Scanning Electron Energy Dispersive Optical Emission
No Basic Characteristics of Testing Methods Electron Focused Ion Beam Backscattered X-Ray Diffraction X-ray Fluorescence Microscope Spectroscopy Spectroscopy Microscope Diffraction Species used for characterization 1 (e.g. electron, ion, etc.) Materials used to generate characterization species * 2 (e.g. material used for electron gun, etc.) Working condition 3 (e.g. vacuum, low pressure, etc.) Characterization species retrieved by detector * 4 (e.g. primary ion, excited atom, etc.) Species - sample interaction 5 (e.g. transmission, diffraction, etc.) Type of characterization * 6 (e.g. imaging, elements measurement, etc.) Sample requirements * 7 (e.g. conductive, thin, powder form, etc.) Advantage * 8 (e.g. easy to perform, fast data collection, etc.) Disadvantage * 9 (e.g. complex sample preparation, dangerous, etc.) Special features * 10 (e.g. spot measurements, material identification, etc.)