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Zero-shift Evaluation of Automatic Strain-gage

Systems Based on Direct and Reverse Current Method
by P. Cappa, Z. Del Prete, K.G. McConnell and L. Zachary
ABSTRACT -Sol id-state digital-multimeters are being
used in multichannel automatic data-acquisition systems
to determina strain values from strain-gage resistance
evaluation rather than using conventional Wheatstone
bridge. 8oth the direct-resistance method and the reverse
current one are examined in two tests. Each one lasted far
two weeks. lrrelevant differences were observed between
the two methods in spite of the adopted general-purpose
low-cost switch-control unit.
lntroduction
The effects of advances in technology on digitai mul-
timeter caused, as is well known, a sensible increase of
metrological performances as accuracy and precision in
Iong-term measurements. The previous observation deter-
mined in 1983
1
the proposal of a nontraditional system to
measure electrical-strain-gage outputs collected with a
digitai ohmmeter; the method is simply based on the direct
measurements, carried out by a four-wire connection, of
the transducer resistance values. Moreover, the Iead-wire
length is theoretically unimportant. The intrinsic Iimitation
that is the zeroing of the instrumentation at the gage
location can be removed by shortening, with a resistance
very small compared to circuit resistance, at the instru-
ment.Z
The strain system is then significantly simplified; in fact,
from a comparative examination of the direct -resistance sys-
tem with the traditional one based on the Wheatstone-bridge
configuration, evidence emerges that on the first system a
P. Cappa (SEM Member) is Associate Professar, and Z. Del Prete is
Researcher, University of Rome, "La Sapienza," Via Eudossiana, 18,
00184 Rome, ltaly. K.G. McConnell (SEM Member) and L Zachary
(SEM Member) are Professors, Department of Aerospace and Engineer-
i ~ Mechanics, University of 1owa, Ames, lA 50011.
Paper was presented at the SEM Vll1nternational Congress on Experi-
mental Mechanics held in Las Vegas, NV on June 8-11.
Originai manuscript submitted: September 27, 1992. Fina[ manuscript
received: February 25, 1993.
constant voltage supply unit, precision resistors to com-
plete the bridge, to balance and to calibrate the bridge
output are not utilized. However, the intrinsic simplicity
of the direct-resistance method implies the utilization of a
constant-current supply unit and the impossibility to com-
pensate the effects caused by test-area temperature vari-
ations as, on the contrary, it is possible, as is well known,
utilizing half-bridge and full-bridge configurations.
Moreover, the development of intelligent instrumenta-
tions makes possible sequential multichannel automatic
strain-gage systems simply based on a computer, a switch
unit and a digitai ohmmeter.
In previous papers
3
'
4
the Iimits of stability of automatic
sequential systems based on the four-wire direct-resistance
method were experimentally examined. It was decided to
test the effectiveness of the method w ben general-purpose
low-cost mechanical switches are utilized. The zero-drift
values observed in six-day static tests were always in
ranges of + 10 to -30 Jlmlm in test-area temperature vari-
ations of 24 to 50C.
Successive experimental tests
5
on the utilization of a
high-speed digitai multimeter (100,000 readings/s)
showed significant inaccuracy (200 )lm/m) that can be
reduced adopting specific averaging scheme, to a value of
50 )lm/m. Therefore, the direct-resistance method seems
to bave some effectiveness only in quasistatic measure-
ments.
However, the direct-resistance method does not cancel
factors such as thermoelectric and electrochemical effects
that can change measurement accuracy. To overcome
these limitations, the reverse-current method was pro-
posed and experimentally validated in preliminary tests
6
conducted on a single-channel configuration. The results
showed that the reverse-current method is superior in
holding the zero-gage resistance reading at the cost of
using severa! meters (reversible-current source, digitai
ammeter, digitai voltmeter).
This paper will comparatively examine the limits of
stability of two sequential multichannel automated sys-
tems that use a four-wire connection wiring scheme, one
based on the direct-resistance method and the other based
on the reverse-current method.
Experimental Mechanics 293
COINTROLn..IEIR
CONTROIL.IL.IE ..
CONISTANT enal
I'IEVEIRS
CUJIRI'IENT
SOUJRCE
DOGO TAL
AM IMl ElJlEI'I
DIOUTAIL.
VOIL.TMETIE ..
MIIJLTOPLEXEI'I
Thermocouple
reference
CONSTANT enal
I'IEVERS
CURRENT
SOURCE
DOGOTAL
AMIMJIETEI'I
DUOUTAIL.
VOIL.TIMIETE ..
MIIJLTOPLEXEI'I
Thermocouple
reference
l
....
l
+or-
Fig. 1-Scheme of the experimental arrangement; (a) test A, (b) test B
294 December 1993
CONTROl
UNI T
l
.....
l
+or-
l
-o.-+
o
v
lE
INl
c
Hl
A
M
IB
lE
R
lC LAB
SWITCH CONTIROl
UN!T
--
:SG
#2
re
l
......
Experimental Test Setup and Procedure
T o evaiuate the metrological performances of automatic
systems in long-term data-acquisitions based on both the
direct-resistance method (DRM) and on the reverse-cur-
rent method (RCM), two electrical resistance strain gages
were applied on a cantilever.
1t was decided to utilize general-purpose strain gages
(constantan foil in combination with polymide hacking).
A two-element rosette was chosen for this work (gage
length: 1.5 mm; grid width: 1.6 mm; nominai resistance:
120 Q). The rosette was applied to the cantilever, in
accordance with the manufacturer' s recommendations, by
means of a methyl-2-cyanoacrylate adhesive that is gener-
ally suggested for routine experimentai anaiysis applica-
tions (long-term operating temperature range: -32 to
65C).
The gage installations were checked before and after the
tests by measuring the resistance between the gages and
the ground. The vaiues observed, aiways higher than 20
GQ, assured good mechanical properties of the adhesive
layers. The observed behavior of the two-element rosette
installation is judged acceptable.
Two different lead wires were chosen in the two tests
that w ere conducted: a four-conductor flat cab le ( diameter
0.4 mm) and a four-conductor twisted cable brieded
shielded (diameter 0.25 mm).
The adopted experimental test setups are schematized in
Fig.l(a) and l(b). Alow-costgenerai-purpose switch-con-
trol unit was utilized. The switches had low thermai offset
( < 3 j..LV at the end of their life); but this source of error
was not compensated. T o measure the current injected and
the voltage drop developed over the strain gages, a digitai
ammeter and a digitai voltmeter were adopted; the
metrologicai performances of the chosen devices are re-
ported in Tables lA-lB. The reversible dc-current source,
used to drive current through the switches, the lead wires
and the gage resistances is characterized, for the selected
current values, by the metrologicai characteristics reported
in Table IC.
To monitor the environmentai temperature variations,
chromel aiumel thermocouples were utilized. The thermo-
couple outputs were measured by a digitai voltmeter via a
multiplexer capable to complete the thermocouple circuits
with a cold junction and to automaticaily compensate the
cold-junction temperature differences from ooc (reference
junction compensation accuracy of O. l
0
C).
The devices are interfaced by means of the IEEE-488
Bus. The experimentai data, are gathered reduced and
stored by a microcomputer.
In the DRM anaiysis, the current source is set to drive,
through the gages, four current vaiues equai to 500 j..LA, l
mA, 5 mA and l O mA; the developed voltage drops are
measured by the digitai voltmeter. By means of the
adopted procedure, the four-wire resistance measurement
available in the digitai multimeter were simulated. How-
ever, it was observed that in the commerciaily available
digitai ohmmeter, it was possible to drive only one current
vaiue which was generaily ::::1 mA, fora load resistance of
:::100 Q. The DRM tests were conducted gathering the
voltage drops, and calculating the resistance values by
means of the selected nominai values. Hence, the resis-
tance vaiue Rn,i at the generic nth acquisition and for the
ith current vaiue selected, was obtained from
R =V.,;
n,l /;
(l)
where
V.,; = the generic voltage drop measured for the ith
current vaiue selected
l; = the nominai current vaiue injected by the
current source
The frrst resistance values, relative to the two examined
gages, were used as the reference readings. The zero shift
vaiues Ezs,n,i for the nth reading and for the ith current value
was then calculated from the relationship
w bere
R -RI
Ezs.n,i = ; R '
. l,i
R . ; = the generic resistance vaiue relative to one
of the four current vaiues selected
Ru = is the frrst resistance vaiue relative to one
of the four current vaiues selected
F = the gage factor
(2)
The RCM has the metrologicai advantage of canceling
the effects of any dc-offset voltage that occurs because of
wire-connection thermocouple effects. In the chosen ex-
perimental procedure the current source is set to drive a
selected current vaiue through the switches, the lead wires
and the gages in both directions. In the RCM anaiysis, both
the current injected and the voltage drops are measured by
the digitai ammeter and the digitai voltmeter. The voltage-
current relationships for the strain-gage resistance R
8
are
given by
where
Vp = the positive voltage reading
lp = the positive current reading
Ll VP = the positive current error voltage
v. = the negative voltage reading
I. = the negative current reading
Ll V. = the negative current error voltage
Subtracting eq (4) from eq (3) gives
where M is the error induced by Ll Vp-Ll v .
(3)
(4)
(5)
If the thermoelectric effects can be assumed to be the
same for both positive and negative currents, then M
should be nearly zero. Thus, the RCM appears to be able
to reduce this source of error. In RCM anaiysis, a complete
set of data for strain-gage resistance evaluation consists of
Experimental Mechanics 295
TABLE 1-METROLOGICAL PERFORMANCES OF CHOSEN DEVICES
a) Current Source
Accuracy: (percent of programmed output + amps)
Range
1 mA
10mA
Maxlmum 24 Hour
Resolutlon (T s ~ 1 C)
1 nA 0.001 percent + 9.5 nA
1 O nA 0.0031 percent + 98 nA
Temperature Coefficient: (percent of programmed output + amps)fOC
90Day
(TcatSoC)
0.0052 percent + 20 nA
0.0074 percent + 220 nA
1 mA 0.00036 percent + 1.2 nA
10 mA 0.00036 percent + 14 nA
Noise and spurious responses (to 250kHZ)
peak-to-peak rms
0.02 percent of range + 0.7 !JA 0.003 percent of range + 70 nA
b) Digitai Ammeter
Accuracy: (ppm of readings + ppm of range)
Maxlmum
Range Resolution
24 Hour
1 mA
10mA
100 pA
1 nA
Temperature Coefficient: (ppm pf readings + ppm of rangefOC)
1mA 2+1
10mA 2+1
c) Digitai Integrating Voltmeter + Relay Multiplexer
Range
300mV
3V
Maximum Resolutlon
100nV
1 flV
NPLC = Number of Power Line Cycles (integration time)
10 +3
10 + 3
90Day
15 + 5
15 + 5
90Day
18to 28C
0.008 percent + 8flV
0.008 percent + 10 flV
Temperature Coefficient =no additional accuracy error occurs when operating inside 18 to 28C.
TABLE 2-TEST EXPERIMENTAL PROCEDURES
DRM RCM Remarks
CH.l CH.2 CH.l CH.2 Data row collected:
every 20 min. for 2 weeks
+500 flA +500 flA 500 !lA 500 !lA
TestA
+l mA +l mA l mA l mA
l O m shielded twisted wires from devices to strain gages into
+5mA +5mA
5mA 5mA
the oven; two thermocouple measurements T 1ab and T oven
+lO mA +lO mA
lO mA lO mA
+500 !lA +500 flA 500 flA 500 IlA
TestB
+l mA +l mA
l mA l mA
l m unshielded wires from devices to strain gages in
+5mA +5mA
5mA 5mA
laboratory environment; one thermocouple measurements
+lO mA +lO mA
lO mA lO mA
T,ab
296 December1993
positive and negative voltage and current values. The
RCM metrological performances were tested with the
same current values chosen in the DIRM analysis, i.e., 500
J.lA, l mA, 5 mA, 10 mA. Finally, the Ez.r.n.i values are
calculated utilizing eq (2).
Both the DRM and the RCM were examined by conduct-
ing two tests; in the frrst test, test A, the two-element
rosette is connected to the switch-control unit by shielded
wire leads approximately 10-m long. T o smooth the gage-
installation temperature variations, the two-element ro-
sette installation was placed in an oven. One of the two
thermocouples was utilized to measure Toven inside the
oven near the gages. The latter T /ab was utilized to monitor
the temperature outside the oven. In the second test, test B,
the gages were connected to the switch-control unit by
unshielded wires approximately l-m long. The gage instal-
lations followed the laboratory temperature T tab variations
and only one lab thermocouple was used and placed at the
strain-gage locations. Both tests A and B lasted for two
weeks and each data row, summarized in Table 2 was
collected every 20 rninutes and the current values were
forced only for the interval of time necessary for the
controller to read the current and the voltage drop devel-
oped (=3 ms). The sequence followed in the data-acquisi-
tion process is reported in Fig. 2.
Test Results
The experimental results relative to DRM analysis are
reportedinFig. 3(a) andFig. 3(b) fortestAandinFig.4(a)
and Fig. 4(b) for test B. From an examination ofFig. 3(a)
and Fig. 3(b ), a sirnilar behavior of the two examined
Genere.toreuppliescurrenti.
DAM reads current.I.
MPX and SCU cloe CH.l l
:;
l DVM reada v. o:r CH.l l
MPX and SCU close CH.l
DVM reeds V_ of CH. 1
YES
YES
Fig. 2-Fiowchart of the data-acquisition process
w
'
o
E
"
..s
DIRECT RESISTANCE METHOD
30
10
;:::

.,
l

"'
N
Test A - Stroin goge #1
..
w
'
o
- :C-1
.,
l

"' N
Time (hour)
(a)
DIRECT RESISTANCE METHQD Test A - Stroin goge #2
(b)
Fig. 3--Direct-resistance method, test A: zero-shift ver-
sus time; a) strain gage #1, b) strain gage #2
DIRECT RESISTANCE METHOD Test B - Strcin goge fl
(a)
DIRECT RESISTANCE METHOD Test 8 - Strcin goge #2
(b)
Fig. 4--Direct-resistance method, test 8: zero-shift ver-
sus time; a) strain gage #1, b) strain gage #2
Experimental Mechanics 297
channels emerges. The same observation is not confirmed
for test B, see Fig. 4(a) and Fig. 4(b). In fact, test B seems
to confirm the high dependence of zero shift values, Ezs.n,;,
on the first resistance readings, Rt,;, accordingly with eq
(2). If Rl.i indeed is significantly different from the mean
value of the all successive Rn,; values, a relevant zero-shift
obviously appears; this behavior is more evident for low-
current supply values, i.e., 500 J.I.A. The current values
chosen and the adopted experimental procedure do not
cause appreciable heating effects of the two gag es.
The environmental temperature variations, showed in
Fig. 5 for test A and in Fig. 6 for test B, seems to cause
relevant effects on Ezs.n.i values. From a comparative exami-
nation ofFig. 3(a) and Fig. 3(b) with Fig. 5, the dependence
of Ezs,n,i on laboratory temperature variations emerges; in
fact the five temperature 'spikes' of =.soc cause a Ezs,n,i
variation of :::15 J.l.ffi/m. This observed 'temperature in-
duced apparent strain' seems to be mainly caused by the
temperature coefficients of the devices, see T ab le l. The
dependence of Ezs.n.i on T IDb is not denied by a comparative
examination ofFig. 4(a) and Fig. 4(b) with Fig.6; in this
case two observed spikes of 2-3 o c determine an apparent
strain of =5 J.l.rnlm. Moreover in test B it clearly appears
that a positive T IDb trend causes a negative Ezs.n.i trend.
However, variations in the range of 18-24C observed in
test A determine a zero shift always in the range of -15 to
~
2
2
30
Q)
a.20
E
Q)
"""
Test A
96 144 192 240
Time (hour)
Fig. 5-Temperature variations as a function of ti me;
test A
i!'
~
~ -T.,
a_20
E
"'
f-
Test B
Fig. 6-Temperature variations as a function of time;
test B
298 December1993
REVERSE CURRENT METHOD
' o
E
.......
..s
JO
10
:.c -10
"' l
e
"'
N
(a)
REVERSE CURRENT METHOD
......
' o
E
.......
~
~
JO
10
:.c -10
(/)
l
e
.,
N
Test A - Stroin goge 111
Test A - Strain goge #2
-Jof.o ~ .. ' ' ~ ' , . . . , - . ~ , . , . , , . . . ~ . . . , . , , , , ~ . , . , , ' . , . . , . . , . ~ ' . , . , 6 6 ~ ' '
Time (hour)
(b)
Fig. 7-Reverse current method, test A: zero-shift ver-
sus time; (a) strain gage #1, (b) strain gage #2
REVERSE CURRENT METHOO Test B - Strain gage 11
(a)
REVERSE CURRENT METHOO Test 8 - Stroin goge fl2
(b)
Fig. 8-Reverse current method, test 8: zero-shift ver-
sus time; (a) strain gage #1, (b) strain gage #2.
+ 20 J!rnlm; w bile in test B a temperature range of 27-30C
determines differences between the maximum and the
minimum of Ezs.n.i values always less than 28 J!rnlm.
The results relative to RCM are reported in Fig. 7(a)
and Fig. 7(b) for test A and in Fig. 8(a) and Fig. 8(b) for
test B. Insignificant differences emerge both in test A
and test B from the obtained zero-shift values of the two
examined channels; in fact, the Ezs.n.i is always in the
range of -18 to + 17 J!rnlm for test A and -7 to + 7 J!rnlm
for test B, with the exception of the current value of 500
J!A which shows a nonrepetitive scatter, probably
caused by the same reasons (RtJ readings) previously
indicated for DRM tests.
The obtained experimental results indicate that, as far as
the examined system, the RCM do not improve metrologi-
cal performances as accuracy and precision with respect to
the DRM in spite of the adopted general-purpose low-cost
mechanical switch-control unit.
Conclusions
The results relative to a multichannel automatic system
based on the direct-resistance method indicate irrelevant
zero-shift values in tests conducted over two weeks with a
temperature variation ranging from l8C to 24 o c and from
2rc to 30C and confmn the effectiveness of this simple
method also in system based on low-cost switch-control
uni t.
Almost identica! zero-shift trends and ranges of vari-
ations were observed adopting the reverse-current method.
Relative to the examined experimental setup, this method
seems to not confirm the superiority in maintaining the
zero-gage resistance readings for long-term data acquisi-
tion.
References
l. Nelson E.J., Sikorra C.D. and Howard J.L, "Measuring Strain
Gages Directly Without Signa[ Conditioning," EXPERIMENTAL TECH-
NIQUES, 7, (9), 26-28 (1983).
2. Zachary L W., McConnell K.G. and Younis N. T., "Accounting for
Lead Wire Resistance Changes and Loss of Zero in Long-term Strain
Measurements," Proc. SEM 1990 Spring Conference on Exp. Mech.,
201-204 (lune 1990).
3. Cappa P., "A Comparative Examination of Automatic Sequential
Direct Systems for Strain-gage Data Readings Based on a Low-cost
Switch-contro[ Unit," EXPERIMENTAL TECHNIQUES, 13-15 (Sept. 1989).
4. Cappa P., "An Experimental Analysis ofthe Zero-shift Values of
Automatic and lnexpensive Strain-gage lnstrumentation Systems," EX-
PERIMENTALMECHANICS, 31 (l), 88-92 (March 1991).
5. Cappa P. and Del Prete Z., "An Experimental Analysis of Accuracy
and Precision of a High Speed Strain-gage System Based on the Direct-
resistance Method," EXPERIMENTAL MECHANICS, 32 (l), 78-82 (March
1992).
6. Cappa P., McConnell K.G. and Zachary L W., "Zero-shift Values
of Automatic and lnexpensive Strain-gage Instrumentation Systems,"
EXPERIMENTALMECHANICS, 31 (l), 88-92 (1991).
Experimental Mechanics 299