A

A
A


B
B
B


C
C
C

D
D
D

E
E
E


F
F
F


G
G
G


H
H
H


I
I
I


J
J
J


K
K
K


L
L
L


M
M
M


N
N
N


O
O
O


P
P
P


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Q
Q


R
R
R


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S
S

T
T
T


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U


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W


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Y
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Y


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Z
Z

NI
MIEL 2002
S SE EL LE EC CT T L LE ET TT TE ER R T TO O C CH HO OO OS SE E T TH HE E A AU UT TH HO OR R
A AU UT TH HO OR R I IN ND DE EX X
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23rd INTERNATIONAL
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A
A
A




Adamovi, N.
Development of a Totally Implantable Hearing Aid

Adamschik, M.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors

Aghabekyan, A.
Distribution of Slip Dislocations in Thermally Deformed Silicon Wafers

Agueev, O.
Influence of Rapid Thermal Annealing Modes of the Parameters of Ni/21R-SiC Contacts

Aleksi, O.
Symmetrical Thick Film EMI/RFI Filters
Parallel Thermal Analysis of Hybrid and SMT Modules Using 2D and 3D Models

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NI
MIEL 2002
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A AU UT TH HO OR RS S
AUTHOR INDEX
Aleksov, A.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors

Alluri, P.
Technology Options for Developing Manufacturable Non-silicon Nanoelectronics

Almansa, A.
Gripping Tools for Handling and Assembly of Microcomponents
Handling and Assembly in MST - Final Results of European Network

Altenburg, H.
Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors

Amirouche, B.
Low-Voltage, Low-Power and High Gain CMOS OTA using Active Positive Feedback with
Feedforward and FDCM Techniques

Andrejevi, M.
Extraction of Frequency Characteristics of Switched-Capacitor Circuits Using Time-Domain Analysis
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NI
MIEL 2002
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A AU UT TH HO OR RS S
AUTHOR INDEX

Arshak, A.
-Radiation Dosimeter Using the Optical and Electrical Properties of Al/S/CuPc/Al Thin Films
Effect of -radiation on the Optical and Electrical Properties of Copper Phthalocyanine Thick Films
Top Surface Imaging Lithography Processes for I-Line Resist using Liquid-Phase Silylation

Arshak, K.
Development of a Novel Humidity Sensor with Error-compensated Measurement System
-Radiation Dosimeter Using the Optical and Electrical Properties of Al/S/CuPc/Al Thin Films
Effect of -radiation on the Optical and Electrical Properties of Copper Phthalocyanine Thick Films
-radiation Dosimetry using Screen Printed Nickel Oxide Thick Films
Top Surface Imaging Lithography Processes for I-Line Resist using Liquid-Phase Silylation

Atanassova, E.
Structural-Phase Ordering in Ta
2
O
5
-p-Si Heterosystem Enhanced by Microwave Processing
Thermal Ta
2
O
5
- Alternative to SiO
2
for High Density Dynamic Memories
Conduction Mechanisms in Thin rf Sputtered Ta
2
O
5
Films on Si and their Dependence on O
2

Annealing
Stress-Induced Leakage Currents in Thin Ta
2
O
5
Films
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MIEL 2002
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AUTHOR INDEX

Atarodi, M.
A 3.3V/1W Class D Audio Power Amplifier with 103Db DR and 90% Efficiency

Aubert, H.
MEMS and NEMS Technologies for Wireless Communications

Axelevitch, A.
Novel Approach to Sputtered Tantalum Film Resistors with Controlled Pre-Defined Resistance

Ayvazyan, G.
Distribution of Slip Dislocations in Thermally Deformed Silicon Wafers


B
B
B





Bafleur, M.
TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology

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MIEL 2002
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AUTHOR INDEX
Bahng, U.
Thyristor-based Integrated Switch Structures for Repetitive Pulse Current Generation

Bai, J.B.
Design of High-Power Reverse-Conducting Gate-Commutated Thyristors
23rd INTERNATIONAL
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PROCEEDINGS
Bailbe, J.-P.
Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification

Balk, L.
Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe
Microscopy

Batcup, S.
Thermal Model of Power Semiconductor Devices for Electro-Thermal Circuit Simulations
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Baudrand, H.
MEMS and NEMS Technologies for Wireless Communications

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MIEL 2002
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AUTHOR INDEX
A AU UT TH HO OR RS S
Beaudoin, F.
TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology

Belaroussi, M.
Low-Voltage, Low-Power and High Gain CMOS OTA using Active Positive Feedback with
Feedforward and FDCM Techniques
23rd INTERNATIONAL
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Bench, A.
Approach to Solve the Reliability Problem at Packaging Level in the Matrix VLSI

Benda, V.
In-Process Diagnostics of Recombination Centers in Structures of Large-Area Solar Cells
OCVD Carrier Lifetime Measurements on an Inhomogeneous Diode Structures

Bertrand, G.
TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology
HOME

Blyzniuk, M.
Estimation of Parametric Sensitivity for Defects Size Distribution in VLSI Defect/Fault Analysis
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MIEL 2002
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AUTHOR INDEX
A AU UT TH HO OR RS S

Bo, J.
A Modified DSOI (Drain/Source on Insulator) Device Structure with Better Electrical Performance

23rd INTERNATIONAL
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Bojii, A.
Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure
PROCEEDINGS

Boltovets, N.
Structural-Phase Ordering in Ta
2
O
5
-p-Si Heterosystem Enhanced by Microwave Processing

Bouhdada, A.
Influence of the Defects on the I-V Characteristics for LDD-nMOSFETs

Bouzerara, L.
Low-Voltage, Low-Power and High Gain CMOS OTA using Active Positive Feedback with
Feedforward and FDCM Techniques
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NI
MIEL 2002
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AUTHOR INDEX
A AU UT TH HO OR RS S
Breglio, G.
Thermal Instabilities in High Current Power MOS Devices: Experimental Evidence, Electro-thermal
Simulations and Analytical Modeling

23rd INTERNATIONAL
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Brenner, W.
Development of a Totally Implantable Hearing Aid
PROCEEDINGS
Gripping Tools for Handling and Assembly of Microcomponents
Handling and Assembly in MST - Final Results of European Network

Brik, M.
Mixed-Level Defect Simulation in Data-Paths of Digital Systems

Buda, M.
Quantum Well Intermixing for Optoelectronic Device Integration

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Butkiewicz, B.
Thermal Investigation of the Three Types of NTC Thermistors


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MIEL 2002
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A AU UT TH HO OR RS S
C
C
C





Cabestany, J.
Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary
Analysis
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Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification

Caudrillier, P.
MEMS and NEMS Technologies for Wireless Communications

Cazarre, A.
Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification

Cerdeira, A.
Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET
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Process Parameters Affecting Plasma Enhanced Crystallization of a-Si:H using a PECVD Equipment

Cerdeira Estrada, A.
Initial Synchronization Procedure for UMTS-FDD Mode in FPGA
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MIEL 2002
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AUTHOR INDEX
A AU UT TH HO OR RS S

Cha, G.-H.
Design Parameter Optimization for Hall Sensor Application

Chakrabarti, P.
Theoretical Analysis of Room Temperature InAs0.89Sb0.11 Mid-Infrared (MIR) Photodetector for CO
Detection

Chan, Y.
Electromagnetic Interference of Switching Mode Power Regulator with Chaotic Frequency
Modulation

Chandra Shekhar, D.
Nature of Hot Carrier Damage in Spacer Oxide of LDD n-MOSFETs

Chang, C. Y.
Process-Related Reliability Issues Toward Sub-100 nm Device Regime

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MIEL 2002
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Chang, S.-I.
Characteristics of MOSFET with Non-Overlapped Source-Drain to Gate Region

Chao, T. S.
Process-Related Reliability Issues Toward Sub-100 nm Device Regime
23rd INTERNATIONAL
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PROCEEDINGS
Charitat, G.
Isolation Issues in Smart Power Integrated Circuits

Charlot, B.
Access to Microsystem Technology: the CMP Services Solution

Chatzitheodoridis, E.
Gripping Tools for Handling and Assembly of Microcomponents
Handling and Assembly in MST - Final Results of European Network
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Chechenin, Yu.
Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application

NI
MIEL 2002
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AUTHOR INDEX
A AU UT TH HO OR RS S
Chen, L.
Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional
Quantum Mechanical Effects and Gate Tunneling Current
Modeling on Direct Tunneling Current in Ultra-Thin Oxide NMOSFET Considering Quantum
Mechanics
23rd INTERNATIONAL
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Chen, W.
Unified MOSFET Scaling Theory using Variational Method

Chien, C. H.
Process-Related Reliability Issues Toward Sub-100 nm Device Regime

Chobola, Z.
C-V and DLTS as Characterization Tools for Silicon Solar Cells

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MIEL 2002
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AUTHOR INDEX
A AU UT TH HO OR RS S
Choi, Y.-I.
Trench Emitter IGBT with Lateral and Vertical MOS Channels
Excess Carrier Density and Forward Voltage Drop in Trench Insulated Gate Bipolar Transistor
(TIGBT)
Improved Trench MOS Barrier Schottky (TMBS) Rectifier

Choi, C.-S.
Design Parameter Optimization for Hall Sensor Application

Chung, S.-K.
Trench Emitter IGBT with Lateral and Vertical MOS Channels
Excess Carrier Density and Forward Voltage Drop in Trench Insulated Gate Bipolar Transistor
(TIGBT)
Improved Trench MOS Barrier Schottky (TMBS) Rectifier

Clough, F.
Novel dual gate high voltage TFT with variable doping slot

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NI
MIEL 2002
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A AU UT TH HO OR RS S
Colinge, C.
SOI Devices for 0.1 m Gate Lengths

Colinge, J.-P.
SOI Devices for 0.1 m Gate Lengths
23rd INTERNATIONAL
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Combes, P.
MEMS and NEMS Technologies for Wireless Communications

Concannon, A.
Emitter Injection Control in LVTSCR for Latch-up Free ESD Protection

Cotofana, S.
FSM Non-minimal State Encoding for Low Power

Courtois, B.
Access to Microsystem Technology: the CMP Services Solution

PROCEEDINGS
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NI
MIEL 2002
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A AU UT TH HO OR RS S
Cova, P.
H+ Irradiation for Reverse Recovery Softness and Reliability of Power p-i-n Diodes for Snubberless
Applications

Cuoco, V.
A novel vertical DMOS transistor in SOA technology for RF-power applications

iri, V.
Synthesis of Folded Fully Pipelined Bit-Plane Architecture

ori, S.
Design, Implementation and Comparison of Three General-Purpose Neurons




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NI
MIEL 2002
A AU UT TH HO OR RS S
AUTHOR INDEX
S SE EL LE EC CT T T TI IT TL LE E T TO O V VI IE EW W T TH HE E P PA AP PE ER R

evizovi, D.
Sheet Density of Electrons in Spacer Layer of AlGaN/GaN MODFET: Calculating and Analyzing


D
D
D





dAlessandro, V.
Thermal Instabilities in High Current Power MOS Devices: Experimental Evidence, Electro-thermal
Simulations and Analytical Modeling
SPICE Simulation of Electro-thermal Effects in New-Generation Multicellular VDMOS Transistors
NASDAC - A New Simulation Tool for the Electro-Thermal Analysis of Bipolar Devices: Application to
Multi-Finger AlGaAs/GaAs HBTs

Danielsson, E.
SiC Device Technology for High Voltage and RF Power Applications

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MIEL 2002
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AUTHOR INDEX
S SE EL LE EC CT T T TI IT TL LE E T TO O V VI IE EW W T TH HE E P PA AP PE ER R
Danil'tsev, V.
Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application

Dankovi, D.
Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs

Dao, L.
Quantum Well Intermixing for Optoelectronic Device Integration

Davazoglou, D.
Electrical Stressing-induced Degradation Effects in Solid Phase Crystallized Polysilicon Thin Film
Transistors

Davidovi, V.
Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs
Effects of Positive Gate Bias Stress on Radiation Response in Power VDMOSFETs



23rd INTERNATIONAL
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MIEL 2002
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AUTHOR INDEX
De Souza, M.
Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective
The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power
Semiconductor Device
Novel Dual Gate High Voltage TFT with Variable Doping Slot
Nature of Hot Carrier Damage in Spacer Oxide of LDD n-MOSFETs

Deenapanray, P. N. K.
Quantum Well Intermixing for Optoelectronic Device Integration

Del Medico, O.
Gripping Tools for Handling and Assembly of Microcomponents
Handling and Assembly in MST - Final Results of European Network

Delori, H.
Access to Microsystem Technology: the CMP Services Solution

Demakov, K.
Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts
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MIEL 2002
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S SE EL LE EC CT T T TI IT TL LE E T TO O V VI IE EW W T TH HE E P PA AP PE ER R

Demierre, M.
Nonlinear Effects in Magnetic Angular Position Sensor with Integrated Flux Concentrator

Denisenko, A.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors

Desnica, V.
Symmetrical Thick Film EMI/RFI Filters

Detter, H.
Gripping Tools for Handling and Assembly of Microcomponents
Handling and Assembly in MST - Final Results of European Network

Dimitrijev, S.
Channel-Carrier Mobility Parameters for 4H SiC MOSFETs
Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs

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MIEL 2002
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A AU UT TH HO OR RS S
AUTHOR INDEX
Dmitruk, N.
New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure

Dobrescu, D.
Mechanical Influences on the Electrical Characteristics of the Mobile Gate MOS Capacitors

Dobrescu, L.
Mechanical Influences on the Electrical Characteristics of the Mobile Gate MOS Capacitors

Domeij, M.
SiC Device Technology for High Voltage and RF Power Applications

Drljaa, P.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors
Nonlinear Effects in Magnetic Angular Position Sensor with Integrated Flux Concentrator

Dubuc, D.
MEMS and NEMS Technologies for Wireless Communications

23rd INTERNATIONAL
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MIEL 2002
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PROCEEDINGS

inovi, Z.
Ambient-Temperature Operation of Nonequilibrium Magnetoconcentration Infrared Detectors in InSb
and HgCdTe

ordjevi, S.
Symbolic-Numeric Co-Simulation of Large Analogue Circuits

ori-Veljkovi, S.
Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs
Effects of Positive Gate Bias Stress on Radiation Response in Power VDMOSFETs





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MIEL 2002
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A AU UT TH HO OR RS S
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uri, Z.
Silicon Resonant Cavity Enhanced UV Flame Detector
Influence of Adsorption-Desorption Process on Resonant Frequency and Noise of Micro- and
Nanocantilevers
A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies
Ambient-Temperature Operation of Nonequilibrium Magnetoconcentration Infrared Detectors in InSb
and HgCdTe


E
E
E





Ebert, W.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors

Escobedo-Alatore, J.
Non-Linear Interaction of Space Charge Waves in GaAs Semiconductor


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MIEL 2002
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Estrada, M.
Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET
Process Parameters Affecting Plasma Enhanced Crystallization of a-Si:H using a PECVD Equipment

Etienne-Cummings, R.
Biologically Inspired Vision Sensors

Evtukh, A.
Properties of Si-SiO
2
Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device
Application


F
F
F





Fedorenko, L.
Optical Multichannel Spectra Analyzer Application for Determination of Trace Amounts of Aluminum
by Silica Modified with Quaternary Ammonium Salt and Lumogallion as Solid-Phase Reagent with N
2
-
Laser Excitation

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MIEL 2002
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A AU UT TH HO OR RS S
AUTHOR INDEX
Fitzpatrick, P.
Reed-Solomon Codecs for Optical Communications

Flandre, D.
Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET

Flores, D.
Novel Dual Gate High Voltage TFT with Variable Doping Slot

Fomina, E.
Low Power Synthesis Based on Information Theoretic Measures

Frantlovi, M.
Influence of Adsorption-Desorption Process on Resonant Frequency and Noise of Micro- and
Nanocantilevers

Frisina, F.
SPICE Simulation of Electro-thermal Effects in New-Generation Multicellular VDMOS Transistors

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MIEL 2002
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A AU UT TH HO OR RS S
AUTHOR INDEX
Fu, L.
Quantum Well Intermixing for Optoelectronic Device Integration


G
G
G




NI
MIEL 2002
A AU UT TH HO OR RS S
23rd INTERNATIONAL
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Gal, M.
Quantum Well Intermixing for Optoelectronic Device Integration

Garcia, R.
Process Parameters Affecting Plasma Enhanced Crystallization of a-Si:H using a PECVD Equipment

Garcia Sanchez, F.
Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET

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Golan, G.
Novel Approach to Sputtered Tantalum Film Resistors with Controlled Pre-Defined Resistance
AUTHOR INDEX

S SE EL LE EC CT T T TI IT TL LE E T TO O V VI IE EW W T TH HE E P PA AP PE ER R
Golubovi, S.
Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs
Effects of Positive Gate Bias Stress on Radiation Response in Power VDMOSFETs

Gonnard, O.
Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification

Graffeuil, J.
MEMS and NEMS Technologies for Wireless Communications

Grenier, K.
MEMS and NEMS Technologies for Wireless Communications

Grimalsky, V.
Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide
Non-Linear Interaction of Space Charge Waves in GaAs Semiconductor

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MIEL 2002
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AUTHOR INDEX
Gupta, S.
Theoretical Analysis of Room Temperature InAs
0.89
Sb
0.11
Mid-Infrared (MIR) Photodetector for CO
Detection


H
H
H





Haba, P.
Hot-Carrier NMOST Degradation at Periodic Drain Signal
A Study of Irradiation Damage in Commercial Power MOSFETs by Means of Split C-V and
Conventional Methods

Hadzaman, I.
Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors

Hadi-Vukovi, J.
Phase Noise Amplitude Distribution as Indicator of Origin of Random Phase Perturbation in a Test
Oscillator
A Novel Analytical Model of a SiC MOSFET
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Hamid, F.
Analogue Integrated Circuit Synthesis from VHDL-AMS Behavioral Specifications

Hardikar, S.
Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective

Harris, J.
-Radiation Dosimeter Using the Optical and Electrical Properties of Al/S/CuPc/Al Thin Films
Effect of -radiation on the Optical and Electrical Properties of Copper Phthalocyanine Thick Films
-radiation Dosimetry using Screen Printed Nickel Oxide Thick Films

Harutyunyan, H.
Study of Photo-Emission Current Impact on Spectral Characteristics of Double Barrier Photo-
Receiving Structure

He, P.
Unified MOSFET Scaling Theory using Variational Method

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MIEL 2002
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Heffernan, D.
Development of a Novel Humidity Sensor with Error-compensated Measurement System

Heitzinger, C.
A Calibrated Model for Silicon Self-Interstitial Cluster Formation and Dissolution

Herzer, R.
Parameters of Radiation-Induced Centers for Simulation of Irradiated Power Devices

Hini, I.
Photoluminescence Caused by Presence of Defects and Oxides at the Surface of Hg
1-x
Cd
x
Te

Holland, A.
Influence of Via Liner Properties on the Current Density and Resistance of Vias

Hopper, P.
Emitter Injection Control in LVTSCR for Latch-up Free ESD Protection
Simulation of Si-Ge BiCMOS ESD Structures Operation Including Spatial Current Instability Mode

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AUTHOR INDEX
Horita, S.
A New Working Principle of Ferroelectric Gate FET Memory with an Additional Electrode

Hristeva, N.
Thermally Stable Low Resistivity Ohmic Contacts for High Power and High Temperature SiC Device
Applications


I
I
I




NI
MIEL 2002
A AU UT TH HO OR RS S
23rd INTERNATIONAL
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Ibrahim, A.
C-V and DLTS as Characterization Tools for Silicon Solar Cells

Igi, P.
Thermal Model of Power Semiconductor Devices for Electro-Thermal Circuit Simulations
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AUTHOR INDEX
Inoue, S.
Analysis of Non-Volatile Latch Circuits with Ferroelectric-Gate Field Effect Transistors for Low Power
and Low Voltage Operation
S SE EL LE EC CT T T TI IT TL LE E T TO O V VI IE EW W T TH HE E P PA AP PE ER R

Ishiwara, H.
A Novel Data Writing Method in a 1T2C-Type Ferroelectric Memory
Analysis of Non-Volatile Latch Circuits with Ferroelectric-Gate Field Effect Transistors for Low Power
and Low Voltage Operation

Itoh, K.
Trends in Low-Voltage EmbeddedRAM Technology

Ivashin, D.
Temperature Response of Irradiated MOSFETs

Ivask, E.
Mixed-Level Defect Simulation in Data-Paths of Digital Systems





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J
J
J





Jablonski, P.
Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary
Analysis
Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification

Jaimovski, S.
Phonon Participation in Superlattice Heat Capacity

Jagadish, C.
Quantum Well Intermixing for Optoelectronic Device Integration

Jain, M.
Theoretical Analysis of Room Temperature InAs
0.89
Sb
0.11
Mid-Infrared (MIR) Photodetector for CO
Detection

Jaki, A.
Characterisation of Radiation Response of 400nm Implanted Gate Oxide RADFETs
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Jaki, O.
Influence of Adsorption-Desorption Process on Resonant Frequency and Noise of Micro- and
Nanocantilevers,
A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies
Ambient-Temperature Operation of Nonequilibrium Magnetoconcentration Infrared Detectors in InSb
and HgCdTe

Jaki, Z.
A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies
Ambient-Temperature Operation of Nonequilibrium Magnetoconcentration Infrared Detectors in InSb
and HgCdTe

Jakubec, A.
Asymmetric Ratio Sensors of Nonelectric Quantities

Jankovi, N.
1D Physically Based Non-Quasi-Static Analog Behavioral BJT Model for SPICE

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Jankovi, S.
Power Saving Modes in Modern Microcontroller Design and Chip Diagnostics

Jevti, M.
Phase Noise Amplitude Distribution as Indicator of Origin of Random Phase Perturbation in a Test
Oscillator,
Photoluminescence Caused by Presence of Defects and Oxides at the Surface of Hg
1-x
Cd
x
Te
A Novel Analytical Model of a SiC MOSFET

Jeyakumar, R.
Reactive Ion Etching of 4H-SiC in C
2
F
6
-O
2
and C
2
F
6
-Ar Mixture

Ji, Y.
Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe
Microscopy

Joki, I.
Influence of Adsorption-Desorption Process on Resonant Frequency and Noise of Micro- and
Nanocantilevers
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Jos, H.
A Novel Vertical DMOS Transistor in SOA Technology for RF-Power Applications

Jovi, V.
Ambient-Temperature Operation of Nonequilibrium Magnetoconcentration Infrared Detectors in InSb
and HgCdTe

Jutman, A.
On Efficient Logic-Level Simulation of Digital Circuits Represented by the SSBDD Model

Juurlink, B.
FSM Non-minimal State Encoding for Low Power






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K
K
K





Kakanakov, R.
Thermally Stable Low Resistivity Ohmic Contacts for High Power and High Temperature SiC Device
Applications

Kaltsas, G.
Multipurpose Thermal Sensor Based on Seebeck Effect

Kampouris, C.
Advances in Silicon Carbide MOS Technology
Reactive Ion Etching of 4H-SiC in C
2
F
6
-O
2
and C
2
F
6
-Ar Mixture

Kang, H.-S.
Design Parameter Optimization for Hall Sensor Application

Kang, Y.-S.
Trench Emitter IGBT with Lateral and Vertical MOS Channels

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Karamarkovi, J.
1D Physically Based Non-Quasi-Static Analog Behavioral BJT Model for SPICE

Karim, K. S.
TFT Circuit Integration in a-Si:H Technology
Reactive Ion Etching of 4H-SiC in C
2
F
6
-O
2
and C
2
F
6
-Ar Mixture

Kasemsuwan, V.
An Analytical Model of Short Channel MOSFET including Velocity Overshoot

Kassamakova-Kolaklieva, L.
Thermally Stable Low Resistivity Ohmic Contacts for High Power and High Temperature SiC Device
Applications

Kazmierski, T.
Analogue Integrated Circuit Synthesis from VHDL-AMS Behavioral Specifications

Kazymyra, I.
Estimation of Parametric Sensitivity for Defects Size Distribution in VLSI Defect/Fault Analysis
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Keevallik, A.
Low Power Synthesis Based on Information Theoretic Measures

Kelleci, B.
Pre-Power Amplifier for 5.2-5.8 GHz Band

Kernajitskiy, A.
Optical Multichannel Spectra Analyzer Application for Determination of Trace Amounts of Aluminum
by Silica Modified with Quaternary Ammonium Salt and Lumogallion as Solid-Phase Reagent with N
2
-
Laser Excitation

Khimenko, M.
Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates

Khoa, T.
A New Working Principle of Ferroelectric Gate FET Memory with an Additional Electrode

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Kholevchuk, V.
Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates

Khrykin, O.
Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application

Khudaverdyan, S.
Study of Photo-Emission Current Impact on Spectral Characteristics of Double Barrier Photo-
Receiving Structure

Kim, E. D.
Design of High-Power Reverse-Conducting Gate-Commutated Thyristors
Realization of a Fast Switching Thyristor by Local Carrier Lifetime Control
Thyristor-based Integrated Switch Structures for Repetitive Pulse Current Generation

Kim, H.-W.
Trench Emitter IGBT with Lateral and Vertical MOS Channels
Excess Carrier Density and Forward Voltage Drop in Trench Insulated Gate Bipolar Transistor
(TIGBT)
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Kim, M.-S.
Excess Carrier Density and Forward Voltage Drop in Trench Insulated Gate Bipolar Transistor
(TIGBT)

Kim, N. K.
Design of High-Power Reverse-Conducting Gate-Commutated Thyristors

Kim, S. C.
Design of High-Power Reverse-Conducting Gate-Commutated Thyristors
Realization of a Fast Switching Thyristor by Local Carrier Lifetime Control
Thyristor-based Integrated Switch Structures for Repetitive Pulse Current Generation

Kizjak, A.
Properties of Si-SiO
2
Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device
Application

Kment, Ch.
Development of a Totally Implantable Hearing Aid
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Koegst, M.
FSM Non-minimal State Encoding for Low Power

Koh, A.
Advances in Silicon Carbide MOS Technology

Kohn, E.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors

Kolyadina, E.
Structural-Phase Ordering in Ta
2
O
5
-p-Si Heterosystem Enhanced by Microwave Processing

Konakova, R.
Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates
Structural-Phase Ordering in Ta
2
O
5
-p-Si Heterosystem Enhanced by Microwave Processing
Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts

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Kondekar, P.
Analysis and Design of Superjunction Power MOSFET: CoolMOS
TM
for Improved On Resistance and
Breakdown Voltage Using Theory of Novel Voltage Sustaining Layer

Koo, S.-M.
SiC Device Technology for High Voltage and RF Power Applications

Koprinarova, J.
Structural-Phase Ordering in Ta
2
O
5
-p-Si Heterosystem Enhanced by Microwave Processing

Korostynska, O.
-radiation Dosimetry using Screen Printed Nickel Oxide Thick Films

Koshevaya, S.
Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide
Non-Linear Interaction of Space Charge Waves in GaAs Semiconductor

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Kouvatsos, D.
Electrical Stressing-induced Degradation Effects in Solid Phase Crystallized Polysilicon Thin Film
Transistors

Krishnan, S.
Novel Dual Gate High Voltage TFT with Variable Doping Slot

Kulesza, Z.
Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary
Analysis
Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification


L
L
L





Lal, R. K.
Theoretical Analysis of Room Temperature InAs
0.89
Sb
0.11
Mid-Infrared (MIR) Photodetector for CO
Detection

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Lane, W.
Characterisation of Radiation Response of 400nm Implanted Gate Oxide RADFETs

Latinovi, I.
Design, Implementation and Comparison of Three General-Purpose Neurons

Lazi, .
Silicon Resonant Cavity Enhanced UV Flame Detector
Multipurpose Thermal Sensor Based on Seebeck Effect

Lee, H.
Characteristics of MOSFET with Non-Overlapped Source-Drain to Gate Region

Lee, J.
Characteristics of MOSFET with Non-Overlapped Source-Drain to Gate Region

Lee, S.-K.
SiC Device Technology for High Voltage and RF Power Applications

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Lee, X.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors

Leech, P.
Influence of Via Liner Properties on the Current Density and Resistance of Vias

Lemberski, I.
FSM Non-minimal State Encoding for Low Power

Lepinois, F.
Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification

Lepoeva, G.
Thermally Stable Low Resistivity Ohmic Contacts for High Power and High Temperature SiC Device
Applications

Lerner, R.
PT-IGBT and Freewheeling Diode for 3.3kV using Lifetime Control Techniques and Low-Efficiency
Emitters
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Lescouzeres, L.
TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology

Li, Z.
Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional
Quantum Mechanical Effects and Gate Tunneling Current
Unified MOSFET Scaling Theory using Variational Method
Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe
Microscopy

Liberali, V.
Evaluation of Epi layer Resistivity Effects in Mixed-Signal Submicron CMOS Integrated Circuits

Lilin, T.
A Modified DSOI (Drain/Source on Insulator) Device Structure with Better Electrical Performance

Lin, H. C.
Process-Related Reliability Issues Toward Sub-100 nm Device Regime
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Linevih, H.
Channel-Carrier Mobility Parameters for 4H SiC MOSFETs

Lingareddy, M.
Low - Vt Devices Replacement for Domino Circuits

Lisovski, I.
Properties of Si-SiO2 Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device
Application

Litovchenko, V.
Properties of Si-SiO2 Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device
Application

Litovski, V.
TSpice-Alecsis Co-simulation
AUTHOR INDEX
Extraction of Frequency Characteristics of Switched-Capacitor Circuits Using Time-Domain Analysis
Timing Simulation with VHDL Simulators
S SE EL LE EC CT T T TI IT TL LE E T TO O V VI IE EW W T TH HE E P PA AP PE ER R

Litvinov, V.
Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts

Liu, L.
Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional
Quantum Mechanical Effects and Gate Tunneling Current
Unified MOSFET Scaling Theory using Variational Method

Liu, X.
Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe
Microscopy

Lomakin, S.
Temperature Response of Irradiated MOSFETs

Lonar, B.
Aging of the Over-Voltage Protection Components

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Lu, J. Q.
Design of High-Power Reverse-Conducting Gate-Commutated Thyristors

Lu, Z.
Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe
Microscopy

Lukovi, M.
Symmetrical Thick Film EMI/RFI Filters

Lunardi, L.
Semiconductor Devices for Fiber Optic Communication Systems

Lunardon, M.
Initial Synchronization Procedure for UMTS-FDD Mode in FPGA

Luo, D.
Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe
Microscopy
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Lutovac, M.
Symbolic Computation of Digital Filter Transfer Function using MATLAB

Lutz, J.
PT-IGBT and Freewheeling Diode for 3.3kV using Lifetime Control Techniques and Low-Efficiency
Emitters
Parameters of Radiation-Induced Centers for Simulation of Irradiated Power Devices

Lytvyn, P.
Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts


M
MM

Ma, S. W.
Electromagnetic Interference of Switching Mode Power Regulator with Chaotic Frequency
Modulation
AUTHOR INDEX

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Ma, Y.
Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional
Quantum Mechanical Effects and Gate Tunneling Current
Modeling on Direct Tunneling Current in Ultra-Thin Oxide NMOSFET Considering Quantum
Mechanics

Macchiaroli, M.
NASDAC - A New Simulation Tool for the Electro-Thermal Analysis of Bipolar Devices: Application to
Multi-Finger AlGaAs/GaAs HBTs

Maciak, J.
Thermal Investigation of the Three Types of NTC Thermistors

Maksimovi, D.
Power Saving Modes in Modern Microcontroller Design and Chip Diagnostics
Timing Simulation with VHDL Simulators



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Malbaa, V.
Formal Specification of an FPGA based Educational Microprocessor
Formal Specification and Preliminary Design of an Asynchronous Traffic Light Controller

Mamontova, I.
New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure

Mamykin, S.
New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure

Mandziy, B.
Approach to Solve the Reliability Problem at Packaging Level in the Matrix VLSI

Manhas, S.
Nature of Hot Carrier Damage in Spacer Oxide of LDD n-MOSFETs

Mani, I.
Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs
Effects of Positive Gate Bias Stress on Radiation Response in Power VDMOSFETs
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Manolov, E.
An Improved Bridge Track-and-Hold Circuit

Mao, L.-F.
A Simple Theory to Determine the Attenuation Amplitudes of Quantum Oscillations

Marcato, L.
Initial Synchronization Procedure for UMTS-FDD Mode in FPGA

Marinkovi, Z.
New Neural Models of Microwave Transistor Noise Parameters Based on Bias Conditions

Markovi, P.
Complex ASICs Verification with SystemC

Markovi, V.
New Neural Models of Microwave Transistor Noise Parameters Based on Bias Conditions

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Marrakh, R.
Influence of the Defects on the I-V Characteristics for LDD-nMOSFETs

Marsi, S.
Initial Synchronization Procedure for UMTS-FDD Mode in FPGA

Marty, A.
Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification

Maslovsky, A.
Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application

Matveeva, L.
Structural-Phase Ordering in Ta
2
O
5
-p-Si Heterosystem Enhanced by Microwave Processing




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Mawby, P.
Advances in Silicon Carbide MOS Technology
Thermal Model of Power Semiconductor Devices for Electro-Thermal Circuit Simulations
Improved 4H-Silicon Carbide Schottky Diodes using Multiple Metal Alloy Contacts
Reactive Ion Etching of 4H-SiC in C
2
F
6
-O
2
and C
2
F
6
-Ar Mixture

Mayeva, O.
New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure

Mazunov, D.
Properties of Si-SiO
2
Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device
Application

McDonagh, D.
Top Surface Imaging Lithography Processes for I-Line Resist using Liquid-Phase Silylation

Meijer, G.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors

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Menozzi, R.
H+ Irradiation for Reverse Recovery Softness and Reliability of Power p-i-n Diodes for Snubberless
Applications

Mezei, I.
Formal Specification of an FPGA based Educational Microprocessor

Mihov, M.
Top Surface Imaging Lithography Processes for I-Line Resist using Liquid-Phase Silylation

Mijalkovi, S.
Compact Modeling for SiGe HBTs

Milenin, V.
Structural-Phase Ordering in Ta
2
O
5
-p-Si Heterosystem Enhanced by Microwave Processing
Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts

Milentijevi, I.
Synthesis of Folded Fully Pipelined Bit-Plane Architecture
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Mileusni, S.
A Study of Irradiation Damage in Commercial Power MOSFETs by Means of Split C-V and
Conventional Methods

Millan, J.
Novel Dual Gate High Voltage TFT with Variable Doping Slot

Milovanovi, B.
New Neural Models of Microwave Transistor Noise Parameters Based on Bias Conditions

Milovanovi, D.
Extraction of Frequency Characteristics of Switched-Capacitor Circuits Using Time-Domain Analysis

Milovanovi, E.
Optimizing AT2 Measure of Hexagonal Systolic Arrays

Milovanovi, I.
Optimizing AT2 Measure of Hexagonal Systolic Arrays
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Min'ko, V.
New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure

Mirjani, D.
Phonon Participation in Superlattice Heat Capacity

Miti, S.
Development of a Totally Implantable Hearing Aid

Mitin, V.
Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates
Structural-Phase Ordering in Ta
2
O
5
-p-Si Heterosystem Enhanced by Microwave Processing

Mladenov, M.
An Improvable Ferroelectric Tactile Sensor with Acoustic Running Wave

Moguilnaia, N.
Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective
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Mohammadzadeh, A.
Characterisation of Radiation Response of 400nm Implanted Gate Oxide RADFETs

Moon, J.-W.
Improved Trench MOS Barrier Schottky (TMBS) Rectifier

Morante, J.
Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification

Moreno, M.
Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary
Analysis
Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification

Morgul, A.
A Novel Current-Mode Design Scheme for Multi-Valued Logic Gates

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Moroz, I.
Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide

Mozol', P.
Appearance of Enriched Hg Regions in Solid State in CdHgTe Crystals

Mrooz, O.
Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors

Mujkovi, V.
Complex ASICs Verification with SystemC

Murel, A.
Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application

Murray, F.
Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification


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N
N
N





Nadzhafova, O.
Optical Multichannel Spectra Analyzer Application for Determination of Trace Amounts of Aluminum
by Silica Modified with Quaternary Ammonium Salt and Lumogallion as Solid-Phase Reagent with N
2
-
Laser Excitation

Nanver, L.
A Novel Vertical DMOS Transistor in SOA Technology for RF-Power Applications

Napieralski, A.
Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary
Analysis
Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification

Nathan, A.
TFT Circuit Integration in a-Si:H Technology
Low Temperature a-Si:H TFT on Plastic Films: Materials and Fabrication Aspects
Reactive Ion Etching of 4H-SiC in C
2
F
6
-O
2
and C
2
F
6
-Ar Mixture
23rd INTERNATIONAL
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MIEL 2002
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AUTHOR INDEX

Nemcsics, A.
Modelling of Cd
4
GeSe
6
Crystal Electrolyte Junction for Electrochemical Solar Cell Purposes

Nenadovi, N.
A Novel Vertical DMOS Transistor in SOA Technology for RF-Power Applications

Nenov, T.
Multifunctional Temperature Sensor

Nenova, Z.
Multifunctional Temperature Sensor

Netzel, M.
PT-IGBT and Freewheeling Diode for 3.3kV using Lifetime Control Techniques and Low-Efficiency
Emitters


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MIEL 2002
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Ngwendson, L.
Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective
The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power
Semiconductor Device

Nikoli, I.
Synthesis of Folded Fully Pipelined Bit-Plane Architecture

Nikoli, P.
Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure

Nishimura, M.
Biologically Inspired Vision Sensors

Novak, Z.
OCVD Carrier Lifetime Measurements on an Inhomogeneous Diode Structures


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MIEL 2002
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Novkovski, N.
Conduction Mechanisms in Thin rf Sputtered Ta
2
O
5
Films on Si and their Dependence on O
2

Annealing,
Stress-Induced Leakage Currents in Thin Ta
2
O
5
Films

Novotny, I.
Asymmetric Ratio Sensors of Nonelectric Quantities


O
O
O




NI
MIEL 2002
A AU UT TH HO OR RS S
23rd INTERNATIONAL
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Oates, A.
Nature of Hot Carrier Damage in Spacer Oxide of LDD n-MOSFETs

Odarich, V.
Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates
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Oklobdija, V.
Clocking in Multi-GHz Environment
S SE EL LE EC CT T T TI IT TL LE E T TO O V VI IE EW W T TH HE E P PA AP PE ER R

Orasson, E.
Internet-Based Software for Teaching Test of Digital Circuits

Ortiz-Conde, A.
Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET

Osmokrovi, P.
Aging of the Over-Voltage Protection Components

Ostapcuk, N.
Complex ASICs Verification with SystemC

stling, M.
SiC Device Technology for High Voltage and RF Power Applications




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MIEL 2002
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P
P
P





Paillotin, J.-F.
Access to Microsystem Technology: the CMP Services Solution

Palamutcuoglu, O.
Pre-Power Amplifier for 5.2-5.8 GHz Band

Parikh, C.
Analysis and Design of Superjunction Power MOSFET: CoolMOS
TM
for Improved On Resistance and
Breakdown Voltage Using Theory of Novel Voltage Sustaining Layer

Park, J.
SOI Devices for 0.1 m Gate Lengths

Pascal, O.
MEMS and NEMS Technologies for Wireless Communications

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MIEL 2002
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Paskaleva, A.
Conduction Mechanisms in Thin rf Sputtered Ta
2
O
5
Films on Si and their Dependence on O
2

Annealing

Patil, M.
Analysis and Design of Superjunction Power MOSFET: CoolMOS
TM
for Improved On Resistance and
Breakdown Voltage Using Theory of Novel Voltage Sustaining Layer

Pavasovi, A.
Design, Implementation and Comparison of Three General-Purpose Neurons

Pavelka, R.
Development of a Totally Implantable Hearing Aid

Pecovska-Gjorgjevich, M.
Conduction Mechanisms in Thin rf Sputtered Ta
2
O
5
Films on Si and their Dependence on O
2

Annealing
Stress-Induced Leakage Currents in Thin Ta
2
O
5
Films

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MIEL 2002
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Pejovi, M.
Characterisation of Radiation Response of 400nm Implanted Gate Oxide RADFETs

Perdu, P.
TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology

Pei, T.
1D Physically Based Non-Quasi-Static Analog Behavioral BJT Model for SPICE

Petkovi, P.
TSpice-Alecsis Co-simulation
Extraction of Frequency Characteristics of Switched-Capacitor Circuits Using Time-Domain Analysis
Symbolic-Numeric Co-Simulation of Large Analogue Circuits

Petrovi, D.
Gripping Tools for Handling and Assembly of Microcomponents
Handling and Assembly in MST - Final Results of European Network

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MIEL 2002
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Petrovi, R.
A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies

Pierasco, M.
Initial Synchronization Procedure for UMTS-FDD Mode in FPGA

Pinel, S.
Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification

Ping, H.
A Modified DSOI (Drain/Source on Insulator) Device Structure with Better Electrical Performance

Plana, R.
MEMS and NEMS Technologies for Wireless Communications

Plewa, J.
Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors

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MIEL 2002
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Pogorzelska, J.
Thermal Investigation of the Three Types of NTC Thermistors

Pons, P.
MEMS and NEMS Technologies for Wireless Communications
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Poole, K.
Technology Options for Developing Manufacturable Non-silicon Nanoelectronics

Pope, G.
Improved 4H-Silicon Carbide Schottky Diodes using Multiple Metal Alloy Contacts

Popov, A.
An Improved Bridge Track-and-Hold Circuit

Popov, D.
Electrons in Cylindrical Quantum Wires

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MIEL 2002
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A AU UT TH HO OR RS S
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MIEL 2002
Popovi, G.
Development of a Totally Implantable Hearing Aid
Gripping Tools for Handling and Assembly of Microcomponents
Handling and Assembly in MST - Final Results of European Network

Popovi, M.
Multipurpose Thermal Sensor Based on Seebeck Effect

Popovi, R.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors
Nonlinear Effects in Magnetic Angular Position Sensor with Integrated Flux Concentrator

Popovici, E.
Reed-Solomon Codecs for Optical Communications

Portesine, M.
H+ Irradiation for Reverse Recovery Softness and Reliability of Power p-i-n Diodes for Snubberless
Applications
AUTHOR INDEX
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Poustylnik, O.
Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide

Pritchard, M.
Reactive Ion Etching of 4H-SiC in C
2
F
6
-O
2
and C
2
F
6
-Ar Mixture


Q
Q
Q




NI
MIEL 2002
A AU UT TH HO OR RS S
23rd INTERNATIONAL
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Quan, T.-H.
In-Process Diagnostics of Recombination Centers in Structures of Large-Area Solar Cells

Quintero, R.
Generalization of the Integral Function Method to Evaluate Distortion in SOI FD MOSFET

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R
R
R





Rabbia, L.
MEMS and NEMS Technologies for Wireless Communications
23rd INTERNATIONAL
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Radil, J.
In-Process Diagnostics of Recombination Centers in Structures of Large-Area Solar Cells

Radoji, B.
Parallel Thermal Analysis of Hybrid and SMT Modules Using 2D and 3D Models

Radulovi, K.
Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure
Silicon Resonant Cavity Enhanced UV Flame Detector

Raik, J.
Mixed-Level Defect Simulation in Data-Paths of Digital Systems
On Efficient Logic-Level Simulation of Digital Circuits Represented by the SSBDD Model

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MIEL 2002
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A AU UT TH HO OR RS S

Ramovi, R.
Parallel Thermal Analysis of Hybrid and SMT Modules Using 2D and 3D Models
A Novel Analytical Model of a SiC MOSFET
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Sheet Density of Electrons in Spacer Layer of AlGaN/GaN MODFET: Calculating and Analyzing

Randjelovi, D.
Multipurpose Thermal Sensor Based on Seebeck Effect
A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies
A Novel Analytical Model of a SiC MOSFET

Randji, A.
Complex ASICs Verification with SystemC

Ravariu, C.
Mechanical Influences on the Electrical Characteristics of the Mobile Gate MOS Capacitors

Reece, P.
Quantum Well Intermixing for Optoelectronic Device Integration
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MIEL 2002
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A AU UT TH HO OR RS S

Reeves, G.
Influence of Via Liner Properties on the Current Density and Resistance of Vias

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Resendiz, L.
Process Parameters Affecting Plasma Enhanced Crystallization of a-Si:H using a PECVD Equipment

Reznicek, Z.
Asymmetric Ratio Sensors of Nonelectric Quantities

Rinaldi, N.
Thermal Instabilities in High Current Power MOS Devices: Experimental Evidence, Electro-thermal
Simulations and Analytical Modeling
SPICE Simulation of Electro-thermal Effects in New-Generation Multicellular VDMOS Transistors
NASDAC - A New Simulation Tool for the Electro-Thermal Analysis of Bipolar Devices: Application to
Multi-Finger AlGaAs/GaAs HBTs

Risti, G.
Characterisation of Radiation Response of 400nm Implanted Gate Oxide RADFETs
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MIEL 2002
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A AU UT TH HO OR RS S

Rudenko, O.
Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates

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Rusu, A.
Mechanical Influences on the Electrical Characteristics of the Mobile Gate MOS Capacitors

Ruika, Z.
C-V and DLTS as Characterization Tools for Silicon Solar Cells


S
S
S





Saadaoui, M.
MEMS and NEMS Technologies for Wireless Communications

Sahandi, F.
A 3.3V/1W Class D Audio Power Amplifier with 103Db DR and 90% Efficiency

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MIEL 2002
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A AU UT TH HO OR RS S
Sankara Narayanan, E.
Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective
The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power
Semiconductor Device
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Novel Dual Gate High Voltage TFT with Variable Doping Slot

Sazonov, A.
Low Temperature a-Si:H TFT on Plastic Films: Materials and Fabrication Aspects

Schmid, P.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors

Schott, C.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors

Nonlinear Effects in Magnetic Angular Position Sensor with Integrated Flux Concentrator

Selberherr, S.
A Calibrated Model for Silicon Self-Interstitial Cluster Formation and Dissolution
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MIEL 2002
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A AU UT TH HO OR RS S

Semenko, M.
Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates

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Seo, K. S.
Thyristor-based Integrated Switch Structures for Repetitive Pulse Current Generation

Servati, S.
TFT Circuit Integration in a-Si:H Technology

Sei, A.
Formal Specification and Preliminary Design of an Asynchronous Traffic Light Controller

Shashkin, V.
Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application

Shenai, K.
Semiconductor Technologies for Powering MicroChips in the Information Age: From Source to Load

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MIEL 2002
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Shin, H.
Characteristics of MOSFET with Non-Overlapped Source-Drain to Gate Region

Shojaei, M.
A 3.3V/1W Class D Audio Power Amplifier with 103Db DR and 90% Efficiency

Shpotyuk, O.
Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors

Shynkarenko, V.
Structural-Phase Ordering in Ta
2
O
5
-p-Si Heterosystem Enhanced by Microwave Processing

Siemieniec, R.
PT-IGBT and Freewheeling Diode for 3.3kV using Lifetime Control Techniques and Low-Efficiency
Emitters
Parameters of Radiation-Induced Centers for Simulation of Irradiated Power Devices

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Simi, Dj.
Phase Noise Amplitude Distribution as Indicator of Origin of Random Phase Perturbation in a Test
Oscillator

Singh, R.
Technology Options for Developing Manufacturable Non-silicon Nanoelectronics

Sivoththaman, S.
Reactive Ion Etching of 4H-SiC in C
2
F
6
-O
2
and C
2
F
6
-Ar Mixture

Sklyar, T.
Optical Multichannel Spectra Analyzer Application for Determination of Trace Amounts of Aluminum
by Silica Modified with Quaternary Ammonium Salt and Lumogallion as Solid-Phase Reagent with N
2
-
Laser Excitation

Slotboom, J.
A Novel Vertical DMOS Transistor in SOA Technology for RF-Power Applications

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Smiljani, M.
Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure
Investigation of Surface Energy States on Si by Photoacoustic Spectroscopy

Sokolovi, M.
TSpice-Alecsis Co-simulation

Soldo, I.
Complex ASICs Verification with SystemC

Song, C.-S.
Design Parameter Optimization for Hall Sensor Application

Spassov, D.
Thermal Ta
2
O
5
- Alternative to SiO
2
for High Density Dynamic Memories

Spirito, P.
Thermal Instabilities in High Current Power MOS Devices: Experimental Evidence, Electro-thermal
Simulations and Analytical Modeling
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Spulber, O.
Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective
The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power
Semiconductor Device

Stankovi, S.
Aging of the Over-Voltage Protection Components

Stefanovi, D.
TSpice-Alecsis Co-simulation

Steinberger, H.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors

Stevens, E.
Reactive Ion Etching of 4H-SiC in C
2
F
6
-O
2
and C
2
F
6
-Ar Mixture

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Stojadinovi, N.
Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs
Effects of Positive Gate Bias Stress on Radiation Response in Power VDMOSFETs

Stojanovi, N.
Optimizing AT2 Measure of Hexagonal Systolic Arrays

Stojev, M.
Optimizing AT2 Measure of Hexagonal Systolic Arrays

Stojkovi, S.
Electrons in Cylindrical Quantum Wires

Stourac, L.
Noise Spectroscopy of Semiconductor Materials and Devices

Stryahilev, D.
Low Temperature a-Si:H TFT on Plastic Films: Materials and Fabrication Aspects

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Sudkamp, W.
Parameters of Radiation-Induced Centers for Simulation of Irradiated Power Devices

Sudnitson, A.
An Approach to Synthesis of Mixed Synchronous/Asynchronous Digital Devices
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Low Power Synthesis Based on Information Theoretic Measures

Sumecz, F.
Gripping Tools for Handling and Assembly of Microcomponents
Handling and Assembly in MST - Final Results of European Network

Sun, Y.
Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe
Microscopy

Svetlichnyi, A.
Influence of Rapid Thermal Annealing Modes on the Parameters of Ni/21R-SiC Contacts

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MIEL 2002
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A AU UT TH HO OR RS S
Sweet, M.
Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective
The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power
Semiconductor Device

Szekeres, A.
Properties of Si-SiO
2
Structure with Ultrathin Dielectrics for Nano- and Microelectronics Device
Application

Szewczyk, R.
Automatic People Identification on the Basis of Iris Pattern Image Processing and Preliminary
Analysis
Automatic People Identification on the Basis of Iris Pattern Extraction Features and Classification

ai, R.
Sheet Density of Electrons in Spacer Layer of AlGaN/GaN MODFET: Calculating and Analyzing
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MIEL 2002

epanovi, M.
Photoluminescence Caused by Presence of Defects and Oxides at the Surface of Hg1-xCdxTe

etraji, J.
Phonon Participation in Superlattice Heat Capacity
Electrons in Cylindrical Quantum Wires

ikula, J.
Noise Spectroscopy of Semiconductor Materials and Devices


T
TT

Tackac, A.
MEMS and NEMS Technologies for Wireless Communications
AUTHOR INDEX

Tan, C.-H.
A Simple Theory to Determine the Attenuation Amplitudes of Quantum Oscillations
S SE EL LE EC CT T T TI IT TL LE E T TO O V VI IE EW W T TH HE E P PA AP PE ER R
Tan, H. H.
Quantum Well Intermixing for Optoelectronic Device Integration

Tao, J.
MEMS and NEMS Technologies for Wireless Communications

Tasselli, J.
Ultra-Thinned Chips Integration: Technological Approach and Electrical Qualification

Tchamov, N.
An Improved Bridge Track-and-Hold Circuit

Tecpoyotl-Torres, M.
Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide
Non-Linear Interaction of Space Charge Waves in GaAs Semiconductor

Temel, T.
A Novel Current-Mode Design Scheme for Multi-Valued Logic Gates

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ter Beek, M.
Emitter Injection Control in LVTSCR for Latch-up Free ESD Protection

Theeuwen, S.
A Novel Vertical DMOS Transistor in SOA Technology for RF-Power Applications

Tian, L.
Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional
Quantum Mechanical Effects and Gate Tunneling Current
Modeling on Direct Tunneling Current in Ultra-Thin Oxide NMOSFET Considering Quantum
Mechanics
Unified MOSFET Scaling Theory using Variational Method

Todorova, V.
An Improvable Ferroelectric Tactile Sensor with Acoustic Running Wave

Todorovi, D.
Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure
Investigation of Surface Energy States on Si by Photoacoustic Spectroscopy
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Toki, T.
Optimizing AT2 Measure of Hexagonal Systolic Arrays
Synthesis of Folded Fully Pipelined Bit-Plane Architecture

Torki, K.
Access to Microsystem Technology: the CMP Services Solution

Torres Jakome, A.
Modulator on the Base of Surface Oriented Integrated P-I-N Structure in the Oversize Waveguide

Toi, B.
Electrons in Cylindrical Quantum Wires

Toi, D.
Symbolic Computation of Digital Filter Transfer Function using MATLAB

Tousi, V.
A 3.3V/1W Class D Audio Power Amplifier with 103Db DR and 90% Efficiency
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Towers, M.
Thermal Model of Power Semiconductor Devices for Electro-Thermal Circuit Simulations

Trbojevi, N.
Silicon Resonant Cavity Enhanced UV Flame Detector

Tremouilles, D.
TCAD and SPICE Modeling Help Solve ESD Protection Issues in Analog CMOS Technology

Turmezei, P.
Modelling of Cd
4
GeSe
6
Crystal Electrolyte Junction for Electrochemical Solar Cell Purposes

Tvaroek, V.
Asymmetric Ratio Sensors of Nonelectric Quantities

Twomey, K.
Development of a Novel Humidity Sensor with Error-compensated Measurement System

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U
U
U





Ubar, R.
Mixed-Level Defect Simulation in Data-Paths of Digital Systems
On Efficient Logic-Level Simulation of Digital Circuits Represented by the SSBDD Model
Internet-Based Software for Teaching Test of Digital Circuits

Uphoff, H.
Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors


V
V
V





Vakiv, M.
Aging of Copper-Nickel-Cobalt Manganite NTC Thermistors

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Vaks, V.
Planar Schottky Diodes with Low Barrier Height for Microwave Detector Application

Vamvakas, V.
Electrical Stressing-induced Degradation Effects in Solid Phase Crystallized Polysilicon Thin Film
Transistors

Van der Spiegel, J.
Biologically Inspired Vision Sensors

Vanke, V.
Non-Traditional Microwave Electronics Based on Electron Beam Transverse Grouping

Vardanyan, A.
Distribution of Slip Dislocations in Thermally Deformed Silicon Wafers

Vashchenko, V.
Emitter Injection Control in LVTSCR for Latch-up Free ESD Protection
Simulation of Si-Ge BiCMOS ESD Structures Operation Including Spatial Current Instability Mode
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Vasiljevi-Radovi, D.
Photo-Pyro-Piezo-Electric Elastic Bending Method: Investigation of Metal-Semiconductor Structure

Vasiltsov, I.
Approach to Solve the Reliability Problem at Packaging Level in the Matrix VLSI

Vellanki, A.
Technology Options for Developing Manufacturable Non-silicon Nanoelectronics

Vellvehi, M.
Novel Dual Gate High Voltage TFT with Variable Doping Slot

Venger, E.
Surface Structure and Electrical Properties of Ge Films on Semi-Insulating GaAs Substrates



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Vershinin, K.
Innovation and Competition: Are they Crucial in Power Semiconductor Industry? A Market Perspective
The Accumulation Enhanced Emitter Switched Thyristor - A Novel Area Efficient Power
Semiconductor Device

Villain, J.
Bridging the Gap Between AMR, GMR and Hall Magnetic Sensors

Vlasenko, O.
Appearance of Enriched Hg Regions in Solid State in CdHgTe Crystals

Vlasenko, Z.
Appearance of Enriched Hg Regions in Solid State in CdHgTe Crystals

Voitsikhovskyi, D.
Structural-Phase Ordering in Ta
2
O
5
-p-Si Heterosystem Enhanced by Microwave Processing

Vojinovi, O.
Synthesis of Folded Fully Pipelined Bit-Plane Architecture
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Vojnovi, B.
Error Minimization of Sensor Pulse Signal Delay-Time Measurements

Vujani A.
Development of a Totally Implantable Hearing Aid
A Consideration of Fabrication-Induced Imperfections in Photonic Crystals for Optical Frequencies


W
W
W





Wang, J.
Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional
Quantum Mechanical Effects and Gate Tunneling Current

Wang, X.
Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe
Microscopy

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Wong, H.
Recent Developments in Silicon Optoelectronic Devices
Electromagnetic Interference of Switching Mode Power Regulator with Chaotic Frequency
Modulation

Wong, P.
Field Effect Transistors From Silicon MOSFETs to Carbon Nanotube FETs

Wuttke, H.-D.
Internet-Based Software for Teaching Test of Digital Circuits


X
XX

Xi, L.
A Modified DSOI (Drain/Source on Insulator) Device Structure with Better Electrical Performance
AUTHOR INDEX

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Xia, Y.
Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe
Microscopy

Xu, M.-Z.
A Simple Theory to Determine the Attenuation Amplitudes of Quantum Oscillations

Xu, Y.
Novel Dual Gate High Voltage TFT with Variable Doping Slot


Y
Y
Y





Yamamoto, S.
A Novel Data Writing Method in a 1T2C-Type Ferroelectric Memory
Analysis of Non-Volatile Latch Circuits with Ferroelectric-Gate Field Effect Transistors for Low Power
and Low Voltage Operation

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Yang, B. F.
Realization of a Fast Switching Thyristor by Local Carrier Lifetime Control

Yastrubchak, O.
New Advanced Polaritonic Photodetector on Base of Surface Barrier Structure

Yu, Z.
Simulation of Nanometer-Scale MOSFETs with Ultra-thin Gate Oxide including Full 2-Dimensional
Quantum Mechanical Effects and Gate Tunneling Current

Yusupov, M.
Optical Multichannel Spectra Analyzer Application for Determination of Trace Amounts of Aluminum
by Silica Modified with Quaternary Ammonium Salt and Lumogallion as Solid-Phase Reagent with N
2
-
Laser Excitation






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Z
Z





Zebrev, G.
A Diagram Technique for Nonequilibrium Processes in Semiconductor Microstructures
Temperature Response of Irradiated MOSFETs

Zekentes, K.
Thermally Stable Low Resistivity Ohmic Contacts for High Power and High Temperature SiC Device
Applications

Zetterling, C.-M.
SiC Device Technology for High Voltage and RF Power Applications

Zhang, C. L.
Design of High-Power Reverse-Conducting Gate-Commutated Thyristors
Realization of a Fast Switching Thyristor by Local Carrier Lifetime Control
Thyristor-based Integrated Switch Structures for Repetitive Pulse Current Generation

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Zhang, G.
Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe
Microscopy

Zhang, H.-Q.
A Simple Theory to Determine the Attenuation Amplitudes of Quantum Oscillations

Zhu, J. Z.
Realization of a Fast Switching Thyristor by Local Carrier Lifetime Control

Zhu, Q.
Low - Vt Devices Replacement for Domino Circuits

Zleetni, S. M.
-Radiation Dosimeter Using the Optical and Electrical Properties of Al/S/CuPc/Al Thin Films
Effect of -radiation on the Optical and Electrical Properties of Copper Phthalocyanine Thick Films

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Zong, B.
Evaluation of Microstructure and Stress of Cu Damascene Interconnects Using Scanning Probe
Microscopy
ivanov, M.
A Study of Irradiation Damage in Commercial Power MOSFETs by Means of Split C-V and
Conventional Methods
ivanov, Lj.
Symmetrical Thick Film EMI/RFI Filters

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