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Профессиональный Документы
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PIs
Flip-flops
Combinational
Circuit
PPOs
POs
Scan-out
Response
Good-circuit
response
Output
Response
Good?
Scan-in
Pattern
Input
Pattern
ATE
IC
pttn 1
pttn 2
pttn n
fault lists
........
Test Cube = 1 X X X 0 1 X X 1 0
1
0
1
1
0
1
0
0
0
1
0
0
1
0
1
1
0
1
0
0
1
0
1
1
1
1
0
0
0
0
1
1
0
0
1
1
1
1
0
0
0
1
1
0
1
0
0
0
1
0
0
1
0
1
1
1
1
0
1
1
0
1
1
1
0
1
0
0
1
0
0
1
1
0
1
1
0
1
1
1
Scan Chains
Output Compactor
2N-1
1 pin
Scan
Input
MUX
Data
Input
Decoder
Output
Scan
Output
Data Input