CONTINUOUS ASSESSMENT TEST - II AP9212 ADVANCED DIGITAL SYSTEM DESIGN
Class: I M.E. (Applied Electronics) Date: 11-12-12 Semester: 01 Duration: 3 Hrs. 0 Answer ALL Questions
PART-A (10 X 2 = 20)
1. What are the two common types of faults that occur in digital circuits? 2. State the conditions for faults to be equivalent and for faults to be redundant. 3. What is the need for self-test in Digital System? 4. State any two properties of Boolean difference. 5. Define MTBF. 6. What is propagation D-cuts? 7. Give an example for the process statement. 8. What is a Test Bench? 9. Write a VHDL code for a 2 1 multiplexer using data flow modeling. 10. What are named and positional associations in structural modeling?
PART - B (5 X 16 = 80)
11. (a) Explain the procedure for designing fault- secure PLA with suitable example. (16)
OR
(b) i) Explain how the Boolean difference method is used for test generation with example. (08)
ii) Derive the test vector to detect the stuck-at-0 fault at line 3 of the following logic circuit using path sensitization method. (08)
12. (a) Explain about BIST. (16)
OR
(b) Explain the path sensitization method. Derive the test vectors to detect the following stuck-at-faults in the given circuit : line a s-a-0, line a s-a-1, line f s-a-1, line w s-a-1. (16)
13. (a) Using structural modeling write a VHDL for a 4 bit shift register. Also write a test bench for it. (16)
OR
(b) (i) Discuss the test generation using any programmable devices. (08)
(ii) Explain about fault table method with example. (08)
14. (a) i) Explain structural modeling with a suitable example. (08) ii) Explain behavioral modeling with suitable example. (08)
OR
(b) Design a simple Microprocessor using VHDL. (16)
15. (a) Write the VHDL code for 3x3 multiplier and test bench to test its functionality. (16)
OR
(b) Write a VHDL code for the following circuits: i) 1 : 8 Demultiplexer (06) ii) What is a generate statement? Write the VHDL code for 4-bit parallel adder using generate statement. (10)