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mechanical properties microprobe (MPM) from MTS
Corporation. With the MPM, simultaneous measure-
ment of indenter penetration depth and load makes it
possible to determine certain mechanical properties.
Mechanical properties assessed were hardness, modu-
lus and creep properties. The most significant finding
with regards to mechanical properties change turned
out to be the decrease in hardness as a function of
Fig. 10. Effect of reflow on the microstructure of eutectic Sn-3.5Ag non-
composite solder joint: (a) non-reflow, (b) first reflow, (c) second
reflow, and (d) third reflow.
a b
c d
a b
c d
Fig. 11. Effect of reflow on the growth of Cu-Sn intermetallic layer at Cu
substrate-solder interface in eutectic Sn-3.5Ag non-composite solder
joint: (a) non-reflow, layer thickness = 1.74 m, (b) first reflow, (c) second
reflow, (d) third reflow, layer thickness = 4.27 m.
1247
Effects of Reflow on Wettability, Microstructure
and Mechanical Properties in Lead-Free Solders
reflow as shown in Fig. 13. Also, the yield strength can
be estimated according to Tabor
14
from hardness
data. In Fig. 14, the relative change in yield strength
is shown as a function of reflow. On average, the yield
strength of eutectic Sn-3.5Ag solder is reduced by
~30%. The reduction in hardness/yield strength is
motivated by the change in solder chemistry and
microstructure due to the reflow process. It is sug-
gested that the composition of the solder changes
from the eutectic composition (96.5 Sn-3.5 Ag) to an
off-eutectic composition containing less Sn due to
reflow. The reduction in the amount of Sn is due to its
consumption in the formation of the intermetallic
layer consisting of Cu
6
Sn
5
and Cu
3
Sn compounds.
15
Change in solder microstructure is expected for off-
eutectic stoichiometry. Proeutectic Ag
3
Sn will pre-
cipitate out of the liquid first followed by solidification
at the eutectic composition with continued cooling. As
indicated in Fig. 10, the Sn cells became larger and
the necklace of eutectic Ag
3
Sn became narrower sub-
sequent to multiple reflows. The microstructure
Fig. 12. Comparison of interfacial intermetallic layer growth due to
reflow between Cu composite solder, Ag composite solder, and
eutectic Sn-3.5Ag non-composite solder joint.
Fig. 13. Change in hardness of eutectic Sn-3.5Ag solder as a function
of reflow.
Fig. 14. Change in yield strength of eutectic Sn-3.5Ag solder as a
function of reflow. yield strength decreases with multiple reflows.
Fig. 15. Microstructure of eutectic Sn-3.5Ag solder around indent:
(a) non-reflow solder, (b) three-reflow solder. The size of the Sn cells
is larger for reflowed materials. Correspondingly, the yield strength is
lower.
a b
Fig. 16. The effect of reflow on steady-state creep strain rate of eutectic
Sn-3.5Ag solder. The stress exponent is slightly higher for multiple
reflowed solder.
1248 Guo, Choi, Lucas, and Subramanian
around the indents of the non-reflow and 3 times-
reflowed solder is shown in Fig. 15. In Fig. 15a for non-
reflow solder, smaller Sn cells and wider Ag
3
Sn bands
were evident. Whereas, Fig. 15b showed larger Sn
cells and thinner Ag
3
Sn bands after three reflows.
The lower hardness and yield strength observed is
consistent with materials having a larger grain size.
Nanoindentation creep tests were conducted. As-
suming steady steady-state behavior, = A
n
, the
stress exponent for indentation creep was also deter-
mined for non-reflow and multiple-reflowed solder.
The stress exponent for eutectic Sn-3.5Ag solder ma-
terials after three reflows was n = 8, whereas the non-
reflow solder exhibited a value of n = 7.1. The stress
exponent data are shown in Fig. 16. The difference in
n-values suggests that creep deformation in the sol-
der is influenced by reflow history. From n values
obtained, the steady-state creep rate of reflowed sol-
der materials is higher due to reflow-induced micro-
structure and composition changes.
CONCLUSIONS
1. Eutectic Sn-3.5Ag solder showed the best
wettability of all the solder materials studied.
The wettability of 17.5 vol.% Ag-reinforced com-
posite solder was significantly better than 17.5
vol.% Cu-reinforced composite solder. Because of
profuse intermetallic layer growth around Cu
reinforcements, the effective volume fraction
doubled. Wettability can be improved, however,
by lowering the volume fraction of the reinforcing
phase, particularly Cu particles.
2. No significant changes in contact angles were ob-
served with multiple reflow of the solder materials.
3. The initial formation of Cu-Sn intermetallics
around the Cu reinforcements was considerable,
whereas the Ag
3
Sn intermetallic layer thickness
around the Ag reinforcements was minimal.
Growth of the intermetallic layer around the Cu
particle reinforcements was excessive leading to
total consumption of the Cu particles after 34
reflows. By comparison, no substantial conver-
sion of the Ag reinforcements into Ag
3
Sn interme-
tallics was evident after multiple reflows.
4. The microstructure of non-reflow eutectic Sn-
3.5Ag solder can generally be characterized by
small Sn cells surrounded by wide-banded eutec-
tic Ag
3
Sn phase. In comparison, the microstruc-
ture of multiple reflowed solder is characterized
by large Sn cells circumvented by a thin necklace
of eutectic Ag
3
Sn precipitates.
5. The hardness and yield strength of multiple
reflowed eutectic Sn-3.5Ag solder were reduced
by 30% after three reflows. This finding is com-
mensurate with the increasing size of Sn cells
produced by multiple reflow as a larger grain/cell
size that will exhibit a lower yield strength.
6. The stress exponent, n, determined using inden-
tation creep testing was about 7 for non-reflow
solders and about 8 for multiple reflowed solders.
From the stress exponents observed, the steady-
state creep rate for the multiple reflowed solder
will be higher compared to non-reflow solder.
ACKNOWLEDGEMENTS
The authors acknowledge the support of this work
from the State of Michigan Research Excellence Funds
administered through the Composite Materials and
Structures Center at Michigan State University. We
also thank Brandon Campbell for his assistance in
sample preparation and testing.
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