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Tech Tip
By Karl Kersten
Applications Engineer
FEI Company
Take Aways
scanning electron microscopes (SEMs). Sample charging can ruin your image by
producing unwanted bright (or dark) regions and image distortion.
Charging can occur in both conductive and nonconductive materials that do not have a
good electrical leakage path to ground. Since electrons are negatively charged particles, and
the number of signal electrons coming out of the sample is typically smaller than the
distorted regions.
number of incoming primary beam electrons, the sample will charge negatively if there
is not a sufficient leakage path to ground through the sample. Such electron build-up on
the samples surface is known as charging and can deflect the electron beam, distorting the
image. In addition, when charging disturbs the electron signal to the microscopes detector,
the image data is lost, resulting in bright or dark regions. As you zoom in on your
image, the charging becomes more localized and more distortion will typically occur
until the image is completely obscured, yielding no data. Data loss due to sample
charging is common and can be reduced or prevented by using a few key tricks.
How much sample charging will occur in a nonconductive sample? This depends on the
materials composition, the scan speed, the scan area, the electron beam voltage and the
vacuum level, to name a few. Many factors affect image quality when viewing nonconductive samples. In this tool tip, you will learn how Phenom is designed specifically to
reduce sample charging with no sample modification. Youll also learn how to eliminate
sample charging at any magnification by sputter coating your sample.
You can virtually eliminate sample charging by using a few key tips outlined in this
article, resulting in better-quality images.
PHENOM
Tips for Reducing Sample Charging
and paint a line from the top of the sample to the sample holder.
This technique makes it easier for electrons to bleed off the sample
surface near the line.
4. Use copper tape with adhesive backing, also available from any
microscope supplier, and lay a track between the top of the sample
and the holder. Again, this technique makes it easier for electrons to
bleed off the sample surface near the tape.
If these steps do not result in reduced sample charging, you will need
Example 1
Example 2
Page 2
PHENOM
Phenom Yields Better Data Faster by
Reducing Sample Charging
Greater Efficiency:
Quick 30 second load and unload cycles deliver high-resolution
images as fast as using a light microscope
Reduces bottleneck on the a traditional SEM
No sputter coating necessary in most cases
Speeds up workflow for sample analysis for about the same cost
and footprint of a high-end light microscope
Operates at least 10X beyond a light microscopes
magnification range
Greater Effectiveness:
Reduces sample charging without the source lifetime being affected
Easy to useanyone on your staff can learn to operate a Phenom
with minimal training
Accommodates flat and 3D samples
Example 3
Example 4
Example 5
For Phenom examples 6 and 7, samples were coated with a layer of approximately 10 nm of gold.
Example 7
Example 6
Conclusion
A Phenom personal electron microscope improves the efficiency and
effectiveness of your analytical lab. Personnel who havent been trained
to use high-resolution SEMs will find Phenom as easy to use as a light
microscope. You no longer have to wait for specially trained personnel
or a high-resolution lab SEM to obtain excellent images.
Phenom empowers its users to obtain the images they need,
when they need them. Phenom helps you to speed up your
work and improve the quality of your results.
FEI Europe
Phone: +31.40.23.56000
FEI Japan
Phone: +81.3.3740.0970
2009. We are constantly improving the performance of our products, so all specifications are subject to change without notice.
FEI is a registered trademark, and Phenom and the FEI logo are trademarks of FEI Company. Other trademarks belong to their respective owners.
HBD/05.09