I nternational Journal Of Com putatio nal Engineering Res earch (ijceronline.com) Vol. 2 Iss ue.

IC TESTER USING 89s52

MICROCONTROLLER
1, Miss.M.A.Tarkunde,

2, Prof.Mrs.A.A.Shinde

1, M.Tech.S

tudent
1,2, Bharati vidyapeeth Deemed Univers ity College of Engineer ing
Pune,India
Abstrac t
An IC co ns titues area o f microelectronics in which many electro nic compo nents are combin ed in to h igh
density
modu les .ICs
, the main component of each and every electron ic circu it can be used for wide v ariety
of
purpos
es
and
fun ctio ns. IC co nsists of active and pass ive compo nents s uch as res istors, capacitors , transisto rs on s
ing leces
chsip
redu
izewhich
o f system, power cons umptio n an d cos t of overall s ystem. But s ometime d ue to fau lty ICs the
circuit
do
esnt
work. It is lot work to debug th e circu it an d confirm wheth er the circuiting is creating pro blem o r the IC is
faulty.
pro posSo
edthe
project is d es ign ed to confirm whether the IC u nder consid eration is properly working or
no t.ject
Th can
e prop
pro
be uos
sededto check the ICs of 74 s eries at g ate level.

I. Introduction
The basic fu nction of IC tes ter is to ch eck d igital IC for correct lo gical fun ction ing as described in the truth
table
i.e. it u sed
to test the variety of ICs wh ich co nsists of gates ,s equ en tial circuits ,co mb inational circuits.
Theapplied
inp ut signals
are
to the in put p ins of th e IC and output is measu red at the corres pondin g ou tput pin. In th e variou
svarious
systemsICs and compo nen ts are con nected to each other. Durin g the s ystem failure it is not p ossible to check
the
whit ole
circu
as it requires much time ,an d hig h cost. Therefore by ch eckin g on ly ICs and compo nen ts on th e chip
the failure
rate
can be reduced b y us ing the des igned p roject. Un like the Ic testers available in market ,this IC tes ter is
affo user
rdable
and
friendly. The 8 9s 52 microco ntroller is us ed in th is project with keyb oard an d LCD dis play un it. It
chec ks
the IC which is p laced in ZIF so cket and dis play the res ult. Testin g of IC is bas ed on the inputs
gates
in given
thattheprovided
to
gates in IC throug h the p rogramming.

Ii.Lite rature Surve y

The proposed p roject is us ed to check the digital ICs. Dig ital ICs are cons is ts of two typ es .
1.M icro con troller bas ed
2.PC based
The proposed pro ject checks on ly mic roco ntroller based ICs .Variou s ty pes o f microcontro llers are ava ilab
le in
the market
to
check
the correct fu nctionality of co mp onent and ICs s uch as
i.8051
ii.89c 205 1
iii.89s 52
DISADVANTAGES O F 8051
1.it gu lps power and so it h eats up.
2.it is no t CM OS compatib le,only TT L co mp atib le.
Disa dvantag e of 89c2051
1.it is 20 pin IC.
2.AS we are testin g 16/ 14 pin IC th is IC is n ot suffic ien t.
3.it
1.8K
ADVANTAGES
Endu
is
Bytes
norance:
t poss
of(online)
100
In-Sys
ibleOF
0to
Write/Eras
tem
interface
89sPro
52 grammab
MICROCONTRO
ekeybo
Cy cles
ard
le and
(ISP)dis
Flash
play.
LLER
Issn
2250-3005
NMemory
ov ember| 2012

Pa24
ge

I nternational Journal Of Com putatio nal Engineering Res earch (ijceronline.com) Vol. 2 Iss ue. 7

4.0V to 5.5V Operating Range

Fu lly Static Operation: 0 Hz to 33 MHz
Th ree-level Prog ram Memory Lo ck
256 x 8-b it Internal RAM
32 Prog rammable I/O Lines
Th ree 16-b it Timer/ Counters
Eig ht Interrupt Sources
Fu ll Dup le x UART Serial Channel
Lo w-po wer Idle an d Power-down Mo des
In terrupt Recovery fro m Power-down Mod e
Watchd og Timer
Dual Data Po inter
Po wer-off Flag

Iii.Block Diagram
Fig.1

Iv.Working
1.Power supply des ign
The basic s tep in the des ign ing of any system is to design the po wer s upp ly required for that s
ys tem.
FILTERING CAP

+ 12 V
C1
10 00 uF /2 5V
D5
1 N4 00 7

D6
1N 40 07

D7
1 N4 00 7

D8
1N 40 07

7805 REGULATOR REGULATED 5V

DC SUPPLY
U3
L M7 80 5C / TO 22 0

13

5V

IN O U T

C2
0. 1u F

C3
0 .1 uF

fo r th 500
rating
e 78mA.
05 The
is near
o utput
about
of the
7 v.transfo
Therefo
rmerer iswe12have
V AC.
us This
ed the
Actransfo
vo ltagermer
is conv
witherted
th einvo
to 12
WeDC
IC
ltag
V
circu
2.LCD
7hav
e it.
805
by
rating
dis
e used
that
Brid
pl ay
gives
230v
Regulator
ge rectifier
-10v
outp ut
and
v oltage
current
of
5V.The
min imu
member|
input voltage
Issn
2250-3005
(online)
N ov
2012 req uired
BRIDGE
RECTIFIER

Pa25
ge

I nternational Journal Of Com putatio nal Engineering Res earch (ijceronline.com) Vol. 2 Iss ue. 7

We hav e used 16* 2 LCD d isp lay which h as 8 data lin es an d 3 co ntrol lines.
The connectio ns of LCD are g iven blo w

3.Ke ypad
It h as 4 keys to s elect p roper IC wh ich we wan t to check.

Working of gate leve l testin g of IC

The test sequence for IC tes ting is as given below,
1. The ISP prog rammer is u sed to downlo ad the program in the microcontroller.
2. the pro ject is made us er friendly by interfac ing keypad and LCD.
3. The IC to be tes ted is in serted in the ZIF so cket . The user en ters the IC nu mb er
th rough
which is
s imukeypad
ltan eously
displayed o n the LCD.
4. The IC nu mb er is co mmunicated to microcontroller wh ich basically test the ICs for fe w
sets
f inptheutMCU
whichand
is g co
iven
thro ough
rres pond ing outp ut. The result is ag ain dis plays on the LCD.
5. If the IC tes ted is ok IC T EST ED OK is dis played on the LCD.Oth erwise IC T EST ED
FAILED is dis played.

V. Flow Chart

digital ICs
determined
This
data
canpaper
be
the tested
proposes
sig nals
byfro
an
justm
in writin
expensive
microgcon
theand
troller
s pecific
compact
are program
comodel
nditioned
o with
f d igital
and
out correspo
any
integrated
ch ange
nding
circuit
in ou
h tester
t
u sin

Vi.Conclus
ion
ardware.
pu
t 2250-3005
pins Depen
gare
89s52.Diffren
checked
ding upforon
t preIssn
(online)

N ov ember| 2012

Pa26
ge

I nternational Journal Of Com putatio nal Engineering Res earch (ijceronline.com) Vol. 2 Iss ue. 7

correctness The system that h as b een imple mented has s hown consid erable o utput that
matched by
ou sr requ
was ly 89s52.
achived
mall irment.this
and us er friend
.

Vii.Re fe re nce s
Electronics club ,IIT
1. Abhis hek Jain, Ans hu l Goyal ,Sidd harth Garg, Dig italIC tester
2. Fan g pang,CanadaA reconfig urab le digital IC tester imp lemented using ARM.
3. Ali F.Sha mmariDesign an d implementation of d igita lIC interface to IBM co mpatible co
mpu terScientific
journ
f
Kerb ala ,univers
ityalo
2010
4. www.scribd .co mdig ital IC Tes ter ieee.
5. Ko nemann,B Zwiehoff, G Much a J,Bu ilt in tes t fo r complex d igital IC.s olid state
circuit.
IEEE
15,is
su e jo
3 urnal ,volu me
6. K.R.Bo tkarIntegrated circu its,Khanna pub licatio n.
7. Ros han Borkar,As hvin Nak man, Dig ital In tegrated Circu it Tester,Don Bosco In stitute
of Techno
8.
On linelogy
teach,Mumbai.
ing labo ratory on embedded s ys tems,Microcontroller bas ed diod e and BJT
9. Dh ananjay v . GardeProg ramming an d customizin g the av r micro con trolle r,
10. On line teach ing labo ratory on embedded s ys tems,Microcontroller bas ed diod e and BJT
11. Dh ananjay v . GardeProg ramming an d customizin g the av r microcontroller
12. www.s ciencep rog.com
13. http ://extremeelectron ics .co.in /avr-tutorials

Issn 2250-3005 (online)

N ov ember| 2012

Kanp ur

tester
.2009
.2009
tester

Pa27
ge