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4-30-2014 TCAD-SILVACO.ppt
April 30, 2014 Dr. Lynn Fuller, Professor
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OUTLINE
Introduction
Tips (Printing tonyplot)
Getting Started
Printing Deckbuild File
Deckbuild Example
Tonyplot for Example
Summary
References
Homework
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INTRODUCTION
SUPREM Stanford University PRocess Engineering Module, 1977
ATHENA is Silvaco, Incs. version of SUPREM. ATHENA is
normally used in conjunction with VWF Interactive tools. These
include DECKBUILD, TONYPLOT,DEVEDIT, MASKVIEWS and
OPTIMIZER. DECKBUILD provides an interactive run time
environment. TONYPLOT supplies scientific visualization
capabilities. DEVEDIT is an interactive tool for structure and mesh
specification and refinement, and MASKLVIEWS is an IC Layout
Editor. The OPTIMIZER supports black box optimizations across
multiple simulators. ATHENA is frequently used in conjunction
with ATLAS device simulator. ATHENA predicts the physical
structure that result from processing. These physical structures are
used as input by ATLAS, which then predicts the electrical
characteristics associated with specified bias conditions.
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GETTING STARTED
To get started you need to invoke the DECKBUILD application.
DECKBUILD will allow you to specify the process steps you want to
analyze.
(1,0)
(0,0)
X
Open terminal window (shell)
Type deckbuild
commands (RMC) select mesh define
(0,2) Y
commands select mesh initialize (LMC)
commands select process (RMC) deposit (LMC)
select parameters for nitride layer
commands select process (RMC) select implant (LMC)
select parameters for ion implant
tonyplot
quit
April 30, 2014 Dr. Lynn Fuller, Professor
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DECKBUILD EXAMPLE
go athena
#comment lines start with #
#near location 0m on the x line set grid approximately 0.1 m
#near location 1m on the x line set grid approximately 0.1 m
line x loc=0.00 space=0.1
line x loc=1.00 space=0.1
#near location 0m on the y line set grid approximately 0.01 m
#near location 2m on the y line set grid approximately 0.01 m
line y loc=0.00 space=0.01
line y loc=2.00 space=0.01
#
init silicon phosphorous resistivity=15 orientation=100
#change nitride thickness to investigate implant penetration
deposit nitride thick=0.30
# dual Pearson model is SIMS verified empirical model
implant boron dose=8.0e12 energy=100 tilt=0 \
rotation=0 crystal lat.ratio1=1.0 lat.ratio2=1.0
#
tonyplot
quit
April 30, 2014 Dr. Lynn Fuller, Professor
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2500 Nitride
3000 Nitride
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SUMMARY
Silvaco ATHENA (SUPREM) analysis allows for the calculation of
resultant impurity concentrations, layer thickness, and much more
for processes such as oxidation, diffusion, implantation and
deposition for temperatures above 800 C.
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y loc=0.0 spac=0.01
y loc=2.2 spac=0.01
y loc=3.5 spac=0.3
y loc=6.0 spac=0.5
Strip photoresist
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# ramp up from 800 to 1000c soak 50 min dry o2, ramp down to 800 n2
diff time=10 temp=800 t.final=1000 dryo2 press=1.0 hcl.pc=0
diff time=50 temp=1000 dryo2 press=1.0 hcl.pc=0
diff time=20 temp=1000 t.final=800 nitro press=1.0 hcl.pc=0
deposit oxynitride thick=0.01
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REFERENCES
1. Silicon Processing for the VLSI Era, Vol.2., Stanley Wolf
2. The Science and Engineering of Microelectronic Processing,
Stephen Campbell
3. Technology Modeling Associates, TMA-SUPREM-4, Instruction
Manual.
4. Silvaco Modeling, Inc.
5. MicroTec-3.03 release note of March 27, 1998 floppy-disk
contains a complete set of MicroTec-3.03 programs for 2D
semiconductor process and device simulation and the Manual in
Adobe Acrobat format. http://www.siborg.ca
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