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Beck
[451
[75]
[73]
[21]
[22]
Inventor:
Assignee:
Appl. No.:
Filed:
[51]
[52]
[56]
5,057,296
Date of Patent:
3rd ed., vol. 20, pp. 766-781, Wefers, K., et al, Oxides
and Hydroxides of Aluminum", Tech. Paper #19, re
vised, Alcoa Res., pp. 54-59 (1987).
5941 (1983).
Szostak, R. et a1., Ultralarge Pore Molecular Sieves:
Characterization of the 14 Angstroms Pore Mineral,
Cacoxenite, Zeolites: Facts, Figures and Future, El
seview Sc. Pub., B.V. (1989).
3,791,964
Kuehl
2/1974
.. .............
8/1980
208/120
ABSTRACT
252/455 Z
l/1982
4,367,163
4,385,994
4,440,871
5/1983
4/1984
4,673,559
4,831,006 5/1989
4,859,648 8/1989
4,880,611 11/1989
. . . . . ..
[57]
Wilson et al.
.. . . . . . .
252/455 R
. . . . . ..
252/435
252/455 R
210/689
502/214
423/306
Aufdembrink ..... ..
502/242
Landis et a1. ..................... .. 502/242
von Ballmoos et a1, ......... .. 423/306
OTHER PUBLICATIONS
35.31
1
ANGSTROMS d-SPACING
17.66
8.838
1
11;78
7.076
5.901
100
*-
90
80
70
~60
II
50/0
-40
-30
~20
-10
lilllllllll
7.5
10.0
12.5
DEGREES 2-THE1A
US. Patent
F|(;_
Sheetl 0f2
mosmous d-SPACING
35 31
17.66
11.78
5,057,296
8.838
7.076
9o
so
7o
so
- 5o
4o
so
2o
10
2.5
I T
5.0
7o
5.901
I 1
7.5
10.0
DEGREES 2-THEIA
'
'
'
'
12.5
'
'
I/ I O
15.0
'
65
so
0
35
(D
1',
as
30
FIG- 2
.1
.2
.3
.5
TM/SIOZ MOLE.RA'|I0.
7 '
.s
.9
us. Patent
011111991 _
51111111011
5,057,296
FIG. 3
(ASPNGIOTZREMS)
B
d
8
0
G
8
<5
3
$
3O
30
35
40
45
50
'55
6O
65
7O
(VPcOLUR/MEg)
.5
3O
35
40
45
50
55
VALUE OF 1ST d-SPACING
60
65
7O
5,057,296
X-ray indifferent. The microstructure of the silicas 45 given silicate by suitable selection of the cation. The
spaces between the tetrahedra are occupied by mole
consists of 100-250 Angstrom particles of dense amor
cules of water prior to dehydration.
phous silica (Kirk-Othmer Encyclopedia of Chemical
Prior art techniques have resulted in the formation of
Technology, 3rd Edition, Vol. 20, John Wiley & Sons,
a great variety of synthetic zeolites. Many of these zeo
New York, p. 766781, 1982), with the porosity result
lites have come to be designated by letter or other con
ing from voids between the particles. Since there is no
venient symbols, as illustrated by zeolite A (US. Pat.
long range order in these materials, the pores tend to be
No. 2,882,243); zeolite X (U.S. Pat. No. 2,882,244);
distributed over a rather large range. This lack of order
zeolite Y (US. Pat. No. 3,130,007); zeolite ZK-S (US.
also manifests itself in the X-ray diffraction pattern,
Pat. No. 3,247,195); zeolite ZK-4 (U .8. Pat. No.
which is usually featureless.
Paracrystalline materials such as the transitional alu
minas also have a wide distribution of pore sizes, but
5,057,296
International Center for Diffraction Data card number 20 reported being about 12 Angstroms.
Certain layered materials, which contain layers capa
15-274. Once heated at about 110 C., however, the
dYvoire material becomes amorphous or transforms to
ble of being spaced apart with a swelling agent, may be
25
4,831,006.
thermal treatment of cacoxenite causes an overall de 40 such as silica, between the spaced apart layers. The
5,057,296
composition:
necessary).
More particularly, the calcined crystalline material of
the invention may be characterized by an X-ray diffrac
tion pattern with at least two peaks at positions greater 35 M as an ion, and r is the coefficient for R, i.e. the num
than about 10 Angstrom Units d-spacing (8.842 degrees
ber of moles or mole fraction of R.
two-theta for Cu K-alpha radiation), at least one of
which is at a position greater than about 18 Angstrom
Units d-spacing, and no peaks at positions less than
about 10 Angstrom Units d-spacing with relative inten 40 placed by post-crystallization methods hereinafter more
sity greater than about 20% of the strongest peak. Still
particularly described.
more particularly, the X-ray diffraction pattern of the
To the extent desired, the original M, e.g. sodium or
calcined material of this invention will have no peaks at
strongest peak.
One important embodiment of the present invention
is the synthesis of an inorganic, porous, non-layered
Ca), VIIA (e.g. Mn), VIIIA (e.g. Ni),IB (e.g. Cu), IIB
(e.g. Zn), IIIB (e.g. In), IVB (e.g. Sn), and VIIB (e.g. F)
5,057,296
material show a hexagonal arrangement of large chan 55 PAD X automated diffraction system employing theta~
nels and the corresponding electron diffraction pattern
theta geometry, Cu K-alpha radiation, and an energy
gives an approximately hexagonal arrangement of dif
dispersive X-ray detector. Use of the energy dispersive
fraction maxima. The dmo spacing of the electron dif
X-ray detector eliminated the need for incident or dif
fraction patterns is the distance between adjacent spots
fracted beam monochromators. Both the incident and
on the hkO projection of the hexagonal lattice and is
diffracted X-ray beams were collimated by double slit
related to the repeat distance a0 between channels ob
incident and diffracted collimation systems. The slit
served in the electron micrographs through the formula
sizes used, starting from the X-ray tube source, were
0.5, 1.0, 0.3 and 0.2 mm, respectively. Different slit
dmo=ao\/3/2. This dloo spacing observed in the elec
tron diffraction patterns corresponds to the d-spacing of
systems may produce differing intensities for the peaks.
a low angle peak in the X-ray diffraction pattern of the 65 The products of the present invention that have the
material. The most highly ordered preparations of the
largest pore sizes may require more highly collimated
material obtained so far have 2040 distinct spots ob
incident X-ray beams in order to resolve the low angle
servable in the electron diffraction patterns. In this
peak from the transmitted incident X-ray beam. The
5,057,296
10
complex.
The above crystalline material, especially in its metal,
hydrogen and ammonium forms can be bene?cially
converted to another form by thermal treatment (calci
ing ranges:
Reactams
X1O3/YOZ
A1203/Si02
XgOg/(YOZ + Z205)
X2O3/(YO2 + WO + Z205)
Solvcnt/
M2/,O/
Useful
0
0
0.1
0.1
l
to
to
to
to
to
0.5
0.01
100
100
1500
Preferred
0.001
0.001
0.1
0.1
5
to
to
to
to
to
0.5
0.01
20
20
1000
Oto l0
0.0l to 20
Oto5
0.05 to 5
0.01 to 20
0 to 10
0.05 to 5
0 to 5
5,057,296
11
Reactants
R;/,()/
12
-continued
Useful
Preferred
0.01 to 2.0
0.03 to 1.0
Reactants
A1203/Si02
Solvent/SiOZ
Ol-F/SiO;
and R, respectively.
In synthesis from this ?rst reaction mixture, when no
Z and/or W oxides are added to the reaction mixture, 10
the pH is important and must be maintained at from
about 9 to about 14. When Z and/or W oxides are
(Mg/e0 + R2/)O)/
Useful
0 to 0.5
l to 1500
0 to 10
0.01 to 20
Preferred
0.001 to 0.5
5 to 1000
0 to 5
0.05 to 5
($102 + A1203)
Mz/eo/
0 to 5
0 to 3
0.01 to 2
0.03 to 1
($02 + A1203)
Rz/p/
(sioz + A1203)
present in the reaction mixture, the pH is not narrowly
important for synthesis of the present crystalline mate
rial. In this, as well as the following recipes for synthesis 15 wherein e and f are the weighted average valences of M
and R, respectively. The crystallization temperature for
of the present material the R2/p/(YO2+WO+Z
this mixture should be from about 25 C. to about 175
105+Xg03) ratio is important. When this ratio is less
than 0.01 or greater than 2.0, impurity products tend to
C., preferably from about 100 C. to about 175 C.
be synthesized at the expense of the present material.
In the usual synthesis method involving the third
A second reaction mixture useful for the usual syn 20 reaction mixture, the pH is important and must be main
Useful
O
0.1
0.1
1
to 0.5
to 100
to 100
to 1500
Preferred
0.(X)l
0.1
0.1
5
to
to
to
to
0.5
20
20
1000
0.05 to 5
0 to 10
o to 5
0.1 to 2.0
0.12 to 1.0
0.1 to 2.0
and R, respectively.
(1) Mix the organic (R) directing agent with the sol
For this second reaction mixture, when no Z and/or 50
vent or solvent mixture such that the mole ratio of
W oxides are added to the reaction mixture, the pH is
solvent/R200 is within the range of from about 50 to
important and must be maintained at from about 9 to
about 800, preferably from about 50 to 500. This mix
about 14. When Z and/or W oxides are present in the
reaction mixture, the pH is not narrowly important for
crystallization of the present invention. The crystalliza
tion temperature for this mixture is from about 25 C. to
about 250 C., preferably from about 50 C. to about
175 C.
Another reaction mixture for the usual synthesis is
55 method.
where X comprises aluminum and Y comprises silicon, 60 (3) Agitate the mixture resulting from step (2) for
from about 10 minutes to about 6 hours, preferably from
and the organic directing agent, or, preferably a combi
about 30 minutes to about 2 hours, at a temperature of
nation of that organic directing agent plus an additional
from about 0 C. to about 25 C., and a pH of less than
organic directing agent, is used. This third reaction
12. This step permits hydrolysis/polymerization to take
mixture comprises sources of, for example, alkali or
alkaline earth metal (M), e.g. sodium or potassium, cat 65 place and the resultant mixture will appear cloudy.
(4) Crystallize the product from step (3) at a tempera
ion, if desired, one or more sources of aluminum and/or
ture of from about 25 C. to about 150 C., preferably
silicon, the organic (R) directing agent, hereinafter
more particularly described, and the solvent or solvent
13
5,057,296
14
Non-limiting examples of various combinations of
Al
Si
A]
Co
Al
Al
Si
-
P
P
Co
A]
Si
__
5i
being Ge.
25
triisopropylbenzene.
thyldidodecylammonium.
cate.
15
5,057,296
ditions. Pore size and volume will vary with the amount
16
catalyst.
17
5,057,296
18
10
magnesia-zirconia.
posite.
In order to more fully illustrate the nature of the
invention and the manner of practicing same, the fol
5,057,296
19
20
EXAMPLES 2-9
adsorption isotherm.
otherwise indicated.
this example, 1.65 grams of NaAlOz was added to 80 15 size and pore volume values for Examples 2,5 and 8
were extrapolated from plots of d-spacings versus mea
grams of cetyltrimethylammonium hydroxide
sured pore sizes and pore volumes for the other exam
(CTMAOI-I) solution, prepared by contacting a 29 wt.
% N,N,N-trimethyl-l-hexadecanaminium chloride so
ples (see FIGS. 3 and 4). The strongest X-ray diffrac
tion lines are also indicated for comparison purposes,
lution with a hydroxide-for-halide exchange resin. The
mixture was stirred until the NaAlOg was completely 20 FIG. 2 plots the effect of TMB auxiliary organic on the
d-spacing of the ?rst X-ray diffraction pattern maxima
dissolved. To this solution was added 40.0 grams of
Mole Ratio
Example
1
Moles TMB
0
2
3
4
5
0.025
0.050
0.075
0.100
0.150
0.150
0.183
0.216
6
7
8
9
TMB/SiOg TMB/CTMA'l'
0
0.12
0.23
0.35
0.46
0.70
0.70
0.85
1.00
0.32
0.65
0.97
1.30
1.95
1.95
2.38
2.80
d-Spacing, A
36.8
Pore Size, A
32, 37.71
40.3
45.3
48.1
54.8
62.2
62.2
63.7
65.1
41.5
45.11
52.51
58.0
63.02
69.02
68.1
70.22
0.70
0.74
0.77
0.91
0.97
1.00
1.04
1.16
mz/g
1186.8
948.6
1299.3
975.4
1655.1
1043.9
TABLE B
EQUILIBRIUM BENZENE
W212).
Example
50 Torr
60 Torr
1
2
3
4
5
6
7
8
9
66
61
62
48
37
43
36
32
38
67
63
63
56
4S
51
44
37
44
EXAMPLES 10-40
5,057,296
21
22
addition of the HiSil in the reaction mixture. The potential auxiliary organic compounds were varied, as indi
TABLE D
EQUILIBRIUM BENZENE
ADSORPTION VALUES 151100 g!
Example '
so To"
60%"
1)
2g
2:
11
36
40
ucts.
48
12
39
13
38
57
1;
2g
:8
18
19
20
31
42
6O
32
55
62
23
36
47
24
25
38
43
48
59
g:
22 _
is
g:
2:
23
34
40
29
32
33
28
35
33
tives
12-15thereof,
and 19 demonstrate
and (5) combinations
preferred thereof.
auxiliary Examples
organics,
2;
38
51
53
with Examples 10, l1, 16, 20-26, 28, 29, 38 and 39 identi-
40
56
57
Boiling Point
Density
Mol. wt.
Moles of aux.
Aux. Org/silica
Angstroms
None
--
36.8
10
11
12
benzene
toluene
p-xylene
80
111
138
0.874
0.867
0.866
78.11
92.14
106.17
0.128
0.109
0.094
0.59
0.50
0.44
43.5
47.6
49.8
13
14
15
16
1,3,5-trimethy1benzene
1,3,5-triethy1benzene
1,3,5-triisopropylbenzene
bromobenzene
163
215
234
157
0.864
0.861
0.845
1.491
120.20
162.28
204.36
0.083
0.062
0.049
0.39
0.29
0.23
157.02
0.064
0.30
51.2
48.1
44.9
42.8
17
a-chloro-p-xylene
200
1.15
104.61
0.096
0.44
amorphous
18
styrene
146
0.909
104.15
0.096
0.44
amorphous
l9
1,3dimethy1adamantane
0.886
164.29
0.061
0.28
48.9
20
21
22
23
n~pentane
n-hexane
n-heptane
n-octane
36
69
98
126
0.626
0.659
0.684
0.703
72.15
86.18
100.21
114.23
0.139
0.116
0.100
0.088
0.64
0.54
0.46
0.41
47.2
50.7
50.7
51.7
24
n-nonane
151
0.718
128.26
0.078
0.36
48.9
25
26
27
28
29
30
n-decane
n-dodecane
n-octadecane
l-phenylnonane
1,8-dibromoctane
l-butanol
174
216
317
282
271
118
0.730
0.750
0.777
0.858
1.477
0.810
142.29
170.34
254.50
204.36
272.03
74.12
0.070
0.059
0.039
0.049
0.037
0.135
0.33
0.27
0.18
0.23
0.17
0.62
46.4
42.8
37.0
46.4
44.9
37.5
31
32
33
34
l-propanol
l-pentano1
cyclohexanol
phenol
97
137
161
182
0.804
0.811
0.963
1.071
60.10
88.15
100.16
94.1 1
0.166
0.113
0.100
0.106
0.77
0.53
0.46
0.49
amorphous
amorphous
amorphous
amorphous
35
2,4,6-trimethy1phenol
220
136.19
0.073
0.34
amorphous
36
2,4,6-mesita1dehyde
237
1.005
148.21
0.067
0.31
amorphous
37
12-crown-4
1.089
176.21
0.057
0.26
37.5
38
pyridene
115
0.978
79.10
0.126
0.59
46.4
39
40
l-adamantanamine
N,N,N,N'~Tetrakis
151.25
236.31
0.066
0.042
0.31
0.20
39.1
38.1
(Z-hydroxyethyl)
ethylenediamine
23
5,057,296
24
EXAMPLE 43(a)
Argon Physisorption For Pore Systems Up to About 60
Angstroms Diameter
35
EXAMPLE 42
hours.
The calcined product proved to have a surface area
of 915 m2/g and an equilbrium benzene adsorption ca
5,057,296
25
26
EXAMPLE 44
EXAMPLE 43(b)
Argon Physisorption For Pore Systems Over About 60
Angstroms Diameter
The above method of Horvath and Kawazoe for
diameter.
In the pore regime above 60 Angstroms diameter,
however, the Kelvin equation can be applied. It is usu
ally given as:
The Kelvin equation treats adsorption in pore sys 45 Many times, these are inferior to those obtained from
more accurate measurement of pore diameter. While 65 reveal details of the microstructure along the direction
the method of Dollimore and Heal was derived for use
of projection indicated by the EDP. In this way, differ
on desorption isotherms, it can be applied equally well
ent projections of a crystals structure can be observed
27
5,057,296
28
thereof.
4. The method of claim 1 wherein said auxiliary or
25, 41 and 42. The dloo values for these examples were
alkyl-substituted benzene, alkyl-substituted adamantane
determined from electron diffraction patterns. These 35 and combinations thereof, alkyl being of from 1 to about
were consistent in each case with the position of the
14 carbon atoms.
XzO3/YO1
Al203/SiOZ
XzO3/(YO1 + 2205)
XzO3/(YO2 + WO + Z205)
Solvent/
thereof,
(ii) maintaining said mixture under sufficient condi
tions of pH, temperature and time for formation of
said composition of matter and
65
0
O
0.1
0.1
1
to 0.5
to 0.01
to 100
to 100
to 1500
0 to 10
0.01 to 20
O to 10
0.01 to 2.0
5,057,296
29
Auxiliary Organic/YO;
Auxiliary Organic/R200
30
-continued
0.05 to 20
0.02 to 100
combinations thereof.
17. The method of claim 14 wherein R is selected
from the group consisting of cetyltrimethylammonium,
octadecyltrimethylammonium,
benzyltrimethylam
monium,
cetylpryidinium,
myristyltrimethylam
monium, decyltrimethylammonium, dodecyltrime
tively.
OH_/SiO2
(Mz/EO + Rz/py
(Si02 + A1203)
MZ/eO/
combinations thereof.
0 to 5
(5i02 + A1203)
Rz/p/
octadecyltrimethylammonium,
benzyltrimethylam
monium,
cetylpryidinium,
myristyltrimethylam~
monium, decyltrimethylammonium, dodecyltrime
O to 10
0.01 to 20
0.01 to 2
($02 + A1203)
25
Auxiliary Organic/SiOZ
Auxiliary Organic/R200
0.05 to 20
0.02 to 100
0 to 0.5
0.1 to 100
0.1 to 1(X)
1 to 1500
(Mz/p + R2/p)/
(YOZ + w'o + Z205 + X203)
MZ/QO/
0 to 10
0.01 m 20
0 to 10
combinations thereof.
21. The method of claim 18 wherein R is selected
0.01 to 2.0
0.05 to 20
0.02 to 100
octadecyltrimethylammonium,
benzyltrimethylam
monium, cetylpryidinium,
myristyltrimethylam
monium, decyltrimethylamrnonium, dodecyltrime
thylammonium and dimethyldidodecylammonium.
5,057,296
31
32
-continued
Auxiliary Organic/RQ/p
0.02 to 100
tions thereof.
29. The method of claim 25 wherein said auxiliary
organic is selected from the group consisting of ben
Al2O3/SiO2
Solvent/SiOZ
OH/SiO2
(Mg/O + R2/}O)/
0 to 0.1
l to i500
0 to 10
0.01 to 20
(Si02 + A1203)
Mz/eo/
0 t0 5
(SiO; + A1203)
Rz/jo/
X103/YO2
Al2O3/Si02
X2O3/(YO2 + Z205)
XzOg/(YOZ + W'O + Z205)
Solvent/
CPI-H02
(SiO; + A1203)
0 to 0.5
0 to 0.01
0.1 to 100
0.1 to 100
1 to 1500
(M200 + R2/p)/
(Y 02 + W'O + 2205 + X203)
0.01 to 20
MZ/ZO/
(YO: + W'O + Z205 + X203)
RZ/p/
0 to 10
0.01 m 2.0
(Y 02 + WO + 2205 + X203)
Auxiliary Organic/YO;
Auxiliary Organic/R200
0.05 to 20
0.02 to 100
0.01 to 2
Auxiliary Organic/SiOg
0.05 to 20
Auxiliary Organic/R200
0.02 to 100
1 to 1500
(Mmo + Rypy
(YO; + W'O + Z205 + X203)
Mz/go/
0 l0 l0
0.01m 20
0.01 to 2.0
0.05 to Z0
65
thereof,
33
5,057,296
34
combinations thereof.
42. The method of claim 38 wherein said auxiliary
organic is selected from the group consisting of ben
thereof.
mantane and combinations thereof, alkyl being of from
38. The method of claim 37 wherein said crystalline 20 1 to about 14 carbon atoms.
phase has, after calcination, a hexagonal arrangement of
43. The method of claim 38 wherein said auxiliary
uniformly-sized pores having diameters of at least about
organic is selected from the group consisting of p
13 Angstrom Units and exhibits a hexagonal electron
xylene, trimethylbenzene, triethylbenzene, dime
25
35
45
50
55
65