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An Introduction to Surface Analysis by XPS and AES. John F. Watts and John Wolstenholme
Copyright 2003 John Wiley & Sons, Ltd. ISBNs: 0-470-84712-3 (HB); 0-470-84713-1 (PB)
An Introduction to Surface Analysis by XPS and AES. John F. Watts and John Wolstenholme
Copyright 2003 John Wiley & Sons, Ltd. ISBNs: 0-470-84712-3 (HB); 0-470-84713-1 (PB)
An Introduction to Surface Analysis by XPS and AES. John F. Watts and John Wolstenholme
Copyright 2003 John Wiley & Sons, Ltd. ISBNs: 0-470-84712-3 (HB); 0-470-84713-1 (PB)
An Introduction to Surface Analysis by XPS and AES. John F. Watts and John Wolstenholme
Copyright 2003 John Wiley & Sons, Ltd. ISBNs: 0-470-84712-3 (HB); 0-470-84713-1 (PB)
An Introduction to Surface Analysis by XPS and AES. John F. Watts and John Wolstenholme
Copyright 2003 John Wiley & Sons, Ltd. ISBNs: 0-470-84712-3 (HB); 0-470-84713-1 (PB)
Structure
AC
AEB Ti 1s
Ad
Vanadium
AC
AEB Ti Is
Ac*
Titanium
AEB Al 2p
AC
AEB Al 1s
Aa
Aluminium
A3 (hcp)
-0.1
-0.3
-0.4
-0.9
-1.1
-2.1
-0.6
Ti-l0Al
a2-DO19
-0.1
-0.2
0.0
-0.7
-1.0
-1.8
-0.6
Ti-20A1
Q2-DO19
+ 0.1
-0.1
-0.5
-0.7
-0.9
-2.1
-0.7
Ti-30Al
A2 (bcc)
+ 0.3
+ 0.2
+ 0.3
-0.3
-0.3
-0.5
Ti-50V
-0.1
-0.2
0.0
-0.2
-0.2
-0.3
-0.7
-1.0
-2.5
Ti-25V-5Al
B2 (bcc)
-0.1
-0.1
-0.5
-0.1
-0.1
-0.1
-0.6
-0.8
-2.0
Ti-20V-40Al
Table 5.1 Differences in core-level binding energies of Al, V and Ti, and initial and final state Auger parameters, for the alloy relative
to the pure metal; the negative sign indicates a decrease in the value for the alloy compared with the pure metal
An Introduction to Surface Analysis by XPS and AES. John F. Watts and John Wolstenholme
Copyright 2003 John Wiley & Sons, Ltd. ISBNs: 0-470-84712-3 (HB); 0-470-84713-1 (PB)
Energy
ions
ions
e
ions
ions
X-rays
Energy
All
Li on
All
3-10nm
He on
Mass
ions
ions
ions
laser
ions
ions
LAMMS
RBS
SIMS
(static)
SIMS
(dynamic)
SIMS
(imaging)
XPS
See text
All
Mass
ions
ions
ISS
<
C(E)
E, C
STD 1 mm2
small area:
10 um imaging
XPS: <3um
<
C(E)
'
s*
s
s
'
s
X
X
X
E
E, C
S
0
X
X'
X
'
E
E
E(C)
0
0*
s
50 nm
50 um
See text
All
Mass
Energy
Mass
Li on
3-10nm
<12nm
1 um
1 um
Depends
l0 nm
on foil
thickness
Outer
100 um
atom layer
0.5 um
1 um
1 mm
1 um
1.5 nm
1 um
Li on
Be on
Li on
Energy
Energy
Energy
e
X-ray
e
e
AES
EDX
EELS
Spatial
resolution
Depth of
analysis
Table 6.1
>
m
X
51
i
0
x
3
in
f\
70
8
2
TJ
ON
An Introduction to Surface Analysis by XPS and AES. John F. Watts and John Wolstenholme
Copyright 2003 John Wiley & Sons, Ltd. ISBNs: 0-470-84712-3 (HB); 0-470-84713-1 (PB)
An Introduction to Surface Analysis by XPS and AES. John F. Watts and John Wolstenholme
Copyright 2003 John Wiley & Sons, Ltd. ISBNs: 0-470-84712-3 (HB); 0-470-84713-1 (PB)
An Introduction to Surface Analysis by XPS and AES. John F. Watts and John Wolstenholme
Copyright 2003 John Wiley & Sons, Ltd. ISBNs: 0-470-84712-3 (HB); 0-470-84713-1 (PB)
An Introduction to Surface Analysis by XPS and AES. John F. Watts and John Wolstenholme
Copyright 2003 John Wiley & Sons, Ltd. ISBNs: 0-470-84712-3 (HB); 0-470-84713-1 (PB)