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Benjamin Lanz
Bruce Broussard
Member, IEEE
Lyondell Chemical
8805 North Tabler Road
Morris, IL 60450
USA
garyhartshorn@equistar.com
Member, IEEE
IMCORP
179 Middle Turnpike
Storrs, CT 06268
USA
ben.lanz@imcorptech.com
Non-member, IEEE
IMCORP
179 Middle Turnpike
Storrs, CT 06268
USA
bruce.broussard@imcortptech.com
1) The DC Test
It is the authors experience that most people in the electric
power industry are familiar with the DC withstand test. The
history of the DC test dates back to the PILC cable where the
mode of failure can be related to conduction and/or partial
discharge. In the 1960s, when extruded insulations were
developed and cable manufacturers adopted a PD based
factory test, the field test industry continued using the DC test,
thinking that it would achieve the same result on extruded
cable as it did with PILC. However, as early as the mid
1970s, researchers began to see signs that the DC test was
inept at finding the defects in extruded systems.
A common example of the ineffectiveness of the DC test is
its use in acceptance testing of new cable systems with
extruded insulation. DC withstand tests are sometimes
performed on cable without terminations installed. A cable
system without a termination may pass a DC test but, it would
experience relatively rapid failure at power frequency without
a stress control accessory (stress cone) to grade the electric
field. This is just one example but, according to IEEE 400 [3],
even massive insulation workmanship defects in extruded
dielectric insulation cannot be detected with the DC test.
Not only can the DC test not find most workmanship
defects, it can also degrade aged extruded insulation.
According to [3], applying a DC test to an extruded cable that
has been service aged can cause them to fail after they are
returned to service. Studies have shown that the service
failures would not have occurred at that point in time if the
cables had remained in service and not been subjected to the
DC test. Thus, IEEE [3] can no longer support the DC test as
a maintenance or acceptance test for extruded cable systems.
2) The very low frequency (VLF) AC Test
The second most common voltage source used in type 1
medium voltage cable tests is a very low frequency (VLF) AC.
The VLF AC voltage source was developed in the early 1980s
as a substitute for DC. DC voltage is known not to generate
sustained PD activity at the sites of defects. In contrast, a
time-varying voltage stress, even at the very low frequency of
0.1Hz, is able to generate PD activity.
Laboratory
experiments using needles forced into cable insulation have
shown that enhanced electric stress areas can grow at an
accelerated rate with the application of a VLF AC voltage [12].
The goal of the VLF AC withstand test is to fail the worst
defect. However, with aged cable systems this presents a
problem.
As a type 1 test, the VLF AC withstand
indiscriminately degrades existing defects, may generate new
discreet defects with PD activity, and can not fail many types
of defects during the recommended withstand period. At the
end of the withstand test, the cable may be less reliable and
have a shorter life expectancy. Furthermore, the standards
(IEEE 400.2 Table 2 [10]) recommend that a VLF AC
withstand test not be applied to aged extruded cable systems
which are likely to have an excessive number of defects.
However, the standards do not explain how the user of the
VLF AC withstand test is supposed to determine which cables
have an excessive number of defects. Cable systems that
have the potential of successive failures and repairs clearly
present a very onerous situation for the cable owner using a
type 1 test.
Test Cable
Reflected
Signal
PD
Locator
Calibrated Pulse
Generator
Voltage (p.u.)
B. Sensitivity Assessment
2.0
1.8
1.6
1.4
1.2
1.0
Voltage Conditioning
PD Recording
~5s
0
Time
Noisy Data
Excitation
Voltage
Filtered Data
Cable ID Info.
Defect Details
PD activity/ defect
site in cable
appearing at
6,575ft at 1.3.0Uo
Recommended Action
Joint Location
44
40
9
3
23
1
8
12
1