BS DD ENV 583-6 Ed.2000

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STD-BSI D D ENV 583-b-ENGL 2000
583-6:2000
Non-destructive
testing - Ultrasonic
examination -
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Part 6: Time-of-flight diffraction

technique as a method for detection and
sizing of discontinuities
ICs 19.100
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Copyright European Committee for Standardization

Provided by IHS under license with CEN
No reproduction or networking permitted without license from IHS
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STDmBSI DD E N V 53-6-ENGL 2000

DD ENV 583-6:2000
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National foreword
This Draft for Development is the official English language version of
ENV 58362000. During the development of ENV 5836, the UK expressed concern
about some of its provisions. Particular attention is drawn to the points outlined in
national annex NA. Attention is also drawn to the related British Standard
BS 77061993.
This publication is not to be regarded as a British Standard.

The UK participation in its preparation was entrusted to Technical Committee
WEW46, Non-destructive testing, which has the responsibility to:
- aid enquirers to understand
the text;
- present to the responsible European committee any enquiries on the
- monitor related international and European developments and promulgate

them in the UK
A list of organizations represented on this committee can be obtained on request to

its secretary.
Cross-references
The British Standards which implement international or European publications
referred to in this document may be found in the BSI Standards Catalogue under the
section entitled ?International StandardsCorrespondence Index?,or by using the
?Find?facility of the BSI Standards Electronic Catalogue.
Summary of pages
This document comprises a front cover, an inside front cover, the ENV title page,
pages 2 to 15 and a back cover.
The BSI copyright notice displayed in this document indicates when the document
was last issued.
having been prepared under the

direction of the Engineering
Sector Committee, was published
under the authority of the
Standards Committee and comes
into effect on 15 July 2000
Amd.No.
Comments
Date
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ENV 583-6
PRENoRMEEuR0PEE"E
EUROPAISCHE vomom
January 2ooo
ICs 19.100
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Engush version
Nondestructive testing -Ultrasonic exambtion Part 6 'Iirne-of-flq$t dZ&action technique as a method for detection
and sizing of discontinuities
Essais non destructifs- Contrle Ultsasonore Partie 6: Technique de difiiwtion du temps de vol
utilise comme mthode de dtection et de
dimensionnement des discontinuits
zerstrungsfeie Prufung - ultraschaiiprufung Teil 6 Beugungsla.ufzei@chnik, ein Technik zum

Aunuiden und Ausmessen von Jnhomogenitkn
This European &standard (ENV) was approved by CEN on 21May1997 as a

prospective standard for provisional application.
The period of validity of this ENV is limited initially to three years. After two years
the members of CEN will be requested to submit their comments, particularly on
the question whether the ENV can be converted into a European Standard.
CEN members are required to announce the existence of this ENV in the same way
as for an EN and to make the ENV available promptly at national level in an
appropriate form. It is permissible to keep conflicting national standards in force
(in parallel to the ENV) unt the final decision about the possible conversion of the
ENV into an EN is reached.
CEN members are the national standards bodies of Austria, Belgium, Czech
Republic, Denmark, Finiand, France, Gennany, Greece, Iceland, Ireland, Italy,
Luxembourg, Netherlands, Norway, Portugai, Spain, Sweden, Switzerland and
United Kingdom.
CEN
European Committee for Standardization
Comit Europen de Normalisation
Europisches Komitee fur Normung
Central Secretariat: rue de Stassart 36, B-1060 Brussels
O 2000 CEN All rights of exploitation in any form and by any means reserved worldwide for CEN national
Members.
Ref. No. ENV 583-6:2000 E
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STDmBSI DD ENV 583-6-ENGL
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Contents
Foreword
This European Prestandard has been prepared by
Technical Committee CENEC 138, Nondestructive
testing, the Secretariat of which is held by AFNOR.
According to the CENKENELEC Internal Regulations,
the national standards organizations of the following
countries are bound to announce this European
Prestandard Austria, Belgium, Czech Republic,
Denmark, Finland, fiance, Germany, Greece, Iceland,
Ireland, Itay, Luxembourg, Netherlands, Norway,
Portugal, Spain, Sweden, Switzerland and the United
Kingdom.
EN 583, Non-destructive testing - Ultrasonic
examination consists of the following parts:
EN 583-1, Non-destructive testing - Ultrasonic
examination -Part 1: General principles.
examination - Part 2: Sensitivity and range
setting.
examination -Part 3: P a m i s s i o n technique.
examination -Part 4: Examination for
discontinuities perpendicular to the surface.
examination - Part 5: CharacMation and sizing
of discontinuities.
ENV 583-6, Non-destructive testing - Ultrasonic
examination - Part 6: 'Pime-offlight dffmction
techniqw?as a method for detection and sizing of
discontinuities.
Foreword
1
Scope
2
Normative references
3
Definitions and symbols
4
General
4.1 Principle of the technique
4.2 Requirements for surface condition
and couplant
4.3 Materials and process type
5
Qualification of personnel
6
Equipment requirements
6.1 Ultrasonic equipment and display
6.2 Uirasonic probes
6.3 Scanning mechanisms
7
Equipment Set-up procedures
7.1 General
7.2 Probe choice and probe separation
7.3 Time window setting
7.4 Sensitivity setting
7.5 Scan resolution setting
7.6 Setting of scanning speed
7.7 Checking system performance
8
Interpretation and analysis of data
8.1 Basic analysis of discontinuities
8.2 Detailed analysis of discontinuities
9
Detection and sizing in complex
geometries
10 Limitations of the technique
10.1 Precision and resolution
10.2 Dead zones
11 TOFD examination without data
recording
12 Examination procedure
13 Examination report
Annex A (normative) Reference blocks

Page
2
3
3
3
4
4
4
6
6
6
6
6
8
8
8
9
9
9
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1 scope
3 Definitions and symbols
This European hestandard defines the general

principles for the application of the Timeof-flight
diffracton ('0FD) technique for both detection and
sizing of discontinuities in low alloyed carbon steel
components. It could also be used for other types of
materials, provided the application of the TOFD
technique is performed with necessary consideration of
geomeixy, acoustical properties of the materials and the
sensitivity of the examination
Although it is applicable, in general terms, to
discontinuities in materials and applications covered by
EN 583-1, it contallis references to the application on
welds. This approach has been chosen for reasons of
clarity as to the ultmsonic probe positions and
directions of scanning.
Unless otherwise specified in the referencing
documents, the minimum requirements of this
hestandard are applicable.
Unless explicitly stated otherwise, this hestandard is
applicable to the following product classes as defined
in EN 583-2
- class 1, without restrictions;
- classes 2 and 3, restrictions will apply as stated in
clause 9.
The inspection of products of classes 4 and 5 wiil
require special procedures. These are addressed in
clause 9 as well.
- TOFD imeof-flight diffmdion.

X
f
h
Y
SY
z
hz
d
d
Dds
coordinate parallel to the scanning

surface, and parallel to a
predetermined reference line. In case
of weld inspection this reference line
should coincide with the weld. The
origin of the axes may be defined as
best suits the specimen under
exanunah
. 'on (see Figure 1);
imperfection length;
coordinate parallel to the scanning
surface, perpendicular to the
predetermined reference line
(*e Figure 1);
error in lateral position;
coordinate perpendicular to the
scanning surface (see Figure i);
imperfection height;
depth of a imperfection tip below the
scanning surface;
error in depth;
scanning-surface dead zone;
backwail dead zone;
sound velocity;
error in sound velocity;
spatial resolution;
timeof-flight from the transmitter to
the receiver;
heof-flight difference between the
lateral wave and a second uitrasonic
signai;
error in meof-flight;
time-of-fight at depth d;
length (in time) of the acoustical pulse
up to an ampiitude of 10% of the
Ddw
c
&
R
t
At
2 Normative references
This European hestandard incorporates by dated or
undated reference, provisions from other publications.
These normative references are cited at the
appropriate places in the text and the publications are
listed hereafter. For dated references, subsequent
amendments to or revisions of any of these
publications apply to this European Fhstandard only
when incorporated in it by amendment or revision. For
undated references the latest edition of the publication
referred to applies.
EN 473, Qudjfication and certjfication of NDT
personnel - Geneml prinpb.
EN 583-1,Non-destructive testing - Ultrasonic
examination - Part 1:G
M principles.
examination -Part 2: S m s i t i v i t ~and range setting.

EN 126681, Ultrasonic examination Characterization and verification of ultrasonic
examination equipment -Part 1: Instruments.
EN 126682, Ultrasonic examination Characterization and verification of ultrasmic
examination equipment -Part 2:h b e s .
EN 126683, Ultrasonic examination chamcterization and vdfication of ultrasonic
examination equipment -Part 3: Combined
equipment.
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ENV 583422000
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STD-BSI D D ENV 53-b-ENGL
maximum;
time-of-flight of the backwall echo;
half the distance between the index
poins of two ultrasonic probes;
6s
error in half the probe separation;
W
wall thickness;
dead zone
zone where indications may be
obscured due to the presence of
signais of geometrical origin;
back wall
extra dead zone where signais may be
dead zone
obscured by the presence of the back
wall echo;
A-sc~~
display of the ultrasonic signal
amplitude as a function of time;
display of the time-of-flight of the
k a n
ultrasonic signal as a function of
probe displacement;
n o n - p d e l scan perpendicular to the ultrasonic
scan
beam direction (see Figure 4);
parallel scan scan parallel to the uitrasonic beam
direction (see Figure 5).
t,
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945
Figure 1 - Coordinate definition
4 General
4.1 Principle of the technique

The TO W technique relies on the interaction of
ultmsonic waves with the tips of discontinuities. This
interaction results in the emission of diffracted waves
over a large m
a
r range. Detection of the diffracted
waves makes it possible to establish the presence of
the imperfection. The time-of-fight of the recorded
signals is a measure for the height of the imperfection,
thus enabhg sizing of the defect. The dimension of
the imperfection is always determined kom the
timeof-flight of the difracted signals. The signal
amplitude is not used in size estimation.
The basic conguration for the TOFD technique
consists of a separate ultrasonic trammitter and
receiver (see Figure 2). Wide-angie beam compression
wave probes are normally used since the diffraction of
ulhasonic waves is only weakly dependent on the
orientation of the imperfection tip. This enables the
inspection of a certain volume in one scan. However,
restrictions apply to the size of the volume that can be
inspected during a single scan (see 7.2).
The first signal to arrive at the receiver after emission
of an acoustic pulse is usually the lateral wave which
travels just beneath the upper surface of the test
specimen.
In the absence of discontinuities the second signai to
arrive at the receiver is the backwail echo.
These two signals axe normally used for reference

purposes. If mode conversion is neglected, any signals
generated by discontinuities in the material should
arrive between the lateral wave and the backwail echo,
since the latter two correspond, respectively, to the
shortest and longest paths between fmnsmitter and
receiver. For similar reasons the diffracted signal
generated at the upper tip of an imperfection wili
arrive before the signal generated at the lower tip of
the imperfection. A typical pattern of indications
(A-scan) is shown in Figure 3. The height of the
imperfection can be deduced from the difference in
time-of-fiight of the two diffracted signals (see 8.1.6).
Note the phase reversal between the lateral wave and
the backwall echo, and between echoes of the upper
and lower tip of the imperfection.
Where access to both surfaces of the specimen is
possible and flaws are distributed throughout the
specimen thickness, scanning from both surfaces wili
improve the overall precision, particularly in regard to
flaws near the surfaces.
4.2 Requirements for surface condition and

couplant
Care sha be taken that the surface condition meets at
least the requirements stated in EN 583-1. Since the
diffracted signals may be weak, the degradation of
signal quality due to poor surface condition wili have a
severe impact on inspection reliabiiiw.
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STD.BS1 D D ENV 583-b-ENGL
2000
Legend
1 'Itansmitter
2 Receiver
a Laterai wave
b Uppertip
e Lowertip
f Backwallecho
Figure 2 - Basic TOFD configuration
Legend
X Amplitude
-b
a Laterai wave
Figure 3
- Schematic A-scan of embedded imperfection
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b Uppertip
c Backwallecho
d Lowertip
Y Time
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c included angle
d Imperfection
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Different coupling media can be used, but their type

shall be compatible with the materials to be examined.
Examples are: water, possibly containing an agent
(wetting, anti-freeze, corrosion inhibitor), contact paste,
oil, grease, cellulose paste containing water, etc.
The characteristics of the coupling medium shall
remain constant throughout the examination. It shall
be suitable for the temperature range in which it wili
be used.
- for general applications combinations of
ultrasonic equipment and scanning mechanisms

(see 6.3) shall be capable of acquiring and digitizing
signals with a rate of at least one A-scan per 1mm
scan length. Data acquisition and scanning
mechanism movement shall be synchronized for this
purpose;
- to select an appropriate portion of the time base
within which A-scans are digitized, a window with
programmable position and length shall be present.
4.3 Materials and process type
Window start shall be programmable between
Due to the relatively low signal amplitudes that are
O and 200 ps from the transmitting pulse, window
used in the TOFD technique, the method can be
length shaii be programmable between 5 and 100 p.
applied routinely on materials with relatively low levels
In this way, the appropriate signals (iaterai or
of attenuation and scatter for ultrasonic waves. In
creeping wave, backwall signal, one or more mode
general, application on unalloyed and low alloyed
converted signals as described in 4.1) can be
carbon steel components and welds is possible, but
selected to be digitized and displayed;
also on fine grained austenitic steels and duminium.
- digitized A-scans should be displayed in
Coarse-grained materials and materials with significant
amplitude related grey or single-colour levels, plotted
anisotropy however, such as cast iron, austenitic weld
dacently to form a Escan. See Figures 4 and 5 for
materials and high-nickel alloys, will require additional
typical B-scans of non-parallel and parallel scans
validation and additional data-processing.
respectively. The number of grey or single-colour
scales should at least be 64;
By mutual agreement, a representative test specimen
with artificial and/or natural discontinuities can be
- for archiving purposes, the equipment shaii be
used to confirm inspectability. Remember that
capable of storing all A-scans or B-scans
ciifhction characteristicsof artificial defects can differ
(as appropriate) on a magnetic or optical storage
significantly from those of real defects.
medium such as hard disk, floppy disk, tape or
optical disk For reporting purposes, it shall be
capable
of making hard copies of A-scans or B-scans
5 Qualification of personnel
(as appropriate);
Personnel performing examinations with the TOFD
- the equipment should be capable of performing
technique shall, as a minimum, be qualified in
signal averaging.
accordance with EN 473, and shall have received
In order to achieve the relatively high gain settings
additional training and examhation on the use of the
TOFD technique on the product classes to be tested, as required for typical TOFD-signals, a preamplifier may
be used, which should have a flat response over the
specified in a written practice.
frequency range of interest. This preamplifier shall be
positioned as close as possible to the receiving probe.
6 Equipment requirements
Additional requirements regarding features for basic
and advanced analysis of discontinuities are described
6.1 Ultrasonic equipment and display
in
clause 8.
Ultrasonic equipment used for the TOFD technique
shall, as a minimum, comply with the requirements of
6.2 Ultrasonic probes
EN 126681, EN 126682 and EN 126683.
Ulkasonic probes used for the TOFD technique s h d
In addition, the following requirements shall apply:
comply with at least the following requirements:
- the receiver bandwidth shall, as a minimum,
- number of probes: 2 (transmitter and receiver);
range between 0,5 and 2 times the nominal probe
- type: any suitable probe (see 7.2);
frequency at -6 dB,unless specific materials and
- wave mode: usually compression wave; the use of
product classes require a larger bandwidth.
shear wave probes is more complex but may be
Appropriate band filters can be used;
agreed upon in special cases;
- the transmitting pulse can either be unipolar or
- both probes shall have the same centre frequency
bipolar. The rise time shall not exceed 0,25 times the
within a tolerance of 320 "/o; frequency: for detajls on
period corresponding to the nominal probe
probe frequency selection, see 7.2;
frequency;
- the pulse length of both the lateral wave and the
- the unrectified signals shall be digitized with a
backwall echo shall not exceed two cycles,
sampling rate of at least four times the nominal
measured at 10 % of the peak amplitude;
probe frequency;
- pulse repetition rate shall be set such that no
interference occurs between acoustical signals
caused by successive transmission puises.
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Page 7
ENV 583-6:2000
Transit time
(through wall extent)
Reference line
Direction o f
probe
displacernent
( X direction)
Direction of
probe
displacement
( X direction)
Lateral
wave
la
-Y
Transmitter
Direction o f probe
displacement ( X direction)
Backwall
reflection
Receiver
Figure 4 Non-parallel scan, with the typical direction of probe displacement

shown on the left, and the corresponding B-scan shown on the right
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Transit time
(through wall extent)
Reference line
1
I
Lateral
wave
/
Trancm itter
Direction o f probe
displacement X direction)
Backwall
refIect ion
Receiver
Figure 6 - Parallel scan, with the typical direction of probe displacement shown
on the left, and the corresponding B-scan shown on the right
6.3 Scanning mechanisms
Scanning mechanisms shall be used to maintain a
constant istance and aiignment between the index
points of the two probes.
An additional function of scanner mechanisms is to
provide the ultrasonic equipment with probe position
information, in order to enable the generation of
position-related B-scans. Information on probe position
can be provided by means of e.g. incremental magnetic
or optical encoders, or potentiometers.
Scanning mechanisms in TOFD can either be motor or
manually driven. They shall be guided by means of a
suitable guiding mechanism (steel band, belt, automatic
track foliowing systems, guiding wheels etc.).
Guiding accuracy with respect to the centre of a
reference h e (e.g. the centre h e of a weld) should be
kept within a tolerance of I10 % of the probe index
point separation.
7 Equipment Set-up procedures

7.1 General
Probe selection and probe configuration are important
equipment Set-up parameters. They largely detemine
the overall a~curacy,the signal-to-noise ratio and the
coverage of the region of interest of the TOFD
technique.
The Set-up procedure described in this subclause
intends to ensure:
- sufficient system gain and signal-to-noise ratio to
detect the diffracted signals of interest;
- acceptable resolution and adequate coverage of
the region of interest;
- efficient use of the dynamic range of the system.
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Wall
thickness
mm
c 10
Centre
frequency
MHZ
10 - 15
10 to <30
5 - 10
30 to <70
2-5
Crystalsize
2-6
50" - 70"
2-6
6- 12
50"-60"
45" - 60"
Centre
frequency
Crystal size
MHz
5-10
30to<100 2-5
100 to 1300 11-3
block as described in annex k
7.4 Sensitivity setting

The probe separation and the time window shall be set
to those values that wili be used in the subsequent
inspection.
The aim isto make sure that the signals from
mm
Depth region
Oto<30
Nominal
probe angle
approximately 5 % of the amplitude scale.

The sensitivity setting can now be checked makmg use
of representative flaws or dSra&ng artificial defects
in a reference block as described in annex A The
results can be used to justify reducing the gain settjng
or give warning that the signai-tenoise ratio is
insufficient.
Nominal
probe angle
2-6
50"- 70"
6- 12
110-25
45" - 60"
145"-60"
7.2.2 Probe separation

The maximum diffraction efficiency occurs when the
included angle is about 120". The probes should be
arranged such that the (imagined) beam centre lines
intersect at about this angle in the depth region where
discontinuities are anticipatedsought.
Deviations of more than -35" or +45" from this value
may cause the diffracted echoes to be weak and
should not be used unless detection capabilities can be
demonstrated.

Q CEN
Provided by IHS under license with
7.6 Scan resolution setting

It is recommended to record one A-scan per miilimetre
of probe displacement.
7.6 Setting of scanning speed

Scanning speed shall be selected such that it is
compatible with the requirements of 7.3,7.4 and 7.6.
7.7 Checking system performance

It is recommended that system performance is checked
before and after an inspection by recordmg and
comparing a limited number of representative A-scans.
See also EN 126683.
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8 Interpretation and analysis of data

8.1 Basic analysis of discontinuities
8.1.1 General
Reporting or acceptance criteria shall be agreed upon
by contracting parties prior to inspection.
Discontinuities detected by TOFD shall be
characterized by at least:
- their position in the object (x-and ycoordinates);
- their length (Ax);
- their depth and height (z, hz);
- their type, limited to: top-surface breaking,
bottom-surfacebreaking or embedded.
8.1.2 Characterization of discontinuities
In order to characterize an imperfection, the phase of
the tip-diffraction associated with this imperfection
shall be determined
- a signal with same apparent phase as the lateral
wave shall be considered to originate from the lower
tip of an imperfection;
- a signal with the same apparent phase as the
backwall echo shall be considered to originate either
from an upper tip of an imperfection or from an
imperfection with no measurable height.
If the signal-tc-noise ratio is insufcient to aUow the
phase of the signal to be detected, these identifications
are invalid.
8.1.2.1 Top-surface breaking impe@ection

An indication consisting of a lower-tip diffraction with
an associated weakening (check for couplant loss) or
interruption of the lateral wave shall be considered a
top-surace breaking imperfection.
Sometimes a slight shift of the laterai wave towards
longer timeof-flight can be observed.
8.1.2.2 Bottom-surfce breaking discontinuities

An indication consisting of an upper-tip diffraction
with either an associated shift of the backwall echo

towards longer time-of-fight or an interruption (check
for couplant loss) of the backwall echo shall be
considered a bottom-surface breaking imperfection.
8.1.2.3 Embedded discontinuities

An indication consisting of both an upper-tip and a
lower-tip diffraction shall be considered an embedded

imperfection.
An indication consisting solely of an apparent upper-tip
diffraction with no associated indications in either
lateral wave or backwall echo shall be considered an
imperfection with no height. Care must be taken
however, because the indications in the lateral wave or
backwall echo can be very weak, resulting in
misinterpretation of the imperfection. In case of doubt
appropriate action shall be taken, either by performing
multiple TOFD-scans (see 8.2.1) or by applying other
techniques.

In case further characterization is required, reference

shaii be made to 8.2.
In case of doubt about the interpretation of a defect,
the worst possible interpretation shall be retained, until
the interpretation can be verified
8.1.3 Estimation of imperfection position

In general it will be sufficiently accurate to assume
that the imperfection is located on the intersection
between the x,z-plane mid-way between the two
ultrasonic probes and the y,z-plane through the
centre-lines of the two probes.
The time-of-fight of an indication generated by an
imperfection can also be used to estimate its position.
The surface of constant timeof-flight theoretically is an
ellipsoid centred around the index points of the
ultrasonic probes. The exact determination of the
position of the diffractor can only be achieved by at
least two scans (see 8.2.1).
If a more accurate assessment of the position andor
orientation of the imperfection is required, multiple
TOFD-scans (non-parailel andor parallel) will have to
be performed.
8.1.4 Estimation of imperfection length
The estimation of the length of an imperfection shall
be made directly from the probe displacement of a
non-parallel scan. In common with all ultrasonic
techniques this record is iikely to be elongated because
of the finte width of the dtrasonic beam, resulting in
conservative estimates of the imperfection length.
Indications with an apparent length of less than
1,5 times the size of the probe crystal used are too
small to be sized, in length, by normal TOFD
procedures, but see 8.2.2 for additional algorithms to
determine imperfection length.
8.1.5 Estimation of imperfection depth and height

It is assumed that the dtrasonic energy enters and
leaves the specimen at the index points of the probes.
In case the imperfection is assumed to be mid-way
between the two probes (see 8.1.3), the depth of the
defect is given by:
d = [%(Ct)2- $1
(1)
where
c is the sound velocity;
t is the time-of-fight of the t i m t i o n signal;

d is the depth of the tip of the imperfection;
S is half the distance between the index points of

the ultrasonic probes.
The time-of-fight of the ultrasonic signai inside the
ultrasonic probes shall be subracted before the
calculation of the depth is made. Failure to do so will
result in grave errors in the calculated depth.
O BSI 07-2000
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ENV 583-6:2000
To avoid the errors that may arise from probe delay

estimation the depth d shall be calculated, if possible,
from the timeof-flight differences, At, between the
lateral wave and the difhcted pulse. Hence:
d = %[(CAt)z+ kAtS]'
(2)
8.1.6.1 Top-suflme brealc.ng discontinuities

The height of a top-surface breaking imperfection is
determined by the distance between the top surface
and the depth of the lower-tip diffrctction signal.
8.2.1.3 Scans with redwed probe angk

Scans with a reduced probe angle and an associated
decreased probe separation can be performed to
obtain increased resolution, increased s i z i i accura~y
and a reduced dead zone at the expense of a smalier
honified volume of the specimen. The equipment
Set-up parameters shall be optimized (see clauses 6
and 7).
8.2.1.4 Scans with d i f f m t probe offset

In order to obtain the lateral position of the
8.1.5.2 Bottom-surJime breaking discontinuities
imperfection (ydirection) and/or its orientation, either
The height of a bottom-suface b r e w imperfection
a parailel scan or an additional non-parailel scan with
is determined by the difference in depth between the
different probe distance (offset) can be made. The
upper-tip diffraction and the bottom surface.
equipment Set-up parameters shall be optimized
(see clauses 6 and 7).
8.1.5.3 Embedded impe@ection
It
shall be checked that the phase relationship of the
The height of an embedded imperfection is determined
signals
observed in these scans is identical to the
by the difference in depth between the upper-tip and
phase
relationship
in the initial scans.
lower-tip dif-action.
The surface of constant timeof-fight for a
8.2 Detailed analysis of discontinuities
tipdifhction signal (locus curve) is an ellipsoid. If we
Detailed imperfection analysis can be performed on
consider oniy the y,z-phne through the probes, the
discontinuties already detected by basic TOFD-scam.
ellipse describing a constant path is expressed by:
In addition, the application of other NDT-techniques
+ [d2 + (S +
ct = [d2 + (S (3)
can be considered in order to arrive at a more detailed
From this expression it is clear that a different offset
characterization
of the diffractor h m the cenire plane between the
The motivation for detailed imperfection analysis can
probes (ie. a different y-value) will resuit in a different
be:
time-of-flight of the tipdifhction. Therefore the
- more accurate assessment of imperfection length, apparent depth of the imperfection-tip will change in
depth and height;
scans with different probe positions.
- assessment of imperfection orientation;
The lateral position of a imperfection-tip (y-direction)
can be determined directly from a parallel scan by the
- detailed estimation of imperfection type.
position
of minimum apparent depth. A number of
The detailed imperfection analysis involves performing
adjacent parallel scans at different x-coordinates will
additional scans with different probe angles,
be required to find the position of real minimal depth
frequencies and/or probe separation. Also parallel
of the imperfection.
scans can be performed. The detailed analysis can also
Once the position and depth of both tips of an
involve the application of additional computer
imperfection
are known its orientation can be
algorithms to analyse the data
determined from the axis through the two
8.2.1 Additional scans
imperfection-tips.
in principle, two non-parallel scam, offset with respect
8.2.1.1 Scans with lower test freq.uency
to each other, also suffice for the accurate
Scans with lower test frequencies can be performed if
determination of imperfection depth, length and
the signal-to-noise ratio is too low to permit detailed
imperfection analysis even with considerable averaging. orientaiion, provided that the overlap of the insonified
volumes is sufficient.
In general this will be at the expense of an increased
However, the determination of the position of the
dead zone, and a decreased resolution.
imperfection-tip kom two non-parallel scans is less
The equipment Set-up parameters shall be optimized
straightforward and will involve the drawing of locus
curves by additional s o h a r e , (see 8.2.2).
8.2.1.2 Scans with higher test frequency
Additional parallel scam may also be used to detect
Scans with higher test frequencies can be performed to near=surface defects, that are poorly resolved because
obtain increased resolution, increased s i z i i accuracy
of the proximity of the lateral wave or the backwall
and a reduced dead zone, at the expense of a reduced
echo. The apparent depth of the defect will change in
signal-tenoise ratio, due to increased grain noise. The
each scan and this will enable resolving it from the
equipment Set-up parameters shall be optimized
lateral wave or the backwall echo.
--``,`-`-`,,`,,`,`,,`---

O CEN
Provided by IHS under license with
ES1 07-2000
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S T D m B S I D D ENV 583-b-ENGL 2000

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Defects which are highiy tilted or skewed, such as

8.2.2 Additional algorithms
transverse
cracks in non-parallel scans, are likely to be
Computer algorithms can be useful in analysing the
more
ifcuit
to detect and it is recommended that
data recorded in a TOFDscan.
specific demonstrations of capability are carried out in
For example:
such cases. In addition flaws which are not serious,
- curve fitting overlays for accurate determination
such as point defects, have some ability to mimic more
of imperfection length (see also 8.1.4);
serious flaws such as cracks. Once again it is
recommended that the abiity to distinguish small
- subtraction of lateral wave andor backwall echo
cracks is demonstrated, where appropriate.
in order to detect indications otherwise obscured
due to interference (see 10.2). If the surface is rough Demonstrations of capability can be specific to the
inspection or can be referred back to other
or pitted, the effectiveness of this technique should
documented data.
be demonstrated in trials;
- linearization algorithms to linearize complete
10.1 Precision and resolution
&scans to accurately determine the depth or the
A distinction should be made between precision and
height of the imperfection;
resolution. Precision is the degree to which the
- modelling algorithms enabling the drawing of
position of a reflector or diffractor can be determined,
locus curves and the analysis of mode converted
whereas resolution defines the degree to which closely
signais. This can provide additional insight in the
spaced Wactors c m be distinguished from one
position, depth and orientation of the imperfection.
another.
Detailed understanding of the physics and modelling The precision of a TOFD-measurement wiii be
software are required
influenced by timing errors, errors in the sound
The algorithms to be used in analysing the data shall
velocity, probe separation errors and errors in the
be agreed upon by the contracting parties prior to
assumed lateral position of an indication. Under
inspection.
norma circumstances the overall precision will be
dominated by the latter,
10.1.1 Errors in the lateral position

As stated in 8.1.3, the lateral position of an indication
is n o d y assumed to be mid-way between the two
For class 2 objects, if the surface between the two
probes.
In reality the indication will be located on an
probes is flat, no further restrictions apply.
elipse
[equation
(3)]. The error in depth (Sd) due to
Otherwise for class 2 objects and for all class 3 objects,
the
error
in
lateral
position (Sy) can be calculated by:
a modified inspection and interpretation procedure will
6d=(c2t2 -@)" ( 6 ~ 2 / ~ 2 t 2 ) l [ ( 0 , 2 5 - 6 ~ 2 / ~ 2 (4)
t2)]'/2
be required to allow for the curvature of the object.
For class 4 and 5 objects special data processing
In principle, the lower edge of the acoustic beams
techniques and operating conditions will apply.
determines 6y. If no reliable information on the lower
beam edge is available, Sy = S shall be used
Computer algorithms will be useful in analysing the
data in these cases.
10.1.2 riming errors
To confirm imperfection detection capabilities, the use
The limit of precision in the depth of an indication,
of representative test specimens with natural flaws or
due to timing errors (Et), can be estimated from:
artificial defects is strongly recommended in these
d = c6t[d2 + $1" 1 2 d
(5)
cases as well.
where
10 Limitations of the technique

This clause considers the limitations of the TOFD
technique and is e q d y applicable to basic
TOFD-detectionas well as to TOFD-sizing. The limits
of achievable accuracy under normal conditions are
defined and the influence of dead zones, which can
affect detectabihty, is discussed. It is important to
realize that the overall reliability of the technique is
determined by a large number of contributing factors
and the overall error will not be less than the
combined errors discussed in this clause.

6d is the error in d.
The timing error can be reduced by using a shorter

pulse andor a higher frequency.
10.1.3 Errors in sound velocity

The limit of precision in the estimate of the depth of
an indication, due to errors in the sound velocity (k),
is given by:
6d = 6c[d2 + 9 - S(d2 + $)"I
I Cd
(6)
This error is reduced if the probe separation is
reduced. Independent calibration of the velocity by
measurement of the delay of the backwali echo, with a
known wall thickness, greatly reduces this error.
O ES1 07-2000
Not for Resale
--``,`-`-`,,`,,`,`,,`---
9 Detection and sizing in complex

geometries
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ENV 583452000
10.1.4 Errors in probe separation

Errors in the distance between the index points (ss)
will result in errors in depth-measurement. The error in
depth 6d can be calculated by:
6d = w ( d 2 +@)" - s] l d
It should be noted that errors in probe separation can
arise from both measurement errors in the distance
between the probes, as well as errors in the index
point caiibration.
When the probe separation is smaller than twice the
specimen thickness, the index point can no longer be
considered a fixed point, but it becomes a function of
depth In this case, if accurate sizing is required, the
depth measurement shall be caiibrakd with the aid of
a representative test specimen.
11 T O D examination without data

recording
10.1.6 Spatial resolution
12 Examination procedure
TOFD examination procedures shall comply with the
The spatial resolution (R)is a function of depth and

can be calculated by:
R = [C2(td + $J2/4 - $1' - d
(8)
where
tp is the length of the acoustic pulse and td is the
In manualiy applied TOFD, where interpretation is

obtained directly from the A-scan, unrectifed display
of the signais shall be used
This form of the TOF'D technique should only be used
on product classes with simple geometries, and the
equipment Set-up shali comply with the requirements
of 7.2,7.3 and 7.4.
In general it will not be possible to perorm the
detailed investigation of any response that is possible
with recorded data It will be more difficult to detect
phase changes, slight changes in transit m e and
defect echoes close to the lateral wave.
requirements given in EN 583-1, as applicable.

Specific conditions of application and use of the TOFD
technique will depend on the type of product
examined and specific requirements, and will be
described in written procedures.
timeof-flight at depth d.
The resolution increases with increasing depth, and
can be improved by decreasing the probe separation or
the acoustic pulse length.
13 Examination report
TOFD examination reports shall comply with the
requirements given in EN 583-1, as applicable.

In
addition, TOF'D examination reports shall contain
10.2 Dead zones
the following information:
Near the scanning surface there is a dead zone (D&)
- a description of the test specimen or reference
due to presence of the lateral wave. Interference
block, if a test specimen or reference block has been
between the lateral wave and the imperfection
used;
indication can obscure the indication. The depth of the
-probe type, frequency, angle(s), separation and
socalied scanning-swface dead zone is given by:
position
with respect to a reference line (e.g. weld
D& = [c2t2, 1 4 + scfpp
(9)
centre line);
Near the backwall there is also a dead zone (&w) due
- plotted images (hard copies) of at least those
to presence of the backwall+xho. The depth of the
locations where relevant indications have been
backwali dead zone is given by:
detected. Details of equipment settings and method
DdW= [$(& + fp)2 / 4 - $1" (10)
of setting test sensitivity.
where
Furthermore, all raw data recorded during the
examination, stored on a magnetic or optical storage
& is the time-of-flight of the backwall echo and W is medium such as hard disk, floppy disk, tape or optical
the wall thickness.
disk shall be kept for later reference.
--``,`-`-`,,`,,`,`,,`---
Both dead zones can be reduced by decreasing the

probe separation or by using probes with shorter puise
length.
O BSI 07-2000

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Page 14
ENV 583-6:2000
2000
W lib24bb9 0859085 874
Measurements shall be based on the diffracted signals

from reference diffractom These are either:
a) machined notches, open to the scanning surface
The purpose of reference blocks is to set the system
of the reference block or
sensitivity correctly and to establish sufficient
b) side drilled holes with a diameter of at least twice
volumetric coverage.
the wavelength of the nominal frequency of the
The minimm requirements of a reference block are
probes utilized in the inspection. The holes should
the following:
be cut to the scanning surface in order to block the
direct reflection 3om the top of the hole,
a) it should be made of similar materiai as the object
see F'igure A. 1.
under inspection (e.g. with regard to sound velocity,
grain noise and surface condition);
Reference diffractors should be present at
approximately 10 %, 25 %, 50 %, 75 % and 90 % of the
b) the wall thickness shall be equal to or greater
than the nominal wall thickness of the object under nominal thickness of the object under inspection.
inspection;
c) the width and the length of the scanning surface
shall be adequate for probe movement over the
reference diffractom.
Annex A (normative)
Reference blocks
.--a
O
O
Legend
a Sawcut
b Side drilled hole
Figure A . l - Sketch of a reference block, using side drilled holes, connected

to the scanning surface by means of a scan cut, as reference reflectors
--``,`-`-`,,`,,`,`,,`---

O BSI 07-2000
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National annex NA (informative)

UK comments on the text of ENV583-6
NA.l General
During the development of ENV 583-6, the UK
expressed concern about some of its provisions.
Particular attention is drawn to the points outlined
in NA.2 to NA.9. In addition, throughout the text the
t e m "defect", "fiaw", "discontinuity" and "crack" are
used usually, but not always, to describe imperfections,
and there is concern that this might cause confusion
NA.2 Coordinate definitions (see Figures 1 , 4 and 5)
The labelling of the axis in Figures 1,4 and5 is not
consistent. Within the UK it is common practice to
adopt the convention shown in Fgure 1, with the
addition of defuied +Y/-Y directions. This would
avoid, for example, possible ambiguity for parallel
scans carried out transverse to the weld directions.
NA.3 Personnel qualincation (see clause 6)
Clause 6 should permit the use of suitable schemes
other than EN 473; this should be by agreement
between the contracting parties.
NA4 Probe selection (see Tables 1 and 2)
The recommended crystal sizes and probe angie ranges
in Tables 1and 2 do not fuily represent current
practice within the UK. For example, for wall
thicknesses from 10 mm up to 30 mm, crystal sizes
of 10 mm and nominal probe angies of 45" have been
used.
NA.6 Probe separation (see 7.2.2)
For guidance, when inspecting the ful test piece
thickness with a single pair of probes, the probe beam
centses should intersect at half to two-thirdsof the
thickness.

O
DD ENV 583-6:2000
NA.6 Sensitivity setting (see 7.4)

ENV 583-6 attempts to detail a specific method for
sensitivity setting based on m a t e d grain noise.
BS T706 includes alternative methods which UK
industry may wish to retain. If the sensitivity setting is
based on material grain noise, it is essential that it is
checked as described in annex A
NA.7 Checking system performance (see 7.7)
The use of calibration blocks is a suitable method for
pre- and post-inspection sensitivity checks, in which
case the maximum allowable Merence in signai
amplitude should be agreed between the contracthg
parties.
NA.8 Characterization of discontinuities
(see 8.1.2)
It should be noted that parallel scans may be needed
in addition to non-paraiiel scans for characterization of
certain types of indication, e.g. for embedded
discontinuities.
NA.9 Errors in the lateral position
There is an error in equation (4), which should read.
6d = (c2t2 - 4s2)(63/ c2t2, / (1 - 4
2
/
2
/ CY)"
NA.10 Reference blocks (see annex A)
It is important to establish the percentage full screen
height to which the maximum amplitude response
from the reference diffractors should be set. This is
important to ensure repeatability between different
inspections.
It should be noted that ENV 53-6 permits the use of
blocks with either machined notches or side-drilled
holes.
Figure A l is not drawn to scale and attention is drawn
to the fact that the horizontal separation between holes
will be much larger than shown and it may be more
practical to produce multiple blocks.
--``,`-`-`,,`,,`,`,,`---
STD-BSI DD ENV 583-b-ENGL 2000
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DD ENV
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presents the UK view on standards in Europe and at the international level. It is
incorporated by Royal Charter.
Revisions
British Standards are updated by amendment or revision. Users of British Standards
should make sure that they possess the latest amendments or editions.
--``,`-`-`,,`,,`,`,,`---
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would be grateful if anyone inding an inaccuracy or ambiguity while using this
British Standard would inform the Secretary of the technical committee responsible,
the identity of which can be found on the inside front cover. Tel 020 8996 9OOO.
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Part 6: Time-of-flight diffraction

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Copyright European Committee for Standardization

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STDmBSI DD E N V 53-6-ENGL 2000

= Lnbd2a4 brdb 9s.c0859073

This publication is not to be regarded as a British Standard.

- present to the responsible European committee any enquiries on the

- monitor related international and European developments and promulgate

A list of organizations represented on this committee can be obtained on request to

having been prepared under the

ISBN O 580 34871 7

Copyright European Committee for Standardization

interpretation, or proposals for change, and keep the UK interests informed

STD-BSI DD ENV 583-b-ENGL

zerstrungsfeie Prufung - ultraschaiiprufung Teil 6 Beugungsla.ufzei@chnik, ein Technik zum

This European &standard (ENV) was approved by CEN on 21May1997 as a

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Copyright European Committee for Standardization

Lh24bb9 0859074 TO9

3 Definitions and symbols

This European hestandard defines the general

- TOFD imeof-flight diffmdion.

coordinate parallel to the scanning

examination -Part 2: S m s i t i v i t ~and range setting.

Not for Resale

STD-BSI D D ENV 53-b-ENGL

STDmBSI DD ENV SB3-b-ENGL 2000

Figure 1 - Coordinate definition

4.1 Principle of the technique

These two signals axe normally used for reference

4.2 Requirements for surface condition and

Copyright European Committee for Standardization

STD.BS1 D D ENV 583-b-ENGL

Figure 2 - Basic TOFD configuration

- Schematic A-scan of embedded imperfection

Copyright European Committee for Standardization

Not for Resale

STD-BSI D D ENV 583-6-ENGL

Different coupling media can be used, but their type

- for general applications combinations of

ultrasonic equipment and scanning mechanisms

Copyright European Committee for Standardization

Not for Resale

STD-BSI DD ENV 583-6-ENGL

Figure 4 Non-parallel scan, with the typical direction of probe displacement

Copyright European Committee for Standardization

Not for Resale

STD=BSI D D ENV 583-b-ENGL 2000

7 Equipment Set-up procedures

Copyright European Committee for Standardization

STD-BSI D D ENV 583-b-ENGL 2000

block as described in annex k

7.4 Sensitivity setting

approximately 5 % of the amplitude scale.

7.2.2 Probe separation

Copyright European Committee for Standardization

7.6 Scan resolution setting

7.6 Setting of scanning speed

7.7 Checking system performance

Not for Resale