ISSN 1594-1906

Padova and Asiago Observatories

Technical Report n. 23
September 2005
Document available at: http://wwwpdastroit/
Vicolo dellOsservatorio, 5 35122 Padova Tel. +3!"#23"11 $a% +3!"1#&5#"!
!ewritab"e #o$a" p"ane %as&s #or 'OS
'. (ianco, ). (ertarelli, *. +iro, *. ,olinari
2
Technical Report N. 23 Rewritable focal plane masks for MOS
Introd($tion
' ne- .ind o/ /ocal 0lane mas.s /or multi ob1ect s0ectrosco02 3as been develo0ed to obtain ne- /unctionalities,
0articular t3ese ne- mas.s are re-ritable man2 times. T3e2 also can be -rite durin4 t3e same ni43t o/ t3e observations.
T3e idea is to simulate t3e /unction o/ a ,O56mas. b2 usin4 03otoc3romic materials 7develo0ed at Politecnico di
,ilano8, -3ic3 are de/ined as c3emical s2stems -3ic3 reversibl2 c3an4e t3eir absor0tion s0ectra, and conse9uentl2 t3eir
color, b2 irradiatin4 t3em -it3 suitable -avelen4t3s. T3e 0ossibilit2 to c3an4e t3e 0ro0erties o/ a material sim0l2 b2 an
e%ternal stimulus 7li43t8 ma.e 03otoc3romic materials 4ood candidates /or a00lication in tec3nolo42, suc3 as /or
dis0la2s, o0tical memories and -ave4uides. :suall2 t3ese materials 3ave one colored /orm and t3e ot3er uncolored. $or
$P, a00lication t3e colored /orm simulates t3e o0a9ue /orm o/ t3e mas. and t3e latter t3e trans0arent slit. T3e
trans/ormation bet-een t3e uncolored and t3e colored /orm is induced b2 :V irradiation, -3ile visible li43t allo-s t3e
recover2 o/ t3e initial state.
1 'as& preparation
T3e 03otoc3romic 0ol2mer used 3as a ver2 broad and stron4 absor0tion band centered near ;2! nm, t3us t3e use/ul
s0ectral ran4e is bet-een 5!! to &!! nm coverin4 im0ortant astronomical emission lines 7<, =a, ,4, O>???@8.
To obtain t3e mas. -it3 t3ese 03otoc3romic materials it is necessar2 to use a 0ol2mer matri% o/ P,,' because t3e
active materials itsel/ does not /orm 4ood o0tical /ilm.
T3e /ilm is cast /rom a solution onto t3e 5%5 cm 0late o/ (A& 7even i/ t3e t3ic.ness o/ t3e mas. is about 1!! m, t3e
area is 5%5 cm and t3e mas. can not be .e0t /lat8 -it3 Doctor (lade tec3ni9ue in a clean room to avoid dust
contamination -3ic3 is a source o/ scatterin4. 'll t3e o0erations are carried out b2 usin4 a BA )ontrol )oater.
T3e 9ualit2 o/ t3e /ilm de0ends on man2 /actors: suc3 as t3e concentration o/ t3e c3romo03or or t3e viscosit2 o/ t3e
solution. 5ometimes it 3a00ens t3at t3e 03otoc3romic molecules remain arran4ed in domains visible -it3 o0tical
microsco0e -3ic3 decreases t3e trans0arenc2 and increases t3e li43t scatterin4, t3us reducin4 t3e contrast bet-een t3e
t-o 03otoc3romic states 7lo- contrast8.
' 0rotocol /or t3e 0re0aration o/ o0tical 9ualit2 03otoc3romic /ilms is de/ined as /ollo-:
T3e 03otoc3romic molecules are dissolved in )<)l3. '/ter t3e com0lete solubiliCation is reac3ed, P,,' is added
725! m4Dml8 and t3e solution is stirred and, i/ necessar2, 3eated. T3e content o/ t3e c3romo03ore is about 56E -t.
703otoc3romic moleculeDP,,'8 de0endin4 on t3e molecule c3osen.
T3e solution is /iltered 7/ilter 0ore !."5 m8 to remove dust 0articles and a44re4ates.
T3e solution is concentrated at lo- 0ressure 715 mm<48 reducin4 t3e volume to 2D3 o/ t3e startin4 volume. T3e
reduction o/ t3e volume o/ solvent increases t3e viscosit2 o/ t3e medium ma.in4 t3e castin4 0rocess easier.
T3e solution is cast on 4lass substrateF b2 usin4 a s0iral o/ 2!! microns t3e t3ic.ness o/ t3e dr2 0ol2meric /ilm is
rou43l2 #!611! m.
T3e 9ualit2 o/ t3e /ilm is evaluated t3rou43 t3e o0tical microsco0e and t3e ))D ima4es ta.en -it3 '$O5) camera.
) *riting pro$ed(re
?n order to obtain $P, based on 03otoc3romic materials t3e slits 0attern 3as to be -ritten on t3e la2er 0re0ared
accordin4 to t3e 0rocedure described above.
T3e idea is to read directl2 t3e star coordinates 7so t3e slits 0osition8 o/ a s0eci/ic s.2 /ield 7see /i4ure 1a8 /rom a /ile
-3ic3 is t3e out0ut o/ t3e camera so/t-are and to -rite t3e slits on t3e mas. in t3e corres0ondin4 0osition 7see /i4ure
1c8. T3e set6u0 is desi4ned to be com0atible -it3 '$O5) and d.o.lo.res 7Go- Besolution ?ma4er650ectro4ra03 /or t3e
?talian =ational Telesco0e +alileo8 cameras so/t-are -3ic3 0rovides t3e ima4e o/ t3e slits desi4ned as sim0le standard
'uto)ad .d/% /ile. 5ince t3e seein4 conditions a//ect t3e actual siCe o/ t3e s.2 ob1ects, -e -ant a /le%ible set6u0 t3at can
-rite slits o/ di//erent -idt3 in order to re4ister t3e s0ectra in t3e o0timal conditions.
#ig(re 1 + Steps #ro% the s&, i%age to the %as& thro(gh the A!A-!O set-(p: .a/ prei%aging with the s"its0 .b/
inter#a$e o# the so#tware (sed0 .$/ res("ting 1P'
' s0eci/ic device called 'B'TBO 70lo-8 3as been develo0ed 7/i4ure 28 to carr2 out t3e -ritin4 0rocess. ?t consists o/
t-o 0er0endicular motoriCed sta4es -it3 a 0late -3ere t3e o0a9ue mas. is 0laced. ' diode laser 7;;! nm, "! mH8 is
mounted onto a column -3ic3 3as a microsco0e ob1ective at one side. ' sim0le s2stem to /ind t3e /ocus e9ui0s t3e
column. (ot3 t3e sta4es movements and t3e s-itc3in4 onDo// o/ t3e laser are P) controlled b2 a so/t-are -ritten in Perl
lan4ua4e.
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Technical Report N. 23 Rewritable focal plane masks for MOS

#ig(re ) + Pi$t(res o# the A!A-!O set-(p2 on the "e#t the who"e s,ste% with the two stages and the $o"(%n with
the "aser2 on the right a detai" o# the ob3e$tive d(ring the writing o# a %as&
T-o im0ortant 0arameters are 4iven as in0ut to t3e so/t-are: 718 t3e -idt3 o/ t3e slits -3ic3 is set b2 c3an4in4 t3e /ocus
o/ t3e laser and usuall2 some tests on t3e ed4e o/ t3e mas.s are carried onF 728 t3e number o/ times t3at t3e laser 3as to
irradiate eac3 slits to convert com0letel2 t3e /ilm to t3e trans0arent /orm. T3is is an im0ortant 0arameter to control t3e
s3ar0ness o/ t3e ed4es o/ t3e slits. :suall2 eac3 slit is -ritten 2! times.
?n order to understand and 9uanti/2 t3e errors induced in t3e /inal mas., t3e set6u0 -as c3aracteriCed in terms o/ t3e
0recision and t3e re0eatabilit2.
To evaluate t3e 0recision, a metallic mas. -it3 a matri% o/ 0in3oles -3ic3 is considered -it3 a ne4li4ible error is used
as standard. 'n ima4e o/ suc3 mas. is recorded -it3 t3e '$O5) camera. T3e standard mas. is used as a re/erence to
9uanti/2 t3e /ictitious 0osition error due to t3e telesco0e and camera distortion. T3e same 0rocedure is used -it3 a
03otoc3romic mas. -ritten -it3 an arra2 o/ 0in3oles and t3e error is evaluated a/ter t3e correction -it3 t3e standard
error.
$i4ure 3 s3o-s t3e /ittin4 -it3 a second order 0ol2nomial o/ t3e 0ositionin4 error alon4 I and J directions and t3e
residual o/ t3e correction -3ic3 turns out to be ver2 small.
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#ig(re 4 + 5rror position #itting and resid(a"s: .a/ 6 a7es0 .b/ 8 a7es
T3e B,5 7root mean s9uare8 error on a 5%5 cm area is a00ro%imatel2 1; m 7-3ic3 corres0onds to !.2 arcsec on t3e
s.2 -it3 'sia4o telesco0e and '$O5) camera8F t3is is considered a 4ood results es0eciall2 i/ -e consider t3at t3e -idt3
o/ t3e slits is usuall2 2!!63!! m.
T3e re0eatabilit2 o/ t3e set6u0 is evaluated b2 -ritin4 t-o s0ots alternativel2 man2 times on a 03otoc3romic mas. and
loo.in4 at t3e s3a0e o/ t3e s0ots to 0oint out i/ an2 di//erence occurs. 'lso in t3is case t3e results are 4ood: t3e s3a0e
and t3e siCe o/ t3e t-o s0ots remain t3e same a/ter man2 re-ritin4 ste0s.
T3e slits must also 3ave s3ar0 ed4es in order to avoid a de0endence o/ t3e si4nal. To test t3is as0ect o/ t3e
03otoc3romic mas.s, t3e 0ro/ile o/ t3e slit is e%tracted /rom t3e ))D ima4es 7/i4ure "8 and t3e slo0e -as evaluated.
2
laser
Technical Report N. 23 Rewritable focal plane masks for MOS
#ig(re 4 + Pro#i"e o# s s"it #ro% a 99: i%age #ro% the A1OS9 $a%era to st(d, the s"ope o# the edges
T3e result is 9uite 4ood, t3e di//erence bet-een t3e com0letel2 trans0arent and com0letel2 o0a9ue si4nal occurs in less
t3en " 0i%els.
T3e 'B'TBO set6u0, -3ic3 is /ull2 c3aracteriCed, meets all t3e s0eci/ications -e -ant to -rite t3e 03otoc3romic /ocal
0lane mas.s. ?n t3e /ollo-in4 section some s.2 tests are described to demonstrate t3e real use/ulness o/ t3is .ind o/
mas.s.
4 ;aborator, tests
To c3aracteriCe t3e mas.s and veri/2 t3e 0ractical a00lication in astronomical instrumentations, -e 0er/ormed some
tests b2 usin4 a :V6Vis laborator2 s0ectro4ra03 7K'5)O V5&!8 as -ell as t3e '$O5) camera.
' /ilter is needed to cut t3e -avelen4t3s -3ere t3e ))D is sensitive but bot3 t3e 03otoc3romic /orms are trans0arent.
He used t-o /ilters -it3 a ver2 3i43 e//icienc2 t3at select t3e e%act s0ectral ran4e -3ere t3e c3an4e in transmittance o/
t3e 03otoc3romic material ta.e 0lace 7solid line in /i4ure;8.
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$as% o&a'(e
1ig(re 5 + -rans%ission $(rves o# the two #i"ters (sed in $o%bination with the photo$hro%i$ %as& in the opa<(e #or% .so"id
"ine/ -he two #i"ters %at$h the spe$tra" range o# the %as&0 %a&ing the s,ste% $o%p"ete", opa<(e in the visib"e range
T3e actual transmission curves o/ t3e /ilters in t3e '$O5) camera are sli43tl2 di//erent /rom t3ose re0orted in /i4ure ;
since t3e /ilters are tilted in t3e cameraF as conse9uence t3e transmission curves s3i/t to-ard s3orter -avelen4t3s and t3e
e//icienc2 decreases. ,oreover, t3e be3avior o/ t3e s2stem mounted on t3e '$O5) camera is necessaril2 di//erent /rom
laborator2 results since t3e s0ectro4ra03 o/ t3e telesco0e is not an ideal s2stem.
T3e s2stem o/ /ilters and mas. -as t3en tested in t3e '$O5) camera b2 usin4 /lat /ield lam0s as li43t source. ' metallic
slit is c3osen as a re/erence and as tar4et /or t3e 03otoc3romic mas.s. T3e contrast 7)8 bet-een t3e o0a9ue and t3e
trans0arent areas o/ t3e mas. is evaluated as:
3
Technical Report N. 23 Rewritable focal plane masks for MOS
mask slit
mask slit
P P
P P
!
+

=
-3ere P$slit is t3e 03oton /lu% t3rou43 t3e slit and P$mas. is t3e 03oton /lu% o/ t3e area -it3out slits. 's s3o-n in /i4ure ;
t3e contrast /or t3e metallic mas. is ver2 closed to 1 7!.18, as e%0ected, because t3e metal is com0letel2 o0a9ue to an2
-avelen4t3 in t3e emission ran4e o/ t3e 3alo4en lam0. Hit3 t3e 03otoc3romic mas., t3e result is ver2 4ood 7!.3#8
-3ic3 means a 4ood matc3 bet-een mas. and /ilters and, conse9uentl2, a ver2 -ea. bac.4round noise. 'lso increasin4
t3e e%0osure time t3e results remain t3e same.
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1ig(re 6 + .a/ 99: i%age o# the photo$hro%i$ s"it2 the dotted "ine $orresponds to the pi7e" "ine $hosen to
%eas(re the $ontrast .b/ 9ontrast #(n$tion #or the %eta""i$ %as& .pea& on the "e#t/ and #or the photo$hro%i$
%as& .pea& on the right/
T3e same test -as carried on b2 usin4 t3e same /lat /ield source, but in t3e s0ectrosco02 con/i4uration o/ t3e '$O5)
camera. T3e 4rism L" -as selected 73!! lDmm, s0ectral ran4e 33;6&&" nm8 and t3e s0ectra -ere collected. T3ese are t3e
conditions -3ere t3e $P,s -ill -or..
's s3o-n in /i4ure &, t3e ratio bet-een t3e t-o curves concernin4 t3e metallic slit -it3 and -it3out /ilters is nearl2
!E in t3e s0ectral ran4e o/ t3e /ilters, t3us demonstratin4 t3e 3i43 e//icienc2 o/ t3e cou0le o/ /ilters used. On t3e ot3er
3and, t3e contrast o/ t3e 03otoc3romic mas. in s0ectrosco0ic conditions is almost 5!E o/ t3e metallic mas.. T3is
3a00ens because t3e lac. o/ com0lete o0acit2 o/ t3e mas. causes a su0erim0osition o/ li43t /rom di//erent 0ositions on
t3e mas. on a same 0i%el o/ t3e ))D. T3e conse9uence is a /urt3er reduction o/ t3e contrast. 5uc3 di//erences in
0er/ormance does not 0reclude t3e use o/ 03otoc3romic mas.s /or astronomical observations.
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to the pi7e" "ine $hosen to %eas(re the $ontrast .b/ 5%ission $(rves o# the #"at #ie"d witho(t #i"ter and with
%eta""i$ %as& .dotted "ine/2 with %eta""i$ %as& and #i"ters .dashed "ine/2 with photo$hro%i$ %as& and #i"ters
.so"id "ine/
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Technical Report N. 23 Rewritable focal plane masks for MOS
He 3ave to ta.e into account t3e di//erent nature o/ li43t source bet-een t3e test -it3 t3e /lat /ield c3aracteriCed b2 t3e
uni/ormit2 on t3e /ocal 0lane and t3e s.2 test -3ere t3e stars are 0ointli.e li43t sources -it3 di//erent intensit2. T3is
increases t3e com0le%it2 o/ t3e observations and data reduction.
4 S&, tests
5ome tests on astronomical tar4ets -ere carried out. T3e '$O5) camera -as set u0 -it3 a /ilter 7O538 di//erent /rom
t3e t-o described 0reviousl2 because t3e2 -ere not available at t3e moment.
T3e /irst tar4et -as t3e cro-ded ,;& cluster /ield: /irstl2, an observation 0attern -as -ritten onto t3e 03otoc3romic
mas. startin4 /rom t3e .d%/ /ile obtained selectin4 t3e ob1ect o/ interest /rom t3e 0reima4in4 o/ t3e 0reviousl2 recorded
,;& /ield. T3e s2stem 0roved to be e%tremel2 versatile: t3e incom0lete o0a9ueness o/ t3e mas. -as use/ull2 e%0loited
in t3is sta4e b2 observin4 t3e s.2 /ield -it3 t3e mas. and no dis0ersin4 element. T3e bac.4round bri43t ob1ect
7es0eciall2 0ointli.e star sources8 are -ell visible to4et3er -it3 t3e slitlets s3a0es.
T3e ali4nment 03ase, usuall2 carried out -it3 t-o series o/ e%0osures 7one -it3 mas. and one -it3out8, can be done
strai43t/or-ardl2 in one s3ot. '/ter t3at some s0ectra -ere recorded usin4 di//erent available 4risms. Hit3out /ilterin4
onl2 s0ectra -it3 3i43 contamination and lo- si4nal to noise ratio in t3e relevant s0ectral ran4e can be obtained 7/i4ure
#8. T3e s0ectral ima4es reveal not onl2 t3e star in corres0ondence o/ t3e slits but also ot3er bri43t stars t3at contribute to
increase t3e noise in t3e s0ectrum.
=evert3eless t3e s0ectrosco0ic data -ere actuall2 e%tracted and t3e bac.4round -as subtracted easil2, in t3e same
manner and -it3 t3e usual so/t-are tools used -it3 metallic mas.sF re/erence s0ectrum o/ a <e6=e lam0 -as re4istered
in order to calibrate in -avelen4t3 t3e ))D ima4e.
1ig(re > + 99: i%ages o# the spe$tra o# '6= #ie"d: .a/ witho(t #i"ter0 .b/ with #i"ter
T3e stellar /ield a00ears cro-ded -it3 ima4es o/ stars o/ di//erent luminosities and t3e main 1ob /or a ,O5 mas. is to
select t3e li43t /rom t3e desired stars. T3e t-o s3o-n s0ectra are t3e t20ical results /rom a non com0letel2 o0a9ue mas.
7/i4ure 8: in t3e u00er 0anel a star -it3 identical abscissa o/ t3e selected one su0erim0oses its s0ectrum on t3e ri43t one
7a00arentl2 3avin4 /lu% at lon4er -avelen4t3s8 -3ile t3e isolated star in t3e lo-er 0anel 0roduced a normal s0ectral
si4nal durin4 data reduction.
5
7a8 7b8
Technical Report N. 23 Rewritable focal plane masks for MOS
1ig(re 9 + Spe$tra obtained in the $rowded '6= open ste""ar $"(ster #ie"d In the top pane" the t,pi$a"
in$onvenien$e $orr(pted part o# the se"e$ted star In the "ower pane" a star spe$tr(% #("", red($ed with no
in$onvenien$es
$or t3e second test, a ,O5 mas. -it3 slits alon4 t3e nebula ,& 3as been made in real time 7see $i4ure 1!8F in less
t3an one 3our it -as 0ossible to ta.e t3e 0reima4in4 and select t3e tar4ets, obtain t3e mas. and /inall2 record di//erent
s0ectra o/ t3e tar4et. Gi.e-ise t3e 0revious case, t3e data -ere reduced and t3e c3aracteristic emission lines o/ 0lanetar2
nebulae due to O>???@ -ere detected near "; and 5!1 nm, t3us demonstratin4 t3at t3e mas. -or.s even in a s0ectral
re4ion -3ere t3e mas. contrast is not so lar4e.
;
Technical Report N. 23 Rewritable focal plane masks for MOS
1ig(re 10 + 99: i%ages o# the Ow" neb("a0 .a/ prei%aging0 .b/ the 1P's with s"its a"ong the neb("a $"o(d
s(peri%posed with the s&,: note the visibi"it, o# the three brightest stars whi$h g(ide the observer %oving the
te"es$ope on the target0 .$/ the spe$tra0 obtained a#ter a"igning the s&, to the s"it"ets -he p"ot is the trans%ission
$(rve o# the #i"ter (sed
?n t3e le/t 0anel o/ /i4ure 1!, t3e 0reima4in4 -as obtained -it3out an2 /ilter usin4 t3e '$O5) camera. T3e /ield is
dominated b2 t3e nebula -it3 /e- /ield stars and a bac.4round 4ala%2 in t3e u00er ri43t corner. T3e middle 0anel s3o-s
t3e e%0osure o/ t3e same /ield -it3 t3e Pol2TP mas. and a /ilter -it3 trasmission bet-een "&! nm and ;5! nm 75!E o/
0ea. transmission8. T3e li43t /rom t3e s.2 and ot3er obects is almost com0letel2 mas.ed out. T3e bri43test stars are still
visible: t3e contaminatin4 li43t cames /rom t3e s0ectral -in4s o/ t3e transmission /ilter -3ic3 is not com0letel2 dar.
-3ere t3e closed 0ortion o/ t3e mas. be4in to be trans0arent a4ain. T3e selected re4ions are mainl2 in t3e emission 0art
o/ t3e nebula, -it3 its central star, anot3er /ield star and t3e /aint 4ala%2. ?n t3e bottom 0art o/ t3e 0anel -e 0lot t3e
transmission o/ t3e com0osite mas.+/ilter in t3e trans0arent 73i43er8 and o0a9ue 7lo-er8 0art o/ t3e mas.. T3e ri43tmost
ima4e is ta.en -it3 t3e same observational set6u0 as t3e middle one -it3 t3e inclusion o/ '$O5) 4rism L". *ac3 o0en
slitlet 0roduced its o-n s0ectrum 7ob1ect 0lus t20ical bac.4round s.2 emission8 and t3e bri43test stars su0erim0ose t3eir
continuum 7slitless8 s0ectra addin4 noise to t3e overall ima4e. ?n t3e case o/ t3e /aint 4ala%2 t3e star cancels out
com0letel2 t3e desired s0ectrum as t3e2 3ave t3e same % s0atial coordinate. T3e nebular li43t is concentrated in t3e
>O???@ emission line and it is clearl2 evident in t3e relevant slits. T3e s.2 bac.4round is not constant mainl2 due to t3e
/act t3at di//erent 0i%els receive di//erent s0ectral ran4e /rom t3e s.2 at t3e to0 and bottom borders.
T3e /ollo-in4 s0ectra 7/i4ure 118 concern t3e central star -3ic3 is an 3ard case because o/ t3e su0erim0osition o/ t3e
emission /rom t3e nebula, /rom t3e star and /rom t3e s.2. T3ere is also a di//use bac.4round due to t3e lac. o/ totall2
o0a9ueness o/ t3e mas..
1ig(re 11 + Spe$tra #ro% the $entra" star o# the #ie"d0 .a/ the tota" spe$tr(%0 .b/ spe$tr(% on", o# the neb("a
e%ission0 .$/ spe$tr(% on", #ro% the star
He are able to model and to subtract t3is di//use bac.4round, but -e can not subtract t3e di//use si4nal /rom t3e nebula
clearl2 visible in /i4ure 11c. He subtract also t3e emission lines 7small 0ea.s bet-een 55! and ;!! nm in t3e -3ole
s0ectrum8 o/ t3e s.2 b2 usin4 t3e slit in t3e u00er ri43t side o/ t3e mas., -3ere t3ere is no contribution /rom t3e nebula.
T3e results obtained are 4ood es0eciall2 i/ -e consider t3at t3e /ilter used in t3e s.2 tests does not matc3 e%actl2 t3e
contrast /unction o/ t3e /ocal 0lane mas.. T3e role o/ t3e /ilter turns to be ver2 im0ortant and -it3 t3e ne- /ilters
available and described in t3is 0a0er t3e observations -ill be im0roved. 'll t3e results demonstrate t3e 0ossible use o/
t3ese $P, /or routine observations.
9on$"(sions
&
7a8
7b8
7c8
Technical Report N. 23 Rewritable focal plane masks for MOS
T3e 03otoc3romic mas.s are -ell c3aracteriCed and t3e2 o//er im0ortant ne- /eatures t3at are use/ul /or observations in
t3e '$O5) camera. ?n 0articular t3e mas. can be 0re0ared durin4 t3e same ni43t o/ t3e 0re6ima4in4 . :suall2 1!62!
minutes are necessar2 to 0re0are it. T3e 'B'TBO set6u0 desi4ned and built to -rite t3e mas.s uses t3e same /ormats
7d%/ /ile8 o/ T=+ and '$O5) so it is /ull2 com0atible -it3 t3e actual tools.
Hit3 t3ese mas.s it is 0ossible to -rite com0le% 0attern o/ slits -it3out an2 mec3anical 0roblems -3ic3 could come
/rom slits too closed. 'lso t3e slits -idt3 is variable c3an4in4 t3e /ocus o/ t3e laser beam.
5.2 tests con/irmed t3e reliabilit2 o/ t3e s2stem and t3e 0er/ormance -ill be im0roved b2 usin4 t3e ne- /ilters
es0eciall2 desi4ned /or t3is 0ur0ose.
T3e ne%t ste0s -ill be t3e develo0ment o/ ne- materials to cover a -ider s0ectral ran4e and to increase t3e contrast and
to use t3e s2stem /or routine observations -it3 t3e '$O5) camera
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