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Neural Networks
for
Monitoring, Control & Optimization
Paul Van Buskirk
Quality Monitoring & Control
Abstract
Introduction
This article highlights neural networks as a model development tool, due to its
widespread use and success. Other AI modeling methods can be used. The
model developer should determine the best technique for a given application.
Background
ANN model generation does not come without risk. The ANN model developer
needs to follow certain data screening guidelines to ensure integrity in the data,
please see the General recommendations for the AI model developer. The work
involved with data screening can occupy the bulk of the time in ANN (or any
other) model development. The ANN model software provider will also supply
guidelines for software use, data screening, and model development. Numerous
technical publications address issues related to ANN model data preparation, PC
AI is an excellent resource for these articles.
When these guidelines are followed, an accurate and robust ANN model can be
developed that can be used for multiple and strategic purposes. A general
overview of these model applications is provided in AI model applications and
utilization.
The applications of a system model are not limited to the items listed. Endless
possibilities exist. End use will be as varied as the personnel and industries that
develop or utilize the model. The applications listed are available now, through
numerous software providers. Implementation will provide a technology
advantage, with benefits that improve profit, quality, environmental and safety
controls.
As shown above, applications of an ANN model can range from sensor & data
verification to forecasting to full process optimization. In most cases the required
ANN model(s) for these applications can be developed from the same database.
For a given process or system, these applications should be used together.
Utilization of ANN models for sensor validation and fault detection is in common
use. A reliable fault detection technique that uses several AI modeling tools is
described in reference (2). This application is most effective when all sensors are
monitored as part of a preventative maintenance program. The keys to
successful process control and optimization implementation are reliable and
accurate sensors.
This application shows a typical sensor monitoring system. The lists on the left
are the various sensor names. The box graphs show the sensor errors, in
percentage. The top graph shows the current error, the bottom graph shows the
average error. Only the top four sensors with the maximum errors are given in
this example.
Prediction is primarily used for forecasting. Applications include market analysis,
sales projections, product properties, process variable inferred values, etc.
Reference (3) is a good starting point for the utilization of ANN models in the
process industries. There are also several articles in past issues of PC AI
Magazine. The major use of ANN models in the process industries is in the
prediction mode, either real-time or for off-line analysis and troubleshooting.
Equipment
Performance Meter
s s = Standard deviation.
= 2.71828182846.
The Process Index provides focus for the variables that most affect stability or
quality in operations. The index value is scaled from 100% (ideal) to 0%
(unacceptable). The index should be configured as a run chart to monitor total
process performance. An example is provided below.
This Plant Index example shows the results of an analysis for polymer
manufacture. The top graph provides the ANN model's prediction versus the
measured product melt index (MI). The MI is a polymer property used for sales
specification. The highlighted list gives the ANN model input variables. Prod_MI
is the modeled, or output, variable. The four top factors that contribute to a Plant
Index reading of 64.65% are listed on an instantaneous and average basis. The
Plant Index individual values are also listed. In this example Recycle_Flow
contributes 16.01% from
the product being
produced off targeted
values, i.e. a Plant Index
of 100% is ideal.
Control monitoring provides an application technology that gives the best pairings
of controls in a process. With a process that can be regulated, certain variables
can be independently manipulated, termed control inputs. These control inputs
are adjusted to control certain system requirements and/or specifications, termed
control outputs. Control monitoring provides the best pairing of manipulated-to-
controlled variables.
The technology is based on an ANN model to generate the gain array (from
process sensitivities). Minimum interaction of manipulated-to-controlled variables
is the goal (5). The maximum performance occurs when interactions are
eliminated. The performance indicator is named the "Stability Index". A value of
one is ideal. Negative values indicate an uncontrollable control scheme. High
positive values indicate a system that is marginal. Multivariable control analyses
shows an industrial application of this technique.
Multivariable Control
Analyses
Control (quality) monitor results show the best pairing combinations (see Input to
Output Pairings). The Stability Index value is in a range that indicates these
pairings will be stable. Therefore, with this multivariable control configuration,
interactions will be minimal due to set point (target value) changes and external
disturbances.
Multivariable non-linear process control and optimization methods directly follow
from the methods presented. Once a neural net model is developed, the
equations can be imported into several optimizers, such as Excels solver.
Scientist , by MicroMath provides a wide range of optimization methods that
directly interfaces with several spreadsheet programs.
Conclusions
PC & AI systems and technologies allow for rapid and effective model generation
and application. As demonstrated, these technologies are currently available and
can be implemented now.
References:
Bhagat, P., "An Introduction to Neural Nets.", Chem. Eng. Progress, p 55 (Aug
1990)
Smith, S., "SDIs e: Real Time Prediction in the Chemical Industry", PC AI, p 18
(Jan/Feb 1998)
Chitra, S., "Use Neural Networks for Problem Solving", Chem. Eng. Progress, p
45 (April 1993)