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INTRODUCTION
In this paper, some partial discharge (PD) (corona) studies under direct voltage (dc) conditions are discussed. High voltage components assemblies for space use mostly see dc impressed voltage. They are used in power supplies and scientific instrument packages such as spark chambers and ultraviolet detection equipment for exploration of the energetic particle and radiation environment of space. These components and assemblies should therefore be tested under dc conditions. The technique of PD detection has been known for some time as attested to by Kreuger [1] and Dakin [2]. However, the majority of the PD work has been carried out under impressed alternating voltage (ac). It may be useful to briefly review the most cogent differences between dc and ac partial discharge behavior of a test specimen. Corona or partial discharges can occur within cavities in solid or liquid systems or at the surface of exposed conductors or at edges of conductors on solid dielectrics, as essentially a localized gas breakdown [3] according to Paschen's curve. Partial discharges can conceivably also occur at other flaws and inhomogeneities within materials, such as grain boundaries, but most of the literature deals with gas breakdown in small cavities. The discharge inception voltage occurs when the gas breakdown stress is just exceeded across the cavity which acts as the discharge site. This local stress is made up of two components: 1) the externally applied voltage stress, taking into account the voltage distribution due to different dielectric constants in the system and also the effects of conductor curvature, edges, and points; 2) the internal stress of residual surface charge density on any inner insulating surface lining the cavity or grain boundary due to previous discharges not having been conducted away. This residual surface charge and its electric field prevent more frequent discharges with applied dc voltage, even when this far exceeds the breakdown stress across the cavity. All inner insulation surfaces previously exposed to discharges are very likely to have some significant surface charge, which may be very slow to dissipate, similar to the better known case of an electret. The ac-crest and dc breakdown voltages of gases have been measured to be closely identical. However, the inception voltage of dc partial discharge is difficult to detect, consisting of only a very few pulses per minute and will only be "correct" for new, virgin, completely discharged dielectric specimen. As stated previously, after the first few pulses of discharge the interior insulating surfaces lining a cavity become charged and thus develop a reverse field which prevents further discharges until the voltage is raised,
VOL. AES-18, NO. 1
RENATE S. BEVER University of the District of Columbia JOHN L. WESTROM NASA Goddard Space Flight Center
DC partial discharge (PD) (corona) testing is performed using a multichannel analyzer for pulse storing, and data is collected during increase of voltage and at quiescent voltage levels. Thus high voltage ceramic disk capacitors were evaluated by obtaining PD data interspersed during an accelarated life test. Increased PD activity was found early in samples that later failed catastrophically. By this technique, trends of insulation behavior are revealed sensitively and nondestructively in high voltage dc components.
Manuscript received February 19, 1981. This work was supported by a grant made by the National Aeronautics and Space Administration to the University of the District of Columbia. Authors' current address: NASA/Goddard Space Flight Center, Greenbelt, MD 20771.
U.S. Government work, not protected by U.S. copyright.
82
JANUARY 1982
or some of the charge is conducted away. Thus the conductivity is the most cogent factor for dc partial discharge, and it controls the discharge frequency f at a given quiescent voltage above inception. In fact, it has been shown to be [4, 5]
cp/yao: ln(1
N`1)
where cp is the conductivity of the dielectric (bulk), E is its permittivity, Eo is the permittivity of free space, N is the ratio of applied voltage V to corona inception voltage V', and
ISYSTEM
JINTERFACE
SAMPLE
[Rc/(Rb
Rc)] [(Cb
Cc)/C,b]
lKVDC
the subscript c referring to cavity and b to the dielectric in series with it. The R's and C's are resistances and capacitances of the lumped parameter circuit model, equivalent to the actual cavity in the dielectric for the dc case shown in Fig. 1. Thus at constant dc voltage the number of discharges per second is controlled by the conductivity of the material and by the amount of overvoltage above inception. The proportionality between discharge pulse frequency and tiny conduction current through the sample has been experimentally shown in great detail by Shihab [61. During the act of voltage rise, or the voltage rise transient, if this is above the threshold voltage, discharges will occur during the voltage step and for a short time following it, after the voltage has reached a steady value. This is, of course, because the voltage rise is analogous to a quarter cycle of ac, and the blocking space charge is being moved. Observations have been published that the partial discharge quantity does not change appreciably with the frequency up to about 10 kHz [7]. This is fortunate in that it is then not necessary to keep the rate of rise of voltage during a voltage increase absolutely the same every time. Two more points need to be kept in mind which further complicate the dc partial discharge behavior: 1) The dc conductivity, so all important in determining the discharge frequency, is in itself decreasing with time, due to charge trapping at shallow and deep traps. Thus the dc current Idc can be written as
SPOWER
FILTER
P.S.
ATIONR
CALIBRATIONI
[j1
SIGNAL
L __
PULSE
ANAYZE
_
t0 _
COUPLER=
magnitude begin very low just above the first threshold voltage, but then increase steadily with increasing voltage.
TEST EQUIPMENT AND METHOD
The test equipment consisted basically of 1) a 664 000 series 40 kV, 3 MA dc partial discharge detection system with power supply by J.G. Biddle Company, Plymouth Meeting, Pennsylvania; 2) output pulses coupled via a buffer-isolation amplifier circuit to an ND-100 multichannel analyzer made by Nuclear Data Corporation, Schaumburg, Illinois. Details of this equipment can be made available; see Fig. 2. The method of testing was to immerse the ends of Idc = ot-m the insulated corona-strand-shielded test cables from where t is the time after voltage application, I, is the the high voltage bushings of the Biddle power supply dc current at t = 0 and is related to the already trap- under Fluorinert Dielectric Fluid FC-48 by the MMM ped charges, and m is a constant determining the Company, such that the stripped metallic ends with speed of further charge-trapping. alligator clips and the test sample were all under the fluid. Thus no naked metal at the test end was ex2) Any real insulation sample has more than one corona into the surdischarge site, which are excited and reach their incep- posed to the gaseous air and thus as surface partial well as rounding air was prevented, tion voltage at random values of increasing applied across the leads sample the test between discharges voltage. Thus corona pulse repetition rate and
83
ai r
Fhe only test. objects that were mieasured while immersedi in air were large, m-achine-shiop maniufactured oflCs that hiad large-sized smioothi term-inals fitt-ed withi c"orona balls so as to pres,ent external c-orona intol the
Objectives
tric conistant ceramic disk
discharge measurement' alonie; 4) discover what thec relationship between ac -co-frona inicepti-on voitage is andl dc partial discharge
behavior,
several manufacturecrs vvas Carried oni. in an effort- to 1) see if partial discharge testing unlder direct voltage conditions carn be uised as a means to select the more reliable cornponlenTS if a chioice i-s avai'lable; 2) see which capacitors ai-e the most,- coronia free, 3) hiope to find. som-e soi-t of acceptance and rejectioni criteria for these capacltors,, based oni dc partial
To this end., the ped-igree of capacitors for test was purposefuilly .omnmerciall, firom a variety of nmanufacturers and qualitv~, it! r' ,recsi-eened except by the manufacturers themnselves., Measurement of Initial Parti'al Discharge
The raw data obtained dutrinig onie tim-re initerval of' ot?servation on- tinree d-iffferent c-apaci'tors is seen in thec phiotographs of Figs. 3(A). (II), andt (C). Each photographi shows a partial dischiar-ge histogramn of the nuimbers of pulses at a given piCOCOuIlomb level versus that picocoul/ornb level which, occur-red during the timne initerval of obsei-vationi. Irn the particular examiples the applied vo!tagc "was chaniged in a linear ramp; other examples could equally well be obtained while the
Data from countless su-ch hiistograms muist be sumi miarized in tables and finially put- in graphical f'orm. Table I presenits the betiavlior of 1000 pF 10O kV, mnan-ufactui-er A capacitotrs and 8500 pF, 4 kV, manufacturer E capacit-ois from 0 to twice rated v oIt ag e, '2kV, Necessarily, such summnfiari-zing destroys some of th-e detailed information Pf the data. The headings m-Teat-i that what is given tn eachi casc- is I) the total numnber of counits between the calibr-at-ion limits cited all the top of the page: lthen .2) below the underlining is given the range of charege in picocouilombs below wvhich most~, of' theii c un"wei souInd, p1uc a- fi:uwI higvher en.ergy straggler-s spelled out individually. ThuIS 58.6 pC 98.3 1 p means hlat- most of the
voltage
was
kept, constant,
iii' P1<
it
suirface-o ntlhe bocl of the tcst. sain-pic OCbviousty. t"ic em-ptyv iest leadNc uadler Foinm liquid wets ek hi nnpoe ~al N,.'t pa rtial dtschait- ct h 't'iii) audi ionic were obta-ined f2 up 'r 3~k\V
a-- '. -,,
.,
i,-,
"
"
),
"
'.
;.
V."
.,
t.
., ,.
i. ).
I-I.:t,(. ---R(
'W "NSFf"Nis
JANI-JARY, 1982
TABLE I Behavior of Manufacturer A and E Capacitors 1000 pf, 10 kV Manufacturer A; Same At and Calibration as for E Below
01/2VR
1/2VR
N
I/2VR- VR
N
PC
VR
N
PC
VR -3/2VR
N
PC
3/2VR
N 9 <14pc+77
3/2VR- 2VR
N
pc
2VR
N pc
19
<1 1.9pc
AC
Incept kV
4.5
rms
Ext kV
4.5
PC
<4.Spc
1
pc
pc
<7.Opc
7
9 <1 0.6pc
19
3 <6.6pc
8
15 <I 8pc+107.5
30
<1 4pc+60
15
+94+161
3.3pc
0
<1I PC
6 <3.3+1 0
<26.1pc
2
<7.8pc
4 <4.2
<25pc
<4+199
<9.4pc
7 <10.2pc
8 _
25
3.5
<28.5+58
3.0 6.0
<26.9pc
12 1.2 +27+160
<1
<2.9+270
9 <58.3
8.5
9/16/77 8500pf, 4KV, Manufacturer E Y5VO-3879-877 Observation Time During AV 10 Sec.: Quiescent Observation Time = 100 Sec.; Calibration: 9-400pc
-
<1
16.3pc
6 <54pc
<400pc
2,786
1.7
<88.5+328
<23pc +154
<267pc
2,651
557(1)
<1 74pc
2.0
509(2) <198+302+359
<21 1+384
I3pc
<96pc
15
2,551 <340pc
706(1)
2.3
0 0
H
VR
VRVR
VR
VR
3VR-2VR
VR2
versus
voltage. Manufacturer E,
Fig. 5.
-2
VR
2VRVR
VR32VR
2VR-2VR
2VR
Y5F,
Number of PD pulses
voltage.
Manufacturer C,
_r lay 1_ co . IC pC -r:in a near below 58.6 total number of counts Maxwellian distribution, plus one count of 98.3 pC and one at 157 pC. In addition, some of the data is presented in Figs. 4, 5, 6, and 7 as graphs. The types of capacitors selected for this graph plotting were the ones of which
-.1
1000
pF,
4 kV dc.
10 identical units were available from the same manufacturer, lot, formulation, capacitance, and rated voltage. The same ones were also the ones later chosen for correlating life tests. The graphs clearly lead one to the following observations:
85
N _ 200 -
180
160 140
120
Ono _IV
830 6
4
-
At constant V
t
=
100 sec
50
00 80
so
2 20
0 VR
23
15 15
,-1
2VR
VR
2VR
VR
_
-
40
20
During A V t - tO sec
15 00 _ 80 _
60
20
n
0I
40 _
-
VR
2VR
VR
VR32VR
2 VR-2VR
Fig. 6. Number of PD counts versus voltage. Manufacturer A, Z5R, 1000 pkF. 10 kV dc.
N _
11
60 40
20
-
13
1100 -
80
60 _
20
50
-
_ 0VR
2V
VR
2 VR
2 VR
15
300 80
60
20
1:40
During AV t - 10 sec
14
30
60
0-
12VR 12VR
VR
VR-32VR 32VR-2VR
versus
voltage. Manufacturer M,
1) Much more revealing information as to the state of the insulation is gathered during the ramp of changing voltage, or on A V. Hence data must be ac-
2) The manufacturer M and A capacitors have few counts, both at AV and quiescent voltage, and their charge content is low. The manufacturer C units rise sharply in count rate with increasing voltage, and the manufacturer E capacitors' rate of increase of counts with voltage is by far the steepest. The result of the capacitor study seems to be that there is no simple, glaringly obvious rejection criterion that can easily be applied. Every manufacturer's type of high voltage capacitor has its own PD characteristics, almost like fingerprints. A summary of the data of the capacitors tested appears in Table II. The symbol AV is used for the phrase "change of voltage." Several monolithic capacitors have been cross sectioned with lapidary equipment. The findings are, as seen in Figs. 8 and 9: 1) Every S capacitor that had never been exposed to high voltage by the experimenter, when ground down, showed delamination cracks running along the outermost parallel plate electrodes. See the photographs. The cracks finally veered outward and ended at the epoxy coating. 2) S monolithics that had been caused to fail electrically by applying 20-30 percent more than rated voltage, were ground down in small increments. Interestingly, what was found was that a shorting crack occurred, starting from the delamination mentioned above, inward to the tip end of the next electrode of opposite polarity. In other words, the short went from a weak spot or fault on the outermost electrode to where the field strength was greatest at the opposite electrode. An interesting type of space charge and poling effect was observed with all the ceramic capacitors of the disk type. This is shown in the data of Table III. The voltage was raised in steps of 2 VR up to 2 V, the first time and the PD histograms obtained as usual, the A V steps occurring in about 10 s and the quiescent observations being taken over a 100 s interval. The voltage was then reduced quickly to zero (manufacturer C's and E's capacitors had energetic "relaxation" PD pulses, but not so the other types, taking about a total of 40 s to cease). The second time up the corona pulses were much fewer in number. After reducing the voltage again to zero, the polarity was then reversed on the capacitor. The third time up at reversed polarity the corona was much stronger than the very first and certainly than the second time. Another repeat at the same polarity caused a decrease in corona again, whereas polarity reversal brought on strong corona again, and so on and so forth. This is clearly a polarization effect, but the authors are not sure whether one is observing true gaseous corona in cavities or poling of the small crystal domains in the ceramic material, one domain at a time. It can certainly be said that if PD pulses appear on
VOL.
AES-18, NO.
JANUARY 1982
TAB LE 11
Manitiificttiie-eA NI
so
Far
Vers little PD, even tip to 2V',. I ow-lesel enei-gy pUses, ito 'relaxaltilon' PD.
Ver-x little Pt), evsn ciner-ev pulses, ito r elaxat1ion FD1). Sorvlesvhat cip to 2['f,. L ow-level noistle ithan A.
Sotme coto-na oni AV' f'roiii [',R to V'f. Corona beeomes piotiotinced and appears In miuiltiple counit buit sts tipon AV beycond I/f These bursts self-exinluu1ish thentielses lhowever, uponi -emaining at a quiescent svoltace. The eneerttes as 2 1 is approached becoimIe seteraIl 1liundi ecd pitocoulombs. The new, E's wit louI lic Silastc reutndei coat have nio i-elaxation c(tona. Sonie eatiicr E's withi Lunidercoat lhad protioulniced relaxation PD. Soriie otlfer E disks tliat had Uinknown ensirotnmental tests done on tienit previtously, hlad early PD 1pulSes oni A L' alt-eadv fitomii 2, [t) Vf, atid -elaxat cor1 on)-()Iia amd bi-oke dowii completely by pIttI-e li1-1,toul1i1 the1 epoxy c)atine n eat- tlhe edee ofthic disk t o the
These hlave a laII-geC liUmber oft etiergetic PD pLlses, begitnlic) ali-cadv on A,' f'otio 0 to t I e energ ies ot obsers ed pillses rante inito tlte 2 V[f. A s A V goes iota 2 ['ftto 2[' t tiousands of' picocoulhmbs eveti bevyod 8000 pC. Tlhet-e is equallvs ctietgetic relaxatitor corotia. Yct tionie of thicse fiavet expetlenced hicakdow'n, evceI at 21,/.
S's tested so tat- break dstown at abouit 20-30 percent above ['f. Tlis sCtllls to be ti-tuc wlietilie- tle capacitotrs are of receint maIlLufcitucire or I}litee years olId, atid reuaIcdIless of capacitance saziLIC or voltage r-atiltig.
Mntolihichts
S
FIrot
to
V/f, tftI-c
is
altaclr
corona, increasinE
All ilie
AV below V'R that one should be alert for unreliable performance and possible breakdown. But this is not necessarily going to happen, as illustrated by the manufacturer C's disks. The results of planned life tests, accelerated by elevated temperature, need to be evaluated to see if there is a general correlation between corona upon AV below VR on one hand and possible short life duration on the other. If so, then early corona below VR upon A V could be used as a rejection criterion. LIFE TESTING ON HIGH VOLTAGE CAPACITORS FOR WHICH THERE IS ALREADY INITIAL PARTIAL DISCHARGE DATA Test objects were, with one lead wire identified as the + side:
L
(A)
a) 5 of manufacturer E, Y5VO, 8500 pF, 4 kV dc rated, ceramic disk capacitors; b) 5 of manufacturer A, Z5R, 1000 pF, 10 kV dc rated ceramic disk capacitors; c) 5 of manufacturer M, X5R, 1000 pF, 10 kV dc rated ceramic disk capacitors; d) 5 of manufacturer C, Y5F, 1000 pF, 4 kV dc rated ceramic disk capacitors. 1) Before the life test began, measured at room temperature, for each capacitor were a) the capacitance of I Volt ac rms, 1000 Hz; b) the dissipation factor, similarly; c) the insulation resistance, at rated voltage dc; polarity was observed. It was noted
L
(B) Fig. 8. Two monolithic capacitors by manufacturer S, in cross section. No high voltage applied by experimenter.
IXTABLI" I'l 1IlffilcS- I,) 'N (c Chal-n2 1110 2 TI K ulltnd Ro-er 100, (4 Ploartk-r0
Mantil
-,
-4
C6,
Zr
/
I/
""
PG
V( r
.,
fc
pc
CC.
C'
vy"
C4p
'IC
1.
'i
1.. ...
..
4i~(
4 F7~
Z.
Io
.. 1. .;
(3 "
Pt,
46(10
100
nalhbrato
at
what time
was
after-
applicationi of'
were
reading
reversed
were as
repeated. Surge
currents
thani
50 MA
iii
all the
cases
above
subsequenit cases
test:
to
2) Survivability
A\ll
test
objects
were
heatedt
liquid
to V/s~
h)
85 0C under Fluorinert
voltage
was
raised
to
each.
exceeding 500
In
case
fortIh,
of
failure,
fusistor
was
eachi
was
in-
h-
of
cooling, step
life testing
at
repeated.
4N
3)
Now
began
the
lonig-termr
and
not
a
85
slowly
was
period
During
only
23
rated
to to
voltage
was
applied; thus
10
6 kV do
applied
applied
was
kV, and 15
kMV
dc
was
I
kV.
at
4) The
interrupted
U~~~~~~~~~~~~dp
were
partial discharge
tested.
Sceps
to
anid
except foi
the
thirdt
and
plied
the
capacitors,
DISCUSSION
io
f'
h0 t1
(
i-;i
20
i-c
are
shlown in Tables IV
through
I)
IX.
event
was
k',
c
00ar
b
` a cd w411'' 0 N iP h o r
onie
of
the manufacturer
capacitor-s
of
in
weakness
was,
Spadce
111,
n-iI
c-ourse,
tLhatL
these
units
had
copious
corona,
mult i-
F[
" ''.
'i
;.
.-
lz. A
(' T I ( ) N.-
A, 1, R ( - I -) .,N'T. -1 N D
I
",
V () 1. A L'- ..
'N C).
-.1 A NNO -. A R Y 19 8 -7
OKV
-
N/pc
Ol/t12VR
N/pc
N/pc
1/2VR
1/2VR-IVR
N/pc
VR N/pc
VR43/2VR N/pc
N/pc
3/2VR
3/2VR-32VR
N/pc
N/pc
2VR
Y5VO
3879
Original
Measurement
Lk49pc
&.20pc
Bursts
444pc 222pc
16
105pc
6 20pc
4177pc
Bursts
109
3/2VR
20. 9pc
2,705 314T.7pc
Bursts
Multiple
at 3.5KV
16-Tpc
ToT40pc+
Bursts
7168
A.220+
1444
322+ 341pc
Bursts
Breakdown
Manufacturer
E
Y5VO
Measurement
Original
10'.Opc _22+16pc
7 17c
10?ZFpc
Bursts
416 208pc
19 L70pc
2896 .316pc
Bursts
e170+234 pc
Bursts
951
Life Test:
5
4 27pc
e
3/2VR
22pc
.4
233pc
1906
+128 +241pc
18
T327pc
11,955
Bursts
4202pc
1310
Bursts
3/2VR
43pc
49pc
444pc
4243pc
426
at 3.5KV
Bursts
e52+198 +275pc
171
i.352pc
6985
Bursts
Bursts
2938 436tpc
Bursts
Breakdown
= 100 s; calibration: 8
400 pC.
N/pc
2 2. lpc
1
OKV
0-pl/2VR
N/pc
1/2VR N/pc
1/2VRKVR
N/pc
N/pc
VR
VR-P3/2VR
N/pc
N/pc
3/2VR
3/2-%VR
N/pc
2VR N/pc
Original #1
e
&4.5pc
0
0
7 L 7pc
Illpc
1 1.7pc
2 7+29pc
1
s6. 6pc
0 0
2 2.8,3.7pc
15
18pc +107pc
2
(14pc
24
15
+77pc
x14pc +60pc
19 4 12pc +94+161pc
19 36pc 6 .7.3pc+368pc
1 2.5pc
0
4
9+25pc
5 c43pc
4
z 32+77pc
.36pc
17445
2
0
2 3. 7pc
2VR
850C,
38.6pc
48.7+36pc
20426pc
25
. 9+133pc
18
Measurement
at at
Original #2
2 2.1pc
1 3.3pc 0
11pc
43.7pc
u
1
e.26pc
-24.5pc
C15pc
19
19
8 o 7.8pc
0
. 25pc
32
L 8.9pc
30
.49.4pc
<.14.3pc
0 2 16
28+58pc llpc
413pc
4
11
850C, 3/2VR
27
28
12
850C, 3/2VR
850C, 2VR
0
0 0
u
1
0
0
19 Z 14.5
2.8pc
1 2pc
3.6pc
4 3.3pc
c18.6pc
L12.7pc
30
16
<
20pc
27
3. 3pc
c8. 7pc
41 +85pc+236pc
25
Z 30+259pc
cl5pc
44
i7.8pc
I11.4pc
e.2.8+74+222pc+307pc
10
460 pC.
89
OKV
0
0-.*1/2VR
j140pc
49
1/2VR
l5pc
0 4
1/2VRg-VR
169 To 460+pc
29
VR
13 31pc
VR9-3/2VR
537 To 460+pc
3 /2VR
3/2VR-*2VR
To 460+pc
2VR
359 L 128+
48
Original Measurement,
49
#7
70+174 +34
14
a
78
1153
7pc
212+220+283pc
,404pc
4420pc
To
278pc
107+282 pc
0
6 63.7+21
11
* 6pc
To 460+pc
159
165
26+90pc
168
38
3.3pc
61 ,473+
cl6+9lpc
12 1+300pc
69
11
To 460+
,69+5 to 392
t75+187+317pc
24 70
52
_!5.lpc
0
_0
53
460+pc
40
6B.2pc
1
10
4 to 360pc 89 To 460+pc
1 1.5pc
85 L104+
To 460+
459
2VR
,437pc
39 To 460+pc 60 To 460+pc 60 To 430 57 To 460+
314
To 460+pc
1.Opc
,17.2pc
4
,.371
236
37pc
Measurement,
Original
#5
1 2.8pc 0
54 Lll7pc
72
L3.7pc
5
L218pc
111
149
5pc
7
_440pc
218 To 460+ 226 To 460+
386
29
-26+7 to 224pc
13 4 40+316pc
33 C 43
t4lOpc
73 L393
tlOpc
7 A.14
L383pc
118 To 460+
454+413
10
6 .9.lpc 8 4. 2pc
c83pc
108 To 440+
2VR
more at
414
0
343
98
213
L5.lpc
0
L440
107 r460+
522
33+120pc
6 <36.6pc
21
2VR
850C,
L395
27
89
To 460+
L_277+396
=
aObservation time during AV\. 10 s; quiescent observation time TABLE VII Partial Discharge History During Life Testinga
Date&tHistory Manufacturer E
848 (6KV) X5T lOOOpf, 6KV rated
10 s; calibration: 2
460 pC.
0
0
0-1-1/2VR
i33pc
22
1/2VR
1/2VR -VR
588 4307pc
VR
23 C66pc
VRg-3/2VR
2398 4179+305(2)
3/2VR
14 L55pc +180pc
3/2VR-*3P-2VR
4120pc+ 248(5)
19
8339
Bursts
2VR
11 421pc
2VRg+O
440(7)pc
76 z78+
L_4.2pc
0
0
+49(2)pc
4 t7+
0
0
8/6VR, 850C
8/18/78 After
250 hrs at 2VR, 85C
0
4307+78+85
+112pc
117
L55+121pc
9 36pc
50
.4
9pc
< 18+60+
177+220+390
45 cw 253pc
21Opc
4 lOpc
493pc
14
22
36 -68+120pc
39
4
7. 3pc
C 108pc
14 13pc
427pc
18
.114+164
309
+348pc
35
73 L22+69pc
&139pc
3048
+194(2)
+362pc
Bursts
4 lOpc
11,260 4200pc
Bursts
+258(2)+320
81
+160(2)
+210pc Bursts
1649 90
9 4l9.5pc
0
c
250 hrs at
163+176
1llpc+
8 5pc
28 4102pc
215 (65+136pc
21 160pc
llpc
27
13
134(3)
1773
C 63+
16pc
37 44 +173pc
10
6 34pc
5
6/2/78
Imme-
12 107pc
2 z.4pc 0
60 494+
12
350(5)pc
+232pc
13 L29pc
0
Burst at 8KV
e-21pc
3
i-19+58
35 4114pc
u31pc
137
4 12pc
Burst
100 s; calibration: 2
460 pC.
90
JANUARY 1982
M X5R
after 6 mins 4 x
15 13 12 14 11
A Z5R
1046 1028 1066 1050 1050 lOOOpf 10KV 979 982 980
i0I2
2.5 x 1012
2 x 1012
1012
x x
x
1012
1012
102
4 5
C
1 2 3
972 968
x x x
x 1012 x 10
Y5F
9 5 7 6 1
E
lOOOpf 4KV
982 984 974 980 992
0.0091 0.0090
0 .0088 0.0088 0.0093
1 1 1 1.3 1.3
x x x x x
1012
1012 1012
2.5 x
1o12
1012
1012
2.7 x 1012
Y5V0 20
8500pf 4KV
18 16 14
11
.4 .8 .3 .4 .3
x1012
x
x10 12 01
.6 x 10
12
.8 x 10
12
.9 x 10
1.4 x
101
ple bursts, originally. As can be seen in Table IV, numbers 15, 18, and 16 had markedly increased corona already after the first 250 h at 3 V, and 85. Whereas originally multiple bursts of partial discharge pulses began to occur just above VR when the voltage was increased, now it occurred upon AV below VR. Whereas originally there were no multiple bursts at quiescent voltage except at 2 V., multiple bursts up to almost 400 pC now occurred at quiescent VR and 3 V. Units 14 and 19 seemed to improve after the first 250 h, but then also worsened as the life test continued, 14 showing degradation after a total of 500 h at 32VR and 19 after an additional 500 h at 2 VR. Except for 19, which survived, 15, 18, 16, and 14 failed when they were raised to 2 VR, either to do PD testing or to continue the last half of the life testing. This is not to say that all of manufacturer E's capacitors will worsen or fail under this regime of accelerated life testing, but only that this particular batch and type failed. In fact, Table VII shows that with a different type and formulation of E's capacitors, namely, 1000 pF, 6 kV, no worsening and in fact a decrease in corona was obtained after 250 h at 8 VR and 250 h more at 2 VR (848 - (6 kV) - X5T 1000 pF). 2) It is interesting to note in Tables VIII and IX that of the usually standard quantities measured,
namely, capacitance, dissipation factor, and insulation resistance, only the dissipation factor showed a definite degradation from about 0.0066 to 0.0099 after the first 500 h at 32 VR. Techniques for measuring the insulation resistance (IR) of capacitors in a satisfactory manner are a subject in themselves. Suffice it to say at this point that the instrumentation available for that parameter determination, for this study, was only good enough for an order of magnitude measurement and did not give an indication of degradation before failure. 3) Certainly one can say that the particular A, M, and C capacitors all survived the 1000 h life test. One can begin to see that after 1000 h: a) roughly speaking, the A and the M capacitors stayed just about the same as originally, perhaps a few more high charge counts at 2 VR than originally, and b) the C capacitors seemed to first get worse, but then during the last 250 h at 2 VR seemed to improve in corona behavior. These C capacitors are somewhat of a puzzle, in that they exhibit some extremely energetic single corona pulses, level to 8000 pC, originally. Yet they survived the life test to 2 VR. The question that has not been answered to where the corona is coming from in all these samples. Dissection of the capacitors is necessary for this. Some lapidary work shows that the size of the electrodes over the disks and the way of
91
3V5, 85
DF
(6/21/78)
at VR; 3 Mins
important idea is that all the measurements in a given test series be carried out in the same, consistent way.
CONCLUSIONS
X5R
lOOOpf
C
10KV pf
Insulation R, in IL,
after VR applied.
15 13 12 14 11
A
2.2x1012
1. 4x1012
2X1012
Z5R
10KV 962
lOOOpf
1 2 3 4 5
C
2x1012
3xlO12 2xlo12
Y5F
9
5 7 6 1
4 New 3 New 2 New
992 983
.0094 . 009 3
.0099
1x1lO12
1X1012
1) Direct voltage PD measurement is a nondestructive, yet revealing technique as to how a device intended for direct voltage use will behave in actual service. Especially informative as to the state of the insulation are data acquired during the raising of voltage or upon AV. Data must be acquired over intervals of time ranging from about 10 s to 200 s, and therefore the testing is time consuming. 2) Rather than only looking for rejection and acceptance criteria of high voltage dc devices, the user should also look for his own rating criteria. For capacitors, from the work done so far, the following guidelines emerge:
a) Make PD
1
.0097 .0098 Up
1. 3X1012 .9X1012
1x1012
measurements at
V.
E Y5VO
20
11
16 14 13 New
.48x1012
.4xlO1
.27X1012
7500
7748
.22x10
.3x102 .53xlO11
12
9% increase
50% increase
dressing out the metal leads is different for the different manufacturers and different for a given manufacturer from time to time (E). Both A and M seem to extend their electrodes precisely to the edge of the capacitor disks. They offset the leads slightly from the body of the disk near the rim so as to permit the epoxy coating to get in between the lead and the disk. Some voids were seen there, but do not matter because the disk is metal coated to the edge. The particular C's and E's tested have electrode diameters significantly smaller than the disk diameter. The particular C's leads were pressed right down close to the body of the ceramic with no epoxy coating between body and lead. The 8500 pF E's had the leads offset near the rim and seemingly coated with a soft inner coating and then the epoxy on top of that. More work needs to be done on this sectioning. 4) There is a question as to whether one should, for at least 24 h before PD testing, ground the capacitor leads or just leave them open circuited. The units in this study were left open circuited since this is the experience they will have in service. Experiment shows that grounding for 24 h before testing will indeed decrease the number of counts somewhat, but does not change the essential nature of the type of corona (bursts, or singles, very energetic or not). The
92
2- VR 2 VE, 2 VR. Here VR is the manufacturer's rated voltage. If already below VR a sharp increase in the total number of pulses and in their charge content, going above 100 pC, is observed during data acquisition upon AV, then derate the device to one-half of the manufacturer's rating (C). If no such sharp increase is observed, then use the device at the manufacturer's rating (A, M). If multiple bursts of corona are observed, reject the device (the 8500 pF E's). b) Furthermore, expose the devices to 250 h of ac3 V R,.Afeth25 After the 250 h celerated life tests, at 85 C and 2 again take PD data. If the corona has become more numerous and energetic, then reject the devices (the 8500 pF E's). Space charge injection during the 250 h and the resulting polarization should normally make the measured corona less numerous and energetic after the 250 h, even after a 24 h waiting period. If despite this, the corona has become worse, it is a definite indication of insulation damage. c) The measurement technique must be consistent, that is, always apply high voltage in the same direction to the sample if several sequential measurements are made; always go through the same time sequence of raising voltage; always wait 24 h after the last application of high voltage before doing PD measurements. During this waiting time the terminals can be grounded or ungrounded, as long as the same is done every time.
3
VR.
0, 0
and
VR,
VR,
VR,
VR
VR,
VR,
possibly
3) The relationship between ac and dc corona has been partially explored, but more work needs to be done on this. So far, a definite conclusion is that dc corona will not be found below ac inception voltage. There is no rhyme or reason among the various manufacturers as to how they rate their dc capacitors for dc use from their measured ac inception voltage. Some manufacturers give dc ratings only 20 percent above the ac corona inception (A); others give dc
VOL. AES-18, NO.
1
JANUARY 1982
ratings that are as much as three times the ac inception voltage (C) at 100 pC. The 100 pC limit on the ac criterion is probably a good experiential number. It could possibly be made more stringent at no PD pulses above 50 pC for dc use. 4) A database needs to be established on different groups or types of insulation systems, e.g., high voltage cables or transformers or potted travelingwave tubes. This report, which is mostly a ceramic capacitor study, must not be misused to judge, for instance, high voltage cable quality from a single measurement of the PD signature of a particular cable. 5) With the aid of such sets of databases, it is the opinion of the authors that PD testing, especially during a change of voltage gives a better, more detailed, "microscopic" insight into the state of electrical insulation than the more customary "macroscopic" quantities like capacitance, dissipation factor, and insulation resistance. PD testing can be used to detect trends before seemingly sudden, unanticipated catastrophic failures occur.
REFERENCES
[2]
[31
Dakin, T.W. (1978) Partial discharges with dc and transient high voltages. Proceedings of the National Aerospace Electronics Conference, Dayton, OH, May 1978.
[41
[51
[6]
[7]
[81
(11
Kreuger, F.H. (1964) Discharge Detection in High Voltage Equipment, New York: American Elsevier, 1964.
Corona discharges in dc and partially rectified ac insulation systems. Proceedings of the 8th Electrical NEMA-IEEE Insulation Conference, Los Angeles, CA, Dec. 1968. Melville, D.R.G., Salvage, B., and Steinberg, N. (1965) Discharge detection measurement under dc voltage conditions. Proceedings of the IEE, Sept. 1965, 112, 1815-1817. Densley, J. (1977) Partial discharges under direct voltage conditions. National Research Council of Canada, Ottawa, Ontario, Canada. Shihab, S. (1972) Partial discharges in voids in polymer insulating materials, using high voltage dc. Ph.D. dissertation, High Voltage Institute, University of Braunschweig, Germany, 1972. Benett, A.I. (1972) Frequency dependence of partial discharges and measurement of void content in insulation. Presented at the NAS-NRC Conference on Electrical Insulation, 1974, paper 2, session B. Densley, J., and Sudershan, T.S. (1977) Some results of partial discharge measurements during the growth of electrical trees. Conference on Electrical Insulation and Dielectric Phenomena, Colonie, NY, 1977.
Renate S. Bever was born in Stuttgart, Germany. She received the M.S. degree in physics from Cornell University, Ithaca, N.Y., in 1951. She has taught physics at several colleges and universities, among them American University and the University of the District of Columbia. While there, she did research on high voltage insulation systems for space use. She has continued this activity since joining the staff of NASA/Goddard Space Flight Center, Greenbelt, Md., in 1978, as an aerospace engineer in the Space Power Applications Branch.
John L. Westrom received the B.S.E.E. degree from the University of Illinois, Urbana, in 1960. Since 1966 he has designed instrument power supplies and distribution systems at the NASA/Goddard Flight Center, Greenbelt, Md. He is head of the Instrument Power and Payload Interface Section. He also is a consultant on high voltage design for instrument systems.
BEVER/WESTROM: PARTIAL DISCHARGE TESTING UNDER DIRECT VOLTAGE CONDITIONS 93