a device lead or pad and a load board trace by a corresponding contact of
the test socket.

It is envisioned that the rear end of the contact, in addition to de?ning the arcuate surface in engagement With the load board, also de?nes a gradually arcing surface Which is angu

BACKGROUND OF THE INVENTION

larly spaced from the arcuate surface thereof. The housing, in this embodiment, de?nes a Wall Within the slot. The Wall is engaged by the gradually arcing surface of the rear end of the

contact, and the spatial relationship betWeen the gradually

Integrated circuit device testing is a procedure Which has
been observed for many years in order to obtain as high a
35

arcing surface and the Wall is such that, as the front end of the contact is engaged by the lead or pad of the device to be tested

degree of quality control as possible for electronic devices. A

tester typically includes a plurality of conductive traces
formed on a load board associated With the tester apparatus. It is necessary to interconnect a lead, of a leaded device, or a pad, of a non-leaded device, to a corresponding trace on the
40

and urged into the corresponding slot, the gradually arcing

surface moves along the Wall and causes the arcuate surface of the contact to roll across its corresponding trace. It is envi

load board in order to effectuate testing. A test socket having a plurality of contacts is interposed betWeen the device under
test and the load board in order to effectuate interconnection. One contact engages, at a front end, the lead orpad of a device under test With its corresponding trace on the load board. Over the years, shape and construction of such contacts have evolved in response to the construction of test sockets, load boards, and architecture of devices to be tested. For merly, it Was considered necessary to have a Wiping action at the various locations of engagement at the contact ends in
45

sioned that the Wall de?ned by the housing Would be angu larly spaced at an acute angle relative to the ?rst surface of the housing. This Would enable the arcuate surface of the contact
to roll across the trace of the tester load board With virtually no translational or rotational sliding.

A preferred embodiment of the invention employs a pair of elastomers, crossing perpendicularly across the slots, to
effect the elastomeric mounting of the contacts. A front elas tomer is positioned in a channel betWeen the surface of the tester load board and the contacts. The front elastomer is pre-compressed in vieW of the fact that a shoulder de?ned by the housing can be employed to engage the contacts and limit

50

order to provide a good transmission path. As technology has progressed, hoWever, it has become apparent that less Wiping
action is necessary to maintain a good transmission path than What Was formerly believed. Furthermore, it has become
55

the distance they extend beyond the second surface of the

housing. Pre-compression is, thereby, accomplished by the

contacts and the load board sandWiching the front elastomer
therebetWeen. The front elastomer becomes further com

apparent that excessive Wiping action damages component parts at the various points of engagement and signi?cantly
decreases the life of the test socket and tester load board.

pressed by the contacts as they are engaged by the leads or pads of the device to be tested and urged into their respective
slots.
60

Consequently, various attempts have been made to minimiZe

abrading of one surface relative to another. The current state of the art, hoWever, has been unable to de?ne a construction

The rear elastomer pre-loads the rear end of the contact. It thereby maintains contact betWeen the rear end of each con tact against its corresponding trace on the surface of the tester

adequate to both maximize ef?ciency of the test socket and minimiZe abrasion and consequent deterioration of compo nent parts. It is to these problems and dictates of the prior art that the present invention is directed. Its advantages Will become more apparent With reference to the Summary of the Inven

65

load board. The present invention can employ contacts made of pre cious metals. Such contacts extend load board life. A Neyoro G contact is a solid gold alloy contact Without any plating. While it has been found that such a material extends the life of

the contact, it also extends loadboard life. By using Neyoro G

US 7,445,465 B2
3
material for the contacts, load board life can, it has been found, be at least doubled over load board life in mechanisms knoWn in the prior art. The present invention is thus an improved test socket Which addresses the dictates of the prior art and solves problems

4
For example, in one embodiment of the invention, the trans
lational sliding is on an order of 0.041 mm on the device 18.

The test socket 10 includes a housing 32 Which has a ?rst

surface 34 generally in engagement With the surface 16 of the

tester load board 12 on Which the traces 14 are formed. The

thereof. More speci?c features and advantages obtained in

vieW of those features Will become apparent With reference to

the Detailed Description of the Invention, appended claims

and accompanying drawing ?gures.

BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a sectional vieW of a test socket in accordance

housing 32 has a second surface 36 Which is generally parallel to, and spaced from, the ?rst surface thereof. The second surface 36 of the housing 32 faces oppositely from the ?rst surface 34. As previously discussed, the housing 32 carries a plurality of contacts 24. A plurality of slots 38 are provided,
each slot to receive a single one of the contacts 24.

With the present invention shoWing contact and elastomer

response to engagement of a contact by a lead of a device

FIG. 2 illustrates, in perspective, an individual contact in accordance With the present invention. The contact 24

includes ?rst, second and third protrusions 40, 42, 44. The
?rst protrusion 40 is de?ned by the rear end 30 of the contact 24 Which engages the trace 14 of the load board 12. The third protrusion 44 is de?ned by the front end 26 of the contact 24 Which is engaged by a lead 20 or pad of the device under test 18. The second protrusion 42 serves to engage, When mounted by a plurality of elastomers 46, 48, as Will be dis cussed hereinafter, a shoulder 49 de?ned by the housing 32.

under test; and

FIG. 2 is a perspective vieW of a contact for use in the

present invention.
DETAILED DESCRIPTION OF THE INVENTION
20

Referring noW to the draWing ?gures, Wherein like refer

ence numerals denote like elements throughout the several vieWs, FIG. 1 illustrates a test socket 10 in accordance With the present invention. The test socket 10 is intended for use
25

Engagement of the shoulder 49 by the second protrusion 42

serves to limit the degree of upWard movement of the contact 24 and the distance the front end 26 of the contact 24 Will

With a tester typically employed for ascertaining quality of integrated circuit devices used in electronic appliances. The
tester interfaces With a tester load board 12 Which has elec trically conductive traces 14 formed on a surface 16 thereof to enable electronic communication betWeen the tester and an
30

extend beyond the second surface 36 of the housing 32 When

the contact 24 is not engaged by a device to be tested. Referring again to FIG. 1, the test socket 10 has a pair of

integrated circuit device 18 to be tested. That is, electrical

signals are transmitted betWeen the device under test 18 and the test apparatus through the test socket 10. FIG. 1 illustrates a DUT package Which is provided With a plurality of leads 20, only one of Which is shoWn. FIG. 1 illustrates only a portion of the device under test 18, but it Will

channels 50, 52 Which extend along axes generally transverse to planes de?ned by the slots 38 formed in the housing 32. These channels 50, 52 are intended to receive elastomers 46,
48 Which serve to mount the contacts 24 in their slots 38. FIG.

35

1 shoWs a generally circular channel 50 receiving a larger, front elastomer 46, and a rectangular channel 52 receiving a
smaller, rear elastomer 48. The rear elastomer 48 is pre loaded and, because of the arcuate surface 28 of the rear end 30 of the contact 24 being in engagement With the load board 12, Will engage an upper edge of the rear end 30 of the contact 24 at a location to urge the front end 26 of the contact 24

be understood that substantially identical leads extend along both of opposite sides of the device package 18.
FIG. 1 further illustrates a lead backer Which, When the device under test 18 is brought into engagement With its leads 20 in contact With corresponding contacts 24 of the test socket 10, deters bending of the leads 20. DoWnWard pressure is brought to bear upon the device 18 under test by a plunger
40

upWardly. Similarly, the front elastomer 46 is under compres

sion and also serves to urge the contact 24 upWard and bias it to a point of initial contact by a lead 24 or pad of an integrated circuit device 18 to be tested. As previously alluded to, the arcuate surface 28 in engage ment With the trace 14 on the load board 12 has no, if any,

mechanism (not shoWn). The plunger depresses, When testing

is to be conducted, the contacts 24 to overcome an upWard

45

bias imparted by the elastomerically-mounted contacts 24.

FIG. 1 illustrates the normal position of the contacts 24 prior to a device under test 18 being brought into engagement With the contacts 24. That ?gure also illustrates, in phantom, a position of the contact When the plunger has depressed the device under test to its test position. Typically, the distance of
travel of the front end 26 of a contact 24 along an axis along Which the plunger moves is on the order of 0.3 mm. It Will be understood that, in vieW of the construction of the contacts 24
as Will be discussed hereinafter, an arcuate surface 28 at a rear
50

appreciable translational or rotational sliding along the trace

14 ofthe load board 12. This is so because of an angled Wall

54 de?ned Within the housing 32 proximate its ?rst surface 34

near the end of a slot 38. The rear end 30 of the contact 24, in

addition to de?ning the arcuate surface 28, also has a gradu ally arcing surface 56 at an edge of the rear end 30 of the contact 24 Which engages this angled Wall 54 de?ned by the housing 32. Disposition of a contact 24 is such that the gradu
55

ally arcing surface 56 Will interact With the angled Wall 54

de?ned by the end of the slot 38 so that the point of contact of
the arcuate surface 28, While it Will move across the load board trace 14, Will not slide across that trace 14. The motion

end 30 of the contact 24 on a loWer edge thereof Will roll across a corresponding trace 14 on the load board 12 With virtually no translational or rotational sliding of that surface

Will be virtually totally a rolling action (that is, one in Which

60

along the trace 14. Optimally, arcuate surface 28 Would have

as great a radius of curvature as possible to limit the impact

the relative movement across the trace Will be as a Wheel

rolling on a surface Without any slippage). This Will result

brought to bear upon trace 14. Further, it has been found that, in vieW of the construction of the contact 24, translational sliding of the front end 26 of the contact 24 along the lead 20 of the device under test 18 to Which the contact corresponds Will be adequate to effect signi?cant scrub on the front end of
the contact but minimal scrub on a lead 20 of the device 18.

from the gradually arcing surface 56, because of its contour,

permitting the arcuate surface 28 of the rear end 30 of the contact 24 to roll Without translational sliding as engagement
65

of the gradually arcing surface 56 is maintained in contact With the angled Wall 54. When the device under test 18 is
WithdraWn, rolling in a reverse direction Will occur.

US 7,445,465 B2
5
As previously discussed, as WithdraWal of the device occurs, the second projection 42 Will engage the shoulder 49 de?ned by the housing 32 in order to limit upward movement
of the contacts 24.

6
to be tested, and having a rear end de?ning an arcuate surface in engagement With a corresponding trace on

said surface of the tester load board; means for elastomerically mounting said contact in said

It Will also be noted that the point of application of force by a device under test 18 is spaced laterally a relatively signi? cant distance from the point of engagement of the rear end 30
of the contact 24 With the trace 14 on the load board 12. This

corresponding slot, Wherein, When said front end of said

contact is engaged by the lead or pad of the device to be

tested and urged into the corresponding slot, said arcuate

surface rolls across said corresponding trace With virtu ally no translational or rotational sliding and
Wherein said rear end of said contact further de?nes a

Will augment the bene?cial advantage achieved by the rolling action (that is, minimiZation of likelihood of damage to the load board).
Further, contacts made of precious metals can be employed
in the present invention. Such contacts tend to extend load board life also. A Neyoro G contact, Which is a solid gold

gradually arcing surface, angularly spaced from said

arcuate surface, and said housing de?nes, Within the slot,
a Wall, angularly spaced relative to said ?rst surface of

said housing and engaged by said gradually arcing sur

face of said rear end of said contact, such that, as said

alloy contact not having any plating, is envisioned as being used. Such a material, it has been found, not only extends the life of the contact. It also, hoWever, extends load board life by minimizing damage to the traces thereon. It has been found
that load board life can be at least doubled over mechanisms

front end of said contact is engaged by the lead or pad of the device to be tested and urged into the corresponding slot, said gradually arcing surface of said contact moves along said Wall in constant engagement thereWith and
20

constructed as knoWn in the prior art.

causes said arcuate surface to roll across the correspond

It Will be understood that this disclosure, in many respects,

ing trace.
2. A test socket in accordance With claim 1 Wherein said means for elastomerically mounting said contact comprises a front elastomer pre-compressed by the contact and com pressed further by the contact as said front end of said contact

is only illustrative. Changes may be made in details, particu larly in matters of shape, siZe, material, and arrangement of
parts Without exceeding the scope of the invention. Accord ingly, the scope of the invention is as de?ned in the language of the appended claims. What is claimed is: 1. A test socket, comprising: a housing having a ?rst surface generally in engagement
With a surface of a tester load board, said housing further
25

is engaged by the lead or pad of the device to be tested and urged into the slot.
3. A test socket in accordance With claim 2 Wherein said means for elastomerically mounting said contact further com prises a rear elastomer that pre-loads the rear end of the contact against a corresponding trace on the surface of the tester load board. 4. A test socket in accordance With claim 3 further com

30

having a second surface, generally parallel to, spaced from, and facing oppositely from said ?rst surface, and
at least one slot formed in said housing extending

through said housing betWeen said ?rst surface and said second surface;
a contact received in a corresponding slot and having a

35

prising a shoulder de?ned by said housing for engaging the contact and limiting the distance the contact extends beyond said second surface of said housing.
* * * * *

front end extending beyond said second surface for

engagement by a corresponding lead or pad of a device

EXHIBIT D

120 South Sixth Street, Suite 1700, Minneapolis, MN 55402 USA

Direct Dial: (952) 253-4106 E-Mail: mlasky@alteralaw.com

25 February 2014

Gabriel Guglielmi, President Interconnect Devices, Inc. and Smiths Connectors 5101 Richland Ave Kansas City, KS 66106 By email: Gabriel.guglielmil@idinet.com and certified mail Re: Our Reference: 04210.0018-US-AB Infringement of US Patents 7 059 866, 7 722 361, 7 445 465

Dear Sirs: We are Intellectual Property counsel for Johnstech International of Minneapolis, MN, a maker of patented test sockets and pins. We are sure you are familiar with Johnstech and its products. It has come to our attention that your company is advertising a test pin and socket under the Archemedes name (see attached). Our review of this product indicates that it is a direct infringement of the following US Patents, namely 7 059 866, 7 722 361 and 7 445 465. The purpose of this letter is to give you official notice under 35 United States Code Section 287 of our clients patents (though the patent numbers are already marked on the product, product literature, and the Johnstech web site) and to advise you of the consequences of infringement of one or more of these patents. Under US law, 35 United States Code Section 271, anyone who makes, uses, offers to sell, or sells a patented invention is liable for patent infringement. Further, under the same statute, if a person induces or contributes to another who ultimately infringes, the inducer and contributor are also liable for infringement. Likewise, a customer of an infringer also becomes an infringer by carrying out the process of the patent. We do not know if you have made, used or offered to sell the infringing product shown in the literature, but we are aware that your company will be exhibiting products at the upcoming BITS conference in Phoenix, AZ in March 2014.
1

If your company exhibits this product at the BITS conference, we will consider that an intentional infringement Under 35 United States Code Sections 284-285, intentional/willful infringement is subject to tripling of damages and Johnstechs attorneys fees in pursing the infringement. Without waiving any rights to obtaining an injunction against your company or its clients, we invite you to contact us to see if an amicable solution can be quickly achieved. If we do not hear from you by March 1, 2014, we shall assume that settlement is of no interest, and continued infringement will certainly be willful. . Very truly yours, s/Michael B. Lasky/ Michael B. Lasky Attorney MBL/jsa