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STATISTICAL METHODS
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S-S-04 (rev. 1)
Sampling Plans for the Inspection of Isolated Lots and Short Series of Lots
1.0
Scope
This specification establishes requirements for sampling inspection of isolated lots and short series of lots
of homogeneous measurement devices.
2.0
Authority
This specification is issued under the authority of section 19 of the Electricity and Gas Inspection
Regulations.
3.0
Normative References
3.1
ISO 2859-2:1985, Sampling procedures for inspection by attributes - Part 2: Sampling plans
indexed by limiting quality (LQ) for isolated lot inspection.
3.2
3.3
3.4
3.5
4.0
4.1
The requirements of ISO 2859-2 (reference 3.1), as modified by the clarifications and additions
described in Annex A, and as extended by the requirements in Annex B for a short series of lots, shall
apply, provided that the requirements of S-S-03 (reference 3.3) are satisfied in advance.
4.2
A lot submitted for sampling inspection shall consist of devices of the same make and model, with
the same metrological parameters, manufactured or reworked under uniform conditions and within a time
frame as specified in the devices specification (reference 3.5). Any additional requirements for lot
homogeneity shall be specified in the devices specification.
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4.3
A conforming unit for the purpose of the sampling plans shall be one for which the conformity
tests have demonstrated that the values of all specified performance quality characteristics are in
conformity with their specification requirements in accordance with the requirements of S-S-02 (reference
3.2), and all specified non-performance quality characteristics are in conformity with their device
specification requirements (reference 3.5). Any unit failing to meet these criteria shall be classified as a
nonconforming unit.
4.4
Quality records shall include the auditing parameters of the random sampling process and all
inspection results and calculations, corrected as applicable, used to determine lot acceptability.
5.0
Revision
Category:
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Alan E. Johnston
President
Category:
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Annex A (normative)
Modifications to ISO 2859-2:1985
This annex lists only the modifications or amendments to the referenced sections of ISO 2859-2:1985. All
remaining requirements apply as written in the standard.
A.1
A.2
Terminology
Nonconforming Unit
A device is a nonconforming unit if any performance or non-performance specification is not met as
defined in the device specification (reference 3.5) issued pursuant to section 18 of the Electricity and Gas
Inspection Regulations. Classification as a nonconforming unit takes precedence over classification as
marginally conforming unit.
Marginally Conforming Compressed Specification Limits (CSL)
The type 1 compressed specification limit (CSL) values determined from the devices performance
specification limits. The specification limits and CSL values are defined in the devices specification
(reference 3.5).
Marginally Conforming Unit
A device which has no nonconformity but exhibits performance falling outside the interval defined by the
lower and upper CSL values (type 1 marginally conforming) or has an MADT value exceeding an MADT
limit (type 2 marginally conforming), where classification as type 1 takes precedence over classification as
type 2.
Measure of Absolute Deviation from Target (MADT)
A measure of an individual devices conformity to target performance over its designed range of
operation, calculated as defined in the devices specification (reference 3.5).
Measurement Device
For the purposes of the standard, a device, or measurement device is an item and considered a meter.
Responsible Authority
For the purposes of the standard, Measurement Canada.
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A.4
Note: Refer to Bulletin S-01: Implementation Guide for the Application of Statistical Sampling
Requirements for guidance on the above sections. Organizations should provide appropriate procedures
to carry out the corrective action process; including response to events that could lead to cessation of
sampling and consequent requalification of the process.
(4) Where the quantities of marginally conforming units in the lot exceed the products of the
associated limiting quality (LQ) values and the lot size, recalibrate, dispose of, or replace
marginally conforming devices, so that the outgoing quantities of such devices do not exceed the
LQ value.
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(5) Whenever any nonconformity discovered during sampling inspection is due to noncompliance
with the devices notice of pattern approval, or the nonconformity or defect compromises, or may
potentially compromise measurement accuracy, meter integrity, or appropriate usage of the meter
and it is determined that the cause of the nonconformity or defect may potentially impact
additional meters of the same (or similar), makes, types, or models then the lot shall be rejected
and sampling inspection shall be suspended pending identification and correction of the cause.
The responsible authority shall be promptly notified of such an occurrence and the corrective
action proposed before sampling inspection continues.
Note: Regarding nonconformity or defect, the above clause does not apply when the cause of the defect
is determined to have occurred as a result of an isolated incident such as mishandling, extreme
environmental occurrences, or catastrophic damage. Furthermore, the above clause does not apply to
nonconformities which are the result of calibration errors not caused by a malfunction or defect, or the
result of errors due to the programming of incorrect data in user-programmable parameters or calibration.
A.5
Double or multiple sampling may be optionally used where the acceptance number for a given single
sampling plan exceeds zero. Details of these sampling plans are provided in the tables below.
Category:
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Table A.1 - Compatible Single, Double, and Multiple Sampling Plans for Type 1 Marginally
Conforming Units
Lot Size
N
Option 1: LQ = 3.15 %
Option 2: LQ = 8.0 %
Single
Double
Multiple
Single
Double
Multiple
n, Ac1, Re1
n, Ac1, Re1
n, Ac1, Re1
n, Ac1, Re1
n, Ac1, Re1
n, Ac1, Re1
Up to 25
use 100%
inspection
use 100%
inspection
use 100%
inspection
17, 0, 1
use Single
use Single
26 to 50
use 100%
inspection
use 100%
inspection
use 100%
inspection
22, 0, 1
use Single
use Single
51 to 90*
44, 0, 1
use Single
use Single
24, 0, 1
use Single
use Single
91 to 150
55, 0, 1
use Single
use Single
26, 0, 1
use Single
use Single
151 to 280
65, 0, 1
use Single
use Single
28, 0, 1
use Single
use Single
281 to 500
80, 0, 1
use Single
use Single
32, 0, 1
use Single
use Single
501 to 1200
125, 1, 2
80, 0, 2
80, 1, 2
use Double
50, 1, 2
32, 0, 2
32, 1, 2
use Double
1201 to 3200
125, 1, 2
80, 0, 2
80, 1, 2
use Double
80, 3, 4
50, 1, 4
50, 4, 5
20, no Ac1, 3
20, 0, 3
20, 1, 4
20, 2, 5
20, 4, 5
3201 to
10000
200, 3, 4
125, 1, 4
125, 4, 5
50, no Ac1, 3
50, 0, 3
50, 1, 4
50, 2, 5
50, 4, 5
125, 5, 6
80, 2, 5
80, 6, 7
32, no Ac1, 4
32, 1, 5
32, 2, 6
32, 4, 7
32, 6, 7
10001 to
35000
315, 5, 6
200, 2, 5
200, 6, 7
80, no Ac1, 4
80, 1, 5
80, 2, 6
80, 4, 7
80, 6, 7
200, 10, 11
125, 5, 9
125, 12, 13
50, 0, 5
50, 3, 8
50, 6, 10
50, 9, 12
50, 12, 13
Notes:
n
Ac1
Re1
no Ac1
*
Sample size
Acceptance number (maximum permissible type 1 marginally conforming units)
Rejection number (minimum impermissible type 1 marginally conforming units)
no Acceptance criteria (acceptance is not permitted for this sample size)
Refer to the Guideline document concerning sample size recommendation.
Where the sample size equals or exceeds the lot size, perform 100% inspection of the lot.
Ac = 0 for all nonconforming units.
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Table A.2 - Compatible Single, Double, and Multiple Sampling Plans for Type 2 Marginally
Conforming Units
Option 1: LQ = 20 %
Lot Size
N
Option 2: LQ = 20 %
Single
Double
Multiple
Single
Double
Multiple
n, Ac2, Re2
n, Ac2, Re2
n, Ac2, Re2
n, Ac2, Re2
n, Ac2, Re2
n, Ac2, Re2
Up to 25
use 100%
inspection
use 100%
inspection
use 100%
inspection
17, 1, 2
use Single
use Single
26 to 50
use 100%
inspection
use 100%
inspection
use 100%
inspection
22, 2, 3
use Single
use Single
51 to 90
44, 6, 7
use Single
use Single
24, 2, 3
use Single
use Single
91 to 150
55, 7, 8
use Single
use Single
26, 2, 3
use Single
use Single
151 to 280
65, 9, 10
use Single
use Single
28, 2, 3
use Single
use Single
281 to 500
80, 11, 12
use Single
use Single
32, 3, 4
use Single
use Single
501 to 1200
125, 19, 20
80, 11, 18
80, 22, 23
use Double
50, 6, 7
32, 3, 6
32, 7, 8
use Double
1201 to
3200
125, 19, 20
80, 11, 18
80, 22, 23
use Double
80, 11, 12
50, 5, 9
50, 14, 15
20, 1, 6
20, 3, 8
20, 6, 10
20, 10, 13
20, 13, 14
3201 to
10000
200, 32, 33
125, 17, 23
125, 40, 41
50, 5, 15
50, 10, 26
50, 20, 32
50, 31, 36
50, 37, 38
125, 19, 20
80, 11, 18
80, 22, 23
32, 2, 9
32, 7, 14
32, 11, 19
32, 18, 21
32, 22, 23
10001 to
35000
315, 53, 54
200, 28, 37
200, 69, 70
80, 9, 23
80, 17, 41
80, 34, 55
80, 49, 66
80, 67, 68
200, 32, 33
125, 17, 23
125, 40, 41
50, 5, 15
50, 10, 26
50, 20, 32
50, 31, 36
50, 37, 38
Notes:
n
Ac2
Re2
Sample size
Acceptance number (maximum permissible type 2 marginally conforming units)
Rejection number (minimum impermissible type 2 marginally conforming units)
Where the sample size equals or exceeds the lot size, perform 100% inspection of the lot.
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STATISTICAL METHODS
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Table A.3 - Compatible Single, Double, and Multiple Sampling Plans for Nonperformance
Nonconforming Units
Single
Double
Multiple
n, Ac3, Re3
n, Ac3, Re3
n, Ac3, Re3
Up to 25
use 100%
inspection
use 100%
inspection
use 100%
inspection
26 to 50
use 100%
inspection
use 100%
inspection
use 100%
inspection
51 to 90*
44, 0, 1
use Single
use Single
91 to 150
55, 0, 1
use Single
use Single
151 to 280
65, 0, 1
use Single
use Single
281 to 500
80, 0, 1
use Single
use Single
501 to 1200*
125, 1, 2
80, 0, 2
80, 1, 2
use Double
1201 to
3200*
125, 1, 2
80, 0, 2
80, 1, 2
use Double
3201 to
10000
200, 1, 2
125, 0, 2
125, 1, 2
use Double
10001 to
35000
315, 3, 4
200, 1, 4
200, 4, 5
80, no Ac3, 3
80, 0, 3
80, 1, 4
80, 2, 5
80, 4, 5
Notes:
n
Ac3
Re3
no Ac3
Sample size
Acceptance number (maximum permissible nonperformance nonconforming units)
Rejection number (minimum impermissible nonperformance nonconforming units)
no Acceptance criteria (acceptance is not permitted for this sample size)
Where the sample size equals or exceeds the lot size, perform 100% inspection of the lot.
Ac3 = 0 for nonperformance characteristics identified in sections A.4(3)(a) and A.4(5).
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Annex B (normative)
Extensions to ISO 2859-2:1985
This annex extends ISO 2859-2:1985 to address sampling inspection of short series of homogeneous
lots.
B.1
Scope
This annex specifies sampling by attributes plans for a short series of lots.
B.2
Conditions
The following conditions shall exist before these plans may be used for sampling inspection:
(a) production process quality is stable over the series of lots in the production run;
(b) the lots are submitted to inspection in the order of their production;
(c) the series of lots are homogeneous and no single lot can be generally considered to be
different than the rest of the lots in the series;
(d) the lots are relatively similar in size.
B.3
B.4
The requirements of Annex A A.4(1), A.4(2), A.4(3), and A.4(5) shall apply, with reference to the sampling
plans in Tables B.1, B.2 and B.3.
B.5
Implementation
B.5.1 The user shall select a sampling plan to be used for the series from the option 1 columns of
Tables B.1, B.2 and B.3. Optionally, for the inspection of device performance characteristics only, a
different sampling plan may be selected and used from the same columns, or from the option 2 columns
of the tables provided that annex A section 3(2) has been satisfied.
B.5.2 At the start or re-start of sampling inspection, lot acceptance shall be based on the observed
number of marginally conforming units (mCSL for type 1 and mMADT for type 2) and nonconforming units d
(dp for performance and dnp for nonperformance) in the sample, using two samples with sizes totalling n1
(where second sample is size n2) and combining those samples for the count of marginally conforming
and nonconforming units. The lot shall be accepted if mCSL Ac1, mMADT Ac2 , dnp Ac3 and dp = 0 and
non-accepted otherwise.
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B.5.3 From the second lot onwards following the start or re-start of sampling inspection, lot acceptance
shall be based on the cumulative numbers of marginally conforming units (mCSL for type 1 and mMADT for
type 2) and nonconforming units in the current sample (i) using sample size n2 and immediately preceding
sample (i 1) using sample size n2. The lot shall be accepted if (mi + m i 1 ) Ac1 (for mCSL), (mi + m i 1 )
Ac2 (for mMADT), (dnpi + dnp i 1 ) Ac3 (for nonperformance), and (dpi + dp i 1 ) = 0, and non-accepted
otherwise.
B.5.4 If resubmitted for inspection, non-accepted lots shall be presented for inspection under Annex
A.4(3): for the case of performance characteristics demonstrating nonconformities or marginal
conformities, screening inspection shall be for all of the devices performance characteristics; for the case
of non-performance characteristics demonstrating nonconformities, screening inspection shall be for the
nonconformities causing nonacceptance.
B.5.5 If, under screening inspection for performance characteristics, the number of marginally
conforming units in the lot exceeds the products of the associated limiting quality (LQ) values and the lot
size, recalibrate, dispose of, or replace marginally conforming devices, so that the outgoing quantities of
such devices do not exceed the LQ value.
B.5.6 Subject to B.5.4 and B.5.7(c), screening inspection shall continue for all of the applicable
characteristics of the devices in the next lot in the series.
B.5.7 Sampling inspection may be re-started for a given quality characteristic if the following criteria
have been satisfied, as applicable:
(a) No nonconformities have been found in the previously screened lot.
(b) The number of marginal nonconforming units in the previously screened lot do not exceed the
products of the associated LQ values and the lot size.
(c) Corrective action, including requalification of the production process where necessary, has
been implemented before production of the next lot.
B.5.8 In the event that lots are frequently non-accepted under LQ 8.0% then sampling inspection may
continue under LQ 3.15%. If that option is not viable, or frequent lot non-acceptance occurs under LQ
3.15%, or other conditions warrant then sampling shall be discontinued and corrective action
implemented. The process must be requalified in accordance with S-S-03 (reference 3.3) for sampling to
resume under either sampling option.
Note: Refer to S-01, Implementation Guide for the Application of Statistical Sampling Requirements for
guidance on the above sections. Refer to note under section A.4(3).
B.5.9 The above rules may be implemented so that they are applied separately to individual device
quality characteristics, leading to some characteristics being inspected under sampling inspection
whereas others are being 100% inspected.
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Table B.1 - Compatible Sampling Plans for Type 1 Marginally Conforming Units
Option 1: LQ = 3.15 %
Option 2: LQ = 8.0 %
80, 40, 0, 1
32, 16, 0, 1
125, 63, 1, 2
50, 25, 1, 2
200, 100, 3, 4
80, 40, 3, 4
315, 158, 5, 6
125, 63, 5, 6
Notes:
n
Ac1
Re1
Sample size
Acceptance number (maximum permissible type 1 marginally conforming units)
Rejection number (minimum impermissible type 1 marginally conforming units)
Where the sample size equals or exceeds the lot size, perform 100% inspection of the lot.
Ac = 0 for all performance nonconforming units.
Table B.2 - Compatible Sampling Plans for Type 2 Marginally Conforming Units
Option 1: LQ = 20 %
Option 2: LQ = 20 %
32, 16, 3, 4
50, 25, 6, 7
Notes:
n
Ac2
Re2
Sample size
Acceptance number (maximum permissible type 2 marginally conforming units)
Rejection number (minimum impermissible type 2 marginally conforming units)
Where the sample size equals or exceeds the lot size, perform 100% inspection of the lot.
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Option 2
80, 40, 0, 1
80, 40, 0, 1
125, 63, 1, 2*
125, 63, 1, 2*
200, 100, 1, 2
200, 100, 1, 2
315, 158, 3, 4
315, 158, 3, 4
Notes:
n
Ac3
Re3
Sample size
Acceptance number (maximum permissible nonperformance nonconforming units)
Rejection number (minimum impermissible nonperformance nonconforming units)