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Incident Beam
7
10
Valence Excitations
Intensity (arb. units)
6
10
Si L edge
5
10
O-K edge
4
10
1.67
0.0276 A E
R= ______________ μm
0.89
(Z ρ)
R= Depth Penetration
A= Atomic Weight (g/mole)
E= Beam Energy (KV)
Z= Atomic number
ρ = density (g/cm )2
Primary Beam
30KV 15KV 5KV 1KV .5KV
.01 μm 35 A
.16 μm (100A)
.99 μm
3.1 μm
Depth Penetration in Iron
5 kV
15 kV
25 kV
Better control of where SE, BSE and x-rays are produced at lower beam voltages
Silver
Iron
Pear to apple-shaped
Carbon
final lens
SE3
SE1 BSE
SE2
specimen
SE1
SE Escape Depth
SE2A
BS1
BS2B
100
Angstroms
SE out
Secondary Electron
Yield Coefficient
δ=
PE in
David Muller 2008
Energy Distribution of Emitted Electrons
SE BSE
# of electrons
collected
Auger
0 50 eV 2 kV EPE
electron energy
SE out
Secondary Electron
Yield Coefficient
δ=
David Muller 2008 PE in
Secondary Electron Yields
Carbon-contaminated Cleaned in-situ
0.8
0.6
Sample charges –ve
(reduces landing energy
0.4 Of incident electrons)
0.2
0
0 EC EC KV
KV 1 2
(http://www.acceleratedanalysis.com/hepvc.html)
David Muller 2008
High Vacuum E.T. Secondary
Electron Detector
Phosphorous
screen (Al-coated)
(10 kV)
glass target
Scintillator
Photomultiplier
David Muller 2008
Secondary Electron Detectors
TLD
PMT
Internal
E.T. SED
Lens
Specimen
• Within-the-lens
detector is
part of the final
lens
SE3
• Bias voltage
down to -150V SE BSE
Specimen
+300 V
SE-detector
B
A C
A 250
200
2nd e- Intensity
150
100
B
50
0 200 400 600 800 1000
Distance (microns)
Charging is worse
On this face
As more secondaries
escape
.99 μm
One Micron SiO2 in Si
1KV
.74uM
One Micron SiO2 in Si
5KV
.99 μm .92 μm
1KV 2KV
.85 μm .74 μm
3KV 5KV
final lens
SE3
SE1 BSE
SE2
specimen
• Normal angle of
incidence
• Greater angle of
incidence
1
Total
• Electron BSE
Emission
Coefficient
.2 SE
20 80
• Atomic Number
2KV
1
• Secondary 5KV
Electron
10KV
Emission
Coefficient 15KV
.2 20KV
20 80
• Atomic Number
• Secondary
Electron
Emission AU
Coefficient AL
.2
C
5 15 25
• Accelerating Voltage in KV
David Muller 2008 From “Scanning Electron Microscopy and X-Ray Microanalysis”, Goldstein et al, 3rd ed. Chap 3
Tilt Dependence of BSE
David Muller 2008 From “Scanning Electron Microscopy and X-Ray Microanalysis”, Goldstein et al, 3rd ed. Chap 3
Reverse Biased S.E.D. Repulses
Secondary Electrons
-150 V
SE-detector
B
A C
-150 V
SE-detector
BSE
B
A C
From http://www.jeol.com/sem_gde/bkscat.html
Electron wave fields within a crystal for incident electron directions close to the Bragg angle qB. The vertical lines are the
position of the Bragg reflecting atomic planes. From H. Niedrig, “Electron backscattering from thin films”, Journal of
Applied Physics -- April 1982 -- Volume 53, Issue 4, pp. R15-R49
Damage layer must be much less than the range of the electrons
3 micron diamond polish No pattern visible 10 minutes colloidal silica Pattern IQ = 177