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PAN, Z.G., JIANG, S., DAGENAIS, M., MORGAN, R.A., KOJIMA, K., ASOM, M.T.,
LEIBENGUTH, R.E., GUTH, G.D., and FOCHT, M.W.: Optical injection induced
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References
I ,
4 February 2002
E-mail: thomas.!aoedl@e-technik.uni-ulm.de
K.J. Ebeling: Also with Infineon Technologies, Munich, Germany
3.43
0 IEE 2002
Electronics Letters Online No: 20020238
Dol: 10.1049/e1:20020238
current, mA
Magneto-inductive waveguide
E. Shamonina, VIA. Kalinin, K.H. Ringhofer and L. Solymar
0.2 -
./-
0.4
r = 21oc
conventional VCSEL
I = 972 n m
,/
ELECTRONICS LETTERS
Vol. 38 No. 8
37 1
wi/w2- 1 j / Q =
K,,
(1)
cosh(nyd)
,,=I
05
"V
=5
E
'I
-05
-1 0
-1 .o
-0.5
attenuation coefficient ad
0
771200
1 .o
0.5
Rev")
zlro
7711 00
25
24
26
$ 0
7712
-2
propagation coefficient pd
10
15
20
25
z/ro
37 2
0 IEE 2002
Electronics Letters Online No: 20020258
DOI: 10.1049/e1:20020258
30 Junuary 2002
ELECTRONICS LETTERS
Vol. 38
No. 8
References
1
(g)2.@
(3)
(4)
where qtg 6,,,/1= (1 -(~;)-)/(l - (E:.&)
is the filling factor for the
effective dielectric loss [4] and tg Sder*= E & / E ; . ~ The parameters k, kl ,
k and k; are bound to the coplanar line structure. K(k), K(k), K(kl),
K(k;) are the complete elliptical integrals of first order of modulus k and
k , and complementary modulus k and k ; . These integrals are also
obtained by analytical equations [4].
51.O-
(0
H: I
(io\
50.5-+$
+-
73
.._E
50.0-
.-
. . .
iii)
W+2S=175ym
h=635 pm
coplanar cell
E2
;
49.549.0!
v ti IS L
h r r E , pr
10 15 20 25
30 35 40 45, 50 55 60 65 70 75
frequency, GHz
~41.
In this Letter we present an easy and fast complex permittivity
extraction method of the coplanar substrates from S-parameter measurements, which takes into account the quasi-TEM mode. The S-parameter
measurement bench employs vector network analysers and coinmercially available high-quality on-coplanar test fixtures covering
0 . 0 5 4 0 and 50-75 GHz without the necessity to make a transition
between the network analyser and the sample-cell as in [l].
ELECTRONICS LETTERS
Vol. 38 No. 8
373