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CONDITIONS
P.M. Vipin, N.K. Klshofe, G.R. Nagabhushana and B.N. Jayaram,
Departmentof High Voltage Engineering,
Indian Institute of Science,
Bangalore 560 012
ABSTRACT
2-EXPERIMENT
2.1
Scheme of experiment
1.INTRODUCTION
Developments in material technology
have spurred quantum advances in power
system equipment protection within the
past two decades. Eversince its advent,
around 1970's, metal oxide based surge
arresters have emerged as the
most
reliable device against power system
traiisient overvoltages. It is
being
increasingly used in surge protection
due
to
its
superior
nonlinear
characteristics
and
greater
energy
handling capabilities. But, due to the
absence of any series isolating gaps,
the
surge
arrester
elements
are
continously
stressed by the
system
voltage, which causes the flow of a
small leakage curent (about SO*
or sol.
This current as well as the energy
absorption
at the time of
impulse
discharges, cause gradual degradation of
theelements. In order to predict the
period of reliable operation of a metal
oxide surge arrester, or its life, the
degradation phenomena is studied the
worldover. Still, a definite procedure
is yet to be postulated to
assess
degradation under both A.C and
D.C
excitations. Here we present the results
of work done-in our laboratory to study
the
degradation of
surge
arrester
element-s
under
simulated
natural
conditions.
temperature of 60 C .
Experiments were
carried out with D.C and A . C cscitations
applied to the arrester elements. T l i c
0
165
where
resistivity in
vb
k,,
barrier height i n cv
Boltzman constant,
-5
0 ,
8.625*10
eV/ K
temperature i n
temperature
+ / - 2 ,C regulation.
The
measuring
instrumentation,
coniprised of a 17.5mnco-axial current
shunt with Gould 4074 looMHz Digital
Storage Oscilloscope , for measuring
impulse
currents and
a
resistance
potentjal
divider
to
monitor
the
residual voltage across the arrester as
well , a , s the C.O.V. Typical
8/20ps
lightning impulse .current and
2.4ms
iswitching impulse current
waveforms,
obtained using the above arrangement are
shown in Fig.1. The leakage current
through
the
arrester
element
was
monitored using a series resistancedi.gita1 . multimeter
scheme.
The
capacitance and tan delta 'variation with
aging..was measured using GENRAD RLC
Digibridge Type 1657
'111
1;
The
capacitance
and
tan . c l c l ta
measurements were made at lkHz
without.
any
external
bias
voltage.,
The
capacitance
values
show
gdlleral
decreasing trends under both D . C and A . C
operating voltages. On the otlicl-li.iird
measured tan delta values at thc! etid,of
each cycle 'of aging show a randainly
varying
spread, which is
hard
explain. While it exhibits a s h i
.spectrum
of values , w i t h
ovrr,al I
increase, in case of D . C , ,the vai-.Lat i o n
is highly erratic, with some p c , a I c s , i i i
case of A . C .
4.DISCUSSION
3 .RESULTS
The
variation in
the
different
degradation
indices
monitored
are
graphically depicted in Figs. 2 to 10 as
a
iunction
of the
aging
cycles.
Eventhough
the 1eakag e current
and
barrier height were the main indices
monitored, capacitance and tan delta
variations are also shown.
As
a real .life simulation o f > I O S A
under field conditions, it is fcll. 1.11;11.
much more need to be done to havr: a c_loud
representation
of
the
operat3 iir~
atmosphere. Even then, the present sc:lic:!iiir:
offers a guidelin6,on how to p l a n a
laboratory simulatbn of PlOSh
ric1c.I
life, to study the complexities o r r 1 . ; 1 1
life stress gegrada-tion.
The leakage current seems to bc t h c
best index of degradation, showirig a
predictable variation with SUCCCSS~VC.
cyclds
. of c x p c ? c t . e d
.
.of aging. The . values
I(
Po. - constant
.1
166
AKNOWLEDGEMENTS
11
1I I
III
I*\
1 2 1 Y Fu j iwa ra , Y .S 11ibuy a , P1 . T mi 1. ;I IC i S
T.Nitta,
"Evaluation
or
~ I I l ~ ~
Degradation
of
Metal
Osidr:
Siii~~.l~Arresters" ,
IEEE
Trans.
on
l'~~h'c?t~
Apparatus and Systems, Vol. PAS-101,
No.4, pp. 9 7 8 - 9 8 5 , April 1 9 0 2 .
,
Considering
the
barrier
, height
variation, the almost steady value and
then the sudden drop evident from the
Figs. 5 . & 6 , indicate that irreversible
changes in the microstructure of the
MOSA material happen only after some
cycles .of aging. In the present case. it
is observed that such a change happens
after about 8 cycles of aging in case of
D.C & 6"cycles of aging in case of A.C.
But i t , .is.notable that the order of
change in case'D.C is far more than that
in case of A.C. This cl.early indicates
the p o 1 a r i z a ~ ; ~e~f nf e c t s '..me into play
in case of
. . an unidirectional excitation
131.
'
C;3(.i
REFERENCES
RarJiiutLiin
values
The::: decreasing capacitance
with number of aging cycles might be the
result's:".. of
microstructural
changes
happerling at the depletion region near
the ZnO,'grain-graininterfaces, in the
arreste,r',material.
This as well as the
erratic,'..nature
of tan delta variation
will have to be explained based more on
the
material characterisation
after
aging and associated changes in qiiantum
mechanical phenomena, which were outside
the s,cope of the present work. Hence the
decision.to consider the leakage current
and barrier height as the main indices
of aging.'
5.CONCLUSIONS
A simulation of the field conditions
under which surge arresters-are supposed
to operate has been achieved to a fairly
good extent in the laboratory.
The
leakage current; through the arrester is
167
J ~ '
I
I
I
AQC
odc
Fig.2
+
K
200
*I
I
I
I
I
" I
II
1
1------I
50$-;;;--
at
1 1
I
I I
10
I
I
I
20
NO: OF AGING CYCLES
(a 1
(b 1
FicJ.3 : ( a ) A . C leakage current at
(b 1
Fig.4
C.0.V
:(a) D.C
leakage current at C . 0 . v
0
(measured at 60 C )
( b ) Normalised dc leakage c u r r e n t s
(observed & calculated)
(measured at 60 C )
( b ) Normalised ac leakage currents
(observed 6, calculated)
168
0.5I
I
I
. I
I
-_
- - 1*
!E
----
5 0.3
tEi
I
I
I
K
U
0.1
F1g.5
I
I
I
I
-_-___
1I - - - - *- - I
I
I
0.80:
0
20
:.
a g i n g under d c e x c i t a t i o n .
Y 0.85
Fig.7
10
I
1
0:53
II
I
NO:
Capacitance v a r i a t i o n a f t e r
aging under a c e x c i t a t i o n .
Fig.8
5
OF AGING CYCLES
10
C a p a c i t a n c e v a r i a t i o n after
aqing under dc e x c i t a t i o n .
0.041
2 0.021
10
0.001
20
Fig.9
Tan d e l t a v a r i a t i o n a f t e r a g i n g
undel' ac e x c i t a t i o n .
Fig.10
169