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[1]
[2]
1/2 Eg ----4.33 eV
[4]
228
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V o l . 125, N o . 2
3. O
ZrO2
8aTiO3
9 SrTiO3
4.0
Ta205 9
229
oLdO--
= o;solO
9 ZnO
TiO2 9
@ FeTiO3
SnO2
CdO
Fe2039
5. D
9 WO3
,,
-2
-I
+1
~ol
[8]
[9]
It is possible to d e t e r m i n e the s t a n d a r d - s t a t e e l e c t r o chemical potentials for the a d s o r b e d species if the a p p r o p r i a t e h y d r o x y l a t e d and p r o t o n a t e d species and
t h e i r s t a n d a r d free energies of f o r m a t i o n are known.
In this case, the pzzp m a y be c a l c u l a t e d d i r e c t l y using
Eq. :[9]. In general, this i n f o r m a t i o n is not k n o w n a n d
the pzzp m u s t be m e a s u r e d e x p e r i m e n t a l l y or estim a t e d f r o m k n o w i n g the semiconductor e l e c t r o n e g a tivities. We show in Fig. 2 the pzzp for several m e t a l
oxides vs. the e l e c t r o n e g a t i v i t y of those oxides. The
d a t a suggest that t h e r e is a strong correlation. T h e o b served slope h a s the same pHpzzp d e p e n d e n c e as i n Eq.
[9]. However, the q u a n t i t a t i v e relationship b e t w e e n
Eq. [9] and Fig. 2 is not clear. The scatter in the d a t a
u n d o u b t e d l y arises f r o m t h e difficulty in m e a s u r i n g
pzzp's. M e a s u r e d pzzp's seem to d e p e n d s o m e w h a t on
the method of p r e p a r a t i o n of the oxide (4).
S e v e r a l techniques h a v e b e e n used to d e t e r m i n e
pzzp's (4). The simplest is j u s t addition of the m e t a l
oxide p o w d e r to an aqueous solution o f a k n o w n p H
with no o t h e r a d s o r b a b l e species present. The p H of
the solution will shift on a d d i t i o n of the p o w d e r
t o w a r d the pzzp. A t the pzzp the p H of the solution is
i n d e p e n d e n t of the a m o u n t of m e t a l oxide added. A
m o r e q u a n t i t a t i v e m e a s u r e of specific ion adsorption is
obtained f r o m the p o t e n t i o m e t r i c t i t r a t i o n of a m e t a l
oxide suspension with either acid or base for solutions
of specific ionic strength. Since the ions a d d e d m u s t
either go to changing the p H of the solution or be a d sorbed on the m e t a l o x i d e surface, it is possible to d e t e r m i n e the surface charge d e n s i t y as a function of
p H for several concentrations of supporting electroi
6.5
@<a205
--@
6. O
SnO 2
Zr02
Fe203
TiO2oHg01,. @ oCuO
FeTi03g Fe304~Z'~o@Ni0
T \
Cr203 ~
9 Cd0
N
9
%
5.5
[5]
[6]
gario3
84
"
o~oI A 4- R T In (aA)
[7]
..,
\
14
PZZP(I~)
Fig. 2. Plot of the pH where the zeta potential is zero (pzzp) vs.
calculated electronegativity for the bulk semiconductor in electron
volts. The line is drawn through:the data and has a slope of 0.12
eV/pH,
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J. Electrochem. Soc.: E L E C T R O C H E M I C A L S C I E N C E A N D T E C H N O L O G Y
230
V[(CH+
---
--
COIl-)
(CH+ -- CoH-)initial]
[10]
--
Ox
roll-)
C1
-- "V
8CH+
[1
(gx
kw/C~+ 2]
[li]
where kw is the ionization constant for water. By exp a n d i n g the partial of the surface charge density, we
obtain
OCH+
OX
(CI/V)
A 0r
kw ] - i
i + V OCH+ t- CH+~ l
[12]
OpIt
Ox
i03
Water
io2
/ ~
0 9
]0I
./..
0\
2 gms TiO
..
%/.
6m,T,o2
-o.
i00
10
[
0r
2.303 1 + kw exp (4.606 p H ) - - (A/2.303V) ~
February 1978
]
exp (2.303 pH)
[13]
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X
(eV)
EA
(eV)
V~b
(SCE) * 9
WO8
SiOa (a)
Ta~O~
SnO2
ZrO2
FelOn (b)
TiO3
6,53
6.46
6.38
6.24
5.92
5.88
-0.20
(19)
5.83
5.18
-4.08
4.49
3.42
4.71
4.33
-~-A4
-- 0 82
--2,94
-0.32
-0.90
(2"O)
(2 I)
(20)
(9)
(1O)
HgO
CuO
Fe~O~
ZnO
NiO
FeTiOa (c)
Cr~Os
CdO
AhOs
Ag20
MgO
SrTiOa ( d )
BaTiOs (e)
5.81
5.80
5.77
5.75
5.74
5.72
5.66
5.55
5.35
5.29
5,27
5.27
5,19
4.57
--4.15
3.89
4.30
4.80
4.55
----1.09
---(22)
-(2)
--0-.59
4.~9
1.42
3,71
3,60
PZZP
(pH) ~
Ref.
-0.22
~
~
(~)
~
--1.19
--1.22
~)
(2)
0.43
2.0
2.9
4.3
6.7
8.6
5.8
7.3
9,5
6,5
8.8
10.3
6.3
8.1
11.6
9.2
11.2
12.4
8.6
9.9
--
Ref.
(17)
(24)
This w o r k
( 14)
(12)
(10)
(13) and
this work
(24)
( 24 )
(25)
(11)
(24)
This work
(26)
(24)
(24)
(27)
(28)
This work
This work
* T h e s o u r c e s f o r t h e s e m a t e r i a l s w e r e : (a) J o h n s o n M a t t h e y
C h e m i c a l s L i m i t e d , p u r i t y 99.999%. (b) J o h n s o n M a t t h e y Chemic a l s L i m i t e d , 99.999%; F i s h e r , 99.95%; a n d M a t h e s o n C o l e m a n Bell,
99.5%; all g a v e c o m p a r a b l e r e s u l t s . (c) See D. S. G i n l e y a n d R. J.
B a u g h m a n , Mater. Res. Bull., 11, 1539 (1976). (d) N a t i o n a l L e a d
C o m p a n y , R e s e a r c h D e p a r t m e n t , " H i g h p u r i t y r e a g e n t " . (e} N a t i o n a l L e a d C o m p a n y , p u r i t y 99.99%.
** M e a s u r e d or c o r r e c t e d t o p H = 13.3. M e a s u r e m e n t a c c u r a c y
is a b o u t _0.1V.
T h e r e is a g r e a t d e a l os s c a t t e r in t h e m e a s u r e d pzzp's.
T h e s e a r e b e l i e v e d t o be the m o s t reliable v a l u e s .
Discussion
Since both of the correction t e r m s can now be e v a l u ated, we can c o m p a r e t h e m e a s u r e d flatband potentials
d i r e c t l y to the calculated electron affinities as is shown
in Fig. 4. The solid line is the b e h a v i o r expected from
Eq. [1] w i t h no a d j u s t a b l e p a r a m e t e r s . One expects a
u n i t a r y slope and an i n t e r c e p t at zero flatband p o t e n tial of Eo. The a g r e e m e n t w i t h t h e o r y is excellent and
3.O
Zr02O ~ N x @ BaTi03
<~
FeTiO3
Ti02 I I \
SnO2 "~
,'7;
CdO
Fe203
5.
~ 0 3
I
-2
-I
O
FlaibsndPotentialvsSC[-(V}
+I
Fig. 4. The electron affinity calculated using atomic electronegativities vs. the measured flatband potentials for the labeled
semiconductors corrected to their respective pzzp's. The solid
line is that expected from Eq. [1] if the correction term, Aft, is
ignored. The flatband potentials and pzzp's not measured by us
are those listed in Table I.
231
Acknowledgments
The authors a r e i n d e b t e d to W. H. S m y r l for h e l p ful discussions. The w o r k r e p o r t e d in this p a p e r was
done for the U.S. E n e r g y Research a n d D e v e l o p m e n t
A d m i n i s t r a t i o n u n d e r Contract AT(29-1)-789.
Manuscript s u b m i t t e d J u n e 20, 1977; revised m a n u script r e c e i v e d Sept. 17, 1977.
A n y discussion o f this p a p e r will a p p e a r in a Discussion Section to be p u b l i s h e d in the D e c e m b e r 1978
JOURNAL. All discussions for the D e c e m b e r 1978 Discussion Section should be s u b m i t t e d b y Aug. 1, 1978.
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232
J. Electrochem. Soc.: E L E C T R O C H E M I C A L S C I E N C E A N D T E C H N O L O G Y
February 1978
Experimental
Reagents.--All chemicals were of reagent grade and
were used without f u r t h e r purification. C h r o m i u m ( I I I )
perchlorate was obtained from V e n t r o n Corporation.
Solutions were prepared with distilled water which
was passed through ion exchanger and, finally, activated carbon columns. Solutions were deoxygenated
with argon or high p u r i t y nitrogen.
Instrumentation.--Cyclic voltammetric and chronoa m p e r o m e t r i c experiments were carried out with the
use of PAR T M Model 173 potentiostat/galvanostat
equipped with a PAR T M Model 176 c u r r e n t to voltage
converter, a PAR T M Model 175 universal programmer,
and a Hewlett P a c k a r d Model 2D-2M X - Y recorder or
alternatively, a PAR T M Model 170 electrochemistry
system. Micrographs were obtained with a Coates and
Welter Cwikscan 100-4 or I n t e r n a t i o n a l Scientific I n s t r u m e n t s Model 7 scanning electron microscope.
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