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3257
I. INTRODUCTION
There are two basic technologies, known as bipolar and
CMOS technology, for integrated circuit implementations.
Bipolar technology maintains an advantage over CMOS in
noise performance and higher transconductance. Also, it has
better high frequency performance than its CMOS
counterparts. On the other hand, CMOS transistors have
low power consumption, high input resistance, and require a
small silicon area compared with bipolar transistors. By
combining these circuit technologies, the main advantages
of each technology can be used. This technology is called
BiCMOS and is useful in high frequency and low power
analogue applications [1].
Second generation current conveyors (CCIIs) were
introduced in 1970 [2]. Since their introduction, they have
been used in numerous applications in the field of analogue
electronics such as in filters, amplifiers, inductance
simulators and, in particular, signal processing circuits. In
1995, the current controlled conveyor (CCCII) was
introduced in bipolar technology [3] and later in BiCMOS
[4] by Fabre. Parasitic resistance is essentially a
disadvantage in electronic circuits. However, this intrinsic
resistance, seen at port X, is used to advantage in current
controlled conveyor circuits, because it can be easily
controlled by biasing current. This advantage allows the
design of numerous tunable functions [3], [5].
Second generation current conveyors designed using only
CMOS technology has been proposed in the literature [6]
[8]. However, they are only able to operate at low
56
:1
:1
M4
I x = I0
Vx V y
2VT
IZ
IX
Q2
I0
M1
(7)
as
M3
M2
2VT
.
I0
:1
:1
g .g
i x = v x g m 2 v y m 4 m1 .
g m5
(6)
Rx =
:1
M6
M5
Q1
V+
:2
(8)
(9)
Rx =
(1)
1
.
gm
(10)
I 0 I C1 + I C 2 ,
ix = g m v x v y ,
:1
:1
M4
(2)
M6
M5
IZ
IX
Q2
Q1
V+
:2
I0
where:
I0
(V y Vx )
I C1 =
:1
(3)
M1
VT
1+ e
IC2 =
I0
V y Vx
1+ e
M3
M2
V-
(4)
VT
Vx V y
I x = I C 2 I C1 = I 0 tanh
2VT
:1
:1
(5)
I x = I0
57
V y Vx
2VT
(11)
2V
Rx = T ,
I0
60K
(12)
50K
40K
Rx (ohm)
0
0
Ix
20
30
Io (A)
a)
40
50
60
-1.26K
(13)
2VT VT I S
+
.
I0
IS Ix
Rx (ohm)
-1.36K
39.95 40 40.05
-30K
-40K
-50K
-60K
0
simulation
theoretical
30
40
50
60
Io (A)
b)
Fig. 3. The parasitic resistance of the CCCII with
for different biasing
for different
currents (a); the parasitic resistance of the CCCII with
biasing currents (b).
(14)
-1.3K
-20K
10
20
(15)
10
( Vx Vy )
1.3K
1.25K
39.98 40 40.02
-10K
I 0 I S
1 +
,
I C1 =
2
2 I S
I 0 I S
I C 2 = 2 1 2 I .
S
Rx =
1.35K
10K
I I
I x = g m ( Vx Vy ) 0 S
2I S
30K
20K
I = IS + S ,
S1
2
I = I I S .
S2
S
2
simulation
theoretical
(16)
58
-4
-8
I2 =
Vin
,
sCR x1 ( Rx 2 )
(18)
where Rx1 and Rx2 are the intrinsic resistances of the CCCII
, and CCCII with
, respectively. As shown in
with
Fig. 6, the input current of the simulator is relative to current
I2 as follows
-12
12
-16
16
-20
1 KHz
20
1.0KHz
10KHz
db(I(Vz)/ I(Vx))
100KHz
1.0MHz
10MHz
100MHz
1.0GHz
I in = I 2 .
10GHz
10 GHz
(19)
Frequency
I0
Iin
Vin
I1
CCCII
( R x+ )
I1
Z
I0
I2
Z
CCCII
( R x )
Y
X
I2
3
Fig. 6. Electronically tunable grounded inductance simulator.
THD (%)
2.5
2
1.5
Z in =
1
0.5
0
0
6
8
10
12
Ix(A)
Fig. 5. Total harmonic distortion for a 1 MHz input signal at port X.
Leq = CRx1Rx2 .
(21)
1.0M
1M
Impedance ()
I0=10A
III0=15A
I0=20A
10K
10K
100
100
101010KHz
30KHz
100KHz
300KHz
1.0MHz
3.0MHz
10MHz
30MHz
100MHz
300MHz
1.0GHz
/ I(vi)
10MHz 30MHz 100MHz 300MHz 1GHz
10KHz V(4)
30KHz
100KHz 300KHz 1MHz 3MHz
Frequency
IV. APPLICATIONS
Frequency
Vin
,
Rx1
(20)
I1 =
Vin
= sCR x1R x 2 .
I in
(17)
59
I0
vi(t)
Y
C1
CCCII
( R x+ )
vo(t)
Z
CCCII
( Rx+ )
C2
[1]
v0 ( t )
sC1R x
=
,
vin (t ) 1 + sC1R x + s 2C1C2 R x2
0 =
1
Rx C1C2
REFERENCES
(22)
[2]
(23)
[3]
[4]
I0 = 20A
30A
I0 = 40A
[5]
Gain (dB)
III0 =
-3
-6
-9
[6]
[7]
-12
2 MHz
12
2.0MHz
db(V(6)/V(44))
3.0MHz
5.0MHz
3 MHz
Frequency
5 MHz
7.0MHz
7 MHz
9.0MHz 10MHz
9 MHz 10 MHz
Frequency
[8]
[9]
V. CONCLUSIONS
[12]
[10]
[11]
[13]
60