Академический Документы
Профессиональный Документы
Культура Документы
FEATURES
PIN CONFIGURATIONS
Vpp
32
A16
31
30
PGM
A17
A12
29
A14
A7
28
A13
A6
27
A5
7 32-pin DIP 26
A4
A3
A2
10
A1
11
22
A0
12
21
CE
Q7
Q0
PGM
Vcc
A15
CE
A0
24
OE
A17
23
A10
13
20
Q6
Q1
14
19
Q5
Q2
15
18
Q4
GND
16
17
Q3
3 2 1 3 3 3
2 1 0 29
28
27
26
32-pin PLCC
25
24
23
1 1 1 1 1 2 22
5 6 7 8 9 0 21
.
Q7
OE
A8
25
OUTPUT
BUFFER
CONTROL
A9
A11
Q0
4
5
6
7
8
9
10
11
12 1
13 4
BLOCK DIAGRAM
CORE
DECODER
ARRAY
VCC
GND
VPP
PIN DESCRIPTION
/
A A A V V P A
1 1 1 p c G 1
2 5 6 p c M 7
A7
A6
A5
A4
A3
A2
A1
A0
Q0
SYMBOL
A14
A13
A8
A9
A11
OE
A10
CE
Q7
A0A17
Address Inputs
Q0Q7
Data Inputs/Outputs
CE
Chip Enable
OE
Output Enable
PGM
VPP
VCC
GND
Q Q G Q Q Q Q
1 2 N 3 4 5 6
D
-1-
DESCRIPTION
Program Enable
Program/Erase Supply Voltage
Power Supply
Ground
Preliminary W27C020
FUNCTIONAL DESCRIPTION
Read Mode
Like conventional UVEPROMs, the W27C020 has two control functions, both of which produce data
at the outputs.
CE is for power control and chip select. OE controls the output buffer to gate data to the output pins.
When addresses are stable, the address access time (TACC) is equal to the delay from CE to output
(TCE), and data are available at the outputs TOE after the falling edge of OE, if TACC and TCE timings
are met.
Erase Mode
The erase operation is the only way to change data from "0" to "1." Unlike conventional UVEPROMs,
which use ultraviolet light to erase the contents of the entire chip (a procedure that requires up to half
an hour), the W27C020 uses electrical erasure. Generally, the chip can be erased within 100 mS by
using an EPROM writer with a special erase algorithm.
Erase mode is entered when VPP is raised to VPE (14V), VCC = VCE (5V), CE = VIL, (0.8V or below
but higher than GND), OE = VIH (2V or above but lower than VCC), A9 = VID (14V), A0 = VIL, and all
other address pins equal VIL and data input pins equal VIH. Pulsing PGM low starts the erase
operation.
Program Mode
Programming is performed exactly as it is in conventional UVEPROMs, and programming is the only
way to change cell data from "1" to "0." The program mode is entered when VPP is raised to VPP
(12V), VCC = VCP (5V), CE = VIL, OE = VIH, the address pins equal the desired addresses, and the
input pins equal the desired inputs. Pulsing PGM low starts the programming operation.
Erase/Program Inhibit
Erase or program inhibit mode allows parallel erasing or programming of multiple chips with different
data. When CE = VIH, erasing or programming of non-target chips is inhibited, so that except for the
CE, the W27C020 may have common inputs.
-2-
Preliminary W27C020
Standby Mode
The standby mode significantly reduces VCC current. This mode is entered when CE = VIH. In
standby mode, all outputs are in a high impedance state, independent of OE and PGM.
System Considerations
EPROM power switching characteristics require careful device decoupling. System designers are
concerned with three supply current issues: standby current levels (ISB), active current levels (ICC),
and transient current peaks produced by the falling and rising edges of CE. Transient current
magnitudes depend on the device output's capacitive and inductive loading. Two-line control and
proper decoupling capacitor selection will suppress transient voltage peaks. Each device should have
a 0.1 F ceramic capacitor connected between its VCC and GND. This high frequency, low inherentinductance capacitor should be placed as close as possible to the device. Additionally, for every eight
devices, a 4.7 F electrolytic capacitor should be placed at the array's power supply connection
between VCC and GND. The bulk capacitor will overcome voltage slumps caused by PC board trace
inductances.
MODE
PINS
CE
OE
PGM
A0
A9
VCC
VPP
OUTPUTS
Read
VIL
VIL
VCC
VCC
DOUT
Output Disable
VIL
VIH
VCC
VCC
High Z
Standby (TTL)
VIH
VCC
VCC
High Z
VCC 0.3V
VCC
VCC
High Z
Program
VIL
VIH
VIL
VCP
VPP
DIN
Program Verify
VIL
VIL
VIH
VCC
VPP
DOUT
Program Inhibit
VIH
VCP
VPP
High Z
Erase
VIL
VIH
VIL
VIL
VID
VCE
VPE
FF (Hex)
Erase Verify
VIL
VIL
VIH
VCC
VPE
DOUT
Erase Inhibit
VIH
VCE
VPE
High Z
Product Identifiermanufacturer
VIL
VIL
VIL
VHH
VCC
VCC
DA (Hex)
Product Identifier-device
VIL
VIL
VIH
VHH
VCC
VCC
85 (Hex)
Standby (CMOS)
-3-
Preliminary W27C020
DC CHARACTERISTICS
Absolute Maximum Ratings
PARAMETER
RATING
UNIT
-55 to +125
Storage Temperature
-65 to +125
-0.5 to +7
-0.5 to +14.5
-0.5 to +14.5
Note: Exposure to conditions beyond those listed under Absolute Maximum Ratings may adversely affect the life and reliability of the
device.
DC Erase Characteristics
(TA = 25 C 5 C, VCC = 5.0V 5%, VHH = 14V)
PARAMETER
SYM.
CONDITIONS
ILI
ICP
CE = VIL, OE = VIH,
LIMITS
UNI
T
MIN.
TYP.
MAX.
-10
10
30
mA
30
mA
IPP
CE = VIL, OE = VIH,
PGM = VIL, A9 = VHH
VIL
-0.3
0.8
VIH
2.4
5.5
VOL
IOL = 2.1 mA
0.45
VOH
IOH = -0.4 mA
2.4
A9 Erase Voltage
VID
13.75
14.0
14.25
VPE
13.75
14.0
14.25
VCE
4.5
5.0
5.5
Note: VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP.
-4-
Preliminary W27C020
CAPACITANCE
(VCC = 5V, TA = 25 C, f = 1 MHz)
PARAMETER
SYMBOL
CONDITIONS
MAX.
UNIT
Input Capacitance
CIN
VIN = 0V
pF
Output Capacitance
COUT
VOUT = 0V
12
pF
AC CHARACTERISTICS
AC Test Conditions
PARAMETER
CONDITIONS
70 nS
0 to 3.0V
5 nS
1.5V/1.5V
CL = 30 pF,
IOH/IOL = -0.4 mA/2.1 mA
90/120 nS
0.45V to 2.4V
10 nS
0.8V/2.0V
CL = 100 pF,
IOH/IOL = -0.4 mA/2.1 mA
3.3K ohm
DOUT
Input/Output
Test Points
2.4V
For 90/120 nS
0.45V
Test Points
2.0V
2.0V
0.8V
0.8V
Test Point
Test Point
3.0V
For 70 nS
1.5V
1.5V
0V
-5-
Preliminary W27C020
READ OPERATION DC CHARACTERISTICS
(Vcc = 5.0V 5%)
PARAMETER
SYM.
CONDITIONS
LIMITS
UNIT
MIN.
TYP.
MAX.
ILI
VIN = 0V to VCC
-5
ILO
VOUT = 0V to VCC
-10
10
ISB
CE = VIH
1.0
mA
ISB1
CE = VCC 0.2V
100
ICC
CE = VIL
IOUT = 0 mA
f = 5 MHz
30
mA
IPP
VPP = VCC
10
VIL
-0.3
0.8
VIH
2.2
VCC +0.5
VOL
IOL = 2.1 mA
0.45
VOH
IOH = -0.4 mA
2.4
VPP
VCC -0.7
VCC
PARAMETER
SYM.
W27C020-70
W27C020-90
W27C020-12
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
UNIT
TRC
70
90
120
nS
TCE
70
90
120
nS
TACC
70
90
120
nS
TOE
30
40
55
nS
TDF
25
25
30
nS
TOH
nS
Note: VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP.
-6-
Preliminary W27C020
DC PROGRAMMING CHARACTERISTICS
(VCC = 5.0V 5%, TA = 25 C 5 C)
PARAMETER
SYM.
ILI
ICP
CONDITIONS
LIMITS
UNIT
MIN.
TYP.
MAX.
CE = VIL, OE = VIH,
10
30
A
mA
30
mA
PGM = VIL
VPP Program Current
IPP
CE = VIL, OE = VIH,
VIL
VIH
VOL
PGM = VIL
IOL = 2.1 mA
-0.3
2.4
-
0.8
5.5
0.45
V
V
V
VOH
VID
VPP
VCP
IOH = -0.4 mA
-
2.4
11.5
11.75
4.5
12.0
12.0
5.0
12.5
12.25
5.5
V
V
V
V
AC PROGRAMMING/ERASE CHARACTERISTICS
(VCC = 5.0V 5%, TA = 25 C 5 C)
PARAMETER
SYM.
LIMITS
UNIT
MIN.
TYP.
MAX.
TVPS
2.0
TAS
2.0
TDS
2.0
TPWP
95
100
105
TPWE
95
100
105
mS
TDH
2.0
OE Setup Time
TOES
2.0
TOEV
150
nS
TDFP
130
nS
TAH
TAHE
2.0
CE Setup Time
TCES
2.0
Note: VCC must be applied simultaneously or before VPP and removed simultaneously or after VPP.
-7-
Preliminary W27C020
TIMING WAVEFORMS
AC Read Waveform
VIH
Address
Address Valid
VIL
VIH
CE
VIL
TCE
VIH
TDF
OE
VIL
TOE
TOH
TACC
Outputs
High Z
Valid Output
High Z
Erase Waveform
Read
Manufacturer
Read
Device
SID
SID
A9 = 12.0V
VIL
Others = V IL
Others = V IL
VIH
Address
A0 = V IL
A0=V IH
Others=V IL
TAS
TAS
Data
DA
Blank Check
Read Verify
Erase Verify
Chip Erase
A9 = 14.0V
Address
Stable
Address
Stable
TAS
01
TAHC
Address
Stable
TACC
TDFP
DOUT
TDH
DOUT
DOUT
T AH
14.0V
5V
5.0V
TVPS
VPP
VIH
CE
TCE
VIL
TOE
TOES
TOE
TOE
VIH
OE
VIL
TCES
TPWE
PGM
-8-
TOEV
Preliminary W27C020
Timing Waveforms, continued
Programming Waveform
Program
Verify
Program
Read
Verify
VIH
Address Stable
Address
Address Valid
Address Stable
VIL
TDFP
TAS
Data
Data In Stable
TDS
DOUT
TACC
DOUT
DOUT
TAH
TDH
12.0V
VPP
5.0V
VIH
5V
TVPS
TCES
CE
VIL
TOE
VIH
OE
VIL
VIH
PGM
TOES
TOEV
TPWP
VIL
-9-
Preliminary W27C020
SMART PROGRAMMING ALGORITHM
Start
Vcc = 5V
Vpp = 12V
X=0
Increment X
Yes
X = 25?
No
Fail
Verify
One Byte
Verify
One Byte
Pass
Increment
Address
No
Fail
Pass
Last
Address?
Yes
Vcc = 5V
Vpp = 5V
Compare
All Bytes to
Original Data
Fail
Pass
Fail
Device
Pass
Device
- 10 -
Preliminary W27C020
SMART ERASE ALGORITHM
Start
X=0
Vcc = 5V
Vpp = 14V
A9 = 14V; A0 = VIL
Chip Erase 100 mS Pulse
Increment X
No
Erase
Verify
Fail
X = 20?
Pass
Yes
Increment
Address
No
Last
Address?
Yes
Vcc = 5V
Vpp = 5V
Compare
All Bytes to
FFs (HEX)
Fail
Pass
Pass
Device
Fail
Device
- 11 -
Preliminary W27C020
ORDERING INFORMATION
PART NO.
ACCESS
TIME
(nS)
POWER SUPPLY
CURRENT MAX.
(mA)
STANDBY VCC
CURRENT MAX.
(A)
PACKAGE
W27C20-70
70
30
100
W27C020-90
90
30
100
W27C020-12
120
30
100
W27C020P-70
70
30
100
32-pin PLCC
W27C020P-90
90
30
100
32-pin PLCC
W27C020P-12
120
30
100
32-pin PLCC
Notes:
1. Winbond reserves the right to make changes to its products without prior notice.
2. Purchasers are responsible for performing appropriate quality assurance testing on products intended for use in
applications where personal injury might occur as a consequence of product failure.
- 12 -
Preliminary W27C020
PACKAGE DIMENSIONS
32-pin P-DIP
Dimension in Inches
Symbol
A
A1
A2
B
B1
c
D
E
E1
e1
L
D
17
32
E1
5.33
0.210
0.010
0.25
0.150
0.155
0.160
3.81
3.94
4.06
0.016
0.018
0.022
0.41
0.46
0.56
0.048
0.050
0.054
1.22
1.27
1.37
0.010
0.014
0.20
0.25
0.36
1.650
1.660
41.91
42.16
0.590
0.600
0.610
14.99
15.24
15.49
0.545
0.550
0.555
13.84
13.97
14.10
0.090
0.100
0.110
2.29
2.54
2.79
0.120
0.130
0.140
3.05
3.30
3.56
15
0.670
16.00
16.51
17.02
0.008
eA
S
Dimension in mm
0.630
0.650
15
0.085
2.16
16
Notes:
c
A A2
A1
Base Plane
Seating Plane
e1
eA
B1
32-Lead PLCC
HE
E
4
32
30
Symbol
5
29
GD
D HD
21
13
14
20
A
A1
A2
b1
b
c
D
E
e
GD
GE
HD
HE
L
y
Dimension in Inches
Min.
Nom.
Max.
Dimension in mm
Min.
Nom.
Max.
3.56
0.140
0.50
0.020
0.105
0.110
0.115
2.67
2.80
2.93
0.026
0.028
0.032
0.66
0.71
0.81
0.016
0.018
0.022
0.41
0.46
0.56
0.008
0.010
0.014
0.20
0.25
0.35
0.547
13.97
14.05
11.43
11.51
0.550
0.553
13.89
0.447
0.450
0.453
11.35
0.044
0.050
0.056
1.12
1.27
1.42
0.490
0.510
0.530
12.45
12.95
13.46
0.390
0.410
0.430
9.91
10.41
10.92
0.585
0.590
0.595
14.86
14.99
15.11
0.485
0.490
0.495
12.32
12.45
12.57
0.075
0.090
0.095
1.91
2.29
2.41
0.004
0
10
0.10
0
10
Notes:
L
A2
b
b1
Seating Plane
A1
y
GE
- 13 -
Preliminary W27C020
VERSION HISTORY
VERSION
DATE
A1
Sep. 1998
PAGE
DESCRIPTION
Initial Issued
Headquarters
Taipei Office
11F, No. 115, Sec. 3, Min-Sheng East Rd.,
Taipei, Taiwan
TEL: 886-2-7190505
FAX: 886-2-7197502
Note: All data and specifications are subject to change without notice.
- 14 -