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2SJ526

Silicon P Channel MOS FET


High Speed Power Switching

ADE-208-579B (Z)
4th. Edition
Jun 1998
Features
Low on-resistance
R DS(on) = 0.11 typ.
Low drive current
4 V gete drive devices
High speed switching

Outline
TO220FM

1 2
S

1. Gate
2. Drain
3. Source
3

2SJ526
Absolute Maximum Ratings (Ta = 25C)
Item

Symbol

Ratings

Unit

Drain to source voltage

VDSS

60

Gate to source voltage

VGSS

20

Drain current

ID

12

48

12

12

12

mJ

25

Drain peak current

I D(pulse)

Body-drain diode reverse drain current

I DR

Avalenche current

I AP

Avalenche energy

Note1

Note3

EAR

Note3
Note2

Channel dissipation

Pch

Channel temperature

Tch

150

Storage temperature

Tstg

55 to +150

Note:

1. PW 10s, duty cycle 1 %


2. Value at Tc = 25C
3. Value at Tch = 25C, Rg 50

Electrical Characteristics (Ta = 25C)


Item

Min

Typ

Max

Unit

Test Conditions

Drain to source breakdown voltage V(BR)DSS

60

I D = 10mA, VGS = 0

Gate to source breakdown voltage V(BR)GSS

20

I G = 100A, VDS = 0

Zero gate voltege drain current

I DSS

10

VDS = 60 V, VGS = 0

Gate to source leak current

I GSS

10

VGS = 16V, VDS = 0

Gate to source cutoff voltage

VGS(off)

1.0

2.0

I D = 1mA, VDS = 10V

Static drain to source on state

RDS(on)

0.11

0.15

I D = 6A, VGS = 10V Note4

resistance

RDS(on)

0.16

0.23

I D = 6A, VGS = 4V Note4

Forward transfer admittance

|yfs|

I D = 6A, VDS = 10V

Input capacitance

Ciss

580

pF

VDS = 10V

Output capacitance

Coss

300

pF

VGS = 0

Reverse transfer capacitance

Crss

85

pF

f = 1MHz

Turn-on delay time

t d(on)

10

ns

VGS = 10V, ID = 6A

Rise time

tr

55

ns

RL = 6

Turn-off delay time

t d(off)

85

ns

Fall time

tf

60

ns

Bodydrain diode forward voltage VDF

1.2

I F = 12A, VGS = 0

Bodydrain diode reverse


recovery time

60

ns

I F = 12A, VGS = 0
diF/ dt = 50A/s

Note:

Symbol

4. Pulse test

t rr

Note4

2SJ526
Main Characteristics
Power vs. Temperature Derating

1000

Maximum Safe Operation Area

300

I D (A)

Pch (W)

40

30

100

10 s

Drain Current

Channel Dissipation

30

20

10

10

0.1

50

100

Case Temperature

150

200

Tc (C)

=
(1 10 m
Op sh s
er ot)
at
ion

Operation in
this area is
limited by R DS(on)
Ta = 25 C

Typical Transfer Characteristics

10 V
5 V

3.5 V

4 V
Pulse Test
3 V

2.5 V

I D (A)

10

Drain Current

I D (A)
Drain Current

DC

0.1 0.3 1
3
10 30 100
Drain to Source Voltage V DS (V)

Typical Output Characteristics


10

PW

0.3

10

V DS = 10 V
Pulse Test

Tc = 75 C

25 C

25 C

VGS = 2 V
0

2
4
6
Drain to Source Voltage

8
10
V DS (V)

1
2
3
Gate to Source Voltage

4
5
V GS (V)

2SJ526

Drain to Source Saturation Voltage


V DS(on) (V)

1.0

Pulse Test

0.8
I D = 5 A

0.6

0.4

Drain to Source On State Resistance


R DS(on) ( )

Drain to Source Saturation Voltage vs.


Gate to Source Voltage

Static Drain to Source on State Resistance


vs. Drain Current
1
0.5
VGS = 4 V

0.2
0.1

10 V

0.05

2 A
0.2

1 A

0.02
Pulse Test

0.01

4
8
12
Gate to Source Voltage

16
20
V GS (V)

Static Drain to Source on State Resistance


vs. Temperature
0.5
Pulse Test
0.4

0.3

0.2

I D = 5 A 2 A
V GS = 4 V

1 A
5 A
1, 2 A

0.1
10 V
0
40

0
40
80
120
160
Case Temperature Tc (C)

0.1

0.3

Drain Current

10

30

100

I D (A)

Forward Transfer Admittance vs.


Drain Current

Forward Transfer Admittance |y fs | (S)

Static Drain to Source on State Resistance


R DS(on) ( )

20
10
Ta = 25 C
5
25 C
2
75 C
1
0.5
0.1
0.1 0.2

V DS = 10 V
Pulse Test
0.5 1
2
5
Drain Current I D (A)

10

2SJ526
BodyDrain Diode Reverse
Recovery Time

2000

200
100
50

20

Ciss
500
200
100
50
20

di / dt = 50 A / s
VGS = 0, Ta = 25 C

10
0

40
V GS

60

80
100
0

8
V DS

12
V DD = 50 V
25 V
10 V

32
8
16
24
Gate Charge Qg (nc)

30

40

50

16
20
40

1000

Switching Time t (ns)

20

I D = 10 A

V GS (V)

V DD = 10 V
25 V
50 V

20

Switching Characteristics
0

Gate to Source Voltage

10

Drain to Source Voltage V DS (V)

Dynamic Input Characteristics


V DS (V)

Crss

Coss
10

5
0.1 0.2 0.5 1 2
5 10
Reverse Drain Current I DR (A)

Drain to Source Voltage

VGS = 0
f = 1 MHz

1000
Capacitance C (pF)

Reverse Recovery Time trr (ns)

500

Typical Capacitance vs.


Drain to Source Voltage

300

V GS = 10 V, V DD = 30 V
Pw = 5 s, duty < 1 %
t d(off)

100
30

tf
tr
t d(on)

10
3
1
0.1 0.2

0.5 1 2
5
Drain Current I D (A)

10

2SJ526
Maximum Avalanche Energy vs.
Channel Temperature Derating

Reverse Drain Current vs.


Source to Drain Voltage
Repetitive Avalanche Energy EAR (mJ)

Reverse Drain Current I DR (A)

10

6
10 V
V GS = 0, 5 V

5 V

2
Pulse Test
0

0.4

0.8

1.2

Source to Drain Voltage

1.6

2.0

20
I AP = 12 A
V DD = 25 V
duty < 0.1 %
Rg > 50

16

12

4
0
25

V SD (V)

50
75
100
125
150
Channel Temperature Tch (C)

Avalanche Test Circuit

V DS
Monitor

Avalanche Waveform
EAR =

1
2
L I AP
2

I AP
Monitor

VDSS
VDSS V DD

V (BR)DSS
I AP

Rg

D. U. T

V DS

VDD
ID

Vin
15 V

50
0

VDD

2SJ526
Normalized Transient Thermal Impedance vs. Pulse Width

Normalized Transient Thermal Impedance


s (t)

3
Tc = 25C
1

D=1
0.5

0.3
0.2

0.1

ch c(t) = s (t) ch c
ch c = 5.0C/W, Tc = 25C

0.1
0.05

PDM

0.02
1
0.0

0.03

D=

PW

uls

p
ot

0.01
10

1s

PW
T

100

1m

100 m

10 m
Pulse Width

Switching Time Test Circuit


Vout
Monitor

Vin Monitor

10

PW (S)

Waveform
Vin
10%

D.U.T.
RL

90%
Vin
10 V 50

V DD
= 30 V

90%

90%
Vout
td(on)

10%
tr

10%
td(off)

tf

2SJ526
Package Dimensions
Unit: mm

2.8 0.2
2.5 0.2

10.0 0.3
7.0 0.3

2.54 0.5

2.54 0.5

2.7

14.0 1.0

0.7 0.1

4.45 0.3
2.0 0.3
5.0 0.3

1.2 0.2
1.4 0.2

17.0 0.3

12.0 0.3

0.6

3.2 0.2

0.5 0.1
Hitachi Code TO220FM
SC72
EIAJ

JEDEC

Cautions
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copyright, trademark, or other intellectual property rights for information contained in this document.
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intellectual property rights, in connection with use of the information contained in this document.
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received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachis sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachis sales office for any questions regarding this document or Hitachi semiconductor
products.

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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.

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