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Flat solderable tin finishes offer important benefits to the assembly industry. From a
fabricator's standpoint, the technology is relatively new, and there are some important
considerations for production scale-up. Precisely and reliably measuring the tin
thickness and solderability enables both suppliers and users to invoke and meet the
required specifications and quality metrics...
By David H. Ormerod, Director of Technical Service
Enthone-Polyclad Technologies Londonderry, NH
The new process has to run consistently, reliably and measurably. With any new
manufacturing technology within the PWB industry, one other important challenge is also
leveled at the industry as a whole. How can the industry and its consortia of task forces,
study groups and committees come to terms with the benchmarking needed? How can the
specialty chemical vendor, the board fabricator, the assembler and the OEM understand
the impact of the new process? How can they work in synergy to capture the benefits,
guard against the threats and complete a win/win selection procedure? These are some of
the challenges that the flat solderable immersion tin
finish technology has had to address.
Dip or Conveyor Processing? A frequent question in the early days of the process was the
net impact of the process type. The following generalized test data resulted from the use
of the process shown in Table I, which shows a typical dip process sequence. When
installing dip-immersion tin systems, emphasis needs to be placed on the equipment
design, particularly the materials of construction, filtration and circulation of the tin tank.
Rinse stages, water flow rates, quality and temperature are key requirements, as is the
need to get completely dry holes, which is best achieved using a horizontal dryer.
A flooded immersion conveyor sequence is similar, but the immersion time in the tin
would be reduced to approximately 6 min and the pretreatment and rinse times would
also be reduced. The conveyor process for regenerable systems also uses a nitrogen
blanket to prevent oxidation of the tin and to ensure a clean running system with no
precipitation.
The conveyor process is used in volume production applications to plate holes down to
0.25-0.3 mm (0.010-0.012 inch) diameter in thinner boards, and down to 0.5 mm (0.020
inch) in thicker 5.5-6.0 mm (0.216-0.236 inch) boards. This gives an aspect ratio
capability down to 10-12:1. Problems have only arisen if the high aspect ratio holes are
partially blocked or plugged at one end. These are more critical and need thorough
wetting-out and more efficient cleaning and micro-etching. As would be expected in
these cases, LPSM (liquid photoimagable solder mask) development and rinsing are also
critical. Residual oxide in buried holes can be difficult to clean and panels may have to be
double passed to get full plating. A good guide is to look at the copper appearance on
incoming product. This should be shiny, which normally ensures good small-hole
production plating capability of the tin.
One of the challenges to conveyor systems is the ability to deal with thicker back plane
boards, which can be more effectively handled in dip processes. A small controlled study
has shown that on 9.75:1 aspect ratio holes (0.041-inch holes in 0.400-inch-thick boards)
the average plated hole thickness in four test coupons was 30.2 microinches.
The results are shown in Figure 1, and the boards were vertically dip plated at 150F for 8
min. The distribution was good, and the lowest thickness figures of 23-25 microinches
were not found in the centers of the holes. While no thin areas of plating were detected,
the measurement technique for holes was more difficult and required a specially
calibrated XRF and SEM cross-section comparison.
Solderability Control It may seem obvious, but the essential requirement of a solderable
tin finish is its good "solderability." The question immediately arises as to how this is
measured, benchmarked and a specification agreed between the supplier (PWB
fabricator) and the customer (PWB assembler). A directly related question becomes
which method of stress testing should be applied as a performance test to simulate long-
term storage and multiple heat cycle capability. If a meniscograph is used, the selection
of test coupons is important to minimize any noise factors and give the best gage
capability. Several approaches for assessing solderability exist, and a list is shown in
Tables IIA and B, including reference in the IPC Joint Standard 003A. The question is
what should be the preferred approach for a finish?
One particular method,
which has evolved for
immersion tin, involves
the use of dry heat aging
at 155C for 4-8 hr. It is
interesting to note that
the oxidation rate of tin
and the growth rate of
copper/tin intermetallic
are similar for all tin and
tin lead alloys at this
temperature. The plated
samples can be heated
Solderabiltiy by hole filling after 155C dry heat aging for 4-8 for about 4, 6, and 8 hr
hr. typical results. and the solderability
assessed by various
methods. It has been found that a hole-fill test (using J-Std 003 acceptance criteria) gives
an excellent indication of solderability. The test coupons should have a large number of
0.025-inch diameter holes to enable a valid statistical count and, after baking, they can be
solder-floated or wave soldered and assessed. The design and build of the coupons should
be agreed with the vendor, as well as the minimum hole-fill requirements.
Oven temperature control is critical to accurate readings, and hot spots must be avoided.
A multiple thermocouple/chart recorder should be used to check accuracy and spread,
and a fan-assisted oven will give the best temperature distribution. Based on this testing,
a minimum hole fill of 95% after a 4-hr test should be expected to give good solderability
for most applications. However, the product should still give >95% hole fill after a 6-hour
bake at 155C (See Fig. 2).
Damp Heat Testing Although the J-Std 003 and Mil specs call out for steam aging testing
for solderability of tin and tin lead finishes, this test is not appropriate for non-fused
finishes such as OSPs (organic solderability preservative) and immersion tin. While some
data has been published for various immersion tins and other finishes, the results are
somewhat variable and inconsistent. This view is shared by the IPC Task force, which is
currently working on solderability testing for alternate solderable finishes. A large study
was underway looking at a wide range of stress testing conditions, including a
temperature range of 50-95C; relative humidity of 30-95%; and stress time of 8-1,000 hr.
Testing has been made using meniscograph, SERA (selective electrochemical reduction
analysis) and visual determination.
The finishes tested include two
immersion tins; immersion
silver; OSP; nickel-gold; bare
copper; and fused 63/37 tin-lead
as the benchmark. The purpose
of the IPC testing is to determine
a relationship between
environmental stress conditions
such as temperature, moisture
and time, and the solderability of
alternate PWB surface finishes.
From this work, the objective is
to develop a model that can be Meniscograph solderability: typical results after 155C
used to 1) Determine screening dry heat aging using various coupons.
test conditions to assess board
solderability during production; 2) Evaluate solderability process capability for a given
surface finish; and 3) Evaluate potential new alternative surface finishes and compare
solderability performance to current finishes.
Based on extensive work with the described finish, the solderability results after
85C/85% RH testing can give an excellent guide to performance after storage under
higher levels of humidity. Again, a hole-fill test or a meniscograph test can be used. The
problem with this type of damp heat aging is the test duration from 1-7 days, which is not
a real time test. This makes the 4-6 hr dry heat test a more viable proposition. Some
details of meniscograph testing and hole-fill testing after accelerated aging using dry heat
and damp heat stressing techniques are shown in Figures 3a and 3b.
The other important factor is having an awareness of the impact of the wetting balance
(meniscograph) methodology, which can give some variability on testing. Figure 3b
shows the impact of the type of testing coupons applied.
The biggest practical problem confronting the use of solderability stress testing, as
applied by the PWB fabricator as a measure of performance, is the time factor. Any stress
test (accelerated-aging test) takes a substantial amount of time.
This is a major concern to the fabricator
who can process a lot of product during
a 6-hr test period. There is no "quick fix"
stress test to get around this problem.
Hence, there has to be a good
understanding of process parameters and
process variables and their long-term
influence on solderability performance.
Two test approaches are required to get a complete picture of the finish. The first
approach is the non-destructive reduction test, which can assess the presence and amount
or surface oxides, SnO and SnO2. This uses a borate buffer solution in the apparatus. The
second involves the use of a destructive oxidation test using a hydrochloric electrolyte
that strips selectively through the layers of pure tin and Cu6Sn5 and Cu3Sn
intermetallics. A measurement of the free surface tin will give an indication of
solderability.
Unfortunately, the test may not effectively predict the change in solderability due to
thermal stress as the growth rates of intermetallic (which reduce the available free tin for
soldering) will vary with different proprietary tin finishes. The various co-deposition
techniques and boundary layers that are formed will vary between the processes and will
ultimately distinguish the absolute performance of the tin finish. Therefore, there is a
strong argument that a stress test is still needed to validate the finish.
Process Integration A major factor for the PWB fabricator is the actual integration of the
tin process into the manufacturing sequence. Tin can be applied in panel form (dip or
conveyor) prior to other finishing operations. Alternatively, it can be applied to finished
circuits, if the conveyor handling system will deal with the size of parts in question. The
latter will minimize any downstream interaction of the plated circuit with heat cycles
from legend application, thermal hole or de-warp bake. However, it will expose all the
external board materials to the acid tin solution, which is running at 150 -160F for 6 - 8
min. This may impact the nomenclature ink or may result in residual chemistry in
partially plugged holes. Trapped solution can leach out and cause a corrosion problem
after the circuits are packed and dispatched.
The most practical approach is to process the boards in panel form, which will enable the
use of both dip and conveyor equipment. There are several key issues to address. First,
will the panels be electrically tested? Second, what is the approach for hole plugging? If
this is to be carried out after plating (to facilitate easier rinsing and drying) then it makes
no sense to subject the plated panels to an additional heat cycle. The recommended
approach is to use a UV curable plug, applied after immersion tin, which will have
minimal impact on the performance of the finish.
The same is true of an extensive de-warp bake, which should also be avoided after tin
plating, or indeed after any other non-HASL (hot-air solder leveling) final finish is
applied.
When dealing with gold tabs or fingers, should this operation be carried out before or
after tin plating? If gold is done first, then the best approach is to use a peelable resist to
cover the precious metal to avoid any graying of the gold. If the gold is done last, then the
tin finish needs to be well protected from the vapors or wicking effect of the gold
solution, which can cause localized solderability problems or even some accelerated
corrosion of the tin or underlying copper. Another concern is the impact of the protective
resist covering the tin in terms of tape residues or a stripping process to remove dry film.
As a general consequence, the "tin last" operation is preferred and is generally more
practical and cost effective.
Electrical Test A question frequently arising is whether
to electrically test before or after the tin, and what is the
impact of any probe-induced damage on the integrity of
the layer. Experience working with the flat solderable tin
system has shown that the product tests well on
conventional bed of nails modules. The optimum tip
style is rounded or bullet tips, since no problems were
encountered with scratching or indentations. The tin
finish in question, although apparently soft on the surface, has a fairly hard undercoat and
is difficult to scratch to reveal any copper underneath.
For each mask group of the 9 tested, a full factorial DOE was applied and this is shown in
Table IV. The DOE involved the preparation of a total of 176 panels (not all groups had
special hardeners available). The DOE response variables which were tested, were as
follows:
The results recorded showed a wide range of responses for the different masks. These are
briefly summarized in Tables V and VI, where Table V shows the average responses for
all the test coupons. This gives a good relative idea of overall performance. The average
results give a clear indication that two of the LPSMs tested (E and F) gave good ionics
and mask integrity across a wide range of conditions.
Discussion of Ionics Mask F was a 100% epoxy solvent developable mask and was not
particularly influenced by any of the main factors. However, the next three masks in
Table V, E, A and C, show that the ionic levels were improved significantly by the
application of a post clean (Alpha CE2263) and to a lesser extent by the UV bump. These
masks were all aqueous developed acrylic/epoxy types. Whereas ionics reduction in the
next group of masks, G, D, B, H (note only D, B, H were acrylated-epoxies) was more
strongly influenced by the application of the UV bump and only to a secondary extent by
the post-clean. While some hazing was observed on some of the test panels, this did not
necessarily impact the ionics results, and the two are regarded as separate issues.
Discussion of Mask Integrity The crosshatch testing, which measures with the adhesion
of the body of the mask to the copper, was most strongly affected by the surface
preparation and not by the exposure to the immersion tin process. Most of the LPSMs
gave good results with the exception of soldermask G, which had acute failures on most
of the samples prepared with pumice pretreatment. Interestingly, the modified micro-etch
(oxide replacement) also gave better results than pumice in several cases.
This trend was also seen on the tape testing results that were much more strongly
influenced by the immersion tin processing. To assess or compensate for the effects of
undercut, tape testing was performed before and after tin exposure. The masks were all
processed according to the manufacturer's recommendations in terms of standard
application, tack dry, exposure, development and final cure. Also, the applied weights of
the LPSM were all recorded, and careful measures were taken to hold all the panels for
several hours after tin plating. This avoided the subjective tape testing often seen with
freshly plated samples. (It appears that many masks normalize within 4 -16 hr dwell time
after tin processing)
In looking at the optimum results recorded from each group, it is clear that the interactive
mask performance can be improved in general terms. Mask G again gave bad results
across all the tests that used pumice. Table VI summarizes some of the more optimal data
drawn from the DOE (tin plated coupons only). This shows that the mask integrity can be
improved and the ionic levels maintained below the maximum 6.5µgs/inch2 (NaCl
equiv.) that is called out on the Bellcore 78 specs.
With the increasing application of immersion tin, much more practical know-how has
developed. This has been necessary to ensure the consistency and reliability of the end
finish and facilitate a smoother integration of the technology into a volume production
operation. The interactivity of the process with many of the PWB materials is a key issue,
and it is clear that more work will be needed as the PWB industry continues on its
perpetual trend of change and improvement.
Solderability testing after stressing (artificial aging) must be agreed between supplier and
customer and carefully applied and controlled. The SERA technique for testing
solderability is under longer-term investigation and not enough results have been
established to make a real determination of its potential as a control tool. However, the
method is in use by some companies to evaluate the performance of immersion tin in
production.
In terms of process integration any extensive baking should be carried out before plating,
or if not possible, should be avoided. When plating gold tabs, a gold first operation
covered with a peelable resist is preferred.
LPSM compatibility and/or dialing-in is key for optimizing ionics and mask integrity.
LPSMs over light pumice scrubbing although heavy pumice footprints are better.
Standard chemical pre-clean is inadequate for many LPSM.
References
1. Dipti Singh, Kathy Hart "Design for the Environment: Printed Wiring Board Surface Finishes Project,"
U.S. Environmental Protection Agency, Washington DC.
2. IPC Working Committee on Alternative Solderable Finishes, chaired by Denny Fritz, various meetings
1998-1999 ongoing.
3. Ormerod, David. "The Development and Use of a Modified Immersion Tin as a High Performance
Solderable Finish" IPC Summit on PWB Surface Finishes and Solderability Supplement Proceedings, pp.
19-34, September 1997.
4. Numerous internal Enthone-Polyclad technical reports and communications compiled by Patrice Dumas
and Mario Orduz from 1996-1999.
5. Internal Enthone-Polyclad LPSM baselining and Pre-Clean DOE studies completed by Bob Gallant
during 1999.
6. Internal Enthone-Polyclad reports correlating thickness measurements and developing XRF
methodology, coordinated by Patrice Dumas during 1999.