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2SK1056, 2SK1057, 2SK1058

Silicon N-Channel MOS FET

Application
Low frequency power amplifier
Complementary pair with 2SJ160, 2SJ161 and 2SJ162

Features

Good frequency characteristic


High speed switching
Wide area of safe operation
Enhancement-mode
Good complementary characteristics
Equipped with gate protection diodes
Suitable for audio power amplifier

2SK1056, 2SK1057, 2SK1058


Outline

TO-3P

D
1

3
1. Gate
2. Source
(Flange)
3. Drain

Absolute Maximum Ratings (Ta = 25C)


Item
Drain to source voltage

2SK1056

Symbol

Ratings

Unit

VDSX

120

2SK1057

140

2SK1058

160

Gate to source voltage

VGSS

15

Drain current

ID

Body to drain diode reverse drain current

I DR

Channel dissipation

Pch*

100

Channel temperature

Tch

150

Storage temperature

Tstg

55 to +150

Note:

1. Value at TC = 25C

2SK1056, 2SK1057, 2SK1058


Electrical Characteristics (Ta = 25C)
Item

Symbol Min

Drain to source

2SK1056 V(BR)DSX

120

breakdown voltage

2SK1057

140

2SK1058

160

Typ

Max

Unit

Test conditions

I D = 10 mA, VGS = 10 V

Gate to source breakdown


voltage

V(BR)GSS

15

I G = 100 A, VDS = 0

Gate to source cutoff voltage

VGS(off)

0.15

1.45

I D = 100 mA, VDS = 10 V

Drain to source saturation


voltage

VDS(sat)

12

I D = 7 A, VGD = 0 *1

Forward transfer admittance

|yfs|

0.7

1.0

1.4

I D = 3 A, VDS = 10 V *1

Input capacitance

Ciss

600

pF

VGS = 5 V, VDS = 10 V,

Output capacitance

Coss

350

pF

f = 1 MHz

Reverse transfer capacitance

Crss

10

pF

Turn-on time

t on

180

ns

Turn-off time

t off

60

ns

Note:

VDD = 20 V, ID = 4 A,

1. Pulse test

2SK1056, 2SK1057, 2SK1058


Maximum Safe Operation Area

Power vs. Temperature Derating


20

Ta = 25C

100

tio

ra

pe

(T C

)
C

25

50

ID max (Continuous)
P PW
5
PW W = = 1
10 0 m
=
0 s
1
m 1
s
s sh
1
2
1 ot
sh
sh
ot
ot
1.0
O

Drain Current ID (A)

10

C
D

0.5
2SK1056
0

50
100
Case Temperature TC (C)

0.2
5

150

Typical Output Characteristics


1.0
TC = 25C

7
6

5
4

Pch =

100 W

VDS = 10 V

C=

0.8

VGS = 10 V
9
8

Drain Current ID (A)

Drain Current ID (A)

500
10
20
50 100 200
Drain to Source Voltage VDS (V)

Typical Transfer Characteristics

10

2SK1057
2SK1058

2
5C
25
75

Channel Dissipation Pch (W)

150

0.6

0.4

0.2
2
1
0

10
20
40
50
30
Drain to Source Voltage VDS (V)

0.4
0.8
1.6
2.0
1.2
Gate to Source Voltage VGS (V)

2SK1056, 2SK1057, 2SK1058


Drain to Source Voltage vs.
Gate to Source Voltage

Drain to Source Saturation


Voltage vs. Drain Current

VGD = 0

25

75

10

TC

25

Drain to Source Voltage VDS (V)

Drain to Source Saturation Voltage


VDS (on) (V)

10

2
1.0
0.5

0.2
0.1
0.1

0.2

0.5 1.0
2
Drain Current ID (A)

6
5A
4

10

Input Capacitance vs. Gate


Source Voltage

500

200
VDS = 10 V
f = 1 MHz
100
0

2
4
6
8
10
Gate to Source Voltage VGS (V)

2A
ID = 1 A
6
2
4
8
10
Gate to Source Voltage VGS (V)

Forward Transfer Admittance


vs. Frequency
Forward Transfer Admittance yfs (S)

Input Capacitance Ciss (pF)

1000

TC = 25C

3.0
1.0
0.3
0.1
0.03
0.01
0.003
10 k

TC = 25C
VDS = 10 V
ID = 2 A

30 k 100 k 300 k 1 M 3 M
Frequency f (Hz)

10 M

2SK1056, 2SK1057, 2SK1058


Switching Time vs. Drain Current

Switching Time ton,toff (ns)

500
t on

200
100
50

t off
20
10
5
0.1

0.2

0.5 1.0
2
Drain Current ID (A)

10

Switching Time Test Circuit


Output
RL= 2
Input

PW = 50s
duty ratio
=1%

20 V

50

Waveforms
90 %
Input
10 %
t on

t off
10 %

Output

90 %

15.6 0.3

1.5

0.3

19.9 0.2

2.0

14.9 0.2

0.5

1.0

3.2 0.2

5.0 0.3

Unit: mm
4.8 0.2

1.6
2.0

1.4 Max

18.0 0.5

2.8

1.0 0.2

3.6

5.45 0.5

0.6 0.2

0.9
1.0

5.45 0.5
Hitachi Code
JEDEC
EIAJ
Weight (reference value)

TO-3P

Conforms
5.0 g

Cautions
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received the latest product standards or specifications before final design, purchase or use.
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contact Hitachis sales office before using the product in an application that demands especially high
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for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.

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