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Research Paper
h i g h l i g h t s
This paper simulates the temperature rise test for substation connectors.
A one-dimensional reduction method based on the finite difference method is proposed.
It uses critical information of the three-dimensional geometry of the analyzed system.
Tests done in a laboratory corroborate the results of the proposed simulation method.
This simulation method can be extended to other power devices.
a r t i c l e
i n f o
Article history:
Received 26 April 2016
Revised 24 August 2016
Accepted 20 September 2016
Available online 22 September 2016
Keywords:
Thermal model
Finite difference
Simulation
Connector
Heat transfer
a b s t r a c t
This paper proposes a simple, fast and accurate simulation approach based on one-dimensional reduction
and the application of the finite difference method (FDM) to determine the temperatures rise in substation connectors. The method discretizes the studied three-dimensional geometry in a finite number of
one-dimensional elements or regions in which the energy rate balance is calculated. Although a onedimensional reduction is applied, to ensure the accuracy of the proposed transient method, it takes into
account the three-dimensional geometry of the analyzed system to determine for all analyzed elements
and at each time step different parameters such as the incremental resistance of each element or the
convective coefficient. The proposed approach allows fulfilling both accuracy and low computational
burden criteria, providing similar accuracy than the three-dimensional finite element method but with
much lower computational requirements. Experimental results conducted in a high-current laboratory
validate the accuracy and effectiveness of the proposed method and its usefulness to design substation
connectors and other power devices and components with an optimal thermal behavior.
2016 Elsevier Ltd. All rights reserved.
1. Introduction
During the last years, the finite element method (FEM) has been
widely applied to design electrical devices. Two- and threedimensional (2D and 3D) multiphysics FEM simulations are recognized as a realistic means to predict the electromagnetic and
thermal behavior of diverse type of electrical devices. Different
authors have struggled to develop coupled electromagneticthermal 2D- and 3D-FEM formulations to predict the thermal
behavior of diverse electrical components such as conductors,
bus bars, cables, connectors or semiconductors among others
[19]. Despite significant improvements in computer performance,
3D-FEM simulations are still time-consuming and memory-
Corresponding author.
E-mail address: riba@ee.upc.edu (J.-R. Riba).
http://dx.doi.org/10.1016/j.applthermaleng.2016.09.110
1359-4311/ 2016 Elsevier Ltd. All rights reserved.
563
Nomenclature
i = 1,2,. . .,I node index identifying the position along the x axis
j = 1,2,. . .,J time step index
cd
abbreviation of conductor
conn
abbreviation of connector
Dx
spatial step [m]
Dt
time step [s]
T
temperature [K]
Tji
temperature [K] at node iDx and time instant jDt
To
reference temperature, 293.15 K
Tcd,1
conductor temperature far from the connector [K]
air temperature far from the conductor [K]
Tair,1
Tfilm
film temperature [K]
Hsea
conductor elevation above sea level [m]
Q_
rate of energy with respect to time [W]
Dcd
outer diameter of the conductor [m]
Cp
specific heat [J/(kgK)]
k
coefficient of thermal conductivity [W/(mK)]
q
mass density [kg/m3]
qe
electrical resistivity [X m]
ae
temperature coefficient of the resistivity [1/K]
R
r
Ie
S
P
PDx
h
e
r
l
b
g
h
Lc
Nu
Pr
Gr
564
Boundary
condition
Conductor
Connector
Conductor
j+1
Tcd,
1 2
icd
icd-conn
iconn
iconn-cd
Boundary
condition
j+1
Tcd,
I-1 I
cd
FDM is based on replacing the partial derivatives by approximations using Taylor expansions near the discrete points of the geometry under study. The temperature calculation in each node is
based on the temperature of the two adjacent nodes, that is the
left-side and right-side nodes. Since three nodes are involved in
each calculation step, a three-diagonal matrix system of equations
can be generated. As a consequence, the TDMA (tri-diagonal matrix
algorithm) algorithm [28] is well-suited to solve this problem since
it allows calculating the temperatures in all nodes simultaneously.
A tridiagonal matrix corresponds to a system of equations given by,
j
j1
aij T j1
cij T j1
i1 bi T i
i1 di
T ij
b1
6
6 aj
6 2
6
6
6
6
6
4
cIj
j
b2
a3j
a1j
c2j
j
b3
aIj
.
Q
i-1
i
x
i+1
x
Fig. 2. Components of the rate of energy in a general element of the considered
domain.
j1
j1
ables T j1
1 ; T 2 ; . . . ; T I can be solved by applying the TDMA
algorithm.
multiplying T j1
i1 ; bi is the coefficient that agglutinates all the terms
j
multiplying T j1
i ; ci is the coefficient agglutinating all the terms
j
multiplying T j1
i1 ; whereas di is the coefficient that agglutinates
all the independent terms in (1).
2.2. Energy rate balance
To determine the actual temperature in all nodes of the
analyzed domain, the energy rate balance equation must be
applied to each node,
Q_ change Q_ input Q_ generation Q_ output Q_ consumption
Q_ [W] being the rate of energy with respect to time. Taking into
account the differential element shown in Fig. 2, (3) can be rewritten as,
Q_ change [W] being the rate of energy change within the considered
element, Q_ conduction left the rate of energy inputting the left side of
the considered element, Q_ generation the rate of energy generated and
Q_ conduction
where a1j 0 and cIj 0. Therefore once all coefficients aij ; bi ; cij and
j
di
.
Q
2 j1 3 2 j 3
T1
d1
7
7
7 6 j1 7 6
6
7 6 T 2 7 6 d2j 7
7 6
7 6 7
7 6
7 6 7
7 6
7 6 7
7 6
7 6 7
j
7 4
5 4 7
cI1
5
5
j1
j
j
T
d
I
I
bI
c1j
.
Q
I) at the j-th time step, t and aij ; bi ; cij and di the constant coefficients
in equation i-th. It is worth noting that superscript j refers to time
steps whereas subscript i is used for spatial steps. The system of
equation in all nodes can be represented in matrix form as,
.
Q
.
Q
right
right the rate of energy outputting the right side of considered element, Q_ conv ection the rate of convective cooling through the
outer surface and Q_ radiation the rate of radiative cooling.
8
j1
j
T T
>
>
Q_ change q S Cp i Dt i Dx
>
>
>
>
j
>
>
> Q_ generation I2 qe T i Dx
>
e
>
S
>
>
j1
j1
>
T T
< _
Q conduction left kT ij i Dx i1 S
>
j
j1
>
> Q_ conv ection hT i P T i T air Dx
>
>
>
4
>
4
>
>
Q_ radiation e r PT j1
>
i T air Dx
>
>
>
>
T j1
T ij1
: Q_
j
i1
S
conduction right kT
i
Dx
565
T air;1
i 1; . . . ; I
j
T 1j T cd;1
j
T Ij T cd;1
j
The temperature T cd;1
of the conductor very far apart from the
n
Dt
j1 4
4
I2e rT j1
cd;1 ecd r p Dcd T cd;1 T air
m Cp
o
j1
hcd T j1
cd;1 p Dcd T cd;1 T air
qair T j1
cd;1
0:5
D0:25
T j1
cd
cd;1 T air
0:25
11
Hsea [m] being the elevation of the conductor above sea level and
Tfilm is defined as,
j1
T j1
film T air T cd;1 =2
12
DRslice;k T j1
k1
where
num
slices
X
qe;conn T j1
k1
Dx
Sslice;k
13
14
qe,conn [X m] being the electrical resistivity of the connector material, ae,conn [1/K] the temperature coefficient of the resistivity and
To the reference temperature. Fig. 3 shows the slices obtained from
the 3D-CAD file of the analyzed connectors and the results from the
convex-hull algorithm.
2.5. Convective coefficient of the connector
htri k Nu=Lc
3:645
1 0:00367 T j1
film 273:15
hcd T j1
cd;1
where
DT
qair T j1
cd;1
Rconn T j1
T 1i
qair [kg/m3] being the air density, which can be calculated as,
10
15
566
Fig. 3. (a) CAD of the analyzed the T-type S285ZTLS connector. (b) Convex-hull envelopes of the T-type S285ZTLS connector after dividing the domain in different slices. (c)
CAD of two S285ZA4P23LS terminal connectors as usually joined. (d) Convex-hull envelopes of the S285ZA4P23LS terminal connectors after dividing the domain in different
slices.
Table 1
Nusselt number as a function of angle and Rayleigh number for horizontal cylinders.
Nu(h)
Ra
h = 0
30
60
90
120
150
180
102
101
100
101
102
103
104
105
106
107
0.48
0.70
0.93
1.34
2.06
3.03
4.50
6.76
10.23
15.50
0.47
0.70
0.92
1.32
2.05
3.02
4.7
6.72
10.16
15.39
0.46
0.69
0.90
1.28
1.99
2.96
4.39
6,58
9.95
15.08
0.46
0.68
0.86
1.20
1.88
2.83
4.23
6.35
9.59
14.57
0.43
0.68
0.82
1.11
1.70
2.59
3.94
5.95
9.04
13.77
0.45
0.67
0.79
1.03
1.48
2.17
3.30
5.10
7.84
12.07
0.45
0.67
0.78
1.00
1.38
1.88
2.57
3.50
4.85
6.88
h: angular coordinate measured from the bottom of the cylinders symmetry axis.
Ra Pr Gr
16
Pr
l Cp
k
17
Gr
g b q2 T s T air;1 L3c
l2
18
T film T air;1 T s =2
19
567
a1 0; b1 1; c1 0; d1 T j1
cd;1
8 j
>
a2 c2j kcd T 2j DSxcd
>
cd
>
>
>
>
j
j
j
Dxcd
S
Dx
>
>
< b2 qcd Scd Cpcd 2Dt 2 kcd T 2 Dxcd hcd T 2 Pcd 2cd
cd
q T j
>
j
>
d2 qcd Scd Cpcd D2xDcdt T 2j I2e e;cdS 2 Dx2cd
>
>
cd
>
>
>
>
4
:
j
Dxcd
hcd T 2 P cd T air 2 ecd r P cd T 2j T 4air Dx2cd
23
It is worth noting that TDMA does not accept temperatures
raised to the fourth power, therefore the radiation term applies
4
T 2j instead of T j1
2 .
Similarly for the penultimate node the coefficients in (1) are as
follows,
8 j
j
j
aI1 cI1
kcd T I1
DSxcd
>
>
cd
>
>
>
>
j
j
j
>
< bI1 qcd Scd Cpcd D2xDcdt 2 kcd T I1
DSxcd hcd T I1
Pcd Dx2cd
cd
20
T j1
cd;1 is the initial condition in the conductor, very far from the
q T
j
j
>
>
dI1 qcd Scd Cpcd D2xDcdt T I1
I2e e;cdS I1 Dx2cd
>
>
cd
>
>
>
:
4
j
j
Dxcd
T 4air Dx2cd
hcd T I1 Pcd T air 2 ecd r Pcd T I1
24
T j1
the other side of the conductor, T j1
I
cd;1 . The constant coeffi-
aI 0; bI 1; cI 0; dI T j1
cd;1
21
8
j1
j
T T
>
>
Q_ change qcd Scd Cpcd 2 Dt 2 Dx2cd
>
>
>
>
>
> _
q T j
>
>
Q generation I2e e;cdS 2 Dx2cd
>
>
cd
>
>
>
j1
j1
>
>
T T
< Q_
k T j 2 cd;1 S
conduction left
cd
Dxcd
cd
22
q T j
j
>
>
di qcd Scd Cpcd DDxcdt T ij I2e e;cdS i Dxcd
>
>
cd
>
>
>
4
:
j
hcd T i P cd T air Dxcd ecd r Pcd T ij T 4air Dxcd
26
Q
2
j
Coefficients aij ; bi and cij in (1) are calculated by grouping terms T j1
i1 ;
j
j1
j1
and T i1 , respectively, whereas coefficient di includes the
Ti
cd
j+1
Tcd_
1
25
8
>
aij cij kcd T ij DSxcd
>
>
cd
>
>
>
j
>
< bi qcd Scd Cpcd DDxtcd 2 kcd T ij DSxcd hcd T ij P cd Dxcd
cd
Dxcd
remaining terms,
j
Coefficients a2j ; b2 and c2j in (1) are calculated by grouping terms
j
j1
j1
j1
T 1 T cd;1 ; T 2 and T j1
3 , respectively, whereas coefficient d2
>
>
>
Q_ conv ection hcd T ij Pcd T j1
T air Dxcd
>
i
>
>
>
>
4
>
j
4
_
>
>
> Q radiations ecd r Pcd T i T air Dxcd
>
>
>
j1
j1
>
T T
: _
Q conduction right kcd T ij i1Dx i Scd
cd
>
>
Dxcd
>
Q_ conv ection hcd T 2j Pcd T j1
>
2 T air 2
>
>
>
>
4
>
>
>
Q_ radiation ecd r Pcd T 2j T 4air Dx2cd
>
>
>
>
j1
j1
>
T T
> _
:
Q conduction right kcd T 2j 3 Dx 2 Scd
8
j1
j
T i T i
_
>
>
> Q change qcd Scd Cpcd Dt Dxcd
>
>
>
>
q T j
> _
>
Q generation I2e e;cdS i Dxcd
>
>
cd
>
>
>
>
>
T ij1 T j1
j
< Q_
i1
Scd
conduction left kcd T
3
x/2
x/2
i-1
x/2
i
x
i+1
x/2
568
8
T j1 T j
T j1 T j
>
>
Q_ change qcd Scd Cpcd i Dt i D2x qconn Sconn Cpconn i Dt i D2x
>
>
>
j
>
>
q T j
q
T i Dx
>
> Q_ generation I2e e;cdS i D2x I2e e;conn
2
>
Sconn
cd
>
>
>
j1
j1
>
T
T
>
>
Q_ conduction left kcd T ij i Dx i1 Scd
>
>
>
>
< _
Q conv ection hcd T j Pcd T j1 T air Dx hconn T j P conn
i
>
>
T j1
T air D2x
>
i
>
>
>
4
>
>
>
Q_ radiation ecd r Pcd T ij T 4air D2x econn
>
>
>
>
>
j 4
4
Dx
>
>
> r Pconn T i T air 2
>
>
j1
j1
>
: _
T T
Q conduction right kconn T ij i1Dx i Sconn
Data input
Conductor: Dcd, cd, e,cd, Cpcd,cd,...
Connector: CAD-3D, conn, e,conn, Cpconn,conn,...
Air: , k, , ,...
x, t, tinitial, Tair,initial, Tcd,initial, Tconn,initial
PREPROCESSING
27
8 j
ai kcd T ij SDcdx
>
>
>
>
j
>
>
bi qcd Scd Cpcd 2DDxt qconn Sconn Cpconn 2DDxt kcd T ij
>
>
>
>
>
> Scd kconn T ij Sconn hcd T ij Pcd Dx hconn T ij Pconn Dx
>
2
2
Dx
Dx
>
>
>
> c j k T j Sconn
>
< i
conn
i
Dx
SOLVER
for j = 1:1:J
for i = 1:1:I
From (27), the constant coefficients in (1) for the conductorconnector contact node result in,
Determine:
T
e
P
>
conn
conn r
air
cd
cd
air
i
>
2
2
>
>
:
j 4
4
Pconn T i T air D2x
j
(Tij),
icd
icd-conn
i = 1:1:I
j = 1:1:J
e(Tij),
iconn
(Spatial iteration)
k(Tij),
Connector
Conductor
j+1
Tcd,
1
h(Tij),
(Temporal iteration)
(Tij), (Tij),...
Conductor
iconn-cd
cd
j+1
Tcd,
I-1 I
Tij
POSTPROCESSING
Data output
Plot: Tcd(t),Tconn(t),Tcd(x),Tconn(x), ...
28
Similarly, the constant coefficients in (1) for the connectorconductor contact are the same as in (28) except,
kcd T ij
29
Scd
Dx
Qradiation
Qradiation
Qconvection
Qgeneration
Qgeneration
Qconduction_right
Qconduction_left
x/2
conn cond
i+1
i
x
x/2
Qconduction_right
Qconduction_left
cond conn
i-1
Qconvection
i-1
a)
x/2
i+1
i
x
x/2
b)
Fig. 6. Energy rate balance in the intermediate conductor-connector and connector-conductor contact nodes.
569
400 V 50Hz
the test loop. The loop current was measured with a calibrated
Fluke i6000s-Flex Rogowski coil that has an uncertainty of 2%.
Temperature measurements were performed with 16 K-type thermocouples with a stainless steel sheath (AISI 316, 1 mm diameter)
placed on the surface of the conductors and connectors bodies.
The tolerance of these thermocouples is typically 2.2 C within
the 0275 C temperature interval once the temperature reading
is stabilized. A small hole was drilled in the connector body to
place the thermocouple, which was attached with thermal grease.
Thermocouples signals were acquired every 10 s by means of a
Tecnocat acquisition card.
Tables 2 and 3 summarize the values of the physical properties
considered in the simulations.
Table 4 shows the time- and spatial-steps considered in the
simulations performed as well as the duration of the simulations.
A time step of 50 s and a spatial step of 0.1 mm were selected after
carrying out a study of their values to fulfill both speed and accuracy criteria.
Figs. 9 compare the temperature evolution in the T-type connector and the conductor. Fig. 9a clearly shows that the temperature of the connector is always below than that of the reference
conductor, as required by the ANSI/NEMA CC1-2009 standard.
Fig. 9b displays the temperature profile along the whole geometry.
It shows that the connector tends to cool the conductor portion
closest to the connector, this effect being negligible at about 2 m
far from the connector.
Figs. 10 compare the temperature evolution in the terminal
connector and the conductor. Once again Fig. 10a shows that the
Transformer control /
Data acquisition
Test loop
Variable
transformer 0-400V
Power transformer
Current
400/10 V
measurement
a)
T-type
connector
Four-terminal
connector
b)
Fig. 8. Experimental setup. (a) Schematics of the experimental setup. (b) Test loop composed of an ACSS conductor, S285ZTLS T-connectors and S285ZA4P23LS terminal
connectors.
570
Table 2
Physical properties of the conductor.
440
Conductor
Value
Conductor type
Aluminum conductor mass
Steel conductor mass
Diameter of the conductor
Diameter of steel core
Aluminum thermal heat capacity, CpAl
Steel thermal heat capacity, Cpsteel
Conductor electrical resistivity, qe,20C
Temperature coefficient, acd
Aluminum thermal conductivity, kpAl
Steel thermal conductivity, kpsteel
GTACSR-464
559.8 kg/km
367 kg/km
20.47 mm
8.77 mm
534.6 J/(m K)
174.7 J/(m K)
4.46 108 m
0.0041 1/K
229 W/(m K)
43 W/(m K)
420
Temperature (K)
Variable
400
380
Connector
360
340
Conductor. Simulation
Connector. Simulation
Conductor. Experimental
Connector. Experimental
320
300
0
Table 3
Physical properties of the connector.
2000
4000
6000
8000
10000
Time (s)
Value
Aluminum alloy
Aluminum mass density
Aluminum thermal heat capacity, CpAl
Aluminum thermal conductivity, kpAl
Connector thermal emissivity, e
Connector electrical resistivity, qe
Temperature coefficient, acd
Contact resistance factora
A356.0
2700 kg/m3
534.6 J/(m K)
229 W/(m K)
0.45
4.5 108 m
0.004 1/K
2
a
Based on measurements, it is known that the contact resistance is 2 times
higher than the theoretical connector resistance.
440
conductor
Value
50 s
9000 s
0.1 mm
conductor
t = 9000 s
400
Table 4
Calculation parameters of the simulation.
Variable
connector
a)
420
Temperature (T,K)
Variable
t = 2250 s
380
t = 1750 s
360
t = 1250 s
340
t = 750 s
320
t = 250 s
300
t=0s
280
0
Position (x, m)
10
b)
3.5
Conductor
Connector
3.0
2.5
2.0
1.5
1.0
0.5
0.0
0
2000
4000
6000
Time (s)
8000
10000
12000
c)
Fig. 9. (a) Experimental data and FDM-based simulation results of the temperature
rise for both the conductor (Tcd,1) and the T-type S285ZTLS connector (center
point). (b) Simulated temperature profile evolution with time. (c) Temperature
difference evolution between experimental and simulated data for the S285ZTLS
connector and its reference conductor. The average relative temperature difference
is 2.33% for the connector and 1.09% for the conductor.
4. Conclusion
The finite element method is a widely-used tool to design electrical devices from both electromagnetic and thermal points of
view. Due to the complex three-dimensional shape of substation
connectors, three-dimensional FEM simulations are required
which regardless of significant improvements in computer performance, are still very computationally-intensive and time-
571
550
440
CONDUCTOR
Conductor
400
380
Connector
360
340
Conductor. Simulation
Connector. Simulation
Conductor. Experimental
Connector. Experimental
320
300
Experimental
FEM
500
Temperature (K)
Temperature (K)
420
FDM
450
400
BIMETALLIC CONNECTOR
Experimental
350
FDM
FEM
300
0
2000
4000
6000
8000
10000
Time (s)
440
conductor
connector
Temperature (T,K)
t = 2250 s
380
t = 1750 s
360
t = 1250 s
340
t = 750 s
320
t = 250 s
300
t=0s
280
2
Position (x, m)
10
b)
2.0
Conductor
Connector
1.5
40
60
80
100
Time (s)
t = 9000 s
400
20
conductor
420
a)
calculate at each time step for all analyzed surface points different
parameters such as the convective coefficient of each element or
the incremental resistance. It has been proved that accuracy is
comparable to that attained with the 3D-FEM approach but with
much less computational requirements and time involved in
preparing the 3D geometries, generating the 3D mesh, or settling
the boundary conditions. Experimental results conducted in a laboratory have validated the accuracy of the proposed method and
its effectiveness to assist the design process of substation connectors and other power devices and components.
Acknowledgements
The authors would like to thank SBI-Connectors Spain that supported this study by provisioning the samples and the equipment
required for the experimental tests. They also thank the Spanish
Ministry of Economy and Competitiveness for the financial support
received under contract RTC-2014-2862-3.
References
1.0
0.5
0.0
2000
4000
Time (s)
6000
8000
c)
Fig. 10. (a) Experimental data and FDM-based simulation results of the temperature rise for both the conductor (Tcd,1) and the S285ZA4P23LS terminal connector
(center point). (b) Simulated temperature profile evolution with time. (c) Temperature difference evolution between experimental and simulated data for the
S285A4P23LS connector and its reference conductor. The average relative temperature difference is 0.42% for the connector and 1.15% for the conductor.
The proposed transient method discretizes the original threedimensional geometry into small one-dimensional elements in
which the energy rate balance equation is applied. To improve
the accuracy, the proposed one-dimensional method retains
three-dimensional information of the original geometry to
572
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