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Fabio Campi
Davide Pandini
Tobias Bjerregaard
Mikkel Stensgaard
ST Microelectronics
Central Cad & Design Solutions
Agrate Brianza, Italy
Teklatech
Copenhagen, Denmark
INTRODUCTION
Digital power rail noise poses increasingly severe
challenges in the design of ICs using advanced submicron technologies. Dynamic voltage drops on power
supply lines may lead to insurgence of non-systematic
timing errors (soft failures), unpredictable performance
degradation, unexpected clock jittering phenomena and
excessive power consumption due to degradation of
slew rates. Moreover, Electro-Magnetic Compatibility
(EMC) is a growing concern, especially in the segments
of automotive, wireless and highly integrated mobile
applications, where the certification for a given ElectroMagnetic Interference (EMI) class may well determine
the success of a given IC product.
Current EDA design methodologies for ensuring power
integrity and EMI compliancy in digital designs tend to
focus on the sign-off phase, where detailed power rail
Synthesis
Placement
FloorDirector
CTS
Routing
2010 ST Microelectronics / Teklatech A Power Shaping Methodology for Supply Noise and EMI Reduction
www.teklatech.com
maximum power shaping flexibility. FloorDirectors
front-end-level current profile analysis provides good
correlation with post-layout results, and as such
furthermore aids in bridging the front-end to back-end
design optimization gap.
REFERENCE DESIGN
The proposed methodology is applied to an automotiveoriented, multi-processor IC reference design. The
design is composed of two Leon processor cores, a
system bus, 64K internal SRAM and a set of IO
peripherals. The design was synthesized for CMOS090,
4 Metal STMicroelectronics technology, optimized
using FloorDirector, laid-out using a Cadence
Encounter P&R flow, and signed-off using a StartRC /
PrimeTime timing extraction and analysis, and Apache
Redhawk dynamic power grid analysis. Figure 2 shows
the layout of the reference design. The total chip area
was 3.12mm2 and the total power consumption was
45.9mW@100MHz in the baseline implementation.
Reference Vdd supply voltage is 1.2V.
In order to comparatively evaluate the impact of the
proposed design methodology on voltage drop and
EMI, several backend implementations were made. The
first implementation was a standard baseline approach,
without applying specific measures for noise reduction.
The second applied DPS using FloorDirector.
Conducted noise emissions of an IC are measured as
the harmonic content of the current signature at the
device supply pins or board-level EMI measurement
pins. After layout, dynamic current profiles and
dynamic voltage drop (DVD) were analyzed, and a
conducted EMI spectrum was extracted. Figure 3 shows
the full chip-package-board modeling environment used
to perform sign-off analysis.
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Figure 5: Power shaping induces evident smoothing of the dynamic cell current demand,
leading to a 55% reduction of the current peak and a significant softening of the slope.
2010 ST Microelectronics / Teklatech A Power Shaping Methodology for Supply Noise and EMI Reduction
www.teklatech.com
Figure 7: Frequency domain analysis of the voltage at the EMI measurement pin
and noise levels in dBV at even harmonics of the clock frequency.
2010 ST Microelectronics / Teklatech A Power Shaping Methodology for Supply Noise and EMI Reduction