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Encounter Test: Reference: Messages

Product Version 15.12


October 2015
20032015 Cadence Design Systems, Inc. All rights reserved.
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Encounter Test: Reference: Messages

Contents
Preface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Typographic and Syntax Conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Encounter Test Documentation Roadmap . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Getting Help for Encounter Test and Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Contacting Customer Service . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Encounter Test And Diagnostics Licenses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Using Encounter Test Contrib Scripts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
What We Changed for This Edition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Revisions for Version 15.10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Revisions for Version 15.11 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Revisions for Version 15.12 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28

1
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Interactive and Background Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Message Severity Codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Message Return Codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Extended Message Help . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35

2
C5C - Audit Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
C5CCS-001 through C5CCS-003 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37

3
CMD - Core Migration Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
CMD-001 through CMD-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39

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1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages

4
DFTS - Design for Test Synthesis Messages . . . . . . . . . . . . . . . . . 43
DFTS-001 through DFTS-025 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
DFTS-100 through DFTS-300 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
DFTS-400 through DFTS-812 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48

5
EDAM - Extended Direct Access Method Messages. . . . . . . . . 55
EDAM-001 through EDAM-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55
EDAM-051 through EDAM-0160 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65

6
FW - Graphical User Interface Framework Messages . . . . . . . 75
FW-001 through FW-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
FW-051 through FW-100 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 87

7
TBD - Generate Test Pattern Data Messages . . . . . . . . . . . . . . . . 97
TBD-001 through TBD-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 97
TBD-051 through TBD-100 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
TBD-101 through TBD-230 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122
TBD-231 through TBD-999 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 133

8
TBM - Test Pattern Manipulation Messages. . . . . . . . . . . . . . . . . . 167
TBM-001 through TBM-030 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 167
TBM-031 through TBM-999 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175

9
TBV - RPCT Boundary Scan Verification Messages . . . . . . . . 203
TBV-210 through TBV-360 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 203
TBV-410 through TBV-999 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 217

October 2015 4 Product Version 15.12


1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages

10
TBX - Extension Language Messages . . . . . . . . . . . . . . . . . . . . . . . . 225
TBX-001 through TBX-050 .............................................. 225
TBX-051 through TBX-119 .............................................. 237
TBX-120 through TBX-174 .............................................. 248
TBX-175 through TBX-219 .............................................. 261
TBX-220 through TBX-481 .............................................. 272

11
TCC - Random Pattern Generation Messages . . . . . . . . . . . . . . 307
TCC-001 through TCC-116 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 307

12
TCE- Domain Constraint Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . 313
TCE-400 through TCE-450 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 313

13
TCI - Structure Analysis Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . 321
TCI-001 through TCI-002 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 321

14
TCL - High Speed Scan Based Simulation Messages . . . . . . 323
TCL-001 through TCL-049 ............................................... 323
TCL-052 through TCL-096 ............................................... 330
TCL-150 through TCL-198 ............................................... 339
TCL-200 through TCL-520 ............................................... 352
TCL-622 through TCL-999 ............................................... 363

15
TCT - Test Data Core Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 373
TCT-001 through TCT-108 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 373
TCT-110 through TCT-580 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 381

October 2015 5 Product Version 15.12


1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages

16
TCW - Stand Alone Random Pattern Simulation Messages . .
391
TCW-001 through TCW-030 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 391
TCW-031 through TCW-055 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 395

17
TDA - General Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 401
TDA-001 through TDA-222 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 401

18
TDC - Design Constraint Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . 411
TDC-001 through TDC-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 411
TDC-051 through TDC-301 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 415

19
TDG - Diagnostic Simulation Messages . . . . . . . . . . . . . . . . . . . . . . 423
TDG-001 through TDG-043 .............................................. 423
TDG-096 through TDG-150 .............................................. 445
TDG-151 through TDG-200 .............................................. 460
TDG-201 through TDG-250 .............................................. 472
TDG-254 through TDG-300 .............................................. 488
TDG-301 through TDG-350 .............................................. 496
TDG-351 through TDG-400 .............................................. 505
TDG-401 through TDG-502 .............................................. 515
TDG-503 through TDG-999 .............................................. 528

20
TDL - True-Time Test Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 553
TDL-001 through TDL-230 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 553
TDL-240 through TDL-301 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 561

October 2015 6 Product Version 15.12


1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages

21
TDM - Delay Model Build Messages . . . . . . . . . . . . . . . . . . . . . . . . . . 565
TDM-001 through TDM-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 565
TDM-051 through TDM-200 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 580
TDM-201 through TDM-317 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 589

22
TDR - Tester Description Rule Messages . . . . . . . . . . . . . . . . . . . . 599
TDR-002 through TDR-600 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 599
TDR-601 through TDR-683 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 612

23
TDS - Convert Vectors To Smartscan Messages . . . . . . . . . . . . 625
TDS-001 - TDS-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 625

24
TDY - Delay Simulation Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . 659
TDY-001 through TDY-071 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 659

25
TDX - Dynamic Test Generation Messages . . . . . . . . . . . . . . . . . . 671
TDX-001 through TDX-049 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 671

26
TEI - Build Model Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 681
TEI-001 through TEI-050 ................................................ 681
TEI-051 through TEI-145 ................................................ 692
TEI-154 through TEI-220 ................................................ 709
TEI-221 through TEI-279 ................................................ 730
TEI-280 through TEI-800 ................................................ 748
TEI-801 through TEI-999 ................................................ 760

October 2015 7 Product Version 15.12


1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages

27
TFA - Deterministic Fault Analysis Messages . . . . . . . . . . . . . . . . 767
TFA-001 through TFA-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 767
TFA-051 through TFA-089 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 782

28
TEM - Insert Embedded Test Messages. . . . . . . . . . . . . . . . . . . . . . 793
TEM-039 through TEM-100 .............................................. 793
TEM-110 through TEM-250 .............................................. 810
TEM-251 through TEM-328 .............................................. 818
TEM-341 through TEM-378 .............................................. 830
TEM-400 through TEM-450 .............................................. 842
TEM-451 through TEM-700 .............................................. 855
TEM-701 through TEM-749 .............................................. 882
TEM-752 through TEM-799 .............................................. 886
TEM-801 through TEM-850 .............................................. 890
TEM-851 through TEM-900 .............................................. 908
TEM-902 through TEM-999 .............................................. 926

29
TFL - Failure Data Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 937
TFL-001 through TFL-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 937
TFL-051 through TFL-100 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 951
TFL-101 through TFL-150 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 965
TFL-151 through TFL-299 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 979
TFL-300 through TFL-999 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1003

30
TFM - Fault Model Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1015
TFM-002 through TFM-050 ............................................. 1015
TFM-051 through TFM-100 ............................................. 1031
TFM-101 through TFM-155 ............................................. 1044
TFM-376 through TFM-999 ............................................. 1056

October 2015 8 Product Version 15.12


1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages

31
TFS - Test Simulation Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1077
TFS-001 through TFS-454 .............................................. 1077
TFS-500 through TFS-600 .............................................. 1087
TFS-602 through TFS-850 .............................................. 1093
TFS-851 through TFS-936 .............................................. 1106

32
TFW - Encounter Test Framework Utilities Messages . . . . . 1117
TFW-001 through TFW-050 ............................................. 1117
TFW-051 through TFW-100 ............................................. 1127
TFW-101 through TFW-289 ............................................. 1135
TFW-600 through TFW-999 ............................................. 1144

33
TGD - GlobalData Audit Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . 1157
TGD-001 through TGD-110 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1157
TGD-111 through TGD-161 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1164

34
TGI - RPCT Boundary Scan Interconnect Test Messages 1171
TGI-100 through TGI-889 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1171

35
TGR - Test Simulation and Manipulate Tests Messages . . 1177
TGR-006 through TGR-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1177
TGR-052 through TGR-100 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1185
TGR-101 through TGR-342 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1191

36
THT - Hierarchical Core Test System Messages . . . . . . . . . . . 1199
THT-001 through THT-599 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1199

October 2015 9 Product Version 15.12


1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages

THT-600 through THT-999 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1205

37
THM - Hierarchical Model Messages . . . . . . . . . . . . . . . . . . . . . . . . 1209
THM-002 through THM-430 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1209
THM-431 through THM-524 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1218
THM-806 through THM-899 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1226

38
TID - Electronic Chip ID Test Generation Messages . . . . . . . 1235
TID-001 through TID-300 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1235

39
TIE - Import EVCD Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1243
TIE-001 through TIE-999 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1243

40
TIM - Import Test Pattern Data Messages . . . . . . . . . . . . . . . . . . . 1251
TIM-001 through TIM-050 .............................................. 1251
TIM-051 through TIM-088 .............................................. 1261
TIM-402 through TIM-500 .............................................. 1274
TIM-501 through TIM-999 .............................................. 1287

41
TIS - Import STIL Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1299
TIS-001 through TIS-052 ............................................... 1299
TIS-400 through TIS-450 ............................................... 1312
TIS-451 through TIS-499 ............................................... 1327
TIS-801 through TIS-999 ............................................... 1344

October 2015 10 Product Version 15.12


1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages

42
TJA - Write BSDL Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1351
TJA-103 through TJA-653 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1351

43
TJB - Parse BSDL Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1363
TJB-100 through TJB-250 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1363
TJB-251 through TJB-300 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1382
TJB-301 through TJB-900 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1395

44
TJC - IEEE 1149.1 Boundary Scan Verification Messages 1415
TJC-102 through TJC-200 .............................................. 1415
TJC-201 through TJC-300 .............................................. 1429
TJC-301 through TJC-351 .............................................. 1438
TJC-500 through TJC-531 .............................................. 1452
TFK-100 through TFK-101 .............................................. 1458

45
TLD - Signature-Based Test Messages . . . . . . . . . . . . . . . . . . . . . . 1459
TLD-001 through TLD-999 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1459

46
TJM - IEEE 1149.1 Boundary Scan Chain Test Mode Define
Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1463
TJM-100 through TJM-105 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1463

47
TLH - Linehold Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1465
TLH-001 through TLH-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1465
TLH-051 through TLH-999 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1482

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48
TLM - Logic Model Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1489
TLM-001 through TLM-050 ............................................. 1489
TLM-051 through TLM-150 ............................................. 1501
TLM-152 through TLM-193 ............................................. 1517
TLM-201 through TLM-999 ............................................. 1526

49
TLP - Low Power Messages. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1535
TLP-100 through TLP-700 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1535

50
TLS - Logic Model Smart Scan Messages . . . . . . . . . . . . . . . . . . 1557
TLS-001 - TLS-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1557

51
TMD - Manufacturing Release Data Messages . . . . . . . . . . . . . 1571
TMD-001 through TMD-100 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1571

52
TMI - Verify Macro Isolation Messages . . . . . . . . . . . . . . . . . . . . . . 1583
TMI-001 through TMI-050 .............................................. 1583
TMI-051 through TMI-088 .............................................. 1596
TMI-101 through TMI-150 .............................................. 1603
TMI-151 through TMI-200 .............................................. 1621
TMI-201 through TMI-250 .............................................. 1630
TMI-251 through TMI-392 .............................................. 1642
TMI-420 through TMI-800 .............................................. 1652

53
TMT - Create MacroTests Messages . . . . . . . . . . . . . . . . . . . . . . . . 1659
TMT-001 through TMT-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1659

October 2015 12 Product Version 15.12


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Encounter Test: Reference: Messages

TMT-051 through TMT-306 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1664


TMT-400 through TMT-521 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1672

54
TND - Good Machine Delay Simulation Messages . . . . . . . . . 1683
TND-001 through TND-600 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1683
TND-601 through TND-799 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1692
TND-800 through TND-936 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1700

55
TNP - Delay Timing Messages. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1713
TNP-011 through TNP-099 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1713

56
TNS - Netname Services Messages . . . . . . . . . . . . . . . . . . . . . . . . . 1715
TNS-001 through TNS-042 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1715

57
TOM - Objective Model Build and Access Messages . . . . . . 1727
TOM-001 through TOM-072 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1727
TOM-100 through TOM-722 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1739

58
TPC - Parallel Processing Communications Messages . . . 1747
TPC-001 through TPC-005 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1747

59
TPD - Test Pattern Display Messages . . . . . . . . . . . . . . . . . . . . . . . 1753
TPD-100 through TPD-900 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1753

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Encounter Test: Reference: Messages

60
TPL - Pipeline Verification Messages . . . . . . . . . . . . . . . . . . . . . . . . 1759
TPL-001 through TPL-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1759
TPL-060 through TPL-296 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1770

61
TPO - Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1781
TPO-001 through TPO-099 ............................................. 1781
TPO-100 through TPO-199 ............................................. 1796
TPO-200 through TPO-299 ............................................. 1800
TPO-300 through TPO-399 ............................................. 1806
TPO-400 through TPO-499 ............................................. 1811
TPO-500 through TPO-599 ............................................. 1816
TPO-600 through TPO-699 ............................................. 1820
TPO-700 through TPO-799 ............................................. 1828
TPO-800 through TPO-899 ............................................. 1857
TPO-900 through TPO-999 ............................................. 1880

62
TPT - Path Test Analysis Messages . . . . . . . . . . . . . . . . . . . . . . . . . . 1907
TPT-001 through TPT-317 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1907

63
TPU - Test Pattern Utility Messages. . . . . . . . . . . . . . . . . . . . . . . . . . 1915
TPU-002 through TPU-972 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1915

64
TRA - Random Resistant Fault Analysis Messages . . . . . . . . 1923
TRA-001 through TRA-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1923
TRA-051 through TRA-600 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1935

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Encounter Test: Reference: Messages

65
TSM - Simulation Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1949
TSM-003 through TSM-900 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1949

66
TSC - Test Sequence Effectiveness Checker Messages . . 1955
TSC-001 through TSC-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1955
TSC-061 through TSC-130 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1964

67
TSR - Scan and LSSD Flush Test Messages . . . . . . . . . . . . . . . 1975
TSR-001 through TSR-360 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1975

68
TSS - Signature Observation Sequence Messages . . . . . . . . 1983
TSS-001 through TSS-117 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1983

69
TST - Sequential Stored Pattern Test Generation Messages .
1993
TST-001 through TST-405 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1993

70
TSU - Segment/Symbol Utilities Messages . . . . . . . . . . . . . . . . . 1999
TSU-001 through TSU-200 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1999

71
TSV- Test Structure Verification Messages . . . . . . . . . . . . . . . . . . 2005
TSV-001 through TSV-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2005
TSV-051 through TSV-099 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2046
TSV-101 through TSV-150 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2077

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Encounter Test: Reference: Messages

TSV-151 through TSV-194 .............................................. 2093


TSV-201 through TSV-250 .............................................. 2102
TSV-251 through TSV-296 .............................................. 2128
TSV-305 through TSV-350 .............................................. 2148
TSV-351 through TSV-400 .............................................. 2168
TSV-401 through TSV-596 .............................................. 2190
TSV-900 through TSV-999 .............................................. 2199

72
TSY - Test Synthesis Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2207
TSY-001 through TSY-050 .............................................. 2207
TSY-051 through TSY-105 .............................................. 2219
TSY-200 through TSY-266 .............................................. 2224
TSY-300 through TSY-390 .............................................. 2243
TSY-400 through TSY-450 .............................................. 2254
TSY-451 through TSY-500 .............................................. 2264
TSY-501 through TSY-550 .............................................. 2277
TSY-551 through TSY-600 .............................................. 2293
TSY-601 through TSY-700 .............................................. 2298
TSY-701 through TSY-921 .............................................. 2314

73
TTA - Testability Measurements Messages . . . . . . . . . . . . . . . . . 2335
TTA-001 through TTA-038 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2335

74
TTC - Test Generation Controller Messages . . . . . . . . . . . . . . . . 2341
TTC-001 through TTC-050 ............................................. 2341
TTC-051 through TTC-100 ............................................. 2356
TTC-102 through TTC-145 ............................................. 2364
TTC-151 through TTC-402 ............................................. 2376

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Encounter Test: Reference: Messages

75
TTM - Test Mode Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2389
TTM-001 through TTM-050 ............................................. 2389
TTM-051 through TTM-124 ............................................. 2401
TTM-267 through TTM-300 ............................................. 2420
TTM-301 through TTM-350 ............................................. 2435
TTM-351 through TTM-400 ............................................. 2449
TTM-401 through TTM-450 ............................................. 2466
TTM-451 through TTM-500 ............................................. 2479
TTM-501 through TTM-550 ............................................. 2496
TTM-551 through TTM-600 ............................................. 2507
TTM-601 through TTM-699 ............................................. 2520
TTM-700 through TTM-750 ............................................. 2538
TTM-751 through TTM-999 ............................................. 2557

76
TTU - Timing Utility Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2577
TTU-001 through TTU-031 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2577
TTU-100 through TTU-140 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2581
TTU-200 through TTU-907 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2590

77
TTV - Test View Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2601
TTV-005 through TTV-050 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2601
TTV-051 through TTV-083 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2612

78
TUI - User Interface Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2623
TUI-022 through TUI-999 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2623

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Encounter Test: Reference: Messages

79
TVC - Create Vector Correspondence Messages . . . . . . . . . . 2651
TVC-001 through TVC-802 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2651

80
TVE - Vector Export Messages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2657
TVE-001 through TVE-150 ............................................. 2657
TVE-151 through TVE-251 ............................................. 2666
TVE-300 through TVE-400 ............................................. 2671
TVE-420 through TVE-999 ............................................. 2688

81
TVS - Verify On Product Clock Sequences Messages. . . . . 2727
TVS-001 through TVS-130 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2727

82
TWC - Command Script Messages . . . . . . . . . . . . . . . . . . . . . . . . . . 2743
TWC-001 through TWC-020 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2743

83
TWT - Weighted Random Pattern Test and LBIST Messages
2751
TWT-002 through TWT-050 ............................................. 2751
TWT-051 through TWT-100 ............................................. 2766
TWT-101 through TWT-147 ............................................. 2781
TWT-161 through TWT-200 ............................................. 2796
TWT-710 through TWT-999 ............................................. 2803

84
Additional TSV Message Help . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2811
TSV-014 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2812

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1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages

Troubleshooting TSV-014 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2814


What If You Do Not Fix TSV-014? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2814
TSV-016 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2814
Troubleshooting TSV-016 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2815
What If You Do Not Fix TSV-016? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2815
TSV-024 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2815
Troubleshooting TSV-024 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2817
What If You Do Not Fix TSV-024? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2818
TSV-027 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2818
Troubleshooting TSV-027 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2821
What If You Do Not Fix TSV-027? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2821
TSV-051 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2822
Troubleshooting TSV-051 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2823
What If You Do Not Fix TSV-051? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2823
TSV-310 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2823
Troubleshooting TSV-310 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2826
What If You Do Not Fix TSV-310? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2829
Messages Related to TSV-310 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2829
TSV-311 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2830
Troubleshooting TSV-311 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2830
What If You Do Not Fix TSV-311? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2831
Messages Related to TSV-311 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2831
TSV-315 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2831
Troubleshooting TSV-315 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2834
What If You Do Not Fix TSV-315? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2834
TSV-350 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2834
Troubleshooting TSV-350 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2836
What If You Do Not Fix TSV-350? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2836
TSV-352 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2837
Troubleshooting TSV-352 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2837
What If You Do Not Fix TSV-352? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2837
Messages Related to TSV-352 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2837
TSV-387 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2838
Troubleshooting TSV-387 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2840
What If You Do Not Fix TSV-387? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2841
Messages Related to TSV-387 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2842

October 2015 19 Product Version 15.12


1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages

TSV-388 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2842
Troubleshooting TSV-388 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2844
What If You Do Not Fix TSV-388? . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2846
Messages Related to TSV-388 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2846

Index. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2847

October 2015 20 Product Version 15.12


1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages

Preface

This manual contains Cadence Encounter Test messages with their explanation and user
response.

Typographic and Syntax Conventions


The Encounter Test library set uses the following typographic and syntax conventions.
Text that you type, such as commands, filenames, and dialog values, appears in Courier
type.
Example: Type diagnose_failset_logic -h to display help for the command.
Variables appear in Courier italic type.
Example: Use TB_SPACE_SCRIPT=input_filename to specify the name of the
script that determines where Encounter Test results files are stored.
User interface elements, such as field names, button names, menus, menu commands,
and items in clickable list boxes, appear in Helvetica italic type.
Example: Select File - Delete - Model and fill in the information for the model.

October 2015 21 Product Version 15.12


1999-2015 All Rights Reserved.
Encounter Test: Reference: Messages
Preface

Encounter Test Documentation Roadmap


The following figure depicts a recommended flow for traversing the documentation structure.

Getting
Started New User
Overview
and

Models
Testmode
Guides
Test
Faults
ATPG
Test Vectors
Diagnostic

Flow PMBIST
PMBIST ET Pattern

Command GUI Expert


Reference Messages Test Pattern
Documents
Extension Glossar

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Preface

Getting Help for Encounter Test and Diagnostics


Use the following methods to obtain help information:
1. From the <installation_dir>/tools/bin directory, type cdnshelp and press
Enter. The installed Cadence documentation set is displayed.
2. To view a book, double-click the desired product book collection and double-click the
desired book title in the lower pane to open the book.

Click the Help or ? buttons on Encounter Test forms to navigate to help for the form and its
related topics.

Refer to the following in the Encounter Test: Reference: GUI for additional details:
Help Pull-down describes the Help selections for the Encounter Test main window.
View Schematic Help Pull-down describes the Help selections for the Encounter Test
View Schematic window.

Contacting Customer Service


Use the following methods to get help for your Cadence product.
Cadence Online Customer Support
Cadence online customer support offers answers to your most common technical
questions. It lets you search more than 40,000 FAQs, notifications, software updates,
and technical solutions documents that give step-by-step instructions on how to solve
known problems. It also gives you product-specific e-mail notifications, software updates,
service request tracking, up-to-date release information, full site search capabilities,
software update ordering, and much more. Go to http://www.cadence.com/support/
pages/default.aspx for more information on Cadence Online Customer Support.
Cadence Customer Response Center (CRC)
A qualified Applications Engineer is ready to answer all your technical questions on the
use of this product through the Cadence Customer Response Center (CRC). Contact the
CRC through Cadence Online Support. Go to http://support.cadence.com and click
Contact Customer Support link to view contact information for your region.
IBM Field Design Center Customers
Contact IBM EDA Customer Services at 1-802-769-6753, FAX 1-802-769-7226. From
outside the United States call 001-1-802-769-6753, FAX 001-1-802-769-7226. The e-
mail address is edahelp@us.ibm.com.

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Preface

Encounter Test And Diagnostics Licenses


Refer to Encounter Test and Diagnostics Product License Configuration in Encounter Test:
Release: Whats New for details on product license structure and requirements.

Using Encounter Test Contrib Scripts


The files and Perl scripts shipped in the <ET installation path>/ etc/tb/contrib
directory of the Encounter Test product installation are not considered as "licensed
materials". These files are provided AS IS and there is no express, implied, or statutory
obligation of support or maintenance of such files by Cadence. These scripts should be
considered as samples that you can customize to create functions to meet your specific
requirements.

What We Changed for This Edition


Refer to the following:
Revisions for Version 15.10
Revisions for Version 15.11
Revisions for Version 15.12

Revisions for Version 15.10


TBD messages
TBD-118
TBD-119
TBD-811
TDA messages
TDA-500
TDS messages
TDS-284
TDS-286

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Preface

TDS-288
TDS-290
TDS-300
TEI messages
TEI-232
TFL messages
TFL-253
TFL-254
TFM messages
TFM-901
TFW messages
TFW-942
THT messages
THT-132
TIS messages
TIS-051
TIS-052
TIS-500
TIS-501
TIS-822
TIS-823
TLH messages
TLH-065
TLP messages
TLP-342
TLP-343
TLP-346

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Preface

TLP-652
TRA messages
TRA-026
TSR messages
TSR-363
TSR-364
TRS-365
TSV messages
TSV-055
TSV-208
TSV-126
TSV-308
TSV-343
TSV-344
TSV-345
TSV-346
TTC messages
TTC-077
TTC-198
TTC-212
TTM messages
TTM-340
TTM-341
TTM-669
TTM-670
TTM-671
TTM-672

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Preface

TTM-673
TTM-674
TTM-675
TTM-760
TTM-761
TTM-762
TTM-763
TTM-884
TTM-885
TTM-886
TUI messages
TUI-333
TUI-362
TUI-363
TUI-364
TUI-737
TUI-738
TUI-739
TUI-740
TUI-741
TUI-742
TUI-743
TUI-744
TUI-745
TUI-746
TUI-747
TUI-748

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Preface

TVE messages
TVE-187
TVE-188

Revisions for Version 15.11


TBD messages
TBD-811
TDS messages
TDS-214
TEM messages
TEM-664
TEM-665
TFM messages
TFM-726
TRA messages
TRA-167
TSV messages
TSV-334
TVE messages
TVE-627

Revisions for Version 15.12


TBD messages
TBD-856
TDS messages
TDS-430
TEM messages

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Preface

TEM-331
TEM-666
TFL messages
TFL-257
TFM messages
TFM-811
TFM-812
TFM-813
TFM-814
TFM-815
TFM-816
TFM-817
TFM-818
TFM-819
THT messages
THT-160
THT-166
THT-430
TIM messages
TIM-092
TPO messages
TPO-767
TPO-767
TPO-768
TPO-769
TPO-770
TPO-771

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Preface

TPO-772
TPO-773
TPO-774
TPO-775
TPO-776
TPO-777
TPO-778
TPO-779
TPO-780
TPO-989
TTM messages
TTM-113
TTM-114

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1
Overview

Interactive and Background Messages


There are two types of Encounter Test Messages:
Messages with interactive analysis
Chapter 71, TSV- Test Structure Verification Messages
Chapter 52, TMI - Verify Macro Isolation Messages
Chapter 44, TJC - IEEE 1149.1 Boundary Scan Verification Messages
Chapter 9, TBV - RPCT Boundary Scan Verification Messages
Chapter 27, TFA - Deterministic Fault Analysis Messages
Chapter 64, TRA - Random Resistant Fault Analysis Messages
Chapter 62, TPT - Path Test Analysis Messages
Background messages
Chapter 2, C5C - Audit Messages
Chapter 5, EDAM - Extended Direct Access Method Messages
Chapter 6, FW - Graphical User Interface Framework Messages
Chapter 7, TBD - Generate Test Pattern Data Messages
Chapter 8, TBM - Test Pattern Manipulation Messages
Chapter 10, TBX - Extension Language Messages
Chapter 11, TCC - Random Pattern Generation Messages
Chapter 14, TCL - High Speed Scan Based Simulation Messages
Chapter 15, TCT - Test Data Core Messages

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Chapter 16, TCW - Stand Alone Random Pattern Simulation Messages


Chapter 17, TDA - General Messages
Chapter 18, TDC - Design Constraint Messages
Chapter 19, TDG - Diagnostic Simulation Messages
Chapter 20, TDL - True-Time Test Messages
Chapter 21, TDM - Delay Model Build Messages
Chapter 22, TDR - Tester Description Rule Messages
Chapter 24, TDY - Delay Simulation Messages
Chapter 25, TDX - Dynamic Test Generation Messages
Chapter 26, TEI - Build Model Messages
Chapter 29, TFL - Failure Data Messages
Chapter 30, TFM - Fault Model Messages
Chapter 31, TFS - Test Simulation Messages
Chapter 32, TFW - Encounter Test Framework Utilities Messages
Chapter 33, TGD - GlobalData Audit Messages
Chapter 34, TGI - RPCT Boundary Scan Interconnect Test Messages
Chapter 35, TGR - Test Simulation and Manipulate Tests Messages
Chapter 37, THM - Hierarchical Model Messages
Chapter 38, TID - Electronic Chip ID Test Generation Messages
Chapter 40, TIM - Import Test Pattern Data Messages
Chapter 41, TIS - Import STIL Messages
Chapter 42, TJA - Write BSDL Messages
Chapter 43, TJB - Parse BSDL Messages
Chapter 46, TJM - IEEE 1149.1 Boundary Scan Chain Test Mode Define
Messages
Chapter 45, TLD - Signature-Based Test Messages
Chapter 47, TLH - Linehold Messages

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Chapter 48, TLM - Logic Model Messages


Chapter 51, TMD - Manufacturing Release Data Messages
Chapter 53, TMT - Create MacroTests Messages
Chapter 54, TND - Good Machine Delay Simulation Messages
Chapter 55, TNP - Delay Timing Messages
Chapter 56, TNS - Netname Services Messages
Chapter 57, TOM - Objective Model Build and Access Messages
Chapter 58, TPC - Parallel Processing Communications Messages
Chapter 59, TPD - Test Pattern Display Messages
Chapter 60, TPL - Pipeline Verification Messages
Chapter 63, TPU - Test Pattern Utility Messages
Chapter 66, TSC - Test Sequence Effectiveness Checker Messages
Chapter 65, TSM - Simulation Messages
Chapter 67, TSR - Scan and LSSD Flush Test Messages
Chapter 68, TSS - Signature Observation Sequence Messages
Chapter 69, TST - Sequential Stored Pattern Test Generation Messages
Chapter 70, TSU - Segment/Symbol Utilities Messages
Chapter 72, TSY - Test Synthesis Messages
Chapter 73, TTA - Testability Measurements Messages
Chapter 74, TTC - Test Generation Controller Messages
Chapter 75, TTM - Test Mode Messages
Chapter 76, TTU - Timing Utility Messages
Chapter 77, TTV - Test View Messages
Chapter 78, TUI - User Interface Messages
Chapter 79, TVC - Create Vector Correspondence Messages
Chapter 80, TVE - Vector Export Messages
Chapter 81, TVS - Verify On Product Clock Sequences Messages

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Overview

Chapter 82, TWC - Command Script Messages


Chapter 83, TWT - Weighted Random Pattern Test and LBIST Messages

Message Severity Codes


The following are the message severities used by Encounter Test.

Code Explanation
INFO This message is issued for information purposes only; no error is found.
Typically, this message severity gives status about a process that is running
or a process that has completed running.
WARNING WARNING messages are issued for situations that may be problematic, but
do not cause the program to prematurely terminate. The data produced may
be reliable, but should be verified.
A warning message may also produce a sub-level code of [Severe] to
indicate that invalid test data or that other unreliable data may result, but that
processing will continue as far as possible.
ERROR ERROR messages indicate severe system, program, or input errors that
explain why the program is terminating prematurely, or to indicate the results
produced are unreliable. The following sub-level codes accompany error
messages when applicable:
[Input] indicates an input error in either the specification of a keyword
value or within the input itself.
[Tool] indicates a problem in the system or execution environment
related to issues such as memory, licensing, or other peripheral settings
that affect the performance of the software.
[Internal] indicates that an unexpected code condition has occurred
and is typically caused by a code bug.

For details about the severity and content of messages, refer to "Message Summary Window"
in the Encounter Test: Reference: GUI.
Note: Items that appear in this manual as objectName may be a pin, block, or net, and the
identification of which it is part of the objectName in Encounter Test. The objectName

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Overview

may be customized (netname vs. pinname, proper name vs. short name). These options are
described in the Options Setup section of the Encounter Test: Reference: GUI.

Message Return Codes


The Encounter Test program return codes are related to the message severities as follows:

Severity Code Return Code


INFO 0
WARNING 2
WARNING [Severe] 4
ERROR [Input] or [Tool] 5
ERROR [Internal] 6

Extended Message Help


Display Interactive extended help information for a message by entering either of the following
commands either directly on the command line or in the GUI Command Input field:
msgHelp <message_prefix-error_number1> <message_prefix-
error_number1> ...
For example,
msgHelp TSV-001 TSV-314

displays interactive help information for messages TSV-001 and TSV-314.


help <message_prefix-error_number1> displays interactive help for the
specified message.

The GUI Session Log is also available to vew message text and extended help. Refer to
"Using the Session Log to View Message Help" in the Encounter Test: Reference: GUI for
details.

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2
C5C - Audit Messages

C5CCS-001 through C5CCS-003 on page 37

C5CCS-001 through C5CCS-003


WARNING (C5CCS-001): [Severe] ---- ERROR ---- Error accessing file filename.
EXPLANATION:
The file name passed to the Checksum routine could not be accessed. Possible reasons
for this are:
The file does not exist.
The permissions for the file are not correct. Read permission is required.
Processing halts.
USER RESPONSE:
Determine if the file exists and check the permissions for the file.

WARNING (C5CCS-002): [Severe] C5CChecksum - Cannot open file file name because
it is a directory.
EXPLANATION:
The file name passed to the Checksum routine was determined to be a directory name,
NOT a file name. Processing halts.
USER RESPONSE:
Determine why the program passed the name of a directory instead of the name of a file.

WARNING (C5CCS-003): [Severe] Invalid mode specified mode.


EXPLANATION:

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C5C - Audit Messages

The Checksum program has 4 modes of operation. The calling program has passed in
a mode that is not recognized by the Checksum routine. Processing halts.
USER RESPONSE:
The valid modes are COMPUTE, VERIFY, UPDATE, and HOSTUPDATE. Change the mode
passed to the program to match one of these modes.

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3
CMD - Core Migration Messages

CMD-001 through CMD-050 on page 39

CMD-001 through CMD-050


INFO (CMD-001): prepare_core_migration_info has started time.
EXPLANATION:
The prepare_core_migration_info process has started.
USER RESPONSE:
None.

INFO (CMD-002): prepare_core_migration_info has ended time.


EXPLANATION:
The prepare_core_migration_info process has ended.
USER RESPONSE:
None.

ERROR (CMD-003): prepare_core_migration_info was unable to access the flat


model.
EXPLANATION:
prepare_core_migration_info could not load the flat model.
USER RESPONSE:
Review the log for any messages that indicate the cause of the problem. Contact
Cadence Customer Support for additional help (see Contacting Customer Service on
page 23).

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CMD - Core Migration Messages

ERROR (CMD-004): prepare_core_migration_info could not withdraw the


PROJECT keyword from the environment.
EXPLANATION:
The PROJECT keyword is required for loading of the Encounter Test model. This
keyword is extracted from the specification of the WORKDIR.
USER RESPONSE:
Check that your WORKDIR specification is correct. If the WORDIR: specification is
correct, contact Cadence Customer Support for additional help (see Contacting
Customer Service on page 23).

ERROR (CMD-005): prepare_core_migration_info could not withdraw the PARTID


keyword from the environment.
EXPLANATION:
The PARTID keyword is required for loading of the Encounter Test model. This keyword
is extracted from the specification of the WORKDIR.
USER RESPONSE:
Check that your WORKDIR specification is correct. If the WORDIR specification is
correct, contact Cadence Customer Support for additional help (see Contacting
Customer Service on page 23).

ERROR (CMD-006): prepare_core_migration_info could not withdraw the


TESTMODE keyword from the environment.
EXPLANATION:
The TESTMODE keyword is required for loading of the Encounter Test model. This
keyword is specified on the prepare_core_migration_info command line.
USER RESPONSE:
Check that your command line specification for the testmode keyword is correct. If the
testmode keyword specification iscorrect, contact Cadence Customer Support for
additional help (see Contacting Customer Service on page 23).

ERROR (CMD-007): prepare_core_migration_info was unable to open the


Encounter Test model.
EXPLANATION:
The Encounter Test model must be loaded during prepare_core_migration_info.

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CMD - Core Migration Messages

USER RESPONSE:
Check that you have permissions to the specified workdir. If you have permission to the
workdir, contact Cadence Customer Support for additional help (see Contacting
Customer Service on page 23).

ERROR (CMD-008): prepare_core_migration_info was unable to set the testmode.


EXPLANATION:
The Encounter Test testmode must be loaded during
prepare_core_migration_info.
USER RESPONSE:
Check that you have permissions to the specified testmode. If the testmode is correct,
contact Cadence Customer Support for additional help (see Contacting Customer
Service on page 23).

ERROR (CMD-009): prepare_core_migration_info was unable to load the


Encounter Test model methods.
EXPLANATION:
The model methodes for Encounter Test must be loaded during
prepare_core_migration_info.
USER RESPONSE:
Contact Cadence Customer Support for additional help (see Contacting Customer
Service on page 23).

ERROR (CMD-010): prepare_core_migration_info was unable to open file


filename.
EXPLANATION:
prepare_core_migration_info creates the coreInfo file for the migration of test
patterns. The coreInfo file could not be created.
USER RESPONSE:
Verify that the coremigrationdir directory is writable and has adequate space
available for the coreInfo file. Cadence Customer Support for additional help (see
Contacting Customer Service on page 23).

ERROR (CMD-011): prepare_core_migration_info was unable to open a storage


area for file filename.

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CMD - Core Migration Messages

EXPLANATION:
prepare_core_migration_info creates the coreInfo file for the migration of test
patterns. The coreInfo file could not be created.
USER RESPONSE:
Verify that the coremigrationdir directory is writable and has adequate space available for
the coreInfo file. Cadence Customer Support for additional help (see Contacting
Customer Service on page 23).

ERROR (CMD-012): The testmode is not a migrate or bypass testmode.


prepare_core_migration_info cannot be run on this testmode.
EXPLANATION:
prepare_core_migration_info creates the coreInfo file for the migration of test
patterns. The coreInfo file could not be created because the boundary keyword of the
scan type statement in the mode definition file did not specify boundary=migrate or
boundary=bypass.
USER RESPONSE:
Specify a testmode which is built using a mode definition file with a scan type statement
that specifies boundary=migrate or boundary=bypass. Cadence Customer
Support for additional help (see Contacting Customer Service on page 23).

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4
DFTS - Design for Test Synthesis
Messages

DFTS-001 through DFTS-025 on page 43


DFTS-100 through DFTS-300 on page 46
DFTS-400 through DFTS-812 on page 48

DFTS-001 through DFTS-025


ERROR (DFTS-001): [Input] The program cannot read file file_name specified for
keyword keyword.
EXPLANATION:
The command was unable to open the indicated file. The command terminates.
RESPONSE:
Ensure the file exists and is readable, and then rerun.

ERROR (DFTS-002): [Input] The program cannot write to file/directory file_name


specified for keyword keyword.
EXPLANATION:
The command was unable to write to the indicated file.The command terminates.
RESPONSE:
Ensure the file/directory exists and is writable, and then rerun.

ERROR (DFTS-003): [Internal] The progame cannot open and create the file file_name
when trying to action.
EXPLANATION:

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DFTS - Design for Test Synthesis Messages

The command was unable to open/create the indicated file. The command terminates.
RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (DFTS- 004): [Input] The insert_scan command was unable to determine the
number of scan chains desired. More input is required.
EXPLANATION:
The insert_scan command requires additional information to determine the number
of scan chains desired. This message indicates that insert_scan could not determine
this number based on the inputs provided.
RESPONSE:
Either supply an IOSpecList (using the iospeclistin keyword) or specify a value for
the keyword numscanchains to provide sufficient input for insert_scan to determine
the number of scan chains to be inserted.

ERROR (DFTS-005): [Input] Invalid value is specified with pin pinName for the
keywordName keyword.
EXPLANATION:
The specified value is invalid. If specified, only the values 0 or 1 are valid.
RESPONSE:
Correct the keyword value and rerun.

ERROR (DFTS-006): [Input] The keyword keyword must be specified for the
insert_scan command.
EXPLANATION:
insert_scan requires the named keyword to be specified.
RESPONSE:
Enter a valid value for the keyword and rerun.

ERROR (DFTS-007): [Input] The numchains parameter must be greater than or equal to
integer for compression_type compression.
EXPLANATION:

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DFTS - Design for Test Synthesis Messages

The requested type of compression requires a minimum number of scan chains to be


present. Fewer scan pins are not allowed since it will yield poor ATPG results or
diagnostic capability.
RESPONSE:
Specify a larger value for the numchains keyword and rerun.

ERROR (DFTS-013): [Input] The keyword keyword must be specified for the
build_top_shell command.
EXPLANATION:
build_top_shell requires the named keyword to be specified.
RESPONSE:
Enter a valid value for the keyword and rerun.

ERROR (DFTS-020): [Input] The value for misrsize must be divisible by 2.


EXPLANATION:
The value for the size of the OPMISR+ macro must be at least 16, at most 128, and must
be an even integer (divisible by 2).
RESPONSE:
Enter a valid value for the keyword and rerun.

ERROR (DFTS-021): [Input] When scanio=uni, the value for numchains must be even,
greater than or equal to 16, and less than or equal to 128. The specified numchains value
was integer.
EXPLANATION:
The value for numchains must be an even number ranging from 16 to 128 for
OPMISR+ with scanio=uni .
RESPONSE:
Specify a valid value for the keyword and rerun.

ERROR (DFTS-022): [Input] When scanio=bidi, the value for numchains must be
greater than or equal to 8, and less than or equal to 64. The specified numchains value was
integer.
EXPLANATION:
The value for numchains must range from 8 to 64 for OPMISR+ with scanio=bidi

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DFTS - Design for Test Synthesis Messages

RESPONSE:
Specify a valid value for the keyword and rerun.

ERROR (DFTS-023): [Input] The value for misrsize must be even, greater than or equal
to 16, and less than or equal to 128. The specified misrsize value was integer.
EXPLANATION:
The size of the MISR must be an even number ranging from 16 to 128 for OPMISR+ .
RESPONSE:
Specify a valid value for the keyword and rerun.

ERROR (DFTS-024): [Input] The value for numchannels integer must be at least twice
numchains integer.
EXPLANATION:
For XOR Compression, the number of scan channels (numchannel) must be two times
greater than the number of top-level scan chains (numchains).
RESPONSE:
Enter a valid value for the keyword and rerun. Refer to build_compression_macro in the
Encounter Test: Reference: Commands for keyword details.

ERROR (DFTS-025): [Input] For OPMISR+ generation the value of the misrsize parameter
times the fanout parameter must be smaller than 65536. The values requested are
misrsize (integer) and fanout (integer) (the product is integer).
EXPLANATION:
The size of the generated OPMISR+ compression is limited by size and time constraints.
RESPONSE:
Decrease the size of the MISR on the fanout parameter and rerun.

DFTS-100 through DFTS-300


ERROR (DFTS-100): [Tool] BuildGates script generation aborted with major errors.
Consult filename for more information.
EXPLANATION:

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DFTS - Design for Test Synthesis Messages

The message indicates that the generation of the BuildGates script by Encounter Test
Synthesis terminated with major errors.
RESPONSE:
Examine the resulting error messages and respond accordingly.

ERROR (DFTS-101): [Internal] BuildGates script generation terminated with programming


error messages. Consult filename for more information.
EXPLANATION:
This message indicates that the generation of the BuildGates script by Encounter Test
Synthesis terminated with programming errors.
RESPONSE:
Contact customer support (see ).

ERROR (DFTS-102): [Tool] Processing aborted with major errors.


EXPLANATION:
This message indicates that the processing required by the command terminated with
major errors.
RESPONSE:
Examine the resulting error messages and respond accordingly.

ERROR (DFTS-103): [Internal] Processing terminated with programming error messages.


EXPLANATION:
This message indicates that the processing required by the command terminated with
programming errors.
RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (DFTS-200): [Tool] Could not establish directory path.


EXPLANATION:
The program was unable to establish the fully qualified location of the specified path.
RESPONSE:
Verify the directory structure and specified path names are properly set up and rerun.

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DFTS - Design for Test Synthesis Messages

ERROR (DFTS-300): [Tool] Unable to obtain license.


EXPLANATION:
The program was unable to obtain the license required for Encounter Test.
RESPONSE:
Verify the availability of the necessary license.

DFTS-400 through DFTS-812


WARNING (DFTS-400): BuildGates script generation completed with warning level
messages. Consult filename for more information.
EXPLANATION:
This message indicates that the generation of the BuildGates script by Encounter Test
Synthesis issued warning level messages.
RESPONSE:
Examine the resulting warning level messages and respond accordingly.

WARNING (DFTS-401): BuildGates script generation completed with error messages.


Consult filename for more information.
EXPLANATION:
This message indicates that the generation of the BuildGates script by Encounter Test
Synthesis issued error messages.
RESPONSE:
Examine the resulting error messages and respond accordingly.

WARNING (DFTS-402): [severe] BuildGates script generation completed with severe error
messages. Consult filename for more information.
EXPLANATION:
This message indicates that the generation of the BuildGates script by Encounter Test
Synthesis issued severe level error messages.
RESPONSE:
Examine the resulting error messages and respond accordingly.

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Encounter Test: Reference: Messages
DFTS - Design for Test Synthesis Messages

WARNING (DFTS-403): BuildGates processing completed with error messages.


EXPLANATION:
This message Indicates that the processing performed by BuildGates issued error
messages. Netlist generation may have been unsuccessful or incomplete.
RESPONSE:
Examine the error messages issued by BuildGates and respond accordingly.

WARNING (DFTS-404): Processing completed with warning level messages.


EXPLANATION:
This message indicates that the processing required by the command issued warning
level messages.
RESPONSE:
Examine the resulting warning level messages and respond accordingly.

WARNING (DFTS-405): Processing completed with error messages.


EXPLANATION:
This message indicates that the processing required by the command issued error
messages.
RESPONSE:
Examine the resulting error messages and respond accordingly.

WARNING (DFTS-406): [severe] Processing completed with severe error messages.


EXPLANATION:
This message indicates that the processing required by the command issued severe
level error messages.
RESPONSE:
Examine the resulting error messages and respond accordingly.

WARNING (DFTS-410): Global Data will not be written. File filename was not found.
EXPLANATION:
A file required for the determination of data to be written to global data could not be
located. No global data will be written by this command.

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RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (DFTS-411): Global Data will not be written. Could not establish topname.
EXPLANATION:
The value for topname is obtained from .globalData.dft. However there was a
problem in obtaining this value. No global data will be written by this command.
RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (DFTS-412): The build_opmisr_plus command has been replaced with the
build_compression_macro command. Please use that command instead. The
build_opmisr_plus command will be removed in a future release.
EXPLANATION:
The build_opmisr_plus command has been renamed because it can now build both
opmisr plus and xor compression macros.
RESPONSE:
Change scripts to use the build_compression_macro command instead of the
build_opmisr_plus command.

WARNING (DFTS-413): When inserting XOR compression and numchains is integer,


optimum test coverage can be achieved when the number of channels is less than or equal
to integer.
EXPLANATION:
For XOR compression, optimum test coverage is achieved when numchannels is less
than or equal to (n choose 3) + (n choose 4), where n is numchains.
RESPONSE:
For optimum test coverage, enter a low numchannel value and rerun.

WARNING (DFTS-414): The numchannels parameters is not divisible by numchains.


This will result in unbalanced FULLSCAN mode scan chains.
EXPLANATION:

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DFTS - Design for Test Synthesis Messages

For XOR compression, if specified numchannels value is not divisible by the specified
numchains value, the number of channels in each FULLSCAN chain will not be the
same, resulting in unbalanced scan chains.
RESPONSE:
Ensure the specified numchannels value is divisible by the specified numchains
value and rerun.

WARNING (DFTS-415): The size of the OPMISR+ macro is large and will take a lengthy
time to generate.
EXPLANATION:
RTL Compilation of large OPMISR+ macros tend to take more time.
RESPONSE:
Verify the compression parameters are correct and rerun if necessary.

INFO (DFTS-800): Creating file_description file_name.


EXPLANATION:
The command will attempt to create the file/directory named in the message.
RESPONSE:
No response required.

INFO (DFTS-801): The insert_scan command command_name is generating a


BuildGates script.
EXPLANATION:
The insert_scan command is automatically generating a BuildGates script file based
on the specified inputs.The script file is intended to be used as input to BuildGates for
scan insertion.
RESPONSE:
No response required.

INFO (DFTS-802): BuildGates script generation completed successfully.


EXPLANATION:
Indicates that the insert_scan command successfully created a BuildGates script.
RESPONSE:

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No response required.

INFO (DFTS-803): Edif format requires the design to be mapped to the library before being
saved. A simple mapping will be performed.
EXPLANATION:
The Edif format cannot be used without tech-mapping the design. Techmap will be set to
1, and processing will continue.
RESPONSE:
No response required.

INFO (DFTS-804): The insert_scan command is launching a BuildGates process.


EXPLANATION:
The insert_scan command is launching a BuildGates process for scan insertion.
RESPONSE:
No response required.

INFO (DFTS-805): BuildGates processing completed successfully.


EXPLANATION:
BuildGates processing completed without errors.
RESPONSE:
No response required.

INFO (DFTS-806): Launching process_name processing.


EXPLANATION:
The command is forking an instance of the program referenced in the message.
RESPONSE:
No response required.

INFO (DFTS-807): Processing completed successfully.


EXPLANATION:
This message indicates that the processing required by the command was successful.
RESPONSE:

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No response required.

INFO (DFTS-808): The command command is using IOSpecList file filename for
processing.
EXPLANATION:
This message provides the names the file command is using as the IOSpecList.
RESPONSE:
No response required.

INFO (DFTS-809): Executing command.


EXPLANATION:
This message lists the command being executed.
USER RESPONSE:
No response required.

INFO (DFTS-810): Output netlist will be written to outnetlistdir.


EXPLANATION:
This message lists the directory the output netlist will be written to.
USER RESPONSE:
No response required.

INFO (DFTS-811): Setting misrsize to integer based on scanio=string and


numchains=integer.
EXPLANATION:
The misrsize keyword was not specified in the command string and is being
determined from the number of scan chains requested.
USER RESPONSE:
No response required.

INFO (DFTS-812): Setting numchains to integer based on scanio=string and


misrsize=integer.
EXPLANATION:

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The misrsize keyword was specified in the command string. The numchains value is
being set to match.
USER RESPONSE:
No response required.

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5
EDAM - Extended Direct Access Method
Messages

EDAM-001 through EDAM-050 on page 55


EDAM-051 through EDAM-0160 on page 65

EDAM-001 through EDAM-050


WARNING (EDAM-001): [Severe] System error occurred while trying to mmap the EDAM
buffer file. Error code from mmap system call was (errno).
EXPLANATION:
The system failed to allocate the EDAM buffer. The most likely cause is insufficient swap
space left. Since the EDAM buffer space requirements are minimal (about 8 MB), this
error is unlikely to occur. The operating systems reason for failure should be provided on
the next line of output.
USER RESPONSE:
Make sure the system has sufficient swap space to run the application.

WARNING (EDAM-001): [Severe] System error occurred while trying to munmap the
EDAM buffer file. Error code from munmap system call was (errno).
EXPLANATION:
The system failed to free the EDAM buffer. This is a very unlikely error and should only
occur if the operating system has failed, possibly due to memory corruption. The
operating systems reason for failure should be provided on the next line of output.
USER RESPONSE:
Check the error code from the system to see if anything can be done.

INFO (EDAM-003:) EDAM Debugging has been enabled.

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EXPLANATION:
The environment variable EDAMDEBUG was set or an application has explicitly turned on
debug checking. This will cause EDAM to continually check the validity of its internal
buffer control blocks. This debug checking is usually done only in an effort to find
programming errors.
USER RESPONSE:
No response required.

INFO (EDAM-004): EDAM default paging buffer size has been overridden to numbytes.
EXPLANATION:
The environment variable EDAMRAM was set and this has caused EDAM to change the
default buffer size from approximately 8 Megabytes to the number of bytes specified in
the EDAMRAM variable (numbytes).
USER RESPONSE:
No response required.

WARNING (EDAM-005): EDAM file locking has been disabled. Avoid use of the same files
by applications running simultaneously.
EXPLANATION:
The environment variable TB_NOLOCK or TFWDDMNOLOCK has been set. This will
prevent EDAM from performing normal file locking operations. This can cause files to
become corrupted and is intended for expert use only.
USER RESPONSE:
No response required.

INFO (EDAM-006): EDAM maximum paging buffer size was exceeded. Size set to
numbytes.
EXPLANATION:
The environment variable EDAMRAM was set and this has caused EDAM to change the
default buffer size from approximately 8 Megabytes to the number of bytes specified in
the EDAMRAM variable except that this would exceed the maximum buffer size allowed.
The buffer size is set to (numbytes) which is the current maximum allowed buffer size.
On the 32-bit systems,
The maximum buffer size is about 1GB. On 64-bit systems, the maximum buffer size is
about 64GB.

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USER RESPONSE:
If a higher buffer size is needed, contact customer support (see Contacting Customer
Service on page 23).

ERROR (EDAM-010): [Internal]IEDAMsfre found an empty Page Table or PTD with a


useCount of count.
EXPLANATION:
This is most likely a programming error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-011): [Severe] Application is attempting to mmap an area of (request)


bytes, which is too large for a 32-bit system.
EXPLANATION:
The application is requesting to map more than 2 GBytes of data while running on a 32-
bit operating system. This request can only be satisfied by running on a 64-bit operating
system.
USER RESPONSE:
Run the application on a 64-bit operating system.

WARNING (EDAM-012): [Severe] System error trying to map file filename.


Offset = offsetllx, Length = lengthllu

EXPLANATION:
The operating system failed while trying to map a portion of the filename file into
memory starting at offset offset bytes into the file for a length of length bytes.
There may be other messages to help determine why the system failed.
USER RESPONSE:
Determine why the system failed. If possible, remove the cause of the problem and try
again.

WARNING (EDAM-013): [Severe] Error trying to unmap file filename.


EXPLANATION:
The operating system failed while trying to unmap a portion of the filename file from
memory. There may be other messages to help determine why the system failed.

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USER RESPONSE:
Determine why the system failed. If possible, remove the cause of the problem and try
again.

ERROR (EDAM-014): [Internal]Internal error trying to map file filename.


EXPLANATION:
The EDAM utility detected an internal programming error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-015): [Severe] Error trying to unmap storage at (address) for file
filename.
EXPLANATION:
The operating system failed while trying to unmap a portion of the filename file from
memory. There may be other messages to help determine why the system failed.
USER RESPONSE:
Determine why the system failed. If possible, remove the cause of the problem and try
again.

WARNING (EDAM-016): Attempting to by-pass SunOS bug. This bug does not allow
mapping an NFS file when locks exist against any file. File data will be copied into memory -
requiring more swap space.
EXPLANATION:
This message is obsolete and should never be seen. There is no longer a warning
message produced when this SunOS bug is bypassed.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-017): [Internal]Application error. NULL pointer passed to EDAMread.


Application was accessing file filename.
EXPLANATION:
The EDAM utility detected an application programming error. The buffer parameter must
be a valid pointer and was found to be NULL.
USER RESPONSE:

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Contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-020): [Severe] System error occurred while opening file filename.
Look at the following system message to understand why:
EXPLANATION:
The operating system failed while trying to open the filename file. The systems
reason for failing is printed on the next line of output.
USER RESPONSE:
Determine why the system failed. If possible, remove the cause of the problem and try
again.

WARNING (EDAM-021): [Severe] System error while removing file filename. Look at
subsequent system messages for further information.
EXPLANATION:
The operating system failed while trying to remove the filename file. The systems
reason for failing is printed on the next line of output.
USER RESPONSE:
Determine why the system failed. If possible, remove the cause of the problem and try
again.

WARNING (EDAM-022): Unable to obtain use of file filename because other users of this
file exist and their use of the file conflicts with the current request for purpose use of the file.
Try again later.
EXPLANATION:
The system failed to provide locks to access the filename file. The most likely reason
is that some other process (perhaps on a different processor) is already using this file in
a manner that conflicts with the desired purpose for this process. Two processes cannot
write to a file at the same time. Only one process can obtain mutually exclusive use of a
file.
USER RESPONSE:
Wait for the other use of the file to end and try again.
In certain cases where systems have crashed without returning their outstanding locks,
it is possible for the system to assume there is a lock outstanding when in fact the original
process is no longer alive. There is no simple solution to free up such locks, but the
following steps may be used and may work in many situations:

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Remove all .lock* files in the directory containing the file by being in that
directory and using this command: rm .lock*
If there is a locks subdirectory there, remove all files there by using this
command: rm locks.
The above steps are drastic and should be done only when it is known that there are no
processes currently running that may be using any of the files in the same directory as
the file that could not be locked.

WARNING (EDAM-023): [Severe] The fsync() failed for file filename. Unable to ensure
updates to this file have been written to disk. Checkpointing of this file is incomplete due to a
system error:
EXPLANATION:
The system failed to sync the filename file, which may mean that the checkpoint
operation is corrupted and that the system may not be able to successfully restart/reopen
this file.
USER RESPONSE:
If the reason the sync failed (which should be stated immediately following this message)
is due to insufficient space, you should make sure the file system being used has
sufficient space before trying this again. If at least one previous checkpoint was
successful, you should be able to restart the application once additional file system
space has been provided. If the restart is successful, it will pick up wherever the previous
checkpoint had left off.

INFO (EDAM-024): Opening file filename for purpose access.


EXPLANATION:
The file filename is being opened for purpose use. This is informational only and
is printed as debug information if the EDAMFILES environment variable is defined.
USER RESPONSE:
No response required.

INFO (EDAM-025): Closing file filename.


EXPLANATION:
The file filename is being closed. This is informational only and is printed as debug
information if the EDAMFILES environment variable is defined.
USER RESPONSE:

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No response required.

WARNING (EDAM-026): The fsync() failed for file filename due to a network or system
timeout.
EXPLANATION:
The system failed to sync the filename file because of a network timeout. The fsync()
operation will be retried a limited number of times. See the explanation for message
EDAM-054 for more details.
USER RESPONSE:
If the system continues to timeout even after all retry attempts, try to determine why the
system (network) is timing out and fix that problem before running the application again.

WARNING (EDAM-027): Unable to obtain use of file filename because permission to lock
the file was denied. User has permission for purpose use of the file, but cannot lock it. Get
permission to lock the file.
EXPLANATION:
The system failed to provide locks to access the filename file. The reason appears to be
due to lack of permission to lock the file. Some file systems have separate permissions
for locking. For example, the Andrew File System (AFS) has separate permissions (-k)
for locks.
USER RESPONSE:
Have the owner of the directory give you permission to lock files. For cases where the file
being accessed is linked to the real file, ensure that you have permission to lock the
target file. For example, if the target file is in an AFS directory, for read-only use ensure
you have rlk (read, list and lock) permission to the containing directory.

WARNING (EDAM-028): [Severe] System error occurred while opening lock file
filename. Look at the following system message to understand why:
EXPLANATION:
The operating system failed while trying to open the filename file.The systems reason
for failing is printed on the next line of output.
USER RESPONSE:
Determine why the system failed. If possible, remove the cause of the problem and rerun.

INFO (EDAM-029): File filename changed while awaiting lock. Trying again...
EXPLANATION:

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While waiting for a lock against the referenced file, some other process updated the file.
Since there are two versions of the data kept within an EDAM file, we have to lock the
appropriate version. Because the file has been updated, we have to release the locks
and try to get a lock against the newer version of the file. If there are many parallel
processes trying to update the same EDAM file, only one will get the file at a time. Such
serialization could cause some processes to wait quite some time before the lock is
issued without the file changing.
USER RESPONSE:
This is normal behavior when multiple processes attempt to update the same EDAM file.
This serialization mechanism is necessary to ensure only one process gets authority to
make updates to the file at any one time. This informational message is intended to alert
you to the fact that several processes are trying to update the referenced file and delaying
access to it.

ERROR (EDAM-030): [Internal] Storage Area handle (handle) not in open list for file
filename".
EXPLANATION:
The EDAM utility detected an application programming error. The calling application
requested to close or delete a storage area, but the handle provided is not valid.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-040): [Internal]Internal error: LRU page not free!! Paging buffers are
corrupted.
EXPLANATION:
The EDAM utility detected that its internal buffers were corrupted. The problem could be
caused by either an internal EDAM error, or by an application that erroneously wrote on
top of the EDAM buffers. To prevent the possible corruption of files that have not yet been
closed, EDAM forces the process to end.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-041): [Tool] EDAM is shutting down to avoid corrupting data.


EXPLANATION:
The EDAM utility detected that its internal buffers were corrupted. The problem could be
caused by either an internal EDAM error, or by an application that erroneously wrote on

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top of the EDAM buffers. To prevent the possible corruption of files that have not yet been
closed, EDAM forces the process to end.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-042): [Internal] LRU Page Table (page) has use count = count.
EXPLANATION:
The EDAM utility detected that its internal buffers were corrupted. The problem could be
caused by either an internal EDAM error, or by an application that erroneously wrote on
top of the EDAM buffers. EDAM forces the process to end.to prevent the possible
corruption of files that have not yet been closed.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-043): [Internal] Unrecognized page (page) of type (type) found in the
LRU queue.
EXPLANATION:
The EDAM utility detected that its internal buffers were corrupted. The problem could be
caused by either an internal EDAM error, or by an application that erroneously wrote on
top of the EDAM buffers. To prevent the possible corruption of files that have not yet been
closed, EDAM forces the process to end.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-044): [Internal] Data page (page) has invalid parent (page2).
EXPLANATION:
The EDAM utility detected that its internal buffers were corrupted. The problem could be
caused by either an internal EDAM error, or by an application that erroneously wrote on
top of the EDAM buffers. To prevent the possible corruption of files that have not yet been
closed, EDAM forces the process to end.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-045): [Internal] Page Table Directory (page1) has invalid page table
directory (page2).

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EXPLANATION:
The EDAM utility detected that its internal buffers were corrupted. The problem could be
caused by either an internal EDAM error, or by an application that erroneously wrote on
top of the EDAM buffers. To prevent the possible corruption of files that have not yet been
closed, EDAM forces the process to end.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-046): [Internal] Page Table Directory (page1) has invalid file control block
(page2).
EXPLANATION:
The EDAM utility detected that its internal buffers were corrupted. The problem could be
caused by either an internal EDAM error, or by an application that erroneously wrote on
top of the EDAM buffers. To prevent the possible corruption of files that have not yet been
closed, EDAM forces the process to end.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-047): [Internal] Available pages = num1 not equal numPagesAvail =


num2.
EXPLANATION:
The EDAM utility detected that its internal buffers were corrupted. The two available page
counts should always be equal but were found not to be. This is likely to be an internal
EDAM program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-048): [Internal] PTD Directory (page1) has invalid file control block
(page2).
EXPLANATION:
The EDAM utility detected that its internal buffers were corrupted. The problem could be
caused by either an internal EDAM error, or by an application that wrote on top of the
EDAM buffers in error. To prevent the possible corruption of files that have not yet been
closed, EDAM forces the process to end.
USER RESPONSE:

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Contact customer support (see Contacting Customer Service on page 23).

EDAM-051 through EDAM-0160


ERROR (EDAM-050): [Internal] EDAM Current Limitation of 1 file exceeded while
processing file filename. Alert Encounter Test development.
EXPLANATION:
The EDAM utility in its current implementation cannot allocate more than 1 physical file
to deal with a single large logic EDAM file. Since this is a fundamental limitation, EDAM
will end the process. The file being processed is simply too large for the system. In some
rare cases, this error message can occur due to a programming error rather than
because a file is too large.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-051): [Severe] System error occurred while Seeking to (offset) in file
filename.
EXPLANATION:
The operating system failed while trying to read data from a location offset bytes
from the beginning of the filename file. The systems reason for failing is printed on
the next line of output.
USER RESPONSE:
Determine why the system failed. If possible, remove the cause of the problem and try
again.

WARNING (EDAM-052): [Severe] System error occurred while Writing to offset in file
filename.
EXPLANATION:
The operating system failed while trying to write data to a location offset bytes from
the beginning of the filename file. The systems reason for failing is printed on the
next line of output. A typical reason for failing is no space left on disk.
USER RESPONSE:
Determine why the system failed. If possible, remove the cause of the problem and try
again.

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WARNING (EDAM-053): [Severe] System error occurred while Reading numbytes bytes
into address address from offset in file filename.
EXPLANATION:
The operating system failed while trying to read data from a location offset bytes
from the beginning of the filename file. numBytes of data was being read into
process memory at location address. The systems reason for failing is printed on the
next line of output.
USER RESPONSE:
Determine why the system failed. If possible, remove the cause of the problem and try
again.

INFO (EDAM-054): Waiting 10 seconds and trying again (retry # try of maxtries).
EXPLANATION:
The previously reported I/O failure appears to be a network timeout problem, so we
attempt to recover by waiting a few seconds and trying the I/O again. This is attempt
number try. The I/O will be attempted up to maxtries times before giving up.
USER RESPONSE:
If the retry succeeds, there is nothing more to do; otherwise, try to determine why the
system is timing out. If possible, remove the cause of the problem and try again. You can
change the number of retry attempts allowed to the value of the TB_RETRY environment
variable. For example, TB_RETRY=2 or TB_RETRY=100. Setting TB_RETRY=0 will
cause the system to fail immediately with no retry attempts.

WARNING (EDAM-055): An I/O operation failed for file filename.


EXPLANATION:
The system failed to perform an I/O operation for the filename file. The I/O operation
will be retried a limited number of times. See the explanation for message EDAM-054 for
more details.
USER RESPONSE:
If the system continues to timeout even after all retry attempts, try to determine why the
I/O operation is failing and fix that problem before running the application again.

ERROR (EDAM-060): [Internal] Internal error: file filename has no FREE Queue!
EXPLANATION:

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The EDAM utility detected an internal programming error. The internal File Control Block
for the open filename file is missing a queue of free disk pages.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-061): [Internal] Internal error: file filename has no AVAIL Queue!
EXPLANATION:
The EDAM utility detected an internal programming error. The internal File Control Block
for the open filename file has an empty queue of available disk pages.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-062): [Internal] Internal error: file filename next free slot (slotID),
not on disk!
EXPLANATION:
The EDAM utility detected an internal programming error. While processing the
filename file, an invalid disk address slotID was selected as the next free slot to
write data to.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-063): [Severe] File filename is too large. EDAM limit of 1 Terabyte
reached.
EXPLANATION:
The EDAM utility attempted to write a page to file filename, but this would have
created a file larger than 1 Terabyte in size. This exceeds the current maximum storage
capability for a single EDAM file. The application writing this file will need to be rewriten
to either write less data, or use multiple files to store all of its data.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

INFO (EDAM-070): Waiting to obtain purpose use of file filename.


EXPLANATION:

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EDAM - Extended Direct Access Method Messages

The system failed to provide locks to access the referenced file. The most likely reason
is that some other process (perhaps on a different processor) is already using this file in
a manner that conflicts with the desired purpose for this process. Two processes
cannot write to a file at the same time. Only one process can obtain mutually exclusive
use of a file.
USER RESPONSE:
Wait for the other use of the file to end and this process should then continue. If the
process never continues, the system may think the lock is held by a process (perhaps on
another system on the network) that is no longer running.
In certain cases where systems have crashed without returning their outstanding locks,
it is possible for the system to assume there is a lock outstanding when in fact the original
process is no longer alive. There is no simple solution to free up such locks, but the
following steps may be used and may work in many situations:
1. Remove all .lock* files in the directory containing the file by being in that
directory and using this command: rm .lock*
2. If there is a locks subdirectory there, remove all files thereby using this
command: rm locks/*.
3. If this process continues to wait, you may have to kill the process.
The preceding steps are drastic and should be done only when it is known that there are
no processes currently running that may be using any of the files in the same directory
as the file that could not be locked.

INFO (EDAM-071): Waited time time to obtain purpose use of file filename.
EXPLANATION:
This process waited for the referenced amount of elapsed time to gain access to the
referenced file for the referenced purpose. This is normal for serialized access to
updatable files.
USER RESPONSE:
If the wait time is very long, there may be multiple processes attempting to update the
same file or a long running process may tie up the file for read-only use. To avoid this, do
not run parallel tasks that need the same file for long periods of time.

ERROR (EDAM-100): [Internal] Application Error: Too little memory supplied to EDAM for
buffers. Memory given = given, minimum allowed = minimum.
EXPLANATION:

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An application program failed to give the EDAM utility enough buffer space.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-110): [Internal] Application Error: EDAMsfre or EDAMsfre64 addr1


parameter (addr) not on a page boundary.
EXPLANATION:
An application program parameter, addr1, has a (hex) value of addr which is not on a
page boundary. This is not legal as input to the EDAMsfre or EDAMsfre64 function.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-111): [Internal] Application Error: cannot find mapped area to be


unmapped. mapped addr=(addr), File = filename.
EXPLANATION:
An application program attempted to unmap an area of storage that EDAM could find no
record of being mapped. The application program has probably tried to free the storage
more than once.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-112): [Internal] Application Error: An offset of xoffset was specified


to EDAMsget64, EDAMsput64, EDAMnxra64, EDAMsfre64, EDAMmap64, or EDAMread64,
which exceeds the offset limit of x0000040000000000 of EDAM64. Application was
accessing file filename.
EXPLANATION:
The EDAM utility detected an application programming error. The application attempted
to access an offset within a storage area that is beyond the current limits allowed by the
EDAM utility. The current offset limit is x0000040000000000, which represents an offset
4 TeraBytes into the storage area.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-120): [Internal] Application Error: Invalid file handle (handle) specified.

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EXPLANATION:
An application program provided an invalid EDAM file handle to an EDAM program
interface (such as EDAMfcls). The application program probably closed the file already
or never opened it.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-121): [Severe] EDAM paging buffers too low (numBuffers). File
filename is not opened. Application should close some files or storage areas to free up
buffers.
EXPLANATION:
The EDAM paging buffers only have numBuffers free, which is too few to allow
another file to be opened. The opening of the filename file fails. There appears to be
too many open files and open storage areas forcing buffers to be removed from service.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-122): Application has opened file filename too often (numOpens).
File is not opened for caller.
EXPLANATION:
The file filename was opened numOpens times, which is the limit of how many
times the same file can be opened without it ever being closed. The calling application
will probably fail. The application should be modified to keep track of opened file handles.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-123): Application warning: CheckPointing file filename which was.


NOT opened for Global Exclusive use. File is CheckPointed. This could cause problems if
other processes access the file.
EXPLANATION:
The file filename was opened for updating, but was not opened for mutually exclusive
use. This provides an exposure to the checkpoint processing if there are other processes
which are reading the file. These other processes could fail. Any file that will be
checkpointed should be opened for exclusive use.
USER RESPONSE:

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Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-124): [Internal] Application error: CheckPointing file filename which


was. NOT opened for update. File is not CheckPointed.
EXPLANATION:
The file filename is attempting to be checkpointed, but is was opened for read-only
processing. The application should be fixed to open the file being checkpointed for
mutually exclusive update access.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-130): [Internal] Application error: request to open storage area (areaID)
denied. Valid range for a storage area number is (0 to maxID).
EXPLANATION:
An application attempted to open a 32-bit storage area within a file but specified an
numeric ID areaID outside the allowed range of 0 to maxID. The application should
be fixed.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-131): [Severe] EDAM paging buffers too low (numBuffers). Storage
Area (areaID) in File filename is not opened. Application should close some files or
storage areas to free up buffers.
EXPLANATION:
The EDAM paging buffers only have numBuffers free, which is too few to allow
another storage area to be opened. The opening of the storage area fails. There appears
to be too many open files and open storage areas forcing buffers to be removed from
service.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-132): [Internal] Application error: Invalid storage area handle (handle)
specified.
EXPLANATION:

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The application program supplied a storage area handle that is not valid. It may be
because it used to be a valid handle, but that storage area is no longer open. The
application needs to be fixed.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-134): [Internal] Application error: EDAMsdel request to close Storage


Area (handle) in file filename is denied. Storage area is currently opened (numOpens)
times. A storage area must be opened exactly once to delete it.
EXPLANATION:
The application program tried to close and delete a storage area in file filename, but
the storage area handle indicates it was opened numOpens times. A storage area
can only be deleted if it is opened exactly one time.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-135): [Severe] Application error: request to find next storage area after
(areaID) denied. Valid range for a storage area number is (0 to maxID).
EXPLANATION:
An application specified a storage area numeric ID of areaID which is outside the
allowed range of 0 to maxID. The application should be fixed.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (EDAM-140): [Internal] Application error: Closed Storage area (areaID) for file
filename appears to have been referenced after it was closed.
EXPLANATION:
An application appears to have referenced data within a storage area that is currently
closed. The storage area ID areaID within the filename file is one in error. The
application should be fixed.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-154): [Severe] Application error: File filename is not a valid EDAM
file.

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EXPLANATION:
The file filename appears not to be a valid EDAM file. The file cannot be opened for
access by EDAM. Either the user has specified some identifiers incorrectly, the file has
been corrupted, or the application had provided the wrong file name.
USER RESPONSE:
Make sure you have supplied the correct identifiers to the application program and that
the file reference has not been corrupted. If everything looks OK but continues to fail,
contact customer support (see Contacting Customer Service on page 23).

WARNING (EDAM-160): [Severe] Application error: file filename has been modified,
but it was opened for READONLY use!
EXPLANATION:
An application appears to updated the file filename, but it was opened for read-only
access. The file is not updated. The application should be fixed.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

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6
FW - Graphical User Interface Framework
Messages

FW-001 through FW-050 on page 75


FW-051 through FW-100 on page 87

FW-001 through FW-050


ERROR (FW-001): [Tool] Unable to initialize the Graphical User Interface - return
code=gui_return_code
EXPLANATION:
The graphical user interface initialization failed to return a valid return code.
USER RESPONSE:
Check for messages from the TUI component

ERROR (FW-002): [Tool] Unable to close the Graphical User Interface


EXPLANATION:
The graphical user interface initialization failed to return a valid return code on a close.
USER RESPONSE:
Check for messages from the TUI component

ERROR (FW-003): [Tool] Graphical Interface does not match current environment
EXPLANATION:
A method attempted to connect to an existing motif Encounter Test GUI and the current
environment in the Tcl Gui does not match the environment in the motif Encounter Test
GUI. The setHostAddress first argument requested that an error be issued in this
case.

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USER RESPONSE:
Either invoke setProject, etc. to force the script to be working in the same
environment as the graphical user interface, or issue an error message and quit, or
specify a different action in the setHostAddress first parameter

ERROR (FW-004): [Tool] Unable to connect to existing graphical user interface. Return
code=returnCode.
EXPLANATION:
A method attempted to connect to an existing graphical user interface, but the underlying
code was unable to connect to that interface. The return code from the underlying code
is specified in the returnCode field.
USER RESPONSE:
Either execute setHostAddress with a null argument to force a new graphical user
interface to start up, or determine why you were unable to connect to the host address
specified in setHostAddress.

ERROR (FW-005): [Input] Invalid WORKDIR : project


EXPLANATION:
The value specified for keyword WORKDIR is not a valid directory
USER RESPONSE:
Check either the environment variable PROJECT or global variable WORKDIR to ensure it
is a valid directory.

ERROR (FW-006): [Input] Invalid WORKDIR subdirectory : project/entity


EXPLANATION:
The value specified as an ENTITY is not a valid sub-directory of WORKDIR.
USER RESPONSE:
Check both the environment variable ENTITY and PARTID and validate that their values
represent a valid sub-directory to WORKDIR.

ERROR (FW-007): [Input] Invalid TESTMODE : testmode


EXPLANATION:
The value specified as a testmode is not a valid testmode for the current project and
entity.

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USER RESPONSE:
Check either the environment variable TESTMODE, or the value of the setEnv testmode
method to ensure it is a valid testmode for the current part.

ERROR (FW-008): [Input] Invalid EXPERIMENT : experiment


EXPLANATION:
The value specified as a experiment is not a valid experiment for the current project,
entity, and testmode.
USER RESPONSE:
Check either the environment variable EXPERIMENT, or the value of the setEnv
experiment method to ensure it is a valid experiment for the current testmode.

ERROR (FW-009): [Input] Invalid FAILSET : failset


EXPLANATION:
The value specified as a failset is not a valid failset for the current project, entity,
and testmode, and experiment.
USER RESPONSE:
Check either the environment variable FAILSET, or the value of the set failset method to
ensure it is a valid failset for the current experiment.

ERROR (FW-010): [Input] Invalid DELAYMODEL : delayModel


EXPLANATION:
The value specified as a delay model is not a valid delay model for the current
project, and entity.
USER RESPONSE:
Check either the environment variable DELAYMODEL, or the value of the
setdelaymodel method to ensure it is a valid delay model for the current part.

ERROR (FW-011): [Input] Invalid HOSTADDRESS : hostAddress


EXPLANATION:
The value specified as a host address is not valid. The host address must consist of four
integers, separated by periods, followed by a colon, followed by a fifth integer e.g.
9.130.46.7:5501
USER RESPONSE:

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Check either the environment variable TB_HOSTADDR, or the value of the


setHostAddress method to ensure it is a valid host address.

WARNING (FW-012): [Severe] Graphics connection action of connectionAction not


recognized.
EXPLANATION:
The first argument to the setHostAddress method must be one from the valid action
list: spawn, control, or error. The connection action specified does not match any of these
entries.
USER RESPONSE:
Fix the first argument to setHostAddress. A value of spawn, or no value specified
indicates that if the graphical user interface is working on a different part, then the
connect should not occur, but a new graphical user interface should be created. A value
of error indicates that if the graphical user interface is working on a different part, an
error should occur. A value of control indicates that if the graphical user interface is
working on a different part, the graphical user interface should be forced to work on the
same part as the current script.

ERROR (FW-013): [Tool] Unable to save registration and dependency information


EXPLANATION:
Any global data changes did not become persistent. Global data will not reflect any
updates.
USER RESPONSE:
Check for possible low system resources, or global data write authority.

ERROR (FW-014): [Tool] Failed to remove dependencies on nameObject


EXPLANATION:
The named object is registered in global data, but has failed to remove any dependencies
registered on the object.
USER RESPONSE:
Use TFWgdata to validate that the given named object has registered dependencies. If
so, check for global data write authority.

WARNING (FW-015): nameObject is not registered in global data. No global data


updates occurred.
EXPLANATION:

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The given named object is not registered in global data. No global data updates were
performed. Register the named object into global data first.
USER RESPONSE:
Use the Tcl Command registerObject method to register the named object into
global data.

ERROR (FW-016): [Tool] Failed to register nameObject in global data.


EXPLANATION:
Global data could not register the given object.
USER RESPONSE:
Using TFWgdata, validate the given object is not previously registered, or registered with
dependencies in global data. If not, check for global write authority.

ERROR (FW-017): [Tool] Failed to unregister nameObject in global data.


EXPLANATION:
Global data failed to unregister the given name object.
USER RESPONSE:
Using TFWgdata, validate that the given named object is registered in global data. If so,
then check for global data write authority.

ERROR (FW-018): [Tool] Failed to register dependent child on object parent in global
data.
EXPLANATION:
Global data failed to register the dependent child object to the parent object with a
specified dependency type of file, stat, char, or all.
USER RESPONSE:
Validate that the parent and child objects are registered in global data using TFWgdata.
If so, check for global data write authority.

ERROR (FW-019): [Tool] Failed to unregister dependent child on object parent in


global data.
EXPLANATION:
Global data failed to unregister the child object dependency on the given parent object.

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USER RESPONSE:
Using TFWgdata, validate that the parent and child objects are registered in global data,
and that the child is also registered as a dependency to the parent. If so, check for global
data write authority.

WARNING (FW-020): WORKDIR is set to NULL.


EXPLANATION:
The value specified as WORKDIR is not a valid directory.
USER RESPONSE:
Tcl Gui accepts the NULL value under the assumption that the PROJECT environment
variable is to be unset.

WARNING (FW-021): WORKDIR sub-directory is set to NULL


EXPLANATION:
The value specified as an entity is not a valid sub-directory of the project specified in the
environment variable PROJECT or global variable WORKDIR.
USER RESPONSE:
Tcl Gui accepts the NULL value under the assumption that s the ENTITY environment
variable is to be unset.

WARNING (FW-022): [Severe] Invalid CALLOUT : failset


EXPLANATION:
The value specified as a callout is not a valid callout for the current project, entity,
testmode, and experiment.
USER RESPONSE:
Check either the environment variable CALLOUT, or the value of the setEnv callout
method to ensure it is a valid callout for the current experiment.

WARNING (FW-023): [Severe] Tcl Gui framework method methodName does not
recognize key keyName
EXPLANATION:
Invalid key for Tcl Gui for specified method call.
USER RESPONSE:

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See TCL Gui documentation for a listing of recognized keys for this method.

WARNING (FW-024): Global Data List is NULL for parent pName and child cName
EXPLANATION:
The specified parent and child do not exist in global data.
USER RESPONSE:
Use TFWgdata to verify contents of global data.

WARNING (FW-025): Global Data Stat is NULL for object objName and key keyName
EXPLANATION:
The specified Object and Key do not exist in global data.
USER RESPONSE:
Use TFWgdData to verify contents of global data.

ERROR (FW-026): [Tool] Unable to display the Graphical User Interface viewName
Window.
EXPLANATION:
The viewName could not be displayed. The following are possible causes:
The design model is currently being modified by another application.
The design model could not be loaded.
The TUIgui or TUIserv analysis process could not be started.
USER RESPONSE:
Check for messages in the window from which the Encounter Test GUI was started.
If locking messages are produced, wait until modification of the design model is
complete and then proceed with your analysis. Note that the application
modifying the design model may be one which you started, or one which is
being run by a colleague.
If you see messages concerning the hierModel or hierAttributes file, it
may indicate that the file is corrupt or incomplete. Try rebuilding the model. If
this does not fix the problem, contact customer support (see Contacting
Customer Service on page 23).

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If you see messages concerning TUIgui or TUIserv, this likely indicates a


path or installation problem. Contact your local Cadence tool support person. If
that does not resolve the problem, contact customer support (see Contacting
Customer Service on page 23).

ERROR (FW-028): [Tool] Unable to display the objectType objectIndex.


EXPLANATION:
The specified objectType failed to be displayed on View Schematic Display. The
index must be zero or greater, and less than the total number for objectType.
USER RESPONSE:
Enter a valid objectType for the desired objectIndex.

INFO (FW-029): There are no messages to view.


EXPLANATION:
There are no messages available for the application.
USER RESPONSE:
No response required.

WARNING (FW-030): Problem detected while closing GlobalData.


EXPLANATION:
The closing of globalData for the current part detected some difficulties. It may be the file
was already closed.
USER RESPONSE:
Check permissions. Refer to any previous TFW messages. If the file was already closed,
no previous TFW message will exist.

ERROR (FW-031): [Input] -workdir and -projectname are mutually exclusive.


EXPLANATION:
When opening a project, either -workdir or -projectname can be specified, but not
both.
USER RESPONSE:
Only specify one option, not both.

ERROR (FW-032): [Input] workdir is not a valid project (part) directory.

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EXPLANATION:
The specified project (part) directory does not preexis, or was incorrectly entered from
the TCL command.
USER RESPONSE:
Provide a valid preexisitng project directory or use the new_project TCL command to
create a new project directory.

ERROR (FW-033): [Input] The specified Alias: projectName, is unknown.


EXPLANATION:
The TCL open_project command cannot find the specified preexisting alias that
represents a project (part) directory.
USER RESPONSE:
Use TCL open_project -workdir option and specify the fully qualified project (part)
directory instead of using the alias option -projectname. To create an alias, specify the
fully qualified project directory using the -workdir option and the
-newprojectname aliasname option. Subsequently, when calling open_project,
specify just the -projectname aliasname.

WARNING (FW-034): No value specified for -projectname, ignoring option.


EXPLANATION:
The TCL open_project command requires a value specified when using the option
-projectname.
USER RESPONSE:
The -projectname option value is an aliasname for a project (part) directory. This
option is typically used instead of specifying a fully qualified part directory using the -
workdir option. The aliasname must preexist in order to use this option. See
open_project in the Encounter Test: Reference: Commands for additional
information.

INFO (FW-035): Unrecognized argument: theArg, ignoring option.


EXPLANATION:
The TCL command did not recognize the input argument option and ignores it.
USER RESPONSE:

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See the Encounter Test: Reference: Commands for the TCL commands list of valid
options, or utilize the TCL commands -h (HELP) option.

INFO (FW-036): Unrecognized argument: theArg, ignoring value.


EXPLANATION:
An argument value was found without a corresponding option, and is ignored.
USER RESPONSE:
See the Encounter Test: Reference: Commands for the TCL commands list of valid
options, or utilize the TCL commands -h (HELP) option.

INFO (FW-037): No project directory specified, using default current directory.


EXPLANATION:
The TCL command did not detect options specified that indicated a project (part)
directory, and is therefore using the current working directory as the project directory.
USER RESPONSE:
Refer to open_project in the Encounter Test: Reference: Commands or use the -h
option for more details on entering a specified project directory to override the defaulted
behavior for the TCL command.

WARNING (FW-038): [Severe] Failed to create Alias: aliasname, Reason:


theErrorCode
EXPLANATION:
The Tcl command failed in the attempt to create an Alias directory to hold the new Alias
in the users Home directory.
USER RESPONSE:
Check permissions or disk space on the home directory or contact Cadence support (see
Contacting Customer Service on page 23).

ERROR (FW-039): [Input] The specified -setupfile setupfile, is an invalid file.


EXPLANATION:
The TCL command does not recognize the specified setupfile as a valid file type.
USER RESPONSE:
Make sure the specified setupfile is a preexisting file and that it is specified as a fully
qualified filename.

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INFO (FW-040): The -setupfile option is not specified - defaulting to filename


setupfile.
EXPLANATION:
The TCL command did not detect the option -setupfile specified. The defaulted
filename: setup, found in the current working directory will be used.
USER RESPONSE:
To override the default, -setupfile must be specified with a fully qualified filename.

INFO (FW-041): Proceeding without a setupfile...


EXPLANATION:
The TCL command did not detect the option -setupfile specified. The defaulted
filename: setup could not be found in the current working directory. Therefore, no
setupfile will be utilized.
USER RESPONSE:
If a setup file is desired, specify the -setupfile option with a fully qualified filename, or
ensure a file named setup (the default name) is in the current working directory.

ERROR (FW-042): [Input] Create project failed because dirname is not a valid directory.
EXPLANATION:
The TCL command new_project failed to create a new project (part) directory because
the fully qualified path that will contain the new project directory is invalid.
USER RESPONSE:
Specify a valid pathname (directory structure).

ERROR (FW-043): [Tool] Failed to create the project directory: projectname, Error
theErrorCode
EXPLANATION:
The Tcl command failed in the attempt to create a new project (part) directory.
USER RESPONSE:
Check for directory write permissions, or contact Cadence support (see Contacting
Customer Service on page 23).

ERROR (FW-044): [Tool] Failed to create the project directory: projectName/tbdata,


Error theErrorCode

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EXPLANATION:
The Tcl command failed in the attempt to properly create a new project (part) directory
structure.
USER RESPONSE:
Check for directory write permissions, or contact Cadence support (see Contacting
Customer Service on page 23).

INFO (FW-045): The -projectname option to create an Alias was not specified. Defaulting
Alias value to projectname.
EXPLANATION:
When creating a new project, an alias for the project directory must be specified through
option -projectname. If it is not specified, the tail of the fully qualified new project is
used as the aliasname by default.
USER RESPONSE:
Specify the -projectname option with a value to override this default behavior.

WARNING (FW-046): Setup file invalid syntax, ignoring entry : setupfilename.


EXPLANATION:
While processing user-specified setupfile, a syntax error was detected in a line item
specification, and was ignored.
USER RESPONSE:
Refer to Setup and Methodology Files Overview in the Encounter Test: Reference:
GUI for proper syntax when creating a setup file for a project.

WARNING (FW-047): Catch Error - catchErr : Setup file invalid syntax, ignoring entry :
setupfileline.
EXPLANATION:
While processing user specified setupfile, a syntax error was detected in a line item
specification, was caught by set_global, and was ignored.
USER RESPONSE:
Refer to Setup and Methodology Files Overview in the Encounter Test: Reference:
GUI for proper syntax when creating a setup file for a project.

WARNING (FW-048): [Severe] The specified -setupfile setupfile does not exist.

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EXPLANATION:
The TCL command does not recognize the specified setupfile.
USER RESPONSE:
Make sure the specified setupfile is a preexisting file and that it is specified as a fully
qualified filename.

WARNING (FW-049): [Severe] The specified -setupfile setupfile does not have
read permissions.
EXPLANATION:
The TCL command cannot open for "read" the specified setupfile.
USER RESPONSE:
Change permissions on the file to read access.

ERROR (FW-050): [Input] The specified -methfile mfile is an invalid file.


EXPLANATION:
The TCL command does not recognize the specified methodology file as a valid file type.
USER RESPONSE:
Make sure the specified methodology file is an existing file and that it is specified as a
fully qualified filename.

FW-051 through FW-100


INFO (FW-051): The -methfile option is not fully qualified - defaulting to filename
EXPLANATION:
The TCL command did not detect a fully qualified path for option -methfile. The TCL
command will use the current working directory to find it.
USER RESPONSE:
To override the default using current working directory, -methfile must be specified
with a fully qualified filename.

WARNING (FW-052): [Severe] TNo design model could be found for this project. The file
hierModel does not exist.

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EXPLANATION:
The requested operation requires a design model, but the model was not found.
USER RESPONSE:
If you have not yet built the model, build it and then try your view request again. If you
copied this part from elsewhere, check to make sure that the hierModel file was copied.
If the hierModel is a symbolic link, make sure that the link is valid.

WARNING (FW-053): [Severe] The testmode tmode is not registered in global data.
EXPLANATION:
The given TESTMODE for the current design is invalid.
USER RESPONSE:
Utilize the getGdList method to retrieve a valid list of testmodes for the current
WORKDIR.

WARNING (FW-054): [Severe] The experiment experiment is not registered in global


data.
EXPLANATION:
The given EXPERIMENT for the current design is invalid.
USER RESPONSE:
Utilize the getGdList method to retrieve a valid list of experiments for the current
WORKDIR.

WARNING (FW-055): [Severe] The delaymodel delaymodel is not registered in global


data.
EXPLANATION:
The given DELAYMODEL for the current design is invalid.
USER RESPONSE:
Utilize the getGdList method to retrieve a valid list of delaymodels for the current
WORKDIR.

WARNING (FW-056): [Severe] The failset failset is not registered in global data
EXPLANATION:
The given FAILSET for the current design is invalid.

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USER RESPONSE:
Utilize the getGdList method to retrieve a valid list of failsets for the current WORKDIR.

WARNING (FW-057): [Severe] The callout callout is not registered in global data.
EXPLANATION:
The given ALTCALLOUT for the current design is invalid.
USER RESPONSE:
Utilize the getGdList method to retrieve a valid list of callouts for the current WORKDIR.

WARNING (FW-058): [Severe] Invalid ALTFAULT: altfault


EXPLANATION:
The value specified as an alternate fault model is not valid for the current project and
entity (WORKDIR).
USER RESPONSE:
Use TFWgdata to determine a valid list of alternate fault models registered in global data
for the current WORKDIR (project and entity).

WARNING (FW-059): [Severe] The alternate fault model altfault is not registered in
global data.
EXPLANATION:
The given value of ALTFAULT keyword for the current design is invalid.
USER RESPONSE:
Utilize the the TFWgdata binary or the Tcl getGdList method to retrieve a valid list of
alternate fault models for the current WORKDIR.

ERROR (FW-060): [Input] Invalid application name appName was specified.


EXPLANATION:
The specified application window failed to be displayed for the given application name.
USER RESPONSE:
Check for valid application name, Otherwise, contact Cadence support. Refer to
Contacting Customer Service on page 23.

INFO (FW-061): The testresults project directory will not be removed.

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EXPLANATION:
The Encounter Test data created within the project testresults directory will not be
removed from the project.
USER RESPONSE:
No response required.

ERROR (FW-062): [Input] Delete aborted - WORKDIR workdir is a back-leveled project.


EXPLANATION:
The specified project (WORKDIR) has globaldata detected in its top level directory
structure. This indicates the project requested for removal is a back-leveled part
directory. No attempt is made to remove any data from this type of project. type of project.
USER RESPONSE:
Automated removal is not available for back-leveled projects.

)ERROR (FW-063): Catch Error: catchError - Delete project failure in projectDir


EXPLANATION:
Failed to remove the directory within the specified project.
USER RESPONSE:
Check permissions or contact Cadence support (see Contacting Customer Service on
page 23).

ERROR (FW-064): [Input] Project workdir preexists, new project request aborted.
EXPLANATION:
Detected a pre-exisitng tbdata directory when requesting the creation of a new project
for the specified project directory.
USER RESPONSE:
Use the delete_project tcl command prior to the new_project command request
on a preexisting part. This will remove any preexisting tbdata and testresults data
in a project directory.

WARNING (FW-065): Warning : catchError- Failed to remove alias link aliasLink.


EXPLANATION:

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Failed to remove an alias symbolic link previously established for a project that is deleted.
These links will continue to be displayed in the Encounter Test Open Project window.
USER RESPONSE:
Check permissions or contact customer support (see Contacting Customer Service on
page 23).

ERROR (FW-066): [Input] Fail Set not specified\


EXPLANATION:
A fail set was specified. Fail set was not defined in the current environment.
USER RESPONSE:
See fwTuiCmnd Itcl class setEnv method for setting environment variables into the
environment.

WARNING (FW-067): [Severe] Failed to launch the Physical Design Viewer.


EXPLANATION:
An internal error was detected while attempting to allocate resources for the launching
of the Physical Design Viewer. This error should be accompanied by additional error
messages in the console.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) and provide
this message and the accompanying console messages.

ERROR (FW-068): [Tool] Failed to close the Physical Design Viewer.


EXPLANATION:
An error was detected while attempting to deallocate the Physical Design Viewer
resources.This error should be accompanied by additional error messages in the
console.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) and provide
this message and the accompanying console messages..This error is also indicative of
an extraneous TUIxComm process that is still running. If this is the case, manually kill this
process.

ERROR (FW-069): [Tool] Failed to launch the Physical Design Viewer.

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EXPLANATION:
An internal error was detected while attempting to launch the Physical Design Viewer.
This error may be accompanied by additional error messages in the xterm window from
which the Encounter Test GUI was launched.
USER RESPONSE:
Follow the instructions given in the message. If there are no instructions, contact
Cadence Customer Support (see Contacting Customer Service on page 23) with this
message and the accompanying xterm messages.

WARNING (FW-070): Specified global METHODOLOGY orgMeth does not exist.


Defaulting value.
EXPLANATION:
The specified globals METHODOLOGY value from setup file is invalid. The value for it is
overridden with a default value dependent upon product.
USER RESPONSE:
Utilize method update_project to reset the project METHODOLOGY value within the
existing project.

WARNING (FW-071): Failed to load the specified physical design.


EXPLANATION:
The layout specified by Library, Cell, and View in the Project set up could not be loaded
by the Physical Design Viewer.
USER RESPONSE:
Verify/correct the Library, Cell, and View specifications in the Project set up and retry..

WARNING (FW-072): [Severe] Write permission failure.


EXPLANATION:
Write permission access is unavailable for the directory.
USER RESPONSE:
Validate that WORKDIR and subsequent directories have write permissions set.

INFO (FW-074): The Physical Design Viewer could not be launched because the necessary
Test_Mfg_Analysis license is not currently available.
EXPLANATION:

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The Physical Design Viewer could not be launched because a Test_Mfg_Analysis


license is not currently available.
USER RESPONSE:
Obtain a license and relaunch the Physical Design Viewer.

WARNING (FW-075): The set environment request for keyword keyword failed. Your
environment may be full.
EXPLANATION:
Your request to set an environment value for the specified keyword failed, probably
because your environment is full.
USER RESPONSE:
Remove unnecessary keywords from your environment, and retry your request.

WARNING (FW-076): Unable to display the Graphical User Interface viewName Window.
EXPLANATION:
The referenced window could not be displayed because it is not valid when the circuit
model is being edited.
USER RESPONSE:
Complete your edits for the circuit model and then retry your view request.

ERROR (FW-077): An unexpected error occurred for opcode opcode. The return code was
return code.
EXPLANATION:
An unexpected error occurred in your Encounter Test graphical analysis. The opcode
that caused the error has been listed.
USER RESPONSE:
Complete your edits for the circuit model and then retry your view request.

INFO (FW-078): Failed to establish a connection with the Physical Design Viewer on
machine machine name|IP address and port port_number. Cross-probing is not
enabled.
EXPLANATION:
Encounter Test was unable to successfully establish communication with the specified
physical design viewer session identified by the referenced machine and port

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specification. Consequently, the cross- probing capabilities supported by the Encounter


Test GUI are not enabled for use with the specified physical design viewer.
USER RESPONSE:
Ensure the machine and port specifications correctly identify an existing physical design
viewer process and rerun.

WARNING (FW-079): [Severe] Unable to display the viewName window. The testmode
could not be established.
EXPLANATION:
The viewName window could not be displayed. Following are the possible reasons:
The testmode does not exist.
The testmode data is corrupt.
USER RESPONSE:
Ensure that the specified testmode exists. If not, choose a different testmode. If the
testmode exists, check for messages in the window from which the Encounter Test GUI
was started. Contact Cadence Customer Support (see Contacting Customer Service
on page 23) and report any messages observed.

WARNING (FW-080): [Severe] The requested testmode could not be established. If there
was a previously selected testmode, it is still in effect.
EXPLANATION:
The requested testmode could not be set for analysis. Following are the possible
reasons:
The testmode does not exist.
The testmode data is corrupt.
If a testmode was previously selected, it will continue to be in effect. If there was no
previously selected testmode, there is none in effect now. The current testmode can be
determined by examining the Analysis Context window.
USER RESPONSE:
Ensure that the specified testmode exists. If not, choose a different testmode. If the
testmode exists, check for messages in the window from which the Encounter Test GUI
was started. Contact Cadence Customer Support (see Contacting Customer Service
on page 23) and report any messages observed.

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WARNING (FW-081): [Severe] Unable to display the viewName window. The testmode
could not be established because the testmode data was created before 2004. This mode
must be rebuilt using build_testmode.
EXPLANATION:
The viewName window could not be displayed. The specified testmode was created
before 2004 and cannot be automatically migrated to conform to the current testmode
data format.
USER RESPONSE:
Use the build_testmode command to rebuild the testmode.

WARNING (FW-082): [Severe] The requested testmode could not be established because
the testmode data was created before 2004. This mode must be rebuilt using
build_testmode. If there was a previously selected testmode, it is still in effect.
EXPLANATION:
The requested testmode could not be set for analysis. The specified testmode was
created before 2004 and cannot be automatically migrated to conform to the current
testmode data format.
If a testmode was previously selected, it will continue to be in effect. If there was no
previously selected testmode, there is none in effect now. The current testmode can be
determined by examining the Analysis Context window.
USER RESPONSE:
Use the build_testmode command to rebuild the testmode.

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7
TBD - Generate Test Pattern Data
Messages

TBD-001 through TBD-050 on page 97


TBD-051 through TBD-100 on page 110
TBD-101 through TBD-230 on page 122
TBD-231 through TBD-999 on page 133

TBD-001 through TBD-050


ERROR (TBD-001): [Input] Failure to read file header from input test vectors file. File
name: fileName is not complete and must be rebuilt. The log file for the Encounter Test
command which created the test vectors file should be inspected for errors. Correct any
problems found before recreating the test vectors file.
EXPLANATION:
The input test vectors file or sequence file is incomplete and cannot be processed.
USER RESPONSE:
Ensure that the application creating the input test vectors or sequence file successfully
completed. Review the log file for the Encounter Test command that created the input test
vectors file. Correct any errors found before attempting to recreate inputs and then rerun.

ERROR (TBD-002): [Input] Filename: fileName was created using a newer version of
Encounter Test software than the one you are currently running. You must either return to the
version of Encounter Test software which was used to create the input file or recreate the
input file in your current version of Encounter Test software.
EXPLANATION:
The input file was created using a newer version of the Encounter Test than you are
currently running.

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USER RESPONSE:
Use the Encounter Test software that was used to create the input file or recreate the
input in your current version of Encounter Test software.

ERROR (TBD-003): [Input] Open binary pattern file : error - no name returned from
TFWgetExperFilename. Circuit qualifiers were incorrectly specified.
EXPLANATION:
Design qualifiers were incorrectly specified.
USER RESPONSE:
Ensure the working directory is correctly specified and then rerun.

ERROR (TBD-004): [Input] Could not open Filename: fileName. Ensure that the working
directory was correctly specified and that you have the necessary file permissions.
EXPLANATION:
The application failed while attempting to open the output test vectors file.
USER RESPONSE:
Ensure the working directory is correctly specified and that you have write authority to
your working directory and then rerun.

ERROR (TBD-005): [Tool] Space allocation failed. program cannot allocate space for
table. Rerun when more space is available.
EXPLANATION:
Sufficient space was not available to run the requested application.
USER RESPONSE:
Rerun when more space is available.

ERROR (TBD-006): [Internal] Invalid node (pinName) in pulse data. Non-clockindex


found in pulse event. Contact Cadence Test Customer Support for assistance.
EXPLANATION:
A non-clock index was found in a pulse command. This is a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

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ERROR (TBD-007): [Internal] Write test vector error - TLMgetContext returned NULL.
Contact Cadence Customer Support for assistance..
EXPLANATION:
The program cannot establish model context. This is a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-008): [Input] Write test vector error - rc = NNN received from
TLMloadModel. Ensure that the working directory is correctly specified.
EXPLANATION:
The flatModel cannot be loaded.
USER RESPONSE:
Rerun after ensuring that WORKDIR is correctly specified. If this fails to correct the
problem, contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-009): [Tool] Failed attempting to write filename: fileName. Insufficient


space was available to create the requested pattern file. Ensure that enough space is
available in your working directory before restarting your job.
EXPLANATION:
Insufficient space was available to create the requested output file.
USER RESPONSE:
Ensure that sufficient space exists and rerun. If this fails to correct the problem, contact
customer support (see Contacting Customer Service on page 23) for assistance.

ERROR (TBD-010): [Tool] TBDallocateWorkArea: error - malloc returned NULL; size


= NNN.
EXPLANATION:
Space allocation failed.
USER RESPONSE:
Ensure that sufficient space exists and rerun the job. If this fails to correct the problem,
contact customer support (see Contacting Customer Service on page 23) for
assistance.

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ERROR (TBD-011): [Input] TBDopenPatternFile: error - no name returned from


TFWgetExperFileName or TFWgetModalFileName. Ensure that your working directory is
correctly specified.
EXPLANATION:
Program parameters were incorectly specified,
USER RESPONSE:
Rerun after ensuring the working directory is correctly specified.

ERROR (TBD-012): [Input] TBDopenPatternFile: error opening pattern output file:


fileName. Ensure that your working directory is correctly specified.
EXPLANATION:
Program parameters were incorectly specified,
USER RESPONSE:
Rerun after ensuring the working directory is correctly specified.

ERROR (TBD-015): [Tool] TBDwriteBinaryFile failed to write test vectors to the output
vectors file. Refer to previous error messages. Contact Cadence Customer Support for
assistance If previous messages do not help resolve the problem.
EXPLANATION:
The program failed while trying to write the output test vectors file. The log contains
previous messages that may assist in resolving the problem.
USER RESPONSE:
Refer to previous messages. Contact customer support (see Contacting Customer
Service on page 23) if previous messages do not help to resolve the problem

ERROR (TBD-016): [Tool] TBDwriteBinaryTestProcedure error writing out a test


procedure to the test vectors file. Refer to previous error messages. Contact Cadence
Customer Support for assistance If previous messages do not help resolve the problem.
EXPLANATION:
The program failed while trying to write a test procedure to the test vectors file. The log
contains previous messages that may assist in resolving the problem.
USER RESPONSE:
Refer to previous messages. Contact customer support (see Contacting Customer
Service on page 23) if previous messages do not help to resolve the problem

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ERROR (TBD-017): [Input] TBDopenBinaryFile: error - unable to open test vectors file.
Ensure the working directory is correctly specified and rerun.
EXPLANATION:
The program filed while trying to open the test vectors file.
USER RESPONSE:
Rerun after ensuring the working direcotory is correctly specified. Contact customer
support (see Contacting Customer Service on page 23) if the failure still occurs.

ERROR (TBD-018): [Input] Error printing ASCII pattern file. Ensure the working directory
is correctly specified and rerun.
EXPLANATION:
The program failed while trying to print a test vectors file or sequence file.
USER RESPONSE:
Rerun after ensuring the working directory is correctly specified. that WORKDIR,
TESTMODE and EXPERIMENT are specified correctly. Contact customer support (see
Contacting Customer Service on page 23) if the failure still occurs.

ERROR (TBD-019): Error opening input Filename fileName. Ensure that the file exists
and that you have the necessary file permissions.
EXPLANATION:
Failure while trying to open the specified input file.
USER RESPONSE:
Ensure that the input file exists. Recreate the file if it has been deleted. Ensure that
necessary file permisions exist before restarting the job. Refer to log that created the
input file. Correct any errors which may have caused the file not to be created.
Rerun after ensuring all identified problems have been corrected. If the failure persists,
contact customer support (see Contacting Customer Service on page 23).

ERROR (TBD-020): [Input] Design data within the Filename: fileName does not match
this design.
EXPLANATION:
Test vectors in the specified file were created on a different design. The number of input
pins, output pins, scan latches, and scan registers do not match this design.
USER RESPONSE:

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Recreate test vectors for the current design and rerun.

ERROR (TBD-021): [Input] Error in the Vector Correspondence file. Correct the error and
rerun.
EXPLANATION:
The program detected an error in the vector correspondence file.
USER RESPONSE:
Correct problems in the vector correspondence file and then rerun the job. Refer to
TBDpatt and TBDseqPatt Format in the Encounter Test: Reference: Test Pattern
Formats for vector correspondence file information.

ERROR (TBD-022): Error detected attempting to update the faultModel. Correct the
faultModel problems before rerunning commit_tests.
EXPLANATION:
The commit_tests command is unable to update the faultModel with the test results
for this experiment due to errors in the faultModel.
USER RESPONSE:
Refer to previous faultModel messages. Rerun after correcting faultModel problems. If
problems persist, contact customer support (see Contacting Customer Service on
page 23).

ERROR (TBD-022): Error detected attempting to update the master faultStatus file. The
TFM function failed. Review prior TFM messages to identify and correct any problems before
rerunning commit_tests. It maybe necessary to review the logfile of the process which
created this experiment to determine what caused the problem.
EXPLANATION:
commit_tests is unable to update the faultModel with the test results for this
experiment because of faultModel errors. To prevent corrupting the master test vectors
file commit_tests terminates.
USER RESPONSE:
Refer to previous TFM messages in the commit_tests logfile. Failure maybe the result
of problems in the test generation/simulation run that created this experiment and it
maybe helpful to review that logfile. After correcting any faultModel problems, rerun your
commit_tests job. If problems persist, contact customer support (see Contacting
Customer Service on page 23) for assistance.

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ERROR (TBD-023): Error - failure attempting to lock objectName object. Object is not
registered on the globalData file or wrong input parameters specified.
EXPLANATION:
Object indicated in the messages is not registered on the globalData file. Wrong input
parameters could have been specified.
USER RESPONSE:
Refer to previous messages. Rerun after correcting any problems. If problems persist,
contact customer support (see Contacting Customer Service on page 23) for
assistance.

WARNING (TBD-024): [Severe] commit_tests failed while trying to register the master
Committed tests file on the globalData file.
EXPLANATION:
After creating or updating the master Committed tests file, commit_tests was unable
to register the master Committed tests file on the globalData file.
USER RESPONSE:
Applications which use our system expect this file to be registered and will fail when
asked to run on this data. The only path which will get this data back into our system will
require:
1.Perform report_vectors on the Committed Tests.
2.Perform read_vectors on the TBDpatt file.
3.Resimulate the Uncommitted tests you created.
4.Rerun commit_tests to create a new Committed tests file.

WARNING (TBD-025): [Severe] commit_tests failed while trying to register the


committed tests file dependencies on the globalData file.
EXPLANATION:
The program failed while trying to register the committed tests file dependent on the
testmode.
USER RESPONSE:
If you rebuild the testmode, the committed tests file will not be automatically deleted.
Delete the file manually.

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WARNING (TBD-026): [Severe] commit_tests failed while trying to remove the


uncommitted test file and dependencies from the globalData file.
EXPLANATION:
As a normal part of processing commit_tests deletes and unregisters uncommitted
files and dependencies.
USER RESPONSE:
If this happens you may have experimental files still in existence at the end of your job.
These files must be manually deleted.

WARNING (TBD-027): [Severe] commit_tests failed while removing the experiment


object from the globalData file.
EXPLANATION:
commit_tests failed while trying to unregister the experiment from the globalData file.
USER RESPONSE:
The experiment name is still registered on the globalData file. If you create additional
experiments, use different experiment names to ensure there is no conflict.

ERROR (TBD-028): [Input] Error - rc = NNN received from TLMsetMode. for test mode
modename. Ensure the specified testmode exists.
EXPLANATION:
The program failed while trying to load the Encounter Test test mode.
USER RESPONSE:
Rerun after ensuring the test mode is correctly specified. If the test mode is correctly
specified, ensure that previous steps which created the test mode successfully
completed. If the application is still failing after ensuring that the test mode is correct,
contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-029): [Input] Missing argument: specify parameter. Rerun after adding
the missing argument.
EXPLANATION:
The identified program parameter was missing.
USER RESPONSE:

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Rerun report_vectors specifying the missing parameter. Specify, report_vectors


-h for a complete list of all report_vectors options.
Refer to "report_vectors" in the Encounter Test: Reference: Commands for additional
information.

ERROR (TBD-030): [Internal] TBDskew error: Non-existent event type. Line: offset.
Contact customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-031): [Internal] TBDskew error: NULL TestSequenceID. Line: offset.


Contact customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-032): [Internal] TBDskew error: NULL TestPatternID. Line: offset.


Contact customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-033): [Internal] TBDskew error: program failed setting the pattern type. Line:
offset. Contact customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:

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Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-034): [Internal] TBDskew error: NULL EventID. Line: offset. Contact
customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-035): [Internal] TBDskew error: program failed setting the event type. Line:
offset. Contact customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-036): [Internal] TBDskew error: program failed setting the timed type. Line:
offset. Contact customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-037): [Internal] TBDskew error: program failed adding stim data. Line:
offset. Contact customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

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ERROR (TBD-038): [Internal] TBDskew error: program failed adding pattern data. Line:
offset. Contact customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-039): [Internal] TBDskew error: program failed adding measure data. Line:
offset. Contact customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-040): [Internal] TBDskew error: program failed adding pulse data. Line:
offset. Contact customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR(TBD-041): [Internal] TBDskew error: nsl pattern failed. Line: offset. Contact
customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-042): [Internal] TBDskew error: nsl pattern type failed. Line offset.
Contact customer support for assistance.

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EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-043): [Internal] TBDskew error: non-RSL or RML found in StimLatch event.
Line: offset. Contact customer support for assistance.
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-044): TBDwriteBinaryFile failed while trying to put the experimental


PattAuditStats to the globalData file. Refer to previous error messages and correct
any problems before rerunning.
EXPLANATION:
The experimental PattAuditStats were not written to the globalData file. The test
vectors file was not written.
USER RESPONSE:
Refer to previous messages. Rerun after correcting problems. If problems persist,
contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-045): TBDwriteBinaryFile failed while trying to get the experimental


PattAuditStats from the globalData file. Refer to previous error messages and correct
any problems before rerunning.
EXPLANATION:
The experimental PattAuditStats were not found on the globalData file. Test data
counts for the experiment could not be updated.
USER RESPONSE:

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Refer to previous messages. Rerun after correcting any problems. If problems persist,
contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-046): [Internal] commit_tests failed while trying to get the master
PattAuditStats from the globalData file. Contact Cadence Customer Support for
assistance.
EXPLANATION:
The master PattAuditStats were not found on the globalData file. This is a
program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-047): [Internal] commit_tests failed while trying to get the experimental
PattAuditStats from the globalData file. Contact Cadence Customer Support for
assistance.
EXPLANATION:
The experimental PattAuditStats were not found on the globalData file. This is a
program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-048): [Internal] commit_tests failed while trying to commit the


experimental PattAuditStats to the committed PattAuditStats. Contact Cadence
Customer Support for assistance.
EXPLANATION:
Update of the master PattAuditStats failed. This is a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-049): [Input] Audits indicate that the test vectors contained within this
uncommitted tests file may be suspect. If you wish to commit these uncommitted tests to the
committed tests file, you must do an unconditional commit.

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EXPLANATION:
Potential problems exist in the test vectors.
USER RESPONSE:
Review previous messages for a list of potential problems. After reviewing the list of
potential problems with the test vectors, if you still wish to commit these vectors to the
committed tests file, perform an unconditional commit. Using the unconditional commit
performs the normal commit_tests checking and forces the uncommitted tests to be
committed.

ERROR (TBD-050): [Tool] Error expanding the test vectors file. Refer to previous error
messages for problem details.
EXPLANATION:
An error occurred while trying to expand the file.
USER RESPONSE:
Refer to previous error messages, resolve the identified errors and then rerun. If no
errors are reported, contact customer support (see Contacting Customer Service on
page 23) for assistance.

TBD-051 through TBD-100


ERROR (TBD-051): [Input] When expanding test vectors, INEXPERIMENT must be
different then EXPERIMENT.
EXPLANATION:
The INEXPERIMENT and EXPERIMENT have the same name. They must be different.
USER RESPONSE:
Change the EXPERIMENT name to a unique identifier.

ERROR (TBD-052): [Tool] Unable to obtain a read lock on the objectName object.
EXPLANATION:
The object indicated in the messages is not currently available. Object may not be
registered. Input parameters may be specified incorrectly.
USER RESPONSE:
Rerun job after object has been freed.

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WARNING (TBD-053): [Severe] Unable to register the expanded uncommitted tests file on
the globalData file. Check file permissions.
EXPLANATION:
The program was unable to register the expanded uncommitted tests file.
USER RESPONSE:
If this file is to be used as input to an application requiring the file to be registered, then
do the following:
Check the globalData file and correct any problems which might prevent
writing to it (for example, file permissions).
Rerun report_vectors to recreate the expanded uncommitted tests and
register it.

WARNING (TBD-054): [Severe] Unable to register the uncommitted tests file


dependencies on the globalData file.
EXPLANATION:
Processing failed while trying to register the uncommitted tests file dependent on the
testmode. However, the expanded uncommitted tests file itself is accurate.
USER RESPONSE:
If you rebuild the test mode, the uncommitted tests file will not be automatically deleted.
It must be manually deleted.

ERROR (TBD-055): [Tool] Unable to obtain a write lock on the objectName object.
EXPLANATION:
The program was unable to write lock the referenced object. The object may be
unavailable or not registered on globalData. Input parameters may be specified
incorrectly.
USER RESPONSE:
Correct any errors and rerun the program and see if the problem still exists. If the problem
presists, call customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-056): Error while trying to expand file workdir/TBDpatt.


testMode.inexperiment. Refer to previous messages to determine the problem.
Contact Cadence Customer Support for assistance if unable to correct the problem.

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EXPLANATION:
An error occurred. Previous error messages describe the error condition.
USER RESPONSE:
Refer to the previous error messages for more information. Contact customer support
(see Contacting Customer Service on page 23) if you cannot resolve the problems.

ERROR (TBD-057): The number scan cycles in the scanfill sequence is greater then the
scanfill length. Either the scanfill length or the scanfill Sequence_Definition is incorrect.
The number of scan cycles in the scanfill sequence must match the scanfill length.
Processing terminates.
EXPLANATION:
The number of scan cycles found within the scanfill sequence must match the scanfill
length.
USER RESPONSE:
Correct either the scanfill length or the scanfill sequence then rebuild your testmode.
After rebuilding your testmode rerun the your job.

ERROR (TBD-058): Unable to allocate NNN bytes. Ensure that sufficent space is available
and rerun
EXPLANATION:
Space allocation failed.
USER RESPONSE:
Ensure that sufficient space exists and rerun the job.

ERROR (TBD-059): [Internal] Test Vector files containing eventName events cannot be
expanded by the function routine.
EEXPLANATION:
The referenced event type is not currently supported for expansion. This was either due
to a program error, or the input file was created with a previous release of Encounter Test
(earlier than Version 1 Release 2).
USER RESPONSE:
If the input file was created with a previous release of Encounter Test (earlier than
Version 1 Release 2), recreate your test data using this Encounter Test release and

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rerun. Otherwise, call customer support (see Contacting Customer Service on


page 23) for assistance.

ERROR (TBD-060): [Internal] commit_tests failed while trying to commit the


experimental MacroAuditStats to the master MasterAuditStats. Contact Cadence
Customer Support for assistance.
EXPLANATION:
Update of the Master MacroAuditStats failed. This is a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-067): [Input] Filename: fileName is not complete and must be rebuilt. The
log file for the Encounter Test command which created the input test vectors file should be
inspected for errors. Correct any problems found before recreating the test vectors file.
EXPLANATION:
The input test vectors file or sequencefile is incomplete and cannot be processed.
USER RESPONSE:
Ensure that the application creating the input test vectors or sequence file successfully
completed. Review the log file for the command that created the input test vectors file.
Correct any detected errors before attempting to recreate the input file.

ERROR (TBD-068): Error writing to Filename: filename. Write to file offset offset
failed. Before restarting your process ensure that enough space is available in your working
directory.
EXPLANATION:
Encounter Test failed while attempting to write the referenced output file.
USER RESPONSE:
Ensure that enough space is available and then rerun.

ERROR (TBD-069): [Input] commit_tests was unable to commit test data. Failed
attempting to open file fileName. The input file is bad. Refer to previous messages, correct
problems, and rerun.
EXPLANATION:
commit_tests failed when asked to open the specified input file. The input file is bad.

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USER RESPONSE:
Refer to previous messages. Rerun your job(s) after correcting any problems. If problems
persist, contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-070): These test vectors can not be migrated. Compression test vectors are
only migrated if the testmode was built using boundary=migrate. Processing terminates.
EXPLANATION:
The testmode was not build specifing boundary=migrate. Test vectors an not be
migrated.
USER RESPONSE:
If migration is required you must rebuild your testmode specifying boundary=migrate.
Recreate your test vectors and then rerun prepare_macro_migration_tests.

ERROR (TBD-073): Unable to process Filename: fileName using restart=yes because


the file checkpoint could not be found. Restart your process specifying restart=end.
EXPLANATION:
The requested checkpoint could not be found in the test vectors file. Processing can not
continue using restart=yes.
USER RESPONSE:
The application that created the test vectors file did not successfully complete and
checkpoint information is incomplete. The program cannot add to the input test vectors
file. Rerun using restart=end. Review the log file for the Encounter Test command that
created the input test vectors file. Correct any errors found before attempting to generate
additional test vector files.

ERROR (TBD-074): Invalid attempt to open checkpointed file fileName with write access
ignored. Checkpointed test vectors file can only be exported to TBDpatt file or used to
continue a test generation run.
EXPLANATION:
An application attempted to update the checkpointed vectors file. A checkpointed test
vectors file has limited use: it cannot be committed or used other than for printing, except
to continue the checkpointed run.
USER RESPONSE:

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Rerun test generation with this experiment to complete the checkpointed test vectors file,
then rerun.

WARNING (TBD-075): [Severe] Vector file checkpoint failed. Refer to previous messages
to determine the problem.
EXPLANATION:
Checkpoint of test vectors file failed.
USER RESPONSE:
Review previous messages to determine and resolve the problem and then rerun.

ERROR (TBD-076): TBDcloseBinaryFile: failure to close test vectors file: fileName.


Refer to previous messages to determine the problem.
EXPLANATION:
The test vector file failed to close.
USER RESPONSE:
Look for system messages such as "afs out of space". Rerun job after correcting
any problems.

WARNING (TBD-077): [Severe] Modeinit sequence definition not found in the sequence
file. The test vectors will not contain an initialization test sequence and the testmode was
improperly created..
EXPLANATION:
The mode initialization sequence definition is required, but was not found in the
sequence file. This sequence should be added to your sequence definition file by
build_testmode.
USER RESPONSE:
Rebuild your test mode, or replace your sequence file with a back-up copy.

ERROR (TBD-078): [Internal] Error - rc = NNN received from TLMloadMethods for


testMode modeName. Could not continue processing test mode modeName because it
could not be loaded.
EXPLANATION:
The program failed while trying to load the flatModel methods for the specified test mode.
USER RESPONSE:

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Ensure that the test mode exists. If you are importing test vectors or sequence
definitions, any test modes specified in Begin_Test_Mode events, Going_To_Mode or
In_Test_Mode objects must exist. If the test mode is not required, remove the
reference from the input and rerun. If the test mode does not exist and is required, the
test mode must be built the test mode before you can continue processing.
Rerun your process after ensuring that the test modes are correct. If the failure still
occurs, customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-079): [Input] Audits indicate that TSV default tests have not been run. If you
wish to commit this experiment to the committed tests, you must do an unconditional commit.
EXPLANATION:
Audits indicate that one or more of the default TSV tests for the mode have not been run.
USER RESPONSE:
If you wish to commit this test data to the Committed tests file you must force the commit.

ERROR (TBD-080): [Tool] convert_vectors_for_core_tests does not support


accessing data from a parent testmode. Only test vectors created on the parent testmode can
be migrated.
EXPLANATION:
While processing the input test vectors, a BeginTestMode event was encountered in
the test vectors. Encounter Test does not currently support creating Structure Neutral
test vectors for parent/child testmodes.
USER RESPONSE:
If you wish to migrate test vectors, the test vectors must be created on a parent testmode.

ERROR (TBD-081): [Tool] commit_tests does not support committing checkpointed


vectors. Your experiment which created this tes vectors file did not successfully complete. You
should be either restart that application and continue, or restart and save the test vectors that
were created up to that point.
EXPLANATION:
The Ucommitted tests to be committed is a checkpointed file. The process which created
this file must be run to completion before the uncommitted tests can be committed to the
committed vectors File.
USER RESPONSE:

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Rerun the process which created this experiment to completion and then rerun
commit_tests.

ERROR (TBD-082): [Input] Test Vector expansion failed while trying access data from the
scanop sequence.
EXPLANATION:
While trying to expand data for a Scan_Load or Scan_Unload command, a NULL
pointer was returned when trying to access the scanop sequence. Without this data,
latch commands cannot be expanded.
USER RESPONSE:
Ensure that there are no problems with the sequence file for the testmode you are
processing. If the data being expanded includes LoadSR and UnLoadSR events ensure
that the required scan information is present on the experiment that we are expanding.
If there are no problems with the sequence file or the sequences on the experiment,
contact customer support (see Contacting Customer Service on page 23) for
assistance.

INFO (TBD-083): Sequence_Definition sequenceName was not found in the TBDseq


file. The Sequence_Definition will not be added the the application object collection of
Experiment experiment. Import the Sequence_Definition and then rerun.
EXPLANATION:
The Sequence_Definition was not found in the TBDseq file. As a result it could not
be added to the experiments application object collection.
USER RESPONSE:
Import the Sequence_Definition and then rerun.

ERROR (TBD-084): [Tool] The program failed. Refer to previous error messages. If there
are none, contact Cadence Customer Support for assistance.
EXPLANATION:
A program error occurred while either processing the input file or writing the output file.
There should be additional error messages to give more details about the problem.
USER RESPONSE:
Resolve the conditions identified in previous error messages. if no messages are
produced, contact customer support (see Contacting Customer Service on page 23)
for assistance.

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ERROR (TBD-085): [Input] Program error: INEXPERIMENT must be different from


EXPERIMENT.
EXPLANATION:
The INEXPERIMENT name and the EXPERIMENT name are the same name. The input
file name cannot be the same as the output file name.
USER RESPONSE:
Change the EXPERIMENT name to a unique identifier.

ERROR (TBD-086): [Input] Missing argument: specify parameter. Specify the missing
argument and rerun.
EXPLANATION:
The referenced program parameter was missing.
USER RESPONSE:
Specify the missing parameter and rerun.

ERROR (TBD-087): Unable to initialize test vectors. See preceding messages. Ensure that
directory permissions are correctly set.
EXPLANATION:
The program was unable to initialize resources.
USER RESPONSE:
Refer to the preceding messages to evaluate the problem. Ensure directory permissions
are correct. Rerun after resolving the problem(s).

ERROR (TBD-088): Unable to open test vectors file. Ensure that the correct working
directory was specified.
EXPLANATION:
The program failed while trying to open the test vectors file.
USER RESPONSE:
Ensure that the correct working directory was specified and that the test vectors file
exists. Use preceding messages to evaluate and resolve the problem. Rerun after
correcting problems.

ERROR (TBD-089): [Input] The program (TBDmigrate) does not support migration from
a checkpointed TBDbin file. Your experiment which created this TBDbin file did not

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successfully complete. Either restart the application and continue, or restart and save the
data that was created up to that point.
EXPLANATION:
The experimental TBDbin is a checkpointed file. The process which created this file must
be run to completion before TBDmigrate can be created from the TBDbin File.
USER RESPONSE:
Rerun the process which created this experiment to completion and then rerun
TBDmigrate.

WARNING (TBD-090): [Severe] TBDmigrate: unable to register the output TBDbin file on
the globalData file. Refer to previous messages for help in correcting the problem.
EXPLANATION:
The program was unable to register the TBDbin file.
USER RESPONSE:
Correct problems identified in previous messages and rerun.

WARNING (TBD-091): [Severe] TBDmigrate: Unable to register the TBDbin file


dependencies on the globalData file. Refer to previous messages for help in correcting the
problem.
EXPLANATION:
Processing failed while trying to register the TBDbin file dependent on the testmode.
However, the TBDbin file itself is accurate.
USER RESPONSE:
If you rebuild the test mode, the output TBDbin file will not be automatically deleted. It
must be manually deleted.

ERROR (TBD-092): [Input] TBDmigrate: Unable to obtain a write lock on the


objectName object. Ensure that the object exists and is registered on globalData.
EXPLANATION:
The program was unable to do a write lock. The referenced object may not be registered
on globalData Input parameters may be incorrectly specified.
USER RESPONSE:

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Correct any errors and rerun the program and see if the problem still exists. If the problem
presists, contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-093): [Input] Encountered an experiment which contains structure neutral


test vectors. This test vectors file cannot not processed.
EXPLANATION:
The experiment contains Load and unLoad commands rather then Scan_Load and
Scan_Unload commands. The TBDmigrate code does not support these commands.
USER RESPONSE:
Only attempt to migrate test vectors files which are not in the structure neutral format.

ERROR (TBD-094): commit_tests: the space required to update the committed tests file
with the experimental uncommitted tests is not available. NNN mbytes are required and only
NNN mbytes are available. Rerun when the required space is available.
EXPLANATION:
The space required to update the committed tests file is not available.
USER RESPONSE:
Rerun commit_tests after ensuring the required space is available.

ERROR (TBD-095): Vectors file: fileName has a file format level which is greater than the
file format level of the Committed tests file. This experiment cannot added to the Committed
tests file. The test vectors must be recreated using the Encounter Test release used to create
the test_vectors contained within the Committed tests file.
EXPLANATION:
The Uncommitted vectors were created using a newer release of Encounter Test than
was used to create and commit the tests stored on the Committed tests File.
USER RESPONSE:
Either recreate the test vectors using the earlier release or rebuild your testmode and
recreate all your test vectors for the test mode.

ERROR (TBD-096): [Input] Vectors file: fileName was created prior to Encounter Test
support for large file (64 bit) support. You cannot restart your experiment using this level of
Encounter Test.
EXPLANATION:

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The experiment was created using a Encounter Test level which wrote the test vectors
using 32 bit file offsets. Encounter Test does not support test vectors file containing with
both 32 and 64 bit offsets.
USER RESPONSE:
Restart your experiment using the earlier version of Encounter Test.

ERROR (TBD-097): [Input] Filename: fileName indicates that it was produced with a
later version of Encounter Test software. This file cannot be processed using this version of
Encounter Test.
EXPLANATION:
The format level for the test vectors file being processed is a newer level then what is
supported by the version of Encounter Test being run.
USER RESPONSE:
Either use the newer version of Encounter Test to continue processing or recreate the
input test vectors file using the this version of the Encounter Test software.

WARNING (TBD-098): [Severe] TBDmigrate found a clock that was not at its OFF value
before scan. This is a probable error in test generation. Contact Cadence Customer Support
for assistance.
EXPLANATION:
One or more clocks were not at their OFF value prior to doing a scan. This should not
occur and is a probable error in test generation.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-099): [Input] Error detected attempting to update the objective model.
EXPLANATION:
commit_tests is unable to update the Encounter Test objective model with the test
results for this experiment.
USER RESPONSE:
Refer to previous objective model messages. Rerun after correcting any faultModel
problems. Contact customer support (see Contacting Customer Service on page 23) if
problems persist.

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WARNING (TBD-100): Override of TI fixed value latch netName by the Scan_Unload


event in the seed file is not allowed. Override will not be honored, run continues.
EXPLANATION:
The seed file specified an override of the referenced TI value latch. This override could
cause problems in the test vectors and will not be honored.
USER RESPONSE:
Overrides of TI fixed value latches are not allowed. No action is required.

TBD-101 through TBD-230


WARNING (TBD-101): [Severe] report_vector_volume failed. Refer to previous
program messages.
EXPLANATION:
report_vector_volume failed while trying to process the input test vectors file.
USER RESPONSE:
Review previous messages and correct the identified failure(s), and then rerun. If the
failure persists, contact customer support (see Contacting Customer Service on
page 23).

ERROR (TBD-102): [Tool] Error occurred writing to Filename: fileName. Write of


length bytes to the output file failed. Ensure enough space is available before rerunning.
EXPLANATION:
An attempt to write data to the output file failed.
USER RESPONSE:
Ensure that enough space is available and then rerun.

ERROR (TBD-103): [Input] Read failure for Filename: fileName. File read from offset +
offset failed. The log file for the Encounter Test command which created the test vectors
file should be inspected for errors. Correct any problems found before recreating the input file.
IEXPLANATION:
The application is attempting to read using a bad file offset. The input cannot be
processed.
USER RESPONSE:

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Check the log for the job that created the input file for an indication of where the
problem(s) with the input file occured. Fix any problems, recreate the input file and then
rerun.

ERROR (TBD-104): Error reading from Filename: fileName. This may indicate that the
file name is wrong or that the file has been deleted, moved, or corrupted.
EXPLANATION:
An error occurred while reading the test vector file.
USER RESPONSE:
Ensure that the correct workdir and experiment were specified. Check previous job
logs for an indication of whether or not there were problem(s) when the test vectors
where created. Fix any problems and rerun.

ERROR (TBD-105): [Input] TBDopenConvertLatch failed attempting to process the


misrobserve sequence. Either the misrobserve sequence does not exist or no
Measure_MISR_Data event was found within the misrobserve sequence.
EXPLANATION:
Either the misrobserve sequence did not exist or no Measure_MISR_Data event was
found within the misrobserve sequence.
USER RESPONSE:
Ensure that a misrobserve sequence exists for the mode and that it contains a
Measure_MISR_Data event. Correct any problems then rerun.

ERROR (TBD-106): [Input] Vectors file filename is not registered on globalData file.
Ensure that the working directory and other parameters are correctly specified.
EXPLANATION:
The application failed while checking test vectors file registration. The referenced test
vectors file was not registered on the globalData file.
USER RESPONSE:
Rerun job after ensuring that WORKDIR, TESTMODE, and EXPERIMENT are correctly
specified.

ERROR (TBD-107): [Internal] A testmode number of zero was returned by


TLMmodeNumber(). Contact Cadence Customer Support for assistance.
EXPLANATION:

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Zero is an invalid mode number, the utility is unable to continue processing. A NULL
pointer is returned to the calling function.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TBD-108): [Input] commit_tests requires that the test vectors be manipulated
before they can be committed to the committed tests file. Run
insert_vector_pipeline_sequence and then rerun commit_tests.
EXPLANATION:
The experimental pattern audit statistics indicate that the test vectors must be
manipulated before they can be applied at the tester.
USER RESPONSE:
Run the insert_vector_pipeline_sequence program to manipulate the
experimental test vectors. After manipulating the test vectors, rerun commit_tests.
Refer to "insert_vector_pipeline_sequence" in the Encounter Test: Reference:
Commands.

ERROR (TBD-109): [Input] Vectors must be manipulated before they can be expanded.
Run insert_vector_pipeline_sequence and then rerun report_vectors.
EXPLANATION:
the test vectors must be manipulated before vector expansion can be run for this
experiment.
USER RESPONSE:
Run the insert_vector_pipeline_sequence program and then rerun
report_vectors . Refer to "insert_vector_pipeline_sequence" in the Encounter
Test: Reference: Commands.

ERROR (TBD-110): [Input] Test vectors must be manipulated before structure neutral test
vectors can be created. Run insert_vector_pipeline_sequence and then rerun
onvert_vectors_for_core_tests.
EXPLANATION:
The test vectors must be manipulated before convert_vectors_for_core_tests
can be run for this experiment.
USER RESPONSE:

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Run the insert_vector_pipeline_sequence program and then rerun


onvert_vectors_for_core_tests. Refer to "insert_vector_pipeline_sequence" in
the Encounter Test: Reference: Commands.

WARNING (TBD-111): [Severe] commit_tests failed while trying to register the


committed experiment name dependency on the globalData file. Processing continues.
EXPLANATION:
The program failed to register the committed experiment name dependent on the
testmode.
USER RESPONSE:
If you rebuild the testmode, the committed experiment name will not be automatically
deleted. After rebuilding the testmode you will still be prevented from using this
experiment name unless the experiment is manually deleted.

ERROR (TBD-112): [Tool] Error occured closing Filename: fileName. Sufficient space
to complete writing the output file is not available. Ensure that enough space is available in
your working directory and rerun.
EXPLANATION:
The program was unable to sucessfully close the output file.
USER RESPONSE:
Ensure you are not running out of space in your working directory, and check for any
system error messages, resolve all problems, and then rerun.

ERROR (TBD-113): [Input] The Test Pattern Audits indicate that test vector resimulation is
required to recalculate the test responses. To commit these tests, resimulate them prior to
running commit_tests.
EXPLANATION:
Test vectors within the test vector file were created with order dependencies. An audit
was set when some of the original test vectors were deleted from the test vector file. This
removal of test vectors has invalidated the test responses.
USER RESPONSE:
Run either analyze_vectors or simulate_vectors to recalculate the test vector
responses and then run commit_tests on the new test data.

ERROR (TBD-114): [Input] Encounter Test does not support creating test vectors for
designs which contain unequal Channel Mask Enable pipeline lengths. Processing ends.

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EXPLANATION:
The CME pipelines must be of equal length for Encounter Test to create valid test vectors.
The testmode contains CME pipelines of differing lengths.
USER RESPONSE:
Alter the design to ensure that if CME pipelines exist, they are of equal lengths before
test vectors can be produced, and then rerun.

ERROR (TBD-115): The Test Pattern Audits indicate that test vectors are smart scan test
vectors. Smart Scan test vectors can not be committed to the master TBDbin file.
EXPLANATION:
After test vectors have been manipulated for smart scan they may not be committed to
the master TBDbin file.
USER RESPONSE:
None.

ERROR (TBD-116): Encounter Test does not support migration of designs with more than
four channel mask enable pins. This design can not be migrated at this time.
EXPLANATION:
Current Encounter Test hierarchical test support is currently limited to designs with one
or two channel mask enable pins.
USER RESPONSE:
Processing terminates. This design can not be migrated at this time.

ERROR (TBD-118): Cannot use expandscan=yes on a testmode whose scan inputs are not
primary inputs (PIs). For LBIST you can run convert_vectors_to_stored_pattern to
get the correct format for input to expandscan=yes.
EXPLANATION:
During expandscan no stim_PI events were found in the Define_Sequence.
USER RESPONSE:
If you are trying to report LBIST vectors you need to run
convert_vectors_to_stored_patterns.

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ERROR (TBD-119): Cannot expand Init Sequence defined in testmode, testmode. It


does not contain RMLs.
EXPLANATION:
A TBD method was called to expand the parent mode init sequences with an invalid
mode.
USER RESPONSE:
Check the parent mode definitions to validate use of RSL/RML logic.

ERROR (TBD-210): [Input] The committed tests will not be altered because the
INEXPERIMENT experiment for testmode testmode could not be found in the
committed test vector file.

A list of valid INEXPERIMENTS, inexperiment_numbers, fault status association and test


section types follows:
list of experiment, numbers, and test section types
EXPLANATION:
The specified INEXPERIMENT could not be found.
USER RESPONSE:
Specify a valid INEXPERIMENT name and rerun.

ERROR (TBD-211): [Input] The committed tests will not be altered because the
INEXPERIMENT experimen, for testmode testmode has fault status associated with
it. Encounter test does not allow theremoval of experiments that have fault status associated
with them. A list of valid INEXPERIMENTS, inexperiment_numbers, fault status
association and test section types follows:
list of experiments, numbers, and test section types
EXPLANATION:
The specified INEXPERIMENT has fault status associated with it. INEXPERIMENTS
which have associated fault status cannot be removed from the committed test vector file.
The removal of these tests would invalidate the reported fault coverage.
USER RESPONSE:
Specify a pattern-only (one with no associated fault status data) committed
INEXPERIMENT and rerun.

ERROR (TBD-212): [Input] The committed tests will not be altered because the
INEXPERIMENT experiment for testmode testmode is not unique. The

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INEXPERIMENT number must be provided. Multiple experiments were created and


committed using this experiment name. A list of valid INEXPERIMENTS,
inexperiment_numbers, fault status association and test section types follows:
list of experiments, numbers, and test section types
EXPLANATION:
The specified INEXPERIMENT is not unique. Multiple experiments were created and
committed using the same experiment name. We will not remove tests because we are
not sure which ones to remove.
USER RESPONSE:
Specify a valid inexperiment_numberand rerun.

ERROR (TBD-215): [Input] The committed tests will not be altered because the
inexperiment_number inexperiment_number for testmode testmode could
not be found in the committed test vectors file. A list of valid INEXPERIMENTS,
inexperiment_numbers, fault status association and test section types follows:
list of experiments, numbers, and test section types
EXPLANATION:
The specified inexperiment_number could not be found.
USER RESPONSE:
Specify a valid inexperiment_number and rerun.

ERROR (TBD-216): [Input] The committed tests will not be altered because the
inexperiment_number inexperiment_number for testmode testmode has
fault status associated with it. A list of valid INEXPERIMENTS, inexperiment_numbers,
fault status association and test section types follows:
list of experiments, numbers, and test section types
EXPLANATION:
The specified inexperiment_number has fault status associated with it.
INEXPERIMENTS which have associated fault status cannot be removed from the
committed test vector file. The removal of these tests would invalidate the reported fault
coverage.
USER RESPONSE:
Specify a pattern-only (one with no associated fault status data) committed
inexperiment_numberand rerun.

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ERROR (TBD-218): [Input] NNN Channel Mask Registers exist but none are valid. No
mask all ability was defined. TBDgenerateMasks fails
EXPLANATION:
When the test mode was built, it was determined that all of the channel Mask Registers
were invalid. No mask all CME state exists. Unable to mask any X responses that it may
find. Processing terminates.
USER RESPONSE:
Determine the design problem that is causing all Channel Mask Registers to be invalid.
Fix the problem, rebuild and process your mode.

ERROR (TBD-219): [Tool] expand_vectors does not support expanding patterns on


testmodes with test_type running or final.
EXPLANATION:
Vector expansion does not support overlapped scan. Overlap is required with a
test_type of running or final because we are accumulating signatures.
USER RESPONSE:
This is a system limitation, unable to expand patterns for this testmode.

ERROR (TBD-220): [Tool] The program failed while attempting to obtain the OPCG
statistics for testmode modename. Contact Cadence Customer Support for assistance.
EXPLANATION:
The test pattern utility failed to obtain the OPCG register data. and terminated.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-221): [Input] Invalid specification of testrange keyword . The tests must
exist within the file and be specified using one of the following forms:
testrange = testgroup, testgroup, ...
testgroup = odometer:odometer or
testgroup = testNumber:testNumber
odometer = blank, stored pattern type, signature-based type
for example, 1.1.1.3 or 1.1.1.2.5 for stored pattern type and
1.1.1.3(1.1) or 1.1.1.5(5.256) for signature-based type
testNumber = relative Test_Sequence number

EXPLANATION:

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The data supplied with the testrange keyword is invalid. It must be specified using the
following guidelines:
testrange=testgroup,testgroup ,...
testgroup = odometer (process single piece of test data)
testgroup = odometer: (process test data beginning with
odometer through the end of the test data)
testgroup = :odometer (process from the beginning of the test
data to the end of the odometer test data)
testgroup = odometer:odometer (process beginning with odometer
test data to the end of the odometer test data)
testgroup = testNumber (process single piece of test data)
testgroup = testNumber: (process from the beginning with test
and through the end of the test data)
testgroup = :testNumber (process from the beginning of the test
data the end of testNumber
testgroup = testNumber:testNumber (process beginning with
testNumber to the end of testNumber
odometer = stored pattern type (that is, 1.1.1.3) or signature-
based type(that is, 1.1.1.3(1.1))
testNumber - integer (Test_Sequence number)
USER RESPONSE:
Correct the testrange specification and rerun the command.

ERROR (TBD-222): [Input] Test testNum was not found within filename.
EXPLANATION:
The specified test number does not exist within the test vector file.
USER RESPONSE:
Correct the testrange specification and rerun the command.

ERROR (TBD-223): [Input] Overlapping ranges of tests were specified using the
testrange keyword. Correct the testrange specifications and rerun.
EXPLANATION:

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Multiple test ranges were specified using the testrange keyword. These test ranges
overlap each other. Ensure the test ranges specified for the testrange keyword do not
overlap.
USER RESPONSE:
Correct the testrange specification and rerun the command.

ERROR (TBD-224): [Input] The specified test can not be simulated using
controlpipeline=skip.
EXPLANATION:
Encounter Test was asked to simulate using the original un-manipulated scan latch
values. These values are saved within a Internal_Scan_Load event during
manipulation of the vectors. No Internal_Scan_Load event was found.
This indicates that the patterns were manipulated by an earlier release of Encounter
Test. Without the initial scan latch values, Encounter Test cannot simulate the un-
manipulated scan latch values.
USER RESPONSE:
Rerun simulation specifying controlpipeline=fm|gm.

ERROR (TBD-225): [Input] Found TG=IGNORE_LAST before finding TG=IGNORE_FIRST.


EXPLANATION:
TG=IGNORE_FIRST starts a group of patterns that the test generator ignores.
TG=IGNORE_LAST completes the group. The program detected a TG=IGNORE_LAST
before a TG=IGNORE_FIRST was encountered in the user-supplied sequence definition.
USER RESPONSE:
Correct the problems with the TG ignore Keyed_Data, reimport the sequence definition,
and then rerun test generation. Refer to TG=keyed data in the Automatic Test Pattern
Generation User Guide for additional information.

ERROR (TBD-226): [Internal] Tests created by the test generator could not be merged with
the specified test sequence. Contact Cadence Customer Support for assistance.
EXPLANATION:
An internal program failed due to one or more differences between the tests generated
by Encounter Test and the specified user sequence.
USER RESPONSE:

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Contact customer support (see Contacting Customer Service on page 23) for
assistance.

ERROR (TBD-227): [Input] Found TG=IGNORE_FIRST but no TG=IGNORE_LAST was


found.
EXPLANATION:
TG=IGNORE_FIRST starts a group of patterns that the test generator ingores.
TG=IGNORE_LAST completes the group. The program detected a TG=IGNORE_FIRST
but did not detect an associated TG=IGNORE_LAST in the user-supplied sequence
definition.
USER RESPONSE:
Correct the problems with the TG ignore key_Data, reimport the sequence definition, and
then rerun test generation.

ERROR (TBD-228): [Input] Error while trying to add Scan_Unload events following the
final Product_Signature events for file working directory/testmode/
TBDpatt.experiment. Refer to previous messages to determine the problem. Contact
Cadence Customer Support for assistance if unable to correct the problem.
EXPLANATION:
An error has occurred. Previous error messages describe this condition.
USER RESPONSE:
Refer to the previous error messages for more information. Contact customer support
(see Contacting Customer Service on page 23) for assistance if you are unable to
determine the problem.

WARNING (TBD-229): [Severe] An OSCILLATE linehold statement was specified for pin
pinname, but this pin has no Start_Osc event in the mode initialization
Sequence_Definition. This OSCILLATE linehold override will be ignored.
EXPLANATION:
The linehold file allows changing the oscillator frequency on pins, but it does not allow for
defining or starting an oscillator on a pin that was not started when the testmode was
built. Processing continues but this pin will not be treated as an oscillator and the results
are likely to be invalid.
USER RESPONSE:
Ensure that the correct pin name was used in the OSCILLATE statement. If it is the
correct pin name, rebuild the testmode, ensuring that this pin has a Start_Osc event in

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the mode initialization Sequence_Definition. Note that the pin must also have a
+/-OSC test function.

WARNING (TBD-230): An OSCILLATE linehold statement specified that pin pinname


should not oscillate, but this pin has no Start_Osc event in the modeinit
Sequence_Definition. This OSCILLATE linehold will be ignored.
EXPLANATION:
The linehold file allows removal of oscillation from a pin that was oscillating as a result of
a Start_Osc event in the mode initialization Sequence_Definition, but this pin had
no Start_Osc event.
USER RESPONSE:
Ensure that the correct pin name was used in the oscillator statement. If it is the correct
pin name, check the mode initialization Sequence_Definition to make sure that it is
correct. If the mode initialization Sequence_Definition is correct, then it is merely a
matter of redundant information, and this message can be ignored. You can remove this
message from future runs by removing the statement from the linehold file.

TBD-231 through TBD-999


ERROR (TBD-231): Invalid logic value(s) specified in the input test vectors. Logic values of
0, 1, x, and Z are supported. Update your input TBDpatt or TBDseqPatt to ensure that all
specifed logic values are set to 0, 1, x, or Z. Rerun read_vectors or
read_sequence_definition.
EXPLANATION:
Supported logic values for Scan_Load, Scan_Unload, Stim_PI, and Measure_PO
events are 0,1, x, and Z.
USER RESPONSE:
Correct any incorrectly specified logic values and rerun.

ERROR (TBD-232): Found TG=IGNORE_FIRST or TG=IGNORE_LAST on a test_vector


event. TG=IGNORE_FIRST and TG=IGNORE_LAST keydata are not supported at the
test_vector event level. Each test_vector event to be ignored must have keyData of
TG=IGNORE.
EXPLANATION:

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When indicating individual events for the Test Generation code to ignore, the group
delimiters of TG=IGNORE_FIRST and TG=IGNORE_LAST cannot be used. Each event
that you want to have ignored must have keyData of TG=IGNORE.
USER RESPONSE:
Correct the problems with TG ignore key_Data and reimport your sequence
definition. Rerun your test generation command.

ERROR (TBD-233): observeType signature observation requires a sequenceType


Sequence Definition, none was found, expand_vectors termainates.
EXPLANATION:
Produce MISR signature values can be observed either serially or in parallel. To do a
parallel observation of the MISR a misrobserve sequence must exist. To do a serial
observation of the MISR a sigobs sequence must exist. The sequence definition type
required to do the requested measure type does not exist. Process terminates.
USER RESPONSE:
If observation type chosen is not acceptable you will need to review the job log from
build_testmode to determine why the requested sequence definition type does not
exist. Corect these errors and rebuild your tesmode before rerunning
expand_vectors.

ERROR (TBD-234): misrobserve=parallel was specified on the command line.


Testmode requires a serial observation of the Product_MISR_Signature values using the
signature observation testmode. Serial MISR observation will occur.
EXPLANATION:
When your testmode was built serial MISR observation was specified. Your command
line specification of misrobserve=parallel will be reset to serial.
USER RESPONSE:
None

ERROR (TBD-235): Testmode modeName requires a serial observation of the


Product_MISR_Signature values. A sigobsreturn Sequence_Definition is also
required to return to the target testmode, none was found. Process terminates.
EXPLANATION:
When your testmode was built serial MISR observation of the
Product_MISR_Signature was specified. No signature observation return sequence
was found. Signature observation return sequence is required. Process will terminate.

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USER RESPONSE:
review your build_testmode log to determine what went wrong. Correct problems
before resuming processing.

ERROR (TBD-236): There is a syntax error in your testrangefile, filename. Verify before
attempting to continue.
EXPLANATION:
There is a syntax error in the file you have supplied as your testrangefile. The file
can handle single testpatterns or a range of testpatterns seperated by a colon(:).
USER RESPONSE:
Correct the input file and rerun delete_testrange.

ERROR (TBD-237): The inputfile provided for


report_vectors_for_core_migration_tests, filename, is not a valid file produced
by prepare_core_migration_tests.
EXPLANATION:
The file provided for reporting was not generated by
prepare_core_migration_tests.
USER RESPONSE:
Provide the TBDtdm file that was created by prepare_core_migration_tests to
obtain the vectors for the core migration tests.

ERROR (TBD-300): Unable to establish pathname path as required to continue.


Processing terminates.
EXPLANATION:
The directory path named pathname could not be identified. Processing will terminate.
USER RESPONSE
Ensure that the correct values of keywords or environment variables have been specified
for WORKDIR and TESTMODE for the circuit being processed.

ERROR (TBD-301): All test types (intradomain, interdomain and static) are set to
no. Processing terminates.
EXPLANATION:

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At least one of intradomain, interdomain or static keywords must be set to yes


or the default to yes for test sequences to be generated.
USER RESPONSE:
Ensure that at least one of the keywords intradomain, interdomain or static is
set to yes.

ERROR (TBD-302): Unknown clock name lhname in holdclock list will be ignored.
EXPLANATION:
The name lhname provided in the holdclock list keyword is not recognized as a valid
PI clock name, or valid PPI clock name or valid OPCG domain name. It is ignored and
processing continues.
USER RESPONSE:
Ensure all holdclock list entries are valid names of clock PIs or PPIs or OPCG Domain
names.

ERROR (TBD-303): Unable to open file filename for output. Processing terminates.
EXPLANATION:
Opening the file filename for output failed, which prevents writing any sequence
definitions.
USER RESPONSE:
Ensure the WORKDIR, TESTMODE, EXPERIMENT and outfilename are specified
correctly.
Contact customer support to have this investigated and fixed (see Contacting Customer
Service on page 23).

ERROR (TBD-304): Program Error. Domain opcgdomain needs delay, but has no down
counter. Processing terminates.
EXPLANATION:
While trying to program a test sequence that uses OPCG domain opcgdomain, a delay
counter was to be set, but this domain does not have a delay down counter. This is a
programming error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) to have this
investigated and fixed.

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ERROR (TBD-305): Domain opcgdomain needs to program a delay count of


delayCount, but this will not fit in its delay counter of length regLen. Processing
continues.
EXPLANATION:
While trying to program a test sequence that uses OPCG domain opcgdomain, a delay
counter was to be set, but this domain's delay down counter length regLen is not large
enough to handle the desired delay counter value delayCount.
USER RESPONSE:
Ensure that delay counters large enough to cover delay for faster domains preceeded by
slower domains. Processing will continue with less efficient test sequences being
produced.

WARNING (TBD-306): There are opcgdomains OPCG domains, but only


opcgdomainswithcounters have delay counters. Inter-domain test sequences for
OPCG require delay counters. Coverage between domains may suffer.
EXPLANATION:
While trying to generate inter-domain test sequences for OPCG domains, it appears that
many domains do not have the delay counter implemented that is required in order to
create valid inter-domain delay tests when using OPCG clocking. Some inter-domain test
sequences cannot be generated, resulting in possibly poor inter-domain transition fault
coverage. There are opcgdomains OPCG domains defined with
opcgdomainswithcounters of them having delay counters.
USER RESPONSE:
If inter-domain testing of OPCG domains is required, ensure to add domain delay
counters when inserting the OPCG logic macros.

INFO (TBD-307): There are interdomanpairs valid inter-domain clock pairings, but
maxinterdomainseqs limits to maxinterdomainseqs the number of inter-domain
sequences that will be generated.
EXPLANATION:
While trying to generate inter-domain test sequences for OPCG domains, it appears that
there are more sequences that could be generated to cover valid inter-domain clock
pairings, but that the limit of maxinterdomainseqs is going to limit the number of
inter-domain test sequences that will be generated. Some loss of fault coverage is
possible.
USER RESPONSE:

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Increase the setting of the maxinterdomainseqs keyword to obtains more test


sequences.

INFO (TBD-308): There were numseqs seqtype sequences generated.


EXPLANATION:
There were numseqs test sequences generated of type seqtype. The sequence
types are intra-domain, inter-domain or static.
USER RESPONSE:
If you do not see sequences of the type you are looking for, try using other keywords on
the prepare_opcg_test_sequences command line.

ERROR (TBD-309): Unable to load the OPCG Statistics for this test mode.
EXPLANATION:
There was a problem loading the OPCG information for this test mode. Be sure to specify
a valid OPCG test mode when running prepare_opcg_test_sequences.
USER RESPONSE:
This command is intended only for OPCG test modes and specifically for designs with
Cadence inserted OPCG logic. Be sure to specify a valid OPCG test mode when running
prepare_opcg_test_sequences.

INFO (TBD-310): Clock Information Table: there are numclks clocks of which numUsedClk
may be used in sequences
Clock Name Clock# Clock Information (# Gates/Nodes Observed)

EXPLANATION:
This provides a list of clocks associated with the circuit and test mode. It reports the
number of clocks defined for the test mode and the number to be used in sequences. For
eachclock, the number of nodes/gates observed by each clock is reported or the clock is
identified as a set/reset clock. Any identified set or reset clocks will not be used for
creating test sequences. Any clocks be held off are also denoted.
USER RESPONSE:
No response required.

INFO (TBD-312): Clock Communication Table: Launch Clock# Capture Clocks(#nodes)


EXPLANATION:

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This table indicates for each clock, which clocks capture data launchd by that clock. Each
listed capturing clock also denotes the (number) of gates/nodes between the domains.
USER RESPONSE:
None.

INFO (TBD-314): seqtype Clock Sequences Generated: Sequence Name Clocks Used
EXPLANATION:
This table lists the set of test sequences generated of type seqtype. It shows the clocks
being pulsed in each sequence.
USER RESPONSE:
None.

WARNING (TBD-316): Testmode testmodename does not appear to use Cadence


inserted OPCG macros. Better results may be obtained using the
prepare_sequence_templates command.
EXPLANATION:
The command prepare_opcg_test_sequences is intended for use with OPCG logic
inserted by Cadence. Test mode testmodename and this design does not appear to
use Cadence inserted OPCG logic. When Cadence inserts OPCG logic, it also
generates test mode assign files that specify all the OPCG domains and the
programming registers for them. All defined OPCG domain registers have specific types
and do not specify a type of custom. The prepare_opcg_test_sequences command
may not provide proper clocking sequence definitions for non-Cadence OPCG or for test
modes using tester clocks.
USER RESPONSE:
It is recommended that you try using the command prepare_sequence_templates
instead. Any clocking sequences produced by the prepare_opcg_test_sequences
command may not work correctly for non-Cadence OPCG logic.

WARNING (TBD-317): PPI ppiname is a clock not associated with an OPCG domain. It is
not known how to control this clock. Better results may be obtained using the
prepare_sequence_templates command.
EXPLANATION:
The command prepare_opcg_test_sequences is intended for use with OPCG logic
inserted by Cadence. The design and test mode define a clock PPI named ppiname

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that is not associated with an OPCG clock domain, so there is no defined way to control
this clock PPI. Any sequences generated that use such a PPI will likely not work correctly.
USER RESPONSE:
It is recommended that you try using the command prepare_sequence_templates
instead. Any clocking sequences produced by the
prepare_opcg_test_sequences command may not work correctly for non-
Cadence OPCG logic.

INFO (TBD-318): There are blockingDomains domains with domain input blocking
provided. Domain input blocking may be used to improve test efficiency.
EXPLANATION:
They are blockingDomains OPCG domains defined with the ability to block their
inputs from other domains. The capability to block inputs from other domains is
programmable based on a program register setting. The blockinputs keyword was
specified or defaulted to yes, so generated sequences may exploit the use of domain
input blocking to enable more clocks to be pulsed in the same sequence.
USER RESPONSE:
None. You can avoid use of domain input blocking by specifying blockinputs=no on
the prepare_opcg_test_sequences command line. You should get better results by
letting it default to yes.

WARNING (TBD-319): Domain domainName register blockReg is of type


BLOCK_DOMAIN_INPUTS, but no programming values are listed with meanings of BLOCK or
ENABLE. Processing continues with an assumption that a value of 1 blocks the domain
inputs.
EXPLANATION:
The OPCG clock domain domainName has a programming register named blockReg
that is defined to be of type BLOCK_DOMAIN_INPUTS. This register type should
normally be defined along with a set of valid programming values to denote which value
will BLOCK and/or which value will enable the domain inputs to be observed. There
appear to be no valid programming values defined, so an assumption will be made that
a programmed value of 1 will block the domain from seeing inputs from other domains.
This matches the assumption of Cadence supplied domain blocking support.
USER RESPONSE:
Verify that the domain input blocking register should be programmed to 1 when blocking
of domain inputs is required and 0 to enable observation of domain inputs. If this is not

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correct, redefine the test mode and explicitly specify programming value of 0 with a
meaning of "BLOCK" or "block".

WARNING (TBD-320): Domain domainName will not fire at half speed as requested
because its CLOCK_HIGH_GATE_SR domainReg is less than 3 bits long.
EXPLANATION:
The OPCG clock domain domainName has a programming register named
domainReg that is of type CLOCK_HIGH_GATE_SR but is less than 3 bits long. This
register type should be defined as 3+ bits long to enable running at half speed for
intradomain tests. This domain will run at its normal, full speed.
USER RESPONSE:
If you want this domain to be able to run at half speed, it needs to have been inserted
with a clock gating SR of 3 or more bits. Go back and insert domain macros that support
at least 3 pulses if you want the halfspeed keyword to apply to this domain.

INFO (TBD-321): There are numDomains domains that will fire at half speed in the
intradomain tests requested by the halfspeed keyword.
EXPLANATION:
Since the halfspeed option was requested, this message reports the number of
domains for which it is possible to run at half speed. This capability requires that OPCG
domains have the capability of firing at least 3 pulses. If no domains have at least 3 pulse
capability, then no domains will run at half speed for intradomain testing.
USER RESPONSE:
If you want domains to be able to run at half speed, they need to have been inserted with
a clock gating SR of 3 or more bits. Go back and insert domain macros that support at
least 3 pulses if you want the halfspeed keyword to apply.

WARNING (TBD-322): Domain domainName has a GO signal that was not resolved to a
primary input pin. This OPCG domain cannot be used.
EXPLANATION:
The OPCG clock domain domainName has a specified GO signal that was not resolved
to be one of the identified GO test function primary input pins. Without knowing which
GO signal to use to trigger this domain, we cannot use it in any generated test
sequences.
USER RESPONSE:

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Ensure the clock domain has a valid primary I/O pin (input or bidirectional) specified in
the OPCG DOMAIN statement.

WARNING (TBD-323): Domain domainName register blockReg is of type


BLOCK_DOMAIN_INPUTS, but there is no cut-point found that prevents this control bit from
being observed. Processing continues with an assumption that no cut-point/PPI needs to be
set.
EXPLANATION:
The OPCG clock domain domainName has a programming register named blockReg
that is defined to be of type BLOCK_DOMAIN_INPUTS. All OPCG control register bits
need to be hidden behind cut-points. This specific programming register needs to have
its own cut-point and PPI associated with it that will block observability of this control bit.
When such a PPI exists, any generated sequence that uses the
block_domain_inputs register will also set the PPI to the appropriate value. Without
this PPI defined, the generated clocking sequence may not work as intended.
USER RESPONSE:
Ensure that there are cut-points and PPIs defined for all block_domain_inputs
control registers when the test mode is defined.

WARNING (TBD-326): [SEVERE] Glitches may occur when switching back into scan state
to apply the scan shift cycles that are part of the scan fill processing. A test pattern audit will
be set to prevent the commit_tests process from adding these test vectors to the master
test vectors file.
EXPLANATION:
Encounter test simulators do not catch possible glitches that may occur when switching
back into scan state to apply the scan shift cycles that are part of the scan fill processing.
Pattern audits will prevent commiting these test vectors.
USER RESPONSE:
Rebuild the testmode after changing the design to remove potential glitches. Recreate
test vectors.

WARNING (TBD-401): Audits indicate that the test vectors contained within this vector file
may be suspect. Audits Summary will be printed in TBDpatt file.
EXPLANATION:
The PattAuditStats for the vector file you are printing contains potential test data
problems. A list of the audits will be printed in the TBDpatt file.
USER RESPONSE:

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If problems are unacceptable, correct the problem with your part and recreate the test
data.

WARNING (TBD-402): The sequence file for this mode (testMode) could not be opened.
expand_vectors will not be able to expand scan operations in this mode.
expand_vectors will not be able expand scan operations in this mode. Ensure that the
correct working directory was specified.
EXPLANATION:
The sequence file for this testmode could not be opened or expanded.
USER RESPONSE:
Ensure that the correct working directory is specified and rerun if necessary

WARNING (TBD-403): At NNN number level in the test vectors no data were found in
the requested range to be printed.
EXPLANATION:
The data requested to be printed does not exist.. report_vectors will continue without
any problems. Most likely this error is caused by something simple such as requesting
the third test section, when there are only two test sections in the test vectors.
USER RESPONSE:
Check your input parameters and change them if needed. If you were trying to print data
which you expected to be in your test vectors, check the run which created the test
vectors for any errors. For example, if you requested that experiment 1 be printed
(exper=1), and you expect that there should be an experiment in your test vectors, check
the preceding test generation run for errors.

WARNING (TBD-404): No levels were found in the requested range to be printed.


EXPLANATION:
The data requested to be printed does not exist. report_vectors will continue without
any problems. Most likely this error is caused by something simple such as requesting
the third test section, when there are only two test sections in the test vectors.
USER RESPONSE:
Check your input parameters and change them if needed. If you were trying to print data
which you expected to be in your test vectors, check the run which created these test
vectors for any errors. For example, if you requested that experiment 1 be printed
(exper=1), and you expect that there should be an experiment in your test vectors,
check the preceding test generation run which created these test vectors.

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WARNING (TBD-405): Override of fixed value or lineheld latch netName by the


Scan_Load event in the seed file is ignored. Value from the linehold file is used.
EXPLANATION:
Your seed file specified an override of the named fixed value on a lineheld latch. This
override could cause problems in your test data. This override will not be honored.
USER RESPONSE:
Ensure that the requested override matches your intent. If so, add the needed value to
your linehold file and rerun if necessary. Refer to Linehold File in the Automatic Test
Pattern Generation User Guide for additional information.

WARNING (TBD-406): LBIST test vectors are not supported by Test Data Migration. The
LBIST tests will be dropped. The output test vector file may be empty.
EXPLANATION:
The test vectors file contains LBIST test vectors which are not supported for Test Data
Migration. The tests are not migrated.
USER RESPONSE:
Be aware that the If the input test vector file only contained LBIST test vectors, the output
test vectors file may be empty.

WARNING (TBD-408): User sequence Name: seqName was not found in the sequence file
for testmode modeName.
EXPLANATION:
The referenced sequence was not found in the sequence file for the testmode.
USER RESPONSE:
Ensure that sequence names are correctly specified and rerun if necessary.

WARNING (TBD-409): None of the user-specified sequences passed sequence checking


by TBDfitSequenceInit. Correct errors in specified sequences and rerun.
EXPLANATION:
TBDfitSequenceInit checks to ensure that the conditional stims make sense. If
PI_STIMS = 7 is the highest conditional stim found on a stim event, the number of
unconditional stims plus the number of conditional stims with the same or smaller value
must exist. If not equal, the user sequence cannot be used. A similar check is made for
LATCH_STIMS. It is also possible that the sequences had stims that conflicted with
Lineholds or Test Inhibits in effect for this run. In this case, there should be a message

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preceding this one that explains the problem. TBDfitSequence found no good user
sequences in the list.
USER RESPONSE:
Correct any errors in the user sequence(s) and import the corrected user sequence
using read_sequence_definition.

WARNING (TBD-411): A linehold specified on pin pinName is overridden by test sequence


sequenceName. If the linehold was intended only to guide the test generator and not to
impose a firm restriction on the sequence, then ignore this message. If not, edit the sequence
and rerun read_vectors to reimport the sequence, and then rerun test generation
EXPLANATION:
A linehold was specified on the referenced pin name, but the referenced test sequence
specifies a pulse or stim (to the opposite state) on this pin.
USER RESPONSE:
Ensure the test sequence is correct. If not, edit the sequence and rerun read_vectors
to reimport the sequence, and then rerun test generation. If the sequence is correct, then
rerun test generation, removing the offending linehold. If the linehold was intended only
to guide the test generator and not to impose a firm restriction on the sequence, then
ignore this message. Refer to Linehold File in the Automatic Test Pattern
Generation User Guide for additional information.

WARNING (TBD-412): Test sequence sequenceName specified an impossible condition


in a conditional event. This sequence will not be used.
EXPLANATION:
A test sequence may have conditional events, meaning that the event is not used if the
test generator did not produce enough Stim_PI (or Scan_load) events. The condition,
specified in Keyed_Data as PI_Stims = n (or Latch_Stims = m), stipulates that
the associated event is to be omitted in any test for which the test generator did not
produce at least n Stim_PI (or m Scan_Load) events.
The purpose of conditional events is to allow the possibility for one sequence to be
substituted for automatically generated tests where the number of Stim events may be
variable. When a generated test has fewer Stim events than the sequence, the user must
have specified which Stim events in the sequence should be skipped, or else the
sequence cannot be used for this test.
This message is produced if the condition requires more Stims than are contained in the
sequence. The event associated with such a condition would always be omitted,
because if there were enough Stims to satisfy the condition, then there would be more

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Stims than were specified in the sequence, so the sequence would not match this test in
the first place.
If your sequence contains at least as many Stims as the largest number on the
conditionals, then this message means that for some conditional, there will be an
ambiguity in trying to match the sequence with a test containing that number of stims.
USER RESPONSE:
Examine the test sequence and correct the mistake, then re-import the sequence and
run the test generator again.
In tracking down the problem, first count the number of Put_Stim_PI events in the
sequence. Make sure that there is no conditional (PI_Stims = n) where n exceeds this
number. If this does not expose the problem, then for each n specified on a
Put_Stim_PI conditional, identify the exact Put_Stim_PI events which could be used
for a test with n Stim_PI events. If you find some value of n where the number of usable
Put_Stim_PI events in the sequence is not exactly equal to n, then you have found the
problem.
If the problem is not found in the PI_Stims = n conditionals, then follow the same
process for the Latch_Stims = m conditionals, comparing the number of usable
Scan_Load events with each value of m.

WARNING (TBD-413): Test sequence sequenceName conflicts with the TI attribute


specified on pin pinName. This sequence will not be used. If this sequence is required, edit
the sequence and rerun read_vectors to reimport the sequence and then rerun test
generation.
EXPLANATION:
The referenced pin name was specified to be held constant by a TI attribute. These
attributes are not intended to be overridden. Verify Test Structures (TSV) uses these
values in determining whether the logic conforms with the design guidelines which
support the generation of valid test vectors. The referenced sequence name specifies a
pulse or stim (to the opposite state) on this pin, invalidating the TSV assumptions.
Encounter Test cannot guarantee that its test vectors will be valid if this state is
overridden.
USER RESPONSE:
Ensure the test sequence is correct. If not, edit the sequence and rerun read_vectors
to reimport the test sequence and then rerun test generation. If the sequence is correct,
change the test function pin attribute editing the test mode definition and rebuilding the
test mode.

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WARNING (TBD-414): Test sequence sequenceName conflicts with the specified linehold
on pseudo PI ppinName. If the linehold was intended only to guide the test generator and
not to impose a firm restriction on the sequence, then ignore the message. If not, edit the
sequence and rerun read_vectors to reimport the sequence, then rerun test generation.
EXPLANATION:
A linehold was specified on ppinName, but the test sequence sequenceName
specifies a pulse or stim (to the opposite state) on this pseudo primary input.
USER RESPONSE:
Make sure the test sequence is correct. If not, edit the sequence and and rerun
read_vectors to re-import the sequence, then rerun test generation. If the sequence
is correct, rerun test generation, removing the offending linehold. If the linehold was
intended only to guide the test generator and not to impose a firm restriction on the
sequence, ignore the message. Refer to Linehold File in the Automatic Test Pattern
Generation User Guide for additional information.

WARNING (TBD-415): Test sequence sequenceName contains a dynamic pattern with


conditional events. This sequence will not be used because conditional events are not
supported on events within the dynamic pattern. To use this sequence, edit the sequence
definition by removing all keyed data conditionals from events within the dynamic pattern.
Then rerun read_sequence_definition and test generation.
EXPLANATION:
Timing data makes reference to the events in a sequence by their relative position within
the dynamic pattern. A conditional event is one that has an associated keyed data
statement of "PI_Stims = n" or "Latch_Stims = n", and will be dropped from the test
sequence for any automatic test that contains fewer than n of the referenced stim events.
Since the dropping of an event would change the relative number of any following events,
the timing data would not be usable. To specify the timing, you must know the exact
number and order of the events within the dynamic pattern.
USER RESPONSE:
Edit the sequence definition by removing all keyed data conditionals from events within
the dynamic pattern. Then rerun read_sequence_definition and test generation.

WARNING (TBD-416): Test sequence sequenceName contains a timing object and


WRPT events. This is not valid for stored pattern tests; the sequence will not be used. To
specify the timing data for stored pattern tests, define the test sequence using only stored
pattern events
EXPLANATION:

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When a WRP test sequence is specified for stored pattern test generation, the sequence
is converted by replacing uniquely WRPT events by equivalent stored pattern events.
This may result in more or fewer events in the resulting sequence definition. Since timing
data makes reference to the events in a sequence by their relative position within the
dynamic pattern, the timing data would not make sense for the converted stored-pattern
sequence definition.
USER RESPONSE:
If you want to specify the timing data for stored pattern tests, you must define the test
sequence using only stored pattern events. Either specify a different sequence definition
or edit the sequence definition by removing all Channel Scan,
Connect_Tester_PRPG, Pulse_Tester_PRPG_Clocks, and
Pulse_Tester_SISR_Clocks events, replacing them with their equivalent stored
pattern events. Then rerun read_sequence_definition and test generation.

WARNING (TBD-417): Test Sequence sequenceName contains a timing object and


stored-pattern events. This is not valid for WRP tests. The sequence will not be used. To
specify the timing data for WRP tests, define the test sequence using only WRPT events.
EXPLANATION:
When a stored pattern test sequence is specified for WRP test generation, the sequence
is converted by replacing uniquely stored-pattern events by equivalent WRP events. This
may result in more or fewer events in the resulting sequence definition. Since timing data
makes reference to the events in a sequence by their relative position within the dynamic
pattern, the timing data would not make sense for the converted stored-pattern sequence
definition.
USER RESPONSE:
If you want to specify the timing data for WRP tests, you must define the test sequence
using only WRPT events. Either specify a different sequence definition or edit the
sequence definition by removing all Scan_load, Skewed_Scan_Load, Scan_Unload,
Skewed_Scan_Unload, Measure_PO, Stim_PI_Plus_Random, and Put_Stim_PI
events. Then rerun read_sequence_definition and test generation.

WARNING (TBD-418): Test Sequence sequenceName specified setup sequence


setupSequenceName, but sequence setupSequenceName cannot be found.
Sequence SequenceName will not be used. To use sequence sequenceName, import
setup sequence setupSequenceName before running test generation.
EXPLANATION:
A setup sequence was specified, but apparently it has not yet been imported to the
sequence file. The specified test sequence cannot be used without its setup sequence.

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USER RESPONSE:
Run read_sequence_definition on setupSequenceName, the setup
sequence, and then rerun test generation.

WARNING (TBD-419): The channel scan in test sequence sequenceName has a different
[skewed_load|skewed_unload] attribute than its setup sequence,
setupSequenceName. This sequence will not be used. If you are initializing the channels
by using a channel scan event in the setup sequence, then it must be homogeneous with the
channel scan event in the test sequence with respect to the number of shift clocks. Edit the
setup sequence by correcting the skewed_load and/or the skewed_unload attribute on the
channel scan event. Rerun read_sequence_definition to import the updated setup
sequence before rerunning test generation.
EXPLANATION:
The setup sequence for this test sequence specified a channel scan, but with different
skewing (number of A and/or B clock pulses) than the channel scan in the test sequence.
If you are initializing the channels by using a channel scan in the setup sequence, it
must be homogeneous with the channel scan in the test sequence with respect to the
number of shift clocks.
USER RESPONSE:
Edit the setup sequence by correcting the skewed_load and/or the skewed_unload
attribute on the channel scan event. Then rerun read_sequence_definition to
imiport the updated setup sequence and then rerun test generation.

WARNING (TBD-420): All user sequences failed checking in TBDfitSequenceInit. No


clock yemplates were created by the generate clock template code. Correct any errors in the
user sequence(s) and import the corrected user sequence(s) using
read_sequence_definition and then rerun test generation.
EXPLANATION:
TBDfitSequenceInit checks to ensure that the user Sequences can be used for this
test generation run. The user sequences which pass TBDfitSequenceInit checking
are used to generate the clock templates. TBDfitSequenceInit found no good user
sequences in the list. No clock templates were generated.
USER RESPONSE:
Correct any errors in the user sequence(s) and import the corrected user sequence
using read_sequence_definition and then rerun test generation.

WARNING (TBD-421): Test Sequence sequenceName specifies user timing data but no
dynamic patterns exist. Timing of static patterns is not supported. Sequence

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sequenceName will not be used. Correct sequence sequenceName by either removing


the timing object or adding dynamic patterns. Reimport the corrected sequence using
read_sequence_definition and then rerun test generation.
EXPLANATION:
The sequence contains timing data but no dynamic patterns exist.
USER RESPONSE:
Correct the user sequence by either removing the timing object or adding dynamic
patterns. Reimport the corrected user sequence using read_sequence_defintion,
and then rerun test generation.

ERROR (TBD-422): [Internal] The test generator Test Procedure contains non-uniform test
sequences. TBDfitSequence cannot process it. Contact Cadence Customer Support for
assistance.
EXPLANATION:
For sequence matching purposes between the TG sequences and the user sequences,
TBDfitSequence makes an assumption that all TG sequences will have uniform
clocking. The TG Test Procedure received by TBDfitSequence does not have uniform
sequences.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

WARNING (TBD-423): Test sequence sequenceName conflicts with the TC attribute


specified on pin pinName. The sequence will be used. Ensure the test sequence is correct.
If not, edit the sequence and rerun read_sequence_definition to import the updated
sequence, and then rerun test generation. If the sequence is correct, change the test
constrained pin attribute by editing the test mode definition and rebuilding the testmode
EXPLANATION:
The pin, pinName, was specified to be held constant by a TC attribute. These attributes
are not intended to be overridden. TSV uses these values in determining whether the
logic conforms with the design guidelines which support the generation of valid test
vectors. sequenceName specifies a pulse or stim (to the opposite state) on this pin,
invalidating the TSV assumptions. Encounter Test cannot guarantee that its test vectors
will be valid if this state is overridden.
USER RESPONSE:

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Ensure the test sequence is correct. If not, edit the sequence and rerun
read_sequence_definition to reimport the sequence and then rerun test
generation. If the sequence is correct, change the test constrained pin attribute by editing
the test mode definition and rebuilding the test mode.

WARNING (TBD-424): Automatic clock sequence generation has produced pulses on one
or more pseudo-primary inputs. Tests produced by these sequences cannot be applied to the
hardware. Specify one or more or more user-generated test sequences when running test
generation for tests that can be applied to the hardware.
EXPLANATION:
This test mode contains some pseudo primary inputs, which Encounter Test can exercise
only with the help of user-supplied sequences. Test generation will proceed on an
uncommitted basis using automatic sequences to exercise the pseudo primary inputs.
An audit bit is set to alert downstream (manufacturing) processes that the test vectors do
not include all the primary input stimuli required to run on a hardware tester.
USER RESPONSE:
Specify one or more user-generated test sequences. The test sequences must first be
coded and imported using read_sequence_definition unless this has already
been done. If you are not familiar with this process, see "Coding Test Sequences" in the
Automatic Test Pattern Generation User Guide.

WARNING (TBD-425): Test Sequence, seqName, did not qualify for the run. A stim event
conflicted with a specified linehold value. Conflicts with lineholds are not supported. Either
remove the linehold which is conflicting with the stim event or change the value of the linehold
and then rerun.
EXPLANATION:
The referenced sequence name did not qualify for the run. A linehold value in the
sequence conflicts with a stim event.
USER RESPONSE:
If the Test Sequence is to be used, ensure the sequence is correct. Either remove the
linehold which is conflicting with the stim event or change the value of the linehold and
then rerun.

WARNING (TBD-426): seqName could not be collapsed. The test type of the sequence
was not specified as opcbistand only sequences with a test type of opcbistand are
collapsed.
EXPLANATION:

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TBDCollapseSequence collapsed the sequence, but this sequence was not specified
as opcbist type.
USER RESPONSE:
Ensure the sequence is specified as test type of opcbist and rerun if necessary.

WARNING (TBD-427): [Severe] seqName was not able to be collapsed. The test type of
the sequence was specified as opcbist, but it did not pass TBDcollapseSequence
validation
EXPLANATION:
TBDcollapseSequence was a collapsed sequence, but this sequence was not
specified as opcbist type.
USER RESPONSE:
Ensure the sequence is specified as test type of opcbist and rerun if necessary.

WARNING (TBD-428): Scan cycle NNN of Observe register NNN contained an X which
could not be masked be the TBDgenerateMasks function. The existing Channel Mask
Register(s) could not mask this Observe reqister.
EXPLANATION:
The Observe register which required masking could not be masked. The existing
Channel Mask Register(s) could not mask this Observe reqister.
USER RESPONSE:
Processing continues. No signature will be produced for the test. If the masking logic is
incorrect, correct the problem and rerun.

WARNING (TBD-429): A scan load or unload event was found within the modeinit
sequence. Scan load and unload events within the modeinit sequence are not expanded.
EXPLANATION:
If a scan load or unload event is found within the modeinit sequence, it is not expanded
by report_vectors when expanding scan operations. Processing continues.
USER RESPONSE:
No response required.

WARNING (TBD-430): No Channel_Scan event was found in test sequence


sequenceName. Its setup sequence, setupSequenceName contains a Channel_Scan
event. This sequence will not be used.

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EXPLANATION:
The setup sequence for the referenced test sequence specified a channel scan, but the
test sequence does not include a Channel_Scan event.
USER RESPONSE:
Edit the test sequence and add a Channel_Scan event. Rerun
read_sequence_definition to import the updated test sequence and then rerun
test generation.

WARNING (TBD-431): One or more holes exist in this designs controllable registers. These
holes will cause scan values to be lost when data is shifted within the control registers.
EXPLANATION:
TBDmanipulateStimLatchEvent found that one or more scan chain holes exist.
When shifting scan chain values the existance of holes causes some data values to be
losted. Loss of these values may cause one or more of the targeted faults to not be
tested.
USER RESPONSE:
none.

WARNING (TBD-432): The test mode is not built correctly to allow for masking. Masking
will not be done for any tests. Check the configuration of your masking.
EXPLANATION:
ATPG is unable to mask any X's in the channels. Check the masking configuration add
adjust as desired. See build_testmode and verify_test_structures for
possible mask configuration problems.
USER RESPONSE:
No response required.

WARNING (TBD-500): Lineholds and/or LFSR seed specifications caused the mode
initialization sequence to be updated. The modified Scan_Load event is changed and there
is a Scan_Unload event which may no longer have the correct values.
EXPLANATION:
The mode initialization sequence was modified by the specification of lineholds on fixed
value latches and/or LFSR seeds. This affected the last Scan_Load event in the
sequence. This event is followed by a Scan_Unload event, but the Scan_Unload event

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is not updated since the mode initialization sequence is not resimulated. Therefore, the
Scan_Unload event may have the wrong value.
USER RESPONSE:
Make sure you really wanted to override the fixed value latch(es). Make sure you
specified the correct test mode for this run. Export the mode initialization sequence and
examine it to verify that all Scan_Unload events following the last Scan_Load event are
still valid when the Scan_Load event is changed in accordance with the lineholds and
seeds for this run. If you find that some Scan_Load in the mode initialization sequence
is not valid for this run, then you will have to either change the setup for this run and
repeat it or fix the initialization sequence and rebuild the test mode.

WARNING (TBD-502): User sequence: seqName failed TBDfitSequenceInit checking.


The sequence type is not supported. Contact Cadence Customer Support for assistance.
EXPLANATION:
The sequence type is not supported.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

WARNING (TBD-503): User sequence: seqName failed TBDcollapseSequence.


Stim_PI events are not supported by TBDcollapseSequence.
EXPLANATION:
The sequence passed to TBDcollapseSequence contains a Stim_PI or
Stim_PI_Plus_Random event.
USER RESPONSE:
Remove the Stim_PI event from the user sequence and rerun if necessary.

WARNING (TBD-505): The stim to stim val on net name, flat index flat index
overrides the non-default LINEHOLD to Line Hold val.The stim value will be simulated.
EXPLANATION:
A non-default linehold is overriden by a stim. The override is allowed.
USER RESPONSE:
Ensure that the override is correct.

INFO (TBD-801): Application_name Output file will be fileName.

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EXPLANATION:
Name of the output file.
USER RESPONSE:
No response required.

INFO (TBD-805): File(s) generated (bytes and name):


file_data
EXPLANATION:
The size and names of the files produced by this invocation of commit_tests are listed
for informational purposes following this message.
USER RESPONSE:
Informational message, no response necessary.

INFO (TBD-808): The objectName object is already in use try again later.
EXPLANATION:
Data is currently in use. Rerun application after the other jobs have completed.
USER RESPONSE:
No response required.

INFO (TBD-810): Experiment experimentName is saved to the master test vectors


odometers: firstOdometer to lastOdometer (Relative test numbers firstNumber
to lastNumber).
EXPLANATION:
Odometers and relative test numbers for the test vectors of the experiment after they are
commited to the master test vectors file.
USER RESPONSE:
No response required.

WARNING (TBD-811): Experiment experimentName does not contain valid test data.
commit_tests will not continue.
EXPLANATION:
An empty experiment was created by atpg. We will not attempt to commit this to the
master bin file.

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USER RESPONSE:
No response required.

INFO (TBD-813): expand_vectors input Vectors file is fileName. The input sequence
is sequenceFileName.
EXPLANATION:
The message states the name of the input test vectors file and the input sequence
definition file.
USER RESPONSE:
No response required.

INFO (TBD-814): expand_vectors output Vectors file is fileName.


EXPLANATION:
The message states the name of the output test vectors file.
USER RESPONSE:
No response required.

INFO (TBD-815): Sequence file (fileName) has been temporarily renamed from
fileName to fileName while a new version of it is being created.
EXPLANATION:
The sequence file has been temporarily renamed as indicated.
USER RESPONSE:
If any errors or system failures occur before program execution is complete, you may
recover your old sequence file by renaming the sequence file back to its original name.

INFO (TBD-816): Sequence file (fileName) has been successfully updated. fileName
has been deleted.
EXPLANATION:
The sequence file, which was temporarily renamed, now exists again with its original
name.
USER RESPONSE:
If any errors or system failures occur before program execution is complete, you may
recover your old sequence file by renaming the TBDseq file back to its original name.

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INFO (TBD-817): The test vectors file has been temporarily renamed from fileName to
fileName while a new version of it is being created.
EXPLANATION:
The test vectors file has been temporarily renamed as indicated.
USER RESPONSE:
If any errors or system failures occur before program execution is complete, you may
recover your old tes vectors file by renaming the temporary vectors file back to its original
name.

INFO (TBD-818): The vectors file (fileName) has been successfully updated. fileName
has been deleted.
EXPLANATION:
The vectors file, which was temporarily renamed, now exists again with its original name.
USER RESPONSE:
If any errors or system failures occur before program execution is complete, you may
recover your old vectors file by renaming the temporary file back to its original name.

INFO (TBD-822): cmdname Output test vectors file name will be filename.
EXPLANATION:
Name of the test vectors output file.
USER RESPONSE:
No response required.

INFO (TBD-823): Pattern audit statistics cannot be printed because they do not exist.
EXPLANATION:
No pattern audit statistics exist for the file.
USER RESPONSE:
No response required.

INFO (TBD-824): The following test sequence was generated by ATPG, but could not be
matched with any of the user-specified sequences. This sequence will not be used.
EXPLANATION:

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Test generation is being run with user-defined test sequences. The test pattern generator
has created the sequence which is printed following this message, but the number of PI
and Latch stims do not match any of the specified user sequences so it cannot be used.
The faults targetted by this sequence may go untested.
USER RESPONSE:
If you have flexibility to define other sequences, examine this automatic sequence and
then define one that more closely matches it and conforms to the necessary constraints.
Then code it, run read_sequence_definition to import the sequence, and run
another test generation job.

INFO (TBD-827): The test vectors file is already at the required format level, migration is not
required.
EXPLANATION:
The user is only required to use the TBDmigrate function when processing TBDbin files
produced prior to TestBench Test 4.1. The Migrate function has determined that the
formatlevel of the TBDbin is TestBench Test 4.1 or greater.
USER RESPONSE:
No response required.

INFO (TBD-828): TBDmigrate: the input TBDbin file is backlevel. Run TBDmigrate with the
-w flag to create an experiment at the current release level.
EXPLANATION:
The test vectors file was produced prior to TestBench 4.1.
USER RESPONSE:
Run TBDmigrate with the -w flag to create an experiment at the current release level.

INFO (TBD-829): TBDmigrate for: PROJECT=project PARTID=entity/


variation/iteration TESTMODE=testMode INEXPERIMENT=experiment is not
necessary. No changes in test data were required.
EXPLANATION:
No changes in the test vectors were required. The pattern Audit statistics for the input
TBDbin file were updated to indicate that no migration is required. If an output experiment
was requested, none will be written.
USER RESPONSE:
No response required.

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INFO (TBD-830): Test vectors file has been renamed from fileName to fileName.
EXPLANATION:
The vectors file has been renamed as indicated.
USER RESPONSE:
No user response required.

(severity) (TBD-831): ) commit_tests CompletionString.


EXPLANATION:
Indicates whether or not commit_tests was successful.
USER RESPONSE:
No response required, this is informational.

WARNING (TBD-832): fileName is not registered on the globalData file. No updates were
made to the committed tests file.
EXPLANATION:
The uncommitted tests file was not registered on the globalData File. commit_tests
could not update the committed tests File.
USER RESPONSE:
Check messages from the job log which created this experiment.

INFO (TBD-836): Pattern Statistics for test vectors: TBDbin.testmode.experiment


EXPLANATION:
Gives the name of the testmode being processed by report_vector_volume.
USER RESPONSE:
No response required.

INFO (TBD-838): commit_tests produced the following files (bytes/name):


EXPLANATION:
The size and names of the files produced by this invocation of commit_tests are listed
for informational purposes following this message.
USER RESPONSE:

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Informational message, no response necessary.

INFO (TBD-840):
Experiment: experiment
---------------------------------
Tester loops: NNN
Test Sequences: NNN
ScanLoad Events: NNN
ScanUnloadEvents: NNN
Number of weight sets: NNN
Effective patterns: NNN
Total patterns: NNN

EXPLANATION:
This message states Information about test vectors contained within the test vectors file.
USER RESPONSE:
No response required, informational message.

INFO (TBD-841): Effective tester cycles: NNN


Total Tester cycles: NN
EXPLANATION:
This message is a continuation of message 840. Only 9 parameters are allowed by the
message handler.
USER RESPONSE:
No response required, informational message.

(severity) (TBD-842): report_vector_volume CompletionString.


EXPLANATION:
Indicates whether or not report_vector_volume was successful.
USER RESPONSE:
No response required if informational. If a terminating message, refer to previous error
messages. Correct problem(s) and rerun.

INFO (TBD-843): FCM/WBM module test data volume calculation


Mode: testmode
------------------------------
Scan Chains: NNN
Maximum scan chain length: NNN
Total # tests per 256k logical buffer: NNN

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Logical 256k buffers in a single buffer load: NNN


Total # effective tests generated: NNN
Max tests generated must be less than: NNN

EXPLANATION:
Information about test data contained within the vectors. Based on FCM/WBM Module
test data volume calculation from Burlington.
USER RESPONSE:
No response required, informational message.

INFO (TBD-844): FCH module test data volume calculation


Mode: testmode
------------------------------
Scan Chains: NNN
Maximum scan chain length: NNN
Total # effective tests generated: NNN
Total tester data volume, must be less than 64M: NNN

EXPLANATION:
Information about test data contained within the vectors. Based on FCH Module test data
volume calculation from Burlington.
USER RESPONSE:
No response required, informational message.

INFO (TBD-845): WBL module test data volume calculation


Mode: testmode
------------------------------
Scan Chains: NNN
Maximum scan chain length: NNN
Total # tests per 2M buffer segment: NNN
Total # effective tests generated: NNN
Max tests that fit in a single buffer load: NNN

EXPLANATION:
Information about test vectors contained within the vectors file. Based on FCM/WBM
Module test data volume calculation from Burlington.
USER RESPONSE:
No response required, informational message.

INFO (TBD-846):
Mode: testmode
------------------------------

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Scan Chains: NNN


Maximum scan chain length: NNN
Total # effective tests generated: NNN

EXPLANATION:
Information about test vectors contained within the vector file.
USER RESPONSE:
No response required, informational message.

INFO (TBD-847): Simulation options report for file: fileName


EXPLANATION:
The simulations options report has started.
USER RESPONSE:
No response required, this is informational.

INFO (TBD-848): Experiment NNN TestSection NNN simulation options: options


EXPLANATION:
The simulation options in effect for when this test section was created are listed.
USER RESPONSE:
No response required, this is informational.

INFO (TBD-849):No simulation options were found for Experiment NNN TestSection NNN.
EXPLANATION:
No simulation options were found for this TestSection. There are two possible
explanations for this. The tests were created before simulation options were stored
within the test vectors file, or the vectors have not been simulated by Encounter Test.
USER RESPONSE:
No response required, this is informational.

INFO (TBD-850): File name contains no test vectors.


EXPLANATION:
Either no experiments were found or the experiment(s) found contained no Test
Sections. The file contains no test vectors.

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USER RESPONSE:
No response required, this is informational.

INFO (TBD-851): Simulation options report complete.


EXPLANATION:
The simulation options report has completed.
USER RESPONSE:
No response required, this is informational.

INFO (TBD-852): Sequence sequenceName was found to be complex for the following
reason(s): reasons
EXPLANATION:
Encounter Test test generators cannot process user sequences that contain more than
the following:
1 scan_load event
2 Stim_PI, Stim_PI_Plus_Random, Put_Stim_PI or Stim_PPI events
2 static clock pulses
10 dynamic clock pulses
1 dynamic pattern
Events with Control Statements STIM=DELETE PI_STIMs=n or
LATCH_STIMs=n Stim_Clock events
If the user-supplied sequence exceeded one or more of the preceding limits, the
sequence is complex. Patterns that are marked with key data TG=IGNORE or groups of
patterns beginning with TG=IGNORE_FIRST and ending with TG=IGNORE_LAST are
skipped during the complexity checking. When the sequence is found to be complex,
Encounter Test will attempt to use the older sequence fitting process.
USER RESPONSE:
No response required, this is informational.

WARNING (TBD-853): Sequence SequenceName has more than 1 clock input active
during a dynamic clock pulse event. Simulation will be done with the clocks overlapped. The
results may be incorrect if there are races in the design.
EXPLANATION:

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A patterns has been detected which activates multiple clock inputs simultaneously. For
cases in which multiple clocks are pulsed simultaneously within the same event,
Encounter Test does not do any timing verification to ensure the clock pulses will actually
overlap in the logic. Encounter Test will simulate the logic with the clocks on
simultaneously, but this may produce incorrect results if the clocks do not actually
overlap.
USER RESPONSE:
There are two different responses that can be taken. If the clocks are not required to be
on simultaneously, the input patterns can be modified to serially activate and deactivate
the clocks. If the clocks are required to be overlapping to produce the correct results, the
user should verify that the timing of the common logic ensures that the clocks are
overlapped so that the simulator's predicted results will match the actual hardware.
TBD Internal program error messages 999.
All internal program error messages will use message # 999. This internal message will
give the filename of the file where the error occurred, the line number where the error
occurred and a short string identifying the program problem.

INFO (TBD-854): No skewedscanfill sequence exists for the test mode. A default
skewedscanfill sequence has been created by the scanfill process.
EXPLANATION:
Skewed_Scan_Loads are possible for the specified test mode. No skewedscanfill
sequence exists for this test mode. The scanfill code creates a default
skewedscanfill sequence. The default skewedscanfill sequence consists of:
SCANENTRY sequence ( if one exists )
SCANPRE
1 to n copies of the SCAN sequence ( scanfill length )
SKEWLOAD sequence
SECTEXIT sequence ( if one exists )
SCANEXIT sequence ( if one exists )
USER RESPONSE:
No response required, this is informational.

INFO (TBD-855): Holes exist within the control registers. ScanFill processing shifts values
within the Scan_Load events as part of the scanFill processing. Latch values which are
shifted into holes within the control register are lost. Test coverage could be affected.

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EXPLANATION:
Shifting values within the control registers which contain holes can affect the test
coverage. Some faults targeted by test generation may not be tested.
USER RESPONSE:
No response required, this is informational. If this is a probelm correct control register
problems to remove the holes, rebuild the testmode and then rerun.

INFO (TBD-856): After prepare_core_migration_tests, numberSequences test


sequences have been converted.
EXPLANATION:
This is a count of the number of patterns that were converted to the TBDtdm file.
USER RESPONSE:
No response required, this is informational.

ERROR (TBD-999): [Internal] Internal Program Error occurred in file: fileName


line:NNN.msgString
EXPLANATION:
Program Error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

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8
TBM - Test Pattern Manipulation
Messages

TBM-001 through TBM-030 on page 167


TBM-031 through TBM-999 on page 175

TBM-001 through TBM-030


ERROR (TBM-001): [Internal] Space allocation failed. Cannot allocate space for table.
Sufficient space was not available to run the requested application.
EXPLANATION:
Sufficient space was not available to run the requested application.
USER RESPONSE:
Rerun when more space is available.

INFO (TBM-002): Encounter Test Pattern Audit statistics indicate that no pattern
manipulation is required.
EXPLANATION:
The Encounter Test pattern audit statistics indicate that manipulation is not required for
this experiment.
USER RESPONSE:
No response required.

INFO (TBM-003): Encounter Test test pattern audit statistics indicate that the test patterns
for this experiment have already been manipulated.
EXPLANATION:

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The Encounter Test pattern Audit statistics indicate that


insert_vector_pipeline_sequence was previously run on this experiment. No
manipulation is required.
USER RESPONSE:
No response required.

ERROR (TBM-004): [Internal] Unable to obtain a read lock on the objectName object.
EXPLANATION:
The object indicated in the message is currently unavailable.
USER RESPONSE:
Rerun after object has been freed.

ERROR (TBM-005): [Internal] Error - failure attempting to lock objectName object.


Object is not registered on the globalData file or incorrect input parameters have been
specified.
EXPLANATION:
The object indicated in the message is not registered on the globalData file. Wrong input
parameters could have been specified.
USER RESPONSE:
Refer to previous messages. After correcting any problems rerun your job(s).
If problems persist, contact customer support (see Contacting Customer Service on
page 23).

INFO (TBM-006): insert_vector_pipeline_sequence for: filename


EXPLANATION:
The message states the name of the test vector file being manipulated.
USER RESPONSE:
No response required.

ERROR (TBM-007): [Internal] Failed while trying to register the output uncommitted test
vectors file on the globalData.
EXPLANATION: globalData

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The command attempted to register the output test vectors file on the globalData file, but
failed. A preceding error message describes the error condition. Processing terminates.
USER RESPONSE:
Correct the error condition described in the preceding message and rerun.

ERROR (TBM-008): [Internal] Failure attempting dependency creation: experiment ->


testmode.
EXPLANATION:
This experiment is dependent on the test mode. The command attempted to register this
dependency in the globalData file, but failed.
A preceding message from the globalData file utility describes the error condition.
Processing terminates.
USER RESPONSE:
Correct the error condition described in the preceding message and rerun.

ERROR (TBM-009): One or more test vectors have already been manipulated. Tests which
already have been manipulated may not be manipulated again.
EXPLANATION:
The test pattern audit statistics indicate that manipulation is required, but one or more
test vectors within the file have already been manipulated.
Determine how this occurred and correct the errors.
USER RESPONSE:
Reprocess after correcting test vector errors. If the problems persist, contact customer
support (see Contacting Customer Service on page 23).

ERROR (TBM-010): The input uncommitted tests contain an non-supported testSection


Type. Processing terminates.
EXPLANATION:
insert_vector_pipeline_sequence found a test section type of channelScan,
logic_BIST, logic_WRP or Macro. These test section types are not supported by
insert_vector_pipeline_sequence. Determine how this occurred and correct the
errors.
USER RESPONSE:

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Reprocess after correcting test vector errors. If the problems persist, contact customer
support (see Contacting Customer Service on page 23).

INFO (TBM-011): TestSequence


experiment.testSection.testerLoop.testProcedure.testSequence
was found to be invalid. It will be dropped from the output test vectors file. A pipeline scan test
must begin with a Scan_Load event and either end with a Scan_Unload event or contain a
Channel_Scan event. One or more of these events were missing from the specified test.
EXPLANATION:
A pipeline scan test must begin with a Scan_Load event and either end with a
Scan_Unload event or contain a ChannelScan event. One or more of these events were
missing from the specified test.
USER RESPONSE:
No response required.

ERROR (TBM-012): insert_vector_pipeline_sequence encountered an


unsupported event type of type. insert_vector_pipeline_sequence processing will
terminate.
EXPLANATION:
Skewed loads are not supported for pipeline scan. The input test vectors contain skewed
loads. The patterns cannot be manipulated.
USER RESPONSE:
Correct the input patterns and rerun.

ERROR (TBM-013): insert_vector_pipeline_sequence failed while trying access


data from the scanop sequence. Processing will terminate.
EXPLANATION:
While trying to process a Scan_Load or Scan_Unload event,
insert_vector_pipeline_sequence was returned a NULL pointer when trying to
access the scan operation sequences. Without this data,
insert_vector_pipeline_sequence cannot continue processing.
USER RESPONSE:
Ensure there are no problems with the sequence file for the currently processed
testmode. If there are no problems with the sequence file, contact customer support (see
Contacting Customer Service on page 23) for assistance.

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INFO (TBM-014): The test vectors file has been temporarily renamed from fileName to
fileName while a new version of it is being created.
EXPLANATION:
The test vectors file has been temporarily renamed as indicated.
USER RESPONSE:
If any errors or system failures occur before program execution is complete, you may
recover your old test vectors file by renaming the temporary file back to its original name.

ERROR (TBM-015): Failed while attempting to rename fileName.


insert_vector_pipeline_sequence processing will terminate.
EXPLANATION:
An attempt to rename the referenced file failed and caused termination.
USER RESPONSE:
Ensure the file exists. If the file exists, contact customer support (see Contacting
Customer Service on page 23).

ERROR (TBM-016): Failed while attempting to open the fileName file.


insert_vector_pipeline_sequence processing will terminate.
EXPLANATION:
An attempt to open the referenced file failed and caused termination.
USER RESPONSE:
Ensure the file exists. If the file exists, contact customer support (see Contacting
Customer Service on page 23).

ERROR (TBM-017): Failure reading Filename fileName.


insert_vector_pipeline_sequence processing will terminate.
EXPLANATION:
An attempt to read the referenced file failed and caused termination.
USER RESPONSE:
Review preceding error messages to determine the cause. Correct error(s) and rerun.

ERROR (TBM-018): [Internal] I/O error occurred writing to fileName.


insert_vector_pipeline_sequence processing will terminate.

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EXPLANATION:
An I/O error occurred and caused termination.
USER RESPONSE:
Verify that you are not running out of space in your working directory, and check for any
system error messages. Fix any problems and rerun.

(severity) (TBM-019): insert_vector_pipeline_sequence CompletionString.


EXPLANATION:
The message indicates whether insert_vector_pipeline_sequence was
successful.
USER RESPONSE:
No response required.

INFO (TBM-020): File(s) generated (bytes and name):


EXPLANATION:
The size and names of the files produced and/or updated by this invocation of
insert_vector_pipeline_sequence are listed for informational purposes following
this message.
USER RESPONSE:
No response required.

ERROR (TBM-021): insert_vector_pipeline_sequence - pinname has a CME or


CMI flag and is also pipelined.
EXPLANATION:
The referenced pin contains either a CME or CMI flag as well as being pipelined. Further
updates to insert_pipeline_vector_sequence are required before this design
style can be handled.
USER RESPONSE:
Do not pipeline these control signals.

WARNING (TBM-022): Sequence Definition name was found to be invalid.


insert_vector_pipeline_sequence cannot process this sequence definition.
EXPLANATION:

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A pipeline scan sequence definition must contain a Channel_Scan event, however


none was found. The sequence definition will not be manipulated.
USER RESPONSE:
No response required.

WARNING (TBM-023): Sequence Definition name was not found in the TBDseq file.
Processing continues.
EXPLANATION:
The referenced sequence was not found in the sequence definition file therefore it cannot
be manipulated.
USER RESPONSE:
No response is required.

WARNING (TBM-024): Sequence Definition name has already been manipulated. It will
not be manipulated again. Processing continues.
EXPLANATION:
The referenced sequence definition has already been manipulated. The program does
not manipulate a previously manipulated sequence definition.
USER RESPONSE:
No response required.

WARNING (TBM-025): The test mode initialization sequence does not need to be
manipulated. Processing continues.
EXPLANATION:
The program has determined the test mode initialization sequence does not require
manipulation.
USER RESPONSE:
No response is required.

ERROR (TBM-026): insert_vector_pipeline_sequence failed attempting to open


the name.
EXPLANATION:
insert_vector_pipeline_sequence failed to open the referenced TBDseq.

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USER RESPONSE:
Verify the name and permissions, then rerun.

WARNING (TBM-027): insert_vector_pipeline_sequence found conflicting values


for PI pinname and it corresponding pseudo PI. Output TBDbin file pattern odometer.
EXPLANATION:
When manipulating the pattern, the PPI event following the Stim_PI event contained a
conflicting value on the pseudo PI. The Stim_PI value is dropped and the pseudo PI
value is used.
USER RESPONSE:
If the Stim_PI value is required, correct the pseudo PI value in the input file and rerun.

severity (TBM-028): delete_testrange completionString


EXPLANATION:
The message and severity indicates whether delete_testrange successfully
completed.
USER RESPONSE:
No response required.

ERROR (TBM-029): The delete_testrange command failed due to an invalid


testrange specification. Refer to preceding messages which highlight testrange
problems. Correct the testrange specification and rerun.
EXPLANATION:
The specified testrange either does not exist in the input experiment or it is not wholly
contained within the input experiment. That is, nonexistent tests were asked to be
removed. Tests are not removed if a request is ambiguous.
USER RESPONSE:
Ensure the existence of all tests specified for removal from the input test vectors. Correct
the testrange specification and rerun delete_testrange.

ERROR (TBM-030): The delete_testrange command encountered looping tests within


the input experiment and cannot be used to remove tests from the input test vector file.
EXPLANATION:

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The delete_testrange command does not support removal of looping


Test_Sequences from the test vector file.
USER RESPONSE:
Use the following procedure to delete looping Test_Sequences:
1 Run report_vectors to create a TBDpatt file for the input experiment
2. Delete the required tests from the TBDpatt file.
3. Run read_vectors to create a new experiment.

TBM-031 through TBM-999


WARNING (TBM-031): [Severe] The delete_testrange command removed one or
more tests where string_describing_condition.
EXPLANATION:
When removing a test where the preceding Channel_Scan or
Compressed_Output_Stream event indicates overlapped scan, the tests are not
independent. Each test influences not only the output responses for that test, but also for
the preceding test. When such tests are rearranged in any manner, the output responses
are no longer valid and must be recomputed. Tests will fail at the tester.
USER RESPONSE:
Run simulate_vectors or analyze_vectors on the new experiment to recompute
the output responses.

WARNING (TBM-032): [Severe] The delete_testrange command removed one or


more tests where string_describing_condition.
EXPLANATION:
The tests must be independent however the condition stated by this message indicates
the tests are not independent. Each test influences not only the output responses for that
test, but also for the succeeding test. When such tests are rearranged in any manner, the
output responses are no longer valid and must be recomputed. Tests will Fail at the
tester.
USER RESPONSE:
Run simulate_vectors or analyze_vectors on the new experiment to recompute
the output responses.

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ERROR (TBM-033): The testrange specified to the delete_testrange command


would result in the removal of all tests from the uncommitted test vector file. The
delete_testrange command treats this as an error. If your intent is to remove all tests,
use the delete_tests command. If your intent is to remove some but not all tests, correct
the testrange specification and then rerun delete_testrange.
EXPLANATION:
The delete_testrange command treats the stated condition as an error for the
following reasons:
It is safer to assume erroneous testrange input rather than using
delete_testrange to delete all of the tests.
Removing all test vectors is more efficiently accomplished by the
delete_tests command. The delete_tests command removes all
Encounter Test files associated with the uncommitted test vectors as well as the
test vectors.
USER RESPONSE:
Either correct the testrange specification and rerun delete_testrange or run
delete_tests to remove all tests.

ERROR (TBM-034): name was specified for both EXPERIMENT and INEXPERIMENT.
EXPERIMENT and INEXPERIMENT can not be the same. Processing terminates. Rerun
specifying a new EXPERIMENT name.
EXPLANATION:
When running edit_compression_pipeline_vectors you cannot over write the
input experiment file with the manipulated test vectors. The un-manipulated vectors are
required for diagnostic processing.
USER RESPONSE:
Specify a new output experiment name and then rerun.

ERROR (TBM-035): Error opening required file file_name. Processing terminates.


EXPLANATION:
The referenced file cannot be opened or does not exist.
USER RESPONSE:
Ensure the file exists and that it has the correct permissions. If the file does not exist, run
the prepare compression pipeline script to generate the file and then rerun this
command.

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WARNING (TBM-036): TBM error on line line_number. object_name is not an SI or


SO pin (entry is ignored).
EXPLANATION:
Specify only scan input and scan output pins in the compressionPipelineInfo.
There is an error in the script to prepare compression pipelines.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

INFO (TBM-040): Initializing togglegram data structure


EXPLANATION:
The toggle gram data structure allocation process is starting.
USER RESPONSE:
No response required.

INFO (TBM-041): Reading design into memory


EXPLANATION:
The program is reading the design information.
USER RESPONSE:
No response required.

INFO (TBM-042): Successfully read design into memory


EXPLANATION:
The design information has been successfully read into memory.
USER RESPONSE:
No response required.

ERROR (TBM-043): string register number of length number is string.


EXPLANATION:
The toggle information for the scan chain cannot be calculated if a scan chain is only
controllable or only observable.
USER RESPONSE:

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Correct the scan chain, rerun ATPG, and then run write_toggle_gram.

INFO (TBM-044): Found number scan chains that are both observable and controllable in
the current test mode.
EXPLANATION:
The message gives information on the control and observe register mappings for the
current test mode.
USER RESPONSE:
No response required.

ERROR (TBM-045): write_toggle_gram requires all scan chains to be both observable


and controllable to calculate toggle information.
EXPLANATION:
The program has detected that not all all registers are both controllable and observable.
The toggle information for the scan chain cannot be calculated if a scan chain is only
controllable or only observable.
USER RESPONSE:
Correct the scan chain, rerun ATPG, and then run write_toggle_gram.

INFO (TBM-046): The longest scan chain length is number.


EXPLANATION:
The message states the longest scan chain length, that is, the number of shift cycles for
each sequence.
USER RESPONSE:
No response required.

INFO (TBM-047): Reading weight table file filename.


EXPLANATION:
The program is reading the weight table file. The flops under the block will be assigned
the weight specified in the file.
USER RESPONSE:
No response required.

INFO (TBM-048): Completed reading weight table file

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EXPLANATION:
The program has completed reading the weight table file.
USER RESPONSE:
No response required.

INFO (TBM-049): Completed initializing togglegram data structures


EXPLANATION:
The toggle gram data structure initialization process is complete.
USER RESPONSE:
No response required.

INFO (TBM-050): Processing toggle information for the specified testrange


EXPLANATION:
The program is processing the test sequences that will be analyzed for toggle activity.
USER RESPONSE:
No response required.

INFO (TBM-051): Processing Scan_Unload of sequence string and Scan_Unload


sequence of string.
EXPLANATION:
This message identifies the currently processed sequence.
USER RESPONSE:
No response required.

INFO (TBM-052): Completed processing toggle information for the specified testrange
EXPLANATION:
Toggle information processing is complete for the specified testrange.
USER RESPONSE:
No response required.

INFO (TBM-053): Generating a toggle report categorized by Sequence/ScanCycle/Flop

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EXPLANATION:
The program is generating a categorized toggle analysis report.
USER RESPONSE:
No response required.

INFO (TBM-054): string Toggle report is categorized by category


EXPLANATION:
The toggle analysis report is categorized by the referenced category.
USER RESPONSE:
No response required.

INFO (TBM-055): Writing toggle count file filename for string cycles only.
EXPLANATION:
The program is writing the toggle count file to the referenced file name.
USER RESPONSE:
No response required.

ERROR (TBM-056): License string is unavailable.


EXPLANATION:
The referenced license is required to run the program, but is unavailable.
USER RESPONSE:
Ensure the license is available and rerun.

ERROR (TBM-057): Unable to check-in license string


EXPLANATION:
An error occurred while returning the license.
USER RESPONSE:
Check the license server, resolve problems, and rerun.

INFO (TBM-058): Successfully obtained licenses string , string


EXPLANATION:

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The referenced licenses were successfully obtained.


USER RESPONSE:
No response required.

INFO (TBM-061): Obtaining licenses string , string


EXPLANATION:
The program is obtainng the referenced licenses.
USER RESPONSE:
No response required.

INFO (TBM-062): All test sequences will be analyzed for toggle activity.
EXPLANATION:
All test sequences in the TBDbin will be analyzed for toggle activity.
USER RESPONSE:
No response required.

INFO (TBM-063): Test sequences between odometer range string and string will be
analyzed for toggle activity.
EXPLANATION:
Test sequences in the referenced odometer range will be analyzed for toggle activity.
USER RESPONSE:
No response required.

INFO (TBM-064): Relative test sequence number string maps to odometer string
EXPLANATION:
The message states the mapping from the referenced relative test sequence number to
the referenced odometer string.
USER RESPONSE:
No response required.

ERROR (TBM-065): write_toggle_gram will need at least two sequences to analyze


toggle count information.

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EXPLANATION:
The write_toggle_gram command uses the Scan_Unload of the first sequence and
the Scan_Load of the next sequence to analyze toggle activity for the sequence.
USER RESPONSE:
Regenerate test patterns with more than one sequence and then rerun
write_toggle_gram.

WARNING (TBM-066): Window size of number cycles for calculating sliding average is
reduced to number
EXPLANATION:
If the scan chain length is lesser than the specified window size, the window size used
for calculating the sliding window is reduced.
USER RESPONSE:
No response is required if this condition is acceptable; otherwise, modify the window size
to obtain the desired results.

WARNING (TBM-067): Unable to find flop/block string in the design


EXPLANATION:
The program was unable to find the flop or block associated with the referenced flop/
block name given in the weight table file.
USER RESPONSE:
Ensure the flop or block name is in the design and rerun if necessary.

INFO (TBM-068): Assigning weight float to scan-flip flop string


EXPLANATION:
The assigned weight is based on the information in weight table file.
USER RESPONSE:
No response required.

WARNING (TBM-069): Weights assigned to string are commented. The commented


weights are not assigned.
EXPLANATION:

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One of the lines in the weight table file is commented, the weight is not assigned. A line
beginning with a hash is a commented line.
USER RESPONSE:
No response is required if this condition is acceptable; otherwise modify the commented
string as necessary and rerun.

ERROR (TBM-070): Unable to find committed experiment string


EXPLANATION:
The committed experiment was not found in the TBDbin data.
USER RESPONSE:
Specify a valid committed experiment and rerun.

ERROR (TBM-071): Unable to find an uncommitted experiment string


EXPLANATION:
The uncommitted experiment was not found in the TBDbin data.
USER RESPONSE:
Specify a valid uncommitted experiment and rerun.

INFO (TBM-072): The keyword string takes the value string


EXPLANATION:
This message lists all keywords and their values for the current invocation of the
command.
USER RESPONSE:
No response required.

WARNING (TBM-074): Could not find a Scan_Unload and Scan_Load pair in the
specified testrange.
EXPLANATION:
One Scan_Unload of a sequence and Scan_Load of the immediate next sequence is
required to calculate the switching activity. The specified testrange does not include
these.
USER RESPONSE:

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Specify a valid testrange and rerun.

WARNING (TBM-075): No valid test sequences found in the specified experiment.


EXPLANATION:
The program could not find valid test sequences in the TBDBIN for the specified
experiment.
USER RESPONSE:
Check if ATPG has generated valid test patterns. Specify a valid experiment and rerun.

ERROR (TBM-076): The input experiment is created with


createinternalscanload=no. Resimulate the experiment with
createinternalscanload=yes.
EXPLANATION:
The program did not detect an Internal_Scan_Load event in the TBDbin.
USER RESPONSE:
Resimulate the experiment with createinternalscanload=yes and then rerun
write_toggle_gram.

INFO (TBM-077): Processed number sequences.


EXPLANATION:
This message states the current number of sequences for which toggle activity has been
calculated.
USER RESPONSE:
No response required.

INFO (TBM-078): The design in the current testmode has number controllable scan chains
and number observable scan chains.
EXPLANATION:
The message states the number of scan chains that can be stimulated and the number
of scan chains that can be measured.
USER RESPONSE:
No response required.

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ERROR (TBM-079): Error in weight specification in weight table file at line number.
Unexpected character number
EXPLANATION:
The weight table contains an invalid weight specification. A valid weight specification
such as 10,15,20 and so on is expected. Only zero or any positive integer are allowed.
USER RESPONSE:
Specify a valid weight specification number and then rerun.

ERROR (TBM-080): Error in weight specification in weight table file at line number.
EXPLANATION:
The weight table file contains an invalidly specified name. The name must be quoted.
USER RESPONSE:
Correct the name and rerun.

INFO (TBM-081): Reading region file filename


EXPLANATION:
The region file is read and the flops or all flops under the block will only be accounted for
calculating toggles.
USER RESPONSE:
No response required.

INFO (TBM-082): Completed reading region file filename


EXPLANATION:
The program has completed reading the region file.
USER RESPONSE:
No response required.

ERROR (TBM-083): Module name specification error in region file at line number.
EXPLANATION:
The region file contains an invalidly specified module name. The name must be quoted.
USER RESPONSE:

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Correct the module name and rerun.

ERROR (TBM-084): Error in generating Tester Cycle Information file string from
write_vectors.
EXPLANATION:
The write_toggle_gram command runs write_vectors as a sub-process to generate
tester cycle information. An error has occurred during the write_vectors phase that
prevents generation of the Test Cycle Information file.
USER RESPONSE:
Run write_vectors separately, determine and correct problems, and then rerun
write_toggle_gram.

WARNING (TBM-085): Unexpected clock toggle at event string for clock string. The
capture toggles might be incorrect for this sequence.
EXPLANATION:
The write_toggle_gram command currently supports capture toggle calculation for
only one capture pulse.
USER RESPONSE:
Either ignore the capture toggle information or generate test vectors with a single capture
cycle and then rerun write_toggle_gram.

ERROR (TBM-086): No scannable flops found in the region(s) specified in the region file.
Ensure the region file contains at least one scannable flop and then rerun
write_toggle_gram.
EXPLANATION:
No scannable flip-flops were detected in the regions for which the toggle must be
calculated. Either the modules(s) specified in the region file do not exist or region file
does not contain any scannable flops.
USER RESPONSE:
Ensure that specified modules in the region file contain at least one scannable flop, and
then rerun write_toggle_gram.

ERROR (TBM-087): Unable to identify spreader network in the current testmode.


EXPLANATION:

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The number of observable scan chains must be greater than the number of controllable
scan chains.
USER RESPONSE:
Check the scan chains configurations, correct where required, and rerun
write_toggle_gram.

INFO (TBM-088): The total number of sequences to be analysed for scan is number and
for capture is number.
EXPLANATION:
This message gives information about the number of scan-load and scan-unload
sequence pairs to be analyzed for calculating toggle count for scan and the number of
test sequences having capture pulse events for analyzing toggle activity for capture.
USER RESPONSE:
No response is required

WARNING (TBM-089): The expected time to complete the run is number hr number mins.
EXPLANATION:
The message states a time estimate for the current execution to complete. The
calculation is based on the number of sequences to analyze and the time it takes to
analyze each sequence.
USER RESPONSE:
No response is required if the estimated time is acceptable. If the estimated run time is
unacceptable, split the runs into multiple runs with smaller numbers of sequences (using
the testrange keyword) to analyze and submit the runs on different machines.

INFO (TBM-090): the time for design load and data structure initialization is number
seconds.
EXPLANATION:
The message states the total time in seconds used to load the design and initialize data
structures.
USER RESPONSE:
No response required.

ERROR (TBM-091): Unable to create the template files for VoltageStorm. Ensure
permissions are properly set to create these files and then rerun write_toggle_gram.

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EXPLANATION:
The application could not create the files run_vstorm2, powermeter_command.tcl,
and vstorm2_command.tcl. These files are required to run the power flow using
VoltageStorm.
USER RESPONSE:
Ensure permissions are properly set to create these files and then rerun
write_toggle_gram.

ERROR (TBM-092): Unable to create the specified TCF file tcf_file for string.
Ensure the path is correctly specified or ensure sufficient permissions are in place.
EXPLANATION:
The application could not create the specified toggle count file. Either the specified path
does not exist or you do not have sufficient permissions to create the file.
USER RESPONSE:
Ensure the specified path is correct and that there is sufficient permission to create the
file and then rerun write_toggle_gram.

INFO (TBM-093): Writing VoltageStorm file file_name.


EXPLANATION:
The program is writing the script for VolatageStorm to the referenced file name.
USER RESPONSE:
No response required.

INFO (TBM-094): Number of scan load events for sequencestring = number.


Scan_Load event id string shall be used for scan toggle computation and event id
string will be used for capture toggle computation.
EXPLANATION:
The write_toggle_gram command does toggle calculation for one pair of
Scan_Load and Scan_Unload events. The Scan_Load from one sequence is
overlapped with the Scan_Unload from the previous sequence for scan shift
computation.
If there are multiple Scan_Load events in the same sequence, the first Scan_Load
event in that sequence is overlapped with the Scan_Unload from the previous
sequence for scan shift toggle computation. For capture toggle computation, the
Scan_Load event just before the and earlier Scan_UnLoad events is used.

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USER RESPONSE:
No response required.

ERROR (TBM-095): No scan chains that are both observable and controllable are detected
in the current test mode.
EXPLANATION:
The calculation of scan chain toggle information requires Tscan chains that are both
observable and controllable.
USER RESPONSE:
Ensure the test mode includes scan chains that are both observable and controllable,
rerun ATPG, and then rerun write_toggle_gram.

ERROR (TBM-096): Encountered simulator errors while simulating sequences having


multiple capture pulses. Review the previous warning/error messages and take appropriate
action
EXPLANATION:
The write_toggle_gram command runs High-Speed Scan Based simulation to detect
internal state of flops, at each capture pulse. This is done for those test sequences that
have more than one capture pulse.
While simulating the multiple capture pulses, High-Speed Scan Based simulation
encountered problems and may have generated some warning or error messages. This
can cause the capture cycle reports to be empty/incorrect. The scan cycle report is not
affected by this message.
USER RESPONSE:
Correct the errors identified in the previous messages and then rerun
write_toggle_gram.

INFO (TBM-097): No scan_unload event found in test sequence number number at


odometer string. This sequence will be ignored for computing the scan toggle.
EXPLANATION:
The write_toggle_gram command calculates scan toggle for each pair of scan_load
and scan_unload events. The scan_load from one sequence is overlapped with the
scan_unload from the previous sequence for scan shift computation. This message
implies there is no scan_unload event in the reported test sequence. This sequence will
be ignored for scan toggle computation. The capture toggle computation, for this test
sequence will still be reported.

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USER RESPONSE:
No response required.

ERROR (TBM-098): The tcfscope=string specification has an invalid value. The


tcfscope keyword accepts a comma separated list of the values capture, chain,
init, and shift.
EXPLANATION:
The tcfscope keyword requires a list of comma separated values from capture,
chain, init, and shift, as shown in the following examples:
tcfscope=capture
tcfscope=shift,capture
tcfscope=chain,capture,init,shift
For more information on this keyword, type write_toggle_gram help on command
line and then type tcfscope.
USER RESPONSE:
Correct the tcfscope specification and rerun write_toggle_gram.

WARNING (TBM-099): Test mode power toggle level has exceeded the threshold value of
30%, which can affect the signal integrity at the tester.
EXPLANATION:
The toggle activity caused by the current set of test vectors is more than the threshold
value.
The threshold is set at 30% switching in any capture or scan cycle. This value depends
upon many factors and may vary from design to design. The excessive toggle activity can
result in power issues on the tester.
USER RESPONSE:
Rerun the atpg with maxscanswitching and maxcaptureswitching keywords set
to an appropriate value. Run the write_toggle_gram command under an advanced
license to get the exact toggle information for scan and capture and which set of test
vectors are causing it. Refer to Encounter Test: Flows for more details on how to
produce low power vectors and do analysis with the write_toggle_gram command.

WARNING (TBM-100): Advanced license for running write_toggle_gram is not


available. Only a summary report will be produced.

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EXPLANATION:
The write_toggle_gram command calculates the switching activity caused by the
test vectors for both scan and capture cycles. It provides both the peak and average
switching percentage and generates various toggle reports for test sequence, scan
cycle, capture cycle and flop switching. These detailed toggle reports are available with
an advanced license. With the basic license, this command only generates the basic
summary report for the switching activity.
USER RESPONSE:
Contact Cadence customer support to obtain the advanced license which will enable you
to extract detailed switching information and reports.

WARNING (TBM-102): Unsupported test section code number type string at odometer
string. This test section will be ignored for toggle calculations.
EXPLANATION:
Write_Toggle_Gram currently only supports toggle calculations for test section type
'scan', 'logic' and 'path'.
USER RESPONSE:
Contact Cadence customer support (see Contacting Customer Service on page 23), in
case you need switching activity reports for any other test section types.

WARNING (TBM-103): No scan_load event found in test sequence number=number at


odometer=string. This sequence will be ignored for overlapping scan in the scan toggle
computation.
EXPLANATION:
The write_toggle_gram command does toggle calculation for one pair of
scan_load and scan_unload events. The scan_load from one sequence is
overlapped with the scan_unload from the previous sequence for scan shift toggle
computation. This message implies there is no scan_load/internal_scan_load
event in the reported test sequence. This sequence will be ignored only for overlapping
scan during scan toggle computation. The capture toggle computation, for this test
sequence will still be reported if it contains capture pulse.
USER RESPONSE:
Check if atpg was run with createinternalscanload=no. In this case rerun atpg
with this option set to yes.

WARNING (TBM-104): The value specified with keyword string will be ignored. This
keyword is not applicable for the current tcfscope=string.

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EXPLANATION:
The keyword specified is not applicable for generating the toggle count file for the
specified tcfscope. Use tcfperiodshift, tcfperiodcapture, tcfperiodinit,
or tcfperiodchain to specify the tcfperiod for tcfscope shift, capture, init and
chain respectively.
USER RESPONSE:
Use the appropriate keyword for the specified tcfscope and rerun
write_toggle_gram command.

WARNING (TBM-105): No capture pulses found in the specified test range. The capture
toggle reports will be empty.
EXPLNATION:
write_toggle_gram reports capture toggle for each pulse and stim clock event during
capture phase. There are no capture pulses found in the current processing range of test
vectors. The capture toggle reports will be empty.
USER RESPONSE:
Check if the atpg generated any capture pulse events. In case the tests are designed
such that no capture pulse events are needed, then this warning can be ignored.

WARNING (TBM-106): The current testmode type is assumed scan.


write_toggle_gram does not support generation of tcf file for this test mode.
EXPLANATION:
Write_Toggle_Gram currently does not support generation of tcf files for assumed
scan type testmodes.
USER RESPONSE:
Contact Cadence customer support (see Contacting Customer Service on page 23), if
you need the tcf file generation for this test mode.

WARNING (TBM-107): Scannable latch latchname is not reachable from any output pin
on cell instance instname. Toggle activity at this latch will not be written to the TCF file.
EXPLANATION:
The write_toggle_gram command will trace back from the output pins of a library cell
instance to the measure (RML) latch contained within the cell. This is done when
generating TCF files, so that toggle activity at the latch can be reported at the output pin
of the library cell (after accounting for inversions along the path). In this case the

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command could not find any output pin that was driven by the scannable latch. This can
happen for any of the following reasons:
This could be an instance of a multi-bit cell, and the latch only goes to other latches
within the cell.
The command is unable to trace through complex logic that is present between the
output pins and the specified latch.
If an RLM block has been incorrectly marked as a technology CELL in the Verilog,
there could be lot of complex logic present between the pin and the latch.
USER RESPONSE:
No response is required if the latch truly does not drive any output pin, either directly or
via simple combinational logic. If this module has been incorrectly marked as a CELL,
one way to fix this is to add the attribute TYPE=RLM on the specified module in the
Verilog. Refer to the Encounter Test: Guide 1: Models for further details. For all other
reasons, contact Cadence customer support to report this problem.

WARNING (TBM-108): Pin pinname on multi-bit cell instance instname is reachable


from multiple RML latches within this block. Toggle activity at latch latchname will not be
written to the TCF file. In the generated TCF file, the toggle rate and probability on this pin
may not be accurate.
EXPLANATION:
Technology cells can contain multiple scan bits within them, resulting in multiple latches
within these cells being marked as measure (RML) latches. Some output pins on these
technology cells could be driven by a combination of multiple RML latches. In such
cases, the TCF file generated by this command will use the toggle activity on one of the
RMLs to report as the toggle activity at the output pin of the cell. For the remaining RMLs
in this cell, this warning is generated.
USER RESPONSE:
Ensure that the specified instance is truly a technology cell and not an RLM that has
been mistakenly represented as a cell. Otherwise, contact customer support (see
Contacting Customer Service on page 23) if you need the command to be enhanced
to support such scenarios more accurately.

WARNING (TBM-109):X values were found in the patterns during toggle calculation. X
values are recorded for unknown latch/flop states, and for any known latch/flop state masked
or blocked due to another unknown latch/flop state. The X values can impact toggle numbers
significantly. The default x-handling policy (if not specified otherwise) is dontcare=random.
EXPLANATION:

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Measure events may record values of X


If the state of a flop/latch is unknown (for example, due to unmodeled logic or a
timing constraint), The default policy is to treat X's toggle 50 percent of times
(random) in write_toggle_gram. write_toggle_gram uses the dontcare
keyword to determine the toggle due to X value in the pattern:
If dontcare=pessimistic, each X value is treated as a toggle in that cycle.
If dontcare=optimistic, no toggle is accounted for any of the X values.
If dontcare=random, 50% of X values are treated as toggle and rest 50% are
treated as no toggle. By default, dontcare is set as random, which means that
50 percent of X values are treated as toggle.
USER RESPONSE:
To use a more pessimistic reporting strategy, specify dontcare=pessimistic. To use
a more optimistic reporting strategy specify dontcare=optimistic.

INFO (TBM-110): Test section type string at odometer string will be ignored for toggle
analysis.
EXPLANATION:
write_toggle_gram currently only supports toggle calculations for test section type
'scan', 'logic' and 'path'. The keyword testsectiontype can be used to do toggle
analysis for only specific test section type(s). The reported test section is not matching
the specified testsectiontype and hence will be ignored for toggle calculations.
USER RESPONSE:
No response required.

ERROR (TBM-111): The testsectiontype=string specification has an invalid


value.Valid testsectiontype values are a list of comma separated values from:logic, scan, and
path.
EXPLANATION:
The testsectiontype keyword requires a list of comma separated values from 'logic',
'scan', and 'path'. The following are the examples of valid values. Example:
testsectiontype=logic
testsectiontype=logic,scan
testsectiontype=logic,scan,path

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For more information on this keyword run the command write_toggle_gram help
and on the help prompt type testsectiontype.
USER RESPONSE:
Correct the testsectiontype specification and rerun write_toggle_gram.

ERROR (TBM-152): Invalid specification for sequencenum=string. Specify a valid test


sequence number or odometer value.
EXPLANATION:
The valid values are either the test sequence number or the test sequence odometer
string, for one test vector that needs to be analyzed. This does not accepts a range of
tests and only one test vector can be specified for doing vector based dynamic power
analysis in EPS.
USER RESPONSE:
Correct the sequencenum parameter and rerun this command.

ERROR (TBM-153): Unable to create the output directory string. Ensure permissions are
properly set to create this directory and then rerun this command.
EXPLANATION:
The application could not create the specified output directory.
USER RESPONSE
Check the file create permissions. Try creating the directory or specify the name for an
existing directory.

ERROR (TBM-154): Either project or testmode is not specified. Provide this information
to proceed.
EXPLANATION:
The application requires the project and testmode information to identify the test
vector set for which analysis is needed.
USER RESPONSE:
Check the project and testmode keywords. Specify a valid value for these and rerun
this command.

ERROR (TBM-155): Either workdir is not specified or is null. Provide this information to
proceed.

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EXPLANATION:
The application requires the workdir directory to know the work area for the specified
project.
USER RESPONSE:
Check the workdir keyword. Specify a valid value and rerun this command.

ERROR (TBM-156): Cannot establist path to the specified workdir directory string.
Ensure a valid directory is specified.
EXPLANATION:
The application requires the workdir directory to know the work area for the specified
project. The path to specified workdir directory could not be established.
USER RESPONSE:
Check the file permissions and specify a valid path.

ERROR (TBM-157): Keyword sequencenum is not specified. This keyword is required for
generating scripts for vector based power analysis
EXPLANATION:
The sequencenum keyword is needed to specify the testsequence number for which
dynamic vector based power analysis is needed. The vcd based dynamic power analysis
can be done for one test vector at a time.
USER RESPONSE:
Specify the sequencenum keyword and rerun this command.

ERROR (TBM-158): Failed to open file for writing : string. Check the access permissions
and rerun this command.
EXPLANATION:
The application failed to open the specified file for writing. Verify if the access
permissions are set correctly and the user has write permissions in the specified
directory.
USER RESPONSE:
Check the access permissions or specify a valid outputdir keyword and rerun this
command.

INFO (TBM-159): Mode is set to generate scripts for string power analysis string.

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EXPLANATION:
This command will generate scripts for the specified mode.
USER RESPONSE:
No response is required.

INFO (TBM-160): Generating script string.


EXPLANATION:
The application is generating the specified script at the mentioned path.
USER RESPONSE:
No response is required.

ERROR (TBM-161): Keyword tcffilename is not specified. This keyword is required for
generating scripts for vector less power analysis.
EXPLANATION:
The tcffilename keyword is needed to specify the path to an existing tcf file for
generating scripts for vector less power analysis.
USER RESPONSE:
Specify the tcffilename keyword and rerun this command.

WARNING (TBM-162): Keyword vcdscancycles is not specified. This will set the scripts
to generate vcd for all the scan cycles for sequence string. The total number of scan cycles
is number.
EXPLANATION:
The vcdscancycles keyword is needed to identify the scan cycle number or range for
which vcd file needs to be generated. This keyword is recommended to use if vector
based analysis for only worst case scan cycle(s) is desired. The scan cycle number for
maximum toggle activity can be identified by running the write_toggle_gram
command.
USER RESPONSE:
Specify the vcdscancycles if generation of vcd for only one or a few scan cycles is
desired. In case you want to generate vcd for all the scan cycles, this warning can be
ignored.

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ERROR (TBM-163): Invalid specification for vcdeventodometer=string. Specify a


valid event odometer value for either scan_load or scan_unload event.
EXPLANATION:
The valid values are the event odometer for either scan_load or a scan_unload
event. The vcd will be generated for the overlap scan of scan_load and scan_unload
of which the specified event odometer is one event. This does not accepts a range of
events only one event odometer can be processed at a time. The event odometer for
worst case switching activity can be identified by running the write_toggle_gram
command.
USER RESPONSE:
Correct the vcdeventodometer parameter and rerun this command.

ERROR (TBM-164): Invalid values for vcdscancycles=string. Specify a valid scan


cycle number or range. The valid range for scan cycles is from 1 to number.
EXPLANATION:
The specified scan cycle number(n) or range (n:m) with vcdscancycle keyword is not
within the valid range. The correct scan cycle number for worst case switching activity
can be identified by running the write_toggle_gram command.
USER RESPONSE:
Provide a valid value and rerun this command.

ERROR (TBM-165): Test or odometer string was not found within string.
EXPLANATION:
The test number or odometer value specified does not exist within the test vector file.
USER RESPONSE:
Check the value specified with sequencenum or vcdeventodometer keyword.
Provide a valid test number or odometer value and rerun this command.

ERROR (TBM-166): Event odometer string is not a valid event for generating vcd for
scan.
EXPLANATION:
The valid scan events types are Scan_Load, Internal_Scan_Load, Scan_Unload,
and Diagnostic_Scan_Unload. For generating vcd for scan, event odometer for one
of the above events can be specified.

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USER RESPONSE:
Provide a valid event odometer for one of the above events and rerun this command.

ERROR (TBM-167): Event odometer for generating vcd for scan, cannot be identified from
test sequence string.
EXPLANATION:
Vector based analysis for scan requires an event odometer for which vcd needs to be
generated. This can be specified with vcdeventodometer keyword. If this is not
specified this command looks for scan_unload event in the specified test sequence.
This error implies no valid scan_unload event can be identified or this test sequence is
invalid.
USER RESPONSE:
Provide a valid event odometer with vcdeventodometer keyword and rerun this
command.

INFO (TBM-169): Keywords libfiles and innetlist are not specified. Getting this information
from the Encounter Test database
EXPLANATION:
The libfiles and innetlist are provided as keywords on the write_eps
command and specifies the input design source and technology library file names.
These file are needed by NCSIM tool and this information is written in the script
generated for running NCSIM. In case these keywords are not specified, write_eps
tries to get the information which was passed in the designsource and techlib
keywords during the build_model run. This information is then written in the run_ncsim
script. Note that the library files passed to build_model may not be sufficient for
running NCSIM. In this case ou may need to mannauly edit the generated script to add
the libraries which are missing.
USER RESPONSE:
No response is required.

INFO (TBM-170): The keywords libfiles and innetlist are not specified and TEIsourceLibPath
file not found in tbdata. Edit the run_ncsim script to provide the input design source and
technology library files information.
EXPLANATION:
The libfiles and innetlist are provided as keywords on the write_eps
command and specifies the input design source and technology library file names.
These file are needed by NCSIM tool and this information is written in the script gnerated

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for running NCSIM. In case these keywords are not specified, write_eps tries to get
the information which was passed in the designsource and techlib keywords during the
build_model run. This information is then written in the run_ncsim script. The
build_model stores this information in the TEIsourceLibPath file and in this case
write_eps is not able to find/read the TEIsourceLibPath file. You will need to manually
edit the generated run_ncsim script to add this information.
USER RESPONSE:
No response is required.

WARNING (TBM-171): Developer keyword tscode is being used. Some of the test section
types are not supported. Allowing a non-supported testsection type can cause unexpected
results, including crashing of the application.
EXPLANATION:
Write_Toggle_Gram currently only supports toggle calculations for test section type
scan, logic and path.
USER RESPONSE:
Contact Cadence customer support (see Contacting Customer Service on page 23), in
case you need switching activity reports for any other test section types.

WARNING (TBM-172): [Severe] The weight number specified for flop string can result
in calculation overflow. Only positive integers below 100 are recommended for assigning
weights.
EXPLANATION:
The weight table contains an invalid weight specification. A valid weight specification
such as 10,15, 20 etc is expected. Only zero or any positive integer number less than
100 is expected. A higher value may cause computation overflow.
USER RESPONSE:
Specify a weight below 100 and rerun.

WARNING (TBM-173): The flop string specified in weight table specification is not a
scan flop. The weight number assigned to it will be ignored.
EXPLANATION:
The weight table contains an invalid specification. write_toggle_gram reports
switching only for the scan flops in the design. A non-scan flop is not processed by this
command, hence any weight assigned to it will be ignored.

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USER RESPONSE:
Specify only the scan flops in the weight table specification and rerun the command. This
message can also be ignored safely, if you do not wish to change your weight table
specification.

ERROR(TBM-999) [Internal] Internal Program Error occurred in file: fileName line:


NNN.
msgString
EXPLANATION:
A program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) for
assistance.

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9
TBV - RPCT Boundary Scan Verification
Messages

TBV-210 through TBV-360 on page 203


TBV-410 through TBV-999 on page 217

TBV-210 through TBV-360


WARNING (TBV-210): Receiver data signal net signal for NonTestIO block IOname from
chip pin chip_pin is not controllable.
EXPLANATION:
Rule IN.1: The receiver data signal must be controllable to 0/1.
The receiver data signal, when traced forward from the port of the receiver I/O cell, must
be controllable by a stim latch or test I/O by satisfying IN.1.1 or IN.1.2 below. At least one
of data signals must be connected. The control must not be through. the receivers I/O
cell. All fanouts of the receiver data signal that are connected must satisfy at least one of
these conditions:
IN.1.1
The first multi-input primitive fed by any receiver signal must have its output
controllable to 0 and 1 in this test mode,
IN.1.2
Every multi-input primitive fed by the first multi-input primitive must have its
output controllable to a 0 and 1, AND all inputs to the first multi-input primitive,
except the receiver input, must be observable at an SRL or at a test output.
IN.1.3

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If the first multi-input primitive is a mux primitive, then rule IN.1.1 applies without
the final OR This message indicates that a connected Receiver Data Signal
(RDS) has not met the controllability requirements of IN.1.1, IN.1.2, or IN.1.3.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-211): No receiver data signals are used for NonTestIO block IOname from
chip pin chip_pin.
EXPLANATION:
Rule IN.1: At least one receiver data signal must be connected The receiver data signal,
when traced forward from the port of the receiver I/O cell, must be controllable by a stim
latch or test I/O by satisfying IN.1.1 or IN.1.2 below. At least one of data signals must be
connected. The control must not be through. the receivers I/O cell. All fanouts of the
receiver data signal that are connected must satisfy at least one of these conditions:
IN.1.1
The first multi-input primitive fed by any receiver signal must have its output
controllable to 0 and 1 in this test mode, or
IN.1.2
Every multi-input primitive fed by the first multi-input primitive must have its
output controllable to a 0 and 1, AND all inputs to the first multi-input primitive,
except the receiver input, must be observable at an SRL or at a test output.
IN.1.3
If the first multi-input primitive is a mux primitive, then rule IN.1.1 applies without
the final
OR
This message indicates that a connected Receiver Data Signal (RDS) (Z,AH,AN) was
connected (re: IN.1).
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-212): No receiver data signals were checked for NonTestIO block IOname
from chip pin chip_pin.
EXPLANATION:

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Rule IN.1: At least one receiver data signal should be checked.


The receiver data signal, when traced forward from the port of the receiver I/O cell, must
be controllable by a stim latch or test I/O by satisfying IN.1.1 or IN.1.2 below. At least one
of data signals must be connected. The control must not be through. the receivers I/O
cell. All fanouts of the receiver data signal that are connected must satisfy at least one of
these conditions:
IN.1.1
The first multi-input primitive fed by any receiver signal must have its output
controllable to 0 and 1 in this test mode,
OR
IN.1.2
Every multi-input primitive fed by the first multi-input primitive must have its
output controllable to a 0 and 1, AND all inputs to the first multi-input primitive,
except the receiver input, must be observable at an SRL or at a test output.
IN.1.3
If the first multi-input primitive is a mux primitive, then rule IN.1.1 applies without
the final OR
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-213): Receiver data signal net signal for NonTestIO block IOname from
chip pin chip_pin is gated with net net which is not observable.
EXPLANATION
Rule IN.1: Clause IN.1.2 is violated.
The receiver data signal, when traced forward from the port of the receiver I/O cell, must
be controllable by a stim latch or test I/O by satisfying IN.1.1 or IN.1.2 below. At least one
of data signals must be connected. The control must not be through .. the receivers I/O
cell. All fanouts of the receiver data signal that are connected must satisfy at least one of
these conditions:
IN.1.1
The first multi-input primitive fed by any receiver signal must have its output
controllable to 0 and 1 in this test mode
IN.1.2

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Every multi-input primitive fed by the first multi-input primitive must have its
output controllable to a 0 and 1, AND all inputs to the first multi-input primitive,
except the receiver input, must be observable at an SRL or at a test output.
IN.1.3
If the first multi-input primitive is a mux primitive, then rule IN.1.1 applies without
the final
OR
This message indicates that a connected Receiver Data Signal (RDS) has not met the
observability requirements of IN.1.2.
USER RESPONSE
Ensure that the design complies with the rule.

WARNING (TBV-220): Driver data signal net signal for NonTestIO block IOname from chip
pin chip_pin is not observable.
EXPLANATION:
Rule IN.2: The driver data signal must be observable.
The signal feeding the driver data port of a nontest I/O cell must be observable at an SRL
or at a test I/O, by satisfying at least one of these conditions, with buffers allowed in all
connections:
IN.2.1
The driver data port may be fed by a scannable L1 or L2.
IN.2.2
The driver data port may be fed by a net which is observable at a scannable
latch or a test output. A buffer tree may be between the observable net and the
driver data port.
This message indicates that a Driver Data Signal (DDS) has not met the observability
requirements of IN.2.1 or IN.2.2.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-224): Receiver data signal net signal for NonTestIO block IOname from
chip pin chip_pin not controlled by unique boundary latch.
EXPLANATION:

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Recommendation IN.4 : The receiver data signal should be supplied by a unique


receiver boundary latch (the latch provides the controllability). That is, there should be a
one-to-one correspondence between receiver data signals and receiver boundary
latches.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-225): Driver data signal net signal for NonTestIO block IOname from chip
pin chip_pin not observed in unique boundary latch.
EXPLANATION:
Recommendation IN.5: The driver data signal should be observable in a unique
boundary latch (the latch provides the observability). That is, there should be a one-to-
one correspondence between driver data signals and driver data boundary latches.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-230): Driver enable signal net signal for NonTestIO block IOname from
chip pin chip_pin is not observable or tied enable.
EXPLANATION:
Rule IN.3: The driver enable signal must be observable or tied to 1
The signal feeding the driver enable port of a nontest I/O cell must satisfy at least one of
the following conditions, with buffers allowed in all connections:
IN.3.1
The enable data port may be fed by an L1, L2, or L3. If an L3, then that L3 must
be feed directly from a scannable L1.
IN.3.2
The enable data port may be fed by a net which is observable at a scannable
latch or a test output. A buffer tree may be between the observable net and the
driver data port.
IN.3.3
The driver enable port may be tied to 1 (tied enabled).
This message indicates that a Driver Enable Signal (DES) has not met the observability
requirements of IN.3.1 or IN.3.2 AND the DES is not tied enabled.

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USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-233): Driver enable signal net signal for NonTestIO block IOname from
chip pin chip_pin can not observe signal net net.
EXPLANATION:
Rule IN.3: The driver enable signal is fed by a 2-input gate where one of the input
signals to the gate is not observable.
The signal feeding the driver enable port of a nontest I/O cell must satisfy at least one of
the following conditions, with buffers allowed in all connections:
IN.3.1
The enable data port may be fed by an L1, L2, or L3. If an L3, then that L3 must
be feed directly from a scannable L1.
IN.3.2
The enable data port may be fed by a net which is observable at a scannable
latch or a test output. A buffer tree may be between the observable net and the
driver data port.
IN.3.3
The driver enable port may be tied to 1 (tied enabled).
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-234): Driver enable signal net signal for NonTestIO block IOname from
chip pin chip_pin is tied to tie_val.
EXPLANATION:
Rule IN.3: The signal feeding the driver enable port of a nontest I/O cell must satisfy at
least one of the following conditions, with buffers allowed in all connections:
IN.3.1
The enable data port may be fed by an L1, L2, or L3. If an L3, then that L3 must
be feed directly from a scannable L1.
IN.3.2

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The enable data port may be fed by a net which is observable at a scannable
latch or a test output. A buffer tree may be between the observable net and the
driver data port.
IN.3.3
The driver enable port may be tied to 1 (tied enabled).
This message indicates that a Driver Enable Signal (DES) is tied to a value other than
one.
USER RESPONSE:
Ensure that the design complies with the rule.

INFO (TBV-237): Driver enable signal net signal for NonTestIO block IOname from chip pin
chip_pin should follow Rule IN.3.2 rather than IN.3.3.
EXPLANATION:
Rule IN.3: The signal feeding the driver enable port of a nontest I/O cell must satisfy at
least one of the following conditions, with buffers allowed in all connections:
IN.3.1
The enable data port may be fed by an L1, L2, or L3. If an L3, then that L3 must
be feed directly from a scannable L1.
IN.3.2
The enable data port may be fed by a net which is observable at a scannable
latch or a test output. A buffer tree may be between the observable net and the
driver data port.
IN.3.3
The driver enable port may be tied to 1 (tied enabled).
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-310): Receiver data signal net signal for NonTestIO block IOname from
chip pin chip_pin has no observe point.
EXPLANATION:
No observable Latch or TestIO for signal

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Rule EX.1: The receiver data signal must be either unconnected or observable (0 and
1) at an SRL or test output, with at least one signal per I/O observable. The observation
may be at the L1 or L2 of the SRL. .. Intervening logic is allowed, as long as the path can
be sensitized by a test PI and/or scannable latch state that also sensitizes the path from
the observe clock PI to the observe latch, if the observation is at an SRL.
This message indicates that a connected Receiver Data Signal (RDS) has not met the
observability requirements.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-311): Receiver data signal net signal for NonTestIO block IOname from
chip pin chip_pin has no sensitizable path to any observe point.
EXPLANATION:
No path to any observable Latch or TestIO for signal can be sensitized
Rule EX.1: The receiver data signal must be either unconnected or observable (0 and
1) at an SRL or test output, with at least one signal per I/O observable. The observation
may be at the L1 or L2 of the SRL. .. Intervening logic is allowed, as long as the path can
be sensitized by a test PI and/or scannable latch state that also sensitizes the path from
the observe clock PI to the observe latch, if the observation is at an SRL.
This message indicates that a connected Receiver Data Signal (RDS) has intervening
logic which is not sensitizable.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-312): Receiver data signal net signal for NonTestIO block IOname from
chip pin chip_pin shares observe point block observe.
EXPLANATION:
Rule EX.5: A receiver boundary latch or test input cannot be used for observing more
than one receiver data signal.
This message indicates that a boundary latch or test I/O is used for more than one
Receiver Data Signal (RDS).
USER RESPONSE:
Ensure that the design complies with the rule.

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WARNING (TBV-313): No receiver data signals are used for NonTestIO block IOname from
Chip pin chip_pin.
EXPLANATION:
This message indicates that EX.1 has been violated. Rule EX.1 requires that at least one
Receiver Data Signal (RDS) per I/O is observable. The NonTestIO block has no receiver
data signals.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-314): No receiver data signals were checked for NonTestIO block IOname
from Chip pin chip_pin.
EXPLANATION:
This message indicates that EX.1 has been violated. Rule EX.1 requires that at least one
Receiver Data Signal (RDS) per I/O is observable. The NonTestIO block has one or more
receiver data signals but none are connected.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-320): Driver data signal net signal for NonTestIO block IOname from chip
pin chip_pin has no control stims.
EXPLANATION:
No stim Latch or TestIO for signal
Rule EX.2: The driver data signal must be controllable (to 0 and 1) from an L1, L2, L3,
or test input. Intervening logic that is sensitizable is allowed.
This message indicates that a Driver Data Signal (DDS) has not met the controllablity
requirements.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-321): Driver data signal net signal for NonTestIO block IOname from chip
pin chip_pin has no sensitizable control stim path.
EXPLANATION:
The paths from the stim Latch or TestIO for signal can not be sensitized.

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Rule EX.2: The driver data signal must be controllable (to 0 and 1) from an L1, L2, L3,
or test input. Intervening logic that is sensitizable is allowed.
This message indicates that a Driver Data Signal (DDS) has intervening logic which is
not sensitizable.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-322): Driver data signal net signal for NonTestIO block IOname from chip
pin chip_pin blocked in Test Inhibit state.
EXPLANATION:
The driver data signal must be controllable to 0/1.
Rule EX.2: The driver data signal must be controllable (to 0 and 1) from an L1, L2, L3,
or test input. Intervening logic that is sensitizable is allowed.
This message indicates that a Driver Data Signal (DDS) is TIE/TIed in the Test Inhibit
state.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-330): Driver enable signal net signal for NonTestIO block IOname from
chip pin chip_pin has no control stims.
EXPLANATION:
No stim Latch or TestIO for signal.
Rule EX.3: The driver enable signal must be controllable (to 0 and 1) from an L1, L2,
L3, or test input or must be tied enabled (1). Intervening logic that is sensitizable is
allowed.
This message indicates that a Driver Enable Signal (DES) has not met the controllability
requirements.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-331): Driver enable signal net signal for NonTestIO block IOname from
chip pin chip_pin has no sensitizable control stim path.
EXPLANATION:

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The paths from the stim Latch or TestIO for signal can not be sensitized.
Rule EX.3: The driver enable signal must be controllable (to 0 and 1) from an L1, L2,
L3, or test input or must be tied enabled (1). Intervening logic that is sensitizable is
allowed.
This message indicates that a Driver Enable Signal (DES) has intervening logic which is
not sensitizable.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-332): Driver enable signal net signal for NonTestIO block IOname from
chip pin chip_pin tied to tie_val.
EXPLANATION:
The enable signal can only be tied if tied to 1 (enabled).
Rule EX.3: The driver enable signal must be controllable (to 0 and 1) from an L1, L2,
L3, or test input or must be tied enabled (1). Intervening logic that is sensitizable is
allowed.
This message indicates that a Driver Enable Signal (DES) is TIEed to a state other than
one.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-333): Driver enable signal net signal for NonTestIO block IOname from
chip pin chip_pin blocked in Test Inhibit state.
EXPLANATION:
The driver enable signal must be controllable to 0/1.
Rule EX.3: The driver enable signal must be controllable (to 0 and 1) from an L1, L2,
L3, or test input or must be tied enabled (1). Intervening logic that is sensitizable is
allowed.
This message indicates that a Driver Enable Signal (DES) is TIed in the Test Inhibit state.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-334): Driver enable signal net signal for NonTestIO block IOname from
chip pin chip_pin tied to tie_val by test inhibit (TI).

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EXPLANATION:
The enable signal can only be tied to 1 by TIE1 or VDD.
Rule EX.3: The driver enable signal must be controllable (to 0 and 1) from an L1, L2,
L3, or test input or must be tied enabled (1). .. Intervening logic that is sensitizable is
allowed.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-339): Test I/O pin test_pin used as both func1 and func2 for
NonTestIO block IOname from chip pin chip_pin.
EXPLANATION:
Same test I/O used for multiple functions.
Rule EX.4: The same L1, L2 or test I/O cannot be used as both a receiver boundary
latch and a driver boundary latch or as both a receiver boundary and an enable boundary
latch. The same L1, L2, L3 or test I/O cannot be used a both a driver boundary latch and
an enable boundary latch in a single I/O. This rule applies to the chip as a whole.
This message indicates that a test I/O is shared.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-340): Boundary latch block latch used as both func1 and func2 for
NonTestIO block IOname from chip pin chip_pin.
EXPLANATION:
Same Latch used for multiple functions.
Rule EX.4 : The same L1, L2 or test I/O cannot be used as both a receiver boundary
latch and a driver boundary latch or as both a receiver boundary and an enable boundary
latch. The same L1, L2, L3 or test I/O cannot be used a both a driver boundary latch and
an enable boundary latch in a single I/O.
This message indicates that a boundary latch is shared.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-341): Cannot sensitize any driver/receiver path for NonTestIO block
IOname from chip pin chip_pin.

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EXPLANATION:
No static sensitizing state exists for which rules EX.1, EX.2 and EX.3 are satisfied.
Rule EX.6: There must exist a static sensitizing state, which may include test PIs and/
or scannable latches, for which rules 1, 2, and 3 are simultaneously satisfied for all
nontest I/O.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-351): Receiver data signal net signal for NonTestIO block IOname from
chip pin chip_pin not observed in SRL.
EXPLANATION:
Recommendation EX.7: In each external test mode, the receiver data signal should
be observable at the L1 or L2 of an SRL.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-352): Driver data signal net signal for NonTestIO block IOname from
chip pin chip_pin not controlled from SRL.
EXPLANATION:
Recommendation EX.8: In each external test mode, the driver data signal should be
controllable from the L1 or L2 of an SRL.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-353): Driver enable signal net signal for NonTestIO block IOname from
chip pin chip_pin not controlled from SRL.
EXPLANATION:
Recommendation EX.9: In each external test mode, the driver enable signal should
be controllable from the L1 or L2 of an SRL.
USER RESPONSE:
Ensure that the design complies with the rule.

INFO (TBV-354): All latches for external test are in number scan chains.

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EXPLANATION:
The fewer chains the better - loads/unloads and skin models.
Recommendation EX.10: All boundary latches should be in one or more scan chains,
with no non-boundary latches in those chains. This recommendation is useful for doing
MCM interconnect test or other high-level package use of boundary scan.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-355): Driver data signal net signal for NonTestIO block IOname from
chip pin chip_pin shares data stim block stim.
EXPLANATION:
Same data stim is used by multiple driver data signals.
Recommendation EX.11:The same driver boundary latch should not be used for more
than one I/O cell. This recommendation allows a shorted nets test to be performed.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-356): Receiver data signal net signal for TestIO block IOname not
observable.
EXPLANATION:
Recommendation EX.12: Test I/O should also be observable or controllable from
boundary latches.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-357): Driver data signal net signal for TestIO block IOname not
controllable.
EXPLANATION:
Recommendation EX.12: Test I/O should also be observable or controllable from
boundary latches.
USER RESPONSE:
Ensure that the design complies with the rule.

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WARNING (TBV-358): Driver enable signal net signal for TestIO block IOname not
controllable.
EXPLANATION:
Recommendation EX.12: Test I/O should also be observable or controllable from
boundary latches.
USER RESPONSE:
Ensure that the design complies with the rule.

INFO (TBV-359): Complex logic found between NonTestIO block IOname from chip pin
chip_pin and associated boundary latches.
EXPLANATION:
Recommendation EX.14: The only logic between the nontest I/O cell and the
boundary latch should be a multiplexing function.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-360): Cannot sensitize all NonTestIO driver/receiver paths for shorted nets
test.
EXPLANATION:
Recommendation EX.13: There should exist a static state sensitizable by test I/O in
which rules 1, 2, and 3 are simultaneously met for all nontest I/O.
USER RESPONSE:
Ensure that the design complies with the rule.

TBV-410 through TBV-999


WARNING (TBV-410): Cannot sensitize any I/O Wrap path for NonTestIO block IOname
from chip pin chip_pin while enabled.
EXPLANATION:
Rule WR.2: The path from the driver data boundary latch to the receiver data boundary
latch must be sensitizable for each nontest bidirectional I/O, simultaneously with the
driver being enabled.
USER RESPONSE:

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Ensure that the design complies with the rule.

WARNING (TBV-415): NonTestIO block IOname from chip pin chip_pin is not
bidirectional.
EXPLANATION:
Recommendation WR.4: All nontest I/O should be bidirectional I/O.
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-416): NonTestIO block IOname from chip pin chip_pin has no
inversion between data latch block release and capture latch block capture.
EXPLANATION:
Recommendation WR.5: If the receiver and driver boundary latches are part of the
same SRL, the data path from the driving latch through the 3-state driver and input buffer
to the capturing latch should include an inversion.
USER RESPONSE:
Ensure that the design complies with the rule.

INFO (TBV-417): All boundary latches are in number scan chains.


EXPLANATION:
Recommendation IOW.7: The fewer chains the better - loads/unloads and skin models
USER RESPONSE:
Ensure that the design complies with the rule.

WARNING (TBV-420): Cannot sensitize all driver latch to receiver latch paths for shorted
nets test.
EXPLANATION:
Recommendation WR.6: All driver data boundary latch to receiver data boundary
latch paths should be able to be simultaneously sensitized.
USER RESPONSE:
Ensure that the design complies with the rule.

INFO (TBV-801): NonTestIO block IOname from chip pin chip_pin is exempt from
checking because reason.

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EXPLANATION:
The I/O was not checked due to the given reason.
USER RESPONSE:
Review the reason that the I/O was not checked and determine if it should have been
checked or not.

WARNING (TBV-802): NonTestIO block IOname from chip pin chip_pin will not be
checked because reason.
EXPLANATION:
The I/O was not checked due to the given reason.
USER RESPONSE:
Review the reason that the I/O was not checked and determine if it should have been
checked or not.

INFO (TBV-803): Receiver data signal net signal for NonTestIO block IOname from chip
pin chip_pin not checked because reason.
EXPLANATION:
The signal was not checked due to the given reason.
USER RESPONSE:
Review the reason that the signal was not checked and determine if it should have been
checked or not.

INFO (TBV-804): Driver enable signal net signal for NonTestIO block IOname from chip
pin chip_pin not checked because reason.
EXPLANATION:
The signal was not checked due to the given reason.
USER RESPONSE:
Review the reason that the signal was not checked and determine if it should have been
checked or not.

INFO (TBV-805): Driver data signal net signal for NonTestIO block IOname from chip pin
chip_pin not checked because reason.
EXPLANATION:

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The signal was not checked due to the given reason.


USER RESPONSE:
Review the reason that the signal was not checked and determine if it should have been
checked or not.

INFO (TBV-900): All Checks Passed OK


EXPLANATION:
No severe, error or warning messages were produced.
USER RESPONSE:
No response required.

INFO (TBV-901): No TBV Checking Messages Printed


EXPLANATION:
Errors or warnings were produced but no messages were printed.
USER RESPONSE:
No response required.

INFO (TBV-905): The maximum number of msg_sev messages have been issued.
EXPLANATION:
The maximum number of messages for the severity has been issued.
USER RESPONSE:
No response required.

ERROR (TBV-984): [Input] No stim or capture latches were found in model structure.
EXPLANATION:
No stim or capture latches were found so no checking is done.
USER RESPONSE:
Ensure that the model structure of the chip is correct.

WARNING (TBV-985): chip Pin pin_pame has an unsupported model structure.


EXPLANATION:

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The model structure of the pin and cell prevents verification checking.
USER RESPONSE:
Ensure that the model structure of the pin and cell are correct.

ERROR (TBV-986): [Input] RPCT Boundary Scan Verification was unable to find any
chipIOs.
EXPLANATION:
No NonTestIO was found to verify therefore no checking is done.
USER RESPONSE:
Ensure that the model structure of the chip is correct.

INFO (TBV-987): Test Structure Verification was successful for this Test Mode.
EXPLANATION:
Test Structure Verification was successful for this Test Mode.
USER RESPONSE:
No response required.

WARNING (TBV-988): Test Structure Verification reported arg which may adversely affect
the results of Boundary Scan Verification.
EXPLANATION:
Test Structure Verification errors may adversely affect the results of Boundary Scan
Verification.
USER RESPONSE:
Ensure that Test Structure Verification is correct.

WARNING (TBV-989): Test Structure Verification was not run for this Test Mode.
EXPLANATION:
Test Structure Verification was not run for this Test Mode.
USER RESPONSE:
Run Test Structure Verification for this Test Mode.

WARNING (TBV-990): [Input] RPCT Boundary Scan Verification Command Line Error -
Required keyword keyword must be specified.

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EXPLANATION:
The keyword is required and must be specified.
USER RESPONSE:
Ensure that the keyword is specified.

ERROR (TBV-991): Reduced Pin Count Test Boundary Scan Verification Command Line
Error - Unknown value for keyword=value.
EXPLANATION:
An unknown value for a keyword was passed in.
USER RESPONSE:
Ensure that the value for the keyword is correct and rerun.

ERROR (TBV-992): [Input] RPCT Boundary Scan Verification Command Line Syntax Error
- keyword=value.
EXPLANATION:
There is a syntax error in the command line.
USER RESPONSE:
Ensure that the command line syntax is correct.
Refer to "verify_lssd_boundary" in the Encounter Test: Reference: Commands for
additional information.

INFO (TBV-993): RPCT Boundary Scan Verification Command Line - Unknown option or
incorrect value or for keyword keyword=. The option=value option=value will be
ignored.
EXPLANATION:
An unknown option or incorrect value or for a keyword was passed in. The
option=value will be ignored.
USER RESPONSE:
Ensure that the option or value is correct.
Refer to "verify_lssd_boundary" in the Encounter Test: Reference: Commands for
additional information.

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ERROR (TBV-994): [Input] RPCT Boundary Scan Verification Command Line Error - The
file name does not exist.
EXPLANATION:
The file does not exist.
USER RESPONSE:
Ensure that the file exists.

ERROR (TBV-995): [Input] RPCT Boundary Scan Verification Methodology Error - Can not
verify verify with Test Mode Boundary boundary.
EXPLANATION:
Internal checks cannot be done in an external test mode boundary. External checks
cannot be done in an internal test mode boundary.
USER RESPONSE:
Ensure that the test mode boundary and verify option are compatible.

ERROR (TBV-996): [Input] RPCT Boundary Scan Verification Methodology Error - Test
Mode Scan Type must be LSSD or GSD
EXPLANATION:
The Test Mode Scan Type must be LSSD or GSD.
USER RESPONSE:
Rebuild the mode with scan type of LSSD or GSD.

INFO (TBV-997): RPCT Boundary Scan Verification Methodology Error - Another


verification is currently being run.
EXPLANATION:
RPCT Boundary Scan Verification is being run on this chip by another process.
USER RESPONSE:
Wait for the other process to finish.

ERROR (TBV-998): [Input] RPCT Boundary Scan Verification Methodology Error -


verify=verify previously run on this Test Mode use reruntests=y to run again.
EXPLANATION:

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The first time RPCT Boundary Scan Verification is run, an audit record is created which
contained the highest severity message of that run. This record should not change if the
application is run again.
USER RESPONSE:
Either rerun the application or not.

ERROR (TBV-999): RPCT Boundary Scan Verification System Error - See previous
messages for problem description.
EXPLANATION:
See previous messages for problem description.
USER RESPONSE:
Fix problem(s) from previous messages.

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10
TBX - Extension Language Messages

TBX-001 through TBX-050 on page 225


TBX-051 through TBX-119 on page 237
TBX-120 through TBX-174 on page 248
TBX-175 through TBX-219 on page 261
TBX-220 through TBX-481 on page 272

TBX-001 through TBX-050


ERROR (TBX-001): Project not specified. Specify the project as either an environment
variable, or with the TBX::selectProject method.
EXPLANATION:
No project was specified either as an environment variable, or with the
TBX::selectProject method.
USER RESPONSE:
Specify a project and rerun.

ERROR (TBX-002): Entity not specified. Specify the entity as either an environment variable
or with the TBX::selectEntity method.
EXPLANATION:
No entity was specified either as an environment variable or with the
TBX::selectEntity method.
USER RESPONSE:
Specify an entity and rerun.

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ERROR (TBX-003): Unable to open hierModel because the file pointed to by the current
project and entity could not be loaded. Check that both the project and entity are correct, file
permissions allow read access, and sufficient resources are available on the system to allow
the model to be opened.
EXPLANATION:
The "hierModel" and "hierAttributes" files pointed to by the current project and entity
could not be loaded. Either the project is incorrect, the entity is incorrect, file permissions
did not allow the files to be read, or there were not enough resources on the system to
allow the model to be opened. Check for other messages for more details.
USER RESPONSE:
Make sure that the current workdir is specified correctly. If so, check other messages for
more details.

ERROR (TBX-004): [Internal] Unable to obtain the flat model context. Check that the
current project and entity are specified correctly. Check additional messages for more details.
EXPLANATION:
The extension language could not access the flat model for this part.
USER RESPONSE:
Make sure that the current project and entity are specified correctly. If so, check other
messages for more details.

ERROR (TBX-005): Unable to load the flat model. Ensure the current project and entity are
correctly specified. Check additional messages for more details.
EXPLANATION:
The extension language could not access the flat model for this part.
USER RESPONSE:
Make sure that the current project and entity are specified correctly. If so, check other
messages for more details.

ERROR (TBX-006): [Internal] Unable to load the hierarchical/flat model correlation data
because insufficient resources were available. Check additional messages for more details.
Check for system resources which might be low, such as paging space.
EXPLANATION:
The flat model was loaded, but there were not enough resources to load the information
that correlates between the flat model and the hierarchical model.

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USER RESPONSE:
Check other messages for more details. Check for system resources which might be low,
such as paging space.

ERROR (TBX-007): Testmode not specified. Specify the testmode as either an environment
variable, or with the TBX::selectTestMode method.
EXPLANATION:
No test mode was specified either as an environment variable, or with the
TBX::selectTestMode method.
USER RESPONSE:
Select a test mode and rerun.

ERROR (TBX-008): Unable to load the test mode. Ensure the current project, entity, and
testmode are correctly specified. Check additional messages for more details.
EXPLANATION:
The extension language could not access the test mode.
USER RESPONSE:
Make sure that the current project, entity, and test mode are correctly specified. If so,
check other messages for more details.

ERROR (TBX-009): [Internal] Unable to load the flat model latch methods because
insufficient resources were available. Check additional messages for more details. Check for
system resources which might be low, such as paging space.
EXPLANATION:
The flat model was loaded, but there were not enough resources to load the information
that keeps track of how each latch functions in the current mode.
USER RESPONSE:
Check other messages for more details. Check for system resources which might be low,
such as paging space.

ERROR (TBX-010): No master fault model file exists because a fault model was never
created for this part or because the fault model is not accessible. Build the fault model and
rerun.
EXPLANATION:

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A fault model was never created for this part, or the fault model is not accessible.
USER RESPONSE:
Build the fault model and rerun.

ERROR (TBX-011): Unable to open the global fault model. The fault model could not be read
either because of file permissions or a lack of system resources. Ensure the current project
and entity are correctly specified. Check additional messages for more details.
EXPLANATION:
The fault model exists, but cannot be read either because of file permissions or lack of
system resources.
USER RESPONSE:
Make sure that the current project and entity is specified correctly. If so, check other
messages for more details.

ERROR (TBX-012): Failset not specified.


EXPLANATION:
No failset was specified either as an environment variable, or with the
TBX::selectFailSet method.
USER RESPONSE:
Select a failset and rerun.

ERROR (TBX-013): [Internal] Unable to open the failset.


EXPLANATION:
The fail set exists, but cannot be read either because of file permissions or lack of system
resources.
USER RESPONSE:
Make sure that the current project, entity, testmode, experiment, and failset are specified
correctly. If so, check other messages for more details.

ERROR (TBX-014): Experiment not specified.


EXPLANATION:
No experiment was specified either as an environment variable, or with the
TBX::selectExperiment method.

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USER RESPONSE:
Select an experiment and rerun.

ERROR (TBX-015): [Internal] Unable to load the TBD repository.


EXPLANATION:
There were not enough resources to load an experiment.
USER RESPONSE:
Check other messages for more details. Check for system resources which might be low,
such as paging space.

ERROR (TBX-016): Unable to open the experimental TBDbin file.


EXPLANATION:
Could not find and/or read the pattern data in the experimental TBDbin file.
USER RESPONSE:
Make sure that the current project, entity, testmode, and experiment are specified
correctly. If so, check other messages for more details.

ERROR (TBX-017): [Internal] Unable to unload flat model.


EXPLANATION:
The extension language opened a flat model associated with the previous project
specified, but was not able to unload the flat model.
Subsequent invocations of extension language functions may work with the flat model
associated with the previous project.
USER RESPONSE:
No response is required.

WARNING (TBX-018): Child net is cloaked. Tracing incomplete.


EXPLANATION:
The trace fed into a net inside a block which was cloaked; that is, intellectual property for
which details may not be made available. The list of pins returned will not include the pins
fed through this cloaked net.
USER RESPONSE:

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Either get an uncloaked version of the model which contains this net, or find a way to
avoid this net, or understand that the results of this function may be incomplete.

WARNING (TBX-019): Sink pin is cloaked. Tracing incomplete.


EXPLANATION:
The trace fed into a sink pin on a net, and the sink pin was inside a block that was
cloaked; that is, intellectual property for which details may not be made available. The list
of pins returned will not include the pins fed through this cloaked pin.
USER RESPONSE:
Either get an uncloaked version of the model which contains this pin, or find a way to
avoid this pin, or understand that the results of this function may be incomplete.

WARNING (TBX-020): Parent net is cloaked. Tracing incomplete.


EXPLANATION:
The trace fed into a net inside a block which was cloaked; that is, intellectual property for
which details may not be made available. The list of pins returned will not include the pins
fed through this cloaked net.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains this net, or find
a way to avoid this net, or understand that the results of this function may be incomplete.

WARNING (TBX-021): Source pin is cloaked. Tracing incomplete.


EXPLANATION:
The trace fed into a source pin on a net, and the source pin was inside a block that was
cloaked; that is, intellectual property for which details may not be made available. The list
of pins returned will not include the pins fed through this cloaked pin.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains this pin, or find
a way to avoid this pin, or understand that the results of this function may be incomplete.

ERROR (TBX-022): [Internal] Unable to zero flat model usage. Usage is usage.
EXPLANATION:
The extension language opened a flat model and was not able to unload all usages of
the flat model. Subsequent invocations of extension language functions may not work
with the flat model in use.

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USER RESPONSE:
Close current extension language session and restart methods.

ERROR (TBX-023): [Internal] Unable to load the flat model with usage usage.
EXPLANATION:
The extension language could not access the flat model for this part. The extension
language was not able to unload all usages of the previous flat model.
USER RESPONSE:
Close current extension language session and restart methods.

ERROR (TBX-024): [Internal] Unable to load the model correlation data with usage
usage.
EXPLANATION:
The flat model was loaded, but there were not enough resources to load the information
that correlates between the flat model and the hierarchical model. The extension
language was not able to unload all usages of the previous flat model.
USER RESPONSE:
Close current extension language session and restart methods.

ERROR (TBX-025): [Internal] Unable to load the flat model active data methods.
EXPLANATION:
The flat model was loaded, but there were not enough resources to load the information
that keeps track of whether each node is active in the current mode.
USER RESPONSE:
Check other messages for more details. Check for system resources which might be low,
such as paging space.

WARNING (TBX-026): [Severe] Unable to open the first experiment in the file.
EXPLANATION:
Probably, the TBDBin file contains no data.
USER RESPONSE:
Print the current experiment as a TBDpatt, and analyze the results.

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WARNING (TBX-027): [Severe] Unable to open the experiment after


experiment_number.
EXPLANATION:
The TBDBin file does not contain as many experiments as expected.
USER RESPONSE:
Print the current experiment as a TBDpatt, and analyze the results.

ERROR (TBX-028): [Internal] Unable to get to experiment experiment_number.


EXPLANATION:
An error occurred traversing the TBDBin data to get to the specified experiment.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results. Check other
messages for more details.

WARNING (TBX-029): [Severe] Unable to open the first test section in experiment
experiment_number.
EXPLANATION:
Probably, the experiment contains no data.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

WARNING (TBX-030): [Severe] Unable to open the test section after


experiment_number.test_section_number.
EXPLANATION:
The experiment does not contain as many test sections as expected.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

ERROR (TBX-031): [Internal] Unable to get to test section


experiment_number.test_section_number.
EXPLANATION:
An error occurred traversing the TBDBin data to get to the specified test section.

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USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results. Check other
messages for more details.

WARNING (TBX-032): [Severe] Unable to open the first tester loop in test section
experiment_number.test_section_number.
EXPLANATION:
Probably, the test section contains no data.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

WARNING (TBX-033): [Severe] Unable to open the tester loop after


experiment_number.test_section_number.test_loop_number.
EXPLANATION:
The test section does not contain as many tester loops as expected.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

ERROR (TBX-034): [Internal] Unable to get to tester loop


experiment_number.test_section_number.test_loop_number.
EXPLANATION:
An error occurred traversing the TBDBin data to get to the specified tester loop.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results. Check other
messages for more details.

WARNING (TBX-035): [Severe] Unable to open the first test procedure in tester loop
experiment_number.test_section_number.test_loop_number.
EXPLANATION:
Probably, the tester loop contains no data.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

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WARNING (TBX-036): [Severe] Unable to open the test procedure after


experiment_number.test_section_number.test_loop_number.test_pr
ocedure_number.
EXPLANATION:
The tester loop does not contain as many test procedures as expected.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

ERROR (TBX-037): [Internal] Unable to get to test procedure


experiment_number.test_section_number.test_loop_number.test_pr
ocedure_number.
EXPLANATION:
An error occurred traversing the TBDBin data to get to the specified test procedure.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results. Check other
messages for more details.

WARNING (TBX-038): [Severe] Unable to open the first test sequence in test procedure
experiment_number.test_section_number.test_loop_number.test_pr
ocedure_number.
EXPLANATION:
Probably, the test procedure contains no data.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

WARNING (TBX-039): [Severe] Unable to open the test sequence after


experiment_number.test_section_number.test_loop_number.test_pr
ocedure_number.test_sequence_number.
EXPLANATION:
The test procedure does not contain as many test sequences as expected.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

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ERROR (TBX-040): [Internal] Unable to get to test sequence


experiment_number.test_section_number.test_loop_number.test_pr
ocedure_number.test_sequence_number
EXPLANATION:
An error occurred traversing the TBDBin data to get to the specified test sequence.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results. Check other
messages for more details.

WARNING (TBX-041): [Severe] Unable to open the first test pattern in test sequence
experiment_number.test_section_number.test_loop_number.test_pr
ocedure_number.test_sequence_number.
EXPLANATION:
Probably, the test sequence contains no data.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

WARNING (TBX-042): [Severe] Unable to open the test pattern after


experiment_number.test_section_number.test_loop_number.test_pr
ocedure_number.test_sequence_number.test_pattern_number.
EXPLANATION:
The test procedure does not contain as many test patterns as expected.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

ERROR (TBX-043): [Internal] Unable to get to test pattern


experiment_number.test_section_number.test_loop_number.test_pr
ocedure_number.test_sequence_number.test_pattern_number.
EXPLANATION:
An error occurred traversing the TBDBin data to get to the specified test pattern.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results. Check other
messages for more details.

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WARNING (TBX-044): [Severe] Unable to open the first test event in test pattern
experiment_number.test_section_number.test_loop_number.test_pr
ocedure_number.test_sequence_number.test_pattern_number.
EXPLANATION:
Probably, the test pattern contains no data.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

WARNING (TBX-045): [Severe] Unable to open the test event after


experiment_number.test_section_number.test_loop_number.test_pr
ocedure_number.test_sequence_number.test_pattern_number.test_e
vent_number.
EXPLANATION:
The test procedure does not contain as many test events as expected.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results.

ERROR (TBX-046): [Internal] Unable to get to test event


experiment_number.test_section_number.test_loop_number.test_pr
ocedure_number.test_sequence_number.test_pattern_number.test_e
vent_number.
EXPLANATION:
An error occurred traversing the TBDBin data to get to the specified test event.
USER RESPONSE:
Print the current experiment as a TBDpatt, and look at the results. Check other
messages for more details.

WARNING (TBX-047): [Severe] Unable to open the test mode fault model.
EXPLANATION:
The fault model exists, but cannot be read either because of file permissions or lack of
system resources. The extension language will try to use the global fault status instead.
USER RESPONSE:
Make sure that the current project, entity, and testmode are specified correctly. If so,
check other messages for more details.

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WARNING (TBX-048): [Severe] Unable to open the experiment fault model.


EXPLANATION:
The fault model exists, but cannot be read either because of file permissions or lack of
system resources. The extension language will try to use the test mode fault status
instead.
USER RESPONSE:
Make sure that the current project, entity, testmode, and experiment are specified
correctly. If so, check other messages for more details.

ERROR (TBX-049): Cannot open fault model for updates when experiment specified.
EXPLANATION:
The fault model exists, but cannot be opened for updates while an experiment is
specified.
USER RESPONSE:
Set the experiment to null and rerun.

ERROR (TBX-050): Unable to open the fault model for updates.


EXPLANATION:
The fault model exists, but cannot be opened for update either because of file
permissions or lack of system resources.
USER RESPONSE:
Make sure that the current project, entity, and testmode are specified correctly. If so,
check other messages for more details.

TBX-051 through TBX-119


ERROR (TBX-051): Unable to close the fault model after updates.
EXPLANATION:
The fault model exists, but cannot be closed after updates either because of file
permissions or lack of system resources.
USER RESPONSE:

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Make sure that the current project, entity, and testmode are specified correctly. If so,
check other messages for more details.

ERROR (TBX-052): Unable to initialize the Encounter Test Graphical User Interface - return
code=gui_return_code
EXPLANATION:
The graphical user interface initialization failed to return a valid return code.
USER RESPONSE:
Check for messages from the TUI component

ERROR (TBX-053): Unable to close the Encounter Test Graphical Interface.


EXPLANATION:
The graphical user interface initialization failed to return a valid return code on a close.
USER RESPONSE:
Check for messages from the TUI component.

ERROR (TBX-054): Graphical Interface does not match current environment


EXPLANATION:
A method attempted to connect to an existing graphical user interface, but the current
environment (PROJECT, ENTITY, VARIATION, ITERATION, and/or TESTMODE) in the
script does not match the environment in the graphical user interface, and the
TBX::selectGraphicsAddress second argument requested that an error be issued
in this case.
USER RESPONSE:
Either invoke TBX::selectProject, etc. to force the script to be working in the same
environment as the graphical user interface, or issue an error message and quit, or
specify a different action in the TBX::selectGraphicsAddress second parameter

ERROR (TBX-055): Unable to connect to existing graphical user interface. Return


code=return code.
EXPLANATION:
A method attempted to connect to an existing graphical user interface, but the underlying
code was unable to connect to that interface.
The return code from the underlying code is specified in the return code field.

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USER RESPONSE:
Either execute TBX::selectGraphicsAddress with a null argument to force a new
graphical user interface to start up, or determine why you were unable to connect to the
host address specified in TBX::selectGraphicsAddress.

ERROR (TBX-056): [Internal] Unable to load the scan identification data methods.
EXPLANATION:
The flat model was loaded, but there were not enough resources to load the information
that keeps track of whether each node is on the scan path.
USER RESPONSE:
Check other messages for more details. Check for system resources which might be low,
such as paging space.

ERROR (TBX-057): Invalid PROJECT: project


EXPLANATION:
The value specified as a project is not a valid directory
USER RESPONSE:
Check either the environment variable PROJECT, or the value of the
TBX::selectProject method to ensure it is a valid directory.

ERROR (TBX-058): Invalid PROJECT/ENTITY : project/entity


EXPLANATION:
The value specified as an entity is not a valid sub-directory of the project.
USER RESPONSE:
Check either the environment variable ENTITY or the value of the
TBX::selectEntity method to ensure it is a valid sub-directory of the current project

ERROR (TBX-059): Invalid TESTMODE: testmode


EXPLANATION:
The value specified as a testmode is not a valid testmode for the current project and
entity.
USER RESPONSE:

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Check either the environment variable TESTMODE, or the value of the


TBX::selectTestMode method to ensure it is a valid testmode for the current part.

ERROR (TBX-060): Invalid EXPERIMENT: experiment


EXPLANATION:
The value specified as an experiment is not a valid experiment for the current project,
entity, and testmode.
USER RESPONSE:
Check either the environment variable EXPERIMENT, or the value of the
TBX::selectExperiment method to ensure it is a valid experiment for the current
testmode.

ERROR (TBX-061): Invalid FAILSET: FAILSET name


EXPLANATION:
The value specified as a failset is not a valid failset for the current project, entity,
testmode, and experiment.
USER RESPONSE:
Check either the environment variable FAILSET, or the value of the
TBX::selectFailSet method to ensure it is a valid failset for the current experiment.

ERROR (TBX-062): Invalid DELAYMODEL: delay model name


EXPLANATION:
The value specified as a delay model is not a valid delay model for the current project
and entity.
USER RESPONSE:
Check either the environment variable DELAYMODEL, or the value of the
TBX::selectDelayModel method to ensure it is a valid delay model for the current
part.

ERROR (TBX-063): Invalid HOSTADDRESS: host address


EXPLANATION:
The value specified as a host address is not valid. The host address must consist of four
integers, separated by periods, followed by a colon, followed by a fifth integer, for
example, 9.130.46.7:5501

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USER RESPONSE:
Check either the environment variable HOSTADDR, or the value of the
TBX::selectGraphicsAddress method to ensure it is a valid host address.

ERROR (TBX-064): Callout not specified.


EXPLANATION:
No callout was specified either as an environment variable, or with the
TBX::selectCallout method.
USER RESPONSE:
Specify callout and rerun.

ERROR (TBX-065): [Internal] Unable to open the callout.


EXPLANATION:
The callout exists, but cannot be read either because of file permissions or lack of system
resources.
USER RESPONSE:
Verify the current project, entity, , test mode, experiment, failset, and callout are correctly
specified. If the settings are correct, review other messages for more details.

ERROR (TBX-066): Invalid callout sort field callout_sort_field.


EXPLANATION:
The specified field is not a valid field to sort a callout on. Valid fields are fault, score,
contributions, conflicting, tfsp, tpsf, or tfsf.
USER RESPONSE:
Correct the sort field parameter to TBX::calloutSort and rerun.

ERROR (TBX-067): Invalid callout sort direction callout_sort_direction.


EXPLANATION:
The specified sort direction is not valid for callout sorts. The sort direction must be a
string that starts with either a, A, d, or D.
USER RESPONSE:
Correct the sort direction parameter to TBX::calloutSort and rerun.

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.ERROR (TBX-068) [Internal]: Unable to load the flat model all methods.
EXPLANATION:
The flat model was loaded, but there were not enough resources to load the information
that keeps track of all flat model functions in the current mode.
USER RESPONSE:
Check other messages for more details.
Check for system resources such as paging space, which might be low.
Correct the detected problems and rerun.

ERROR (TBX-069): Failed to obtain a license for product product_name. This method
terminates.
EXPLANATION:
A required license could not be obtained for the indicated product. The method cannot
proceed without the required licenses. Either no license for the specified product is
available, or all licenses for the specfied product are currently in use.
USER RESPONSE:
Ensure the availability of the required license, and rerun.

ERROR (TBX-070): The action of action_parameter has not been registered against
object_type objects because the label, label_parameter, matches a predefined
label for object_type objects.
EXPLANATION:
The Extension language method specified a label that exactly matches the label of an
existing predefined action related to that object_type. Replacing predefined actions
is not supported.
USER RESPONSE:
Invoke the Extension language method using a label parameter that does not match the
predefined action labels associated with that object type.

WARNING (TBX-071): [Severe] Unable to find Net net_name in the physical design.
Error description: error_string. An empty string is returned.
EXPLANATION:

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The extension language method TBX::circaNetCommand was invoked with a net


name, but that net could not be found in the physical design. The result of this method
will be an empty string. The error string gives an indication of why the net was not found.
USER RESPONSE:
No response is required. To avoid this error, improve the correlation between the physical
design and the logical design. Use the report_physical_correlation command
to understand what percentage of nets will cause this message.

WARNING (TBX-100): [Severe] Pin index pin_index is cloaked.


EXPLANATION:
The pin specified by the pin_index argument is inside logic which is cloaked; that is,
intellectual property for which details may not be made available. An invalid value will be
returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains this pin, or find
a way to avoid this pin.

ERROR (TBX-101):Pin index pin_index is invalid.


EXPLANATION:
The pin specified by the pin_index argument could not be found in the current
hierModel. An invalid value will be returned.
USER RESPONSE:
Check to see that pin_index is correct, (a number between zero and the number of
hierarchical pins on the part) and that you are pointing to the correct model.

WARNING (TBX-102): [Severe] Pin pin_name is cloaked.


EXPLANATION:
The pin specified by the pin_name argument is inside logic which is cloaked; that is,
intellectual property for which details may not be made available. An invalid value will be
returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains this pin, or find
a way to avoid this pin.

WARNING (TBX-103): [Severe] Pin pin_name cannot be found.

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EXPLANATION:
The pin specified by the pin_name argument could not be found in the current
hierModel. An invalid value will be returned.
USER RESPONSE:
Check to see that pin_name is correct and that you are pointing to the correct model.

WARNING (TBX-104): [Severe] Node node is cloaked.


EXPLANATION:
The node specified by the node argument is inside logic which is cloaked; that is,
intellectual property for which details may not be made available. An invalid value will be
returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains this node, or
find a way to avoid this node.

WARNING (TBX-105): Node node traces into cloaked logic.


EXPLANATION:
One or more nodes encountered in the trace from the argument node are contained in
cloaked logic; that is, intellectual property for which details may not be made available.
The nodes inside the cloaked logic will not be returned, so the returned node list will be
incomplete.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains the traced
nodes, find a way to avoid this node, or accept that the returned node list will be
incomplete.

WARNING (TBX-106): [Severe] Pin pin_index traces into cloaked logic.


EXPLANATION:
The pin specified by pin_index argument traces into logic which is cloaked; that is,
intellectual property for which details may not be made available. An invalid value will be
returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains this pin, or find
a way to avoid this pin.

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WARNING (TBX-107): [Severe] Block block_name cannot be found.


EXPLANATION:
The block specified by the block_name argument could not be found in the current
hierModel. An invalid value will be returned.
USER RESPONSE:
Check that block_name is correct and that you are pointing to the correct model.

WARNING (TBX-108): [Severe] Block block_name is cloaked.


EXPLANATION:
The block specified by the block_name argument is inside logic which is cloaked; that
is, intellectual property for which details may not be made available. An invalid value will
be returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains this block, or
find a way to avoid this block.

WARNING (TBX-109): [Severe] Unable to map block block_name to a single flat model
node.
EXPLANATION:
The block name specified in the argument cannot map to a single flat model node,
probably because it is not the name of a block which is an Encounter Test primitive.
USER RESPONSE:
Check the specified block to make sure it has only one output.

ERROR (TBX-110): [Internal] Unable to load highest net name table.


EXPLANATION:
The flat model was loaded, but there were not enough resources to load the table that
describes the highest net name for a node.
USER RESPONSE:
Check for other messages. Check for system resources which might be low, such as
paging space.

ERROR (TBX-111): Controllable register register is invalid.

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EXPLANATION:
The register specified by the register argument is out of range for valid controllable
registers. An invalid value will be returned.
USER RESPONSE:
Check to see that the register is correct and within the range of valid controllable register
values.

ERROR (TBX-112): Measure register register is invalid.


EXPLANATION:
The register specified by the register argument is out of range for valid measure
registers. An invalid value will be returned.
USER RESPONSE:
Check to see that register is correct and within the range of valid measure register
values.

WARNING (TBX-113): At least one floating latch is in cloaked logic.


EXPLANATION:
At least one of the latches which should have been included in the floating latch list was
inside cloaked logic; that is, intellectual property for which details may not be made
available. All cloaked latches will not appear in the node list that is returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains the cloaked
floating latches, or work only with uncloaked floating latches.

WARNING (TBX-114): At least one latch is in cloaked logic.


EXPLANATION:
At least one of the latches which should have been included in the list of latch nodes was
inside cloaked logic; that is, intellectual property for which details may not be made
available. All cloaked latches will not appear in the node list that is returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains the cloaked
latches for this bit, or work only with uncloaked floating latches for this bit.

ERROR (TBX-115): Bit bit cannot be found in stim register register.

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EXPLANATION:
The bit position specified by the bit argument could not be found in the stim register
specified by the register argument. An invalid value will be returned.
USER RESPONSE:
Check to see that bit is correct (a number between one and the number of bits in this stim
register), and that you are pointing to the correct stim register.

WARNING (TBX-116): [Severe] Requested latch is in cloaked logic.


EXPLANATION:
The latch which should have been the return value for this function was inside cloaked
logic; that is, intellectual property for which details may not be made available. An invalid
value will be returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains the cloaked
latch for this bit, or ignore this bit.

ERROR (TBX-117): Bit bit cannot be found in measure register register.


EXPLANATION:
The bit position specified by the bit argument could not be found in the measure register
specified by the register argument. An invalid value will be returned.
USER RESPONSE:
Check to see that bit is correct (a number between one and the number of bits in this
measure register), and that you are pointing to the correct measure register.

WARNING (TBX-118): At least one clock node is in cloaked logic.


EXPLANATION:
This will only happen if the entire design is cloaked.
USER RESPONSE:
Get an uncloaked version of this design.

WARNING (TBX-119): [Severe] Node node is not a primary input.


EXPLANATION:

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The node specified as an argument does not correlate to a primary input pin. An invalid
value will be returned.
USER RESPONSE:
Check to see if the node is correct.

TBX-120 through TBX-174


WARNING (TBX-120): [Severe] Unable to find representative fault for fault index
fault_index.
EXPLANATION:
Most probably, the fault specified as an argument could not be found in the Encounter
Test global fault model. An invalid value will be returned.
USER RESPONSE:
Check the fault index argument.

ERROR (TBX-121): Sequence sequence ID is not correct syntax.


EXPLANATION:
The sequence specified by the sequence ID argument could not be found in the current
experiment because it was not syntactically correct. An invalid value will be returned.
USER RESPONSE:
Check to see that sequence ID is correct (Five integers, separated by four periods).

WARNING (TBX-122): [Severe] Sequence sequence ID cannot be found.


EXPLANATION:
The sequence specified by the sequence ID argument could not be found in the current
experiment because even though it was syntactically correct, there is no such sequence
in the Vectors file. An invalid value will be returned.
USER RESPONSE:
Check to see that sequence ID is correct and is a valid sequence for the current
experiment.

INFO (TBX-123): Sequence sequence ID has no successor.


EXPLANATION:

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The sequence specified by the sequence ID is the last sequence in the current
experiment. An invalid value will be returned.
USER RESPONSE:
No response is required.

ERROR (TBX-124): Node node is invalid.


EXPLANATION:
The node specified by the node argument is out of range for the flatModel. An invalid
value will be returned.
USER RESPONSE:
Check to see that node is correct and within the range of valid node values.

ERROR (TBX-125): Block index block_index is invalid.


EXPLANATION:
The block specified by the block_index argument could not be found in the current
hierModel. An invalid value will be returned.
USER RESPONSE:
Check to see that block_index is correct, (a number between zero and the number
of hierarchical pins on the design) and that you are pointing to the correct model.

ERROR (TBX-126): Net index net_index is invalid.


EXPLANATION:
The net specified by the net_index argument could not be found in the current
hierModel. An invalid value will be returned.
USER RESPONSE:
Check to see that net_index is correct, (a number between zero and the number of
hierarchical pins on the design) and that you are pointing to the correct model.

WARNING (TBX-127): [Severe] Net net_name cannot be found.


EXPLANATION:
The net specified by the net_name argument could not be found in the current
hierModel. An invalid value will be returned.
USER RESPONSE:

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Check to see that net_name is correct and that you are pointing to the correct model.

WARNING (TBX-128): [Severe] Node node is an input pin with no associated block name.
EXPLANATION:
The node specified by the node argument is an input pin and has no associated block
name in the hierModel. An invalid value will be returned.
USER RESPONSE:
Check to see that node reference is correct or use alternate methods to define block
name.

WARNING (TBX-129): [Severe] Node node is an output pin with no associated block
name.
EXPLANATION:
The node specified by the node argument is an output pin and has no associated block
name in the hierModel. An invalid value will be returned.
USER RESPONSE:
Check to see that node reference is correct or use alternate methods to define block
name.

WARNING (TBX-130): [Severe] Node node is a net with no associated block name.
EXPLANATION:
The node specified by the node argument is a net and has no associated block in the
hierModel. An invalid value will be returned.
USER RESPONSE:
Check to see that node reference is correct or use alternate methods to define block
name.

WARNING (TBX-131): [Severe] Block index block_index is cloaked.


EXPLANATION:
The block specified by the block_index argument is inside logic which is cloaked; that
is, intellectual property for which details may not be made available. An invalid value will
be returned.
USER RESPONSE:

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Either find a way to get an uncloaked version of the model which contains this block, or
find a way to avoid this block.

WARNING (TBX-132): [Severe] Net index net_index is cloaked.


EXPLANATION:
The net specified by the net_index argument is inside logic which is cloaked; that is,
intellectual property for which details may not be made available. An invalid value will be
returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains this net, or find
a way to avoid this net.

WARNING (TBX-133): [Severe] Net net_name is cloaked.


EXPLANATION:
The net specified by the net_name argument is inside logic which is cloaked; that is,
intellectual property for which details may not be made available. An invalid value will be
returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains this net, or find
a way to avoid this pin.

ERROR (TBX-134): Fault fault_index is invalid.


EXPLANATION:
The fault index specified by the fault_index argument is out of range for the fault
model. An invalid value will be returned.
USER RESPONSE:
Check to see that fault_index is correct and within the range of valid fault index
values.

INFO (TBX-135): Pin index pin_index has no child net.


EXPLANATION:
The pin specified by the pin_index argument is at a terminating block; that is, no child
net is defined. An invalid value will be returned.
USER RESPONSE:

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No response is required.

INFO (TBX-136): Pin index pin_index has no parent net.


EXPLANATION:
The pin specified by the pin_index argument is at the highest level block; that is, no
parent net is defined. An invalid value will be returned.
USER RESPONSE:
No response is required.

INFO (TBX-137): Block index block_index has no child block.


EXPLANATION:
The block specified by the pin_index argument is at the lowest level of hierarchy; that
is, no child block is defined. An invalid value will be returned.
USER RESPONSE:
No response is required.

INFO (TBX-138): Block index block_index has no parent block.


EXPLANATION:
The block specified by the pin_index argument is at the highest level of hierarchy; that
is, no parent block is defined. An invalid value will be returned.
USER RESPONSE:
No response is required.

WARNING (TBX-139): [Severe] Node node is an input pin with no associated block index.
EXPLANATION:
The node specified by the node argument is an input pin and has no associated block
index in the hierModel. An invalid value will be returned.
USER RESPONSE:
Check to see that node reference is correct or use alternate methods to define block
index.

WARNING (TBX-140): [Severe] Node node is an output pin with no associated block
index.

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EXPLANATION:
The node specified by the node argument is an output pin and has no associated block
index in the hierModel. An invalid value will be returned.
USER RESPONSE:
Check to see that node reference is correct or use alternate methods to define block
index.

WARNING (TBX-141): [Severe] Node node is a net with no associated hierarchical index.
EXPLANATION:
The node specified by the node argument is a net and has no associated index in the
hierModel. An invalid value will be returned.
USER RESPONSE:
Check to see that node reference is correct or use alternate methods to define
hierarchical index.

WARNING (TBX-143): [Severe] Unable to map block index block_index to a single flat
model node.
EXPLANATION:
The block index specified by the block_index argument cannot map to a single flat
model node, probably because it is not a block index which is a Encounter Test primitive.
An invalid value will be returned.
USER RESPONSE:
Check the specified block to make sure it has only one output.

WARNING (TBX-144): [Severe] Fault index fault_index traces into cloaked logic.
EXPLANATION:
The fault index specified by the fault_index argument traces into cloaked logic; that
is, intellectual property for which details may not be made available. An invalid value will
be returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains traceable faults
or find a way to avoid this fault.

WARNING (TBX-145): [Severe] Unable to map node node to a single pin index.

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EXPLANATION:
The node specified by the node argument cannot map to a single pin. An invalid value
will be returned.
USER RESPONSE:
Check to see that node reference is correct or use alternate methods to define pin index.

ERROR (TBX-146): Unable to load the fault specification.


EXPLANATION:
The fault model was loaded, but there were not enough resources to load the fault
specification.
USER RESPONSE:
Check for other messages. Check for system resources which might be low, such as
paging space.

WARNING (TBX-147): [Severe] Propagation value for fault fault_index is unknown.


EXPLANATION:
The fault propagation value for the fault index specified by the fault_index argument
can not be determined. An invalid value will be returned.
USER RESPONSE:
Check to see that fault_index is correct and has an expected propagation value.

ERROR (TBX-148): Skewed measure latch at bit bit of register register cannot be
found.
EXPLANATION:
The bit position bit in measure register register does not contain a skewed latch
node. An invalid value will be returned.
USER RESPONSE:
Check to see that bit bit and measure register register are both correct.

ERROR (TBX-149): Unable to update the fault model.


EXPLANATION:
The fault model was loaded, but there were not enough resources to update the fault
model.

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USER RESPONSE:
Check for other messages. Check for system resources which might be low, such as
paging space.

ERROR (TBX-150): PRPG register register is invalid.


EXPLANATION:
The register specified by the register argument is out of range for valid PRPG registers.
An invalid value will be returned.
USER RESPONSE:
Check to see that register is correct and within the range of valid PRPG register values.

ERROR (TBX-151): MISR register register is invalid.


EXPLANATION:
The register specified by the register argument is out of range for valid MISR registers.
An invalid value will be returned.
USER RESPONSE:
Check to see that register is correct and within the range of valid MISR register values.

ERROR (TBX-152): Failure Index failureIndex is invalid.


EXPLANATION:
The failure index specified by the failIndex argument is out of range for valid failure
data indexes. An invalid value will be returned.
USER RESPONSE:
Check to see that failIndex is correct and within the range of valid failure indexes
(from 1 to numFails)

ERROR (TBX-153): Device Name deviceName is invalid.


EXPLANATION:
The device name specified by the deviceName argument does not exist in the current
failset. An empty list will be returned.
USER RESPONSE:
Check to see that deviceName is correct for the current fail set (must appear in
deviceList).

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WARNING (TBX-154): [Severe] Graphics connection action of connectionAction not


recognized.
EXPLANATION:
The optional second parameter to the TBX::selectGraphicsAddress method must
have one of the valid values: spawn, control, or error. The specified value does not
match any of these entries. The default action spawn will be used.
USER RESPONSE:
Change the value of the second parameter of TBX::selectGraphicsAddress
method to any of the mentioned valid values or null and rerun. A value spawn, or no value
specified indicates that if the Graphical User Interface is working on a different part, then
the connect should not occur, but a new Graphical User Interface should be created. A
value of error indicates that if the graphical user interface is working on a different part,
an error should occur.

ERROR (TBX-155): TSV returned a non-zero return code of TSV return code while
attempting to get default values.
EXPLANATION:
Attempt to get TSV defaults failed because TSV returned a bad return code.
USER RESPONSE:
Check for other messages from TSV.

ERROR (TBX-156): Child net is cloaked


EXPLANATION:
A pin index is not cloaked, but the internal child net to which the pin connects is cloaked.
A child net index of -1 will be returned.
USER RESPONSE:
Either find a way to get an uncloaked version of the model which contains this net, or find
a way to avoid this net, or understand that the results of this function are incomplete.

ERROR (TBX-157): Unable to initialize the simulator.


EXPLANATION:
The extension language could not initialize the Simulator for this design.
USER RESPONSE:

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Make sure that the current project and entity are specified correctly. If these parameters
are specified correctly, check other messages for more details.

ERROR (TBX-158): Unrecognized design state: state.


EXPLANATION:
The extension language could not properly interpret the given device under test (design)
state.
USER RESPONSE:
Refer to setCircuitState in the Encounter Test: Reference: Extension
Languagefor a list of acceptable design states:

ERROR (TBX-159): Multiple Scan Sections detected and Scan Section Entry not specified.
EXPLANATION:
This design contains multiple scan sections, that is, different ways in which a single scan-
in or scan-out pin can be used to drive more than one scan register. In this case, the scan
chain must be configured to address one of these scan sections.
USER RESPONSE:
Set Scan Section Entry by calling the extension language method
TBX::selectScanSection. Refer to selectScanSection in the Extension Language
Reference.

ERROR (TBX-160): Unrecognized scan section sequence name:


scan_section_sequence.
EXPLANATION:
A scan section sequence name which matches the name specified as a parameter was
not found.
USER RESPONSE:
Check the TBDseqPatt file produced by report_sequences to find the valid scan
section sequence names. See report_sequences in the Encounter Test: Reference:
Commands for additional information.

WARNING (TBX-161): Three-State contention occurred.


EXPLANATION:
A hard three state contention occurred (i.e. a single net driven by both a one and a zero)
at one or more nets.

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USER RESPONSE:
No response is required. Simulation will assume an unknown resolved value for the
net(s). For a list of nodes with three state contention, utilize the method
TBX::getThreeStateContentionNodeList. Refer to
getThreeStateContentionNodeList in the Extension Language Reference.

WARNING (TBX-162): Three-State contention occurred when setting design state


EXPLANATION:
The design state specified in the parameter causes hard three-state contention (i.e. a
single net driven by both a one and a zero) at one or more nets.
USER RESPONSE:
No response is required. Check TSV burnout messages for more detail. Simulation will
assume an unknown resolved value for the net(s) in contention.

ERROR (TBX-163): Invalid argument. Detected NULL for value.


EXPLANATION:
Cannot stimulate design state with a null value.
USER RESPONSE:
Specify a value of 0, 1, Z, X, +, or - as an argument.

WARNING (TBX-164): [INTERNAL] Unable to load the flat model circuit state methods.
EXPLANATION:
The flat model was loaded, but there were not enough resources to load the circuit state
custom protocol methods.
USER RESPONSE:
Check other messages for more details. Check for system resources which might be low,
such as paging space.

ERROR (TBX-165): [Internal] No DOTT blocks were found


EXPLANATION:
There were no DOTT blocks (two three-state drivers dotted together) found for this
model. Therefore, the TBX::getThreeStateContention method will always return
an empty list.
USER RESPONSE:

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No response required.

WARNING (TBX-166): [Severe] Unable to add the first experiment in the file.
EXPLANATION:
It is probable the file has write permission problems.
USER RESPONSE:
Check other messages for more details.

ERROR (TBX-167): Unable to set experiment name in the experiment.


EXPLANATION:
It is probable the file has write permission problems.
USER RESPONSE:
Check other messages for more details.

ERROR (TBX-168): New experiment name must be specified.


EXPLANATION:
Cannot create an new experiment without a new experiment name specified as input.
Refer to createNewExperiment in the Extension Language Reference.
USER RESPONSE:
Ensure that the new experiment name parameter is specified in the invocation of the
TBX::createExperiment method.

ERROR (TBX-169): Failed to register experiment file experiment_name.


EXPLANATION:
The Encounter Test function to register this experiment on globalData failed.
USER RESPONSE:
Check globalData write authority in the part directory.

ERROR (TBX-170): Experiment already exists.


EXPLANATION:
Cannot create a new experiment because experiment already exists for the current
testmode.

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USER RESPONSE:
Change testmode or provide a different experiment name.

ERROR (TBX-171): [Internal] Unable to register experiment experiment_name as


dependent on testmode testmode.
EXPLANATION:
The Encounter Test function to register the dependency of the experiment on the test
mode in globalData failed.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TBX-172): Unable to save registration and dependency information.


EXPLANATION:
Any global data changes did not become persistent. Global data will not reflect any
updates.
USER RESPONSE:
Check for possible low system resources, or global data write authority.

ERROR (TBX-173): Unrecognized event type: event type name


EXPLANATION:
TBD/TBX failed to recognize the given event type provided in ASCII format.
USER RESPONSE:
Specify a valid event type as an argument to TBX::createEvent.

ERROR (TBX-174): Incorrect node specification for event type: event type name
EXPLANATION:
The node specified is not a valid node for the event type of the specified event. For
instance, a node which is not a primary input node was specified for a Stim_PI event.
USER RESPONSE:
Ensure that the node specified is valid for the event type for the event.

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TBX-175 through TBX-219


ERROR (TBX-175): Incorrect net value specification for event type: event type name.
EXPLANATION:
The specified net value is not valid for the event type.
USER RESPONSE:
Refer to createEventFromPatternType in the Encounter Test: Reference:
Extension Languagefor a list of valid net values.

ERROR (TBX-176): Incorrect polarity value specification for event type: event type
name
EXPLANATION:
The specified polarity value is not valid. Valid polarity values include "0","1","-", and "+".
"0" and "-" are equivalent and represent 1-0-1 pulse. "1" and "+" are equivalent and
represent the 0-1-0 pulse.
USER RESPONSE:
Ensure that the create method specifies a valid polarity value as an argument.

ERROR (TBX-177): Invalid number of TBD hierarchical levels specified. Minimum required
is minimum levels.
EXPLANATION:
The minimum number of odometer levels for the extension language "Create" method
was not specified. For example, the minimum odometer levels that must be specified
when creating a tester loop are two, the experiment level and the test section level, for
example, 1.1.
USER RESPONSE:
Refer to "Test Pattern Methods" in the Encounter Test: Reference: Extension
Language for standards and conventions.

ERROR (TBX-178): Failed to remove dependencies on object name.


EXPLANATION:
The named object is registered in global data, but has failed to remove any dependencies
registered on the object.
USER RESPONSE:

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Validate that the given named object has registered dependencies. If so, check for global
data write authority.

WARNING (TBX-179):object name is not registered in global data. No global data


updates occurred.
EXPLANATION:
The given named object is not registered in global data. No global data updates were
performed. Register the named object into global data first.
USER RESPONSE:
Use the Encounter Test Extension Language TBX::registerObject method to
register the named object into global data.

ERROR (TBX-180): Failed to register object name in global data.


EXPLANATION:
Global data could not register the given object.
USER RESPONSE:
Validate the given object is not previously registered, or registered with dependencies in
global data. If not, check for global write authority.

ERROR (TBX-181): Failed to unregister object name in global data.


EXPLANATION:
Global data failed to unregister the given name object.
USER RESPONSE:
Validate that the given named object is registered in global data. If so, then check for
global data write authority.

ERROR (TBX-182): Failed to register dependent child on object parent in global data.
EXPLANATION:
Global data failed to register the dependent child object to the parent object with a
specified dependency type of file, statistic, character, or all.
USER RESPONSE:
Validate that the parent and child objects are registered in global data. If so, check for
global data write authority.

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ERROR (TBX-183): Failed to unregister dependent child on object parent in global


data.
EXPLANATION:
Global data failed to unregister the child object dependency on the given parent object.
USER RESPONSE:
Validate that the parent and child objects are registered in global data, and that the child
is also registered as a dependency to the parent. If so, check for global data write
authority.

ERROR (TBX-184): Both a child and parent objects must be specified.


EXPLANATION:
The Encounter Test Extension language detected that either the child or parent object
was not specified (NULL).
USER RESPONSE:
Specify a valid parent/child object pair as input.

WARNING (TBX-185): [Severe] Unable to initialize the Distance Model.


EXPLANATION:
There was a problem initializing the Timing Utilitys Distance Model needed for
determining path lengths. This can be caused by an inability to open the Delay Model or
an internal program error.
USER RESPONSE:
Ensure that the Delay Model has been selected and that it exists and can be accessed.

WARNING (TBX-186): [Severe] Illegal net value requested for hold: net Value.
EXPLANATION:
The TBX::holdPinForPathCalc method was called with a net value of something
other than 0, 1, or X. The only three acceptable values for this function are 0, 1, or X.
USER RESPONSE:
Modify the script to ensure that only values of 0, 1, or X are passed to the
TBX::holdPinForPathCalc method.

WARNING (TBX-187): Delay Model name not set. Unable to open Delay Model.

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EXPLANATION:
The DELAYMODEL environment variable was not set, but the Delay Model resource was
requested. The Delay Model cannot be opened unless the DELAYMODEL environment
variable is set.
USER RESPONSE:
Set the DELAYMODEL environment variable to name the Delay Model that you would like
to use.

WARNING (TBX-188): [Severe] Failed to open the Delay Model (delay Model Name).
EXPLANATION:
There was an error attempting to open the Delay Model. Refer to the TDM messages
prior to this message to determine the cause.
USER RESPONSE:
Refer to the suggested responses for the TDM messages describing the cause of the
problem. See Chapter 21, TDM - Delay Model Build Messages.

INFO (TBX-189): Using gate delays for path distance calculations.


EXPLANATION:
The DELAYMODEL environment variable was not set, so gate delays will be used in path
distance calculations instead of timing information. This will lead to less accurate longest
path calculations.
USER RESPONSE:
No response is required. If more accurate path length calculations are desired, make
sure that you have a Delay Model and set the DELAYMODEL environment variable to the
name of it.

ERROR (TBX-190): Initialization of clock affiliation tables failed.


EXPLANATION:
The Encounter Test Extension language failed to obtain resources for initializing the
clock affiliation tables.
USER RESPONSE:
Check other messages for more details.

ERROR (TBX-191): Bit bit index not found in PRPG register register index.

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EXPLANATION:
The bit index specified is either not a positive number or greater than the number of bit
positions for the given PRPG register.
USER RESPONSE:
Check the bit position passed into this method.

ERROR (TBX-192): [Internal] Unable to find latch for bit bit index in PRPG register
register index.
EXPLANATION:
The bit index specified is a valid bit position, but Encounter Test was unable to find the
corresponding Representative Stimmable Latch (RSL).
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TBX-193): Bit bit index not found in MISR register register index.
EXPLANATION:
The bit index specified is either not a positive number or greater than the number of bit
positions for the given MISR register.
USER RESPONSE:
Check the bit position passed into this method.

ERROR (TBX-194): [Internal] Unable to find latch for bit bit index in MISR register
register index.
EXPLANATION:
The bit index specified is a valid bit position, but Encounter Test was unable to find the
corresponding Representative Measure Latch (RML).
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TBX-195): Invalid experiment odometer level specified: input experiment


odometer
EXPLANATION:

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For creation and population of an experiment, the only valid experiment odometer level
value accepted is 1. Attempting to add more than one experiment is not permitted.
USER RESPONSE:
Specify a value of 1 for the experiment odometer level when creating and populating an
experiment.

INFO (TBX-196): parseArgs returned a null result because help was requested.
EXPLANATION:
The TBX::parseArgs method was called with the -h or -H option which activates the
help function. Once the help function is completed, this method returns a null value.
USER RESPONSE:
Specification of the -h or -H option to the TBX::parseArgs method activates Help
function and returns a null value.

ERROR (TBX-197): An invalid or missing argument was discovered by parseArgs.


EXPLANATION:
A missing or invalid argument was detected by parseArgs, such as a non-supported
option specified.
USER RESPONSE:
Validate the arguments specified as input to this method. To force parseArgs to
override this error, specify TB_CONTINUE.

ERROR (TBX-198): [Internal] parseArgs returned an invalid result.


EXPLANATION:
parseArgs failed to parse the specified keyword file given the specified arguments.
USER RESPONSE:
Validate the arguments specified as input to this method. Validate the specified keyword
file exists and is correct. Validate the specified arguments are not a mismatch with the
keyword file. Contact customer support (see Contacting Customer Service on page 23)
for support.

ERROR (TBX-199): [Internal] Port instance attributes not found for block index block
index.
EXPLANATION:

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No attribute names were found to be assigned to the pins of block instance(s) for the
given block index in the hierarchical model.
USER RESPONSE:
The attribute names may be assigned to the pins of a block definition for the given block
index. Try using TBX::portPropertyListFromBlockIndex method as an
alternative.

ERROR (TBX-200): [Internal] Port instance attribute value not found for attribute
attribute name of pin index pin index.
EXPLANATION:
An attribute value was not found given the attribute name and pin index for pin
instance(s) in the hierarchical model.
USER RESPONSE:
Validate the attribute name is valid for this pin index, or the attribute name may be
assigned to a pin definition and would alternatively use the
TBX::portPropertyValueFromPinIndexProperty method.

ERROR (TBX-201): [Internal] Port attributes not found for block index block index.
EXPLANATION:
No attribute names were found to be assigned to the pins of the block definition for the
given block index in the hierarchical model.
USER RESPONSE:
The attribute names may be assigned to the pins of block instance(s) for the given block
index. Try using TBX::portInstancePropertyListFromBlockIndex method as
an alternative.

ERROR (TBX-202): [Internal] Port attribute value not found for attribute attribute
name of pin index pin index.
EXPLANATION:
An attribute value was not found given the attribute name and pin index for pin definition
in the hierarchical model.
USER RESPONSE:
Validate the attribute name is valid for this pin index, or the attribute name may be
assigned to a pin instance(s) and would alternatively use the
TBX::portInstancePropertyValueFromPinIndexProperty method.

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ERROR (TBX-203): [Internal] Block instance attributes not found for block index block
index.
EXPLANATION:
No attribute names were found to be assigned to the block instance(s) for the given block
index in the hierarchical model.
USER RESPONSE:
The attribute names may be assigned to the block definition for the given block index. Try
using TBX::cellPropertyListFromBlockIndex method as an alternative.

ERROR (TBX-204): [Internal] Block instance attribute value not found for attribute
attribute name of block index block index.
EXPLANATION:
An attribute value was not found given the attribute name and block index for block
instance(s) in the hierarchical model.
USER RESPONSE:
Validate the attribute name is valid for this block index, or the attribute name may be
assigned to a block definition and would alternatively use the
TBX::cellPropertyValueFromBlockIndexProperty method.

ERROR (TBX-205): [Internal] Cell attributes not found for block index block index.
EXPLANATION:
No attribute names were found to be assigned to the cell (block definition) for the given
block index in the hierarchical model.
USER RESPONSE:
The attribute names may be assigned to the block instance(s) for the given block index.
Try using TBX::instancePropertyListFromBlockIndex method as an
alternative.

ERROR (TBX-206): [Internal] Cell attribute value not found for attribute attribute
name of block index block index.
EXPLANATION:
An attribute value was not found given the attribute name and block index for the cell
(block definition) in the hierarchical model.
USER RESPONSE:

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Validate the attribute name is valid for this block index, or the attribute name may be
assigned to a block instance(s) and would alternatively use the
TBX::instancePropertyValueFromBlockIndexProperty method.

ERROR (TBX-207): [Internal] Net attributes not found for block index block index.
EXPLANATION:
No attribute names were found to be assigned to the nets of the block definition for the
given block index in the hierarchical model.
USER RESPONSE:
Validate the block index is valid for a block definition that has net definition attributes
assigned and rerun.

ERROR (TBX-208): [Internal] Net attribute value not found for attribute attribute
name of net index net index.
EXPLANATION:
An attribute value was not found given the attribute name and net index for a net
definition in the hierarchical model.
USER RESPONSE:
Validate the attribute name is valid for this net index.

ERROR (TBX-209): Pin proper pin name is invalid.


EXPLANATION:
Could not find pin from the specified pin name.
USER RESPONSE:
Validate that the specified cell name and pin name is correct, provided to the TBX
method in proper parameter order, and that the correct hierarchical model is used.

ERROR (TBX-210): Missing or invalid argument specified.


EXPLANATION:
An argument for the TBX method is missing or invalid. NULL detected or possibly an
invalid type or value specified.
USER RESPONSE:
Validate that all arguments are specified, NULL is not specified, or validate argument
value or type specification.

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WARNING (TBX-211): TDR specified for the current testmode does not contain
PIN_TIMING information.
EXPLANATION:
The TBX::getTDR method requires that the TDR specified by the testmode contains
PIN_TIMING data. The TDR associated with this testmode does not contain
PIN_TIMING data.
USER RESPONSE:
Review which TDR contains the PIN_TIMING information and select the mode that
specifies this TDR.

WARNING (TBX-212): TBX::setDetermineTimeLinearComb the best, nominal, and


worst values to be >= 0 and least parameter to > 0.
EXPLANATION:
The linear combination is used to select what portion of the delays are used. For example
0,1,0 would select the nominal, while .5,.5,0 would select the mid-point between the best
and nominal. At least one of the three values must be > 0.
USER RESPONSE:
Ensure at least one of the three parameters is > 0 and the rest >= 0.

WARNING (TBX-213): No distance could be determined by


TBX::determineLongestTimeTo, TBX::determineLongestSourceTimeTo or
TBX::getSourcesforTimeTo, the nodes are may at a stable state.
EXPLANATION:
No distance to the all the given flat nodes could be determined. This could be because
the nodes are at a stable state.
USER RESPONSE:
Select pins that are not at a stable state.

WARNING (TBX-214): circuit_state is not an allowed circuit state for the determine
time functions.
EXPLANATION:
The determine time circuit has a limited set of states. Read the documentation for the
allowed states.
USER RESPONSE:

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Refer to setDetermineTimeCircuitState in the Encounter Test: Reference:


Extension Language for the allowed states and use one of the allowed sets.

WARNING (TBX-215): TBX::getDetermineTimeCmfm or


TBX::getDetermineTimeGoto passed a node that does not feed a cell boundary.
EXPLANATION:
The model used for distance time uses delays that only reside on the upper most cell
boundaries. Nodes that do not connect to a cell boundary are not in the model.
USER RESPONSE:
Ensure the nodes passed into TBX::getDetermineTimeCmfm or
TBX::getDetermineTimeGoto are on cell boundaries or ignore the warning.

WARNING (TBX-216): Linear Combination not yet set.


EXPLANATION:
The selected mode does not set the late mode linear combination (LC) or the linear
combination was not set by the TBX::setDetermineTimeLinearComb method.
USER RESPONSE:
Set the linear combination by calling TBX::setDetermineLinearComb or adding late
mode to the mode information.

WARNING (TBX-217): [Severe] Node node is not a Latch.


EXPLANATION:
The flat node specified to this TBX method must be a latch.
USER RESPONSE:
Validate flat node input is a latch by using the TBX::simFunctionFromNode method.

WARNING (TBX-218): [Severe] Node node is not a Stimmable Latch.


EXPLANATION:
The flat node specified to this TBX method must be a latch that is controllable.
USER RESPONSE:
Use the Extension Language method TBX::nodeListFromStimRegBit for a node
list of valid controllable latches.

WARNING (TBX-219): [Severe] Node node is not a Measure Latch.

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EXPLANATION:
The flat node specified to this TBX method must be a latch that is measurable.
USER RESPONSE:
Use the Extension Language method TBX::nodeFromMeasureRegBit for a valid
measure latch flat node.

TBX-220 through TBX-481


WARNING (TBX-220): Violation Message Summary List not available.
EXPLANATION:
Encounter Test failed to load the violation message summary list.
USER RESPONSE:
Validate that the appropriate analysis has been performed. Refer to preceding messages
for more detailed information.

WARNING (TBX-221): [Severe] Range violation range is invalid


EXPLANATION:
The range provided as input is either invalid in syntax, or is greater than the total available
violations for the given Text Message identfier.
USER RESPONSE:
Refer to the Encounter Test: Reference: Extension Language for valid range syntax
or utilize the appropriate Extension Language method to retrieve the violation message
list data for determining maximum range.

WARNING (TBX-222): [Severe] Text Message identifier text message identifier


not found.
EXPLANATION:
Encounter Test failed to match the given text message identifier in the violation message
summary list.
USER RESPONSE:
Utilize the appropriate Extension Language method to retrieve the violation message
summary list for determining valid available message identifiers.

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ERROR (TBX-223): Node node is not a latch.


EXPLANATION:
The TBX method expects the input node to point to a latch primitive. This method only
works when the input node is a latch.
USER RESPONSE:
Check the input node to ensure it points to a latch primitive.

ERROR (TBX-224): Node node is not a controllable latch.


EXPLANATION:
The invoked TBX method expects the input node to point to a controllable latch primitive.
This method only works when the input node is a controllable latch.
USER RESPONSE:
Check the input node to ensure it points to a controllable latch primitive in the current test
mode.

ERROR (TBX-225): Node node is not a measurable latch.


EXPLANATION:
The invoked TBX method expects the input node to point to a measurable latch primitive.
This method only works when the input node is a measurable latch.
USER RESPONSE:
Check the input node to ensure it points to a measurable latch primitive in the current test
mode.

ERROR (TBX-226): Node node is not a PRPG latch.


EXPLANATION:
The invoked TBX method expects the input node to point to a PRPG latch primitive. This
method only works when the input node is a PRPG latch.
USER RESPONSE:
Check the input node to ensure it points to a PRPG latch primitive in the current test
mode.

ERROR (TBX-227): Node node is not a MISR latch.


EXPLANATION:

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The invoked TBX method expects the input node to point to a MISR latch primitive. This
method only works when the input node is a MISR latch.
USER RESPONSE:
Check the input node to ensure it points to a MISR latch primitive in the current test
mode.

INFO (TBX-228): No bidirectional pins found for block index block index.
EXPLANATION:
The invoked TBX method expects the given block index to have input-output pins.
USER RESPONSE:
No response required.

WARNING (TBX-229): [Severe] The specified Primary Input node index is not a top
level block bidirectional pin.
EXPLANATION:
The invoked TBX method expects the given primary input node to be a Common Input
Output pin (top level block bidirectional pin).
USER RESPONSE:
Utilize the Extension Language method TBX::bidiPinListFromBlockIndex for a list of
bidirectional hier model pin indexes.

WARNING (TBX-230): [Severe] The specified Primary Output node index is not a top
level block bidirectional pin.
EXPLANATION:
The invoked TBX method expects the given PO node to be a Common Input Output pin
(top level block bidirectional pin).
USER RESPONSE:
Utilize the Extension Language method TBX::bidiPinListFromBlockIndex for
a list of bidirectional hier model pin indexes.

WARNING (TBX-231): [Severe] Node node is not a primary output.


EXPLANATION:
The node specified as an argument does not correlate to a primary output pin. An invalid
value will be returned.

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USER RESPONSE:
Check to see if the node is correct.

WARNING (TBX-232): PROJECT is set to NULL.


EXPLANATION:
The value specified as a project is not a valid directory.
USER RESPONSE:
Encounter Test Extension Language accepts NULL value under the assumption the
script writer wants the PROJECT environment variable unset.

WARNING (TBX-233): ENTITY is set to NULL


EXPLANATION:
The value specified as an entity is not a valid sub-directory of the project specified in the
environment variable PROJECT.
USER RESPONSE:
Encounter Test Extension Language accepts the NULL value under the assumption the
script writer wants the ENTITY environment variable unset.

WARNING (TBX-234): Come from Node from node is not valid for Node to node.
EXPLANATION:
The node specified as a come from node is not valid for the specified "to" node in the
trace.
USER RESPONSE:
Validate the specified arguments are in the correct order.

WARNING (TBX-235): [Severe] Block name block name is not an instance of a primitive.
EXPLANATION:
The specified Block Name is for a hierarchical non-primitive block.
USER RESPONSE:
Specify block name for a primitive. Refer to blockNameFromNode in the Extension
Language Reference.

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WARNING (TBX-236): [Severe] Block index block index is not an instance of a


primitive.
EXPLANATION:
The specified block index is for a hierarchical non-primitive block.
USER RESPONSE:
Specify block index for a primitive. Refer to blockIndexFromNode in the Extension
Language Reference.

WARNING (TBX-237): [Severe] Invalid CALLOUT: CALLOUT name


EXPLANATION:
The value specified as a callout is not a valid callout for the current project, entity,
testmode, experiment, and FAILSET.
USER RESPONSE:
Check either the environment variable CALLOUT, or the value of the
TBX::selectCallout method to ensure it is a valid callout for the current experiment.

ERROR (TBX-238): Invalid Pseudo Primary Input (PPI): pseudo primary input
index
EXPLANATION:
The value specified as a Pseudo Primary Input (PPI) index is not valid for the current
project, entity, and testmode.
USER RESPONSE:
Correct the pseudo primary input index and rerun.

ERROR (TBX-239): Invalid node node index for Pseudo Primary Input (PPI) pseudo
primary input index
EXPLANATION:
For the current project, entity, and testmode, the specified cut point is not found for the
given PPI index. There is a mismatch in input parameters.
USER RESPONSE:
To obtain a valid node list from a Pseudo Primary Input entry, refer to the method
TBX::nodeListFromPPI.

ERROR (TBX-240): There are no Pseudo Primary Inputs (PPI) for this testmode.

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EXPLANATION:
For the current project, entity, and testmode, no pseudo primary inputs were found.
USER RESPONSE:
Select a different testmode.

ERROR (TBX-241): There is no Pseudo Primary Input (PPI) from the node cut point
node.
EXPLANATION:
The node index specified is not a cut point node for any PPIs found for the current project,
entity, and testmode.
USER RESPONSE:
Refer to the method TBX::clockNodeListFromNode in the Encounter Test:
Reference: Extension Language to obtain a list of valid pseudo primary input entries.

ERROR (TBX-242): Invalid RRFA EXPERIMENT : experiment


EXPLANATION:
The specified experiment does not contain generated random resistant data.
USER RESPONSE:
Run the analyze_random resistance command to create an EXPERIMENT for this
application.

WARNING (TBX-243): [Severe] Invalid RRFA EAI/EOI value.


EXPLANATION:
The value returned from the EAI/EOI request was not a valid value.
USER RESPONSE:
Review the values from the analyze_random_resistance experiment for this part.

ERROR (TBX-244): Unable to get RRFA EAI/EOI data.


EXPLANATION:
The attempt to get RRFA data failed.
USER RESPONSE:
Review the creation of the analyze_random_resistance experiment for this part.

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WARNING (TBX-245): [Severe] Input pin position pin position is invalid for flat node
flat node.
EXPLANATION:
The requested pin position is larger than the number of input pins for the node.
USER RESPONSE:
Review the number of inputs for the node.

ERROR (TBX-246): No RRFA EXPERIMENT specified.


EXPLANATION:
An experiment containing random resistant data was not specified.
USER RESPONSE:
Specify the experiment or run analyze_random_resistance to create an
EXPERIMENT for this application.

ERROR (TBX-247): Callout Index callout index is invalid.


EXPLANATION:
The callout index specified by the callout index argument is out of range for valid
callout data indices.
USER RESPONSE:
Verify the value for callout index is correct and within the range of valid callout indexes
(from 1 to numCallouts).

WARNING (TBX-248): [Severe] Callout sort failed.


EXPLANATION:
An error occurred while trying to sort the callout data.
USER RESPONSE:
Check for other errors such as the callout was not open.

WARNING (TBX-249): [Severe] Tester/Simulation Passed/Failed data only available for


callouts from the logic monitor.
EXPLANATION:
One of the following methods:

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TBX::tfsfFromCalloutIndex
TBX::tfspFromCalloutIndex
TBX::tpsfFromCalloutIndex
was invoked on a callout that was not created using the logic monitor.
The tfsf, tfsp, or tpsf data is only valid when the logic monitor was used to create the
callout. A value of 0 will be returned.
USER RESPONSE:
Verify the correct monitor was used to create the callout using the
TBX::calloutMonitor method before invoking the methods listed in the
EXPLANATION section.

WARNING (TBX-250): [Severe] True/False Passed/Failed data only available for callouts
from the invariant analysis monitor.
EXPLANATION:
One of the followingmethods:
TBX::tfFromCalloutIndex
TBX::tpFromCalloutIndex
TBX::ffFromCalloutIndex
TBX::fpFromCalloutIndex
was invoked on a callout that was not created using the invariant analysis monitor.
The tf, tp, ff, or fp data is only valid when the invariant analysis monitor was used to create
the callout. A value of 0 will be returned.
USER RESPONSE:
Verify the correct monitor was used to create the callout using the
TBX::calloutMonitor method before invoking the methods listed in the
EXPLANATION section.

ERROR (TBX-251): [Internal] Callout Index callout_index does not point to valid
callout data.
EXPLANATION:
The callout index is a valid number, but there is no data related to the callout associated
with the referenced index.

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USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TBX-252): Argument to TBX::selectFilteredFails was argument but


should be a 0 or 1.
EXPLANATION:
The TBX::selectFilteredFails method takes an argument of 0 to use unfiltered
failures, and 1 to use the subset of failures when creating the callout data. No other
arguments are valid for this method.
USER RESPONSE:
Validate the specification of the arguments to TBX::selectFilteredFails.

ERROR (TBX-253): WorkDir value WORKDIR name is not a valid directory


EXPLANATION:
The argument to TBX::selectWorkDir must be a valid working directory.
USER RESPONSE:
Correct the argument to TBX::selectWorkDir and rerun.

ERROR (TBX-254): WorkDir value WORKDIR name does not point to an Encounter Test
model.
EXPLANATION:
The specified argument to TBX::selectWorkDir should point to an Encounter Test
model.
USER RESPONSE:
Correct the argument to TBX::selectWorkDir and rerun.

ERROR (TBX-255): Search level specification to


TBX::blockAndValueListFromPropertyName,
TBX::pinAndValueListFromPropertyName, or
TBX::netAndValueListFromPropertyName must be primitive, techlib, or top. It
was search level specification.
EXPLANATION:
The second argument to TBX::blockAndValueListFromPropertyName,
TBX::pinAndValueListFromPropertyName, or

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TBX::netAndValueListFromPropertyName must be one of primitive,


techlib, or top. None of these arguments were specified.
USER RESPONSE:
Correct the argument to method and rerun.

WARNING (TBX-256): At least one block_pin_or_net with attribute attribute


name is in cloaked logic.
EXPLANATION:
At least one of the blocks, pins, or nets which should have been included in the
TBX::blockAndValueListFromPropertyName,
TBX::netAndValueListFromPropertyName, or
TBX::pinAndValueListFromPropertyName results was inside cloaked logic; that
is, intellectual property for which details may not be made available.
All cloaked blocks, pins, or nets will not appear in the result that is returned.
USER RESPONSE:
Either obtain an uncloaked version of the model which contains the cloaked attributes, or
work only with uncloaked blocks, pins, or nets.

ERROR (TBX-257): Second argument to TBX::templateDetailsFromSequence was


argument but should be eventType, TBDshort, or TBDlong.
EXPLANATION:
The second argument for TBX::templateDetailsFromSequence specifies the
format of the details. The allowed values are eventType, TBDshort, or TBDlong. If no
second argument is specifed, it defaults to eventType.
USER RESPONSE:
Correct the specification of the arguments to
TBX::templateDetailsFromSequence.

ERROR (TBX-258): An incorrect number of arguments was passed to


TBX::templateDetailsFromSequence. The correct number of arguments is either one
or two.
EXPLANATION:
TBX::templateDetailsFromSequence accepts two arguments, the second of
which can be defaulted.
USER RESPONSE:

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Correct the specification of the arguments to


TBX::templateDetailsFromSequence.

ERROR (TBX-259): Unable to simulate the unrecognized event event.


EXPLANATION:
The specified extension language method is unable to simulate the referenced event
because the event type is not recognized. Cannot simulate the unrecognized event.
USER RESPONSE:
Correct the event type and rerun the application.

WARNING(TBX-260): Node node number is not a valid clock node.


EXPLANATION:
One or more elements of the clock list argument to TBX::traceForwardFromNode or
TBX::traceBackwardFromNode contains a node index which is not a clock. Tracing
will perform as if the nodes which are not clocks were not specified.
USER RESPONSE:
Modify the argument list of TBX::traceForwardFromNode or
TBX::traceBackwardFromNode from its second argument to contain only clock
nodes as inputs.

WARNING(TBX-261): Unable to determine the predominant clock sequence.


EXPLANATION:
There are no sequences found either in the current experiment, or in the committed test
data if no experiment has been selected. The predominant clock sequence is null, and
since a clock list was not specified, an empty clock list will be used for tracing. In this
case, tracing will stop at all memory elements.
USER RESPONSE:
If the default of the predominant clock sequence should be used to determine the clock
list, select a combination of testmode and/or experiment for which valid patterns exist.

WARNING(TBX-262): Unable to determine the clocks for the sequence sequence


odometer.
EXPLANATION:
No clocks were found for the referenced sequences. Tracing will stop at all memory
elements.

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USER RESPONSE:
No response is required.

WARNING (TBX-263): [Severe] The value of the addOrReplace addOrReplace value is


not recognized.
EXPLANATION:
The optional third parameter to the TBX::selectGraphicsAddress method must
have one of the valid values, add or replace. The specified value does not match with
any of these entries. The default value replace will be used.
USER RESPONSE:
Change the value of the third parameter of TBX::selectGraphicsAddress method
to any of the mentioned valid values or null and then rerun.

WARNING (TBX-264): [Severe] The value of the autoRefresh autoRefresh value is


not recognized.
EXPLANATION:
The optional fourth parameter to the TBX::selectGraphicsAddress method must
have one of the valid values: yes or no. The specified value does not match with any of
these entries. The default action "yes" will be used.
USER RESPONSE:
Change the value of the fourth parameter of TBX::selectGraphicsAddress method
to any of the mentioned valid values or null and then rerun.

WARNING (TBX-265): [Severe] Unable to launch the physical design viewer with
parameters oa path: oa_path library: library cell: cell view: view.
EXPLANATION:
Tried to load the physical design sofware with the parameters specified, but physical
design data was not available.
USER RESPONSE:
Run TBX::selectCircaParms with parameters that point to a valid open access
database and rerun.

ERROR (TBX-266): There are no conflicts and hence, there is no first conflicting event
EXPLANATION:

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The TBX::firstConflictingEventFromCalloutIndex method was invoked with


a callout index argument that points to a fault callout which has no conflicts. Every failure
was predicted by this fault, and there are no failures predicted by this fault that were not
measured.
USER RESPONSE:
No response required. A null event string is returned by the method.

INFO(TBX-401): Status - status


EXPLANATION:
This message conveys the latest status information available.
USER RESPONSE:
No response required.

ERROR(TBX-402): Unable to open the journal control file journal_control_file.


The journal will not be updated.
EXPLANATION:
The journal control file specified by the journalcontrolfile keyword could not be
opened for reading.
USER RESPONSE:
Make sure that the journalcontrolfile keyword specifies a file with at least read
access, and rerun the command.

WARNING(TBX-403): Line journal_control_file_line_number in journal


control file journal_control_file is not recognized and will be ignored. Ignored text:
ignored_text
EXPLANATION:
The application could not recognize the indicated line as a valid journal control file
keyword/value pair or as a comment. Therefore, this line will be ignored.
USER RESPONSE:
Modify the journal control file to resolve the identified problem either by making the
indicated line a valid keyword/value pair, or by making it a comment. Then rerun the
update_diagnostic_journal command, if necessary.

ERROR(TBX-404): Journal directory journal_directory does not exist, and could not
be created. No further journal updates will be performed.

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EXPLANATION:
The journal directory specified by the journaldirectory keyword in the journal
control file or one of its subdirectories did not previously exist, and could not be created.
USER RESPONSE:
Change the value of the journaldirectory keyword in the journal control file to point
to either an existing directory or a directory whose parent directory exists and you have
the authority to create a subdirectory in the parent directory, and then rerun.

INFO(TBX-405): Created journal directory journal_directory


EXPLANATION:
The diagnostic journal directory or one of its subdirectories did not previously exist, and
was created successfully.
USER RESPONSE:
No response is required.

ERROR(TBX-406): File file_name exists but could not be opened for


read_or_write. No further journal updates will be performed.
EXPLANATION:
While updating a diagnostic journal, the application could not open the indicated file for
the specified purpose.
USER RESPONSE:
Ensure the specified file has the required access and rerun.

ERROR(TBX-407): Report report_name has an unrecognized report style of


report_style. The journal has not been updated.
EXPLANATION:
The indicated report does not have any of the recognized report style values of pareto,
trend, or wafermap in the journal control file.
USER RESPONSE:
Correct the report specification in the journal control file and rerun.

WARNING(TBX-408): Report report_name specified a field field that is not in the


diagnostic database at the current level (part, lot, or wafer) or below. The journal has not been
updated.

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EXPLANATION:
The report identified by the report name has a field specification, the value of which does
not match a field name in the diagnostic database either at the current level (part, lot or
wafer) for which the report is being generated, or any lower level in the hierarchy.
USER RESPONSE:
Correct the report specification in the journal control file and rerun.

WARNING(TBX-409): The categorization function file


categorization_function_file specified in the journal control file does not exist or
could not be read. No custom categorization functions are available.
EXPLANATION:
The journal control file contained a categorizationfunction keyword, but the value
of that keyword pointed to a file that does not exist or could not be read. No custom
categorization functions will be available.
USER RESPONSE:
Correct the categorizationfunction keyword in the journal control file or rectify the
permissions for the categorization function file and rerun.

WARNING(TBX-410): The categorization function file


categorization_function_file specified in the journal control file could not be
evaluated. Perl reports the following problem: perl error. No custom categorization
functions are available.
EXPLANATION:
The journal control file contained a categorizationfunction keyword but Perl
encountered an error while evaluating the file pointed to by that keyword. No custom
categorization functions will be available.
USER RESPONSE:
Correct errors in the categorization function file and rerun.

ERROR(TBX-411): Unable to connect to the diagnostic database. Error message from the
connect is: database_error. The journal has not been updated.
EXPLANATION:
The command was unable to establish contact with the diagnostic database associated
with this part, and therefore was unable to continue.

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USER RESPONSE:
Ensure that the part is connected to a diagnostic database. If the part is connected, make
sure the database server is running. Otherwise, fix the problem, and rerun the command.

ERROR(TBX-412): Unable to create the .in_process sub-directory of the failure data


directory faildatadirectory. Processing ends.
EXPLANATION:
The indicated sub-directory could not be created in the specified failure data directory.
Hence processing ends.
USER RESPONSE:
Ensure the failure data directory specified in the volume control file exists, the write
permissions are set, and then rerun.

INFO(TBX-413): diagnose_volume_failures complete. Final summary report:


EXPLANATION:
The diagnose_volume_failures command completed processing and is issuing its
final summary report.
USER RESPONSE:
No response required.

INFO(TBX-414): The highest return code for diagnose_volume_failures is


highest_return_code.
EXPLANATION:
This message indicates the completion of the diagnose_volume_failures
command processing.
USER RESPONSE:
No response required.

ERROR(TBX-415): Unable to open the volume control file volume_control_file.


Processing ends.
EXPLANATION:
The application could not open the volume control file specified by the
volumecontrolfile keyword for reading. Hence processing ends.
USER RESPONSE:

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Ensure the volumecontrolfile keyword specifies a readable file and rerun.

WARNING(TBX-416): Unable to action the include file include_file specified in


volume control file volume_control_file on line line_number. Processing ends.
EXPLANATION:
The indicated action could not be performed on the include file specified in volume
control file. Hence processing ends.
USER RESPONSE:
Ensure the specified include file exists and is readable, then rerun.

WARNING(TBX-418): The sub-command_name sub command in the volume control file


is specified with the keyword keyword. This keyword specification is ignored.
EXPLANATION:
The diagnose_volume_failures command ignores the keyword option specified in
the sub-command_options keyword in the volume control file. The
diagnose_volume_failures command generates the correct value for this keyword
automatically. All other keywords and values specified in the sub-command_options
keyword are respected.
USER RESPONSE:
No response is required. To avoid this message, remove the keyword in the sub-
command_options specification of the volume control file.

WARNING(TBX-419): Keyword keyword is specified with an invalid value of bad_value


in the volume control file volume_control_file line
volume_control_file_line_number. This keyword value will be set to a default
value of default_value.
EXPLANATION:
The diagnose_volume_failures command detected an unsupported value for the
indicated keyword in the volume control file. Processing continues with the default value
for the keyword.
USER RESPONSE:
No response is required if the default value is acceptable. To avoid this value in future
runs, modify the volume control file by removing the offending keyword or specifying a
valid value. If the default is not acceptable, modify the volume control file specifying a
valid keyword value and then rerun.

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ERROR(TBX-420): Unable to create the sub-directory sub-directory of the failure data


directory failure_data_directory. Processing ends.
EXPLANATION:
The application could not create the indicated subdirectory in the specified failure data
directory, hence processing ends.
USER RESPONSE:
Ensure the failure data directory specified in the volume control file exists, that write
permissions are set, and then rerun.

WARNING(TBX-421): Unable to find the failing die lot and wafer information in the
failure_data_file file.
EXPLANATION:
The diagnose_volume_failures command failed to find the lot, wafer, wafer x, and
wafer y information in the failure data file. The lot name will default to a unique FAILSET
name. However, the read_failures command will not be able to update the
diagnostics database with the failures in this file.
USER RESPONSE:
Modify the failure data file as needed and then rerun.

ERROR(TBX-422): Unable to create or write to sub-command log directory


logdirectory. Processing ends.
EXPLANATION:
The indicated sub-command log directory is not created or the directory is not writable,
hence processing ends.
USER RESPONSE:
Ensure the sub-command log directory can be created and the write permissions are set
and then rerun.

WARNING(TBX-423): Unable to create the category defined by report report_name. No


graphs or reports generated for report_title.
EXPLANATION:
The named report requires the creation of a category pareto from the diagnostic
database, but the category could not be created. No graph or report will be created or
updated in the diagnostic journal for this report.

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USER RESPONSE:
Determine why the category could not be created. Either update the journal control file
parameters so that a report can be created, or remove this report from the diagnostic
journal.

WARNING(TBX-424): Unable to create the trend defined by report report_name because


the secondary category on secondary_category_field has only one bin. No graphs
or reports generated for report_title.
EXPLANATION:
The named report requires the creation of a trend from the diagnostic database, but the
trend could not be created because the secondary category contains only a single bin.
No graph or report will be created or updated in the diagnostic journal for this report.
USER RESPONSE:
Determine why the secondary category has only a single bin. Either update the journal
control file parameters so that a report can be created, or remove this report from the
diagnostic journal.

ERROR(TBX-425): Failset: failset_name already exists. Processing ends.


EXPLANATION:
The failset name generated by the diagnose_volume_failures command already
exists in the Encounter Test data. The failset name is derived from the FAILSET keyword
in the volume control file. The FAILSET value must be specified in such a way that a
unique failset name can be generated.
Duplicate failset names can cause incorrect results, especially when multiple
diagnose_volume_failures commands are running simultaneously. Therefore,
diagnose_volume_failures terminates when it encounters duplicate failset names.
USER RESPONSE:
Modify the value of the FAILSET keyword in the volume control file to ensure that a
unique FAILSET name will be generated, and rerun.

ERROR(TBX-426): Unable to connect to the diagnostic database. Error message from the
connect is: database_error. Processing ends.
EXPLANATION:
The diagnose_volume_failures command was unable to establish a connection
with the diagnostic database server associated with this design, and therefore was
unable to continue.

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USER RESPONSE:
Ensure that the design is connected to a diagnostic database by using the User Interface
Setup icon, and then choosing Diagnostic Database. If values are specified, the
design is connected to a server. If the design is connected, ensure the database server
is running. Fix the problem and rerun the command.

WARNING (TBX-427): Unable to access the physical design. Volume analysis on physical
design attributes is not possible.
EXPLANATION:
A volume analysis report which requires physical design information, such as Pareto by
layer, was requested, but the physical design was not accessible. All requests for
physical design attributes will be resolved as "UNCLASSIFIED".
USER RESPONSE:
Start the Encounter Test User interface, and verify correct settings are specified via
Setup-Paths-Physical Design and Setup-Options-Physical Design. When these
are correct, try to start View Physical Design. If any errors occur, additional messages
should appear. Resolve all encountered errors and rerun the command.

INFO (TBX-428): convert_diagdb_to_postgres completed the execution of


internal_step.
EXPLANATION:
This message indicates the completion of a internal step in the
convert_diagdb_to_postgres command.
USER RESPONSE:
No response required.

INFO (TBX-429): The highest return code for convert_diagdb_to_postgres is


highest_return_code.
EXPLANATION:
This message indicates the completion of the convert_diagdb_to_postgres
command.
USER RESPONSE:
No response required.

ERROR (TBX-430): Program failed to do mysqldump. Run terminates.

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EXPLANATION:
Program failed to execute mysqldump. The following are possible reasons for the failure:
The MySQL server may not be running.
The design may not be connected to the MySQL server.
Insufficient space in the current directory. Available space should be at least
double the size of the MySQL database directory size.
USER RESPONSE:
Check the stated conditions in the explanation of this message. Correct any problems or
any issues from preceding messages and then rerun.

ERROR (TBX-431): database_error Processing ends.


EXPLANATION:
The message text contains the explanation.
USER RESPONSE:
The message text contains the response. Correct any problems and rerun.

INFO (TBX-432): info_message


EXPLANATION:
The message text contains the explanation.
USER RESPONSE:
No response required.

WARNING (TBX-433): Unable to find the normalization file file_name. Normalized


pareto will not be created for report.
EXPLANATION:
The specified normalization file could not be found. This could happen due to incorrect
value specified to normalize keyword or the normalization file is not generated prior to
the invocation of update_diagnostic_journal command. When the normalization
file is not found, the program creates a pareto without normalization.
UNCLASSIFIED.
USER RESPONSE:

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If you wish to generate normalized paretos, run report_physical_correlation if


the report is related to a physical attribute or run volume analysis to generate the
normalization file and then rerun.

INFO (TBX-434): diagnose_failures subcommand summary report:


EXPLANATION:
diagnose_failures completed processing and is issuing its subcommand summary
report.
USER RESPONSE:
No response required.

INFO (TBX-435): The highest return code of diagnose_failures is


highest_return_code.
EXPLANATION:
This message indicates the completion of reported command.
USER RESPONSE:
No response required.

INFO (TBX-436): Failures specified in importfile_name are imported into Encounter


Test with the FAILSET name failset_name.return_status log_name
EXPLANATION:
This message indicates the completion of importing the fail data in to Encounter Test.
The imported fail data will be stored with a FAILSET name specified in the message.
USER RESPONSE:
If there are any warnings, severe warnings, or errors reported, check the latest log file
(log_read_failures_*) generated at the location specified using the
SUBCOMMAND_LOGS keyword in the precision controlfile. Otherwise, no response is
required

INFO (TBX-437): Scan chain defect is present in device(s)


list_of_scanfail_devices.
EXPLANATION:
The reported device(s) failed the scan chain test. Scan Chain diagnostics will be
performed on the reported device(s).

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USER RESPONSE:
No response required.

INFO (TBX-438): Performed scan diagnostics on device device_name for FAILSET


failset_name.return_status Defect locations will be printed at the end. log_name
EXPLANATION:
This message indicates the completion of scan chain diagnostics on the specified
device. The identified defective flip-flop locations and their corresponding score will be
printed at the end of the run.
USER RESPONSE:
If there are any warnings, severe warnings, or errors reported, check the latest log file
(log_diagnose_failset_scanchain_*) generated at the location specified using
the SUBCOMMAND_LOGS keyword in the precision controlfile. Otherwise, no response is
required

INFO (TBX-439): Logic defect(s) are present in device(s) list_of_devices.


EXPLANATION:
The reported device(s) passed the scan chain test. Logic diagnostics will be performed
on the reported device(s).
USER RESPONSE:
No response required.

INFO (TBX-440): Performed multiple defect analysis and identified


number_of_independent_defects independent defects.return_status The fail
data for these defects is separated and stored in FAILSET failset_name. log_name
EXPLANATION:
This message indicates the completion of multiple defect analysis. This analysis consists
of identifying the presence of defects that are independent of each other. This analysis
helps in getting good accuracy of diagnostics results.
USER RESPONSE:
If there are any warnings, severe warnings, or errors reported, check the latest log file
(log_prepare_failset_partition_*) generated at the location specified using the
SUBCOMMAND_LOGS keyword in the precision controlfile. Otherwise, no response is
required

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INFO (TBX-441): Performed logic diagnostics on device device_name on FAILSET


failset_name.(always_diagnose_full_device is set to yes).return_status Defect
locations will be printed at the end. log_name
EXPLANATION:
This message indicates the completion of logic diagnostics on the specified FAILSET
and device. The identified logic defect locations will be printed at the end.
USER RESPONSE:
If there are any warnings, severe warnings, or errors reported, check the latest log file
(log_diagnose_failset_logic_*) generated at the location specified using the
SUBCOMMAND_LOGS keyword in the precision controlfile. Otherwise, no response is
required.

INFO (TBX-442): Performed logic diagnostics on device


device_name.return_status Defect locations will be printed at the end. log_name
EXPLANATION:
This message indicates the completion of logic diagnostics on the specified FAILSET
and device. The identified logic defect locations will be printed at the end.
USER RESPONSE:
No response required.

INFO (TBX-443): Deleted FAILSET failset_name.


EXPLANATION:
This message indicates the completion of the FAILSET deletion.
USER RESPONSE:
No response required.

WARNING (TBX-444): The precisioncontrolfile keyword is not specified. Default


values present in the control file <ET Install Directory>/tools/tb/defaults/
samples/example.pcf located in Encounter Test installation will be used.
EXPLANATION:
The precisioncontrolfile keyword identifies the file that controls the precision diagnostics
flow and reporting options. A documented sample precision control file is located in the
Encounter Test installation at: <ET Install Directory>/tools/tb/defaults/
samples/example.pcf.

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In this case, the precisioncontrolfile keyword is left unspecified and hence the program
uses the default options for the precision diagnostics flow. For more information about
the default options, refer to the above example.pcf.
USER RESPONSE:
Use default options for best diagnostic results. To create your own precision control file
with different flow or reporting options, copy the file specified above, make necessary
changes and rerun with this new precision control file name specified to
precisioncontrolfile keyword.

INFO (TBX-445): Performed multiple defect analysis and identified single


defect.return_status
EXPLANATION:
This message indicates the completion of multiple defect analysis. This analysis consists
of identifying the presence of defects that are independent of each other. This analysis
helps in getting good accuracy of diagnostics results. In this case, single defect is
identified.
USER RESPONSE:
If there are any warnings, severe warnings, or errors reported, check the latest log file
(log_prepare_failset_partition_*) created at the location specified using the
SUBCOMMAND_LOGS keyword in the precision controlfile. Otherwise, no response is
required.

ERROR (TBX-446): The specified failset already exists and replace=no is specified.
Processing ends.
EXPLANATION:
None.
USER RESPONSE:
Rerun the program with replace=yes or specify a new name to FAILSET keyword.

ERROR (TBX-447): Unable to open the precision control file


precision_control_file. Processing ends.
EXPLANATION:
The precision control file specified by the precisioncontrolfile keyword could not
be opened for read. Hence processing ends.
USER RESPONSE:

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Ensure the precisioncontrolfile keyword specifies a readable file and rerun.

INFO (TBX-448): The output of diagnose_failures is stored in the following log file:
logfile_name
EXPLANATION:
None.
USER RESPONSE:
None.

ERROR (TBX-449): Unable to action the include file include_file specified in


precision control file precision_control_file on line line_number, Processing
ends.
EXPLANATION:
The indicated action could not be performed on the include file specified in precision
control file. Hence processing ends.
USER RESPONSE:
Ensure the specified include file exists and is readable, then rerun.

INFO (TBX-450): Encounter Test Diagnostics Report:


EXPLANATION:
This message indicates the completion of precision diagnostics on the failures specified
in the importfile. This message contains the high level summary of the number of failures
processed, kind of diagnostics performed and the results of diagnostics.
USER RESPONSE:
This report contains the fault candidates identified from the diagnostics of failures
specified in the importfile.

WARNING (TBX-451): Line precision_control_file_line_number in precision


control file precision_control_file is not recognized and will be ignored. Ignored
text: ignored_text
EXPLANATION:
The indicated line was not recognized as a valid precision control file keyword/value pair,
or as a comment. The line is ignored.
USER RESPONSE:

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Modify the precision control file to resolve the identified problem either by making it a
valid keyword/value pair, or by making the line a comment. Then rerun
diagnose_failures if necessary.

WARNING (TBX-452): The sub-command_name sub-command in the precision control


file is specified with the keyword keyword. This keyword specification is ignored.
EXPLANATION:
The keyword option specified in the <sub-command>_options keyword in the
precision control file is ignored. The diagnose_failures command generates the correct
value for this keyword automatically. All other keywords and values specified in the
<sub-command>_options keyword are respected.
USER RESPONSE:
No response is required. To avoid this message, remove the keyword in the <sub-
command>_options specification of the precision control file.

WARNING (TBX-453): Keyword keyword is specified with an invalid value of bad_value


in precision control file precision_control_file line
precision_control_file_line_number. This keyword value will be set to a
default value of default_value.
EXPLANATION:
The diagnose_failures command detected an unsupported value for the indicated
keyword in the precision control file. Processing continues with the default value for the
keyword.
USER RESPONSE:
No response is required if the default value is acceptable. This message can be avoided
in future runs by modifying the precision control file by removing the offending keyword
or specifying a valid value. If the default is not acceptable, modify the precision control
file specifying a valid keyword value and then rerun.

WARNING (TBX-454): [Severe] The field field is not present in diagnostic database.
EXPLANATION:
The specified field does not exist in the database and hence the condition specified by
the user will be ignored.
USER RESPONSE:
The message will be succeeded by another message that reports the condition name
and title that has the specified field. Take corrective action and rerun.

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WARNING (TBX-455): [Severe] The sub-condition statement sub-condition with in


the condition condition is not as per the required syntax.
EXPLANATION:
The specified sub-condition is not as per the required syntax. The required syntax is
(database_field_name operator "value").
USER RESPONSE:
Correct the specified sub-condition according to the required syntax and rerun.

WARNING (TBX-456): [Severe] The title statement condition is not as per the
required syntax and is ignored.
EXPLANATION:
The specified selection statement is not as per the required syntax and hence it is
ignored. The syntax for writing a selection statement is:
<selection_level>:Condition=<condition_string> Title="<title_name>"
Reports=<report1> <report2> ....

<selection_level> is not of PartSelection or LotSelection or


WaferSelection
<condition_string> syntax is nested AND or OR combition of a sub-condition with
syantax (database_field_name operator "value")
title_name is a unique string that identifies the condition in the journal. If 2 selection
statements with same title are specified, the second statement overwrite the first
statement. <report1> is the title name of the reports to be generated based on the
specified condition.
USER RESPONSE:
Take corrective action and rerun.

WARNING (TBX-457): [Severe] The selection statement with title title and condition
condition is not as per the required syntax and is ignored.
EXPLANATION:
The specified condition is not as per the required syntax and hence it is ignored.
USER RESPONSE:
The message will be preceeded by another message that reports the cause for this
problem. The message text contains the response.

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msgseverity(TBX-458): Failure Import Summary for failurefile:


summaryreport End of Failure Import Summary
EXPLANATION:
diagnose_failures executed the read_failures sub-command and printed the
summary report. The number of failures successfully read should always be equal to the
total number of failures specified in the importfile. If the number does not match, some
of the tester failures are not properly imported into Encounter Diagnostics. A 'failed'
failure indicates that the value specified for this failure in the importfile matches the good
machine value present in the test sequences. An ignored failure indicates the presence
of 'Z' value as the tester value. Running diagnostics on this FAILSET will cause incorrect
results to be generated since the failed/ignored failures are not considered by the
diagnostics tool.
USER RESPONSE:
Analyze the failures mentioned in failed/ignored rows and rerun with modified failure data
for accurate diagnostics results.

ERROR (TBX-459): Failures specified in importfile_name could not be imported into


Encounter Test.return_code log_name.
EXPLANATION:
The failures specified in the import file could not be imported in to Encounter Test. Check
the specified logfile and understand the root cause of the problem. If the value of the
$parms{stop_on} specified in the precision control file is Error, then program will
terminate and if the value of $parms{stop_on} is never then program will continue till
the end of the command and sub command(s).
USER RESPONSE:
Take corrective action after going through the errors reported in the specified logfile and
rerun.

ERROR (TBX-460): Failed to perform scan diagnostics on device


device_name.return_code log_name.
EXPLANATION:
Scan chain diagnostics on the specified device could not be performed. Check the
specified logfile and understand the root cause of the problem. If the value of the
$parms{stop_on} specified in the precision control file is Error, then program will
terminate and if the value of $parms{stop_on} is never then program will continue till
the end of the command and sub command(s).
USER RESPONSE:

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Take corrective action after going through the errors reported in the specified logfile and
rerun.

ERROR (TBX-461): Failed to perform multiple defect analysis.return_code


log_name.
EXPLANATION:
Failed to complete the multiple defect analysis on independent defects. Check the
specified logfile and understand the root cause of the problem. If the value of the
$parms{stop_on} specified in the precision control file is Error, then program will
terminate and if the value of $parms{stop_on} is never then program will continue till
the end of the command and sub command(s).
USER RESPONSE:
Take corrective action after going through the errors reported in the specified logfile and
rerun.

ERROR (TBX-462): Failed to perform logic diagnostics for device device_name.


(always_diagnose_full_device is set to yes).return_code log_name
EXPLANATION:
Failed to complete the logic diagnostics on the specified device. Check the specified
logfile and understand the root cause of the problem. If the value of the
$parms{stop_on} specified in the precision control file is Error, then program will
terminate and if the value of $parms{stop_on} is never then program will continue till
the end of the command and sub command(s).
USER RESPONSE:
Take corrective action after going through the errors reported in the specified logfile and
rerun.

ERROR (TBX-463): Failed to perform logic diagnostics on device


device_name'.return_code log_name.
EXPLANATION:
Failed to complete the logic diagnostics on the specified device. Check the specified
logfile and understand the root cause of the problem. If the value of the
$parms{stop_on} specified in the precision control file is Error, then program will
terminate and if the value of $parms{stop_on} is never then program will continue till
the end of the command and sub command(s).
USER RESPONSE:

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Take corrective action after going through the errors reported in the specified logfile and
rerun.

ERROR (TBX-464): Volume Diagnostic Database server is not running. Processing ends.
EXPLANATION :
To perform volume diagnostics using diagnose_volume_failures, two pre-requisite
steps need to be performed. A volume diagnostic database server needs to be started
using the start_diagdb_server command. Once this is successful, the server needs
to be connected to the part using the setup_diagdb_control command.
diagnose_volume_failures makes a check to insure the presence of diagnostic
database server and its connection to the part directory before running diagnostics jobs
on the failure data files. In this case, this checking has failed and hence the program
could not proceed further.
USER RESPONSE:
Make sure the diagnostic database server is running and is connected to the part and
rerun.

ERROR (TBX-466): Unable to load OPCG statistics.


EXPLANATION:
Unable to load OPCG statistics. Check the design to see for OPCG statistics
USER RESPONSE:
Check to see OPCG in the design and rerun.

ERROR (TBX-467): Invalid Scan Pipe Register Entry.


EXPLANATION:
The scan pipe register entry is invalid and it should be less than or equal to the total
number of pipelines within the design.
USER RESPONSE:
Rerun using valid entry.

WARNING (TBX-468): The volumecontrolfile keyword is not specified. Default values


present in the control file: <ET Install Directory>/tools/tb/defaults/
samples/example.vcf located in Encounter Test installation will be used.
EXPLANATION:

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The volumecontrolfile keyword identifies the file that controls the volume diagnostics flow
and reporting options. A sample fully documented file is located in the Encounter Test
installation at: <ET Install Directory>/tools/tb/defaults/samples/
example.vcf. In this case, the volumecontrolfile keyword is left unspecified and hence
the program uses the default options for the volume diagnostics flow. For more
information about the default options, refer to the above example.vcf.
USER RESPONSE:
The default options are recommended for best diagnostic results. However, if you wish
to create your own volume control file with different flow or reporting options, copy the file
specified above, make necessary changes and rerun with this new volume control file
name specified to volumecontrolfile keyword.

INFO (TBX-469):Initial Summary


EXPLANATION:
Informational message indicating the initial status of all the failing files in fail data.
directory
USER RESPONSE:
No response required.

INFO (TBX-470): Interim report


EXPLANATION:
Informational message indicating the number of fail data files that have been processed
till that point.
USER RESPONSE:
No response required.

INFO (TBX-471): The status of current individual diagnostic run.


EXPLANATION:
Informational message indicating which fail data file from the fail data directory is
currently being processed and the position of their respective logs.
USER RESPONSE:
No response required.

WARNING (TBX-473): [Severe] Node node is neither a primary input nor a primary
output.

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EXPLANATION:
The node specified as an argument does not correlate to a primary input or output pin.
An invalid value will be returned.
USER RESPONSE:
Check to see if the node is correct.

WARNING (TBX-474): [Severe] Fault id faultID is not a representative fault index.


EXPLANATION:
The fault id specified as an argument does not correlate to a representative fault index.
An invalid value will be returned.
USER RESPONSE:
Check to see if the fault id is correct.

WARNING (TBX-475): [Severe] Fault id faultID does not have any reduced fault
associated with it.
EXPLANATION:
The fault id specified as an argument does not have any reduced fault associated with it.
An invalid value will be returned.
USER RESPONSE:
No response required.

WARNING (TBX-476): [Severe] Fault id fault_ID does not have any equivalent faults
associated with it.
EXPLANATION:
The fault id specified as an argument does not have any equivalent faults associated with
it. An invalid value will be returned.
USER RESPONSE:
No response required.

ERROR (TBX-477): Unable to create or write to diagnose_failures log directory


logdirectory. Processing ends.
EXPLANATION:

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The indicated diagnose_failures log directory is not created or the directory is not
writable hence processing ends.
USER RESPONSE:
Ensure the specified diagnose_failures log directory can be created and the write
permissions are set and then rerun.

INFO (TBX-480): The output of diagnose_volume_failures is stored in the following


log file:logfile_name
EXPLANATION:
The log file name mentioned in the message, contains the output of
diagnose_volume_failures command.
USER RESPONSE:
No response required.

INFO (TBX-481): The function will not work correctly , execute


TBX::createNewEditableExperiment().
EXPLANATION:
The function requires an editable experiment to work properly, execute
TBX::createNewEditableExperiment() before using this function command.
USER RESPONSE:
Execute TBX::createNewEditableExperiment() to ensure the function works
properly.

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11
TCC - Random Pattern Generation
Messages

TCC-001 through TCC-116 on page 307

TCC-001 through TCC-116


INFO (TCC-001): Start of type design compilation for simulation.
EXPLANATION:
The simulator is creating the compiled code file. The compile step may take several
minutes, depending on design size and complexity.
USER RESPONSE:
No response required.

INFO (TCC-002): Design compilation is complete.


EXPLANATION:
Creation of the compiled code file is complete.
USER RESPONSE:
No response required.

INFO (TCC-003): Simulation has detected the presence of more than 5 trailing edges clock
choppers chained together. These topologies cannot be simulated with either the compiled
code or interpretive option. The design will be compiled for event driven.
EXPLANATION:
The event driven method is being used per the preceding message text.
USER RESPONSE:

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No response required

WARNING (TCC-020): [Severe] Cannot set the test mode.


EXPLANATION:
The mode data is not accessible.
USER RESPONSE:
Ensure the mode name is valid, or rebuild the mode. If this does not fix the problem,
contact customer support (see Contacting Customer Service on page 23).

WARNING (TCC-034): [Severe] Cannot get storage in file:line (time date).


EXPLANATION:
There is insufficient storage to handle a get storage request.
USER RESPONSE:
Check for possible storage problems and rerun.

WARNING (TCC-035): [Severe] Cannot get storage for an internal table (name size=num
bytes).
EXPLANATION:
There is insufficient storage to handle a get storage request.
USER RESPONSE:
Check for possible storage problems and rerun.

WARNING (TCC-050): [Severe] Unsupported node/SimFunction (nodeid/func)


encountered during compile of a fanout free tree.
EXPLANATION:
Unsupported design logic was encountered preventing the creation of the compiled code
file. Processing terminates.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCC-083): Error with TSD fault effect detected in TCCfcomp. Processing ends.
EXPLANATION:

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An error condition was encountered during processing of a TSD which prevents


processing from continuing. This indicates a problem with the fault model for the mode
being processed.
USER RESPONSE:
If possible, rebuild the fault model for the mode and rerun. If the message still appears,
contact customer support (see Contacting Customer Service on page 23).

ERROR (TCC-084): A discrepancy exists between the number of faults expected to be


processed and the actual number of faults being processed. Attempted to load number
type faults when only number were expected.
EXPLANATION:
The fault model indicates there are n faults to process, but during processing, fault n+1
has just been encountered.
USER RESPONSE:
If possible, rebuild the fault model for the mode and rerun. If the message still appears,
contact customer support (see Contacting Customer Service on page 23).

ERROR (TCC-090): Run terminating due to error in TCCfl1l2.


EXPLANATION:
This indicates an internal program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCC-100): [Severe] TCCregInit linkage type not recognized.


EXPLANATION:
This indicates an internal program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCC-101): [Severe] Compiler has run out of assignable registers.


EXPLANATION:
This indicates an internal program error.
USER RESPONSE:

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TCC - Random Pattern Generation Messages

Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCC-110): [Severe] Compiled code file is not Readable.


EXPLANATION:
This indicates an internal program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCC-111): [Severe] Compiled code file is not Writeable.


EXPLANATION:
This indicates an internal program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCC-112): [Severe] Cannot delete the existing compiled code file.
EXPLANATION:
This indicates an internal program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCC-113): [Severe] Cannot open the compiled code file.


EXPLANATION:
This indicates an internal program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCC-114): [Severe] Error from EDAMfcls(fcb,keep) rc=retc


EXPLANATION:
This indicates an internal program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

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WARNING (TCC-115): [Severe] Error from EDAMsopn(fcb,sanum)


EXPLANATION:
This indicates an internal program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCC-116): [Severe] Error from EDAMsput(fcb,addr,offset,size)


rc=retc
EXPLANATION:
This indicates an internal program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

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12
TCE- Domain Constraint Messages

TCE-400 through TCE-450 on page 313

TCE-400 through TCE-450


ERROR (TCE-400): Unable to load model or testmode data. command is ending.
EXPLANATION:
The model and testmode data are created by the build_model and build_testmode
commands. Ths command could not load the data. It is either non-existent or the file
permissions do not allow access to the tbdata directory.
USER RESPONSE:
Ensure the file permissions allow access to the tbdata directory and that build_model
and build_testmode have been run.

WARNING (TCE-401): [Severe] When block input and functional clock gates are set for
domain dom1, this domain receives data into state element elem1 from domain dom2 state
element elem2.
EXPLANATION:
When an internal clock domain is programmed to block all inputs from other domains, it
is considered a mistake when data from other domains can in fact be captured into the
domain when the block_inputs and functional clock gate controls are set. The
prepare_domain_constraints command creates constraints that are used by
default during simulation. If they are used, data from other domains will be captured as
an X. If the constraints do not exist or test generation is run with
constraintcheck=no, invalid data may be captured into the domain.
USER RESPONSE:
The domain logic should be fixed to ensure all paths into the domain are correctly
blocked when the block_inputs and functional clock gate controls are set.

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TCE- Domain Constraint Messages

INFO (TCE-403): Clock Domain Identification Completed. numDomains Domains


Identified.
EXPLANATION:
Indicates that the process to identify clock domains has completed.
USER RESPONSE:
No response is required.

INFO (TCE-404): Domain Crossing Identification Started.


EXPLANATION:
Indicates that the process to identify domain crossings has started.
USER RESPONSE:
No response is required.

INFO (TCE-405): Domain Crossing Identification Completed.


EXPLANATION:
Indicates that the process to identify domain crossings has started.
USER RESPONSE:
No response is required.

INFO (TCE-406): Domain Fencing Check Started.


EXPLANATION:
Indicates that the process to check whether domains are properly fenced has started.
USER RESPONSE:
No response is required.

INFO (TCE-407): Domain Fencing Check Completed.


EXPLANATION:
Indicates that the process to check whether domains are properly fenced has completed.
USER RESPONSE:
No response is required.

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TCE- Domain Constraint Messages

WARNING (TCE-408): Invalid Pin Name: pn on line ln, statement sn of file filename.
The statement is skipped.
EXPLANATION:
The specified pin name does not exist in the Encounter Test logic model. The statment
is skipped and is not processed.
USER RESPONSE:
Correct the pin name or remove the statement from the file and rerun
prepare_domain_constraints.

WARNING (TCE-409): Clock Domain Crossing pn1 to pn2 on line ln, statement sn of file
filename is not found. The statement is skipped.
EXPLANATION:
Encounter Test did not find the domain crossing specified. The statement is skipped.
USER RESPONSE:
Correct the pin name(s) of the domain crossing or remove the statement from the file and
rerun prepare_domain_constraints.

WARNING (TCE-410): Syntax error processing line: ln, statement sn of file: fn. Reason:
reason
EXPLANATION:
A syntax error was found in the specified file. The statement is skipped.
USER RESPONSE:
Correct the syntax error and rerun prepare_domain_constraints.

INFO (TCE-411): Write Constraints Started. c constraints identified.


EXPLANATION:
Indicates that the process to write constraints for ATPG has started.
USER RESPONSE:
No response is required.

INFO (TCE-412): Write Constraints Completed.


EXPLANATION:

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TCE- Domain Constraint Messages

Indicates that the process to write constraints for ATPG has completed.
USER RESPONSE:
No response is required.

INFO (TCE-413): Removing Domain Constraints Started.


EXPLANATION:
Indicates that the process to remove domain constraints for ATPG has started.
USER RESPONSE:
No response is required.

INFO (TCE-414): Removing Domain Constraints Completed.


EXPLANATION:
Indicates that the process to remove domain constraints for ATPG has completed.
USER RESPONSE:
No response is required.

INFO (TCE-415): n falsepath constraints have been identified.


EXPLANATION:
Prepare_domain_constraints was run to identify the need for falsepath constraints
during ATPG. For this ATPG / Simulation command, the specified number of constraints
are required to prevent transitions across domains that interact.
USER RESPONSE:
If you do not want the constraints applied, run remove_domain_constraints to
remove the constraint data, or run this command with constraintcheck=no to avoid
checking any ATPG timing constraints.

WARNING (TCE-416): [Severe] When block input and functional clock gates are set for
domain dom1, this domain receives data into state element elem1 from state element
elem2 along the scan path.
EXPLANATION:
During at speed delay test using launch off capture, a transition should not be captured
from the scan path unless the scan path has been timed to operate at speed. When the
block inputs and functional clock gates are set for domain dom1, data is captured along
the scan path. The prepare_domain_constraints command creates constraints

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that are used by default during delay test generation and simulation. If they are used,
transitions along the scan path will be captured as an X. If the constraints have been
removed or delay test generation is run with constraintjustify=no
constraintcheck=no, invalid data may be captured.
USER RESPONSE:
The domain fencing logic should be fixed to ensure all scan paths are correctly blocked
when the block_inputs and functional clock gate controls are set.

INFO (TCE-417): n falsepath setup constraints have been identified.


EXPLANATION:
Prepare_domain_constraints was run to identify the need for setup constraints
along the scan path during ATPG. For this ATPG / Simulation command, the specified
number of constraints are required to prevent transitions along the scan path.
USER RESPONSE:
If you do not want the constraints applied, run remove_domain_constraints to
remove the constraint data, or run this command with constraintcheck=no to avoid
checking any ATPG timing constraints.

WARNING (TCE-418): Unable to determine Block Input register value for domain d.
Skipping fencing check for this domain.
EXPLANATION:
The build_testmode input file contains a definition of the Block Input register along
with valid register values and their meanings. prepare_domain_constraints was
unable to determine which value sets the block input register to the state that causes the
blocking to occur. A register value with the string "block" or "BLOCK" in its name is
assumed to set the register to its blocking state. If no such register value is found, then
the complement of a register value with the string "enable" or "ENABLE" in its name is
used as the blocking value. If a value cannot be determined, the checking is skipped for
this domain.
USER RESPONSE:
ATPG will automatically protect the domain crossing even if the domain fencing was not
checked. However to check the domain fencing, you must first rebuild the testmode with
a register value defined that prepare_domain_constraints can use to determine
the blocking state. Then rerun prepare_domain_constraints.

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INFO (TCE-419): Domain dom1, state element elem1, feeds domain dom2, state element
elem2.
EXPLANATION:
State element elem2 captures data from state element elem1. elem1 is clocked by
dom1. elem2 is clocked by dom2.
USER RESPONSE:
None required. To suppress this message specify reportdomaincrossings=no.

INFO (TCE-420): Write Setup Sequences Started.


EXPLANATION:
Indicates that the process to write setup sequences for domain groups has started.
USER RESPONSE:
No response is required.

INFO (TCE-421): Write Setup Sequences Completed. n Sequences Identified:\n


EXPLANATION:
Indicates that the process to write setup sequences for domain groups has completed.
The n sequences identified are named setup_group_all and setup_group_1
through setup_group_(n-1).
USER RESPONSE:
No response is required.

INFO (TCE-422): setupsequence_list


EXPLANATION:
RESPONSE:
No response required.

WARNING (TCE-423): [Severe] Domain dom1, and domain dom2 appear to share the
same domain root: root. Domain crossing checks may produce invalid results.
EXPLANATION:
Two domains share the same domain root. This is most likely due to the fact that the
twodomains are defined in the test mode definition file using the same PPI as their
domain roots.

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prepare_domain_constraints is unable to accurately identify the latchee/flops


clocked by these domains. As a result, messages produced during domain checking
may be incorrect.
USER RESPONSE:
If the testmode was created using prepare_opcg_testmode, rebuild the testmode
using ppilimit=0 and then rerun prepare_domain_constraints. Otherwise,
revise the test mode definition file to use unique PPIs for each OPCG domain. Then
rebuild the testmode and rerun prepare_domain_constraints.

WARNING (TCE-424): [Severe] n msgnum Messages were suppressed.


EXPLANATION:
The specified number of messages were suppressed via the SUPPRESS_MSG attribute.
Constraints were not generated to protect potentially unsafe domain crossings. This
could result in invalid test data.
USER RESPONSE:
To see the messages that were suppressed, rerun prepare_domain_constraints
suppressmsg=no.

INFO (TCE-425): number design constraints are being applied.


EXPLANATION:
The constraints from a design constraints file are being applied for ATPG and/or
simulation. As clocking requirements change, the constraints may need to be reapplied,
resulting in multiple occurrences of this message throughout a given ATPG or simulation
experiment.
USER RESPONSE:
No response required. If the test coverage is lower than expected, it is possible that the
design is being over constrained. You may need to review the design constraints to
ensure that they are not overconstraining the ATPG process.

INFO (TCE-425): number design constraints are being applied.


EXPLANATION:
The constraints from a design constraints file are being applied for ATPG and/or
simulation. As clocking requirements change, the constraints may need to be reapplied,
resulting in multiple occurrences of this message throughout a given ATPG or simulation
experiment.

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USER RESPONSE:
No response required. If the test coverage is lower than expected, it is possible that the
design is being over constrained. You may need to review the design constraints to
ensure that they are not overconstraining the ATPG process.

INFO (TCE-426): Read fencinglinehold File Started.


EXPLANATION:
The fencinglinehold file is being read to apply lineholds that should be applied when
fencing is being checked.
USER RESPONSE:
No response is required.

INFO (TCE-427): Read fencinglinehold File Complete.


EXPLANATION:
Reading the fencinglinehold file is complete.
USER RESPONSE:
No response is required.

INFO (TCE-428): Read indomainfile Started.


EXPLANATION:
The indomainfile is being read to identify SAFE/UNSAFE domains as specified by the
user.
USER RESPONSE:
No response is required.

INFO (TCE-429): Read indomainfile Complete.


EXPLANATION:
Reading the indomainfile is complete.
USER RESPONSE:
No response is required.

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13
TCI - Structure Analysis Messages

TCI-001 through TCI-002 on page 321

TCI-001 through TCI-002


ERROR (TCI-001): Clock Affiliation must be initialized prior to Block Driven Table (BDT)
initialization.
EXPLANATION:
An internal program error has occurred.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCI-002): Invalid Clock Affiliation handle. Block Driven Table (BDT)

initialization ceases.
EXPLANATION:
Creation of the compiled code file is complete.
USER RESPONSE:
No response required.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

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14
TCL - High Speed Scan Based Simulation
Messages

TCL-001 through TCL-049 on page 323


TCL-052 through TCL-096 on page 330
TCL-150 through TCL-198 on page 339
TCL-200 through TCL-520 on page 352
TCL-622 through TCL-999 on page 363

TCL-001 through TCL-049


IINFO (TCL-001): Simulator initialization completed.
EXPLANATION:
This is an informational message.
USER RESPONSE:
No response required.

WARNING (TCL-002): Cannot allocate simulation handle.


EXPLANATION:
The allocation and initialization of the simulation handle failed. The run cannot continue.
USER RESPONSE:
More storage may be needed. Contact customer support (see Contacting Customer
Service on page 23) if this does not seem reasonable.

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WARNING (TCL-003): Simulator initialization failed. Refer to accompanying messages for


more information and contact customer support (see Contacting Customer Service on
page 23) for more help.
EXPLANATION:
The simulator did not initialize. Refer to accompanying messages for more information.
USER RESPONSE:
Examine accompanying messages and correct the problem.

WARNING (TCL-004): Simulator was not initialized, simulation will not be attempted. Refer
to accompanying messages for more information and contact customer support (see
Contacting Customer Service on page 23) for more help.
EXPLANATION:
An internal program error caused the run to terminate.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-005): type Good Machine 3-State contention on netname (index=


hierIndex) detected at TBD location TBDodometer.
EXPLANATION:
This indicates that conflicting values were driven on the same net. Based on current
options, the test sequence may be written to the Vector output file creating a risk of
burnout at the tester when the generated test data is used. If the sequence is written to
the Vectors it will be audited.
USER RESPONSE:
If desired, correct the design and rerun, or change the options so that sequences causing
such contention are removed.

INFO (TCL-006): type Good Machine 3-State contention on netname (index=


hierIndex) detected at TBD location TBDodometer. The test will be removed.
EXPLANATION:
This indicates an orthogonal condition was encountered that is not allowed to be
included in the Vector output file based on current options. To ensure accurate fault
simulation results the output file should be resimulated. This will happen automatically if
running test generation.

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USER RESPONSE:
If desired, correct the design and rerun.

WARNING (TCL-009): Error from EDAMsopn(fcb,sanum). An error was encountered


while attempting to access data from the compiled code file. Check for additional messages
and contact customer support (see Contacting Customer Service on page 23).
EXPLANATION:
An error was encountered while attempting to access data from the compiled code file.
In some cases the run is terminated.
USER RESPONSE:
Check the additional messages and contact customer support (see Contacting
Customer Service on page 23).

WARNING (TCL-010): Error from EDAMsget(fcb,toptr, offset,size). An error


was encountered while attempting to access data from the compiled code file. Check for
additional messages and contact customer support (see Contacting Customer Service on
page 23).
EXPLANATION:
An error was encountered while attempting to access data from the compiled code file.
In some cases the run is terminated.
USER RESPONSE:
Check for additional messages and contact customer support (see Contacting
Customer Service on page 23).

WARNING (TCL-011): Error from EDAMmap(fcb,offset, size). An error was


encountered while attempting to access data from the compiled code file. Check for additional
messages and contact customer support (see Contacting Customer Service on page 23).
EXPLANATION:
An error was encountered while attempting to access data from the compiled code file.
In some cases the run is terminated.
USER RESPONSE:
Check for additional messages and contact customer support (see Contacting
Customer Service on page 23).

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TCL - High Speed Scan Based Simulation Messages

WARNING (TCL-012): Error from EDAMfcls(fcb,keep) = (retc). An error was


encountered while attempting to access data from the compiled code file. Check for additional
messages and contact customer support (see Contacting Customer Service on page 23)
EXPLANATION:
An error was encountered while attempting to close the compiled code file. In some
cases the run is terminated.
USER RESPONSE:
Check for additional messages and contact customer support (see Contacting
Customer Service on page 23).

INFO (TCL-014): num faults are tested, num possibly testable at best faults are possibly
tested and num other faults are not selected for simulation.
EXPLANATION:
The fault model being processed by this simulation run may contain faults that are not
loaded for simulation.
USER RESPONSE:
No response required.

WARNING (TCL-022): [Severe] Cannot load the flat model. If the flat model does not exist
or is suspect, rerun build_model. Otherwise, contact customer support (see Contacting
Customer Service on page 23).
EXPLANATION:
An error condition was encountered when attempting to load the flat model.
USER RESPONSE:
If the flatModel file exists, contact customer support (see Contacting Customer Service
on page 23). Otherwise, re-build the flat model and reprocess the part.

WARNING (TCL-023): [Severe] Cannot load the flat model Latch Methods. If the flat model
is suspect, rerun build_model. Otherwise, contact customer support (see Contacting
Customer Service on page 23).
EXPLANATION:
An internal program error caused the run to terminate.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

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WARNING (TCL-024): [Severe] Cannot initialize data structures. An internal program error
caused the run to terminate. Contact customer support (see Contacting Customer Service
on page 23).
EXPLANATION:
An internal program error caused the run to terminate.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

INFO (TCL-025): The simulator has been closed.


EXPLANATION:
Simulation is complete and the simulator has been unloaded.
USER RESPONSE:
No response required.

WARNING (TCL-027): [Severe] Cannot exhaustively test parts with more than 24 PIs. num
were found on this part. The exhaustive simulation option is limited to combinational parts
with no more than 24 primary inputs. No simulation is performed.
EXPLANATION:
The exhaustive simulation option is limited to combinational parts with no more than 24
primary inputs. No simulation is performed.
USER RESPONSE:
If desired, rerun without the exhaustive simulation option.

INFO (TCL-028): Compile will be done: Compiled code does not exist.
EXPLANATION:
This is an informational message.
USER RESPONSE:
No response required.

INFO (TCL-029): Compile will be done: Compiled code is older than Fault Model.
EXPLANATION:

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The compiled code is dependent on the fault model. Since the compiled code is older
than the fault model it will be recompiled to ensure it is not backleveled.
USER RESPONSE:
No response required.

INFO (TCL-030): Compile will be done: Level mismatch between compiled code and
simulator. Simulator level = majorid.minorid
EXPLANATION:
The current compiled code is backleveled and needs to be recompiled. This is usually
due to a new maintenance level.
USER RESPONSE:
No response required.

INFO (TCL-031): Compile not required: existing type file is up to date.


EXPLANATION:
This is an informational message.
USER RESPONSE:
No response required.

WARNING (TCL-037): A Test Procedure with memory cannot be done in Expand mode.
Ignoring specification of Expand.
EXPLANATION:
Expand mode is a test generator specified option that causes multiple test sequences to
be simulated in parallel. If the test procedure requires that non-scannable memory
elements retain their design state across test sequences then they must be simulated
one at a time and the expand option is ignored. This is most likely a programmer error,
but the output data is valid.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCL-039): Run stopped. Check for additional messages and contact customer
support (see Contacting Customer Service on page 23).
EXPLANATION:
An error was encountered causing the run to terminate.

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USER RESPONSE:
Check for additional messages and contact customer support (see Contacting
Customer Service on page 23).

WARNING (TCL-040): [Severe] Cannot get storage for an internal table (name). More
internal storage is required for this run. Contact customer support (see Contacting Customer
Service on page 23) if this does not seem reasonable.
EXPLANATION:
More internal storage is required for this run.
USER RESPONSE:
More storage may be needed. Contact customer support (see Contacting Customer
Service on page 23) if this does not seem reasonable.

WARNING (TCL-041): A Test Procedure with memory is not valid during IDDq processing.
The output data is valid, but the memory attribute will be ignored. Contact customer support
(see Contacting Customer Service on page 23) if these patterns were not user specified.
EXPLANATION:
An IDDq test is expanded into multiple independent test sequences of which the one that
detects the most IDDq faults is kept. A test procedure with memory requires that non-
scannable memory elements retain their design state across test sequences and this is
not supported during IDDq processing. The output data is valid.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) if this is a
concern.

WARNING (TCL-042): [Severe] Unexpected Error in file:line (time date). An


internal program error caused the run to terminate. Check for additional error messages and
contact customer support (see Contacting Customer Service on page 23).
EXPLANATION:
A program error has occurred and the simulator is terminating. The data included in the
message is for developer debug.
USER RESPONSE:
Check for additional error messages and contact customer support (see Contacting
Customer Service on page 23)

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TCL - High Speed Scan Based Simulation Messages

WARNING (TCL-048): Unable to access TSV Test Status on the globalData file. An LSSD
flush test cannot be generated.
EXPLANATION:
Generation of an LSSD flush test is dependent on information supplied by TSV but TSV
has not been run.
USER RESPONSE:
Run TSV before attempting to generate an LSSD flush test.

WARNING (TCL-049): Flush Measure Registers do not exist. An LSSD flush test cannot be
generated.
EXPLANATION:
Generation of an LSSD flush test is dependent on the existence of flush measure
registers.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) if there is a
concern.

TCL-052 through TCL-096


INFO (TCL-052): A tester termination of 0|1 will be used.
EXPLANATION:
If Test Termination is 0, 0 will be used to resolve the TSR value. If Test Termination is 1,
1 will be used to resolve the TSR value.
USER RESPONSE:
No response required.

INFO (TCL-053): The product termination will dominate.


EXPLANATION:
This message informs that product termination will dominate.
USER RESPONSE:
No response required.

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INFO (TCL-053): The tester termination will dominate.


EXPLANATION:
This message informs that tester termination will dominate.
USER RESPONSE:
No response required.

WARNING (TCL-060): (callcallnum) TBDeventType_Error detected.


EXPLANATION:
An erroneous event was encountered while processing patterns within a test sequence.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-061): (callcallnum) Unknown TBDeventType detected.


EXPLANATION:
An unknown event was encountered while processing patterns within a test sequence.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-062): (callcallnum) Ignoring a clock being stimmed to X (node


nodeid).
EXPLANATION:
The simulator does not allow clocks to be stimmed to an unknown value. The stim is
ignored and processing continues.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-063): (callcallnum) Clock node nodeid has an invalid stability value.
EXPLANATION:
A stability value for a clock cannot be determined.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

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WARNING (TCL-064): (callcallnum) Ignoring a PI being stimmed to X (node nodeid).


EXPLANATION:
Stimming a PI to X is not supported. The PI will remain at its current state.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-065): (callcallnum) Test Inhibit node nodeid has an invalid stability
value.
EXPLANATION:
A stability value for a Test Inhibit cannot be determined.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-066): The application encountered an error processing the scan chain test
patterns.
EXPLANATION:
An error condition was encountered processing the scan chain test patterns. Processing
of the scan chain tests terminates.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-067): The application encountered an error processing the LSSD flush
test. Contact customer support (see Contacting Customer Service on page 23).
EXPLANATION:
An error condition was encountered processing the scan chain LSSD flush test patterns.
Processing of the scan chain tests terminates.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-068): A stim was removed because it took a Test Inhibit PI (nodeid) away
from its stability value of value.
EXPLANATION:

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The simulator does not allow a test inhibited primary input to be stimmed to anything
other than its stability value. The stim is not placed on the output Vectors.
USER RESPONSE:
If this error occurs during simulation of a user-imported Vectors, if desired, correct the
input data and re-import. If user-imported vectors are not being simulated contact
customer support (see Contacting Customer Service on page 23).

WARNING (TCL-069): [Severe] num clocks are out of stability. This simulator may produce
incorrect results if more than one clock is turned on at a time. The results will be flagged as
suspect.
EXPLANATION:
The simulator cannot guarantee correct response data when multiple clocks are on at
the same time. An audit flag is set for the experiment indicating that the results are
suspect.
USER RESPONSE:
If this error occurs during simulation of a user-imported Vectors file, if desired, correct the
input data and re-import. If user-imported vectors are not being simulated, contact
customer support (see Contacting Customer Service on page 23).

WARNING (TCL-072): (callcallnum) PI node nodeid has an invalid stability value that
will be ignored. Contact customer support (see Contacting Customer Service on page 23).
EXPLANATION:
A test function PI has an unsupported stability value which will be ignored.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-073): [Severe] The specified tester termination (term) violates the TDR.
EXPLANATION:
There is a conflict between the tester termination specified for the run and the allowable
terminations on the TDR. The override is audited.
USER RESPONSE:
If desired, change the TDR or the run time specification.

WARNING (TCL-074): A test pattern was detected that may cause excessive output
switching. Such tests may be unreliable.

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EXPLANATION:
This indicates a clock was pulsed or stimmed on while an output inhibit (OI) test function
pin was enabled. When running test generation this can be controlled via the Allow
Simultaneous Output Switching (SOS) option (sos=yes|no on the command line).
USER RESPONSE:
If desired, disallow the option when running test generation. Or, if using manual patterns,
edit the patterns and rerun.

INFO (TCL-075): Compile will be done: Fault machine code does not exist.
EXPLANATION:
The compiled code was generated for good machine simulation. The compiled code
must be recompiled to include fault machine simulation.
USER RESPONSE:
No response required.

INFO (TCL-076): Running in clean mode: compiled code files will be deleted.
EXPLANATION:
When running in clean mode the compiled code files are automatically deleted when the
simulator is closed.
USER RESPONSE:
No response required.

WARNING (TCL-077): Cannot delete the existing compiled code file.


EXPLANATION:
When running in clean mode the compiled code files are automatically deleted when the
simulator is closed. For some reason, a file was not deleted.
USER RESPONSE:
No response required. If desired, delete the file manually.

WARNING (TCL-078): [Severe] The measurepo specification (all) violates the TDR.
EXPLANATION:
The specification of measurepo=all for the run conflicts with the TDR specification of
measurepo = faultdetect. The override is audited.

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USER RESPONSE:
If desired, change the TDR or the run time specification.

WARNING (TCL-080): [Severe] The application encountered an error while processing the
output vectors. Check for insufficient filespace or file permissions. Contact customer support
(see Contacting Customer Service on page 23) for further help.
EXPLANATION:
An error condition was encountered during processing of the output Vectors.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-081): [Severe] Cannot add a event to output vectors database. Contact
customer support (see Contacting Customer Service on page 23) for further help.
EXPLANATION:
An error condition was encountered during processing of the output vectors.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-082): [Severe] The applicaion encountered an error while processing the
random pattern clocking sequences. Simulation halted. Contact customer support (see
Contacting Customer Service on page 23).
EXPLANATION:
The applicaion encountered an error while processing the random pattern clocking
sequences.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-083): Command line parameter contentionremove=no has been


specified indicating that test sequences for which 3-state contention was reported should be
written to the output Vector file. This requires that you specify that all test sequences,
including those that are ineffective, be written (command line parameter
writepatterns=all).
EXPLANATION:

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By specifying that patterns with 3-state contention should not be removed the user is
requesting that test sequences for which 3-state contention was reported be written to
the output Vector file. When this option is specified the High Speed Scan-Based
Simulator also requires that all sequences, including those that are ineffective, be written
to the output Vector file. This option is most likely to be used when simulating manual test
sequences.
USER RESPONSE:
If it is required that test sequences for which 3-state contention has been reported get
written to the output Vector file, rerun specifying that ineffective patterns should be
included in the output (command line parameter writepatterns=all). Otherwise,
specify that these sequences should be removed (command line parameter
contentionremove=yes).

WARNING (TCL-084): [Severe] An invalid stim to value of Test Inhibit PI/PPI


netname (index= hierIndex) away from its stability value of value has been
encountered.
EXPLANATION:
The simulator does not allow a test inhibited primary input or pseudo primary input to be
stimmed to anything other than its stability value.
The run is terminated.
USER RESPONSE:
If this error occurs during simulation of user-imported Vectors, correct the input data and
re-import. If user-imported Vectors are not being simulated, contact customer support
(see Contacting Customer Service on page 23).

WARNING (TCL-085): An invalid stim to value of Test Constraint PI/PPI netname


(index= hierIndex) away from its stability value of value has been encountered.
EXPLANATION:
The simulator does not allow a test constraint primary input or pseudo primary input to
be stimmed to anything other than its stability value except during a scan operation.
USER RESPONSE:
If this error occurs during simulation of a user-imported Vectors, correct the input data
and re-import. If user-imported Vectors are not being simulated contact customer
support (see Contacting Customer Service on page 23).

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WARNING (TCL-086): A Stop_Osc event specifies a quiescent value of value, which


differs from the stability value of value. The PI is set to value. The PI is netname (index=
hierIndex).
EXPLANATION:
The value specified to restore an oscillator was not the stability value of the clock.
USER RESPONSE:
Ensure that the specified Stop_Osc event is intended to leave the clock in the non-
stability state. If not, change the Stop_Osc event to utilize the stability value.

WARNING (TCL-087): [Severe] A clock was not at its stability value when an event
(eventID) requiring a scan operation was encountered. The run terminates. The clock is
netname (index= hierIndex).
EXPLANATION:
In order to ensure that the design correctly scans, the High Speed Scan-Based Simulator
requires that all clocks be at their stability value when a scan operation is invoked.
USER RESPONSE:
If this error occurs during simulation of user-imported Vectors, correct the input data and
re-import.
If user-imported Vectors are not being simulated, contact customer support (see
Contacting Customer Service on page 23).

ERROR (TCL-088): Unable to add failure data to the TBDfail file. Processing terminates.
Check the disk to make sure there is enough space available. If a failure data file is not
needed, specify tbdfail=no on the command line.
EXPLANATION:
Unable to write failure data to the TBDfail file.
USER RESPONSE:
Check the disk quota to make sure there is enough space available. If a failure data file
is not needed, specify tbdfail=no on the command line.

WARNING (TCL-089): [Severe] Hard|Soft|AllX Good Machine 3-State contention on


netname (index= hierIndex). The test data may be invalid.
EXPLANATION:

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This message indicates that conflicting strong values were driven on the same net in the
simulation of WRPT or LBIST patterns, creating a risk of burnout at the tester when the
generated test data is used. The data will still be included in the Vectors.
USER RESPONSE:
Determine whether there is a way to prevent this condition by lineholding some primary
inputs and/or latches. If not, then modify the design. The most effective way to prevent
this condition is to put mutually exclusive gating on the enable signals to the driver
circuits that are dotted together.

WARNING (TCL-095): [Severe] An invalid stim to value of Prpg Save PI/PPI_2


netname (index= hierIndex) away from its stability value of value has been
encountered.
EXPLANATION:
The simulator does not allow a prpg save primary input or pseudo primary input to be
stimmed to anything other than its stability value.
The run is terminated.
USER RESPONSE:
If this error occurs during simulation of user-imported Vectors, correct the input data and
re-import. If user-imported Vectors are not being simulated, contact customer support
(see Contacting Customer Service on page 23).

WARNING (TCL-096): [Severe] An invalid stim to value of Prpg Restore PI/PPI


netname (index= hierIndex) away from its stability value of value has been
encountered.
EXPLANATION:
The simulator does not allow a prpg restore primary input or pseudo primary input to be
stimmed to anything other than its stability value.
The run is terminated.
USER RESPONSE:
If this error occurs during simulation of user-imported Vectors, correct the input data and
re-import. If user-imported Vectors are not being simulated contact customer support
(see Contacting Customer Service on page 23).

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TCL-150 through TCL-198


WARNING (TCL-150): [Severe] Cannot set the test mode.
EXPLANATION:
The mode data is not accessible.
USER RESPONSE:
Ensure the mode name is valid, or rebuild the mode. If this does not fix the problem,
contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-151): [Severe] Cannot set the testmode. If the testmode is suspect, rerun
build_testmode. If this does not correct the problem, contact customer support (see
Contacting Customer Service on page 23).
EXPLANATION:
An error occurred while trying to set up the mode data for the flat model.
USER RESPONSE:
Ensure the mode name is valid, or rebuild the mode. If this does not fix the problem,
contact customer support (see Contacting Customer Service on page 23).

INFO (TCL-152): Compile will be done: Existing compiled code is for AIX machines only.
EXPLANATION:
The existing compiled code will not run on a non-AIX platform. Valid compiled code will
be built automatically.
USER RESPONSE:
No response required.

INFO (TCL-153): num tests were removed because of type.


EXPLANATION:
This indicates how many test sequences were not written to the Vector output based on
the current orthogonal elimination option, violation of dynamic constraints, and/or the
current removeXpo and removeXlatch options.
USER RESPONSE:
No response required.

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INFO (TCL-154): contentionreport has been set to type.


EXPLANATION:
This indicates the current setting of the 3-state contention reporting option.
USER RESPONSE:
No response required.

WARNING (TCL-155): [Severe] Cannot load the faults for simulation. Check for additional
messages and contact customer support (see Contacting Customer Service on page 23).
EXPLANATION:
An error was encountered while attempting to access data from the compiled code file.
In some cases the run is terminated.
USER RESPONSE:
Check for additional messages and contact customer support (see Contacting
Customer Service on page 23).

WARNING (TCL-156): Multiple stims of non-contacted primary inputs were found in a test
sequence, but the number of tester parametric measure units does not support this. The test
sequence was discarded.
EXPLANATION:
Based on the TDR and circuit, test data is being generated that only allows one PMU to
be used. Any test sequence requiring multiple PMUs is discarded.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) if there is a
concern.

WARNING (TCL-157): [Severe] Encountered an error while attempting to process the


linehold data. Check for additional messages and contact customer support (see Contacting
Customer Service on page 23).
EXPLANATION:
An error was encountered while attempting to process the linehold data. In some cases
the run is terminated.
USER RESPONSE:
Check for additional messages and contact customer support (see Contacting
Customer Service on page 23).

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INFO (TCL-158): This design requires infinite X simulation for Latches. Performance may be
degraded.
EXPLANATION:
A pessimistic mode of simulation, called "infinite X", is being invoked for latch transitions
due to the presence of design guideline violations. This is necessary to guard against
invalid simulation results in the presence of these violations.
Two conditions that can cause infinite X simulation to be invoked for latch input transitions
are:
A memory element is clocked by a clock which is gated by a signal from a
memory element which is clocked by the same clock (TSV059 - LSSD and
GSD).
One or more clock inputs to a latch are not at a known value in the stability state
(TSV310 - GSD).
USER RESPONSE:
If optimum simulation performance and fault coverage are to be achieved then the
underlying design guideline violations must be corrected. Otherwise this message can
be ignored.
Note: If invalid clock gating (TSV059) is the design guideline violation responsible for the
TCL-158 message then check the results of your Test Structure Verification (TSV) run to
see if Check Mutually Exclusive Gating was selected (command line parameter
megraces=yes). If not, then you may want to rerun TSV using this option. The
mutually exclusive gating check may cause the TSV message(s) which prompted the
TCL-158 message to disappear.

INFO (TCL-159): This design requires infinite X simulation for Primary Inputs. Performance
may be degraded.
EXPLANATION:
A pessimistic mode of simulation, called "infinite X", is being invoked for primary input
transitions due to the presence of design guideline violations. This is necessary to guard
against invalid simulation results in the presence of these violations.
Two conditions that can cause infinite X simulation to be invoked for primary input
transitions are:
A clock pin on a memory element is not off in the stability state (message
TSV008 from Test Structure Verification - LSSD).

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One or more clock inputs to a latch are not at a known value in the stability state
(TSV310 - GSD).
USER RESPONSE:
If optimum simulation performance and fault coverage are to be achieved then the
underlying design guideline violations must be corrected. Otherwise this message can
be ignored.

WARNING (TCL-161): [Severe] An internal program error caused the run to terminate.
Check for additional messages and contact customer support (see Contacting Customer
Service on page 23).
EXPLANATION:
An error was encountered while attempting to process the data that is used to do 3-state
contention elimination. In some cases the run is terminated.
USER RESPONSE:
Check for additional messages and contact customer support (see Contacting
Customer Service on page 23).

WARNING (TCL-162): A stim to netname of non-contacted primary input n (index=


hierIndex) was found in a test sequence, and a tester parametric measure unit cannot be
used. The test sequence was discarded.
EXPLANATION:
In order to stim a non-contacted primary input a parametric measure unit (PMU) must be
used. Either there are not enough PMUs in the tester or PMUs are not allowed to be used
for the type of tests that are being simulated.
USER RESPONSE:
Check the messages from Build Test Mode for a warning about this condition. If no such
message was produced, or there are other concerns, contact customer support (see
Contacting Customer Service on page 23).

WARNING (TCL-163): A stim to netname of inactive, non-contacted primary input n


(index= hierIndex) was found in a test sequence. It will be ignored.
EXPLANATION:
A stim to an inactive, non-contacted primary input is not valid. The simulator will simulate
such PIs at X, unless they are 3-state PIs in which case they will be simulated at Z.
USER RESPONSE:

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If this condition is unacceptable, contact customer support (see Contacting Customer


Service on page 23).

INFO (TCL-164): Infinite X simulation for Latches has been requested. Performance may be
degraded.
EXPLANATION:
Infinite X simulation for latches was explicitly requested. It may not be required.
USER RESPONSE:
No response required.

INFO (TCL-165): Infinite X simulation for Primary Inputs has been requested. Performance
may be degraded.
EXPLANATION:
Infinite X simulation for PIs was explicitly requested. It may not be required.
USER RESPONSE:
No response required.

WARNING (TCL-167): Fault grouping is not supported for this type of experiment.
Simulation using one fault group will be attempted.
EXPLANATION:
Multiple fault groups were requested but this support is not available for WRPT or LBIST.
USER RESPONSE:
No response required.

WARNING (TCL-168): Fault grouping is not supported for test procedures requiring
memory between test sequences. A test procedure is ignored.
EXPLANATION:
Processing of multiple fault groups is limited to test procedures that do not require
memory between test sequences. The test procedure requiring memory is not simulated
and will not be included in the output Vector file.
USER RESPONSE:
No response required.

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INFO (TCL-169): Fault simulation will be performed with num fault groups using a space of
num meg.
EXPLANATION:
This is an informational message.
USER RESPONSE:
No response required.

WARNING (TCL-170): A stim value for correlated PI netname (index= hierIndex) is not
the value required by the correlation. Other conflicts may exist in this event. Processing
continues.
EXPLANATION:
A conflict on a stim PI or stim PI plus random event is detected. The conflicting values
are simulated.
USER RESPONSE:
Ensure the stim value on the correlated PI is correct. No response is required if the stim
value on the correlated PI is correct. If the value is not correct, change the manual
patterns and re-import the patterns to correct the problem.

WARNING (TCL-171): [Severe] A stim|pulse value for correlated clock PI netname


(index= hierIndex) is not the value required by the correlation. Conflicts on clock events
are not supported by the High Speed Scan-Based Simulator. The conflicting value will be
changed to the required value.
EXPLANATION:
There is a conflict between the actual value and the value required by correlation. The
conflicting value will be changed to the required value.
USER RESPONSE:
Ensure the stim|pulse value on the correlated PI is correct. If the stim|pulse
value on the correlated PI is correct, rerun using the General Purpose Simulator. If the
value is not correct, change the manual patterns and re-import the patterns to correct
the problem.

INFO (TCL-172): Compile will be done: overriding current keeper device processing.
EXPLANATION:
A recompile is necessary based on the value of the keeper device parameter.

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USER RESPONSE:
No response required.

ERROR (TCL-173): A event type event specified PI netname (index= hierIndex)


but test function pin flags indicate this PI is not a clock. Processing terminates.
EXPLANATION:
The specified PI is not a clock according to the test function pin flags. The High Speed
Scan-Based Simulator does not support this event on non-clock primary inputs.
USER RESPONSE:
Check the test sequence. Ensure the PI specified in the event is a clock., then rerun.

WARNING (TCL-174): [Severe] Exhaustive simulation is limited to small combinational


parts. A design with clocks, latches or rams cannot be exhaustively simulated.
EXPLANATION:
The design being processed does not meet the criteria to be able to perform exhaustive
simulation. No simulation is performed.
USER RESPONSE:
If desired, rerun without the exhaustive option.

WARNING (TCL-175): [Severe] A TBD error occurred during processing of an init test
procedure. Processing continues, but results are suspect.
EXPLANATION:
A bad return code was received when attempting to put an init test procedure on the
output Vector file. This probably indicates a programming error and it is likely that any
output data is invalid.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCL-176): The specification to put out all PO measures is being ignored due to
the test section being processed. PO measures will be limited to those which detect faults for
this driver/receiver test section.
EXPLANATION:
The measurepo option does not apply to driver/receiver tests. PO measures are
produced only on POs that detect faults in this type of test section. measurepo=all will

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still be in effect for all applicable test sections being processed during this run.
Processing continues.
USER RESPONSE:
No response is required; however, you may remove the measurepo=all parameter and
the results will be the same.

WARNING (TCL-177): The specification to put out all PO measures is being ignored due to
the test section being processed. PO measures will be limited to those which detect faults for
this logic test section since the number of active logic pins is greater than the full function pin
limit as specified on the TDR.
EXPLANATION:
The measurepo option does not apply to logic tests when the number of active logic pins
is greater than the full function pin limit as specified on the TDR. PO measures are
produced only on POs that detect faults in this type of test section. measurepo=all will
still be in effect for all applicable test sections being processed during this run.
Processing continues.
USER RESPONSE:
No response is required; however, you may remove the measurepo=all parameter and
the results will be the same.

WARNING (TCL-178): [Severe] Fault simulation was requested but there are no faults to
simulate.
EXPLANATION:
No fault data exists for the simulator to fault simulate. This usually occurs when faults do
not exist for the test mode being processed. This can be verified by checking the fault
model statistics for the test mode. Processing terminates.
USER RESPONSE:
If fault simulation is desired, ensure faults exist for the test mode being processed. This
may require rebuilding the fault model for the test mode. If fault simulation is not required
the job should be rerun with good machine simulation specified.

INFO (TCL-179): num miscompares were detected during simulation.


EXPLANATION:
This indicates that the comparemeasures option was in effect and provides the number
of miscompares that occurred between expected values and predicted values. Refer to
message "TCL-710" or "TCL-711" for further explanation.

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USER RESPONSE:
No response required.

WARNING (TCL-180): 1 or more test procedures with memory had conflicts which makes
the fault coverage suspect. A resimulation is necessary to ensure the fault coverage is
correct.
EXPLANATION:
If a test procedure with memory is found to have 3-state contention or a PMU conflict the
entire test procedure is considered to be invalid. Faults detected during simulation of the
test procedure are no longer valid detects and the fault coverage is not accurate. If a
Vector file is being written it must be resimulated in order to get an accurate fault
coverage. This will happen during a test generation experiment if reverse simulation was
selected.
USER RESPONSE:
Review other messages to determine the type of conflict and respond to those if desired.
For test generation applications, specifying reportdebug=yes can give detailed
information about 3-state contention. If reverse simulation was not performed and an
accurate fault coverage is necessary, resimulate the uncommitted Vectors.

INFO (TCL-181): num tests which had type 3-state contention were written to the Vector
output file.
EXPLANATION:
This indicates how many test sequences with a certain type of 3-state contention were
written to the Vector output file. This is based on the contentionreport and
contentionremove options.
USER RESPONSE:
No response required.

INFO (TCL-182): Compile will be done: 64 bit incompatibility.


EXPLANATION:
A recompile is necessary based on a difference between the existing compiled code and
the current platform. Either the compiled code was built on a 32 bit machine and is being
run on a 64 bit machine or vice versa.
USER RESPONSE:
No response required.

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WARNING (TCL-183): [Severe] The process to generate the compiled code files failed.
This usually indicates a lack of space or an inadequate ulimit setting.
EXPLANATION:
A separate process is used to generate the compiled code files. The return code from
the process indicates that the process failed.
USER RESPONSE:
Check available space. Set ulimits to unlimited.

INFO (TCL-184): 01hot has been set to no%lor.yes.


EXPLANATION:
This indicates the current setting of the 01hot 3-state driver contention reporting option.
If yes, the simulator will report any 3-state with more than 1 driver enabled in the case
where there is a known propagation value. For example, if there are only two drivers and
they are both driving zero this would be reported. Also if one of the drivers was driving a
zero and the other driver was possibly driving a zero this would be reported since the
zero would propagate. If one driver was zero and the other was unknown this would not
be reported since the propagation value would be X. The removal of the sequence
depends on the setting of the contentionremove keyword.
USER RESPONSE:
No response required.

WARNING (TCL-185): [Severe] This 1149.1 mode requires an update_dr operation in the
form of load suffix patterns. A Scan_Load or Skewed_Scan_Load was found that was not
followed by the required load suffix patterns.
EXPLANATION:
Based on the mode statistics, each pattern containing a Scan_Load or
Skewed_Scan_Load event must be followed by the update_dr operation. This is
indicated by patterns with the load suffix pattern sequence attribute.
This message is printed each time the required patterns are missing.
USER RESPONSE:
If this error occurs during simulation of a user-imported Vectors, if desired, ensure the
load suffix sequence patterns follow each pattern containing a Scan_Load or
Skewed_Scan_Load event, and re-import the patterns to correct the problem.
If user-imported Vectors are not being simulated contact customer support (see
Contacting Customer Service on page 23).

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WARNING (TCL-186): [Severe] Pseudo primary inputs were found in the design model,
but no user sequences were provided. The run continues with automatically generated
sequences, but these tests can not be used on the hardware.
EXPLANATION:
This test mode contains some pseudo primary inputs, which Encounter Test can exercise
only with the help of user-supplied sequences.
Random pattern generation will proceed on an uncommitted basis using automatic
sequences to exercise the pseudo primary inputs. An audit bit is set to alert downstream
(manufacturing) processes that the test data does not include all the primary input stimuli
required to run on a hardware tester.
USER RESPONSE:
User-generated test sequences must be specified for the generated tests to be used on
the hardware. Test sequences must first be coded and imported by selecting File, Import,
Sequence Definition Data. On the General Options screen, under Clocking Sequences,
select Use Manual Sequences and specify Test Sequence Name(s).

INFO (TCL-187): Compile will be done: overriding current measure latch processing.
EXPLANATION:
A recompile is necessary based on the value of the measurelatch parameter.
USER RESPONSE:
No response required.

ERROR (TCL-189): A event type event specified PI netname (index= hierIndex)


but test function pin flags indicate this PI is not an oscillator. Processing terminates.
EXPLANATION:
The specified PI is not an oscillator according to the test function pin flags. The High
Speed Scan-Based Simulator does not support this event on primary inputs which do not
have an oscillator attribute.
USER RESPONSE:
Check the test sequence. Ensure the PI specified in the event is an oscillator, then rerun.

INFO (TCL-190): The dynamic type constraint placed on netname (index hierIndex)
has been violated.
EXPLANATION:

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The simulator detected that the specified model object violated the constraint placed on
it. The test pattern will either be removed or the design fed by the object will be ignored
by simulating X. Message TCL-192 or TCL-193 will describe the action taken as a result
of this violation.
USER RESPONSE:
Determine the cause of the constraint violation and correct it.

NFO (TCL-191): The SDC data will be read from source.


EXPLANATION:
The referenced file contains the SDC data to be read by the program.
USER RESPONSE:
No response required.

INFO (TCL-192): A constraint violaton has caused portions of the design to be ignored.
EXPLANATION:
One or more constraint violations has resulted in the design fed by the object to ignored
by simulating X. Message TCL-190 describes the constraint violated.
USER RESPONSE:
Determine the cause of the constraint violation and correct it.

INFO (TCL-193): A constraint violaton has caused a test pattern to be removed.


EXPLANATION:
One or more constraint violations has resulted in the test pattern in which it was found to
be removed from the Vectors. Message TCL-190 describes the constraint.
USER RESPONSE:
Determine the cause of the constraint violation and correct it.

INFO (TCL-194): num tests will be removed due to removeXlatch|removeXPO.


EXPLANATION:
This indicates unknown X is produced at measurable latch or at PO node. if
removeXlatch or removePO is turned on. The test will be removed.
If Channel Masking is available, an X has been propagated to MISR bits, and therefore
the X is not masked out. The test is also removed.

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USER RESPONSE:
Verify your command line parameters. Refer to "analyze_vectors in the Encounter
Test: Reference: Commands.

INFO (TCL-195): Clock Choppers will be simulated safe|risky. Pessimistic simulation


will/will not be performed.
EXPLANATION:
By default, Clock Choppers will be simulated safe, pessimistic simulation will be
performed. The default can be overridden by specifying choppers=risky.
USER RESPONSE:
Verify your command line parameters. Refer to "analyze_vectors in the Encounter
Test: Reference: Commands.

INFO (TCL-196): Unknown (X) value was found at netname (index=hierIndex at


odometer). The test sequence will be removed due to removeXlatch / removeXpo.
EXPLANATION:
An unknown (X) value is propagating to an observable latch and is removed to prevent
corruption of a MISR signature in OPMISR mode.
USER RESPONSE:
No response required.

INFO (TCL-197): Pessimistic simulation will be performed because blank | on


feedbacks because reason.
EXPLANATION:
If Verify Test Structures has been run and TSV001 messages were issued, or if Verify
Test Structures was not run, the default behavior of pessimistic simulation is executed for
the current run.
USER RESPONSE:
If pessimistic simulation is desired, specify feedbacks=risky.

WARNING (TCL-198): Pessimistic simulation on feedbacks will not be performed. The data
might be invalid.
EXPLANATION:

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The zero delay simulator does not automatically observe glitches that might cause a
feedback to oscillate and generated vectors with pessimistic simuilation disabled might
contain invalid data.
USER RESPONSE:
If vectors contain invalid data due to disabled pessimistic simulation off, activate
pessimistic simulation by specifying the development keyword needpessfeedback=on
and rerun.

WARNING (TCL-199): The maxscanswitching threshold may be exceeded in some


patterns. The effect of scan overlap on scan switching is estimated during ATPG and a large
percentage of flops (pct) are directly affected by scan overlap. Patterns should be verified
with write_toggle_gram.
EXPLANATION:
When the switching of the scan unload is being evaluated during ATPG, the switching
due to new scan data entering the scan chains is estimated. If the percentage of flops
directly affected by overlapping scan is small (<2%), it should not significantly affect the
overall scan switching of the scan operation. For this design, the number of flops affected
by overlapping scan is large enough to have a non-trivial impact on the early scan cycles
of the scan unload event.
USER RESPONSE:
Once ATPG is complete, you should run write_toggle_gram to identify any patterns
where overlapping the scan unload with the scan load of the next pattern causes the
maxscanswitching threshold to be exceeded. Or, you may run ATPG with a lower
maxscanswitching threshold to allow for the effect of the overlap.

TCL-200 through TCL-520


ERROR (TCL-200): Not enough memory to satisfy the request of size of memory bytes.
EXPLANATION:
The system is near OOM (out of memory). The message is issued as an alert that the
process may be terminated due to constrained memory.
USER RESPONSE:
Specify additional keywords to reduce memory usage, such as the expert keyword
maxfaultcopies and rerun.

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ERROR (TCL-201): The test sequences in Test Procedure odometer can not be simulated
in parallel since they are non-uniform. Add non-uniform_sequences attribute to the Test
Procedure and rerun.
EXPLANATION:
Test sequences in the same test procedure should be uniform to take gain the advantage
from parallel simulation. Bad data might be produced if test sequences in the same test
procedure are not uniform.
USER RESPONSE:
Verify whether the simulated test sequences are non-uniform. Use one of the following
methods to correct the problem:
Set a non-uniform_sequences attribute on the Test Procedure.
Specify the keyword value force1tseq=yes to force the simulator to do serial
simulation. This keyword is primarily intended for use by Encounter Test
development.
Regroup the test sequences to result in all test sequences being uniform in a
particular test procedure.

INFO (TCL-202): Good circuit simulation will be done using number_of_threads


threads.
EXPLANATION:
This message states the number of threads to perform multi-threading on good circuit
simulation.
USER RESPONSE:
No response required.

NFO (TCL-203): Faulty circuit simulation will be done using number_of_threads


threads.
EXPLANATION:
This message states the number of threads to perform multi-threading on faulty circuit
simulation.
USER RESPONSE:
No response required.

INFO (TCL-205): Start the TCL Simulator.

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EXPLANATION:
High-Speed Scan Based simulation has begun.
USER RESPONSE:
No response required.

INFO (TCL-206): removeXlatch is set to be off|on.


EXPLANATION:
When removeXlatch=on is specified, the simulator removes the test sequence which
generates an "X" in the scan chain. Otherwise, the simulator ignores the test sequence.
USER RESPONSE:
No response required.

(TCL-207):
INFO removeXpo is set to be off|on.
EXPLANATION:
When removeXpo=on is specified, the simulator removes the test sequence which
generates an "X" on any measurable PO. Otherwise, the simulator ignores the test
sequence.
USER RESPONSE:
No response required.

INFO (TCL-208): Faults will/will not propagate through measure latches.


EXPLANATION:
If measurelatch=normal is specified, and a fault effect propagates to a measurable
latch, either the fault is marked tested if detecting the condition is met. (e.g. fault effect
on a SML and there is a measurelatch event following), or the fault effect will be wiped
out if the fault is not marked tested for the current event.
If measurelatch=sequential is specified, a fault copy is kept if the fault is not marked
as tested on a measurable latch. The fault copy will be kept for a subsequent fault
simulation. Specifying measurelatch=sequential will improve the accuracy but will
also increase the running time.
USER RESPONSE:
Specify measurelatch=sequential to achieve an accurate test coverage..

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INFO (TCL-209): All valid keeper devices are active.


EXPLANATION:
This message states status for all valid keeper devices.
USER RESPONSE:
No response required.

INFO (TCL-210): Valid glitch-free keeper devices are active.


EXPLANATION:
This message states status for valid glitch-free keeper devices.
USER RESPONSE:
No response required.

INFO (TCL-211): No keeper devices are active.


EXPLANATION:
This message states keeper device status.
USER RESPONSE:
No response required.

INFO (TCL-215): Sequential elements will be reset at each Test Sequence.


EXPLANATION:
The sequential element (memory element) will be reset to some reset value at the
boundary of each Test Sequence.
USER RESPONSE:
No response required.

(TCL-216):
INFO A tester termination of 0|1 will be used.
EXPLANATION:
The stated tester termination value is being used.
USER RESPONSE:

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No response required.

INFO (TCL-217): The tester termination will dominate.


EXPLANATION:
This message states that tester termination will be dominant.
USER RESPONSE:
No response required.

INFO (TCL-218): number tests will be removed since Xs have already propagated into
MISR bits before generating Channel Masking Bits.
EXPLANATION:
The tests the simulator is currently simulating generate "X". The "X" has already
propagated into MISR latches before generating Channel Masking Bits. The tests are
removed to prevent corruption of the MISR signatures.
USER RESPONSE:
No response required.

INFO (TCL-219): number tests will be removed since the Channel Masking Bits were not
generated. See preceding message.
EXPLANATION:
The simulator has detected X in the scan channel, but Channel Masking Bits cannot be
correctly generated. The simulator will remove those tests in order to prevent the
corruption of the MISR signature.
USER RESPONSE:
No response required.

INFO (TCL-220): Invoking 2-pass simulation.


EXPLANATION:
The High Speed Scan Based simulator will invoke 2-pass simulation in following
conditions:
If contentionremove=yes is specified and there is potential burnout
(gmonly=no).
If removeXlatch=yes or removeXpo=yes and gmonly=no () are specified.

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For OPMISR parts, removeXlatch defaults to yes.


If Channel Masking is available (for OPMISR+ parts).
USER RESPONSE:
No response required.

WARNING (TCL-221): There are Xs in the scan chain, but the channel masking data was
not generated.
EXPLANATION:
The simulator detected Xs in the scan chain, but channel masking data was not
generated due to either:
Channel masking data cannot be correctly generated.
xmask is set to update, however there is no channel masking data in the input.
experiment.
USER RESPONSE:
Specify xmask=yes to generate channel masking data.

INFO (TCL-222): number tests will be removed due to linehold violations.


EXPLANATION:
A linehold was not honored in the stimulus at a PI or latch. The test will be removed. It is
not always possible to honor latch lineholds for compression testmodes with input
decompression.
USER RESPONSE:
No response is required unless too many tests are being dropped. In that case, re-
examine the linehold set. With input decompression, lineholds contained within one scan
register are easier to solve.

WARNING (TCL-223): Linehold violation at netname (index=hierIndex at


odometer).
EXPLANATION:
A linehold was not honored in the stimulus at a PI or latch. This may occur on
compression testmodes with input decompression.
USER RESPONSE:
No response required.

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WARNING (TCL-226): The Encounter ATPG simulation option


simtype=simulation_type in the vector file cannot honor the specified fault subset.
Simulation continues without the fault subset.
EXPLANATION:
Fault subset lists are only supported by specifying simtype=eventdriven with
flatsim=yes. The specified simtype option in the input vector was compiled or
interpretive.
USER RESPONSE:
Ignore this message if running without a fault subset is acceptible. Otherwise, rerun
without specifying useatpgsimoptions=yes.

WARNING (TCL-226): The Encounter ATPG simulation option


simtype=simulation_type in the vector file can not honor the specified fault subset.
Simulation continues without the fault subset.
EXPLANATION:
A simtype option of either compiled or interpretive was specified and neither
supports a fault subset list. simtype=eventdriven supports a fault subset list.
USER RESPONSE:
Ignored this message if running without a fault subset is acceptible. Otherwise, rerun
without specifying useatpgsimoptions=yes.

INFO (TCL-227): Processing faults that do not meet small delay test thresholds.
EXPLANATION:
Encounter Test has marked those tested faults that were detected during simulation but
did not meet the small delay test thresholds (ndetect, percentpath, or simsdql).
USER RESPONSE:
If you want these faults left as untested, specify marksdfaultstested=no and rerun
the command. Otherwise, no action is required.

ERROR (TCL-300): Stim a value Z on netname (index=hierIndex) which is not


allowed at TBD Loc odometer. Simulation terminates.
EXPLANATION:
Only a strong value is allowed on a net; a weak value is stimmed.
USER RESPONSE:

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Check the stim value, correct it, and rerun.

INFO (TCL-301): Maximum fault machine X size of maxFaultXsize will be used.


EXPLANATION:
Allow maxfaultxsize nodes to be X when propagating a fault before dropping it. The
default size is 1000. Decreasing the default size may lower the overall Test Coverage.
Increasing the default size may significantly increase the running time.
USER RESPONSE:
Decrease the maxfaultxsize if the running time is excessive and test coverage is not
a primary consideration. Increase the maxfaultxsize if the test coverage is too low
due to an excessive number of dropped faults.

INFO (TCL-302): Patterns with 3-state contention will NOT be removed.


EXPLANATION:
Patterns with 3-state contention will be written into the output experiment. Specify
writepatterns=all to retain patterns with three-state contention violations.
USER RESPONSE:
To remove patterns with violating three-state contention violations, specify
contentionremove=yes.:

ERROR (TCL-304): Unsupported block type in function functionName,


nodeid=nodeID. Simulation terminates.
EXPLANATION:
The node is not a supported block type in this function. Such as a latch is not supported
in the specific simulation function. nodeid=0 is not supported in any function.
USER RESPONSE:
Determine whether a GMcompiled* or FMcompiled* file exists in the part directory.
Remove the file(s) and rerun.

ERROR (TCL-307): Cant allocate number byte memory for pointerName. Simulation
terminates.
EXPLANATION:
This message indicates that insufficient memory is available to run the application.
USER RESPONSE:

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Verify whether sufficient memory is available on the current workstation. If necessary,


rerun the job on a workstation with more memory.

INFO (TCL-308): Latch/Flip-Flops are simulated to X when clock at X.


EXPLANATION:
Latches and Flip-Flops will be pessimistically simulated when the clocks of those
elements are at X.
USER RESPONSE:
No response is required needed if pessimistic simulation on latches is expected.
Otherwise, change the latchsimulation keyword specification to optimistic or
remove the keyword from the command string and rerun.

INFO (TCL-309): Measure Points will be ignored if the input data of those points at X.
EXPLANATION:
If the measure points are at "X" in the input data, the corresponding measurable points
will be ignored for measurement and marking off faults.
USER RESPONSE:
No response is required needed if ignoring of measures when input data are "X" is
expected. Otherwise, set the keyword ignoremeasureinputx to no or remove the
keyword from command line and rerun.

WARNING (TCL-401): [Severe] number of active clock primary inputs or


PPIs clock inputs were active during an Event type event at TBD location odometer.
Simulation will be done with the clocks overlapped. The results may be incorrect if there are
races in the design.
list of violating clocks
EXPLANATION:
Patterns have been detected which activate multiple clock inputs simultaneously. The
offending event which resulted in multiple active clocks is indicated, but may not itself
contain multiple clocks (in which case it must have been preceded by another event
which stimmed a clock active). For cases in which multiple clocks are pulsed
simultaneously within the same event, Encounter Test does not do any timing verification
to ensure the clock pulses will actually overlap in the logic. Encounter Test will simulate
the logic with the clocks on simultaneously, but this may produce incorrect results if the
clocks do not actually overlap. A listing of violating clocks is included at the end of the
message.

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USER RESPONSE:
There are two approaches that can be taken:

a. If the clocks are not required to be on simultaneously, the input patterns can be
modified to serially activate and deactivate the clocks.

b. If the clocks are required to be overlapping to produce the correct results, verify that
the timing of the common logic ensures that the clocks are overlapped so that the
simulators predicted results will match the actual hardware.

WARNING (TCL-402): number of active clock primary inputs or PPIs


clock inputs were active during a odometer event @ TBD location odometer . Simulation
will be done with the clocks overlapped. The results may be incorrect if there are races in the
design.
EXPLANATION:
Patterns have been detected which activate multiple clock inputs simultaneously. The
offending event which resulted in multiple active clocks is indicated, but may not itself
contain multiple clocks (in which case it must have been preceded by another event
which stimmed a clock active). For cases in which multiple clocks are simultaneously
pulsed within the same event, Encounter Test does not do any timing verification to
ensure the clock pulses will actually overlap in the logic. Encounter Test will simulate the
logic with the clocks on simultaneously, but this may produce incorrect results if the
clocks do not actually overlap.
The violating clocks are listed at the end of the message.
USER RESPONSE:
Use either of the following methods and rerun if necessary:
If the clocks are not required to be simultaneously on, the input patterns can be
modified to serially activate and deactivate the clocks.
If the clocks are required to be overlapping to produce the correct results, verify
that the timing of the common logic ensures that the clocks are overlapped so
that the simulators predicted results will match the actual hardware.

WARNING (TCL-450): Pattern fault index fault index was unable to be injected due to
an unknown or unsupported required value. This fault will not be simulated.
EXPLANATION:
This message indicates either an unsupported required value specification for a pattern
fault or a programming error.

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USER RESPONSE:
Examine the fault specification to ensure that the required values are supported within
the pattern fault specification documentation. See "Fault Rule Syntax" in the Encounter
Test: Guide 4: Faults . If this is the case, then please contact customer support (see
Contacting Customer Service on page 23).

ERROR (TCL-470): An illegal force event was encountered on netname (index=


hierIndex). The High Speed Scan-Based Simulator can only support force events on
stable latches. Processing terminates.
EXPLANATION:
The High Speed Scan-Based Simulator is limited in its processing of force events
because it is a compiled logic simulator.
USER RESPONSE:
Ensure that the force events are limited to stable latches. If this is not possible, it may be
necessary to use the general purpose simulator.

ERROR (TCL-471): An illegal force event was encountered on latch netname (index=
hierIndex). The High Speed Scan-Based Simulator does not support the hold attribute.
Processing terminates.
EXPLANATION:
The High Speed Scan-Based Simulator is limited in its processing of force events
because it is a compiled logic simulator. It cannot hold a force value in a latch.
USER RESPONSE:
Remove the hold attribute from the force event. If this is not possible, it may be necessary
to use the general purpose simulator.

WARNING (TCL-520): Unable to create the diagnostic testset failset name. No


TBDfail file will be produced by this run. Ensure that the design parameters specified are
correct, that there is sufficient space in the file system and that file permissions are set
correctly.
EXPLANATION:
The Encounter ATPG simulation options in the vector file must have the simulation
keyword as the first keyword in the keyed data. This enables verification that the current
simulator is the same as the ATPG simulator. If not matched, the rest of the options in
SimOptions are not relevent and will invalidate the run. SimOptions keyed data must
have been edited and imported back into vector format in order for this problem to occur.

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USER RESPONSE:
Ensure that the specified design parameters are correct, that there is sufficient space in
the file system and that file permissions are set correctly. If problems persist, contact
customer support (see Contacting Customer Service on page 23).

TCL-622 through TCL-999


ERROR (TCL-622): No simulation options keyed data found in the vector file for Test Section
test_section.
EXPLANATION:
The use of Encounter Test ATPG simulation options was requested, however there are
no simulation options in the vector file for the indicated test section. The run terminates.
RESPONSE:
Rerun with useatpgsimoptions=no specified.

ERROR (TCL-623): ATPG sim options stored in the vector file (Test Section
test_section) contains simulation=simulator in SimOptions keyed data but
the current run is simulator=simulator for the current run.
EXPLANATION:
The Encounter Test ATPG simulation options in the vector file for the indicated test
section is not the same as the simulator being used for the current run. When specifying
useatpgsimoptions=yes, the simulator selected for the run must be the same as the
simulator used during Encounter ATPG run.
RESPONSE:
Rerun with useatpgsimoptions=no specified or change the simulator to match the
simulation technique that was specified for the simoptions keyword.

ERROR (TCL-624): ATPG simulation option, keyword=current test sectionss


keyword value is stored in Test Section current_test_section. This value is
inconsistent with keyword=first test sectionss keyword value, found in
Test Section first test section in test range.
EXPLANATION:
The Encounter Test ATPG simulation options in the vector file are inconsistent between
the indicated test sections located in the specified test range. When specifying

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useatpgsimoptions=yes, certain simulation options must be the same across test


sections in order to be processed in a single run.
RESPONSE:
Either rerun with useatpgsimoptions=no specified or specify a test range with
consistent keyword values..

ERROR (TCL-625): ATPG simulation option in Test Section test_section does not
contain simulation as the first keyword.
EXPLANATION:
The Encounter ATPG simulation options in the vector file must have the simulation
keyword as the first keyword in the keyed data. This enables verification that the current
simulator is the same as the ATPG simulator. If not the same, the rest of the options in
SimOptions invalidate the run. SimOptions keyed data must have been edited and
imported back into vector format in order for this problem to occur.
RESPONSE:
Ensure that simulation is the first keyword in SimOptions and rerun..

ERROR (TCL-626): The accumulated number of faults polling from each gates is larger than
the total faults (total number faults) available in the fault model, simulation will terminate.
EXPLANATION:
The accumulated number of faults polling from each gates is larger than the total number
the simulator detects from the fault model utility. This usually means the fault model or
fault status file is corrupted. The simulation cannot continue since it may leading to a core
dump.
RESPONSE:
Review the methodology to determine which step is corrupting the fault model/fault
status file and report this to customer support. Refer to Contacting Customer Service
on page 23.

WARNING (TCL-700): A good machine oscillation was detected on net netname at TBD
location tbd_location. The good machine logic value is set to X on this net.
EXPLANATION:
The referenced net changed value more times than the specified Good Machine
Oscillation limit (the specified value for the gmosc keyword), for a single event. Tthis
typically indicates that the referenced net is part of an oscillating feedback circuit.

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In rare cases, the referenced net may not actually be oscillating and may legitimately
need to change value more times than specified with the gmosc keyword.
USER RESPONSE:
Increase the specified value for the gmosc keywordif it appears that the design cannot
oscillate. The highest allowed is 65535.
Note: Simulation runtime may increase when this value is increased.

WARNING (TCL-710): [Severe] One or more miscompares were detected for the event
type event at TBD location odometer.
EXPLANATION:
This message indicates that miscompares have occurred between expected design
states expressed in the input TBD patterns vs. design states predicted by the High Speed
Scan-Based Simulator.
The event type field in the message indicates the kind of event at which the miscompare
occurred. The tbd loc field gives the hierarchical location in the output TBD patterns
where the miscompare occurred. The miscompare data will be presented in the following
format:
@ Net netname (index=nodeid) - Expected: logic val Found: logic val

The Expected logic val is the value that was predicted in the input TBD event. The Found
logic val is the value that the High Speed Scan-Based Simulator achieved.
USER RESPONSE:
A miscompare message may or may not warrant further investigation, depending on the
source of the input patterns and the reason for performing the simulation. In most cases
miscompare messages do warrant investigation to determine their cause.

WARNING (TCL-711): [Severe] One or more miscompares were detected for the event
type event at relative TBD location odometer.
EXPLANATION:
This message indicates that miscompares have occurred between expected design
states expressed in the input TBD patterns vs. design states predicted by the High Speed
Scan-Based Simulator.
The event type field in the message indicates the kind of event at which the miscompare
occurred. The tbd loc field gives the relative location in the input TBD patterns where
the miscompare occurred. The location is based on the order the events have been
simulated.

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For example, if sequences are being simulated in reverse order the location will not
match the location on the input. To make it easier to locate a miscomparing event use
good machine simulation in the forward direction. The miscompare data will be
presented in the following format:
@ Net netname (index=nodeid) -
Expected: logic val Found: logic val

The Expected logic val is the value that was predicted in the input TBD event. The Found
logic val is the value that the High Speed
Scan-Based Simulator achieved.
USER RESPONSE:
A miscompare message may or may not warrant further investigation, depending on the
source of the input patterns and the reason for performing the simulation. In most cases
miscompare messages do warrant investigation to determine their cause.

INFO (TCL-713): Input measure values of X will be ignored|used for compares.


EXPLANATION:
If ignored, and the measure value from input vector is "X", the simulator will ignore the
compare against the output measure value. If used, the simulator will compare the input
and output measure value regardless of the content of the input vector.
USER RESPONSE:
No response required.

INFO (TCL-714): A TBDfail file will not be produced for detected miscompares.
EXPLANATION:
By default, a TBDfail file is not generated when output measure data miscompares with
the input measure data.
USER RESPONSE:
No response required.

INFO (TCL-730): Fault # fault index was dropped for exceeding maximum type of
limit.
EXPLANATION:
A faultXsize is the number of nets on which the faulty logic value is all X and differs from
good machine value. Each such difference costs runtime.

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A faultsize is the number of nets on which the faulty logic value differs from the good
machine logic value. Each difference costs runtime.
The named faults size exceeded the faultXSize/faultsize limit and was dropped from the
simulation. The fault will no longer be eligible to be detected by this simulation run. By
dropping faults of this type, significant simulation performance gains may be achieved.
USER RESPONSE:
Typically, none. If you are concerned that the dropped faults may be affecting your test
coverage, you can increase the maxfaultxsize and/or maxfaultsize parameter
and run the simulation again. These keywords are described in the "analyze_vectors
section of the Encounter Test: Reference: Commands.

ERROR (TCL-800): Input pattern error encountered. The Begin Loop pattern at TBD
location odometer contains no repeat event to specify the number of loop iterations.
Processing terminates. Correct the pattern and run the simulation again.
EXPLANATION:
See the message text.
USER RESPONSE:
Correct the pattern to contain a specification of how many loop iterations should be
performed.

INFO (TCL-802): number of MultiPulse events TBD MultiPulse events were simulated.
EXPLANATION:
When there are multiple clock pulses in a single event, they are simultaneously
simulated. If the clock PIs being pulsed are correlated (have a relationship defined with
the CORRELATE attribute) it is assumed that they must be simultaneously
simultaneously so this message is not printed. However, if the clock PIs are not
correlated (non-correlated), pulsing more than one at the same time may produce
unexpected results. The simulation will not account for delays in the clock trees, and son
on, to predict the order of the clocks arrival at the flops. Therefore, if there are any flop-
to-flop paths between the clock domains the results cannot be accurately predicted.
USER RESPONSE:
If the order of the clock pulses is significant, ensure the pulses are in separate events
and rerun if necessary.

ERROR (TCL-805): Input pattern error encountered. The Begin Loop pattern at TBD
location odometer contains an event other than the repeat event.

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This is an invalid construct. Processing terminates. Correct the pattern and run the
simulation again.
EXPLANATION:
See the message text.
USER RESPONSE:
Remove the erroneous event from the pattern and ensure that a repeat event is
specified.

ERROR (TCL-806): Input test sequence limitation encountered. There is a loopable test
sequence at TBD location odometer. Its test procedure includes additional test sequences.
The High Speed Scan-Based Simulator requires that a loopable test sequence be the only
test sequence in the test procedure. Processing terminates. Correct the test procedure and
run the simulation again.
EXPLANATION:
See the message text.
USER RESPONSE:
Ensure that a loopable test sequence has no other test sequences in its containing test
procedure.

ERROR (TCL-807): Input test sequence limitation encountered. There is a sequence at


TBD location odometer which contains a pattern loop. Its test procedure includes additional
test sequences. The High Speed Scan-Based Simulator requires that this test sequence be
the only test sequence in the test procedure. Processing terminates. Correct the test
procedure and run the simulation again.
EXPLANATION:
See the message text.
USER RESPONSE:
Ensure that the test sequence with the pattern loop has no other test sequences in its
containing test procedure.

WARNING (TCL-808): The event type Expect is not processed at TBD location odometer.
This event was found in your input test patterns and cannot be simulated in the high speed
scan simulator. Use simulation=gp to verify your test sequences with this event.
EXPLANATION:

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The Expect event type was found in the input pattern set, but will not be processed by
the high speed scan simulator. The event will be transferred intact to the output
experiment, but no checking of expected values will be performed for this event. This will
not affect your fault coverage. In order to make use of the functionality of this event, you
must rerun with simulation=gp.
USER RESPONSE:
No response is required. If you wish to verify the expected values using the Expect event,
then rerun with simulation=gp specified on the command line to select a different
simulation engine.

WARNING (TCL-838): [Severe] number of Pulses in the event uncorrelated


inputs were pulsed in a event type TBD event. They were simulated in
parallel(overlapped) order. The simulation results may be wrong if the clocks are not
independent.
EXPLANATION:
The TBD patterns contain an Event which pulses more than one clock at the same time.
The programt does not perform timing verification to ensure that the clock pulses may
overlap in the logic. The program will simulate the logic with the clocks on simultaneously,
but the results may be wrong if the clocks are not supposed to overlap.
USER RESPONSE:
If the clocks are not required to be on simultaneously, the pulses can be serialized by
putting them into separate events.
If the clocks are required to be on simultaneously, verify that the timing of the common
logic ensures that the simulated results will match the hardware.

INFO (TCL-841): There is a sequence at TBD location odometer which does not contain
any target fault information and measures=targeted was specified. Since it cannot be
determined which measure points are being targeted by this sequence, all measures will be
recorded.
EXPLANATION:
The TBD patterns contain a sequence without target fault information. One use of this
information is to identify to simulation which measurable nets in the cicuit are being
targeted by this sequence. Without this information, simulation will record expect values
and (if fault simulating) detect faults at all measurable points on this sequence.
USER RESPONSE:
Certain test sequences such as the scan chain tests or the shorted nets test do not
contain target fault information. Therefore this message is expected for these sequences

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if measures=targeted is specified. If this is a resimulation of existing patterns which


were imported from report_vectors output, ensure that report_vectors was run
with targetfault=yes specified.

WARNING (TCL-855): A non-three-state PI is stimmed to an illegal value. The stim value of


Z has been converted to X. The PI is netname (index=hierIndex).
EXPLANATION:
A primary input stimulus value was encountered that was Z. It is converted to X. The
output TBD file will contain the original stim value and not the assumed X.
USER RESPONSE:
If the patterns were manually generated, ensure that the stim value conversion is
acceptable. If not, change the stim value to an explicit legal value. If these patterns were
generated by a Encounter Test automatic test generator, please contact customer
support (see Contacting Customer Service on page 23).

WARNING (TCL-870): There are active clock oscillators at the end of a setup sequence.
These clocks will be set to X at the beginning of each subsequent test sequence, regardless
of any event that may set them to a known value during any test sequence.
EXPLANATION:
One or more clocks were the subject of a Start_Osc event in the setup sequence for the
current test procedure, causing them to become active oscillators. The oscillators on
these clocks, however, were not all deactivated (via a Stop_Osc, stim or pulse event)
prior to the end of the setup sequence. Since sequences do not have memory for this
test procedure, oscillating clocks will be set to X at the start of each test sequence, even
if they are stimmed or deactivated during the course of some test sequence. This is
necessary because these test sequences may be run in any order at the tester.
USER RESPONSE:
Ensure that you really wished to leave the clock oscillator active at the end of the setup
sequence. If not, change the setup sequence to correct the situation.

ERROR (TCL-871): An error occurred during processing of a setup sequence. There was
an active clock oscillator when an event requiring a scan operation was encountered.
Processing terminates. Correct the setup sequence and run the simulation again.
EXPLANATION:
One or more clocks were the subject of a Start_Osc event in the setup sequence for the
current test procedure, causing them to become active oscillators. The oscillators on
these clocks, however, were not all deactivated (via a Stop_Osc, stim or pulse event)

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prior to an event requiring a scan operation. In order to ensure that the design scans
correctly the High Speed Scan-Based Simulator requires that all clocks be at their
stability value when a scan operation is invoked.
USER RESPONSE:
Change the setup sequence to correct the situation.

WARNING (TCL-911): [Severe] Error parsing options. keyword=value is not valid.


EXPLANATION:
The simulator was invoked with the specified invalid option.
USER RESPONSE:
Either omit the option, or specify an allowed value.

INFO (TCL-998): Stack Size on this machine is limitation, usually for large circuits.
Simulation needs unlimited stack size to finish initialization.
EXPLANATION:
An unlimited stack size is needed to backtrace large circuits for recursive calls. if the
stack size is small, you might get a core during the initialization of High Speed Scan
Based simulation (hsscan).
USER RESPONSE:
Typically, no response is required. If a core does occur, check the stack size. If required,
use ulimit to the set stack size to unlimited and rerun.

INFO (TCL-999): Exception message summary


EXPLANATION:
The messages that follow are the summary of the issued exception messages during the
run.
USER RESPONSE:
Analyze each exception to determine if you need to change the patterns, test generation/
simulation keywords, the testmode, or the design to remove the condition that caused it.
See the extended help for the individual messages for more information. Refer to
Extended Message Help on page 35.

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15
TCT - Test Data Core Messages

TCT-001 through TCT-108 on page 373


TCT-110 through TCT-580 on page 381

TCT-001 through TCT-108


WARNING (TCT-001): [Severe] The TCT function, function, could not find file
filename.
EXPLANATION:
create_macro_tests attempted to open the file listed but the file does not exist.
Processing terminates.
USER RESPONSE:
Determine the reason (wrong workdir, testmode, path, etc.), correct and rerun.

WARNING (TCT-002): [Severe] The TCT function, function, could not write data to file
filename.
EXPLANATION:
create_macro_tests attempted to write data to the listed file but could not.
Processing terminates.
USER RESPONSE:
Determine the reason (wrong file, missing file, etc.), correct and rerun.

WARNING (TCT-003): [Severe] The TCT function, function, could not read data from
file filename.
EXPLANATION:
The function was unable to read from the file listed. Processing terminates.

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USER RESPONSE:
Determine the reason (wrong file, missing file, etc.), correct and rerun.
Determine the reason (wrong file, missing file, etc.), correct and rerun.

WARNING (TCT-004): [Severe] The TCT function, function, could not close file
filename.
EXPLANATION:
The function was unable to close the file listed. Processing terminates.
USER RESPONSE:
Determine the reason (wrong file, missing file, etc.), correct and rerun.

WARNING (TCT-005): [Severe] The TCT function, function, could not verify the file
header in file filename.
EXPLANATION:
The file header may have been created with an old version of a Encounter Test
application that used an out of date file header format. For example, the
MacroIsolationbin file may have been created with an old version of Verify Macro
Isolation.
USER RESPONSE:
Obtain the correct version of the application that created the specified file and rerun.

WARNING (TCT-010): [Severe] The file, filename, is not registered in globalData and
therefore cannot be accessed.
EXPLANATION:
The MacroIsolationbin Verify Macro Isolation output file was not registered.
USER RESPONSE:
Determine why the file is not registered and rerun.

WARNING (TCT-011): [Severe] The file, filename, is not writeable, therefore the results
of this TCT run cannot be saved.
EXPLANATION:
The permission bits for this file are not set to write.
USER RESPONSE:

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The file owner must set the appropriate permission bits to make the file writeable before
create_macro_tests can be rerun.

WARNING (TCT-012): [Severe] The file, filename, is not readable, therefore the results
of this TCT run cannot be saved.
EXPLANATION:
The permission bits for this file are not set to read.
USER RESPONSE:
The file owner must set the appropriate permission bits to make the file readable before
create_macro_tests can be rerun.

ERROR (TCT-013): [Internal] The master filename for the file filename could not be
constructed.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCT-015): [Severe] The directory, directoryname, is not writeable,


therefore the results of this TCT run cannot be saved.
EXPLANATION:
The permission bits for the directory are not set to write.
USER RESPONSE:
The directory owner must have the appropriate permission bits set to make the directory
writable.

WARNING (TCT-016): [Severe] The directory, directoryname, is not readable,


therefore the results of this TCT run cannot be saved.
EXPLANATION:
The permission bits for the directory are not set to read.
USER RESPONSE:
The directory owner must have the appropriate permission bits set to make the directory
readable.

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ERROR (TCT-018): [Internal] The directory name could not be constructed using
PROJECT = projectname, PARTID = partid
EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-020): [Internal] A non-zero return code was returned from Encounter Test
(TBD) function function. TCT processing terminates.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

WARNING (TCT-022): [Severe] No isolation data exists in the MacroIsolationbin file.


EXPLANATION:
The Verify Macro Isolation run failed before any isolation data could be generated.
Processing terminates.
USER RESPONSE:
Create valid isolation data and rerun Create Macro Tests.

WARNING (TCT-024): [Severe] No group(s) to process.


EXPLANATION:
None of the groups specified by the selectgroup option exist in the isolation data or
the isolation data did not contain any groups. Processing terminates.
USER RESPONSE:
Correct the group number(s) in the selectgroup option. To print a list of valid group
numbers, run create_macro_tests with the printgroups option. The resulting
group numbers are the valid group numbers which can be used with the selectgroup
option.

WARNING (TCT-040): [Severe] No TDM files were found to be processed.


EXPLANATION:

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The name of a macrotest data file must be specified using the tdminput keyword or a
directory name containing macro test data files must be specified using the tdmpath
keyword.
USER RESPONSE:
Ensure the complete path and file name of the file containing the macro test data or the
directory name containing macro test data files is specified on the command line.

WARNING (TCT-050): [Severe] No TDM file name was found for macro macroname,
algorithm algname.
EXPLANATION:
When using the tdmpath keyword, a model attribute on the macro must exist which
contains the algorithm name and test data file name.
USER RESPONSE:
Check that a model attribute for this macro exists and contains the correct algorithm
name and test data file name.

WARNING (TCT-052): [Severe] TDM filename was found for macro macroname,
algorithm algname.
EXPLANATION:
The tdmpath keyword combined with the test data file name from the macros model
attribute for this algorithm formed a fully qualified path name to a file which does not exist.
USER RESPONSE:
Ensure the tdmpath value entered on the command line is correct and that the file
containing the test data for this macro exists.

WARNING (TCT-054): [Severe] No TDM files were found for any of the macros in group
groupname, algorithm algname.
EXPLANATION:
None of the macro test data files were found using the tdmpath keyword and test data
file names retrieved from the macros model attribute.
USER RESPONSE:
Check that the tdmpath is correct and that the macro test data files reside in the
directory.

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INFO (TCT-060): Processing group groupnum, algorithm algname, TDM file(s):


filenames.
EXPLANATION:
This informational message provides the group number, algorithm name, and a list of
TDM files that will be processed for this group number.
USER RESPONSE:
No response required.

WARNING (TCT-062): [Severe] Unable to open or process TDM file tdmfile.


EXPLANATION:
The program was unable to open a TDM file or was not able to process the file data.
USER RESPONSE:
If using the tdminput keyword, ensure that a fully qualified macro test data file name
was entered, the file exists in the directory, and the directory has read permission.
If using the tdmpath keyword ensure the path directory is correct and has read
permission.
If the file is corrupt, re-create the file using supported processes.

WARNING (TCT-070): [Severe] No PI Vector Application Objects.


EXPLANATION:
Each macro test data file should contain information about the input pins on the macro.
This information does not exist in the macro test data file being processed.
USER RESPONSE:
Ensure the correct macro test data file name is being processed from preceding
messages and that the macro test data file is of the structure neutral format.

WARNING (TCT-072): [Severe] No PO Vector Application Objects.


EXPLANATION:
Each macro test data file should contain information about the output pins on the macro.
This information does not exist in the macro test data file being processed.
USER RESPONSE:

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Ensure the correct macro test data file name is being processed from preceding
messages and that the macro test data file is of the structure neutral format.

WARNING (TCT-080): [Severe] The input pin pinname does not have a correspondence
pin.
EXPLANATION:
The macro test data requires that a stim value be applied to this pin on the macro but the
pin does not have a corresponding pin on the package that can be used to apply the
value to the macro.
USER RESPONSE:
Ensure the macro input pin is listed in the Macro Isolation Control file for the algorithm
being processed and that the pin was successfully isolated.

WARNING (TCT-082): [Severe] The output pin pinname does not have a correspondence
pin.
EXPLANATION:
The macro test data requires that this pin on the macro be measured but the pin does
not have a corresponding pin on the package that can be used to measure the value.
USER RESPONSE:
Ensure the macro output pin is listed in the Macro Isolation Control file for the algorithm
being processed and that the pin was successfully isolated.

WARNING (TCT-090): [Severe] A suitable operation was not found for event event. This
event will not be processed.
EXPLANATION:
There is no operation that has correspondence for all pins exercised in this event.
USER RESPONSE:
Ensure that all pins exercised in this event are in the same operation in the Macro
Isolation Control file and that all pins were successfully isolated.

WARNING (TCT-092): [Severe] A suitable operation was not found for events
startevent through endevent. These events will not be processed.
EXPLANATION:
There is no operation that has correspondence for all pins exercised in these events.

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USER RESPONSE:
Ensure that all pins exercised in these events are in the same operation in the Macro
Isolation Control file and that all pins were successfully isolated.

WARNING (TCT-100): [Severe] Pin pinname was stimmed to Z in event event but the
pin is not a bidirectional pin.
EXPLANATION:
A pin must be defined as an input pin and an output pin in the macro test data before it
can be classified as a bidirectional pin. Only bidirectional pins can be stimmed to a value
of Z.
USER RESPONSE:
Ensure that the macro test data was created with this pin functioning as a bidirectional
pin and that the correct test data file is being used.

WARNING (TCT-102): [Severe] A correspondence pin was not found for pin pinname
which was stimmed to Z in event event, operation operation.
EXPLANATION:
To ensure that a macro pin required to be set to a Z is not driven to a value by the
package, an output correspondence pin is required. If none is found, the stim Z on this
pin is ignored.
USER RESPONSE:
For macro pins that are stimmed to a Z in the macro test data, ensure that an operation
exists that has output correspondence for these pins.

WARNING (TCT-104): [Severe] A correspondence pin was not found for pin pinname
which was measured at Z in event event, operation operation.
EXPLANATION:
The macro test data requires that this pin be measured to a Z but the pin does not have
a corresponding pin on the package that can be used to measure this value.
USER RESPONSE:
Ensure the macro output pin is listed in the Macro Isolation Control file for the operation
being processed and that the pin was successfully isolated.

WARNING (TCT-106): [Severe] An input correspondence pin or required pin was not found
for pin pinname in event event, operation operation.

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EXPLANATION:
The macro test data requires that this pin be stimmed to a value but the pin does not have
a corresponding pin on the package or a required pin with the same value that can be
used.
USER RESPONSE:
Ensure the macro input pin is listed in the Macro Isolation Control file for the operation
being processed and that the pin was successfully isolated.

WARNING (TCT-108): [Severe] An output correspondence pin or assumed value pin was
not found for pin pinname in event event, operation operation.
EXPLANATION:
The macro test data requires that this pin be measured at a value but the pin does not
have a corresponding pin on the package or an assumed value pin with the same value
that can be used.
USER RESPONSE:
Ensure the macro output pin is listed in the Macro Isolation Control file for the operation
being processed and that the pin was successfully isolated.

TCT-110 through TCT-580


WARNING (TCT-110): [Severe] The event type eventtype is not supported.
EXPLANATION:
This event type is not supported by MacroTest.
USER RESPONSE:
Ensure that the macro test data was created using only supported processes. If the event
type referred to in the message was created by a supported process, contact customer
support (see Contacting Customer Service on page 23).

WARNING (TCT-112): [Severe] The event type eventtype is not supported in the
macros modeinit sequence.
EXPLANATION:
The macros modeinit sequence is limited to a subset of event types. The event type
called out in the message is not included in this subset.

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USER RESPONSE:
Ensure that the macro test data was created using only supported processes. If the event
type referred to in the message was created by a supported process, contact customer
support (see Contacting Customer Service on page 23).

WARNING (TCT-114): [Severe] The event type eventtype is not supported in the
macros scanop sequence.
EXPLANATION:
The macros scanop sequences are limited to a subset of event types. The event type
called out in the message is not included in this subset.
USER RESPONSE:
Ensure that the macro test data was created using only supported processes. If the event
type referred to in the message was created by a supported process, contact customer
support (see Contacting Customer Service on page 23).

WARNING (TCT-116): [Severe] The event type eventtype is not supported in the
macros test data.
EXPLANATION:
Macro Test does not support this event type.
USER RESPONSE:
Ensure that the macro test data was created using only supported processes. If the event
type referred to in the message was created by a supported process, contact customer
support (see Contacting Customer Service on page 23).

WARNING (TCT-118): The scan event event_type at event event is within a pattern
loop.
EXPLANATION:
A scan event has been added to the output after a begin loop pattern and before the end
loop pattern. Scan events within loops can severely impact test time.
USER RESPONSE:
Ensure the macro pins that change states within the pattern loop do not have latch
correspondence. This may require that the correspondence requirements for these pins
in the Macro Isolation Control (MIC) file be changed to CORRESP_TYPE=PIPO.

WARNING (TCT-120): [Severe] Unable to process eventtype event event due to


missing correspondence pins.

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EXPLANATION:
There is no operation that has correspondence for all pins exercised in this event.
USER RESPONSE:
Ensure that all pins exercised in this event are in a single operation in the Macro Isolation
Control file and that all pins were successfully isolated.

WARNING (TCT-130): [Severe] One or more measure Zs were encountered in event


event. These pins will be ignored.
EXPLANATION:
The measuring of a Z value at the macro pin can only be accomplished if the pin is
directly connected to a corresponding pin on the package.
USER RESPONSE:
Currently, the measuring of a Z value in the macros test data is not supported.

WARNING (TCT-140): [Severe] Shared pins pinname and pinname are stimmed to
different values in event event.
EXPLANATION:
Two macro pins share the same correspondence pin on the package but the macro test
data requires them to be stimmed to different values.
USER RESPONSE:
Remove the share keyword from the pinname statement for the pins in question.

WARNING (TCT-142): [Severe] Pin pinname was pulsed without shared pin pinname
being pulsed in event event.
EXPLANATION:
Two macro pins share the same correspondence pin on the package but the macro test
data requires one to be pulsed without the other one being pulsed.
USER RESPONSE:
Remove the share keyword from the pinname statement for the pins in question.

WARNING (TCT-144): [Severe] Shared pins pinname and pinname were pulsed to
different values in event event.
EXPLANATION:

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Two macro pins share the same correspondence pin on the package but the macro test
data causes them to be pulsed to different values.
USER RESPONSE:
Remove the share keyword from the pinname statement for the pins in question.

WARNING (TCT-150): [Severe] Latch correspondence in the macro modeinit sequence for
event type eventtype is not supported.
EXPLANATION:
Latch correspondence to exercised pins in the modeinit sequence is not supported.
USER RESPONSE:
Choose the PIPO correspondence type in the Macro Isolation Control file for all
exercised pins in the macros modeinit sequence.

WARNING (TCT-152): [Severe] Latch correspondence in a scanop sequence for event


type eventtype is not supported.
EXPLANATION:
Latch correspondence for pins in a scanop sequence would require loading the package
scan chain at the same time the macro scan chain was being loaded. This would most
likely result in corrupt scan data and should be avoided.
USER RESPONSE:
Choose the PIPO correspondence type in the Macro Isolation Control file for all
exercised pins in the macros scanop sequences.

WARNING (TCT-154): [Severe] Latch correspondence for event type eventtype is not
supported.
EXPLANATION:
Macro pins that are pulsed, scanned in, or scanned out must not have latch
correspondence since it would result in long test times and would most likely cause
corrupt macro data.
USER RESPONSE:
Choose the PIPO correspondence type in the Macro Isolation Control file for all pins that
will be pulsed or used as scan in or scan out pins.

WARNING (TCT-170): The scan length of a stim or measure register in the TDM input file
is zero.

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TCT - Test Data Core Messages

EXPLANATION:
The macro test data file did not have a valid scan length for one of its registers.
USER RESPONSE:
Ensure that the macro test data was created using only supported processes. If the
macro test data was created by a supported process, contact customer support (see
Contacting Customer Service on page 23).

WARNING (TCT-180): No stim latches were found within the macro boundary for register
regnum.
EXPLANATION:
None of the stim register latch names listed in the macro test data file for this register
were found within the macro boundary.
USER RESPONSE:
If the macro is a white box macro and the macro tests were created using a supported
process, contact contact customer support (see Contacting Customer Service on
page 23).

WARNING (TCT-182): No measure latches were found within the macro boundary for
register regnum.
EXPLANATION:
None of the measure register latch names listed in the macro test data file for this register
were found within the macro boundary.
USER RESPONSE:
If the macro is a white box macro and the macro tests were created using a supported
process, contact contact customer support (see Contacting Customer Service on
page 23).

WARNING (TCT-184): [Severe] Latch latchName cannot be loaded directly through the
package register in TDM file event event. The data for this latch will be ignored. Regenerate
the macro test data using the normal load option.
EXPLANATION:
To load a macros skewed stim latch (SSL), it must be the first latch in a package stim
register.
USER RESPONSE:

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TCT - Test Data Core Messages

Direct ATPG to create test data using normal loads.

WARNING (TCT-190): [Severe] A skewed stim latch event has been created that combines
skewed and non-skewed data.
EXPLANATION:
In a skewed stim latch event, the master and slave latches may not end up containing the
same data as they do in non-skewed events. Skewing apply data designed for a non-
skewed environment can lead to erroneous test results.
USER RESPONSE:
Ensure that the macro test data was created using only supported processes. If the
macro test data was created by a supported process, contact customer support (see
Contacting Customer Service on page 23).

WARNING (TCT-192): [Severe] A skewed measure latch event has been created that
combines skewed and non-skewed data.
EXPLANATION:
In a skewed measure latch event, data is transferred from the master to the slave latch
before scanning out the data. Skewing expect data that is designed for non-skewed
environment can lead to erroneous test results.
USER RESPONSE:
Ensure that the macro test data was created using only supported processes. If the
macro test data was created by a supported process, contact customer support (see
Contacting Customer Service on page 23).

INFO (TCT-400): Message number TCT-message_number has been printed


message_limittimes and will no longer be printed or recorded for the rest of this run.
EXPLANATION:
Each message has a limit to the number of times it will be printed during the run. The
default is 1000 times. When this limit is reached, a TCT-400 message will be printed
identifying the message number and the number of times it has been printed.
USER RESPONSE:
The number of times a message will be printed can be overridden by the messagecount
keyword. For example: messagecount=90=100,92=100 limits the number of times
messages TCT-090 and TCT-092 are printed to 100.

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TCT - Test Data Core Messages

ERROR (TCT-500): [Internal] Unable to initialize TBD in preparation to open TDM file
tdmfile.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-502): [Internal] Unable to initialize TBD with no model.


EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-504): [Internal] Unable to open merged TDM file tdmfile.


EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-510): [Internal] Invalid node ID (nodeID) for macro pin


macropinnodeID.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-512): [Internal] Invalid node ID (nodeID) for correspondence pin


corrpinnodeID.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:

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TCT - Test Data Core Messages

Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-520): [Internal] macro scanop sequence number seqNum was not found.
Unable to continue.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-530): [Internal] Invalid subgroup subGroup.


EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-540): [Internal] The maximum number of LATCH save levels has been
exceeded.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-550): [Internal] Node nodeID is not a valid stim latch node.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-552): [Internal] Node nodeID is not a valid measure latch node.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:

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TCT - Test Data Core Messages

Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-560): [Internal] The maximum number of PI save levels has been exceeded.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-570): [Internal] The maximum number of PO save levels has been
exceeded.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

ERROR (TCT-580): [Internal] The macro modeinit pin pinname has a required value that
is not the same as the value in the TDM file.
EXPLANATION:
This is most likely a program error.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23).

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TCT - Test Data Core Messages

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16
TCW - Stand Alone Random Pattern
Simulation Messages

TCW-001 through TCW-030 on page 391


TCW-031 through TCW-055 on page 395

TCW-001 through TCW-030


WARNING (TCW-001): [Severe] Error parsing options. keyword=value is not valid.
EXPLANATION:
The simulator was invoked with the specified invalid option. Processing terminates.
USER RESPONSE:
Either omit the option, or specify an allowed value. Refer to "create_exhaustive_tests in
the Encounter Test: Reference: Commands for additional information.

WARNING (TCW-002): The following option flags were ignored: flags


EXPLANATION:
The simulator was invoked with the specified invalid option flags. The invalid options are
ignored and processing continues.
USER RESPONSE:
Either omit the option, or specify an allowed value. Refer to "create_exhaustive_tests in
the Encounter Test: Reference: Commands for additional information.

WARNING (TCW-003): [Severe] Error occurred while trying to obtain proper license.
EXPLANATION:
The necessary license could not be obtained so processing terminates.

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TCW - Stand Alone Random Pattern Simulation Messages

USER RESPONSE:
Check for additional messages, correct the problem and rerun.

WARNING (TCW-004): [Severe] Simulator initialization failed. Run terminates.


EXPLANATION:
An error occurred during initialization of the simulator so processing terminates.
USER RESPONSE:
Check for additional messages, correct the problem and rerun.

WARNING (TCW-005): [Severe] Cannot set the test mode.


EXPLANATION:
The mode data is not accessible.
USER RESPONSE:
Ensure the mode name is valid, or rebuild the mode. If this does not fix the problem,
contact customer support (see Contacting Customer Service on page 23).

WARNING (TCW-006): [Severe] Random pattern generation does not support a scan type
of 1149.1.
EXPLANATION:
The TDR for the mode indicates a scan type of 1149.1, which is not supported by random
pattern generation.
USER RESPONSE:
Run with a valid TDR.

WARNING (TCW-010): [Severe] Unable to obtain shared use of the hierModel. Run
terminates.
EXPLANATION:
The simulator attempted to get a shared lock on the hierModel file to ensure that no other
applications try to rebuild the hierModel file while the simulator is being run. The lock was
not obtained, probably because the file was already exclusively locked by another
application.
USER RESPONSE:

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TCW - Stand Alone Random Pattern Simulation Messages

If no other application is running, contact customer support (see Contacting Customer


Service on page 23).
Otherwise, rerun after other applications have completed.

WARNING (TCW-011): [Severe] Unable to obtain a shared lock on mode modename. Run
terminates.
EXPLANATION:
The simulator attempted to get a shared lock on the mode to ensure that no other
applications try to rebuild the mode while the simulator is being run. The lock was not
obtained, probably because the mode was already exclusively locked by another
application.
USER RESPONSE:
If no other application is running, contact customer support (see Contacting Customer
Service on page 23).
Otherwise, rerun after other applications have completed.

WARNING (TCW-012): [Severe] Unable to obtain a write lock on experiment exp. Run
terminates.
EXPLANATION:
The simulator attempted to get an exclusive lock on the experiment since it will be
creating uncommitted files for that experiment. The lock was not obtained, probably
because the experiment was already in use by another application.
USER RESPONSE:
If no other application is running, contact customer support (see Contacting Customer
Service on page 23).
Otherwise, rerun after other applications have completed or try a different experiment
name.

WARNING (TCW-013): Unable to release read lock on the hierModel.


EXPLANATION:
An error occurred while trying to release a lock. Processing continues.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) if
subsequent locking problems occur.

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TCW - Stand Alone Random Pattern Simulation Messages

WARNING (TCW-014): Unable to release read lock on the mode.


EXPLANATION:
An error occurred while trying to release a lock. Processing continues.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) if
subsequent locking problems occur.

WARNING (TCW-015): Unable to release write lock on the experiment.


EXPLANATION:
An error occurred while trying to release a lock. Processing continues.
USER RESPONSE:
Contact customer support (see Contacting Customer Service on page 23) if
subsequent locking problems occur.

WARNING (TCW-020): [Severe] Unable to register the experiment object. Run terminates.
EXPLANATION:
This indicates a problem with the globalData file.
USER RESPONSE:
Re-import the design and rerun. If this does not fix the problem, contact customer
support (see Contacting Customer Service on page 23).

WARNING (TCW-021): [Severe] Unable to register an experiment dependency. Run


terminates.
EXPLANATION:
This indicates a problem with the globalData file.
USER RESPONSE:
Re-import the design and rerun. If this does not fix the problem, contact customer
support (see Contacting Customer Service on page 23).

WARNING (TCW-030): [Severe] TSV stored pattern tests were not run. Poor test coverage
and/or invalid test data may result.
EXPLANATION:

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TCW - Stand Alone Random Pattern Simulation Messages

Audit information indicates that TSV checks were not performed. Invalid design
structures can cause test coverage to degrade, and can even result in program errors.
USER RESPONSE:
Run TSV prior to Random Pattern Generation.

TCW-031 through TCW-055


WARNING (TCW-031): Unable to access TSV statistics on the globalData file. Results may
be suspect.
EXPLANATION:
Audit information indicates that TSV checks were not performed. Invalid design
structures can cause test coverage to degrade, and can even result in program errors.
USER RESPONSE:
If desired, run TSV prior to Random Pattern Generation.

WARNING (TCW-032): TSV issued warning messages. Test coverage may be impacted.
EXPLANATION:
Audit information indicates that TSV detected design conditions which could result in test
coverage degradation.
USER RESPONSE:
If maximum coverage is desired, correct the problems identified by TSV and rerun.

WARNING (TCW-033): TSV issued error messages. Poor test coverage and/or invalid test
data may result.
EXPLANATION:
Audit information indicates that TSV detected errors which could result in test coverage
degradation and could even result in program errors.
USER RESPONSE:
Correct the design conditions which are in violation and rerun TSV and simulation.

WARNING (TCW-034): [Severe] TSV issued severe error messages. Poor test coverage
and/or invalid test data may result.
EXPLANATION:

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TCW - Stand Alone Random Pattern Simulation Messages

Audit information indicates that TSV detected severe errors which could result in test
coverage degradation and could even result in program errors.
USER RESPONSE:
Correct the design conditions which are in violation and rerun TSV and simulation.

WARNING (TCW-040): [Severe] Simulation terminated due to error.


EXPLANATION:
A severe error has occurred and the simulation processing is terminating.
USER RESPONSE:
Check for additional messages and if necessary, contact customer support (see
Contacting Customer Service on page 23)

WARNING (TCW-041): [Severe] Cannot get storage for an internal table (name).
EXPLANATION:
More internal storage is required for this run.
USER RESPONSE:
More storage may be needed. Contact customer support (see Contacting Customer
Service on page 23) if this does not seem reasonable.

WARNING (TCW-042): Error from EDAMsopn(fcb,sanum).


EXPLANATION:
An error was encountered while attempting to access data from the compiled code file.
The file will be rebuilt.
USER RESPONSE:
No response required.

WARNING (TCW-043): Error from EDAMsget(fcb,toptr,offset, size).


EXPLANATION:
An error was encountered while attempting to access data from the compiled code file.
The file will be rebuilt.
USER RESPONSE:
No response required.

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TCW - Stand Alone Random Pattern Simulation Messages

INFO (TCW-044): Compile will be done: Compiled code does not exist.
EXPLANATION:
A valid compiled code file does not exist. Previous messages may give additional
information.
USER RESPONSE:
No response required.

INFO (TCW-045): Compile will be done: Level mismatch between compiled code and
simulator. Simulator level = majorid.minorid
EXPLANATION:
The current compiled code is backleveled and needs to be recompiled. This is usually
due to a new maintenance level.
USER RESPONSE:
No response required.

INFO (TCW-046): Compile will be done: Existing compiled code is for AIX machines only.
EXPLANATION:
The existing compiled code will not run on a non-AIX platform. Valid compiled code will
be built automatically.
USER RESPONSE:
No response required.

INFO (TCW-047): Compile not required: existing file is up to date.


EXPLANATION:
This is an informational message.
USER RESPONSE:
No response required.

INFO (TCW-048): Compile will be done: Fault machine code does not exist.
EXPLANATION:
The compiled code exists for good machine simulation, but not for fault simulation. Valid
compiled code will be built automatically.

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TCW - Stand Alone Random Pattern Simulation Messages

USER RESPONSE:
No response required.

INFO (TCW-049): Compile will be done: Compiled code is older than Fault Model.
EXPLANATION:
The compiled code is dependent on the fault model. Since the compiled code is older
than the fault model it will be recompiled to ensure it is not backleveled.
USER RESPONSE:
No response required.

INFO (TCW-050): Compile will be done: overriding current keeper device processing.
EXPLANATION:
A recompile is necessary based on the value of the keepers parameter.
USER RESPONSE:
No response required.

INFO (TCW-051): Compile will be done: overriding current compiled code type.
EXPLANATION:
The existing compiled code type does not match the requested type. A recompile is
required to produce the requested type.
USER RESPONSE:
No response required.

WARNING (TCW-052): Error from EDAMfcls(fcb,keep) = (rc).


EXPLANATION:
An error was encountered while attempting to close the compiled code file. In some
cases the run is terminated.
USER RESPONSE:
Check for additional messages and contact customer support (see Contacting
Customer Service on page 23).

INFO (TCW-053): Compile will be done: 64 bit incompatibility.


EXPLANATION:

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TCW - Stand Alone Random Pattern Simulation Messages

A recompile is necessary based on a difference between the existing compiled code and
the current platform. Either the compiled code
was built on a 32 bit machine and is being run on a 64 bit machine or vice versa.
USER RESPONSE:
No response required.

INFO (TCW-054): Compile will be done: overriding current measure latch processing.
EXPLANATION:
A recompile is necessary based on the value of the measurelatch parameter.
USER RESPONSE:
No response required.

INFO (TCW-055): Event driven compile will be done: event driven simulation is required to
propagate faults through measure latches.
EXPLANATION:
This indicates that propagation of faults through measure latches was requested. This
requires event driven compiled code and either the current compiled code was not event
driven or event driven was not specified to be built.
USER RESPONSE:
No response required.

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TCW - Stand Alone Random Pattern Simulation Messages

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Encounter Test: Reference: Messages

17
TDA - General Messages

TDA-001 through TDA-222 on page 401

TDA-001 through TDA-222


INFO (TDA-001): System Resource Statistics. Maximum Storage used during the run and
Cumulative Time in hours:minutes:seconds:
Working Storage = work_bytes bytes
Mapped Files = mapped_bytes bytes
Shared Memory = shared_bytes bytes (created by this process)
Shared Memory = attached_bytes bytes (attached by this process)
(Paging) Swap Space = swap_bytes bytes
CPU Time = cpu_time
Elapsed Time = elapsed_time

EXPLANATION:
This is a general, informational message that is usually printed at the end of an
application. It reports the maximum storage used during the run in 3 categories.
Working Storage indicates the maximum number of bytes of storage allocated by the
application and any utilities for working storage at any point in time. This does not include
memory for program stack space, which may be a significant amount of memory in
addition to this.
Mapped Files indicates the maximum number of bytes of memory in use at any point
in time for mapping files into virtual memory. Encounter Test uses memory mapping of
certain files (for example, the hierModel and flatModel) to improve start-up performance
for large designs.
Encounter Test uses Shared Memory to read the information present in certain files (for
example, the flatModel and modeinfo). The use of Shared Memory by the application is
controlled by the development keyword usesharedmemory. This information is printed
in this message only when the Shared Memory is successfully used to load the
information in the files.

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TDA - General Messages

The Shared Memory statistics have two components. The first component shows the
amount of Shared Memory created by the current process. The second component
shows the amount of Shared Memory utilized by the current process. This utilized
Shared Memory is assumed to be created by previous processes running on the same
design related information.
(Paging) Swap Space indicates the maximum number of bytes of swap space known
to be used specifically by this invocation of the program. All of the numbers reported here
tend to increase with the size of the design being processed. These numbers reflect only
the storage explicitly in use by Encounter Test programs and do not include any operating
system storage that may also be in use. The to